Alpha—Omega-Semicon-AO4606
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AO4606
30V Complementary MOSFET
General Description
Product Summary
The AO4606 uses advanced trench technology
MOSFETs to provide excellent R
DS(ON)
and low gate
charge. The complementary MOSFETs may be used to
form a level shifted high side switch, and for a host of
other applications.
N-Channel
P-Channel
V
DS
= 30V
-30V
I
D
= 6A
(V
GS
=10V)
R
DS(ON)
-6.5A (V
GS
=-10V)
R
DS(ON)
< 30m
ꢀ
(V
GS
=10V)
< 42m
ꢀ
(V
GS
=4.5V)
< 28m
ꢀ
(VGS=-10V)
< 44m
ꢀ
(VGS=-4.5V)
100% UIS Tested
100% R
g
Tested
100% UIS Tested
100% R
g
Tested
SOIC-8
D2
D1
Top View
Bottom View
Top View
S2
G2
S1
G1
D2
D2
D1
D1
1
2
3
4
8
7
6
5
G2
G1
S2
S1
Pin1
n-channel
p-channel
Absolute Maximum Ratings
T
A
=25
°
C
u
nless otherwise noted
Parameter
Symbol
V
DS
Max n-channel
Max p-channel
Units
Drain-Source Voltage
Gate-Source Voltage
30
±20
6
-30
±20
-6.5
-5.3
-30
V
V
V
GS
T
A
=25
°
C
T
A
=70
°
C
Continuous Drain
Current
Pulsed Drain Current
C
Avalanche Current
C
I
D
A
5
I
DM
30
I
AS
, I
AR
E
AS
, E
AR
10
5
23
26
2
A
Avalanche energy L=0.1mH
C
mJ
T
A
=25
°
C
2
P
D
W
°C
Power Dissipation
B
T
A
=70
°
C
1.3
1.3
Junction and Storage Temperature Range
T
J
, T
STG
-55 to 150
Thermal Characteristics
Parameter
Symbol
Typ
48
Max
62.5
90
Units
°
C
/W
°
C
/W
°
C
/W
Maximum Junction-to-Ambient
A
Maximum Junction-to-Ambient
A D
Maximum Junction-to-Lead
t
≤
10s
R
θ
JA
Steady-State
Steady-State
74
R
θ
JL
32
40
Rev 10: April 2012
Page 1 of 9
AO4606
N-Channel Electrical Characteristics (T
J
=25
°
C
u
nless otherwise noted)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
STATIC PARAMETERS
I
D
=250
µ
A, V
GS
=0V
BV
DSS
Drain-Source Breakdown Voltage
30
V
V
DS
=30V, V
GS
=0V
1
5
I
DSS
Zero Gate Voltage Drain Current
µ
A
T
J
=55
°
C
I
GSS
V
DS
=0V, V
GS
=±20V
V
DS
=V
GS
I
D
=250
µ
A
Gate-Body leakage current
Gate Threshold Voltage
On state drain current
±100
2.4
nA
V
V
GS(th)
I
D(ON)
1.2
30
1.8
V
GS
=10V, V
DS
=5V
V
GS
=10V, I
D
=6A
A
25
40
30
48
42
m
Ω
R
DS(ON)
Static Drain-Source On-Resistance
T
J
=125
°
C
V
GS
=4.5V, I
D
=5A
V
DS
=5V, I
D
=6A
I
S
=1A,V
GS
=0V
33.5
15
m
Ω
S
g
FS
V
SD
I
S
Forward Transconductance
Diode Forward Voltage
0.76
1
V
Maximum Body-Diode Continuous Current
2.5
A
DYNAMIC PARAMETERS
C
iss
C
oss
C
rss
R
g
Input Capacitance
200
30
255
45
310
60
pF
pF
pF
Ω
V
GS
=0V, V
DS
=15V, f=1MHz
Output Capacitance
Reverse Transfer Capacitance
Gate resistance
20
35
50
V
GS
=0V, V
DS
=0V, f=1MHz
1.6
3.25
4.9
SWITCHING PARAMETERS
Q
g
(10V) Total
Gate Charge
Q
g
(4.5V) Total
Gate Charge
4
2
5.2
2.55
0.85
1.3
6
3
nC
nC
nC
nC
ns
V
GS
=10V, V
DS
=15V, I
D
=6A
Q
gs
Q
gd
t
D(on)
t
r
Gate Source Charge
Gate Drain Charge
Turn-On DelayTime
4.5
Turn-On Rise Time
V
GS
=10V, V
DS
=15V, R
L
=2.5
Ω
,
GEN
2.5
ns
t
D(off)
t
f
Turn-Off DelayTime
14.5
3.5
ns
Turn-Off Fall Time
ns
t
rr
I
F
=6A, dI/dt=100A/
µ
s
I
F
=6A, dI/dt=100A/
µ
s
Body Diode Reverse Recovery Time
Body Diode Reverse Recovery Charge
8.5
12
3
ns
Q
rr
nC
2.2
A. The value of R
θ
JA
is measured with the device mounted on 1in
2
FR-4 board with 2oz. Copper, in a still air environment with T
A
=25
°
C. The
value in any given application depends on the user’s specific board design.
