HXY-MOSFET-AO4606-HXY

Part #HXY-MOSFET-AO4606-HXY
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HXY-MOSFET-AO4606-HXY
HUAXUANYANG  
HXY  
AO4606-HXY  
ELECTRONICS CO.,LTD  
Dual N+P-Channel Enhancement Mode MOSFET  
Description  
The AO4606-HXY uses advanced trench technology  
to provide excellent R

DS(ON)

, low gate charge and  
operation with gate voltages as low as 4.5
V
. This  
device is suitable for use as a  
D2  
D2  
D1  
D1  
G2  
S2  
G1  
S1  
Battery protection or in other Switching application.  
SOP-8  
General Features  
V

DS

= 30V
 
I

D

=6A  
R

DS(ON)

< 30mΩ @ V

GS

=10V  
V

DS

= -30V
 
I

D

=-5.5A  
D1  
S1  
D1 D2  
D2  
G2  
R

DS(ON)

< 48
 
mΩ @ V

GS

=-10V  
Application  
G1 S2  
Wireless charging  
N-Channel and
 
P-Channel  
Boost driver  
Brushless motor  
Package Marking and Ordering Information  
Product ID  
Pack  
Marking  
Qty(PCS)  
AO4606-HXY  
SOP-8  
4606 XXXX  
3000  
Absolute Maximum Ratings (T

C

=25
℃
unless otherwise noted)  
Rating  
Symbol  
Parameter  
Units  
N-Channel  
P-Channel  
VDS  
VGS  
Drain-Source Voltage  
Gate-Source Voltage  
30  
-30  
±20  
V
V
±20  
I

D

@T

A

=25
℃
 
I

D

@T

A

=70
℃  
IDM  
Continuous Drain Current, V

GS

@ 10V

1  

Continuous Drain Current, V

GS

@ 10V

1  

Pulsed Drain Current

2  

6
-5.5  
A
5
-4.3  
A
30  
-30  
A
EAS  
Single Pulse Avalanche Energy

3  

T
o
tal Power Dissipation

4  

5
26  
mJ  
W
P

D

@T

A

=25
℃  
TSTG  
2
2
Storage
T
e
mperature Range  
-55 to 150  
-55 to 150  
-55 to 150  
-55 to 150  
℃
T

J  

Operating Junction
T
e
mperature Range  
Thermal Resistance Junction-Ambient

1  

Thermal Resistance Junction-Case

1  

℃
R

θ

JA  
62.5  
40  
℃
/W  
℃
/W  
R

θ

JC  
Shenzhen HuaXuanYang Electronics CO.,LTD  

HUAXUANYANG  
HXY  
AO4606-HXY  
ELECTRONICS CO.,LTD  
Dual N+P-Channel Enhancement Mode MOSFET  
N-Channel Electrical Characteristics (TJ =25
℃
, unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
STATIC PARAMETERS  
I

D

=250
µ
A, V

GS

=0V  
BV

DSS  

Drain-Source Breakdown Voltage  
30  
V
V

DS

=30V, V

GS

=0V  
1
5
I

DSS  

Zero Gate Voltage Drain Current  
µ
A  
T

J

=55
°
C  
I

GSS  

V

DS

=0V, V

GS

=±20V  
Gate-Body leakage current  
Gate Threshold Voltage  
On state drain current  
±100  
2.4  
nA  
V
V

GS(th)  

I

D(ON)  

V

DS

=V

GS

I

D

=250
µ
A  
1.2  
30  
1.8  
V

GS

=10V, V

DS

=5V  
A
V

GS

=10V, I

D

=6A  
2
0  
40  
30  
48  
42  
m
Ω  
R

DS(ON)  

