AGM-Semi-AGM312M1

Part #AGM-Semi-AGM312M1
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AGM-Semi-AGM312M1
AGM312M1  
●
General Description  
Product Summary  
The AGM312M1 combines advanced trench  
MOSFET technology with a low resistance  
package to provide extremely low R

DS(ON)

. This  
device is ideal for load switch and battery  
protection applications.  
BVDSS  
30V  
RDSON  
ID  
18
mΩ  
30
mΩ  
9.0A  
-7.2A  
-30V  
●
Features  
■
Advance high cell density Trench technology  
■
Low R

DS(ON)

to minimize conductive loss  
■
Low Gate Charge for fast switching  
■
Low Thermal resistance  
SOP-8 Pin Configuration  
D1  
D2  
●
Application  
■
MB/VGA Vcore  
■
SMPS 2

nd

Synchronous Rectifier  
G1  
G2  
■
POL application  
S1  
■
BLDC Motor driver  
S2  
Pac
k
age Mar
k
ing and Ordering Information  
Device Marking  
Device  
Device Package  
Reel Size  
Tape width  
Quantity  
SOP-8  
325mm  
16mm  
3000  
AGM312M  
AGM312M1  
Table 1.
 
Absolute Maximum Ratings (T
A
=25 )  
℃
Rating  
N-Ch  
P-Ch  
Units  
V
Symbol  
V
DS  
Parameter  
30  
-30  
Drain-Source Voltage (
V
GS=
0V
)
 
±20  
V
GS  
Gate-Source Voltage (
V
DS=
0V)  
V
A
A
±20  
-7.2  
(Note 1)  
Drain Current-Continuous(T
c
=25
℃
)  
9.0  
I

D  

IDM (pluse)  
P

D  

Drain Current-Continuous(Tc=100
℃
)  
5.7  
-4.7  
-19  
Drain Current-Continuous@ Current-Pulsed

(Note 2)  

24  
A
Total Power Dissipation(T
c
=25
℃
)  
5
5
W
W
0.2  
Total Power Dissipation(TA=100
℃
)  
0.2  
(Note 3)  
25  
25  
Avalanche energy  
EAS  
mJ  
Operating Junction and Storage Temperature Range  
TJ,TSTG  
-55 To 150  
℃
-55 To 150  
Table 2.
 
Thermal Characteristic  
Symbol  
Parameter  
Typ  
Max  
Unit  
℃
/W  
℃
/W  
Thermal Resistance Junction-ambient (Steady State)

1  

—  
62  
R

θ
JA  

R

θ
JC  

Thermal Resistance Junction-Case

1  

—  
24  
1
VER2.4  

AGM312M1  
ELECTRICAL SPECIFICATIONS
(T

A

= 25°C unless otherwise noted)  
PARAMETER  
Static

(Note 4)  

CONDITIONS  
SYMBOL  
MIN  
TYP  
MAX UNIT  
Drain-Source Breakdown Voltage  
Gate Threshold Voltage  
Gate Body Leakage  
V

GS

= 0V, I

D

= 250µA  
V

DS

= V

GS

, I

D

= 250µA  
V

GS

= ±20V, V

DS

= 0V  
BV

DSS  

V

GS(TH)  

I

GSS  

30  
1.2  
—  
—  
1.5  
—  
—  
2.5  
±100  
1
V
V
nA  
V

DS

= 30V, V

GS

= 0V  
V

DS

= 24V, Tc = 125ºC  
V

GS

= 10V, I

D

= 10A  
V

GS

= 4.5V, I

D

= 6A  
V

DS

= 5V, I

D

= 6A  
—  
—  
Zero Gate Voltage Drain Current  
Drain-Source On-State Resistance  
I

DSS  

µA  
—  
—  
10  
29  
32  
—  
—  
18  
22  
13  
R

DS(on)  

m
Ω  
—  
Forward Transconductance  
Dynami
c

(Note 5)  

S
g
fs  
—  
Total Gate Charge  
Q

g  

Q

gs  

Q

gd  

—  
—  
—  
—  
—  
—  
4.1  
1
—  
—  
—  
—  
—  
—  
V

DS

= 15V, I

D

= 8A,  
V

GS

= 4.5V  
Gate-Source Charge  
Gate-Drain Charge  
nC  
pF  
2.1  
370  
55  
32  
Input Capacitance  
C
iss  
V

DS

= 25V, V

GS

= 0V,  
f = 1.0MHz  
Output Capacitance  
Reverse Transfer Capacitance  
C

oss  

C
rss  
Switching

(Note 6)  

