Infineon-Technologies-BSC0910NDI

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Infineon-Technologies-BSC0910NDI
BSC0910NDI  
Q2  
Dual N-Channel OptiMOS™ MOSFET  
Product Summary  
Features  
Q1  
25  
• Dual N-channel OptiMOS™ MOSFET  
V

DS  

25  
1.2  
1.6  
40  
V
• Optimized for high performance Buck converter  
R

DS(on),max  

V

GS

=10 V  
V

GS

=4.5 V  
4.6  
5.9  
40  
m
W  
•
Logic level (4.5V rated)  
• 100% avalanche tested  
I

D  

A
• Qualified according to JEDEC

1)

for target applications  
• Pb-free lead
 
plating; RoHS compliant  
• Halogen-free according to IEC61249-2-21  
• Integrated monolithic Schottky-like diode  
VPhase  
Type  
Package  
Marking  
BSC0910NDI  
PG-TISON-8  
0910NDI  
Maximum ratings,
at
T

j

=25 °C, unless otherwise specified

2)  

Value  
Parameter  
Symbol Conditions  
Unit  
Q1  
Q2  
I

D  

T

C

=70 °C,
V

GS

=10 V  
Continuous drain current  
40  
40  
A
T

A

=25 °C,
V

GS

=4.5 V

3)  

16  
31  
25  
T

A

=70 °C,  
V

GS

=4.5 V

3)  

13  
T

A

=25 °C,
V

GS

=10 V

4)  

T

C

=70 °C  
11  
22  
Pulsed drain current

5)  

I

D,pulse  

E

AS  

160  
160  
Q1:
I

D

=20 A,  
Q2:
I

D

=20 A,  
R

GS

=25
W  
Avalanche energy, single pulse  
12  
80  
mJ  
V

GS  

P

tot  

±
20  
Gate source voltage  
Power dissipation  
V
T

A

=25 °C

2)  

2.5  
1.0  
2.5  
1.0  
W
T

A

=25 °C, minimum  
footprint

4)  

T

j

,
T

stg  

-55 … 150  
55/150/56  
Operating and storage temperature  
IEC climatic category; DIN IEC 68-1  
°C  
Rev.2.0  
page 1  
2013-11-27  

BSC0910NDI  
Values  
typ.  
Parameter  
Symbol Conditions  
Unit  
min.  
max.  
Thermal characteristics  
R

thJC  

Q1  
Q2  
Q1  
Q2  
Q1  
Q2  
–
–
–
–
4.5  
1.5  
K/W  
Thermal resistance, junction –  
case  
R

thJA  

Thermal resistance, junction –  
ambient

1)  

6 cm

2

cooling area

3)  

–
–
–
–
50  
minimal footprint,  
steady state

4)  

125  
Electrical characteristics,
at
T

j

=25 °C, unless otherwise specified  
Static characteristics  
Drain-source breakdown voltage
 
Q1  
V

(BR)DSS

V

GS

=0 V,
I

D

=10 mA  
25  
–
–
15  
–
–
–
V
Q2  
Q1  
Q2  
Q1  
d
V

(BR)DSS  

/d
T

j  

I

D

=10 mA, referenced  
to 25 °C  
Breakdown voltage temperature  
coefficient  
mV/K  
Gate threshold voltage  
V

GS(th)

V

DS

=
V

GS

,
I

D

=250 µA  
1
2
V
Q2  
Q1  
Q2  
Q1  
Q2  
Q1  
Q2  
Q1  
Q2  
Q1  
Q2  
Q1  
Q2  
Q1  
Q2  
I

DSS  

Zero gate voltage drain current  
–
–
–
–
–
–
1
500  
0.1  
–
µA  
V

DS

=20 V,
V

GS

=0 V,  
T

j

=25 °C  
–
mA  
V

DS

=20 V,
V

GS

=0 V,  
T

j

=150 °C  
3
I

GSS  

Gate-source leakage current  
V

GS

=20 V,
V

DS

=0 V  
–
–
100 nA  
R

DS(on)  

–
–
4.7  
1.25  
3.5  
0.9  
0.8  
0.7  
84  
5.9  
1.6  
4.6  
1.2  
1.6  
1.4  
–
m
W  
Drain-source on-state  
resistance  
V

