HL-S8N10

Part #HL-S8N10
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HL-S8N10
N-Ch 100V Fast Switching MOSFETs  
S
8
N
1
0
Product Summary  
Green Device Available  
Super Low Gat
e
C
harge  
Excellent CdV/dt effect decline  
Advanced high cell density Trench  
technology  
BVDSS  
100V  
RDSON  
110m
Ω
 
ID  
6.5A  
SOT89-3L Pin
 
Configuration  
Description  
The S8N10 is the high cell density trenched  
N-ch MOSFETs, which provides excellent  
RDSON and efficiency for most of the small  
power switching and load switch applications.  
The S8N10 meets the RoHS and Green  
Product requirement with full function reliability  
approved.  
Absolute Maximum Ratings  
Symbol  
Parameter  
Rating  
100  
Unit  
V
DS  
Drain-Source
V
o
ltage  
Gate-Sou
r
ce Voltage  
V
V
V
GS  
±
20  
Continuous Drain Current,
V
GS
@ 10
V

1  

Continuous Drain Current,
V
GS
@ 10
V

1  

I
D  
@T
A
=25
℃
 
6.5  
A
I
D  
@T
A
=70
℃  
3.2  
12  
A
I
DM  
Pulsed Drain Current  
2
A
P
D
@T  
A
=25
℃  
Total Power Dissipation  
3
2
W
℃
℃
T
STG  
Storage Temperature Range  
-55 to 150  
-55 to 150  
T
J
Operating Junction Temperature Range  
01  

N-Ch 100V Fast Switching MOSFETs  
S8N10  
Electrical Characteristics (T

J

=25 ℃ unless otherwise specified)  
Symbol  
Parameter  
Test condition  
Min.  
Typ.  
Max.  
Units  
Off Characteristic  
Drain-Source Breakdown
V
o
ltage  
Zero Gate Voltage Drain Current  
Gate to Body Leakage Current  
–
V
V
(BR)DSS  
DSS  
GSS  
V
GS
= 0
V
, I  

DS

= 100
V
, V

GS

= 0V  
V

DS

= 0
V
, V

GS

= ±20V  
D
= 250
μ
A  
100  
–
110  
–
μ
A  
nA  
I
V
1
±100  
–
–
I
On Characteristics

note3  

Gate Threshold
V
o
ltage  
V
V
GS(th)  
V

DS

= V

GS

, I  
D
= 250
μ
A  
= 3A  
1
–
1.95  
115  
3
140  
Static Drain-Source On-Resistance

note2  

m
Ω  
R
DS(on)  
V

GS

= 10
V
, I  
D
Dynamic Characteristics

note4  

Input Capacitance  
–
–
–
–
–
–
–
–
–
–
–
–
pF  
pF  
pF  
nC  
nC  
nC  
C
iss  
oss  
rss  
206  
28.9  
1.4  
4.3  
1.5  
Output Capacitance  
C
V

DS

= 50
V
, V

GS

= 0
V
, f =
1
.0
M
H
z  
Re
v
e
rse Transfer Capacitance  
Total Gate Charge  
C
Q
g
Gate-Source Charge  
Gate-Drain(“
M
i
ller”) Charge  
Q
gs  
V

DS

= 50
V
, I
 
=
3
A
, V

GS

= 10V  
D
Q
gd  
1.1  
Switching Characteristics

note4  

Turn-On Delay Time  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
–
–
–
–
–
–
–
–
ns  
ns  
ns  
ns  
t
d
(
o
n)  
14.7  
3.5  
20.9  
2.7  
t
r  
V

DD

= 50
V
, I

DS

=3
A
R  
G
= 2
Ω
,  
V

GEN

= 10V  
t
d
(
o
ff)  
t
f  
Drain-Source Diode Characteristics and Maximum Ratings  
–
–
–
–
–
–
–
–
A
A
I
S
M
a
x
i
mum Continuous Drain to Source Diode Forward Current

note2  

M
a
x
i
mum Pulsed Drain to Source Diode Forward Current  
6.5  
12  
1.3  
–
I
SM  
SD  
rr  
rr  
Drain to Source Diode Forward
V
o
ltage

note3  

Body Diode Re
v
e
rse Reco
v
e
ry Time  
–
V
V
V

GS

= 0
V
, I  
S
=3A  
ns  
nC  
A
t
32.1  
39.4  
2.1  
Body Diode Re
v
e
rse Reco
v
e
ry Time Charge  
–
–
Q
V

GS

= 0
V
, I  
F
= 3
A
,
d
i/dt =100
A
/
μ
s  
Characteristics  
Peak Re
v
e
rse Reco
v
e
ry Current  
I
rrm  
Notes:  
1. Repetitive Rating: Pulse width limited by maximum junction temperature.  
2. Surface Mounted on FR4 Board, t ≤ 10 sec.  
3. Pulse Test: Pulse Width ≤ 300μs, Duty Cycle ≤2%.  
4. Guaranteed by design, not subject to production 5. V

DD

=50 V, R
G
=50 Ω, L=0.3 mH, starting Tj=25 °C  
02  

N-Ch 100V Fast Switching MOSFETs  

S8N10  
Typical Electrical and Thermal Characteristics (Curves)  
Figure1: Output Characteristics  
Figure 2: Typical Transfer Characteristics  
Figure 3:Forward Characteristics of Reverse  
Figure 4:RDS(ON) vs. VGS  
Figure 5: RDS(ON) vs. ID  
Figure 6:Normalized RDS(on) vs. Temperature  
03  

N-Ch 100V Fast Switching MOSFETs  

S
8
N
1
0
Typical Performance Characteristics  
Figure 7: Capacitance Characteristics  
Figure 8: Gate Charge Characteristics  
04  

N-Ch 100V Fast Switching MOSFETs  
S8N10  
SOT-89-3L Package Information  
05