Diodes-Incorporated-DMN2013UFDE-7

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Diodes-Incorporated-DMN2013UFDE-7
DMN2013UFDE  
20V N-CHANNEL ENHANCEMENT MODE MOSFET  
Product Summary  
Features  
I

D  

0.6mm profile – ideal for low profile
 
applications  
PCB footprint of 4mm

2  

V

(BR)DSS  

R

DS(ON) MAX  

Package  
T

A

= +25°C  
U-DFN2020-6  
U-DFN2020-6  
U-DFN2020-6  
U-DFN2020-6  
10.5A  
9.4A  
6.5A  
5.5A  
11m
@ V

GS

= 4.5V  
13m
Ω
@ V

GS

= 2.5V  
30m
@ V

GS

= 1.8V  
50m
Ω
@ V

GS

= 1.5V  
Low Gate Threshold Voltage  
ESD Protected Gate  
20V  
Totally Lead-Free & Fully RoHS Compliant (Notes 1 & 2)  
Halogen and Antimony Free. “Green” Device (Note 3)  
Qualified to AEC-Q101 Standards for High Reliability  
PPAP Capable (Note 4)  
Description  
This new generation MOSFET has been designed to minimize the on-  
state resistance (R

DS(ON)

and yet maintain superior switching  
Mechanical Data  
)
Case: U-DFN2020-6  
performance, making it ideal for high efficiency power management  
applications.  
Case Material: Molded Plastic, “Green” Molding Compound.
 
UL  
Flammability Classification Rating 94V-0  
Moisture Sensitivity: Level 1 per J-STD-020  
Terminals: Finish – NiPdAu over Copper leadframe. Solderable  
Applications  
Drain  
per MIL-STD-202, Method 208
 
e4  
General Purpose Interfacing Switch  
Power Management Functions  
Weight: 0.0065 grams (approximate)  
U-DFN2020-6  
Gate  
Gate  
Protection  
Diode  
ESD PROTECTED  
Source  
Bottom View  
Pin Out  
Equivalent Circuit  
Ordering Information
(Note 5)  
Part Number  
Compliance  
Standard  
Automotive  
Standard  
Case  
Quantity per reel  
DMN2013UFDE-7  
DMN2013UFDEQ-7  
DMN2013UFDE-13  
DMN2013UFDEQ-13  
U-DFN2020-6  
U-DFN2020-6  
U-DFN2020-6  
U-DFN2020-6  
3,000  
3,000  
10,000  
10,000  
Automotive  
Notes:  
1. No purposely added lead. Fully EU Directive 2002/95/EC (RoHS) & 2011/65/EU (RoHS 2) compliant.  
2. S

more information about Diodes Incorporated’s definitions of Halogen- and Antimony-free, “Green”  
and Lead-free.  
3. Halogen- and Antimony-free “Green” products are defined as those which contain <900ppm bromine, <900ppm chlorine (<1500ppm total Br + Cl) and  
<1000ppm antimony compounds.  
4. Automotive products are AEC-Q101 qualified and are PPAP capable. Automotive, AEC-Q101 and standard products are electrically and thermally the  
same, except where specified. For more information, please refer

5. For packaging details, go to our website at http”

Marking Information  
N6 = Product Type Marking Code  
YM = Date Code Marking  
Y = Year (ex: Y = 2011)  
N6  
M = Month (ex: 9 = September)  
Date Code Key  
Year  
2011  
2012  
2013  
2014  
2015  
2016  
2017  
Code  
Y
Z
A
B
C
D
E
Month  
Code  
Jan  
1
Feb  
2
Mar  
3
Apr  
4
May  
5
Jun  
6
Jul  
7
Aug  
8
Sep  
9
Oct  
O
Nov  
N
Dec  
D
1 of 6  
April 2013  
© Diodes Incorporated  
DMN2013UFDE  
Document number: DS35701 Rev. 7 – 2  

DMN2013UFDE  
Maximum Ratings
(@T

A

= +25°C, unless otherwise specified.)  
Characteristic  
Drain-Source Voltage  
Symbol  
V

DSS  

Value  
20  
Units  
V
V
Gate-Source Voltage  
±8  
V

GSS  

T

A

= +25°C  

A

= +70°C  
Steady  
State  
10.5  
8.5  
A
A
A
A
I

D  

I

D  

I

D  

I

D  

T
Continuous Drain Current (Note 7) V

GS

= 4.5V  
Continuous Drain Current (Note 7) V

GS

= 2.5V  
T

A

= +25°C  
T

A

= +70°C  
T

A

= +25°C  
12.5  
10.0  
t < 10s  
Steady  
State  
9.4  
7.5  
T

A

= +70°C  

A

= +25°C  
T
11.2  
8.8  
t <1 0s  
T

A

= +70°C  
Pulsed Drain Current (10µs pulse, duty cycle = 1%)  
Maximum Body Diode Continuous Current  
80  
A
A
I

