HUAYI-HY5012W

Part #HUAYI-HY5012W
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HUAYI-HY5012W
HY5012W/A  
N-Channel Enhancement Mode MOSFET  
Features  
Pin Description  
•
125V/300A  
2.9
m  

(typ.) @ V

GS

=10V  
R

DS(ON)  

=
•
•
•
Avalanche Rated  
Reliable and Rugged  
Lead Free and Gree
n
D
evice
s
A
vailable  
(RoHS Compliant)  
S
S
D
D
G
G
TO-247
A
-3L  
TO-3P-3L  
Applications  
Power Management for Inverter Systems.  
N Channe
l
M
OSFET  
Ordering and Marking Information  
Package Code  
W
A
W : TO-247A-3L  
A : TO-3P-3L  
HY5012  
HY5012  
Assembly Material  
Date Code  
YYXXXJWW G  
YYXXXJWW G  
G : Lead Free Device  
YYXXX WW  
Note: HUAYI lead -free products contain molding compounds/die attach materials and 100% matte tin plate  
Termination finish;which are fully compliant with RoHS. HUAYI lead -free products meet or exceed the lead-  
Free requirements of IPC/JEDEC J-STD-020 for MSL classification at lead-free peak reflow temperature.  
HUAYI defines
 
“Green” to mean lead-free (RoHS compliant) and halogen free (Br or Cl does not exceed  
900ppm by weight in homogeneous material and total of Br and Cl does not exceed 1500ppm by weight).  
HUAYI reserves the right to make changes, corrections, enhancements, modifications, and improvements to  
this pr-oduct and/or to this document at any time without notice.  
V1.0  
1

HY5012W/A  
Absolute Maximum Ratings  
Symbol  
Parameter  
Rating  
Unit  
Common Ratings
(T

C

=25°C Unless Otherwise Noted)  
V

DSS  

V

GSS  

T

J  

Drain-Source Voltage  
125  
±25  
V
Gate-Source Voltage  
Maximum Junction Temperature  
Storage Temperature Range  
Diode Continuous Forward Current  
175  
°C  
°C  
A
T

STG  

I

S  

55 to 175  
300  
T

C

=25°C  
Mounted on Large Heat Sink  
I

DM  

Pulsed Drain Current *  
T

C

=25°C  
T

C

=25°C  
T

C

=100°C  
T

C

=25°C  
T

C

=100°C  
1100**  
300  
196  
500  
250  
0.3  
A
A
I

D  

Continuous Drain Current  
P

D  

Maximum Power Dissipation  
W
Thermal Resistance-Junction to Case  
Thermal Resistance-Junction to Ambient  
R

JC  

R

JA  

°C/W  
40  
Avalanche Ratings  
E

AS

Avalanche Energ
y
,
S
ingle Pulsed  
Note
:
 
2000***  
mJ  
L=0.5mH  
* Repetitive
 
rating ; pulse width limiited by junction temperature  
** Drain
 
current is limited by junction temperature  
*** VD=100V  
Electrical Characteristics
 
(T

C

= 25
C Unless Otherwise Noted)  
HY5012  
Symbol  
Parameter  
Test Conditions  
Unit  
Min. Typ. Max.  
Static Characteristics  
BV

DSS

Drain-Source Breakdown Voltage  
125  
–
–
–
1
V
V

GS

=0V, I

DS

=250
A  
V

DS

=125V, V

GS

=0V  
–
–
I

DSS

Zero Gate Voltage Drain Current  
A  
T

J

=85°C  
–
10  
4
V

GS(th)

Gate Threshold Voltage  
I

GSS

Gate Leakage Current  
R

DS(ON)  

Diode Characteristics  
2
–
3
V
V

DS

=V

GS

, I

DS

=250
A  
V

GS

=±25V, V

DS

=0V  
–
±100  
3.6  
nA  
m
  
2.9  
*
Drain-Source On-state Resistance
 
V

GS

=10V, I

DS

=150A  
–
V

SD

*  
t

rr  

Diode Forward Voltage  
I

SD

=15
0
A
, V

GS

=0V  
–
–
–
0.8  
70  
1.3  
V
Reverse Recovery Time  
Reverse Recovery Charge  
–
–
ns  
nC  
I

SD

=15
0
A
,dl

SD

/dt=100A/
s  
Q

rr  

134  
V1.0  
2

HY5012W/A  
Electrical Characteristics (Cont.)
 