Static Drain-Source On-Resistance  
T

J

=125
°
C  
V

GS

=4.5V, I

D

=5A  
V

DS

=5V, I

D

=6A  
I

S

=1A,V

GS

=0V  
33.5  
15  
m
Ω  
S
g

FS  

V

SD  

I

S  

Forward Transconductance  
Diode Forward Voltage  
0.76  
1
V
Maximum Body-Diode Continuous Current  
2.5  
A
DYNAMIC PARAMETERS  
C

iss  

C

oss  

C

rss  

R

g  

Input Capacitance  
200  
30  
255  
45  
310  
60  
pF  
pF  
pF  
Ω
V

GS

=0V, V

DS

=15V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
20  
35  
50  
V

GS

=0V, V

DS

=0V, f=1MHz  
1.6  
3.25  
4.9  
SWITCHING PARAMETERS  
Q

g

(10V) Total
 
Gate Charge  
Q

g

(4.5V) Total
 
Gate Charge  
4
2
5.2  
2.55  
0.85  
1.3  
6
3
nC  
nC  
nC  
nC  
ns  
V

GS

=10V, V

DS

=15V, I

D

=6A  
Q

gs  

Q

gd  

t

D(on)  

t

r  

Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
4.5  
Turn-On Rise Time  
V

GS

=10V, V

DS

=15V, R

L

=2.5
Ω
,  
R

GEN

=3
Ω  
2.5  
ns  
t

D(off)  

t

f  

Turn-Off DelayTime  
14.5  
3.5  
ns  
Turn-Off Fall Time  
ns  
t

rr  

I

F

=6A, dI/dt=100A/
µ
s  
I

F

=6A, dI/dt=100A/
µ
s  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
8.5  
12  
3
ns  
Q

rr  

nC  
2.2  
A. The value of R

θ
JA

is measured with the device mounted on 1in

2

FR-4 board with 2oz. Copper, in a still air environment with T

A

=25
°
C. The  
value in any given application depends on the user’s specific board design.  
B. The power dissipation P

D

is based on T

J(MAX)

=150
°
C, using
≤
10s junction-to-ambient thermal resistance.  
C. Repetitive
 
rating, pulse width limited by junction temperature T

J(MAX)

=150
°
C. Ratings are based on low frequency and duty cycles to keep  
initialT

J

=25
°
C.  
D. The R

θ
JA

is the sum of the thermal impedence from junction to lead R

θ
JL

and lead to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300
µ
s pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-ambient thermal impedence which is measured with the device mounted on 1in

2

FR-4 board with  
2oz. Copper, assuming a maximum junction temperature of T

J(MAX)

=150
°
C. The SOA curve provides a single pulse rating.  
Shenzhen HuaXuanYang Electronics CO.,LTD  

HUAXUANYANG  
HXY  
AO4606-HXY  
ELECTRONICS CO.,LTD  
Dual N+P-Channel Enhancement Mode MOSFET  
30  
25  
20  
15  
10  
5
15  
12  
9
10V  
V

DS

=5V  
4.5V  
7V  
4V  
3.5V  
6
125
°
C  
3
25
°
C  
V

GS

=3V  
0
0
0
1
2
3
4
5
1
1.5  
2
2.5  
3
3.5  
4
V

DS

(Volts)  
Fig 1: On-Region Characteristics (Note E)  
V

GS

(Volts)  
Figure 2: Transfer Characteristics (Note E)  
45  
2
V

GS

=4.5V  
I

D

=6A  
1.8  
1.6  
1.4  
1.2  
1
40  
35  
30  
25  
20  
V

GS

=4.5V  
V

GS

=10V  
I

D

=8A  
V

GS

=10V  
0.8  
0
3
6
9
12  
15  
0
25  
50  
75  
100  
125  
150  
175  
I

D

(A)  
Temperature (
°
C
)  
Figure 3: On-Resistance vs. Drain Current and Gate  
Voltage (Note E)  
Figure 4: On-Resistance vs. Junction Temperature  
(Note E)  
100  
80  
1.0E+02  
1.0E+01  
I

D

=6A  
1.0E+00  
125
°
C  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
60  
125
°
C  
25
°
C  
25
°
C  
40  
20  
0
2
4
6
8
10  
0.0  
0.2  
0.4  
V

