A-Power-microelectronics-AP5N20D-H
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AP5N20D-H
200V N-Channel Enhancement Mode MOSFET
Description
The AP5N20D-H is silicon N-channel Enhanced
VDMOSFE
T
s
, is obtained by the self-aligned planar
T
e
chnology
which reduce the conduction loss, improve switching
performance and enhance the avalanche energy. The transistor
can be used in various power switching circuit for system
miniaturization and higher efficiency.
General Features
VDS =200
V
,
ID =5A
RDS(ON) <600mΩ@ VGS=10V
(
Type
:
530mΩ
)
Hight Vth
Application
Uninterruptible Power Supply(UPS)
Power Factor Correction (PFC)
Package Marking and Ordering Information
Product ID
Pack
Marking
Qty(PCS)
AP5N20D-H
TO-252-3L
AP5N20D-H XXX YYYY
2500
Absolute Maximum Ratings
T
C
= 25ºC, unless otherwise noted
Symbol
VDSS
I
D
Parameter
Drain-Source Voltage (V
GS
= 0V)
Continuous Drain Current
Pulsed Drain Current
Value
200
5
Unit
V
A
IDM
20
A
VGSS
E
AS
Gate-Source Voltage
±20
45
V
Single Pulse Avalanche Energy
Avalanche Current
mJ
A
IAR
3
E
AR
Repetitive Avalanche Energy
Power Dissipation (T
C
= 25ºC)
Thermal Resistance, Junction-to-Case
3.2
46
mJ
W
P
D
RthJC
2.7
ºC/W
ºC/W
RthJA
Thermal Resistance, Junction-to-Ambient
60
-55~+150
TJ,
T
s
tg
Operating Junction and Storage
T
e
mperature Range
ºC
AP5N20D-H RVE1.1
永源微電子科技有限公司
AP5N20D-H
200V N-Channel Enhancement Mode MOSFET
Electrical Characteristics (TJ=25
℃
, unless otherwise noted)
Symbol
V(BR)DSS
IDSS
IDSS
IGSS
VGS(th)
RDS(on)
C
iss
Parameter
Test Conditions
Min. Typ. Max. Unit
Drain-Source Breakdown Voltage
V
GS
= 0
V
,
I
D
= 250µA
200
—
221
—
—
5
V
V
DS
= 200
V
,
V
GS
= 0
V
, T
J
= 25ºC
V
DS
= 160
V
,
V
GS
= 0
V
, T
J
= 125ºC
V
GS
= ±20V
Zero Gate Voltage Drain Current
μA
—
—
100
±100
4.0
600
—
Gate-Source Leakage
Gate-Source Threshold Voltage
Drain-Source On-Resistance (Note3)
Input Capacitance
—
—
nA
V
V
DS
= V
GS
, I
D
= 250µA
V
GS
= 10
V
,
I
D
= 2.5A
2.5
—
3.1
530
228
48
17
18
1.5
9.5
10
19
43
32
—
mΩ
—
V
GS
= 0
V
,
V
DS
= 25
V
, f =
1
.0MHz
C
oss
Output Capacitance
—
—
pF
nC
C
rss
Reverse Transfer Capacitance
T
o
tal Gate Charge
—
—
Q
g
—
—
V
DD
= 160
V
,
I
D
= 5.0A, V
GS
10V
=
Q
gs
Gate-Source Charge
—
—
Q
gd
Gate-Drain Charge
—
—
td(on)
t
r
Turn-on Delay Time
—
—
Turn-on Rise Time
—
—
V
DD
= 100
V
,
I
D
= 5.0A, R
G
= 25
Ω
ns
A
td(off)
t
f
Turn-off Delay Time
—
—
Turn-off Fall Time
—
—
I
S
Continuous Body Diode Current
Pulsed Diode Forward Current
Body Diode Voltage
—
5
T
C
= 25 ºC
ISM
—
—
20
1.4
—
V
SD
T
J
= 25ºC, I
SD
= 5A, V
GS
= 0V
—
—
V
t
rr
Reverse Recovery Time
Reverse Recovery Charge
—
160
1.5
ns
μC
V
GS
= 0
V
,
I
S
= 5A, di
F
/dt =100A
/μs
Q
rr
—
—
Note :
1
、
The data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ copper.
2
、
The EAS data shows Max. rating . IAS = 3A, VDD = 50
V
,
R
G = 25 Ω, Starting TJ = 25 ºC
3
、
The test condition is Pulse
T
e
st: Pulse width ≤ 300μs, Duty Cycle ≤ 1%
4
、
The power dissipation is limited by 150
℃
junction temperature
5
、
The data is theoretically the same as ID and IDM , in real applications , should be limited by total power dissipation.
AP5N20D-H RVE1.1
永源微電子科技有限公司
AP5N20D-H
200V N-Channel Enhancement Mode MOSFET
AP5N20D-H RVE1.1
永源微電子科技有限公司
AP5N20D-H
200V N-Channel Enhancement Mode MOSFET
AP5N20D-H RVE1.1
永源微電子科技有限公司
AP5N20D-H
200V N-Channel Enhancement Mode MOSFET
AP5N20D-H RVE1.1
永源微電子科技有限公司
AP5N20D-H
200V N-Channel Enhancement Mode MOSFET
Package Mechanical Data:TO-252-3L
E
Dimensions
A
B2
Ref.