(T

C

= 25
C Unless Otherwise Noted)  

HY5012  
Symbol  
Parameter  
Test Conditions  
Unit  
Min. Typ. Max.  
Dynamic Characteristics  
R

G  

C

iss  

C

oss  

C

rss  

t

d(ON)  

T

r  

Gate Resistance  
V

GS

=0V,V

DS

=0V,F=1MHz  
–
–
–
–
–
–
–
–
0.5  
16300  
1570  
930  
55  
–
–
–
–
–
–
–
–
Input Capacitance  
V

GS

=0V,  
V

DS

=25V,  
Frequency=1.0MHz  
pF  
Output Capacitance  
Reverse Transfer Capacitance  
Turn-on Delay Time  
Turn-on Rise Time  
V

DD

=62.5 V,
R

G

=
6
,  
I

DS

=150A,
V

GS

=10V,  
49  
ns  
t

d(OFF)

Turn-off Delay Time  
T

f

Turn-off Fall Time  
Gate Charge Characteristics  
122  
98  
352  
46  
–
–
–
Q

g  

Q

gs  

Q

gd  

Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
–
–
–
V

DS

=100V, V

GS

=10V,  
I

DS

=150A  
nC  
136  
Note * : Pulse test ; pulse width
300
s, duty cycle
2%.  
V1.0  
3

HY5012W/A  
Typical Operating Characteristics  
Power Dissipation  
Drain Current  
320  
280  
240  
200  
500  
400  
300  
200  
100  
limited by package  
160  
120  
80  
40  
T

C

=25

o

C  
0
T

C

=25

o

C,V

G

=10V  
0
20 40 60 80
 
100 120 140 160 180 200  
0
20 40 60 80
 
100 120 140 160 180 200  
T

c

–  
Temperature (°C)  
T

c

–
C
ase
T
emperature (°C)  
Case  
Safe Operation Area  
1000  
100us  
100  
10  
10ms  
1ms  
DC  
1
0.1  
1
10  
100  
400  
V

DS

– Drain – Source Voltage (V)  
Thermal Transient Impedance  
1
Duty =
 
0.5  
0.2  
0.1  
0.1  
0.01  
0.05  
0.02  
0.001  
0.01  
Mounted on minimum pad  
o
R

JA  

:
40 C/W  
Single  
0.0001  
0.1  
0.0001  
0.001  
0.01  
1
10  
Square Wave Pulse Duration (sec)  
V1.0  
4

HY5012W/A  
Typical Operating Characteristics (Cont.)  
Output Characteristics  
Drain-Source On Resistance  
4.0  
3.5  
400  
350  
300  
250  
200  
150  
100  
50  
V

GS

= 6,7,8,9,10V  
5.5V  
V

GS

=10V  
5V  
3.0  
2.5  
4.5V  
0
0.0  
2.0  
0
80  
160  
240  
320  
400  
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
V

DS

– Drain-Source Voltage (V)  
I

D

– Drain Current (A)  
Drain-Source On Resistance  
Gate Threshold Voltage  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
7.0  
6.0  
5.0  
4.0  
3.0  
I

DS

=150A  
I

DS

=250
A  
2.0  
1.0  
4
5
6
7
8
9
10  
-50 -25  
0
25 50 75
 
100 125 150 175  
V

GS

– Gate – Source Voltage (V)  
T

j

– Junction
T
emperature (°C)  
V1.0  
5

HY5012W/A  
Typical Operating Characteristics (Cont.)  
Drain-Source On Resistance  
Source-Drain Diode Forward  
2.4  
2.2  
2.0  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
V

GS

= 10V  
1000  
100  
10  
I

DS

=150A  
T

j

=175

o

C  
T

j

=25

o

C  
R

ON

@T

j

=25

o

C: 2.9m
 
1
-50 -25  
0
25 50 75
 
100 125 150 175  
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4  
T

j

– Junction
T
emperature (°C)  
V

SD

– Source-Drain Voltage (V)  
Capacitance  
Gate Charge  
10  
22000  
20000  
18000  
16000  
14000  
12000  
10000  
8000  
6000  
4000  
2000  
0
Frequency=1MHz  
Ciss  
V

