SUPSiC-GC3M0120090D

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SUPSiC-GC3M0120090D
GC3M0120090D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
Features  
•
•
•
•
High blocking voltage with low On-resistance  
High speed switching with low capacitances  
Fast intrinsic diode with low reverse recovery (Qrr)  
Halogen free, RoHS compliant  
V

DS  

I

D  

R

DS(on)  

900 V  
23 A  
@
25˚C  
120 m
Ω  
Benefits  
•
•
•
•
Higher system efficiency  
Reduced cooling requirements  
Increased power density  
Increased system switching frequency  
Applications  
•
•
•
•
•
Renewable energy  
EV battery chargers  
High voltage DC/DC converters  
Switch Mode Power Supplies  
Lighting  
TO-247-3  
Package  
Part Number  
Package  
TO-247-3  
GC3M0120090D  
Maximum Ratings
(T

C

= 25 ˚C unless otherwise specified)  
Symbol  
Parameter  
Drain – Source Voltage  
Value  
Unit  
Test Conditions  
Note  
V

GS

= 0
V
,
I

D

= 100 μA  
900  
-8/+19  
-4/+15  
23  
V
V
V
V

DSmax  

V

GSmax  

V

GSop  

Gate – Source Voltage (dynamic)  
Gate – Source Voltage (static)  
AC (f >1 Hz)  
Static  
Note: 1  
Note: 2  
Fig. 19  
V

GS

= 15
V
,
 
T

C

= 25˚C  
Continuous Drain Current  
Pulsed Drain Current  
A
A
I

D  

15  
V

GS

= 15
V
,
 
T

C

= 100˚C  
50  
97  
Fig. 22  
Fig. 20  
I

D(pulse)  

P

D  

Pulse width t

P

limited by T

jmax  

Power Dissipation  
W
˚C  
˚C  
T

C

=25˚C, T
 
= 150 ˚C  
J
-55 to  
+150  
Operating Junction and Storage Temperature  
Solder Temperature  
T ,
 
T

stg  

J
260  
1.6mm (0.063”) from case for 10s  
M3 or 6-32 screw  
T

L  

1
8.8  
Nm  
lbf-in  
Mounting Torque  
M

d  

Note (1):
 
When using MOSFET Body Diode V

GSmax

= -4V/+19V  
Note (2):
 
MOSFET can also safely operate at 0/+15 V  
GC3M0120090D Rev.
 
B, 10-2019  
1
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©

GC3M0120090D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
Electrical Characteristics
 
(T

C

= 25˚C unless otherwise specified)  
Symbol  
Parameter  
Min.  
900  
1.8  
Typ.  
Max. Unit  
Test Conditions  
Note  
V

(BR)DSS  

Drain-Source Breakdown Voltage  
V
V
V

GS

= 0
V
,
I

D

= 100 μA  
2.1  
1.6  
1
3.5  
V

DS

= V

GS

, I

D

= 3 mA  
V

GS(th)  

Gate Threshold Voltage  
Fig. 11  
V

DS

= V

GS

, I

D

= 3 mA, T

J

= 150ºC  
V

DS

= 900
V
,
V

GS

= 0 V  
V

GS

= 15
V
,
V

DS

= 0 V  
V
I

DSS  

I

GSS  

Zero Gate Voltage Drain Current  
Gate-Source Leakage Current  
100  
250  
155  
μA  
nA  
10  
120  
170  
8.9  
7.1  
V

GS

= 15
V
,
I

D

= 15 A  
Fig. 4,  
5, 6  
R

DS(on)  

Drain-Source On-State Resistance  
Transconductance  
m
Ω  
V

GS

= 15
V
,
I

D

= 15 A, T

J

= 150ºC  
V

DS

= 20
V
,
I

DS

= 15 A  
g

fs  

S
Fig. 7  
V

DS

= 20
V
,
I

DS

= 15 A, T

J

= 150ºC  
C

iss  

C

oss  

C

rss  

E

oss  

Input Capacitance  
414  
48  
Fig. 17,  
18  
V

GS

= 0
V
,
V

DS

= 600 V  
Output Capacitance  
Reverse Transfer Capacitance  
C

oss

Stored Energy  
pF  
f = 1 MHz  
3
AC  
V
= 25 mV  
10.6  
μJ  
μJ  
Fig. 16  
E

ON  

Turn-On Switching Energy (Body Diode FWD)  
176  
V

DS

= 400
V
,
V

GS

= -4 V/15
V
,
I

D

= 15 A,  
Fig. 26,  
29  
R

G(ext)

