A-Power-microelectronics-AP34N20P

Part #A-Power-microelectronics-AP34N20P
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A-Power-microelectronics-AP34N20P
AP34N20P  
200V N-Channel Enhancement Mode MOSFET  
Description  
The AP34N20P is silicon N-channel Enhanced  
VDMOSFETs, is obtained by the self-aligned planar Technology  
which reduce the conduction loss, improve switching  
performance and enhance the avalanche energy. The transistor  
can be used in various power switching circuit for system  
miniaturization and higher efficiency.  
General Features  
VDS =200V,ID =34A  
RDS(ON) <85mΩ@ VGS=10V  
Application  
Power amplifier  
motor drive  
Package Marking and Ordering Information  
Product ID  
Pack  
Marking  
Qty(PCS)  
AP34N20P  
TO-220-3
L
 
AP34N20P XXX YYYY  
1000  
Absolute Maximum Ratings
 
T

C

= 25ºC, unless otherwise noted  
Symbol  
VDSS  
ID  
Parameter  
Value  
Unit  
V
Drain-Source Voltage  
200  
34  
Drain Current -continuous  
Drain Current -pulse  
A
IDM  
VGSS  
EAS  
112  
±30  
588  
28  
A
Gate-Source Voltage  
V
Single Pulsed Avalanche Energy  
Avalanche Current  
mJ  
A
IAR  
EAR  
Repetitive Avalanche Current  
Peak Diode Recovery dv/dt  
15.8  
5.5  
mJ  
V/ns  
dv/dt  
158  
-55
~
+150  
300  
W
℃
PD TC=25
℃
 
TJ
,
TSTG  
TL  
Power Dissipation  
Operating and Storage Temperature Range  
Maximum Lead Temperature for Soldering Purposes  
Thermal Resistance, Junction to Case  
℃
Rth(j-c)  
Rth(j-A)  
0.79  
℃
/W  
℃
/W  
62.5  
Thermal Resistance, Junction to Ambient  
AP34N20P R
ev
1
.
0  
臺灣永源微電子科技有限公司  

AP34N20P  
200V N-Channel Enhancement Mode MOSFET  
Electrical Characteristics Diagrams  
Symbol  
BV

DSS  

Parameter  
Drain-Source Voltage  
Tests conditions  
I

D

=250μA, V

GS

=0V  
Min Typ Max
 
Units  
200  
–
0.19  
–
–
V
ΔBVDSS /ΔTJ  
–
–
–
I

D

=250μA, referenced to 25
℃
 
V/
℃  
μA  
Breakdown Voltage
T
emperature Coefficient  
1
IDSS  
V

DS

=200
V
,
V

GS

=0V, T

C

=25

℃  

Zero Gate Voltage Drain Current  
Gate-body leakage current, forward  
Gate-body leakage current, reverse  
Gate Threshold Voltage  
Static Drain-Source On-Resistance  
Forward Transconductance  
Input capacitance  
IGSSF  
IGSSR  
VGS(th)  
RDS(ON)  
g

fs  

V

DS

=0
V
,
V

GS

=30V  
V

DS

=0
V
,
V

GS

=-30V  
–
–
–
100  
nA  
–
-100 nA  
V

DS

= V

GS

, I

D

=250μA  
V

GS

=10V , I

D

=14.0A  
V

DS

= 40V , I

D

=14.0A  
V

DS

=25
V
,
V

GS

=0V, f=1.0MH

Z  

2.0  
–
4.0  
85  
–
V
mΩ  
S
–
–
–
–
–
–
–
–
–
–
–
–
60  
24  
C

iss  

2879 3742
 
pF  
C

oss  

Output capacitance  
362 470  
81 105  
pF  
pF  
ns  
ns  
ns  
ns  
C

rss  

Reverse transfer capacitance  
Turn-On delay time  
t

d

(on)  
t

r  

V

DD

=100V,I

D

=28A,R

G

=25Ω V

GS  

28  
69  
=10V  
(
note 4
,
5
)  
Turn-On rise time  
251 494  
309 617  
220 412  
t

d

(off)  
t

f  

Turn-Off delay time  
Turn-Off Fall time  
Q

g  

T
o
tal Gate Charge  
V

DS

=160V , I

D

=28A  
V

GS

=10V
(
note 4
,
5
)  
103 136
 
nC  
Q

gs  

Gate-Source charge  
16  
53  
–
–
nC  
nC  
Q

gd  

Gate-Drain charge  
Maximum Continuous Drain-Source  
Diode Forward Current  
IS  
–
–
–
–
–
28  
112  
1.4  
A
A
V
Maximum Pulsed Drain-Source Diode  
Forward Current  
ISM  
Maximum Continuous Drain-Source  
Diode Forward Current  
VSD  
V

