FETek-FKS3115

Part #FETek-FKS3115
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FETek-FKS3115
FKS3115  
FE
T
ek Technology Corp.  
P-Ch 30V Fast Switching MOSFETs  
100% EAS Guaranteed  
Product Summary  
Green Device Available  
Super Low Gate Charge  
Excellent CdV/dt effect decline  
Advanced high cell density Trench  
technology  
BVDSS  
RDSON  
ID  
-30V  
8.7m
Ω
 
-14A  
Description  
SOP8 Pin Configuration  
The FKS3115 is the high cell density trenched  
P-ch MOSFE
T
s
, which provide excellent RDSON  
and gate charge for most of the synchronous buck  
converter applications.  
The FKS3115 meet the RoHS and Green Product  
requirement, 100% EAS guaranteed with full  
function reliability approved.  
Absolute Maximum Ratings  
Symbol  
Parameter  
Rating  
-30  
Units  
V

DS  

V

GS  

Drain-Source Voltage  
Gate-Sou
r
ce Voltage  
V
V
±
20  
I

D

@T

A

=25
℃  
I

D

@T

A

=70
℃  
I

DM  

Continuous Drain Current, V

GS

@ -10V

1  

Continuous Drain Current, V

GS

@ -10V

1  

Pulsed Drain Current

2  

-14  
-11  
A
A
-56  
A
EAS  
Single Pulse Avalanche Energy

3  

151  
mJ  
A
I

AS  

Avalanche Current  
-55  
P

D

@T

A

=25
℃  
T

STG  

Total Power Dissipation

4  

1.5  
W
℃
℃
Storage
T
e
mperature Range  
Operating Junction Temperature Range  
-55 to 150  
-55 to 150  
T

J  

Thermal Data  
Symbol  
R

θ
JA  

Parameter  
Typ.  
Max.  
40  
Unit  
℃
/W  
℃
/W  
℃
/W  
Thermal Resistance Junction-Ambient

1

(t
≦
10s)  
—  
Thermal Resistance Junction-Ambient

1  

Thermal Resistance Junction-Case

1  

—  
—  
75  
R

θ
JC  

24  
Data and specifications subject to change without notice.  
1

FKS3115  
FE
T
ek Technology Corp.  
P-Ch 30V Fast Switching MOSFETs  
Electrical Characteristics (T

J

=25
℃
, unless otherwise noted)  
Symbol  
BV

DSS  

Parameter  
Conditions  
V

GS

=0V , I

D

=-250uA  
Min.  
-30  
—  
Typ.  
—  
Max.  
—  
Unit  
V
Drain-Source Breakdown Voltage  
BV

DSS

Temperature Coefficient  
△
BV

DSS

/
△
T

J  

Reference to 25
℃
, I

D

=-1mA  
V

GS

=-10V , I

D

=-12A  
-0.018  
—  
—  
V/
℃  
—  
8.7  
13.5  
-2.5  
—  
R

DS(ON)  

Static Drain-Source On-Resistance

2  

m
 
V

GS

=-4.5V , I

D

=-10A  
—  
—  
V

GS(th)  

Gate Threshold Voltage  
-1.2  
—  
—  
V
V

GS

=V

DS

, I

D

=-250uA  
△
V

GS(th)  

V

GS(th)

Temperature Coefficient  
5.04  
—  
mV/
℃  
V

DS

=-24V , V

GS

=0V , T

J

=25
℃  
V

DS

=-24V , V

GS

=0V , T

J

=55
℃  
—  
-1  
I

DSS  

Drain-Source Leakage Current  
uA  
—  
—  
-5  
V

GS

=
±
20V , V

DS

=0V  
I

GSS  

gfs  
Gate-Source Leakage Current  
Forward Transconductance  
Total Gate Charge (-4.5V)  
Gate-Source Charge  
Gate-Drain Charge  
—  
—  
±
100  
—  
nA  
S
V

DS

=-5V , I

D

=-12A  
—  
25  
Q

g  

—  
30  
—  
V

DS

=-15V , V

GS

=-4.5V , I

D

=-12A  
nC  
Q

gs  

Q

gd  

T

d(on)  