SD

(Volts)  
Figure 6: Body-Diode Characteristics (Note E)  
0.6  
0.8  
1.0  
1.2  
V

GS

(Volts)  
Figure 5: On-Resistance vs. Gate-Source Voltage  
(Note E)  
Shenzhen HuaXuanYang Electronics CO.,LTD  

HUAXUANYANG  
HXY  
AO4606-HXY  
ELECTRONICS CO.,LTD  
Dual N+P-Channel Enhancement Mode MOSFET  
10  
8
500  
400  
300  
200  
100  
0
V

DS

=15V  
I

D

=6A  
C

iss  

6
4
C

oss  

2
C

rss  

0
0
5
10  
15  
20  
25  
30  
0
2
4
6
V

DS

(Volts)  
Q

g

(nC)  
Figure 8: Capacitance Characteristics  
Figure 7: Gate-Charge Characteristics  
100.0  
10.0  
1.0  
1000  
100  
10  
T

A

=25
°
C  
10
µ
s  
R

DS(ON)  

limited  
100
µ
s  
1ms  
10ms  
0.1  
T

J(Max)

=150
°
C  
T

A

=25
°
C  
10s  
DC  
1
0.0  
0.00001  
0.001  
0.1  
10  
1000  
0.01  
0.1  
1
10  
100  
V

DS

(Volts)  
Pulse Width (s)  
Figure 10: Single Pulse Power Rating Junction-  
to-Ambient (Note F)  
Figure 9: Maximum Forward Biased  
Safe Operating Area (Note F)  
10  
In descending order  
D=T

on

/T  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
T

J,PK

=T

A

+P

DM

.Z

θ
JA

.R

θ
JA  

R

θ
JA

=90
°
C/W  
1
0.1  
P

D  

0.01  
T

on  

T
0.001  
0.00001  
0.0001  
0.001  
0.01  
Pulse Width (s)  
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)  
0.1  
1
10  
100  
1000  
Shenzhen HuaXuanYang Electronics CO.,LTD  

HUAXUANYANG  
HXY  
AO4606-HXY  
ELECTRONICS CO.,LTD  
Dual N+P-Channel Enhancement Mode MOSFET  
Gate Charge Test Circuit & Waveform  
Vgs  
Qg  
10V  
+
VDC  
+
Qgs  
Qgd  
Vds  
VDC  
–
–
DUT  
Vgs  
Ig  
Charge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vds  
Vds  
90%  
10%  
+
DUT  
Vdd  
Vgs  
Rg  
VDC  
–
Vgs  
Vgs  
t

d(on)  

t
r
t

d(off)  

t
f
t

on  

t

off  

Unclamped Inductive Switching (UIS) Test Circuit & Waveforms  
L
E

AR

= 1/2 L
I

A

2

R  

B
V

DSS  

Vds  
Id  
Vds  
+
Vgs  
Vdd  
I

AR  

Vgs  
VDC  
Id  
Rg  
–
DUT  
Vgs  
Vgs  
Diode Recovery Test Circuit & Waveforms  
Q

rr

= –
 
Idt  
Vds +  
Vds –  
Ig  
DUT  
Vgs  
t

rr  

L
Isd  
I

F  

Isd  
Vgs  
dI/dt  
I

RM  

+
Vdd  
VDC  
Vdd  
–
Vds  
Shenzhen HuaXuanYang Electronics CO.,LTD  

HUAXUANYANG  
HXY  
AO4606-HXY  
ELECTRONICS CO.,LTD  
Dual N+P-Channel Enhancement Mode MOSFET  
P-Channel Electrical Characteristics (TJ =25
℃
, unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
STATIC PARAMETERS  
I

D

=-250
µ
A, V

GS

=0V  
BV

DSS  

Drain-Source Breakdown Voltage  
-30  
V
V

DS

=-30V, V

GS

=0V  
-1  
-5  
I

DSS  

Zero Gate Voltage Drain Current  
µ
A  
T

J

=55
°
C  
V

DS

=0V, V

GS

=±20V  
I

GSS  

Gate-Body leakage current  
Gate Threshold Voltage  
On state drain current  
±100  
-2.4  
nA  
V
V

