Infineon-Technologies-BSP296NH6327

Part #Infineon-Technologies-BSP296NH6327
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Infineon-Technologies-BSP296NH6327
BSP296N  
OptiMOS

™

Small-Signal-Transistor  
Features  
Product Summary  
V

DS  

100  
0.6  
0.8  
1.2  
V
• N-channel  
R

DS(on),max  

V

GS

=10 V  
W
• Enhancement mode  
• Logic level (4.5V rated)  
V

GS

=4.5 V  
I

D  

A
• Avalanche rated  
• Qualified according to AEC Q101  
• 100% lead-free; RoHS compliant  
• Halogen-free according to IEC61249-2-21  
PG-SOT223  
Type  
Package  
Tape and Reel Information  
Marking  
Halogen-Free  
Packing  
BSP296N  
SOT223  
H6327: 1000 pcs/ reel  
BSP296N  
Yes  
Non dry  
Maximum ratings,
at
T

j

=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol Conditions  
Unit  
I

D  

T

A

=25 °C  
T

A

=70 °C  
T

A

=25 °C  
Continuous drain current  
1.2  
0.9  
4.6  
A
I

D,pulse  

Pulsed drain current  
E

AS  

I

D

=1.2 A,
R

GS

=25
W  
Avalanche energy, single pulse  
15.0  
6
mJ  
I

D

=1.2 A,
V

DS

=80 V,  
d
i
/d
t
=200 A/µs,  
T

j,max

=150 °C  
Reverse diode d
v
/d
t  
d
v
/d
t  
kV/µs  
V

GS  

Gate source voltage  
±20  
V
P

tot  

T

A

=25 °C  
1.8  
Power dissipation  
W
°C  
T

j

,
T

stg  

Operating and storage temperature  
ESD Class  
-55 … 150  
0 (<250V)  
260 °C  
JESD22-A114 -HBM  
Soldering Temperature  
IEC climatic category; DIN IEC 68-1  
55/150/56  
Rev 2.0  
page 1  
2013-04-04  

BSP296N  
Unit  
Values  
typ.  
Parameter  
Symbol Conditions  
min.  
max.  
Thermal characteristics  
Thermal resistance,  
junction – soldering point  
R

thJS  

–
–
25  
K/W  
Thermal resistance  
junction – ambient  
R

thJA  

minimal footprint  
–
–
–
–
110  
70  
6 cm

2

cooling area

1)  

Electrical characteristics,
at
T

j

=25 °C, unless otherwise specified  
Static characteristics  
V

(BR)DSS

V

GS

=0 V,
I

D

=250 µA  
V

GS(th)

V

DS

=Vgs V,
I

D

=100 µA  
Drain-source breakdown voltage  
Gate threshold voltage  
100  
0.8  
–
–
V
1.4  
1.8  
V

DS

=100 V,
V

GS

=0 V,  
T

j

=25 °C  
I

DSS  

Drain-source leakage current  
–
–
0.1  
m
A  
V

DS

=100 V,
V

GS

=0 V,  
T

j

=150 °C  
–
–
–
–
–
10  
10  
I

GSS  

V

GS

=20 V,
V

DS

=0 V  
Gate-source leakage current  
–
nA  
R

DS(on)

V

GS

=4.5 V,
I

D

=0.95 A  
V

GS

=10 V,
I

D

=1.2 A  
Drain-source on-state resistance  
371  
329  
2.66  
800  
600  
–
m
W  
|
V

DS

|>2|
I

D

|
R

DS(on)max  

,
g

fs  

Transconductance  
S
I

D

=0.9 A  

1)

Device on 40mm x 40mm x 1.5mm epoxy PCB FR4 with 6cm² (one layer, 70μm thick) copper area for drain  
connection. PCB is vertical in still air.  
Rev 2.0  
page 2  
2013-04-04  

BSP296N  
Unit  
Values  
typ.  
Parameter  
Symbol Conditions  
min.  
max.  
Dynamic characteristics  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C

iss  

–
–
–
–
–
–
–
114.8  
19.7  
9.8  
152.7 pF  
26.3  
V

GS

=0 V,
V

DS

=25 V,  
f
=1 MHz  
C

oss  

C

rss  

t

d(on)  

t

r  

14.7  
3.5  
5.3  
5.7  
ns  
3.8  
V

DD

=50 V,
V

GS

=10 V,  
I

D

=1.2 A,
R

G,ext

=6
W  
t

d(off)  

t

f  

Turn-off delay time  
Fall time  
18.4  
5.2  
27.6  
7.8  
Gate Charge Characteristics  
Gate to source charge  
Gate to drain charge  
Gate charge total  
Q

