Alpha—Omega-Semicon-AO4606

Part #Alpha—Omega-Semicon-AO4606
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Alpha—Omega-Semicon-AO4606
AO4606  
30V Complementary MOSFET  
General Description  
Product Summary  
The AO4606 uses advanced trench technology  
MOSFETs to provide excellent R

DS(ON)

and low gate  
charge. The complementary MOSFETs may be used to  
form a level shifted high side switch, and for a host of  
other applications.  
N-Channel  
P-Channel  
V

DS

= 30V  
-30V  
I

D

= 6A
 
(V

GS

=10V)  
R

DS(ON)  

-6.5A (V

GS

=-10V)  
R

DS(ON)  

< 30m
ꢀ
(V

GS

=10V)  
< 42m
ꢀ
(V

GS

=4.5V)  
< 28m
ꢀ
(VGS=-10V)  
< 44m
ꢀ
(VGS=-4.5V)  
100% UIS Tested  
100% R

g

Tested  
100% UIS Tested  
100% R

g

Tested  
SOIC-8  
D2  
D1  
Top View  
Bottom View  
Top View  
S2  
G2  
S1  
G1  
D2  
D2  
D1  
D1  
1
2
3
4
8
7
6
5
G2  
G1  
S2  
S1  
Pin1  
n-channel  
p-channel  
Absolute Maximum Ratings
 
T

A

=25
°
C
u
nless otherwise noted  
Parameter  
Symbol  
V

DS  

Max n-channel  
Max p-channel  
Units  
Drain-Source Voltage  
Gate-Source Voltage  
30  
±20  
6
-30  
±20  
-6.5  
-5.3  
-30  
V
V
V

GS  

T

A

=25
°
C  
T

A

=70
°
C  
Continuous Drain  
Current  
Pulsed Drain Current

C  

Avalanche Current

C  

I

D  

A
5
I

DM  

30  
I

AS

, I

AR  

E

AS

, E

AR  

10  
5
23  
26  
2
A
Avalanche energy L=0.1mH

C  

mJ  
T

A

=25
°
C  
2
P

D  

W
°C  
Power Dissipation

B  

T

A

=70
°
C  
1.3  
1.3  
Junction and Storage Temperature Range  
T

J

, T

STG  

-55 to 150  
Thermal Characteristics  
Parameter  
Symbol  
Typ  
48  
Max  
62.5  
90  
Units  
°
C
/W  
°
C
/W  
°
C
/W  
Maximum Junction-to-Ambient

A  

Maximum Junction-to-Ambient

A D  

Maximum Junction-to-Lead  
t
≤
10s  
R

θ
JA  

Steady-State  
Steady-State  
74  
R

θ
JL  

32  
40  
Rev 10: April 2012  
Page 1 of 9  

AO4606  
N-Channel Electrical Characteristics (T

J

=25
°
C
u
nless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
STATIC PARAMETERS  
I

D

=250
µ
A, V

GS

=0V  
BV

DSS  

Drain-Source Breakdown Voltage  
30  
V
V

DS

=30V, V

GS

=0V  
1
5
I

DSS  

Zero Gate Voltage Drain Current  
µ
A  
T

J

=55
°
C  
I

GSS  

V

DS

=0V, V

GS

=±20V  
V

DS

=V

GS

I

D

=250
µ
A  
Gate-Body leakage current  
Gate Threshold Voltage  
On state drain current  
±100  
2.4  
nA  
V
V

GS(th)  

I

D(ON)  

1.2  
30  
1.8  
V

GS

=10V, V

DS

=5V  
V

GS

=10V, I

D

=6A  
A
25  
40  
30  
48  
42  
m
Ω  
R

DS(ON)  

Static Drain-Source On-Resistance  
T

J

=125
°
C  
V

GS

=4.5V, I

D

=5A  
V

DS

=5V, I

D

=6A  
I

S

=1A,V

GS

=0V  
33.5  
15  
m
Ω  
S
g

FS  

V

SD  

I

S  

Forward Transconductance  
Diode Forward Voltage  
0.76  
1
V
Maximum Body-Diode Continuous Current  
2.5  
A
DYNAMIC PARAMETERS  
C

iss  

C

oss  

C

rss  

R

g  

Input Capacitance  
200  
30  
255  
45  
310  
60  
pF  
pF  
pF  
Ω
V

GS

=0V, V

DS

=15V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
20  
35  
50  
V

GS

=0V, V

DS

=0V, f=1MHz  
1.6  
3.25  
4.9  
SWITCHING PARAMETERS  
Q

g

(10V) Total
 
Gate Charge  
Q

g

(4.5V) Total
 
Gate Charge  
4
2
5.2  
2.55  
0.85  
1.3  
6
3
nC  
nC  
nC  
nC  
ns  
V

GS

=10V, V

DS

=15V, I

D

=6A  
Q

gs  

Q

gd  

t

D(on)  

t

r  

Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
4.5  
Turn-On Rise Time  
V