GS(th)  

I

D(ON)  

V
V
V

DS

=V

GS

I

D

=-250
µ
A  

GS

=-10V, V

DS

=-5V  

GS

=-10V, I

D

=-6.5A  
-1.3  
-30  
-1.85  
A
40  
32  
48  
40  
44  
m
Ω  
R

DS(ON)  

Static Drain-Source On-Resistance  
T

J

=125
°
C  
V
V

GS

=-4.5V, I

D

=-5A  

DS

=-5V, I

D

=-6.5A  
34  
m
Ω  
S
g

FS  

V

SD  

I

S  

Forward Transconductance  
Diode Forward Voltage  
18  
I

S

=-1A,V

GS

=0V  
-0.8  
-1  
V
Maximum Body-Diode Continuous Current  
-2.5  
A
DYNAMIC PARAMETERS  
C

iss  

C

oss  

C

rss  

R

g  

Input Capacitance  
760  
140  
95  
pF  
pF  
pF  
Ω
V

GS

=0V, V

DS

=-15V, f=1MHz  
V

GS

=0V, V

DS

=0V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
1.5  
3.2  
5
SWITCHING PARAMETERS  
Q

g

(10V) Total
 
Gate Charge  
Q

g

(4.5V) Total
 
Gate Charge  
13.6  
6.7  
2.5  
3.2  
8
16  
8
nC  
nC  
nC  
nC  
ns  
V

GS

=10V, V

DS

=-15V, I

D

=-6.5A  
Q

gs  

Q

gd  

t

D(on)  

t

r  

Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
Turn-On Rise Time  
V

GS

=10V, V

DS

=-15V, R

L

=2.3
Ω
,  
R

GEN

=3
Ω  
6
ns  
t

D(off)  

t

f  

Turn-Off DelayTime  
17  
5
ns  
Turn-Off Fall Time  
ns  
t

rr  

I

F

=-6.5A, dI/dt=100A/
µ
s  
I

F

=-6.5A, dI/dt=100A/
µ
s  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
15  
9.7  
ns  
Q

rr  

nC  
A. The value of R

θ
JA

is measured with the device mounted on 1in

2

FR-4 board with 2oz. Copper, in a still air environment with T

A

=25
°
C. The  
value in any given application depends on the user’s specific board design.  
B. The power dissipation P

D

is based on T

J(MAX)

=150
°
C, using
≤
10s junction-to-ambient thermal resistance.  
C. Repetitive
 
rating, pulse width limited by junction temperature T

J(MAX)

=150
°
C. Ratings are based on low frequency and duty cycles to keep  
initialT

J

=25
°
C.  
D. The R

θ
JA

is the sum of the thermal impedence from junction to lead R

θ
JL

and lead to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300
µ
s pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-ambient thermal impedence which is measured with the device mounted on 1in

2

FR-4 board with  
2oz. Copper, assuming a maximum junction temperature of T

J(MAX)

=150
°
C. The SOA curve provides a single pulse rating.  
Shenzhen HuaXuanYang Electronics CO.,LTD  

HUAXUANYANG  
HXY  
AO4606-HXY  
ELECTRONICS CO.,LTD  
Dual N+P-Channel Enhancement Mode MOSFET  
40  
30  
20  
10  
0
40  
30  
20  
10  
0
V

DS

=-5V  
-10V  
-5V  
-4.5V  
-4V  
125
°
C  
-3.5V  
25
°
C  
V

GS

=-3V  
0
1
2
3
4
5
0
1
2
3
4
5
-V

DS

(Volts)  
Fig 1: On-Region Characteristics (Note E)  
-V

GS

(Volts)  
Figure 2: Transfer Characteristics (Note E)  
45  
1.8  
1.6  
1.4  
1.2  
1
V

