Infineon-Technologies-BSL308PEH6327XTSA1

Part #Infineon-Technologies-BSL308PEH6327XTSA1
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Infineon-Technologies-BSL308PEH6327XTSA1
BSL308PE  
OptiMOS™ P3 Small-Signal-Transistor  
Features  
Product Summary  
V

DS  

-30  
80  
V
• Dual P-channel  
R

DS(on),max  

V

GS

=-10 V  
V

GS

=-4.5 V  
m
W  
• Enhancement mode  
130  
-2.0  
• Logic level (4.5V rated)  
I

D  

A
• ESD protected  
PG-TSOP-6  
• Qualified according to AEC Q101  
• 100% Lead-free; RoHS compliant  
• Halogen free according to IEC61249-2-21  
6
5
4
1
2
3
Type  
Package  
Tape and Reel Information  
Marking  
Lead Free  
Packing  
BSL308PE PG-TSOP-6
 
H6327: 3000 pcs/ reel  
sPR  
Yes  
Non dry  
Maximum ratings,
at
T

j

=25 °C, unless otherwise specified  
Parameter

1)  

Value  
Symbol Conditions  
Unit  
I

D  

T

A

=25 °C  
T

A

=70 °C  
T

A

=25 °C  
Continuous drain current  
-2.0  
-1.6  
-8.0  
A
I

D,pulse  

Pulsed drain current  
E

AS  

I

D

=-2 A,
R

GS

=25
W  
Avalanche energy, single pulse  
-10.7  
6
mJ  
I

D

=-2 A,  
V

DS

=-16V,  
d
i
/d
t
=-200A/µs,  
T

j,max

=150 °C  
Reverse diode d
v
/d
t  
d
v
/d
t  
kV/µs  
V

GS  

Gate source voltage  
±20  
0.5  
V
Power dissipation

2)  

P

tot  

T

A

=25 °C  
W
°C  
T

j

,
T

stg  

Operating and storage temperature  
ESD Class  
-55 … 150  
2 (2kV to 4kV)  
260 °C  
JESD22-A114 -HBM  
Soldering Temperature  
°C  
°C  
IEC climatic category; DIN IEC 68-1  

1)

Only one of both transistors in operation  
55/150/56  
Rev 2.03  
page 1  
2013-11-07  

BSL308PE  
Unit  
Values  
typ.  
Parameter  
Symbol Conditions  
min.  
max.  
Thermal characteristics  
Thermal resistance,  
junction – ambient  
minimal footprint

2)  

R

thJA  

–
–
250 K/W  
Electrical characteristics,
at
T

j

=25 °C, unless otherwise specified  
Static characteristics  
V

(BR)DSS

V

GS

= 0V,
I

D

=-250µA  
V

GS(th)

V

DS

=V

GS

,
I

D

=-11µA  
Drain-source breakdown voltage  
Gate threshold voltage  
-30  
-2.0  
–
–
-1.5  
–
–
V
-1.0  
-1  
V

DS

=-30V,
V

GS

=0 V,  
I

DSS  

Drain-source leakage current  
m
A  
T

j

=25 °C  
V

DS

=-30V,
V

GS

=0V,  
T

j

=150 °C  
–
–
-100  
I

GSS  

V

GS

=-20V,
V

DS

=0V  
Gate-source leakage current  
–
–
–
-5  
m
A  
V

GS

=-4.5 V,  
I

D

=-1.7 A  
R

DS(on)  

Drain-source on-state resistance  
88  
130  
m
W  
V

GS

=-10 V,
I

D

=-2 A  
–
62  
80  
–
|
V

DS

|>2|
I

D

|
R

DS(on)max  

I

D

=-1.6 A  
,
g

fs  

Transconductance  
4.6  
S

2)

Performed on 40mm

2

FR4 PCB. The traces are 1mm wide, 70
μ
m thick and 20mm long; they are present on both  
sides of the PCB.  
Rev 2.03  
page 2  
2013-11-07  

