HXY-MOSFET-HD6956

Part #HXY-MOSFET-HD6956
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HXY-MOSFET-HD6956
HUAXUANYANG  
HXY  
HD6956  
ELECTRONICS CO.,LTD  
N-Channel Enhancement Mode MOSFET  
Description  
The HD6956 uses advanced trench technology  
to provide excellent R

DS(ON)

, low gate charge and  
operation with gate voltages as low as 4.5
V
. This  
device is suitable for use as a  
D
S
G
Battery protection or in other Switching application.  
TO252-2
L
 
General Features  
V

DS

= 60V
 
I

D

=50 A  
PIN2 D  
!
R

DS(ON)

< 15mΩ @ V

GS

=10V  
Application  
“
! ”  
“
!
PIN1 G  
“
!
PIN3 S  
Battery protection  
N-Channel MOSFET  
Load switch  
Uninterruptible power supply  
Package Marking and Ordering Information  
Product ID  
Pack  
Marking  
Qty(PCS)  
HD6956  
TO252-2L  
HD6956 XXYYS  
2500  
Absolute Maximum Ratings (T

C

=25
℃
unless otherwise noted)  
Symbol  
Parameter  
Rating  
Units  
V
V
DS  
Drain-Source Voltage  
60  
±
20  
50  
V
GS  
V
Gate-Sou
r
ce Voltage  
Continuous Drain Current, V

GS

@ 10V

1  

Continuous Drain Current, V

GS

@ 10V

1  

Continuous Drain Current, V

GS

@ 10V

1  

Continuous Drain Current, V

GS

@ 10V

1  

Pulsed Drain Current

2  

A
I

D

@T

C

=25
℃  
A
I

D

@T

C

=100
℃  
25  
7.4  
A
I

D

@T

A

=25
℃  
I

D

@T

A

=70
℃  
I
DM  
6
A
A
9
0  
EAS  
Single Pulse Avalanche Energy

3  

Avalanche Current  
39.2  
mJ  
A
I
AS  
28  
T
o
tal Power Dissipation

4  

45  
2
W
W
℃
℃
℃
/W  
P

D

@T

C

=25
℃  
P

D

@T

A

=25
℃  
T
STG  
T
o
tal Power Dissipation

4  

Storage
T
e
mperature Range  
Operating Junction
T
e
mperature Range  
Thermal Resistance Junction-Ambient

1  

-55 to 150  
-55 to 150  
62  
T

J  

R

θ

JA  
Shenzhen HuaXuanYang Electronics CO.,LTD  

HUAXUANYANG  
HXY  
HD6956  
ELECTRONICS CO.,LTD  
N-Channel Enhancement Mode MOSFET  
R

θ

JC  
Thermal Resistance Junction-Case

1  

2.8  
℃
/W  
Electrical Characteristics (T

J

=25
℃
, unless otherwise noted)  
Symbol  
BV
DSS  
Parameter  
Conditions  
V

GS

=0V , I

D

=250uA  
Reference to 25
℃
, I

D

=1mA  
V

GS

=10V , I

D

=20A  
Min.  
60  
Typ.  
—  
Max.  
—  
Unit  
V
Drain-Source Breakdown Voltage  
BV

DSS

T
e
mperature Coefficient  
—  
0.057  
11  
—  
△
BV
DSS
/
△
T
J  
V/
℃  
—  
15  
Static Drain-Source On-Resistance

2  

Gate Threshold Voltage  
V

GS

=4.5V , I

D

=10A  
—  
1.2  
15  
—  
20  
2.5  
m
Ω
 
R
DS(ON)  
V
GS(th)  
V
△
V

GS(th)  

V

GS(th)

T
e
mperature Coefficient  
—  
—  
-5.68  
—  
—  
1
mV/
℃  
V

GS

=V

DS

, I

D

=250uA  
V

DS

=48V , V

GS

=0V , T

J

=25
℃  
—  
—  
5
V

DS

=48V , V

GS

=0V , T

J

=55
℃  
I
DSS  
I
GSS  
Drain-Source Leakage Current  
Gate-Source Leakage Current  
uA  
nA  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
45  
V

GS

=
±
20V , V

DS

=0V  
V

DS

=5V , I

D

=15A  
±
100  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
35  
80  
1
gfs  
R

g  

Forward Transconductance  
Gate Resistance  
S
V

DS

=0V , V

GS

=0V , f=1MHz  
1.7  
19.3  
7.1  
7.6  
7.2  
50  
Ω
Q

g  

T
o
tal Gate Charge (4.5V)  
Gate-Source Charge  
Gate-Drain Charge  
Q

gs  

Q

gd  

T
d(on)  
T

r  

V

DS

=48V , V

GS

=4.5V , I

D

=15A  
nC  
ns  
Turn-On Delay Time  
Rise Time  
V

DD

=30V , V

GS

=10V ,  
R

G

=3.3  
I

D

=15A  
,
T
d(off)  
T

f  

Turn-Off Delay Time  
Fall Time  
36.4  
7.6  
2423  
145  
97  
C

iss  

C
oss  
C
rss  
I

S  

Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
Continuous Source Current

1,5  

Pulsed Source Current

2,5  

Diode Forward Voltage

2  

Reverse Recovery Time  
Reverse Recovery Charge  
V

DS

=15V , V

GS

=0V , f=1MHz  
pF  
—  
A
A
V

G

=V

D

=0V , Force Current  
I
SM  
V
SD  
t

rr  

—  
—  
V
V

GS

=0V , I

S

=A , T

J

=25
℃  
16.3  
11  
—  
—  
nS  
nC  
I
F
=15A  
,
dI/dt=100A/µs  
,
Q

rr  

T

J

=25
℃  
Note :  
1.The data tested by surface mounted on a 1 inch2 FR-4 board with 2OZ coppe
r
.  
2.The data tested by pulsed , pulse width
≦
300us , duty cycle
≦
2%  
3.The EAS data shows Max. rating . The test condition is VDD=25V,VGS=10V,L=0.1mH,IAS=28A  
4.The power dissipation is limited by 150
℃
junction temperature 5.The data is theoretically the same as ID  
and IDM , in real applications , should be limited by total power dissipation  
Shenzhen HuaXuanYang Electronics CO.,LTD  