GS

=-4.5V  
40  
35  
30  
25  
20  
15  
10  
V

GS

=-10V  
I

D

=-6.5A  

=-4.5

V  

I

D

=-5A  
V

GS  

V

GS

=-10V  
0.8  
0
5
10  
15  
20  
0
25  
50  
75  
100  
125  
150  
175  
-I

D

(A)  
Temperature (
°
C
)  

Figure 4: On-Resistance vs. Junctio
n

Temperature  

Figure 3: On-Resistance vs. Drain Current and Gate  
Voltage (Note E)  
(Note E)  
90  
1.0E+02  
1.0E+01  
I

D

=-6.5A  
70  
50  
30  
10  
1.0E+00  
125
°
C  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
125
°
C  
25
°
C  
25
°
C  
2
4
6
8
10  
0.0  
0.2  
0.4  
-V

SD

(Volts)  
Figure 6: Body-Diode Characteristics (Note E)  
0.6  
0.8  
1.0  
1.2  
-V

GS

(Volts)  
Figure 5: On-Resistance vs. Gate-Source Voltage  
(Note E)  
Shenzhen HuaXuanYang Electronics CO.,LTD  

HUAXUANYANG  
HXY  
AO4606-HXY  
ELECTRONICS CO.,LTD  
Dual N+P-Channel Enhancement Mode MOSFET  
10  
1200  
1000  
800  
600  
400  
200  
0
V

DS

=-15V  
I

D

=-6.5A  
8
6
4
2
0
C

iss  

C

oss  

C

rss  

0
5
10  
15  
20  
25  
30  
0
3
6
9
12  
15  
-V

DS

(Volts)  
Q

g

(nC)  
Figure 8: Capacitance Characteristics  
Figure 7: Gate-Charge Characteristics  
1000  
100  
10  
100.0  
10.0  
1.0  
T

A

=25
°
C  
10
µ
s  
R

DS(ON)  

limited  
100
µ
s  
1ms  
10ms  
0.1  
DC  
T

J(Max)

=150
°
C  
T

A

=25
°
C  
10s  
0.0  
1
0.01  
0.1  
1
10  
100  
0.00001  
0.001  
0.1  
10  
1000  
-V

DS

(Volts)  
Pulse Width (s)  
Figure 9: Maximum Forward Biased Safe  
Operating Area (Note F)  
Figure 10: Single Pulse Power Rating Junction-  
to-Ambient (Note F)  
10  
D=T

on

/T  
In descending order  
T

J,PK

=T

A

+P

DM

.Z

θ
JA

.R

θ
JA  

D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
1
R

θ
JA

=90
°
C/W  
0.1  
P

D  

0.01  
T

on  

T
0.001  
0.00001  
0.0001  
0.001  
0.01  
Pulse Width (s)  
Figure 11: Normalized Maximum Transient Thermal Impedance (Note F)  
0.1  
1
10  
100  
1000  
Shenzhen HuaXuanYang Electronics CO.,LTD  

HUAXUANYANG  
HXY  
AO4606-HXY  
ELECTRONICS CO.,LTD  
Dual N+P-Channel Enhancement Mode MOSFET  
Gate Charge Test Circuit & Waveform  
Vgs  
Qg  
–
-10V  
–
VDC  
Qgs  
Qgd  
+
Vds  
VDC  
+
DUT  
Vgs  
Ig  
Charge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vds  
t

off  

t

on  

t
t

d(off)  

t

d(on)  

t
r
f
Vgs  
–
90%  
10%  
DUT  
Vdd  
Vgs  
Rg  
VDC  
+
Vgs  
Vds  
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms  
E