GS

=4.5 V,
I

D

=25 A  
–
V

GS

=10 V,
I

D

=25 A  
–
R

G  

Gate resistance  
0.4  
0.4  
42  
85  
W
g

fs  

Transconductance  
S
|
V

DS

|>2|
I

D

|
R

DS(on)max  

,
I

D

=30 A  
170  
–
Rev.2.0  
page 2  
2013-11-27  

BSC0910NDI  
Values  
typ.  
Parameter  
Symbol Conditions  
Unit  
min.  
max.  
Dynamic characteristics  
C

iss  

Input capacitance  
Q1  
Q2  
Q1  
Q2  
Q1  
Q2  
Q1  
Q2  
Q1  
Q2  
Q1  
Q2  
Q1  
Q2  
–
–
–
–
–
–
–
–
–
–
–
–
–
–
760  
3400  
370  
1700  
35  
1000 pF  
4500  
500  
2300  
–
C

oss  

Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
V

GS

=0 V,  
V

DS

= 12 V,
f
=1 MHz  
C

rss  

t

d(on)  

t

r  

150  
2.4  
–
–
–
–
–
–
–
–
–
ns  
5.6  
3.6  
V

DD

=12 V,  
V

GS

=10 V,
R

G

=1.6
W
,  
I

D

=30 A  
5.6  
t

d(off)  

Turn-off delay time  
Fall time  
13  
28  
t

f  

2.4  
4.1  
Gate Charge Characteristics  
Gate to source charge  
Gate to drain charge  
Switching charge  
Q

gs  

Q1  
Q2  
–
–
–
–
–
–
1.9  
1.2  
5.0  
2.5  
8.1  
5.6  
23  
2.5  
1.8  
6.6  
–
nC  
V
Q

gd  

Q

g  

V

DD

=12 V,  
I

D

=30 A,  
V

GS

=0 to 4.5 V  
V

plateau  

Q

gs  

Gate plateau voltage  
Gate to source charge  
Gate to drain charge  
Switching charge  
10.8 nC  
8.4  
Q

gd  

Q

g  

30.6  
V

plateau  

Q

oss  

Gate plateau voltage  
Output charge  
–
–
–
2.4  
8
–
V
Q1  
Q2  
10.6 nC  
48  
V

DD

=12 V,
V

GS

=0 V  
36  
Rev.2.0  
page 3  
2013-11-27  

BSC0910NDI  
Values  
typ.  
Parameter  
Symbol Conditions  
Unit  
min.  
max.  
Reverse Diode  
Diode continuous forward current  
I

S  

Q1  
Q2  
Q1  
Q2  
–
–
–
–
–
–
–
–
28  
40  
A
V
T

C

=25 °C  
I

S,pulse  

Diode pulse current  
160  
160  
V

GS

=0 V,
I

F

=20 A,  
T

j

=25 °C  
V

SD  

Diode forward voltage  
Q1  
Q2  
–
–
0.87  
0.56  
1
V

GS

=0 V,
I

F

=10 A,  
T

j

=25 °C  
0.7  
Q

rr  

Reverse recovery charge  
Q1  
Q2  
–
–
5
5
–
–
nC  
nC  
V

R

=12 V,
I

F

=10 A,  
d
i

F

/d
t
=400 A/µs  

1)

J-STD20 and JESD22  

2)

One transistor active  

3)

Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain connection. PCB is  

4)

Device mounted on a minimum pad (one layer, 70 µm thick). One transistor active.  

5)

See figure 3 for more detailed information.  
Rev.2.0  
page 4  
2013-11-27  

BSC0910NDI  
1 Power dissipation (Q1)  
2 Power dissipation (Q2)  
P

tot

=f(
T

A

)

3)  

P

tot

=f(
T

A

)

3)  

