HL-Haolin-Elec-HD830U

Part #HL-Haolin-Elec-HD830U
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HL-Haolin-Elec-HD830U
June 2014  
BV

DSS

= 550
 
V  

DS(on) typ

= 1.
1
Ω  
R
HD
830
U
/ HU
830
U  
I

D

=
5
.
0
A  
5
50
V N-Channel MOSFET  
TO-252  
TO-251  
FE
A
T
URES  
Originative New Design  
HD
830U  
HU
830U  
Superior Avalanche
 
Rugged Technology  
Robust Gate Oxide Technology  
Very Low
 
Intrinsic Capacitances  
Excellent Switching
 
Characteristics  
Unrivalled Gate Charge : 15.5
 
nC (Typ.)  
Extended Safe Operating Area  
Lower R

DS(ON)

: 1.
1
Ω (Typ.) @V

GS

=10V  
100% Avalanche Tested  
1.Gate 2.
 
Drain 3.
 
Source  
Absolute Maximum Ratings  
T

C

=25
℃
unless otherwise specified  
Symbol  
Parameter  
Value  
Units  
V
V

DSS  

Drain-Source Voltage  
Drain Current  
5
5
0  
5
.
0  
2.9  
18  
I

D  

– Continuous (T

C

= 25
℃
)  
– Continuous (T

C

= 100
℃
)  
A
Drain Current  
A
I

DM  

V

GS  

E

AS  

I

AR  

Drain Current  
– Pulsed  
(Note 1)  
A
Gate-Source Voltage  
±
30  
300  
4.5  
7.3  
4.5  
V
Single Pulsed Avalanche Energy  
Avalanche Current  
(Note 2)  
(Note 1)  
(Note 1)  
(Note 3)  
mJ  
A
E

AR  

dv/dt  
P

D  

Repetitive Avalanche Energy  
Peak Diode Recovery dv/dt  
Power Dissipation
 
(T

A

= 25
℃
) *  
mJ  
V/ns  
3.13  
38  
W
W
Power Dissipation (T

C

= 25
℃
)  
– Derate above 25
℃  
0.3  
W/
℃  
℃
T

J

, T

STG  

T

L  

Operating and Storage Temperature Range  
-55 to +150  
Maximum lead temperature for soldering purposes,  
1/8” from case for 5 seconds  
300  
℃
Thermal Resistance
 
Characteristics  
Symbol  
Parameter  
Typ.  
Max.  
Units  
R

θ
JC  

R

θ
JA  

Junction-to-Case  
—  
—  
—  
3.0  
Junction-to-Ambient*  
Junction-to-Ambient  
38  
60  
℃/W  
R

θ
JA  

* When
 
mounted on the minimum pad size recommended (PCB Mount)  

Electrical Characteristics

T

C

=25
°
C unless otherwise specified  

Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max Units  
On Characteristics  
V

GS  

—  
Gate Threshold Voltage  
V

DS

= V

GS

, I

D

= 250
㎂  
2.5  
—  
4.5  
1.3  
V
R

DS(ON)

Static Drain-Source  
On-Resistance  
V

GS

= 10 V, I

D

= 2.5 A  
1.1  
Ω
Off Characteristics  
BV

DSS  

Drain-Source Breakdown Voltage  
V

GS

= 0 V, I

D

= 250
㎂  
I

D

= 250
㎂, Referenced to25℃  

DS

= 550 V, V

GS

= 0 V  
550  
—  
—  
—  
—  
V
Δ
BV

DSS

Breakdown Voltage Temperature  
0.5  
V/℃  
/
Δ
T

J  

Coefficient  
I

DSS  

V
—  
—  
—  
—  
1
㎂
㎂
Zero Gate Voltage Drain Current  
V

DS

= 400 V, T

C

= 125
℃  
10  
I

GSSF  

I

GSSR  

Gate-Body Leakage Current,  
Forward  
V

GS

= 30 V, V

DS

= 0 V  
—  
—  
—  
—  
100  
㎁
㎁
Gate-Body Leakage Current,  
Reverse  
V

GS

= -30 V, V

DS

= 0 V  
-100  
Dynamic Characteristics  
C

iss  

C

oss  

C

rss  

Input Capacitance  
—  
—  
—  
750  
86  
840  
111  
15  
㎊
㎊
㎊
V

DS

= 25 V, V

GS

= 0 V,  
f = 1.0 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
11.5  
Switching Characteristics  
t

d(on)  

t

r  

t

d(off)  

t

f  

Turn-On Time  
—  
—  
—  
—  
—  
—  
—  
12  
46  
35  
100  
120  
105  
20  
㎱
㎱
V

DS

= 250 V, I

D

= 5.0 A,  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
R

G

= 25
Ω  
50  
㎱
(Note 4,5)  
48  
㎱
Q

g  

Q

gs  

Q

gd  

15.5  
2.9  
6.4  
nC  
nC  
nC  
V

DS

= 400V,
 
I

D

= 5.0 A,  
V

GS

= 10 V  
—  
(Note 4,5)  
—  
Source-Drain Diode Maximum Ratings and Characteristics  
I

S  

Continuous Source-Drain Diode Forward Current  
Pulsed Source-Drain Diode Forward Current  
—  
—  
—  
—  
—  
—  
—  
5.0  
20  
2
A
I

SM  

V

SD  

trr  
Source-Drain Diode Forward Voltage
 
I

S

= 5.0 A, V

GS

= 0 V  
—  
V
Reverse Recovery Time  
I

S

= 5.0 A, V

GS

= 0 V  
263  
1.9  
—  
㎱
μC  
di

F

/dt = 100 A/
μs
(Note 4)  
Reverse Recovery Charge  
—  
Qrr  
Notes ;  
1. Repetitive
 