DM  

I

S  

2.5  
Thermal Characteristics  
Characteristic  
Symbol  
P

D  

Value  
0.66  
Units  
T

A

= +25°C  
Total Power Dissipation (Note 6)  
W
0.42  
189  
132  
2.03  
1.31  
61  
T

A

= +70°C  
Steady state  
t<10s  
T

A

= +25°C  
T

A

= +70°C  
Steady state  
t<10s  
Thermal Resistance, Junction to Ambient (Note 6)  
Total Power Dissipation (Note 7)  
°C/W  
W
R

  

JA  
P

D  

Thermal Resistance, Junction to Ambient (Note 7)  
R

  

JA  
43  
9.3  
°C/W  
°C  
Thermal Resistance, Junction to Case (Note 7)  
Operating and Storage Temperature Range  
R

  

JC  
-55 to +150  
T

J,

T

STG  

Electrical Characteristics
(@T

A

= +25°C, unless otherwise specified.)  
Characteristic  
OFF CHARACTERISTICS (Note 8)  
Drain-Source Breakdown Voltage  
Symbol  
Min  
Typ  
Max  
Unit  
Test Condition  
20  
—
—
—
—
—
—
1
V
BV

DSS  

I

DSS  

V

GS

= 0V, I

D

= 250
μ
A  
V

DS

= 16V, V

GS

= 0V  
V

GS

= ±8V, V

DS

= 0V  
µA  
µA  
Zero Gate Voltage Drain Current T

J

= +25°C  
Gate-Source Leakage  
±2  
I

GSS  

ON CHARACTERISTICS (Note 8)  
Gate Threshold Voltage  
0.5  
—
—
8.4  
9.8  
12  
15  
10  
—
1.1  
11  
13  
30  
50  
—
V
V

GS(th)  

V

DS

= V

GS

, I

D

= 250
μ
A  
V
V
V
V

GS

= 4.5V, I

D

= 8.5A  

GS

= 2.5V, I

D

= 8.5A  

GS

= 1.8V, I

D

= 1A  

GS

= 1.5V, I

D

= 0.5A  
Static Drain-Source On-Resistance  
R

DS (ON)  

m
  
Forward Transfer Admittance  
Diode Forward Voltage  
DYNAMIC CHARACTERISTICS
 
(Note 9)  
Input Capacitance  
—
—
S
V
|Y

fs

|  
V

SD  

V

DS

= 5V, I

D

= 4A  
1.2  
V

GS

= 0V, I

S

= 8.5A  
—
—
—
—
—
—
—
—
—
—
—
—
2453  
275  
257  
1.2  
—
—
—
—
—
—
—
—
—
—
—
—
pF  
pF  
pF  
ꢀ
C

iss  

C

oss  

C

rss  

R

g  

V

DS

= 10V, V

GS

= 0V,  
f = 1.0MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
V

DS

= 0V, V

GS

= 0V, f = 1MHz  
14.3  
25.8  
1.8  
nC  
nC  
nC  
nC  
ns  
ns  
ns  
ns  
Total Gate Charge
 
(V

GS

= 4.5V)  
Total Gate Charge
 
(V

GS

= 8V)  
Gate-Source Charge  
Q

g  

Q

g  

V

DS

= 10V, I

D

= 8.5A  
Q

gs  

Q

gd  

t

D(on)  

t

r  

2.1  
Gate-Drain Charge  
9.9  
Turn-On Delay Time  
24.5  
66.4  
20.8  
Turn-On Rise Time  
V

DS

= 10V, I

D

= 8.5A  
V

GS

= 4.5V, R

G

= 1.8
ꢀ  
Turn-Off Delay Time  
t

D(off)  

t

f  

Turn-Off Fall Time  
Notes:  
6. Device mounted on FR-4 PC board, with minimum recommended pad layout, single sided.  
7. Device mounted on FR-4 substrate PC board, 2oz copper, with thermal bias to bottom layer 1inch square copper plate  
8. Short duration pulse test used to minimize self-heating effect  
9. Guaranteed by design. Not subject to production testing  
2 of 6  
April 2013  
© Diodes Incorporated  
DMN2013UFDE  
Document number: DS35701 Rev. 7 – 2  

