BORN-ULN2803QN
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ULN2
803Q
N
series High-voltage High-current Darlington Transistor Arrays
Features
Package
• 500-mA-Rated
Collector Current(single output)
• High-Voltage
Outputs: 50V
• Inputs
Compatible With Various Types of Logic
• Output
Clamp Diodes
• Relay-Driver
Applications
General Description
The
ULN
2803Q
N
is high-voltage high-current Darlington transistor arrays each containing seven open collector common
emitter pairs. Each pair is rated at 500mA. Suppression diodes are included for inductive load driving, the inputs and outputs are
pinned in opposition to simplify board layout.These devices are capable of driving a wide range of loads including solenoids,
relays, DC motors, LED displays, filament lamps, thermal print-heads and high-power buffers.
Connection Diagram
1C 2C
3C 4C
17 16
15 14
5C 6C
7C 8C
12 11
10
13
9
COM
GND
8
19 20 1
2
3
4
5
6
1B 2B
3B 4B
5B 6B
7B 8B
BORN SEMICONDUCTOR , INC. ALL
RIGHT RESERVED
Specifications are subject to change without notice.
Page:1
Revision: 2022-Jan-1
ULN
2803Q
N
series High-voltage High-current Darlington Transistor Arrays
Pin Description
QFN4X4-20L
Top Marking
Pin Number
Name
3B
Function
Input pair3
Input pair4
Input pair5
Input pair6
Input pair7
Input pair8
NC
Pin Number
Name
7C
Function
Output pair7
Output pair6
Output pair5
Output pair4
Output pair3
Output pair2
Output pair1
NC
1
2
11
12
13
14
15
16
17
18
19
20
4B
6C
3
5B
5C
4
6B
4C
5
7B
3C
6
8B
2C
7
NC
E
1C
8
CE(ground)
CC Diodes
Output pair8
NC
1B
9
COM
8C
Input pair1
Input pair2
10
2B
NOTE: CE(ground)= Common Emitter (ground);
CC Diodes = Common Clamp Diodes
BORN SEMICONDUCTOR , INC. ALL
RIGHT RESERVED
Specifications are subject to change without notice.
Page:2
Revision: 2022-Jan-1
ULN
2803Q
N
series High-voltage High-current Darlington Transistor Arrays
Functional Block Diagram
COM
Output
R
B
=2.7k
Ω
C
E
Input
B
7.2k
Ω
3k
Ω
Note: All resistor values shown are nominal.
The collentor-emitter diode is a parasitic structure and should not be used to conduct current.If the collector(s) go below ground an
external Schoottky diode should be added to clamp negative undershoots.
Absolute Maximum Ratings
(At 25°C free-air temperature unless otherwise noted)(1)
Symbol
V
CC
V
COM
V
I
Parameter
Collector to emitter voltage
voltage of Pin COM
Min
Max
50
Units
V
-0.5
50
V
Input voltage
-0.5
30
V
I
CP
Peak collector current (See typical characteristics)
Output clamp current
500
500
-2.5
150
150
1.3
mA/ch
mA
A
◦
C
◦
C
W
I
OK
I
TE
T
o
tal emitter-terminal current
Operating virtual junction temperature
Storage temperature range
Power consumption
T
J
T
STG
P
D
-65
(1) Stresses beyond those listed under ”absolute maximum ratings” may cause permanent damage to the device.
These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under ”recommended operating
conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2) All voltage values are with respect to the emitter/substrate terminal E, unless otherwise noted.
(3) Maximum power dissipation is a function of T
J
(max), θ
JA
, and T
A
. The
maximum allowable power dissipation at any allow able
ambient temperature is PD = (T
J
(max)–T
A
)/θ
JA
. Operating at the absolute maximum T
J
of 150°C can affect reliability.
(4) Maximum pow er dissipation is a function of T
J
(max), θ
JC
, and T
A
. The
maximum allow able pow er dissipation at any allow able
ambient temperature is PD = (T
J
(max)–T
A
)/θ
JC
. Operating at the absolute maximum T
J
of 150°C can affect reliability.
BORN SEMICONDUCTOR , INC. ALL
RIGHT RESERVED
Specifications are subject to change without notice.