BSL308PE  
Unit  
Values  
typ.  
Parameter  
Symbol Conditions  
min.  
max.  
Dynamic characteristics  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C

iss  

–
–
–
–
–
–
–
376  
196  
12  
500 pF  
261  
V

GS

=0 V,  
V

DS

=-15 V,
f
=1 MHz  
C

oss  

C

rss  

t

d(on)  

t

r  

18  
5.6  
7.7  
15.3  
2.8  
–
–
–
–
ns  
V

DD

=-15V,  
V

GS

=-10 V,  
t

d(off)  

t

f  

Turn-off delay time  
Fall time  
I

D

=-2 A,
R

G,ext

=6
W  
Gate Charge Characteristics  
Gate to source charge  
Gate to drain charge  
Gate charge total  
Q

gs  

–
–
–
–
-1.2  
-0.6  
-5.0  
-3.1  
–
–
–
–
nC  
Q

gd  

V

DD

=-15 V,
I

D

=-2 A,  
V

GS

=0 to -10 V  
Q

g  

V

plateau  

Gate plateau voltage  
V
A
Reverse Diode  
I

S  

Diode continous forward current  
Diode pulse current  
–
–
–
–
-0.4  
-8.4  
T

A

=25 °C  
I

S,pulse  

V

GS

=0 V,
I

F

=-2 A,  
T

j

=25 °C  
V

SD  

Diode forward voltage  
–
-0.8  
-1.1  
V
t

rr  

Reverse recovery time  
–
–
14  
–
–
ns  
V

R

=-10 V,
I

F

=-2 A,  
d
i

F

/d
t
=100 A/µs  
Q

rr  

Reverse recovery charge  
-5.9  
nC  
Rev 2.03  
page 3  
2013-11-07  

BSL308PE  
1 Power dissipation  
2 Drain current  
P

tot

=f(
T

A

)  
I

D

=f(
T

A

);
V

GS

≥-10 V  
2.2  
2
0.5  
0.375  
0.25  
0.125  
0
1.8  
1.6  
1.4  
1.2  
1
0.8  
0.6  
0.4  
0.2  
0
0
40  
80  
120  
160  
0
20  
40  
60  
80 100
 
120 140 160  
T

A

[°C]  
T

A

[°C]  
3 Safe operating area  
I

D

=f(
V

DS

);
T

A

=25 °C;
D
=0  
parameter:
t

p  

4 Max. transient thermal impedance  
Z

thJA

=f(
t

p

)  
parameter:
D
=
t

p

/
T  
10

1  

10

3  

1 µs  
10 µs  
100 µs  
10

0  

1 ms  
0.5  
10

2  

0.2  
10 ms  
0.1  
10

-1  

10

-2  

10

-3  

10

-4  

0.05  
10

1  

0.02  
0.01  
single pulse  
10

0  

DC  
10

-1  

10

-1  

10

0  

10

1  

10

2  

10

-5  

10

-4  

10

-3  

10

-2  

10

-1  

10

0  

10

1  

10

2  

V

DS

[V]  
t

p

[s]  
Rev 2.03  
page 4  
2013-11-07  

BSL308PE  
5 Typ. output characteristics  
I

D

=f(
V

DS

);
T

j

=25 °C  
6 Typ. drain-source on resistance  
R

DS(on)

=f(
I

D

);
T

j

=25 °C  
parameter:
V

GS  

parameter:
V

GS  

400  
6
4.5 V  
2.8 V  
10 V  
4 V  
350  
3 V  
5
4
3
2
1
0
3.5 V  
300  
3.3 V  
250  
3.3 V  
200  
150  
100  
50  
3.5 V  
4 V  
3 V  
4.5 V  
10 V  
2.8 V  
0
0
0.5  
1
1.5  
2
2.5  
3
3.5  
4
0.0  
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
V