DMN2013UFDE  
30  
25  
20  
20  
15  
10  
V
= 5.0V  
DS  
15  
10  
T
= 150°C  
A
T
= 125°C  
A
5
0
T
= 85°C  
A
5
0
T
A
= 25°C  
A
T
= -55°C  
0
0.5  
1
1.5  
2
V

GS

, GATE-SOURCE VOLTAGE  
Fig.2 Typical
 
Transfer Characteristics  
V

DS

, DRAIN-SOURCE VOLTAGE (V)  
Fig.1 Typical Output Characteristic  
0.020  
0.015  
0.020  
0.015  
V
= 4.5V  
GS  
V
= 1.5V  
GS  
V
T
= 125°C  
T
= 150°C  
A
A
0.010  
= 1.8V  
0.010  
GS  
T
T
= 85°C  
= 25°C  
A
V
V
= 2.5V  
= 4.5V  
GS  
GS  
A
T
= -55°C  
A
0.005  
0
0.005  
0
0
4
8
12  
16  
20  
0
5
10  
15  
20  
I

D

, DRAIN-SOURCE CURRENT  
I

D

, DRAIN CURRENT  
Fig. 3 Typical On-Resistance vs.  
Drain Current and Gate Voltage  
Fig. 4 Typical On-Resistance vs.  
Drain Current and
T
e
mperature  
1.8  
1.6  
0.020  
0.015  
V
= 2.5V  
= 5A  
GS  
V
= 2.5V  
= 5A  
GS  
I
D
1.4  
1.2  
1.0  
I
D
0.010  
V
= 4.5V  
= 10A  
GS  
I
D
V
= 4.5V  
GS  
I
= 10A  
D
0.005  
0
0.8  
0.6  
– 50
 
-25  
T

J

, JUNCTION TEMPER
A
T
URE (  
Fig. 6 On-Resistance Variation with
T
e
mperature  
0
25  
50  
75 100
 
125 150  
50 -25  
T

J

, JUNCTION TEMPER
A
T
URE (  
Fig. 5 On-Resistance Variation with
T
e
mperature  
0
25  
50  
75 100
 
125 150  
C)  
C)  
3 of 6  
April 2013  
© Diodes Incorporated  
DMN2013UFDE  
Document number: DS35701 Rev. 7 – 2  

DMN2013UFDE  
1.4  
1.2  
20  
15  
1.0  
0.8  
0.6  
0.4  
T
= 25°C  
I
= 1mA  
A
10  
D
I
= 250µA  
D
5
0
0.2  
0
-50 -25  
T

J

, JUNCTION TEMPERATURE (  
Fig. 7 Gate Threshold Variation vs. Ambient
T
e
mperature  
0
25  
50 75 100 125
 
150  
0
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
C)  
V

SD

, SOURCE-DRAIN VOLTAGE (V)  
Fig. 8 Diode Forward Voltage vs. Current  
10,000  
10  
8
V
= 10
V
, I
 
=
8
.5A  
DS  
D
C
iss  
6
4
1,000  
C
oss  
2
0
C
rss  
f = 1MHz  
100  
0
5
10  
15  
20  
25  
30  
35 40  
0
5
10  
15  
20  
V

DS

, DRAIN-SOURCE VOLTAGE (V)  
Q

g

, TOTAL GATE CHARGE
 
(nC)  
Fig. 9 Typical Junction Capacitance  
Fig. 10 Gate Charge  
100  
10  
R
DS(on)  
P
= 100µs  
W
Limited  
DC  
= 10s  
P
1
W
P
= 1s  
W
P
= 100ms  
W
P
= 10ms  
W
P
= 1ms  
W
0.1  
T

J(max)

= 150°C  
T

A

= 25°C  
V

GS

= 8V  
Single Pulse  
DUT on 1 * MRP Board  
0.01  
0.01  
0.1  
1
10  
100  
V

DS

, DRAIN-SOURCE VOL
T
A
GE (V)  
Fig. 11 SOA, Safe Operation Area  
4 of 6  
April 2013  
© Diodes Incorporated  
DMN2013UFDE  
Document number: DS35701 Rev. 7 – 2  

DMN2013UFDE  
1
D = 0.9  
D = 0.7  
D = 0.5  
D = 0.3  
0.1  
D = 0.1  
D = 0.05  
D = 0.02  
D = 0.01  
D = 0.005  
0.01  
R
R
= r
 