1.2  
1
1.2  
1
0.8  
0.6  
0.4  
0.2  
0
0.8  
0.6  
0.4  
0.2  
0
0
40  
80  
120  
160  
0
40  
80  
120  
160  
T

A

[
°
C]  
T

A

[
°
C]  
3 Drain current (Q1)  
I

D

=f(
T

C

)  
4 Drain current (Q2)  
I

D

=f(
T

C

)  
parameter:
V

GS

≥10 V  
parameter:
V

GS

≥10 V  
50  
40  
30  
20  
10  
0
50  
40  
30  
20  
10  
0
0
40  
80  
120  
160  
0
40  
80  
120  
160  
T

C

[
°
C]  
T

C

[
°
C]  
Rev.2.0  
page 5  
2013-11-27  

BSC0910NDI  
5 Safe operating area (Q1)  
I

D

=f(
V

DS

);
T

C

=25 °C;
D
=0  
parameter:
t

p  

6 Safe operating area (Q2)  
I

D

=f(
V

DS

);
T

C

=25 °C;
D
=0  
parameter:
t

p  

10

3  

10

3  

1 µs  
1 µs  
10 µs  
10

2  

10

2  

10 µs  
100 µs  
100 µs  
1 ms  
1 ms  
10 ms  
10

1  

10

1  

10 ms  
DC  
DC  
10

0  

10

0  

10

-1  

10

-1  

10

-1  

10

0  

10

1  

10

2  

10

-1  

10

0  

10

1  

10

2  

V

DS

[V]  
V

DS

[V]  
7 Max. transient thermal impedance (Q1)  
Z

thJC

=f(
t

p

)  
8 Max. transient thermal impedance (Q2)  
Z

thJC

=f(
t

p

)  
parameter:
D
=
t

p

/
T  
parameter:
D
=
t

p

/
T  
10

1  

10

1  

0.5  
10

0  

0.5  
0.2  
0.2  
10

0  

0.1  
0.1  
0.05  
0.05  
10

-1  

0.02  
0.01  
0.02  
0.01  
single pulse  
single pulse  
10

-1  

10

-2  

10

-5  

10

-4  

10

-3  

10

-2  

10

-1  

10

0  

10

-5  

10

-4  

10

-3  

10

-2  

10

-1  

10

0  

t

p

[s]  
t

p

[s]  
Rev.2.0  
page 6  
2013-11-27  

BSC0910NDI  
9 Typ. output characteristics (Q1)  
I

D

=f(
V

DS

);
T

j

=25 °C  
10 Typ. output characteristics (Q2)  
I

D

=f(
V

DS

);
T

j

=25 °C  
parameter:
V

GS  

parameter:
V

GS  

160  
400  
4 V  
4.5 V  
3.5 V  
10 V  
10 V  
3.5 V  
4.5 V  
4 V  
3.3 V  
120  
300  
200  
100  
0
3.2 V  
3 V  
80  
40  
0
3 V  
2.8 V  
2.8 V  
0
1
2
3
0
1
2
3
V

DS

[V]  
V

DS

[V]  
11 Typ. drain-source on resistance (Q1)  
R

DS(on)

=f(
I

D

);
T

j

=25 °C  
12 Typ. drain-source on resistance (Q2)  
R

DS(on)

=f(
I

D

);
T

j

=25 °C  
parameter:
V

GS  

parameter:
V

GS  

8
3
7
3.3 V  
2.5  
3.5 V  
6
3 V  
4 V  
2
5
4.5 V  
3.3 V  
5 V  
3.5 V  
4
1.5  
4 V  
4.5 V  
10 V  
5 V  
3
2
1
0
1
0.5  
0
10 V  
0
20  
40  
60  
0
20  
40  
60  
80  
I

D

[A]  
I

D

[A]  
Rev.2.0  
page 7  
2013-11-27  

BSC0910NDI  
13 Typ. transfer characteristics (Q1)  
I

D

=f(
V

GS

);
|
V

DS

|>2 |
I

D

|
R

DS(on)max  

parameter:
T

j  

14 Typ. transfer characteristics (Q2)  
I

D

=f(
V

GS

);
|
V

DS

|>2 |
I

D

| R

DS(on)max  

parameter:
T

j  

160  
120  
80  
160  
120  
80  
25 °C  
150 °C  
40  
40  
150 °C  
25 °C  
0
0
0
1
2
3
4
0
1
2
3
4
V

GS

[V]  
V

GS

[V]  
15 Drain-source on-state resistance (Q1)  
16 Drain-source on-state resistance (Q2)  
R

DS(on)

=f(
T

j

);
I

D

=25 A;
V

GS

=10 V  
R

DS(on)

=f(
T

j

);
I

D

=25 A;
V

GS

=10 V  
8
7
6
5
2.5  
2
1.5  
4
typ  
1
typ  
3
2
1
0
0.5  
0
-60  
-20  
20  
60  
100  
140  
180  
-60  
-20  
20  
60  
100  
140  
180  
T

j

[
°
C]  
T

j

[
°
C]  
Rev.2.0  
page 8  
2013-11-27  

BSC0910NDI  
17 Typ. gate threshold voltage (Q1)  
18 Typ. gate threshold voltage (Q2)  
V

GS(th)

=f(
T

j

);
V

GS

=
V

DS

;
I

D

=250 µA  
V

GS(th)