B. The power dissipation P
D
is based on T
J(MAX)
=150
°
C, using
≤
10s junction-to-ambient thermal resistance.
C. Repetitive
rating, pulse width limited by junction temperature T
J(MAX)
=150
°
C. Ratings are based on low frequency and duty cycles to keep
initialT
J
=25
°
C.
D. The R
θ
JA
is the sum of the thermal impedence from junction to lead R
θ
JL
and lead to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300
µ
s pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-ambient thermal impedence which is measured with the device mounted on 1in
2
FR-4 board with
2oz. Copper, assuming a maximum junction temperature of T
J(MAX)
=150
°
C. The SOA curve provides a single pulse rating.
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS.
AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
Rev 10: April
2012
Page 2 of 9
AO4606
N-Channel: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
30
25
20
15
10
5
15
12
9
10V
V
DS
=5V
4.5V
7V
4V
3.5V
6
125
°
C
3
25
°
C
V
GS
=3V
0
0
0
1
2
3
4
5
1
1.5
2
2.5
V
GS
(Volts)
3
3.5
4
V
DS
(Volts)
Fig 1: On-Region Characteristics (Note E)
Figure 2: Transfer Characteristics (Note E)
45
2
V
GS
=4.5V
I
D
=6A
1.8
1.6
1.4
1.2
1
40
35
30
25
20
V
GS
=4.5V
V
GS
=10V
I
D
=8A
V
GS
=10V
0.8
0
3
6
9
12
15
0
25
50
75
100
125
150
175
I
D
(A)
Temperature (
°
C
)
Figure 3: On-Resistance vs. Drain Current and Gate
Voltage (Note E)
Figure 4: On-Resistance vs. Junction Temperature
(Note E)
100
80
1.0E+02
1.0E+01
I
D
=6A
1.0E+00
125
°
C
1.0E-01
1.0E-02
1.0E-03
1.0E-04
1.0E-05
60
125
°
C
25
°
C
25
°
C
40
20
0
2
4
6
8
10
0.0
0.2
0.4
V
SD
(Volts)
Figure 6: Body-Diode Characteristics (Note E)
0.6
0.8
1.0
1.2
V
GS
(Volts)
Figure 5: On-Resistance vs. Gate-Source Voltage
(Note E)
Rev 10: April
2012
Page 3 of 9
AO4606
N-Channel: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
10
500
400
300
200
100
0
V
DS
=15V
I
D
=6A
8
C
iss
6
4
C
oss
2
C
rss
0
0
5
10
15
20
25
30
0
2
4
6
V
DS
(Volts)
Q
g
(nC)
Figure 8: Capacitance Characteristics
Figure 7: Gate-Charge Characteristics
100.0
10.0
1.0
1000
100
10
T
A
=25
°
C
10
µ
s
R
DS(ON)
limited
100
µ
s
1ms
10ms
0.1
T
J(Max)
=150
°
C
T
A
=25
°
C
10s
DC
1
0.0
0.00001
0.001
0.1
10
1000
0.01
0.1
1
10
100
V
DS
(Volts)
Pulse Width (s)
Figure 10: Single Pulse Power Rating Junction-
to-Ambient (Note F)
Figure 9: Maximum Forward Biased
Safe Operating Area (Note F)
10
In descending order
D=T
on
/T
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
T
J,PK
=T
A
+P
DM
.Z
θ
JA
.R
θ
JA
R
θ
JA
=90
°
C/W
1
0.1
P
D
0.01
0.001
T
on
T
0.00001
0.0001
0.001
0.01
0.1
1
10
100
1000
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)
Rev 10: April
2012