Rating : Pulse width limited by maximum junction temperature  
2. L=21.5mH,
 
I

AS

=4.5A, V

DD

=50V, R

G

=25
Ω
, Starting T

J

=25
°
C  
3. I

SD

≤5.0A, di/dt≤200A/μs, V

DD

≤BV

DSS

, Starting T

J

=25
°
C  
4. Pulse
 
Test : Pulse Width
≤ 300μs, Duty Cycle ≤ 2%  
5. Essentially
 
Independent of Operating Temperature  

Typical Characteristics  
V

GS

, Gate-Source Voltage[V]  
V

DS

, Drain-Source Voltage[V]  
Figure 1. On Region Characteristics  
Figure 2. Transfer Characteristics  
I

D

, Drain Current [A]  
V

SD

, Source-Drain Voltage [V]  
Figure 4. Body Diode Forward Voltage  
Variation with Source Current  
and Temperature  
Figure 3. On Resistance Variation vs  
Drain Current and Gate Voltage  
12  
10  
8
V

DS

= 100V  
V

DS

= 250V  
V

DS

= 400V  
6
4
2
∗
Note : I

D

= 5.0A  
0
0
4
8
12  
16  
20  
Q

G

, Total Gate Charge [nC]  
V

DS

, Drain-Source Voltage [V]  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  

Typical Characteristics
 
(continued)  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
∗
Note :  
1. V

G
S

= 10 V  
2. I

D

= 2.5 A  
-100  
-50  
0
50  
100  
150  
200  
T

J

, Junction Temperature [

o

C]  
T

J

, Junction Temperature [

o

C]  
Figure 8. On-Resistance Variation  
vs Temperature  
Figure 7. Breakdown Voltage Variation  
vs Temperature  
10

2  

5
4
3
2
1
0
Operation in This Area  
is Limited by R

DS(on)  

10

1  

100
µ
s  
1
m
s  
10 ms  
100 ms  
10

0  

DC  
-1  
10  
* Notes :  
1. T

C

= 25

o  

C
2. T

J

= 150

o  

C
3. Single Pulse  
-2  
10  
10

0  

10

1  

10

2  

10

3  

25  
50  
75  
100  
125  
150  
T

C

, Case Temperature [

o

C]  
V

D
S

, Drain-Source Voltage [V]  
Figure 9. Maximum Safe Operating Area  
Figure 10. Maximum Drain Current  
vs Case Temperature  
10

0  

D=0.5  
0.2  
* Notes :  
1. Z

θ
JC

(t) = 1.71

o

C/W Max.  
2. Duty Factor, D=t

1

/t

2  

3. T

JM

– T

C

= P

DM

* Z

θ
JC

(t)  
0.1  
-1  
10  
0.05  
0.02  
0.01  
single pulse  
P

DM  

-2  
10  
t

1  

t

2  

-5  
10  
-4  
10  
-3  
10  
-2  
10  
-1  
10  
10

0  

10

1  

t

1

, Square Wave Pulse Duration [sec]  
Figure 11. Transient Thermal Response Curve  

Fig 12.
 
Gate Charge Test Circuit
 
& Waveform  
V

GS  

Same Type  
50KΩ  
as DUT  
Q

g  

12V  
200nF  
10V  
300nF  
V

DS  

V

GS  

Q

gs  

Q

gd  

DUT  
3mA  
Charge  
Fig 13.
 
Resistive Switching Test Circuit
 
& Waveforms  
R

L  

V

DS  

90%  
V

DS  

V

DD  

( 0.5 rated V

DS  

)
R

G  

10%  
V

in  

DUT  
10V  
t

d(on)  

t

r  

t

d(off)  

t

f  

t

on  

t

off  

Fig 14.
 
Unclamped Inductive Switching Test Circuit
 
& Waveforms  
BV

DSS  

——————–  
BV

DSS

— V

DD  

L
1
2
2
—-  
E

AS  

=
L

L

I

AS  

V

DS  

V

DD  

BV

DSS  

I

AS  

I

D  

R

G  

I

D

(t)  
V

DD  

V

DS

(t)  
DUT  
10V  
t

p  

Time  

Fig 15.
 
Peak Diode Recovery dv/dt Test Circuit
 
& Waveforms  
DUT  
+
V

DS  

_
I

S  

L
Driver  
R

G  

Same Type  
as DUT  
V

DD  

V

GS  

• dv/dt controlled by
 
R

G  

• I

S

controlled by pulse period  
Gate Pulse Width  
————————–  
V

GS  

D =  
Gate Pulse Period  
10V  
( Driver )  
I

FM

, Body Diode Forward Current  
I

S  

di/dt  
( DUT )  
I

RM  

Body Diode Reverse Current  
Body Diode Recovery dv/dt  
V

f  

V

DS  

( DUT )  
V

DD  

Body Diode  
Forward Voltage Drop  

Package Dimension  
TO-252  
±0.2  
6.6  
±0.1  
2.3  
±0.15  
5.35  
±0.05  
0.5  
±0.3  
1.2  
+0.1  
-0.05  
0.05  
±0.2  
±0.2  
0.8  
+0.1  
-0.05  
0.5  
0.6  
2.3typ  
2.3typ  

Package Dimension  
TO-251  
±0.2  
±0.1  
2.3  
6.6  
±0.15  
±0.05  
0.5  
5.35  
±0.15  
±0.15  
0.75  
0.8  
+0.1  
-0.05  
0.5  
±0.1  
0.6  
2.3typ  
2.3typ  
±0.3  
1.2