Turn-On Delay Time  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
t

d(on)  

t

r  

t

d(off)  

t

f  

—  
—  
—  
—  
2.8  
7.2  
—  
—  
—  
—  
V

DD

= 15V, I

D

= 1A,  
ns  
R

GEN

=6
Ω  
15.8  
4.6  
Notes:  
1. Current
 
limited by package  
2. Pulse
 
width limited by the maximum junction temperature  
3. L
 
= 0.1mH, I

AS

= 17A, V

DD

= 25V, R

G

=
25Ω, Start
ing T

J

= 25

o

C  
4. Pulse
 
test: PW
≤
300µs, duty cycle
≤
2%  
5. For
 
DESIGN AID ONLY, not subject to production testing.  
6. Switching
 
time is essentially independent of operating temperature.  
2
VER2.4  

AGM312M1  
N- Channel Typical Electrical and Thermal Characteristics (Curves)  
●
Thermal resistance  
Parameter  
Symbol  
Min. Typ.
 
Max.  
Unit  
Thermal resistance, junction – case  
R
thJC  
R
thJA  
T
sold  
–
–
–
–
34  
°
C/W  
°
C/W  
°
C  
Thermal resistance, junction – ambient  
Soldering temperature, wavesoldering for 10s  
180  
–
–
265  
●
Electronic Characteristics  
Parameter  
Symbol  
BV

DSS  

Condition  
Min.  
-30  
Typ  
Max.  
Unit  
Drain-Source Breakdown  
Voltage  
V

GS

=0V,I

D

=-250uA  
V
Gate Threshold Voltage  
V

GS(TH)  

V

GS

=V

DS

, I

D

=-250uA  
V

DS

=-30V, V

GS

=0V  
V

GS

=±12V ,V

DS

=0V  
V

GS

=-10V, I

D

=-20A  
V

GS

=-4.5V, I

D

=-10A  
V

DS

=-10V, I

D

=-5A  
Is=-20A  
-1.2  
-2.5  
-1.0  
±
100  
42  
V
Drain-Source Leakage Current
 
I

DSS  

Gate- Source Leakage Current
 
I

GSS  

uA  
nA  
3
1
 
3
9  
6
m
Ω
 
m
Ω  
s
Static Drain-source On  
Resistance  
R

DS(ON)  

56  
Forward Transconductance  
Source-drain voltage  
g

FS  

V

SD  

1.28  
V
●Electronic Characteristics  
Parameter  
Symbol  
Condition  
Min.  
Typ  
Max.  
Unit  
Input capacitance  
C

iss  

–
850  
–
Output capacitance  
C

oss  

C

rss  

f = 1MHz  
–
–
140  
103  
–
–
pF  
Reverse transfer capacitance  
●
Gate Charge characteristics(T
a
= 25
℃
)  
Parameter  
Symbol  
Condition  
Min.  
Typ  
Max.  
Unit  
Total gate charge  
Q

g  

–
–
13  
7
–
–
V

DD

=25V  
I

D

= 2A  
Gate – Source charge  
Q

gs  

nC  
V

GS

= 10V  
Gate – Drain charge  
Q

gd  

–
2
–
3
VER2.4  

AGM312M1  
N-CH Electrical Characteristics (TJ=25
℃
, unless otherwise  
25  
20  
15  
10  
20  
16  
12  
8
V
GS
= 5~10V  
V
GS
4V  
5
0
4
0
V
GS
3V  
5
0
1
2
3
4
6
0
1
2
3
4
5
6
V
DS
, Drain-to-Sourc
e
V
oltage
(V)  
Figure 1. Output
Characteristics  
V
GS
, Gate-to-Source Voltage
(V)  
Figure 2. Transfer
Characteristics  
1.1  
1.075  
1.05  
1.025  
1
2
V
G
= 10V  
I
D
= 6.9A  
I
D
= 250uA  
1.75  
1.5  
1.25  
1
0.975  
0.95  
0.925  
0.75  
0.5  
0.25  
-50  
-25  
0
25  
50  
75 100
 
125  
-50 -25  
0
25  
50 75  
100 125  
T
j
, Junction Temperature
(°C)  
T
j
, Junction Temperature (°C)  
Figure 3. Breakdown Voltage Variation
with  
Temperature  
Figure 4. On-Resistance Variation with Temperature  
V
DS
= 10V  
I
D
= 1A  
I
D
= 250uA  
1.2  
1.1  
1
6
4
2
0.9  
0.8  
0.7  
0.6  
0
0
2
4
6
8
10  
-50 -25  
0
25  
T
j
, Junction Temperature
(°C)  
Figure 5. Gate Threshold Variation with Temperature  
50  
75 100
 