GS

=0V, I

S

=28A  
trr  
218  
ns  
Reverse recovery time  
V

GS

=0V, I

S

=28A dI

F

/dt=100A/μs  
(note 4)  
Q

rr  

1.91  
μC  
Reverse recovery charge  
Notes:  
1
:
Pulse width limited by maximum junction temperature  
2
:
L=1.5mH, I
AS
=28A, V
DD
=50V, R =25 Ω,Starting T =25
℃  
3
:
I
SD
≤28A,di/dt ≤200A/μs, VDD≤BV
DSS
, Starting T =25
℃  
G
J
J
4
:
Pulse Test
:
Pulse Width ≤300μs, Duty Cycle≤2
%  
5
:
Essentially independent of operating temperature  
AP34N20P R
ev
1
.
0  
臺灣永源微電子科技有限公司  

AP34N20P  
200V N-Channel Enhancement Mode MOSFET  
Electrical Characteristics Diagrams  
1000  
1000  
VGS  
VGS  
TOP  
15V  
TOP  
15V  
10V  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
100  
10  
100  
10  
1
BOTTOM 4.5V  
BOTTO
M
4
.5V  
4.5V  
4.5V  
1
0.1  
0.01  
20µs PULSE WIDTH  
20µs PULSE WIDTH  
°
T =
 
175 C  
J
°
T =
 
25 C  
J
0.1  
0.1  
1
10  
100  
0.1  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1.
 
Typical Output Characteristics  
Fig 2.
 
Typical Output Characteristics  
3.5  
1000  
30A  
=
I
D
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
100  
°
T =
 
175 C  
J
10  
1
°
T =
 
25 C  
J
V
= 50V  
DS  
20µs PULSE WIDTH  
V
=
1
0V  
GS  
0.1  
4.0  
-60 -40 -20  
0
20 40 60 80
 
100 120 140 160 180  
°
5.0  
6.0  
7.0  
8.0 9.0  
10.0  
T ,
 
Junction Temperature (
 
C)  
J
V
, Gate-to-Source Voltage (V)  
GS  
Fig 4.
 
Normalized On-Resistance  
Fig 3.
 
Typical Transfer Characteristics  
Vs. Temperature  
5000  
4000  
3000  
2000  
1000  
0
16  
12  
8
V
C
= 0V,
 
f = 1 MHZ  
= C
 
+ C
 
, C  
I
D
=
18A  
GS  
V
V
V
= 160V  
= 100V  
= 40V  
DS  
DS  
DS  
SHORTED  
iss  
gs  
gd ds  
C
= C  
rss  
gd  
C
= C
 
+ C  
ds gd  
oss  
Ciss  
Coss  
Crss  
4
0
0
20  
40  
60  
80  
100  
1
10  
100  
1000  
Q ,
 
Total Gate Charge (nC)  
G
V
, Drain-to-Source Voltage (V)  
DS  
Fig 5.
 
Typical Capacitance Vs.  
Fig 6.
 
Typical Gate Charge Vs.  
Drain-to-Source Voltage  
Gate-to-Source Voltage  
AP34N20P R
ev
1
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臺灣永源微電子科技有限公司  

AP34N20P  
200V N-Channel Enhancement Mode MOSFET  
1000  
1000  
100  
10  
OPERATION IN THIS AREA LIMITED  
BY R  
DS(on)  
100  
°
T =
 
175 C  
J
10us  
100us  
°
T =
 
25 C  
J
10  
1
1ms  
°
T =
 
25 C  
J
C
°
T =
 
175 C  
Single Pulse  
10ms  
V
= 0 V  
GS  
1.4  
0.1  
1
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
1.6  
1
10  
100  
1000  
V
,Source-to-Drain Voltage (V)  
V
, Drain-to-Source Voltage (V)  
SD  
DS  
Fig 7.
 