= 2.5Ω, L= 99 μH,
 
T

J

= 150ºC  
E

OFF  

t

d(on)  

t

r  

Turn Off Switching Energy (Body Diode FWD)  
Turn-On Delay Time  
36  
6
V

DD

= 400
V
,
V

GS

= -4 V/15 V  
Rise Time  
32  
I

D

= 15 A, R

G(ext)

= 2.5 Ω,  
Timing relative to V

DS  

Inductive load  
Fig. 27,  
29  
ns  
t

d(off)  

t

f  

Turn-Off Delay Time  
Fall Time  
14  
7
,
R

G(int)  

Q

gs  

Q

gd  

Q

g  

Internal Gate Resistance  
Gate to Source Charge  
Gate to Drain Charge  
Total Gate Charge  
13  
5
Ω
f = 1 MHz
 
V

AC

= 25 mV  
V

DS

= 400
V
,
V

GS

= -4 V/15 V  
I

D

= 15 A  
8
nC  
Fig. 12  
Per IEC60747-8-4 pg 21  
21  
(T
= 25˚C unless otherwise specified)  
Reverse Diode Characteristics  
C
Symbol  
Parameter  
Typ.  
Max.  
Unit  
Test Conditions  
Note  
4.8  
V
V
V

GS

= -4
V
,
I

SD

= 7.5 A  
Fig. 8,  
9, 10  
V

SD  

Diode Forward Voltage  
4.4  
V

GS

= -4
V
,
I

SD

= 7.5 A, T
 
= 150 °C  
J
I

S  

I

S, pulse  

t

rr  

Continuous Diode Forward Current  
Diode pulse Current  
15  
50  
A
V

GS

= -4 V  
Note 1  
Note 1  
A
V

GS

= -4
V
,
 
pulse width t

P

limited by T

jmax  

Reverse Recover time  
28  
ns  
V

GS

= -4
V
,
I

SD

= 15 A, V

R

= 400 V  
Note 1  
Q

rr  

I

rrm  

Reverse Recovery Charge  
127  
6
nC  
A
dif/dt = 600 A/µs, T
 
= 150 °C  
J
Peak Reverse Recovery Current  
Thermal Characteristics  
Symbol  
R

θ
JC  

Parameter  
Max.  
1.3  
Unit  
Test Conditions  
Note  
Thermal Resistance from Junction to Case  
°C/W  
Fig. 21  
R

θ
JA  

Thermal Resistance From Junction to Ambient  
40  
Note (3): Turn-off and Turn-on switching energy and timing values measured using SiC MOSFET Body Diode  
GC3M0120090D Rev.
 
B, 10-2019  
2
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©

GC3M0120090D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
Typical Performance  
45  
40  
35  
30  
25  
20  
15  
10  
5
45  
40  
35  
30  
25  
20  
15  
10  
5
V

GS

= 15V  
V

GS

= 13V  
V

GS

= 13V  
V

GS

= 15V  
Conditions:  
T

j

= 25 °C  
tp = < 200 µs  
Conditions:  
T

j

= -55 °C  
tp = < 200 µs  
V

GS

= 11V  
V

GS

= 11V  
V

GS

= 9V  
V

GS

= 9V  
V

GS

= 7V  
V

GS

= 7V  
0
0
0.0  
0.0  
0
2.0  
4.0  
6.0  
8.0  
10.0  
12.0  
12.0  
50  
0.0  
2.0  
4.0  
6.0  
8.0  
10.0  
12.0  
Drain-Source Voltage, V

DS

(V)  
Drain-Source Voltage, V

DS

(V)  
Figure 1. Output Characteristics T

J

= -55 ºC  
Figure 2. Output Characteristics T

J

= 25 ºC  
45  
40  
35  
30  
25  
20  
15  
10  
5
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
Conditions:  
T

j

= 150 °C  
tp = < 200 µs  
Conditions:  