DS

= 100V  
I

DS

= 150A  
9
8
7
6
5
4
3
2
1
0
Coss  
Crss  
0
5
10 15 20 25 30 35 40  
0
50 100
 
150 200 250 300 350 400  
V

DS

– Drain – Source Voltage (V)  
Q

G

–
G
ate Charge (nC)  
V1.0  
6

HY5012W/A  
Avalanche Test Circuit  
Switching Time Test Circuit  
Gate Charge Test Circuit  
V1.0  
7

HY5012W/A  
Device Per Unit  
Package Type  
Unit  
Quantity  
TO-247A-3L  
Tube  
30  
Package Information  
TO-247A
–
3
L  
PP  
120  
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V1.0  

HY5012W/A  
Device Per Unit  
Package Type  
Unit  
Quantity  
TO-3P-3L  
Tube  
30  
Package Information  
TO-3P-3L  
9
V1.0  

HY5012W/A  
Classification Profile  
Classification Reflow Profiles  
Profile Feature  
Preheat & Soak  
Sn-Pb Eutectic Assembly  
Pb-Free Assembly  
100
q
C  
150
q
C  
60-120 seconds  
150
q
C  
200
q
C  
60-120 seconds  
Temperature min (T

smin  

)
Temperature max (T

smax  

)
Time (T

smin

to T

smax

) (t

s

)  
Average ramp-up rate  
(T

smax

to T

P

)  
3
q
C/second max.  
3
q
C/second max.  
Liquidous temperature (T

L

)  
Time at liquidous (t

L

)  
183
q
C  
60-150 seconds  
217
q
C  
60-150 seconds  
Peak package body Temperature  
(T

p

)*  
See Classification Temp in table 1  
20** seconds  
See Classification Temp in table 2  
30** seconds  
Time (t

P

)** within 5
q
C of the specified  
classification temperature (T

c

)  
Average ramp-down rate (T

p

to T

smax  

)
6
q
C/second max.  
6
q
C/second max.  
6 minutes max.  
8 minutes max.  
Time 25
q
C to peak temperature  
* Tolerance for peak profile Temperature (T

p

) is defined as a supplier minimum and a user maximum.  
** Tolerance for time at peak profile temperature (t

p

) is defined as a supplier minimum and a user maximum.  
10  
V1.0  

HY5012W/A  
Table 1. SnPb Eutectic Process – Classification Temperatures (Tc)  
Volume mm

3  

Package  
Thickness  
Volume mm

3  

<350  
≥
350  
<2.5 mm  
235
q
C  
220
q
C  
220
q
C  
t
2.5 mm  
220
q
C  
Table 2. Pb-free Process – Classification Temperatures (Tc)  
Package  
Thickness  
<1.6 mm  
Volume mm

3  

<350  
Volume mm

3  

350-2000  
260
q
C  
Volume mm

3  

>2000  
260
q
C  
245
q
C  
245
q
C  
260
q
C  
260
q
C  
250
q
C  
1.6 mm – 2.5 mm  
t
2.5 mm  
250
q
C  
245
q
C  
Reliability Test Program  
Test item  
SOLDERABILITY  
Method  
JESD-22, B102  
Description  
5 Sec, 245°C  
HTRB  
PCT  
JESD-22, A108  
JESD-22, A102  
JESD-22, A104  
168 Hrs /500 Hrs /1000 Hrs, Bias @ 150°C  
96Hrs, 100%RH, 2atm, 121°C  
500 Cycles, -55°C~150°C  
TCT  
Customer Service  
Worldwide Sales and Service: sales@hymexa.com  
Technical Support: Technology@hymexa.com  
Xi’an Huayi Microelectronics Co., Ltd.  
No.8928,Shangji Road,Economic and
T
e
chnological Development Zone,Xi’an,China  
TEL: (86-029) 86685706  
FAX: (86-029) 86685705  
E-mail: sales@hymexa.com  
11  
V1.0