DS

[V]  
I

D

[A]  
7 Typ. transfer characteristics  
8 Typ. forward transconductance  
I

D

=f(
V

GS

); |
V

DS

|>2|
I

D

|
R

DS(on)max  

g

fs

=f(
I

D

);
T

j

=25 °C  
4
3
2
1
0
10  
8
6
4
25 °C  
150 °C  
2
0
0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0  
0
1
2
3
4
5
6
I

D

[A]  
V

GS

[V]  
Rev 2.03  
page 5  
2013-11-07  

BSL308PE  
9 Drain-source on-state resistance  
10 Typ. gate threshold voltage  
V

GS(th)

=f(
T

j

);
V

DS

=V

GS

;
I

D

=11 µA  
parameter:
I

D  

R

DS(on)

=f(
T

j

);
I

D

=-2 A;
V

GS

=-10 V  
140  
120  
100  
2.4  
2
98 %  
1.6  
98 %  
typ  
80  
1.2  
typ  
2 %  
60  
0.8  
0.4  
0
40  
20  
0
-60  
-20  
20  
60  
100  
140  
180  
-60  
-20  
20  
60  
100  
140  
180  
T

j

[°C]  
T

j

[°C]  
11 Typ. capacitances  
12 Forward characteristics of reverse diode  
I

F

=f(
V

SD  

C
=f(
V

DS

);
V

GS

=0 V;
f
=1 MHz; T

j

=25°C  
)
parameter:
T

j  

10

3  

10

1  

Ciss  
150 °C  
Coss  
25 °C  
10

0  

10

-1  

10

-2  

10

2  

25 °C, 98%  
Crss  
150 °C, 98%  
10

1  

10

0  

10

-3  

0
5
10  
15  
20  
0
0.4  
0.8  
1.2  
1.6  
V

DS

[V]  
V

SD

[V]  
Rev 2.03  
page 6  
2013-11-07  

BSL308PE  
13 Avalanche characteristics  
14 Typ. gate charge  
V

GS

=f(
Q

gate

);
I

D

=-2 A pulsed  
parameter:
V

DD  

I

AS

=f(
t

AV

);
R

GS

=25
W  
parameter:
T

j(start)  

10

1  

10  
8
15 V  
24 V  
6
25 °C  
100 °C  
6 V  
10

0  

125 °C  
4
2
0
10

-1  

10

0  

10

1  

10

2  

10

3  

0
1
2
3
4
5
6
Q

gate

[nC]  
t

AV

[µs]  
15 Drain-source breakdown voltage  
16 Gate charge waveforms  
V

BR(DSS)

=f(
T

j

);
I

D

=250 µA  
33  
32  
31  
30  
29  
28  
27  
V

GS  

Q

g  

V

gs(th)  

Q

g(th)  

Q

sw  

Q

gd  

Q

gate  

Q

gs  

-60  
-20  
20  
60  
100  
140  
T

j

[°C]  
Rev 2.03  
page 7  
2013-11-07  

BSL308PE  
TSOP-6  
Package Outline:  
Footprint:  
Packaging:  
Rev 2.03  
page 8  
2013-11-07  

BSL308PE  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© 2009 Infineon Technologies AG  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of  
conditions or characteristics. With respect to any examples or hints given herein, any typical  
values stated herein and/or any information regarding the application of the device,  
Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind,  
including without limitation, warranties of non-infringement of intellectual property rights  
of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please  
Warnings  
Due to technical requirements, components may contain dangerous substances. For information  
on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with  
the express written approval of Infineon Technologies, if a failure of such components can  
reasonably be expected to cause the failure of that life-support device or system or to affect  
the safety or effectiveness of that device or system. Life support devices or systems are  
intended to be implanted in the human body or to support and/or maintain and sustain  
and/or protect human life. If they fail, it is reasonable to assume that the health of the user  
or other persons may be endangered.  
Rev 2.03  
page 9  
2013-11-07  

Mouser Electronics  
Authorized Distributor  
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