GS

=10V, V

DS

=15V, R

L

=2.5
Ω
,  
R

GEN

=3
Ω  
2.5  
ns  
t

D(off)  

t

f  

Turn-Off DelayTime  
14.5  
3.5  
ns  
Turn-Off Fall Time  
ns  
t

rr  

I

F

=6A, dI/dt=100A/
µ
s  
I

F

=6A, dI/dt=100A/
µ
s  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
8.5  
12  
3
ns  
Q

rr  

nC  
2.2  
A. The value of R

θ
JA

is measured with the device mounted on 1in

2

FR-4 board with 2oz. Copper, in a still air environment with T

A

=25
°
C. The  
value in any given application depends on the user’s specific board design.  
B. The power dissipation P

D

is based on T

J(MAX)

=150
°
C, using
≤
10s junction-to-ambient thermal resistance.  
C. Repetitive
 
rating, pulse width limited by junction temperature T

J(MAX)

=150
°
C. Ratings are based on low frequency and duty cycles to keep  
initialT

J

=25
°
C.  
D. The R

θ
JA

is the sum of the thermal impedence from junction to lead R

θ
JL

and lead to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300
µ
s pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-ambient thermal impedence which is measured with the device mounted on 1in

2

FR-4 board with  
2oz. Copper, assuming a maximum junction temperature of T

J(MAX)

=150
°
C. The SOA curve provides a single pulse rating.  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS.
 
AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.  
Rev 10: April
 
2012  
Page 2 of 9  

AO4606  
N-Channel: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
30  
25  
20  
15  
10  
5
15  
12  
9
10V  
V

DS

=5V  
4.5V  
7V  
4V  
3.5V  
6
125
°
C  
3
25
°
C  
V

GS

=3V  
0
0
0
1
2
3
4
5
1
1.5  
2
2.5  
V

GS

(Volts)  
3
3.5  
4
V

DS

(Volts)  
Fig 1: On-Region Characteristics (Note E)  
Figure 2: Transfer Characteristics (Note E)  
45  
2
V

GS

=4.5V  
I

D

=6A  
1.8  
1.6  
1.4  
1.2  
1
40  
35  
30  
25  
20  
V

GS

=4.5V  
V

GS

=10V  
I

D

=8A  
V

GS

=10V  
0.8  
0
3
6
9
12  
15  
0
25  
50  
75  
100  
125  
150  
175  
I

D

(A)  
Temperature (
°
C
)  
Figure 3: On-Resistance vs. Drain Current and Gate  
Voltage (Note E)  
Figure 4: On-Resistance vs. Junction Temperature  
(Note E)  
100  
80  
1.0E+02  
1.0E+01  
I

D

=6A  
1.0E+00  
125
°
C  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
60  
125
°
C  
25
°
C  
25
°
C  
40  
20  
0
2
4
6
8
10  
0.0  
0.2  
0.4  
V

SD

(Volts)  
Figure 6: Body-Diode Characteristics (Note E)  
0.6  
0.8  
1.0  
1.2  
V

GS

(Volts)  
Figure 5: On-Resistance vs. Gate-Source Voltage  
(Note E)  
Rev 10: April
 
2012  
Page 3 of 9  

AO4606  
N-Channel: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
10  
500  
400  
300  
200  
100  
0
V

DS

=15V  
I

D

=6A  
8
C

iss  

6
4
C

oss  

2
C

rss  

0
0
5
10  
15  
20  
25  
30  
0
2
4
6
V

DS

(Volts)  
Q

g

(nC)  
Figure 8: Capacitance Characteristics  
Figure 7: Gate-Charge Characteristics  
100.0  
10.0  
1.0  
1000  
100  
10  
T

A

=25
°
C  
10
µ
s  
R

DS(ON)  

limited  
100
µ
s  
1ms  
10ms  
0.1  
T

J(Max)

=150
°
C  
T

A

=25
°
C  
10s  
DC  
1
0.0  
0.00001  
0.001  
0.1  
10  
1000  
0.01  
0.1  
1
10  
100  
V

DS

(Volts)  
Pulse Width (s)  
Figure 10: Single Pulse Power Rating Junction-  
to-Ambient (Note F)  
Figure 9: Maximum Forward Biased  
Safe Operating Area (Note F)  
10  
In descending order  
D=T

on

/T  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
T

J,PK

=T

A

+P

DM

.Z

θ
JA

.R

θ
JA  

R

θ
JA

=90
°
C/W  
1
0.1  
P

D  

0.01  
0.001  
T

on  

T
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
Pulse Width (s)  
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)  
Rev 10: April
 