Millimeters
Typ.
Inches
Typ.
C2
Min.
2.10
0
Max.
Min.
0.083
0
Max.
0.098
0.004
0.034
0.216
0.024
0.023
0.248
2.50
0.10
0.86
5.48
0.60
0.58
6.30
A
A2
B
0.66
5.18
0.40
0.44
5.90
0.026
0.202
0.016
0.017
0.232
B2
C
C2
D
C
5.30REF
0.209REF
D1
E
B
G
6.40
4.63
4.47
9.50
1.09
1.35
6.80
0.252
0.182
0.176
0.374
0.043
0.053
0.268
DETAIL A
E1
G
4.67
10.70
1.21
0.184
0.421
0.048
0.065
H
V 2
L
1.65
L2
V1
V2
V1
7°
7°
E1
L2
0°
6°
0°
6°
DETAIL A
TO-252
Reel Spectification-TO-252
B
D0
Dimensions
P0
P2
T
Ref.
Millimeters
Typ.
15.90 16.00
16.10
Inches
Typ.
t1
Min.
Max.
Min.
0.626
0.065
0.291
0.055
0.055
0.154
0.311
0.075
0.270
Max.
A
A
W
E
0.630 0.634
0.069 0.073
0.295 0.299
0.059 0.063
0.059 0.063
1.65
7.40
1.40
1.40
3.90
7.90
1.90
6.85
1.75
7.50
1.50
1.50
4.00
8.00
2.00
6.90
1.85
7.60
1.60
1.60
4.10
8.10
2.10
7.00
D1
F
K0
P1
D0
D1
P0
P1
P2
A0
B0
K0
T
A0
B
B
B
5°
0.157
0.161
20
A
A
0.315 0.319
0.079 0.083
0.271 0.276
Φ329
10.45 10.50 10.60
0.411 0.413 0.417
Φ13
2.68
0.24
2.78
2.88
0.27
0.105
0.009
0.004
0.109 0.113
0.011
t1
0.10
10P0
39.80
40.00 40.20 1.567
1.575 1.583
AP5N20D-H RVE1.1
永源微電子科技有限公司
AP5N20D-H
200V N-Channel Enhancement Mode MOSFET
Attention
1,Any and all APM Microelectronics products described or contained herein do not have specifications
that can handle applications that require extremely high levels of reliability, such a
s
l
ife support systems,
aircraft’s control systems, or other applications whose failure can be reasonably expected to result in
serious physical and/or material damage. Consult with your APM Microelectronics representative nearest
you before using any APM Microelectronics products described or contained herein in such applications.
2,APM Microelectronics assumes no responsibility for equipment failures that result from usin
g
p
roducts
at values that exceed, even momentarily, rated values (such as maximum ratings, operatingcondition
ranges, or other parameters) listed in products specifications of any and all APM Microelectronics
products described or contained herein.
3, Specifications of any and all APM Microelectronics products described or contained her
e
i
nstipulate the
performance, characteristics, and functions of the descri
b
e
d products in the independent state, and are
not guarantees of the performance, characteristics, and functions of thedescribed products as mounted
in the customer
’
s products or equipment. To verify symptoms andstates that cannot be evaluated in an
independent device, the customer should always evaluate and test devices mounted in the customer
’
s
products or equipment.
4, APM Microelectronics Semiconductor CO., LTD. strives to supply high quality high reliabilityproducts.
However, any and all semiconductor products fail with some probability. It is possible tha
t
t
hese
probabilistic failures could give rise to accidents or events that could endanger human lives that could
give rise to smoke or fire, or that could cause damage to other property. Whendesigning equipment,
adopt safety measures so that these kinds of accidents or events canno
t
o
ccur. Such measures include
but are not limited to protective circuits and error prevention circuits for safe design, redundant
design,and structural design.
5,In the event that any or all APM Microelectronics products(including technical data, services) described
or contained herein are controlled under any of applicable local export control laws and regulations, such
products must not be exported without obtaining the export license from the authorities concerned in
accordance with the above law.
6, No part of this publication may be reproduced or transmitted in any form or by any means,electronic or
mechanical, including photocopying and recording, or any information storage or retrieval system, or
otherwise, without the prior written permission of APM Microelectronics Semiconductor CO., LTD.
7, Information (including circuit diagrams and circuit parameters) herein is for example only; it i
s
n
ot
guaranteed for volume production. APM Microelectronics believes information herein is accurate and
reliable, but no guarantees are made or implied regarding its use or any infringements o
f
i
ntellectual
property rights or other rights of third parties.
8, Any and all information d
e
s
cribed or contained herein are subject to change without notice du
e
t
o
product/technology improvement,etc. When designing equipment, refer to the “DeliverySpecification” for
the APM Microelectronics product that you Intend to use.
AP5N20D-H RVE1.1
永源微電子科技有限公司
AP5N20D-H
200V N-Channel Enhancement Mode MOSFET
Edition
Rve1.0
R
ve
1.1
Date
Change
2020/5/31
2020/3/15
Initial release
Change layout format
Copyright Attribution“APM-Microelectronice”
AP5N20D-H RVE1.1
永源微電子科技有限公司