DS

= 15 A  

GS

= 15 V  

p

< 200 µs  
V

GS

= 15V  
V

GS

= 11V  
I
V
t
V

GS

= 13V  
V

GS

= 9V  
V

GS

= 7V  
0
2.0  
4.0  
6.0  
8.0  
10.0  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
Junction Temperature, T

j

(°C)  
Drain-Source Voltage, V

DS

(V)  
Figure 3.
Output Characteristics T

J

= 150 ºC  
Figure 4. Normalized On-Resistance vs. Temperature  
300  
275  
250  
225  
200  
175  
150  
125  
100  
75  
250  
225  
200  
175  
150  
125  
100  
75  
Conditions:  

DS

= 15 A  
t

p

< 200 µs  
Conditions:  

GS

= 15 V  

p

< 200 µs  
I
V
t
V

GS

= 11 V  
T

j

= 150 °C  
T

j

= -55 °C  
V

GS

= 13 V  
T

j

= 25 °C  
V

GS

= 15 V  
50  
50  
25  
25  
0
0
-50  
-25  
0
25  
50  
75  
100  
125  
150  
5
10  
15  
20  
25  
30  
35  
40  
45  
Junction Temperature, T

j

(°C)  
Drain-Source Current, I

DS

(A)  
Figure 5. On-Resistance vs. Drain Current  
For Various Temperatures  
Figure 6. On-Resistance vs. Temperature  
For Various Gate Voltage  
GC3M0120090D Rev.
 
B, 10-2019  
3
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©

GC3M0120090D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
Typical Performance  
35  
30  
25  
20  
15  
10  
5
-8  
-7  
-6  
-5  

GS

= -4 V  
-4  
-3  
-2  
-1  
0
Conditions:  
V

DS

= 20 V  
tp < 200 µs  
0
V
-5  
V

GS

= 0 V  
-10  
-15  
-20  
-25  
-30  
-35  
-40  
-45  
T

J

= 150 °C  
T

J

= 25 °C  
V

GS

= -2 V  
T

J

= -55 °C  
Conditions:  
T

j

= -55°C  
t

p

< 200 µs  
0
0
2
4
6
8
10  
12  
14  
Gate-Source Voltage, V

GS

(V)  
Drain-Source Voltage V

DS

(V)  
Figure 7. Transfer Characteristic for  
Various Junction Temperatures  
Figure 8. Body Diode Characteristic at -55 ºC  
-8  
-7  
-6  
-5  
-4  
-3  
-2  
-1  
0
-8  
-7  
-6  
-5  
-4  
-3  
-2  
-1  
0
0
0
V

GS

= -4 V  
-5  
-5  
V

GS

= -4 V  
V

GS

= 0 V  
V

GS

= 0 V  
-10  
-15  
-20  
-25  
-30  
-35  
-40  
-45  
-10  
V

GS

= -2 V  
-15  
-20  
-25  
-30  
-35  
-40  
-45  
V

GS

= -2 V  
Conditions:  
T

j

= 150°C  
Conditions:  
T

j

= 25°C  
t

p

< 200 µs  
t

p

< 200 µs  
Drain-Source Voltage V

DS

(V)  
Drain-Source Voltage V

DS

(V)  
Figure 9. Body Diode Characteristic at 25 ºC  
Figure 10. Body Diode Characteristic at 150 ºC  
4.0  
3.5  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
16  
Conditions:  
Conditons  
V

GS

= V

DS  

I

DS

= 3 mA  
I

DS  

=
15 A  
I

GS

= 10 mA  
V

DS  

T

J

= 25 °C  
=
400 V  
12  
8
4
0
-4  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
0
5
10  
15  
20  
25  
Junction Temperature T

J

(°C)  
Gate Charge, Q

G

(nC)  
Figure 11. Threshold Voltage vs. Temperature  
Figure 12. Gate Charge Characteristics  
GC3M0120090D Rev.
 