* R  
(t)
JA  
= 65
C/W  
JA(t)  
JA  
Duty Cycle, D = t1/t2  
D = Single Pulse  
0.001  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1,000  
t1, PULSE DURATION TIME (sec)  
Fig. 12 Transient Thermal Resistance  
Package Outline Dimensions  
A3  
A1  
U-DFN2020-6  
Type E  
A
Dim  
Min  
Max  
Typ  
A
A1  
A3  
b
0.57  
0
—
0.63  
0.05  
—
0.60  
0.03  
0.15  
0.30  
D
0.25  
0.35  
b1  
0.185 0.285 0.235  
D
D2  
E
E2  
e
L
L1  
K1  
K2  
Z
1.95  
0.85  
1.95  
1.40  
—
0.25  
0.82  
—
2.05  
1.05  
2.05  
1.60  
—
0.35  
0.92  
—
2.00  
0.95  
2.00  
1.50  
0.65  
0.30  
0.87  
0.305  
0.225  
0.20  
b1  
K1  
D2  
E
E2  
L1  
L(2X)  
K2  
—
—
—
—
Z(4X)  
e
b(6X)  
All Dimensions in mm  
Suggested Pad Layout  
Value  
Dimensions  
(in mm)  
C
X
X1  
X2  
Y
Y1  
Y2  
Y3  
0.650  
0.400  
0.285  
1.050  
0.500  
0.920  
1.600  
2.300  
X2  
Y1  
Y3 Y2  
X1  
Y (2x)  
X (6x)  
C
5 of 6  
April 2013  
© Diodes Incorporated  
DMN2013UFDE  
Document number: DS35701 Rev. 7 – 2  

DMN2013UFDE  
IMPORTANT NOTICE  
DIODES INCORPORATED MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARDS TO THIS DOCUMENT,  
INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE  
(AND THEIR EQUIVALENTS UNDER THE LAWS OF ANY JURISDICTION).  
Diodes Incorporated and its subsidiaries reserve the right to make modifications, enhancements, improvements, corrections or other changes  
without further notice to this document and any product described herein. Diodes Incorporated does not assume any liability arising out of the  
application or use of this document or any product described herein; neither does Diodes Incorporated convey any license under its patent or  
trademark rights, nor the rights of others.
 
Any Customer or user of this document or products described herein in such applications shall assume  
all risks of such use and will agree to hold Diodes Incorporated and all the companies whose products are represented on Diodes Incorporated  
website, harmless against all damages.  
Diodes Incorporated does not warrant or accept any liability whatsoever in respect of any products purchased through unauthorized sales channel.  
Should Customers purchase or use Diodes Incorporated products for any unintended or unauthorized application, Customers shall indemnify and  
hold Diodes Incorporated and its representatives harmless against all claims, damages, expenses, and attorney fees arising out of, directly or  
indirectly, any claim of personal injury or death associated with such unintended or unauthorized application.  
Products described herein may be covered by one or more United States, international or foreign patents pending.
 
Product names and markings  
noted herein may also be covered by one or more United States, international or foreign trademarks.  
This document is written in English but may be translated into multiple languages for reference.
 
Only the English version of this document is the  
final and determinative format released by Diodes Incorporated.  
LIFE SUPPORT  
Diodes Incorporated products are specifically not authorized for use as critical components in life support devices or systems without the express  
written approval of the Chief Executive Officer of Diodes Incorporated. As used herein:  
A. Life
 
support devices or systems are devices or systems which:  
1. are intended to implant into the body, or  
2. support or sustain life and whose failure to perform when properly used in accordance with instructions for use provided in the  
labeling can be reasonably expected to result in significant injury to the user.  
B. A
 
critical component is any component in a life support device or system whose failure to perform can be reasonably expected to cause the  
failure of the life support device or to affect its safety or effectiveness.  
Customers represent that they have all necessary expertise in the safety and regulatory ramifications of their life support devices or systems, and  
acknowledge and agree that they are solely responsible for all legal, regulatory and safety-related requirements concerning their products and any  
use of Diodes Incorporated products in such safety-critical, life support devices or systems, notwithstanding any devices- or systems-related  
information or support that may be provided by Diodes Incorporated.
 
Further, Customers must fully indemnify Diodes Incorporated and its  
representatives against any damages arising out of the use of Diodes Incorporated products in such safety-critical, life support devices or systems.  
Copyright © 2013, Diodes Incorporated  
6 of 6  
April 2013  
© Diodes Incorporated  
DMN2013UFDE  
Document number: DS35701 Rev. 7 – 2