2012  
Page 4 of 9  

AO4606  
Gate Charge Test Circuit & Waveform  
Vgs  
Qg  
10V  
+
VDC  
+
Qgs  
Qgd  
Vds  
VDC  
–
–
DUT  
Vgs  
Ig  
Charge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vds  
Vds  
90%  
10%  
+
DUT  
Vdd  
Vgs  
VDC  
Rg  
–
Vgs  
Vgs  
t

d(on)  

t
r
t

d(off)  

t
f
t

on  

t

off  

Unclamped Inductive Switching (UIS) Test Circuit & Waveforms  
L
E

AR

= 1/2 L
I

A

2

R  

B
V

DSS  

Vds  
Id  
Vgs  
Vds  
+
Vgs  
Vdd  
I

AR  

VDC  
Id  
Rg  
–
DUT  
Vgs  
Vgs  
Diode Recovery Test Circuit & Waveforms  
Q

rr

= –
 
Idt  
Vds +  
Vds –  
Ig  
DUT  
Vgs  
t

rr  

L
Isd  
I

F  

Isd  
Vgs  
dI/dt  
I

RM  

+
Vdd  
VDC  
Vdd  
–
Vds  
Rev 10: April
 
2012  
Page 5 of 9  

AO4606  
P-Channel Electrical Characteristics (T

J

=25
°
C
u
nless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
STATIC PARAMETERS  
I

D

=-250
µ
A, V

GS

=0V  
BV

DSS  

Drain-Source Breakdown Voltage  
-30  
V
V

DS

=-30V, V

GS

=0V  
-1  
-5  
I

DSS  

Zero Gate Voltage Drain Current  
µ
A  
T

J

=55
°
C  
V

DS

=0V, V

GS

=±20V  
I

GSS  

Gate-Body leakage current  
Gate Threshold Voltage  
On state drain current  
±100  
-2.4  
nA  
V
V

GS(th)  

I

D(ON)  

V

DS

=V

GS

I

D

=-250
µ
A  
V

GS

=-10V, V

DS

=-5V  
V

GS

=-10V, I

D

=-6.5A  
-1.3  
-30  
-1.85  
A
22  
32  
28  
40  
44  
m
Ω  
R

DS(ON)  

Static Drain-Source On-Resistance  
T

J

=125
°
C  
V
V

GS

=-4.5V, I

D

=-5A  

DS

=-5V, I

D

=-6.5A  
34  
m
Ω  
S
g

FS  

V

SD  

I

S  

Forward Transconductance  
Diode Forward Voltage  
18  
I

S

=-1A,V

GS

=0V  
-0.8  
-1  
V
Maximum Body-Diode Continuous Current  
-2.5  
A
DYNAMIC PARAMETERS  
C

iss  

C

oss  

C

rss  

R

g  

Input Capacitance  
760  
140  
95  
pF  
pF  
pF  
Ω
V

GS

=0V, V

DS

=-15V, f=1MHz  
V

GS

=0V, V

DS

=0V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
1.5  
3.2  
5
SWITCHING PARAMETERS  
Q

g

(10V) Total
 
Gate Charge  
Q

g

(4.5V) Total
 
Gate Charge  
13.6  
6.7  
2.5  
3.2  
8
16  
8
nC  
nC  
nC  
nC  
ns  
V

GS

=10V, V

DS

=-15V, I

D

=-6.5A  
Q

gs  

Q

gd  

t

D(on)  

t

r  

Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
Turn-On Rise Time  
V

GS

=10V, V

DS

=-15V, R

L

=2.3
Ω
,  
R

GEN

=3
Ω  
6
ns  
t

D(off)  

t

f  

Turn-Off DelayTime  
17  
5
ns  
Turn-Off Fall Time  
ns  
t

rr  

I

F

=-6.5A, dI/dt=100A/
µ
s  
I

F

=-6.5A, dI/dt=100A/
µ
s  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
15  
9.7  
ns  
Q

rr  

nC  
A. The value of R

θ
JA

is measured with the device mounted on 1in

2

FR-4 board with 2oz. Copper, in a still air environment with T

A

=25
°
C. The  
value in any given application depends on the user’s specific board design.  
B. The power dissipation P

D

is based on T

J(MAX)

=150
°
C, using
≤
10s junction-to-ambient thermal resistance.  
C. Repetitive
 
rating, pulse width limited by junction temperature T

J(MAX)

=150
°
C. Ratings are based on low frequency and duty cycles to keep  
initialT

J

=25
°
C.  
D. The R

θ
JA

is the sum of the thermal impedence from junction to lead R

θ
JL

and lead to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300
µ
s pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-ambient thermal impedence which is measured with the device mounted on 1in

2

FR-4 board with  
2oz. Copper, assuming a maximum junction temperature of T

J(MAX)

=150
°
C. The SOA curve provides a single pulse rating.  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS.
 
AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.  
Rev 10: April
 
2012  
Page 6 of 9  

AO4606  
P-Channel: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
40  
30  
20  
10  
0
40  
30  
20  
10  
0
V

DS

=-5V  
-10V  
-4.5V  
-4V  
-5V  
125
°
C  
-3.5V  
25
°
C  
V

GS

=-3V  
0
1
2
3
4
5
0
1
2
3
4
5
-V

DS

(Volts)  
Fig 1: On-Region Characteristics (Note E)  
-V

GS

(Volts)  
Figure 2: Transfer Characteristics (Note E)  
45  
1.8  
1.6  
1.4  
1.2  
1
V

GS

=-4.5V  
40  
35  
30  
25  
20  
15  
10  
V

GS

=-10V  
I

D

=-6.5A  

=-4.5

V  

I

D

=-5A  
V

GS  

V

GS

=-10V  
0.8  
0
5
10  
15  
20  
0
25  
50  
75  
100  
125  
150  
175  
-I

D

(A)  
Temperature (
°
C
)  

Figure 4: On-Resistance vs. Junctio
n

Temperature  

Figure 3: On-Resistance vs. Drain Current and Gate  
Voltage (Note E)  
(Note E)  
90  
1.0E+02  
1.0E+01  
I

D

=-6.5A  
70  
50  
30  
10  
1.0E+00  
125
°
C  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
125
°
C  
25
°
C  
25
°
C  
2
4
6
8
10  
0.0  
0.2  
0.4  
-V

SD

(Volts)  
Figure 6: Body-Diode Characteristics (Note E)  
0.6  
0.8  
1.0  
1.2  
-V

GS

(Volts)  
Figure 5: On-Resistance vs. Gate-Source Voltage  
(Note E)  
Rev 10: April
 
2012  
Page 7 of 9  

AO4606  
P-Channel: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
10  
1200  
1000  
800  
600  
400  
200  
0
V

DS

=-15V  
I

D

=-6.5A  
8
C

iss  

6
4
C

oss  

2
C

rss  

0
0
5
10  
15  
-V

DS

(Volts)  
20  
25  
30  
0
3
6
9
12  
15  
Q

g

(nC)  
Figure 8: Capacitance Characteristics  
Figure 7: Gate-Charge Characteristics  
1000  
100  
10  
100.0  
10.0  
1.0  
T

A

=25
°
C  
10
µ
s  
R

DS(ON)  

limited  
100
µ
s  
1ms  
10ms  
0.1  
DC  
T

J(Max)

=150
°
C  
T

A

=25
°
C  
10s  
0.0  
1
0.01  
0.1  
1
10  
100  
0.00001  
0.001  
0.1  
10  
1000  
-V

DS

(Volts)  
Pulse Width (s)  
Figure 9: Maximum Forward Biased Safe  
Operating Area (Note F)  
Figure 10: Single Pulse Power Rating Junction-  
to-Ambient (Note F)  
10  
D=T

on

/T  
In descending order  
T

J,PK

=T

A

+P

DM

.Z

θ
JA

.R

θ
JA  

D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
1
R

θ
JA

=90
°
C/W  
0.1  
P

D  

0.01  
T

on  

T
0.001  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
Pulse Width (s)  
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)  
Rev 10: April
 
2012  
Page 8 of 9  

AO4606  
Gate Charge Test Circuit & Waveform  
Vgs  
Qg  
–
-10V  
–
VDC  
Qgs  
Qgd  
+
Vds  
VDC  
+
DUT  
Vgs  
Ig  
Charge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vds  
t

off  

t

on  

t
t

d(off)  

t

d(on)  

t
r
f
Vgs  
–
90%  
10%  
DUT  
Vdd  
Vgs  
VDC  
+
Rg  
Vgs  
Vds  
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms  
E

AR

= 1/2 LI

A

2

R  

L
Vds  
Id  
Vgs  
Vds  
BV

DSS  

Vgs  
Vdd  
+
VDC  
Id  
Rg  
I

AR  

DUT  
Vgs  
Vgs  
Diode Recovery Test Circuit & Waveforms  
Q

rr

= –
 
Idt  
Vds +  
Vds –  
Ig  
DUT  
Vgs  
t

rr  

L
-Isd  
-I

F  

Isd  
Vgs  
dI/dt  
-I

RM  

+
Vdd  
VDC  
Vdd  
–
-Vds  
Rev 10: April
 
2012  
Page 9 of 9