B, 10-2019  
4
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©

GC3M0120090D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
Typical Performance  
-6  
-5  
-4  
-3  
-2  
-1  
0
-6  
-5  
-4  
-3  
-2  
-1  
0
0
0
V

GS

= 0 V  
V

GS

= 0 V  
-5  
V

GS

= 5 V  
V

GS

= 5 V  
-10  
-15  
-20  
-25  
-30  
-35  
-40  
-10  
-20  
-30  
-40  
V

GS

= 10 V  
V

GS

= 10 V  
V

GS

= 15 V  
V

GS

= 15 V  
Conditions:  
T

j

= -55 °C  
t

p

< 200 µs  
Conditions:  
T

j

= 25 °C  
t

p

< 200 µs  
Drain-Source Voltage V

DS

(V)  
Drain-Source Voltage V

DS

(V)  
Figure 13. 3rd Quadrant Characteristic at -55 ºC  
Figure 14. 3rd Quadrant Characteristic at 25 ºC  
-6  
-5  
-4  
-3  
-2  
-1  
0
25  
20  
15  
10  
5
0
V

GS

= 0 V  
-10  
V

GS

= 5 V  

GS

= 10 V  

GS

= 15 V  
V
V
-20  
-30  
-40  
Conditions:  
T

j

= 150 °C  

p

< 200 µs  
0
t
0
100  
200  
300  
400  
500  
600  
700  
800  
900 1000  
Drain-Source Voltage V

DS

(V)  
Drain to Source Voltage, V

DS

(V)  
Figure 15. 3rd Quadrant Characteristic at 150 ºC  
Figure 16. Output Capacitor Stored Energy  
1000  
100  
10  
1000  
Conditions:  
T

J

= 25 °C  
V

AC

= 25 mV  
f = 1 MHz  
Conditions:  
T

J

= 25 °C  
V

AC

= 25 mV  
f = 1 MHz  
C

iss  

C

iss  

C

oss  

100  
10  
1
C

oss  

C

rss  

C

rss  

1
0
50  
100  
Drain-Source Voltage, V

DS

(V)  
150  
200  
0
100  
200  
300  
400  
500  
600  
700  
800  
900  
Drain-Source Voltage, V

DS

(V)  
Figure 17. Capacitances vs. Drain-Source  
Voltage (0 – 200V)  
Figure 18. Capacitances vs. Drain-Source  
Voltage (0 – 900V)  
GC3M0120090D Rev.
 
B, 10-2019  
5
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©

GC3M0120090D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
Typical Performance  
25  
20  
15  
10  
5
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
Conditions:  
T

J

≤ 150
°C  
Conditions:  
T

J

≤ 150
°C  
0
-50  
-25  
0
25  
50  
75  
100  
125  
150  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
Case Temperature, T

C

(°C)  
Case Temperature, T

C

(°C)  
Figure 19. Continuous Drain Current Derating vs.  
Case Temperature  
Figure 20. Maximum Power Dissipation Derating vs.  
Case Temperature  
1
Limited by R

DS On  

10 µs  
10.00  
100 µs  
0.5  
0.3  
1 ms  
100 ms  
0.1  
1.00  
0.10  
0.01  
0.05  
100E-3  
0.02  
SinglePulse  
0.01  
Conditions:  

C

= 25 °C  
T
D = 0,  
Parameter:
t

p  

10E-3  
0.1  
1
10  
100  
1000  
1E-6  
10E-6  
100E-6  
1E-3  
Time, t

p

(s)  
10E-3  
100E-3  
1
Drain-Source Voltage, V

DS

(V)  
Figure 21. Transient Thermal Impedance  
(Junction – Case)  
Figure 22. Safe Operating Area  
600  
500  
400  
300  
200  
100  
0
350  
Conditions:  
T

J

= 25 °C  

DD

= 600 V  
R

G(ext)

=
2.5 Ω  

GS

= -4/+15 V  
Conditions:  
T

J

= 25 °C  
E

Total  

E

Total  

V
V
R

DD

= 400 V  

G(ext)

=
2.5 Ω  
300  
250  
200  
150  
100  
50  
V
V

GS

= -4/+15 V  
FWD = GC3M0120090D  
L =
99 μH  
E

On  

FWD =
 
GC3M0120090D  
L =
99 μH  
E

On  

E

Off  

E

Off  

0
0
5
10  
15  
20  
25  
0
5
10  
15  
20  
25  
Drain to Source Current, I

DS

(A)  
Drain to Source Current, I

DS

(A)  
Figure 23. Clamped Inductive Switching Energy vs.  
Drain Current (V

DD

= 600V)  
Figure 24. Clamped Inductive Switching Energy vs.  
Drain Current (V

DD

= 400V)  
GC3M0120090D Rev.
 