AR

= 1/2 LI

A

2

R  

L
Vds  
Vds  
Id  
–
BV

DSS  

Vgs  
Vdd  
Vgs  
Rg  
VDC  
+
Id  
I

AR  

DUT  
Vgs  
Vgs  
Diode Recovery Test Circuit & Waveforms  
Q

rr

= –
 
Idt  
Vds +  
Vds –  
Ig  
DUT  
Vgs  
t

rr  

L
-Isd  
-I

F  

Isd  
Vgs  
dI/dt  
-I

RM  

+
Vdd  
VDC  
Vdd  
–
-Vds  
Shenzhen HuaXuanYang Electronics CO.,LTD  

HUAXUANYANG  
HXY  
AO4606-HXY  
ELECTRONICS CO.,LTD  
Dual N+P-Channel Enhancement Mode MOSFET  
SO
P-8
Package Outline Dimensions  
Dimensions In Millimeters  
Dimensions In Inches  
Sy
m
bo l  
M
i
n  
1.350  
0.100  
1.
3
50  
0.330  
0.170  
4.800  
Max  
1.
7
50  
0.250  
1.5
5
0  
0.510  
0.250  
5.000  
M
i
n  
0.053  
0.004  
0.0
53  
0.013  
0.007  
0.189  
Max  
0.069  
0.010  
0.0
61  
0.020  
0.010  
0.197  
A
A1  
A2  
b
c
D
e
1.270(BSC)  
0.050(BSC)  
E
5.800  
3.800  
0.400  
0°  
6.200  
4.000  
1.270  
8°  
0.228  
0.150  
0.016  
0°  
0.244  
0.157  
0.050  
8°  
E1  
L
θ
Shenzhen HuaXuanYang Electronics CO.,LTD  

HUAXUANYANG  
HXY  
AO4606-HXY  
ELECTRONICS CO.,LTD  
Dual N+P-Channel Enhancement Mode MOSFET  
Attention  
■ Any and all HUA XUAN YANG ELECTRONICS products described or contained herein do not have specifications that can handle  
applications that require extremely high levels of reliability, such as life-support systems, aircraft’s control systems, or other applications  
whose failure can be reasonably expected to result in serious physical and/or material damage. Consult with your HUA XUAN YANG  
ELECTRONICS representative nearest you before using any HUA XUAN YANG ELECTRONICS products described or contained herein  
in such applications.  
■ HUA XUAN YANG ELECTRONICS assumes no responsibility for equipment failures that result from using products at values that  
exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or other parameters) listed in products  
specifications of any and all HUA XUAN YANG ELECTRONICS products described or contained herein.  
■ Specifications of any and all HUA XUAN YANG ELECTRONICS products described or contained herein stipulate the performance,  
characteristics, and functions of the described products in the independent state, and are not guarantees of the performance,  
characteristics, and functions of the described products as mounted in the customer’s products or equipment. To verify symptoms and  
states that cannot be evaluated in an independent device, the customer should always evaluate and test devices mounted in the  
customer’s products or equipment.  
■ HUA XUAN YANG ELECTRONICS CO.,LTD. strives to supply high-quality high-reliability products. However, any and all semiconductor  
products fail with some probability. It is possible that these probabilistic failures could  
give rise to accidents or events that could endanger human lives, that could give rise to smoke or fire, or that could cause damage to other  
property. When designing equipment, adopt safety measures so that these kinds of accidents or events cannot occur. Such measures  
include but are not limited to protective circuits and error prevention circuits for safe design, redundant design, and structural design.  
■ In the event that any or all HUA XUAN YANG ELECTRONICS products(including technical data, services) described or contained herein  
are controlled under any of applicable local export control laws and regulations, such products must not be exported without obtaining the  
export license from the authorities concerned in accordance with the above law.  
■ No part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including  
photocopying and recording, or any information storage or retrieval system, or otherwise, without the prior written permission of HUA  
XUAN YANG ELECTRONICS CO.,LTD.  
■ Information (including circuit diagrams and circuit parameters) herein is for example only ; it is not guaranteed for volume production.  
HUA XUAN YANG ELECTRONICS believes information herein is accurate and reliable, but no guarantees are made or implied regarding  
its use or any infringements of intellectual property rights or other rights of third parties.  
■ Any and all information described or contained herein are subject to change without notice due to product/technology improvement, etc.  
When designing equipment, refer to the “Delivery Specification” for the HUA XUAN YANG ELECTRONICS product that you intend to use.  
Shenzhen HuaXuanYang Electronics CO.,LTD