Typical Source-Drain Diode  
Fig 8.
 
Maximum Safe Operating Area  
Forward Voltage  
800  
600  
400  
200  
0
35  
30  
25  
20  
15  
10  
5
I
D
TOP  
7.3A  
13A  
BOTTOM 18A  
0
25  
50  
75  
100  
125  
150  
175  
25  
50  
75  
100  
125  
150  
17
°
Starting T
 
, Junction Temperature (
 
C)  
J
°
, Case Temperatur
e
(
 
C
)  
T
C
Fig 12c.
 
Maximum Avalanche Energy  
Fig 9.
 
Maximum Drain Current Vs.  
Vs. Drain Current  
Case Temperature  
1
D = 0.50  
0.20  
0.1  
0.10  
0.05  
P
2
DM  
t
1
SINGLE PULSE  
0.02  
t
(THERMAL RESPONSE)  
0.01  
2
Notes:  
1. Duty factor D = t
 
/ t  
1
2. Peak T
 
=
P  
x Z  
+ T  
C
J
DM  
thJC  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t ,
 
Rectangular Pulse Duration (sec)  
1
Fig 11.
 
Maximum Effective Transient Thermal Impedance, Junction-to-Case  
AP34N20P R
ev
1
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0  
臺灣永源微電子科技有限公司  

AP34N20P  
200V N-Channel Enhancement Mode MOSFET  
AP34N20P R
ev
1
.
0  
臺灣永源微電子科技有限公司  

AP34N20P  
200V N-Channel Enhancement Mode MOSFET  
Attention  
1,Any and all APM Microelectronics products described or contained herein do not have specifications  
that can handle applications that require extremely high levels of reliability, such a
s
l
ife support systems,  
aircraft’s control systems, or other applications whose failure can be reasonably expected to result in  
serious physical and/or material damage. Consult with your APM Microelectronics representative nearest  
you before using any APM Microelectronics products described or contained herein in such applications.  
2,APM Microelectronics assumes no responsibility for equipment failures that result from usin
g
p
roducts  
at values that exceed, even momentarily, rated values (such as maximum ratings, operatingcondition  
ranges, or other parameters) listed in products specifications of any and all APM Microelectronics  
products described or contained herein.  
3, Specifications of any and all APM Microelectronics products described or contained her
e
i
nstipulate the  
performance, characteristics, and functions of the descri
b
e
d products in the independent state, and are  
not guarantees of the performance, characteristics, and functions of thedescribed products as mounted  
in the customer
’
s products or equipment. To verify symptoms andstates that cannot be evaluated in an  
independent device, the customer should always evaluate and test devices mounted in the customer
’
s  
products or equipment.  
4, APM Microelectronics Semiconductor CO., LTD. strives to supply high quality high reliabilityproducts.  
However, any and all semiconductor products fail with some probability. It is possible tha
t
t
hese  
probabilistic failures could give rise to accidents or events that could endanger human lives that could  
give rise to smoke or fire, or that could cause damage to other property. Whendesigning equipment,  
adopt safety measures so that these kinds of accidents or events canno
t
o
ccur. Such measures include  
but are not limited to protective circuits and error prevention circuits for safe design, redundant  
design,and structural design.  
5,In the event that any or all APM Microelectronics products(including technical data, services) described  
or contained herein are controlled under any of applicable local export control laws and regulations, such  
products must not be exported without obtaining the export license from the authorities concerned in  
accordance with the above law.  
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mechanical, including photocopying and recording, or any information storage or retrieval system, or  
otherwise, without the prior written permission of APM Microelectronics Semiconductor CO., LTD.  
7, Information (including circuit diagrams and circuit parameters) herein is for example only; it i
s
n
ot  
guaranteed for volume production. APM Microelectronics believes information herein is accurate and  
reliable, but no guarantees are made or implied regarding its use or any infringements o
f
i
ntellectual  
property rights or other rights of third parties.  
8, Any and all information d
e
s
cribed or contained herein are subject to change without notice du
e
t
o  
product/technology improvement,etc. When designing equipment, refer to the “DeliverySpecification” for  
the APM Microelectronics product that you Intend to use.  
AP34N20P R
ev
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0  
臺灣永源微電子科技有限公司