HUAXUANYANG  
HXY  
HD6956  
ELECTRONICS CO.,LTD  
N-Channel Enhancement Mode MOSFET  
Typical Characteristics  
20  
19  
18  
17  
16  
15  
I

D

=12A  
4
6
8
10  
V

GS

(V)  
Fig.2 On-Resistance v.s Gate-Source  
Fig.1 Typical Output Characteristics  
12  
10  
8
6
T

J

=150
℃
 
T

J

=25
℃  
4
2
0
0.2  
0.4  
0.6  
0.8  
1
V

SD

, Source-to-Drain Voltage (V)  
Fig.3 Forward Characteristics of Reverse  
Fig.4 Gate-Charge Characteristics  
2.0  
1.5  
1.0  
0.5  
1.5  
1
0.5  
0
-50  
0
50  
100  
150  
-50  
0
50  
100  
150  
T

J

,Junction Temperature (
℃
)  
T

J

, Junction Temperature (
℃
)  
Fig.5 Normalized V

GS(th)

v.s T

J  

Fig.6 Normalized R

DSON

v.s T

J  

Shenzhen HuaXuanYang Electronics CO.,LTD  

HUAXUANYANG  
HXY  
HD6956  
ELECTRONICS CO.,LTD  
N-Channel Enhancement Mode MOSFET  
10000  
1000  
100  
F=1.0MHz  
Ciss  
Coss  
Crss  
10  
1
5
9
13  
17  
21  
25  
V

DS

Drain to Source Voltage(V)  
Fig.7 Capacitance  
Fig.8 Safe Operating Area  
1
DUTY=0.5  
0.3  
0.1  
0.1  
0.05  
0.02  
P

DM  

T

ON  

T
0.01  
D = T

ON

/T  
S
I
NGLE PULSE  
T

J

peak = T

C

+ P

DM

x R

θJC  

0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
t , Pulse Width (s)  
Fig.9 Normalized Maximum Transient Thermal Impedance  
1
2
BV

DSS  

BV

DSS

-V

DD  

EAS=  
BV

DSS  

L x I

AS

2

x  
V

DS  

90%  
V

DD  

I

AS  

10%  
V

GS  

T

d(on)  

T

r  

T

on  

T

d(off)  

T

f  

T

off  

V

GS  

Fig.11 Unclamped Inductive Switching Waveform  
Fig.10 Switching Time Waveform  
Shenzhen HuaXuanYang Electronics CO.,LTD  

HUAXUANYANG  
HXY  
HD6956  
ELECTRONICS CO.,LTD  
N-Channel Enhancement Mode MOSFET  
TO252-2L Package
 
Information  
Dimensions In Millimeters  
Dimensions In Inches  
Symbol  
Min.  
2.200  
0.000  
0.660  
0.460  
6.500  
5.100  
Max.  
2.400  
0.127  
0.860  
0.580  
6.700  
5.460  
Min.  
0.087  
0.000  
0.026  
0.018  
0.256  
0.201  
Max.  
0.094  
0.005  
0.034  
0.023  
0.264  
0.215  
A
A1  
b
c
D
D1  
D2  
E
0.483 TYP.  
0.190 TYP.  
6.000  
2.186  
9.800  
6.200  
2.386  
10.400  
0.236  
0.086  
0.386  
0.244  
0.094  
0.409  
e
L
L1  
L2  
L3  
L4  
Φ
θ
2.900 TYP.  
1.600 TYP.  
0.114 TYP.  
0.063 TYP.  
1.400  
1.700  
0.055  
0.067  
0.600  
1.100  
0°  
1.000  
1.300  
8°  
0.024  
0.043  
0°  
0.039  
0.051  
8°  
h
0.000  
0.300  
0.000  
0.012  
V
5.350 TYP.  
0.211 TYP.  
Shenzhen HuaXuanYang Electronics CO.,LTD  

HUAXUANYANG  
HXY  
HD6956  
ELECTRONICS CO.,LTD  
N-Channel Enhancement Mode MOSFET  
Attention  
■ Any and all HUA XUAN YANG ELECTRONICS products described or contained herein do not have specifications that can handle  
applications that require extremely high levels of reliability, such as life-support systems, aircraft’s control systems, or other applications  
whose failure can be reasonably expected to result in serious physical and/or material damage. Consult with your HUA XUAN YANG  
ELECTRONICS representative nearest you before using any HUA XUAN YANG ELECTRONICS products described or contained herein  
in such applications.  
■ HUA XUAN YANG ELECTRONICS assumes no responsibility for equipment failures that result from using products at values that  
exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or other parameters) listed in products  
specifications of any and all HUA XUAN YANG ELECTRONICS products described or contained herein.  
■ Specifications of any and all HUA XUAN YANG ELECTRONICS products described or contained herein stipulate the performance,  
characteristics, and functions of the described products in the independent state, and are not guarantees of the performance,  
characteristics, and functions of the described products as mounted in the customer’s products or equipment. To verify symptoms and  
states that cannot be evaluated in an independent device, the customer should always evaluate and test devices mounted in the  
customer’s products or equipment.  
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products fail with some probability. It is possible that these probabilistic failures could  
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Shenzhen HuaXuanYang Electronics CO.,LTD