Page:3
Revision: 2022-Jan-1
ULN
2803Q
N
series High-voltage High-current Darlington Transistor Arrays
Typical Characteristics
Symbol
Parameter
Min
–
Max
50
Units
V
◦
C
V
CE
T
A
Collector to emitter voltage
Operating Ambient
T
e
mperature
-40
+105
Electrical Characteristics
(
T
A
=+25
◦
C, unless otherwise specified)
Test
BE2803Q
MIN TYP
Parameter
Test Conditions
Unit
Figure
MAX
2.4
2.7
3
I
C
= 200 mA
I
C
= 250 mA
I
C
= 300 mA
I
C
= 100 mA
I
C
= 200 mA
I
C
= 350 mA
I
I
= 0
–
–
–
–
–
–
–
–
–
V
I
(
on
)
On-state input voltage
Figure 6
V
CE
= 2 V
V
–
I
I
= 250 μA
I
I
= 350 μA
I
I
= 500 μA
V
CE
= 50 V,
V
CE
= 50 V;
T
A
= +105°C
I
F
= 350 mA
0.9
1
1.1
1.3
1.6
50
V
CE
(
sat
)
Collector-emitter saturation voltage
Collector cutoff current
Figure 5
V
1.2
–
Figure 1
Figure 2
I
CEX
μA
I
I
= 0
–
–
100
V
F
Clamp forw ard voltage
Off-state input current
Figure 8
Figure 3
–
1.7
65
0.93
–
2
–
V
I
I
(
off
)
V
CE
= 50 V,I
C
= 500 μA
V
I
= 3.85 V
V
I
= 5 V
50
–
μA
1.35
–
I
I
Input current
Figure 4
Figure 7
–
mA
V
I
= 12 V
–
–
–
T
A
= 25°C
–
–
50
100
25
I
R
Clamp reverse current
Input capacitance
V
R
= 50 V
μA
pF
T
A
= 70°C
–
–
C
i
V
I
= 0, f = 1 MHz
–
15
Switching Characteristics
(
T
A
= +25°C, unless otherwise specified)
BE2803Q
TYP
Parameter
Test Conditions
Figure 9
Unit
μs
MIN
MAX
Propagation delay time,
low – to high-level output
Propagation delay time,
high- to low -level output
High-level output voltage
after switching
t
PLH
t
PHL
V
OH
–
0.25
0.25
–
1
Figure 9
–
1
–
μs
V
S
= 50 V, I
O
= 300 mA
Figure 9
V
S
–20
mV
BORN SEMICONDUCTOR , INC. ALL
RIGHT RESERVED
Specifications are subject to change without notice.
Page:4
Revision: 2022-Jan-1
ULN
2803Q
N
series High-voltage High-current Darlington Transistor Arrays
Parameter Measurement Information
Open V
CE
Open V
CE
Open
V
I
I
CEX
I
CEX
Fig.1 I
CEX
Test Circuit
Fig.2 I
CEX
Test Circuit
Open
Open V
CE
I
C
I
I(on)
I
I(off)
Open
Fig.3 I
I(off)
Test Circuit
Fig.4 I
I
Test Circuit
Open
Open
V
I(on)
V
CE
I
C
V
CE
I
I
I
I
I
C
Fig.5 h
fe
, V
CE(sat)
Test Circuit
Fig.6 V
I(on)
Test Circuit
V
R
I
R
Open
V
F
I
F
Open
Fig.7 I
R
Test Circuit
Fig.8 V
F
Test Circuit
BORN SEMICONDUCTOR , INC. ALL
RIGHT RESERVED
Specifications are subject to change without notice.
Page:5
Revision: 2022-Jan-1
ULN
2803Q
N
series High-voltage High-current Darlington Transistor Arrays
V
S
2mH
Open
Input
1N3064
200
Ω
Pulse
Generator
Output
C
L
=15pF
(Note 9)
(Note 8)
t
ON
, t
OFF
Test Circuit
t
r
t
f
90%
50%
90%
(Note 10)
50%
10%
40
μ
s
Input
0
t
PLH
t
PHL
Output
V
OH
50%
50%
V
OL
Voltage Waveform
Fig.9 Latch-Up
Test Circuit and Voltage Waveform
Notes:
8. The pulse generator has the follow ing characteristics: Pulse Width=12.5Hz, output impedance 50Ω, t
f
≤5ns, t
f
≤10ns.
9. C
L
includes prove and jig capacitance.
10 V
IH
=3V
BORN SEMICONDUCTOR , INC. ALL
RIGHT RESERVED
Specifications are subject to change without notice.
Page:6
Revision: 2022-Jan-1
ULN
2803Q
N
series High-voltage High-current Darlington Transistor Arrays
QFN4X4-20L Package Specifications
E
SYMBOL
A
MIN
TYP
MAX
0.500
0.600
0.800
0.050
0.211
4.100
4.100
2.675
2.675
0.400 0.450
0.500 0.550
0.700 0.750
D
A1
A2
D
0.00
0.195 0.203
3.900 4.00
–
E
3.900 4.000
2.625 2.650
2.625 2.650
D1
E1
k
0.150MIN.
0.200 0.250
0.500TY
P
.
0.300 0.400
b
b
0.300
0.500
e
L
D
1
Note:All dimensions shown are in millimeters (mm) and refer to JEDEC STANDARD MO-220 WHHD-4
BORN SEMICONDUCTOR , INC. ALL
RIGHT RESERVED
Specifications are subject to change without notice.
Page:7
Revision: 2022-Jan-1