T

r  

—  
10  
—  
—  
10.4  
9.4  
10.2  
117  
24  
—  
Turn-On Delay Time  
Rise Time  
—  
—  
V

DD

=-15V , V

GS

=-10V , R

G

=3.3
,  
—  
—  
ns  
I

D

=-1A  
T

d(off)  

T

f  

Turn-Off Delay Time  
Fall Time  
—  
—  
—  
—  
C

iss  

C

oss  

C

rss  

Input Capacitance  
—  
3448  
508  
421  
—  
V

DS

=-15V , V

GS

=0V , f=1MHz  
pF  
Output Capacitance  
Reverse Transfer Capacitance  
—  
—  
—  
—  
Diode Characteristics  
Symbol  
Parameter  
Conditions  
Min.  
—  
Typ.  
—  
Max.  
-14  
-56  
-1.2  
—  
Unit  
A
I

S  

I

SM  

V

SD  

t

rr  

Continuous Source Current

1,5  

Pulsed Source Current

2,5  

Diode Forward Voltage

2  

Reverse Recovery Time  
Reverse Recovery Charge  
V

G

=V

D

=0V , Force Current  
—  
—  
A
V

GS

=0V , I

S

=-1A , T

J

=25
℃  
I
F
=-10A , dI/dt=100A/µs ,  
T

J

=25
℃  
—  
—  
V
—  
19.4  
9.1  
nS  
nC  
Q

rr  

—  
—  
Note :  
1.The data tested by surface mounted on a 1 inch

2

FR-4 board with 2OZ copper.  
2.The data tested by pulsed , pulse width
 
≦
300us , duty cycle
 
≦
2%  
3.The EAS data shows Max. rating . The test condition is V

DD

=-25V,V

GS

=-10V,L=0.1mH,I

AS

=-55A  
4.The power dissipation is limited by 150
℃
junction temperature  
5.The data is theoretically the same as I

D

and I

DM

, in real applications , should be limited by total power dissipation.  
Data and specifications subject to change without notice.  
2

FKS3115  
FE
T
ek Technology Corp.  
P-Ch 30V Fast Switching MOSFETs  
Typical Characteristics  
40  
35  
30  
25  
20  
15  
10  
5
V

GS

=-10V  
V

GS

=-7V  
V

GS

=-5V  
V

GS

=-4.5V  
V

GS

=-3V  
0
0
1
2
3
4
-V

DS

, Drain-to-Source Voltage (V)  
Fig.1 Typical Output Characteristics  
Fig.2 On-Resistance v.s Gate-Source  
12  
10  
8
6
T

J

=150
℃
T

J

=25
℃  
4
2
0
0.2  
0.4  
0.6  
0.8  
1
-V

SD

, Source-to-Drain Voltage (V)  
Fig.4 Gate-Charge Characteristics  
Fig.3 Forward Characteristics Of Reverse  
2.0  
1.5  
1.0  
0.5  
1.5  
1
0.5  
0
-50  
0
50  
100  
150  
-50  
0
50  
100  
150  
T

J

,Junction Temperature (
℃
)  
T

J

, Junction Temperature (
℃
)  
Fig.6 Normalized R

DSON

vs. T

J  

Fig.5 Normalized V

GS(th)

vs. T

J  

Data and specifications subject to change without notice.  
3

FKS3115  
FE
T
ek Technology Corp.  
P-Ch 30V Fast Switching MOSFETs  
10000  
1000  
100  
F=1.0MHz  
Ciss  
Coss  
Crss  
10  
1
1
5
9
13  
17  
21  
25  
-V

DS

, Drain to Source Voltage(V)  
Fig.7 Capacitance  
Fig.8 Safe Operating Area  
DUTY=0.5  
0.2  
0.1  
0.1  
0.01  
0.05  
0.01  
P

DM  

T

ON  

T
D =
T

ON

/T  
SINGLE  
T

Jpeak

=
T

C

+P

D
M

XR

θJC  

0.001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
t , Pulse Width (s)  
Fig.9 Normalized Maximum Transient Thermal Impedance  
Fig.11 Unclamped Inductive Switching Waveform  
Fig.10 Switching Time Waveform  
Data and specifications subject to change without notice.  
4