B, 10-2019  
6
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©

GC3M0120090D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
Typical Performance  
300  
250  
200  
150  
100  
50  
300  
250  
200  
150  
100  
50  
Conditions:  
I

DS

= 15 A  
V

DD

= 400 V  
R

G(ext)

=
2.5 Ω  
V

GS

= -4/+15 V  
L =
99 μH  
Conditions:  
T =  
J
25 °C  
V

DD  

=
400 V  
15 A  
I

DS  

=
E

Total  

E

Total  

V

GS  

=
-4/+15 V  
FWD =
GC3M0120090D  
L =  
GC3M0120090D  
FWD =  
99 μH  
E

On  

E

On  

E

Off  

E

Off  

0
0
0
25  
50  
75  
100  
125  
150  
175  
200  
0
5
10  
15  
20  
25  
Junction Temperature, T

J

(°C)  
External Gate Resistor RG(ext) (Ohms)  
Figure 26. Clamped Inductive Switching Energy vs.  
Temperature  
Figure 25. Clamped Inductive Switching Energy vs. R

G(ext)  

60  
Conditions:  
T

J

= 25
 
°C  
V

DD  

I

DS  

=
=
400 V  
15 A  
50  
40  
30  
20  
10  
0
V

GS

= -4/+15
 
V  
FWD =
 
GC3M0120090D  
t

r  

t

d(off)  

t

f  

t

d(on)  

0
5
10  
15  
20  
25  
External Gate Resistor RG(ext) (Ohms)  
Figure 27. Switching Times vs. R

G(ext)  

Figure 28. Switching Times Definition  
GC3M0120090D Rev.
 
B, 10-2019  
7
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©

GC3M0120090D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
Test Circuit Schematic  
Q

1  

GC3M0120090D  
R

G  

V

GS

= – 4V  
V

DC  

Q

2  

R

G  

GC3M0120090D  
D.U.T  
Figure 29. Clamped Inductive Switching Test Circuit  
Note (3): Turn-off and Turn-on switching energy and timing values measured using SiC MOSFET Body Diode as shown above.  
GC3M0120090D Rev.
 
B, 10-2019  
8
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©

GC3M0120090D  
无 国晶微半 体技 有限公司  
Wuxi Gwok Semiconductor Co.,Ltd  
Silicon Carbide Power MOSFET  
N-Channel Enhancement Mode  
Package Dimensions  
Package TO-247-3  

.

190  
.205  
.100  
.085  
.052  
.095  
.133  
.027  
A
4.83  
5.21  
A1  
2.29  
2.54  
.090  
A2  
1.91  
1.07  
2.16  
.075  
b
b1  
1.33  

.

042  
.075  
1.91  
2.41  
b
3

2.87  
3.38  
0.68  

.

113  
0.55  

.

022  
c
D
20.80  
21.10  
.819

.831  
16.25  
17.65  
.640  
037  
.620

.635  
.695  
D1  
0.
9

5
1
.
2
5
.

.049  
D2  
15.75  
16.13  
E
E
1

13.10  
14.15  
.516  
.557  
3.68  
1.00  
5.10  
1.90  
.145

.201  
E2  

.

039  
.075  
.529  
E3  
12.38  
13.43  

.

487  
E4  
5.44 BSC  
.214 BSC  
e
3
3
N
L
19.81  
4.10  
20.32  
.780

.161  
.800  
.173  
L1

4.40  
3.51  
3.65  
6.00  
.138

.144  
�
P

Pinout Information:  
Q

5.49  

.

216  
.236  
.248  
6.04  
6.30  

.

238  
S
T
W
X
•ꢀ
Pin 1 = Gate  
�ꢀꢁꢂꢃꢄꢅꢆꢇꢁ  
•ꢀ
Pin 2, 4 = Drain  
•ꢀ
Pin 3 = Source  
ꢈꢁꢂꢃꢄꢅꢆꢇꢁ  
ꢉꢃꢄꢅꢆꢇꢁ  
Recommended Solder Pad Layout  
TO-247-3  
GC3M0120090D Rev.
 
B, 10-2019  
9
Copyright  
2019 Wuxi Gwok Semiconductor Co.,Ltd All rights reserved.  
©