Page 4 of 9
AO4606
Gate Charge Test Circuit & Waveform
Vgs
Qg
10V
+
VDC
+
Qgs
Qgd
Vds
VDC
–
–
DUT
Vgs
Ig
Charge
Resistive Switching Test Circuit & Waveforms
RL
Vds
Vds
90%
10%
+
DUT
Vdd
Vgs
VDC
Rg
–
Vgs
Vgs
t
d(on)
t
r
t
d(off)
t
f
t
on
t
off
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms
L
E
AR
= 1/2 L
I
A
2
R
B
V
DSS
Vds
Id
Vgs
Vds
+
Vgs
Vdd
I
AR
VDC
Id
Rg
–
DUT
Vgs
Vgs
Diode Recovery Test Circuit & Waveforms
Q
rr
= –
Idt
Vds +
Vds –
Ig
DUT
Vgs
t
rr
L
Isd
I
F
Isd
Vgs
dI/dt
I
RM
+
Vdd
VDC
Vdd
–
Vds
Rev 10: April
2012
Page 5 of 9
AO4606
P-Channel Electrical Characteristics (T
J
=25
°
C
u
nless otherwise noted)
Symbol
Parameter
Conditions
Min
Typ
Max
Units
STATIC PARAMETERS
I
D
=-250
µ
A, V
GS
=0V
BV
DSS
Drain-Source Breakdown Voltage
-30
V
V
DS
=-30V, V
GS
=0V
-1
-5
I
DSS
Zero Gate Voltage Drain Current
µ
A
T
J
=55
°
C
V
DS
=0V, V
GS
=±20V
I
GSS
Gate-Body leakage current
Gate Threshold Voltage
On state drain current
±100
-2.4
nA
V
V
GS(th)
I
D(ON)
V
DS
=V
GS
I
D
=-250
µ
A
V
GS
=-10V, V
DS
=-5V
V
GS
=-10V, I
D
=-6.5A
-1.3
-30
-1.85
A
22
32
28
40
44
m
Ω
R
DS(ON)
Static Drain-Source On-Resistance
T
J
=125
°
C
V
V
GS
=-4.5V, I
D
=-5A
DS
=-5V, I
D
=-6.5A
34
m
Ω
S
g
FS
V
SD
I
S
Forward Transconductance
Diode Forward Voltage
18
I
S
=-1A,V
GS
=0V
-0.8
-1
V
Maximum Body-Diode Continuous Current
-2.5
A
DYNAMIC PARAMETERS
C
iss
C
oss
C
rss
R
g
Input Capacitance
760
140
95
pF
pF
pF
Ω
V
GS
=0V, V
DS
=-15V, f=1MHz
V
GS
=0V, V
DS
=0V, f=1MHz
Output Capacitance
Reverse Transfer Capacitance
Gate resistance
1.5
3.2
5
SWITCHING PARAMETERS
Q
g
(10V) Total
Gate Charge
Q
g
(4.5V) Total
Gate Charge
13.6
6.7
2.5
3.2
8
16
8
nC
nC
nC
nC
ns
V
GS
=10V, V
DS
=-15V, I
D
=-6.5A
Q
gs
Q
gd
t
D(on)
t
r
Gate Source Charge
Gate Drain Charge
Turn-On DelayTime
Turn-On Rise Time
V
GS
=10V, V
DS
=-15V, R
L
=2.3
Ω
,
GEN
6
ns
t
D(off)
t
f
Turn-Off DelayTime
17
5
ns
Turn-Off Fall Time
ns
t
rr
I
F
=-6.5A, dI/dt=100A/
µ
s
I
F
=-6.5A, dI/dt=100A/
µ
s
Body Diode Reverse Recovery Time
Body Diode Reverse Recovery Charge
15
9.7
ns
Q
rr
nC
A. The value of R
θ
JA
is measured with the device mounted on 1in
2
FR-4 board with 2oz. Copper, in a still air environment with T
A
=25
°
C. The
value in any given application depends on the user’s specific board design.
B. The power dissipation P
D
is based on T
J(MAX)
=150
°
C, using
≤
10s junction-to-ambient thermal resistance.
C. Repetitive
rating, pulse width limited by junction temperature T
J(MAX)
=150
°
C. Ratings are based on low frequency and duty cycles to keep
initialT
J
=25
°
C.
D. The R
θ
JA
is the sum of the thermal impedence from junction to lead R
θ
JL
and lead to ambient.