125  
Q
g
, Total Gate Charge
(n  
C
)  
Figure 6. Gate C
 
rg  
h
a e  
4
VER2.4  

AGM312M1  
20  
10  
40  
20  
10  
0
.
0012S  
0.01S  
1
0
.
1S  
V
GS
= 10V  
Single Pulse  
T
A
=25ºC  
0.1  
DC  
1
0.04  
0.75 0.85  
0.93  
1.0  
1.06  
1.11  
0.5  
0.1  
1
3
10  
30 50  
V
DS
, Drain-Source Voltage
(V)  
Figure 7. Maximum Safe
Operating  
Area  
V
SD
, Body Diode Forward Voltage (V)  
Figure 8. Body Diode Forward Voltage Variation  
with Source Current  
V
DD  
V
DS  
90%  
R
L
D
Vout  
Vin  
G
V
GS  
R
GEN  
10%  
V
GS  
S
t

d(on)  

t

d(off)  

t

r  

t

f  

Figure 9. Switching Test Circuit and
Switching  
Waveforms  
2
1
Duty Cycle = 0.5  
0.2  
0.1  
P
DM  
0.1  
0.05  
t
1  
t
2  
0.02  
1. R
th
JA
(t)=r (t) * R
th
JA  
2. R
th
JA
=See Datasheet  
3. T
JM
– T
A
= P
DM
* R
th
JA
(t)  
4. Duty C
y
c
le, D = t
1
/t
2  
Single Pulse  
0.01  
1
0

-4  

1
0

-3  

1
0

-2  

1
0

-1  

1
10  
100  
600  
Square Wave Pulse Duration
(sec)  
Figure 10. Normalized Thermal Transient Impedance
Curve  
5
VER2.4  

AGM312M1  
●
P Channel characteristics curve  
Fig.1 Power Dissipation Derating Curve  
Fig.2 Typical output Characteristics  
1.2  
1
50  
V

GS

=-10V  
V

GS

=-4.5V  
0.8  
0.6  
0.4  
0.2  
0
25  
0
0
0.5  
1
1.5  
2
0
50  
100  
150  
200  
Temperature (

。

C)  
Drain-Source voltage (V)  
Fig.3 Threshold Voltage V.S Junction Temperature
 
Fig.4 Resistance V.S Drain Current  
Junction Temperature  
50  
30  
20  
10  
0
-50  
150  
0
-0.5  
-1  
-1.5  
-2  
0
10  
20  
30  
40  
Drain Current(-A)  
-2.5  
Fig.5 On-Resistance VS Gate Source Voltage  
Fig.6 On-Resistance V.S Junction Temperature  
1.5  
40  
30  
20  
10  
0
1
0.5  
3
5
7
9
-50  
0
50  
100  
150  
V

GS

( -V )  
Temperature  
6
VER2.4  

AGM312M1  
●
Test Circuit  
Fig.1 Switching Time Measurement Circuit  
Fig.2 Gate Charge Waveform  
Fig.3 Switching Time Measurement Circuit  
Fig.4 Gate Charge Waveform  
Fig.5 Avalanche
 
Measurement Circuit  
Fig.6 Avalanche
 
Waveform  
7
VER2.4  

AGM312M1  
Package Outline  
SOIC-8, 8leads  
8
VER2.4  

AGM312M1  
Disclaimer:  
The information provided in this document is believed to be accurate and reliable.  
however,Shenzhen Core Control
E
lectronics Technology Co., Ltd. does not assume  
any responsibility for the following consequencesDo not consider the use of such  
information or use beyond its scope.  
The information mentioned in this document may be changed at any time without  
notice.  
The products and information provided in this document do not infringe patents.  
Shenzhen Core Control
E
lectronics Technology Co., Ltd. assumes no responsibility  
for any infringement of any other rights of third parties.The result of using such  
products and information.  
This document is the second version issued on
O
ctober 10, 201
9
. This document  
replaces and
R
eplace all previously provided information.  
It is a registered trademark of Shenzhen Core Control
E
lectronics  
Technology Co., Ltd.  
Copyright © 2017 Shenzhen Core Control
E
lectronics Technology Co., Ltd. all rights  
reserved.  
9
VER2.4