=f(
T

j

);
V

GS

=
V

DS

;
I

D

=10 mA  
2.8  
2.4  
2
2.8  
2.4  
2
1.6  
1.2  
0.8  
0.4  
0
1.6  
1.2  
0.8  
0.4  
0
-60  
-20  
20  
60  
100  
140  
180  
-60  
-20  
20  
60  
100  
140  
180  
T

j

[
°
C]  
T

j

[
°
C]  
19 Typ. capacitances (Q1)  
20 Typ. capacitances (Q2)  
C
=f(
V

DS

);
V

GS

=0 V;
f
=1 MHz  
C
=f(
V

DS

);
V

GS

=0 V;
f
=1 MHz  
10

4  

10

3  

10

2  

10

1  

10

4  

Ciss  
Coss  
10

3  

Ciss  
Coss  
Crss  
10

2  

Crss  
10

1  

0
5
10  
15  
20  
25  
0
5
10  
15  
20  
25  
V

DS

[V]  
V

DS

[V]  
Rev.2.0  
page 9  
2013-11-27  

BSC0910NDI  
21 Forward characteristics of reverse diode (Q1)
 
22 Forward characteristics of reverse diode (Q2)  
I

F

=f(
V

SD  

)
I

F

=f(
V

SD

)  
parameter:
T

j  

parameter:
T

j  

10

3  

10

3  

100 °C  
150 °C  
10

2  

10

1  

10

0  

10

2  

10

1  

10

0  

25 °C  
-55 °C  
150 °C  
25 °C  
10

-1  

0
10

-1  

0
0.2  
0.4  
0.6  
0.8  
1
1.2  
0.2  
0.4  
0.6  
0.8  
1
V

SD

[V]  
V

SD

[V]  
23 Avalanche characteristics (Q1)  
24 Avalanche characteristics (Q2)  
I

AS

=f(
t

AV

);
R

GS

=25
W  
parameter:
T

j(start)  

I

AS

=f(
t

AV

);
R

GS

=25
W  
parameter:
T

j(start)  

10

2  

10

2  

25 °C  
25 °C  
100 °C  
125 °C  
10

1  

10

1  

100 °C  
125 °C  
10

0  

10

0  

10

0  

10

1  

10

2  

10

3  

10

0  

10

1  

10

2  

10

3  

t

AV

[µs]  
t

AV

[µs]  
Rev.2.0  
page 10  
2013-11-27  

BSC0910NDI  
25 Typ. gate charge (Q1)  
V

GS

=f(
Q

gate

);
I

D

=20 A pulsed  
parameter:
V

DD  

26 Typ. gate charge (Q2)  
V

GS

=f(
Q

gate

);
I

D

=20 A pulsed  
parameter:
V

DD  

10  
10  
8
8
12 V  
20 V  
12 V  
20 V  
5 V  
5 V  
6
6
4
4
2
2
0
0
0
2
4
6
8
10  
12  
0
10  
20  
30  
40  
50  
Q

gate

[nC]  
Q

gate

[nC]  
27 Drain-source breakdown voltage (Q1)  
28 Typ. drain-source leakage current (Q2)  
I

DSS

=f(
V

DS

);
V

GS

=0 V  
V

BR(DSS)

=f(
T

j

);
I

D

=1 mA  
parameter:
T

j  

10

-2  

30  
29  
28  
27  
26  
25  
24  
23  
22  
21  
20  
10

-3  

125 °C  
100 °C  
10

-4  

75 °C  
10

-5  

25 °C  
10

-6  

-60  
-20  
20  
60  
100  
140  
180  
0
5
10  
15  
20  
T

j

[
°
C]  
V

DSj

[V]  
Rev.2.0  
page 11  
2013-11-27  

BSC0910NDI  
PG-TISON  
Rev.2.0  
page 12  
2013-11-27  

BSC0910NDI  
PG-TISON-8  
Rev.2.0  
page 13  
2013-11-27  

BSC0910NDI  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© 2013 Infineon Technologies AG  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of  
conditions or characteristics. With respect to any examples or hints given herein, any typical  
values stated herein and/or any information regarding the application of the device,  
Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind,  
including without limitation, warranties of non-infringement of intellectual property rights  
of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please  
contact the nearest Infineon Technologies Office (www.infineon.com).  
Warnings  
Due to technical requirements, components may contain dangerous substances. For information  
on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with  
the express written approval of Infineon Technologies, if a failure of such components can  
reasonably be expected to cause the failure of that life-support device or system or to affect  
the safety or effectiveness of that device or system. Life support devices or systems are  
intended to be implanted in the human body or to support and/or maintain and sustain  
and/or protect human life. If they fail, it is reasonable to assume that the health of the user  
or other persons may be endangered.  
Rev.2.0  
page 14  
2013-11-27