E. The static characteristics in Figures 1 to 6 are obtained using <300
µ
s pulses, duty cycle 0.5% max.
F. These curves are based on the junction-to-ambient thermal impedence which is measured with the device mounted on 1in
2
FR-4 board with
2oz. Copper, assuming a maximum junction temperature of T
J(MAX)
=150
°
C. The SOA curve provides a single pulse rating.
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS.
AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.
Rev 10: April
2012
Page 6 of 9
AO4606
P-Channel: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
40
30
20
10
0
40
30
20
10
0
V
DS
=-5V
-10V
-4.5V
-4V
-5V
125
°
C
-3.5V
25
°
C
V
GS
=-3V
0
1
2
3
4
5
0
1
2
3
4
5
-V
DS
(Volts)
Fig 1: On-Region Characteristics (Note E)
-V
GS
(Volts)
Figure 2: Transfer Characteristics (Note E)
45
1.8
1.6
1.4
1.2
1
V
GS
=-4.5V
40
35
30
25
20
15
10
V
GS
=-10V
I
D
=-6.5A
=-4.5
V
I
D
=-5A
V
GS
V
GS
=-10V
0.8
0
5
10
15
20
0
25
50
75
100
125
150
175
-I
D
(A)
Temperature (
°
C
)
Figure 4: On-Resistance vs. Junctio
n
Temperature
Figure 3: On-Resistance vs. Drain Current and Gate
Voltage (Note E)
(Note E)
90
1.0E+02
1.0E+01
I
D
=-6.5A
70
50
30
10
1.0E+00
125
°
C
1.0E-01
1.0E-02
1.0E-03
1.0E-04
1.0E-05
125
°
C
25
°
C
25
°
C
2
4
6
8
10
0.0
0.2
0.4
-V
SD
(Volts)
Figure 6: Body-Diode Characteristics (Note E)
0.6
0.8
1.0
1.2
-V
GS
(Volts)
Figure 5: On-Resistance vs. Gate-Source Voltage
(Note E)
Rev 10: April
2012
Page 7 of 9
AO4606
P-Channel: TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS
10
1200
1000
800
600
400
200
0
V
DS
=-15V
I
D
=-6.5A
8
C
iss
6
4
C
oss
2
C
rss
0
0
5
10
15
-V
DS
(Volts)
20
25
30
0
3
6
9
12
15
Q
g
(nC)
Figure 8: Capacitance Characteristics
Figure 7: Gate-Charge Characteristics
1000
100
10
100.0
10.0
1.0
T
A
=25
°
C
10
µ
s
R
DS(ON)
limited
100
µ
s
1ms
10ms
0.1
DC
T
J(Max)
=150
°
C
T
A
=25
°
C
10s
0.0
1
0.01
0.1
1
10
100
0.00001
0.001
0.1
10
1000
-V
DS
(Volts)
Pulse Width (s)
Figure 9: Maximum Forward Biased Safe
Operating Area (Note F)
Figure 10: Single Pulse Power Rating Junction-
to-Ambient (Note F)
10
D=T
on
/T
In descending order
T
J,PK
=T
A
+P
DM
.Z
θ
JA
.R
θ
JA
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse
1
R
θ
JA
=90
°
C/W
0.1
P
D
0.01
T
on
T
0.001
0.00001
0.0001
0.001
0.01
0.1
1
10
100
1000
Pulse Width (s)
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)
Rev 10: April
2012
Page 8 of 9
AO4606
Gate Charge Test Circuit & Waveform
Vgs
Qg
–
-10V
–
VDC
Qgs
Qgd
+
Vds
VDC
+
DUT
Vgs
Ig
Charge
Resistive Switching Test Circuit & Waveforms
RL
Vds
t
off
t
on
t
t
d(off)
t
d(on)
t
r
f
Vgs
–
90%
10%
DUT
Vdd
Vgs
VDC
+
Rg
Vgs
Vds
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms
E
AR
= 1/2 LI
A
2
R
L
Vds
Id
Vgs
Vds
BV
DSS
Vgs
Vdd
+
VDC
Id
Rg
I
AR
DUT
Vgs
Vgs
Diode Recovery Test Circuit & Waveforms
Q
rr
= –
Idt
Vds +
Vds –
Ig
DUT
Vgs
t
rr
L
-Isd
-I
F
Isd
Vgs
dI/dt
-I
RM
+
Vdd
VDC
Vdd
–
-Vds
Rev 10: April
2012
Page 9 of 9