gs  

–
–
–
–
0.27  
1.45  
4.5  
0.4  
2.2  
6.7  
–
nC  
Q

gd  

V

DD

=50 V,
I

D

=1.2 A,  
V

GS

=0 to 10 V  
Q

g  

V

plateau  

Gate plateau voltage  
2.4  
V
A
Reverse Diode  
I

S  

Diode continous forward current  
Diode pulse current  
–
–
–
–
1.2  
4.6  
T

A

=25 °C  
I

S,pulse  

V

GS

=0 V,
I

F

=1.2 A,  
T

j

=25 °C  
V

SD  

Diode forward voltage  
–
0.85  
1.1  
V
t

rr  

Reverse recovery time  
–
–
27  
30  
40.5 ns  
V

R

=50 V,
I

F

=1.2 A,  
d
i

F

/d
t
=100 A/µs  
Q

rr  

Reverse recovery charge  
45  
nC  
Rev 2.0  
page 3  
2013-04-04  

BSP296N  
1 Power dissipation  
2 Drain current  
P

tot

=f(
T

A

)  
I

D

=f(
T

A

);
V

GS

≥10 V  
2
1.8  
1.6  
1.4  
1.2  
1
1.25  
1
0.75  
0.5  
0.25  
0
0.8  
0.6  
0.4  
0.2  
0
0
40  
80  
120  
160  
0
40  
80  
120  
160  
T

A

[
°
C]  
T

A

[
°
C]  
3 Safe operating area  
I

D

=f(
V

DS

);
T

A

=25 °C;
D
=0  
parameter:
t

p  

4 Max. transient thermal impedance  
Z

thJA

=f(
t

p

)  
parameter:
D
=
t

p

/
T  
10

2  

10  
1 µs  
10 µs  
100 µs  
0.5  
0.2  
1
1 ms  
10 ms  
10

1  

0.1  
0.1  
DC  
0.05  
0.02  
0.01  
0.01  
single pulse  
10

0  

0.001  
10

-4  

10

-3  

10

-2  

10

-1  

10

0  

10

1  

10

2  

1
10  
V

DS

[V]  
100  
1000  
t

p

[s]  
Rev 2.0  
page 4  
2013-04-04  

BSP296N  
5 Typ. output characteristics  
I

D

=f(
V

DS

);
T

j

=25 °C  
6 Typ. drain-source on resistance  
R

DS(on)

=f(
I

D

);
T

j

=25 °C  
parameter:
V

GS  

parameter:
V

GS  

4.8  
1000  
3.3 V  
4 V  
3.5 V  
10 V  
2.8 V  
3 V  
4.4  
4
3.6  
3.2  
2.8  
2.4  
2
750  
500  
250  
0
3 V  
3.3 V  
3.5 V  
2.8 V  
4 V  
4.5 V  
1.6  
1.2  
0.8  
0.4  
0
10 V  
0
2
4
6
8
0
0.8  
1.6  
2.4  
I

D

[A]  
3.2  
4
4.8  
V

DS

[V]  
7 Typ. transfer characteristics  
8 Typ. forward transconductance  
I

D

=f(
V

GS

); |
V

DS

|>2|
I

D

|
R

DS(on)max  

g

fs

=f(
I

D

);
T

j

=25 °C  
4.8  
4
6
5
4
3
2
1
0
25 °C  
150 °C  
3.2  
2.4  
1.6  
0.8  
0
0
1
2
3
4
0.0  
0.8  
1.6  
2.4  
3.2  
4.0  
4.8  
V

GS

[V]  
I

D

[A]  
Rev 2.0  
page 5  
2013-04-04  

BSP296N  
9 Drain-source on-state resistance  
10 Typ. gate threshold voltage  
V

GS(th)

=f(
T

j

);
V

DS

=V

GS

;
I

D

=100 µA  
parameter:
I

D  

R

DS(on)

=f(
T

j

);
I

D

=1.2 A;
V

GS

=10 V  
1400  
1200  
1000  
2.4  
2
max  
1.6  
typ  
800  
max  
1.2  
600  
min  
0.8  
400  
typ  
0.4  
0
200  
0
-60 -40 -20  
0
20 40 60 80
 
100 120 140 160  
-60  
-10  
40  
T

j

[
°
C]  
90  
140  
T

j

[
°
C]  
11 Typ. capacitances  
12 Forward characteristics of reverse diode  
I

F

=f(
V

SD  

C
=f(
V

DS

);
V

GS

=0 V;
f
=1 MHz; T

j

=25°C  
)
parameter:
T

j  

10

3  

10

1  

25 °C  
Ciss  
10

2  

10

0  

150 °C  
25 °C, 98%  
Coss  
10

1  

10

-1  

Crss  
150 °C, 98%  
10

0  

10

-2  

0
0
10 20 30 40 50 60 70 80 90
 
100  
V

DS

[V]  
0.2 0.4 0.6 0.8  
1
1.2 1.4 1.6  
V

SD

[V]  
Rev 2.0  
page 6  
2013-04-04  

BSP296N  
13 Avalanche characteristics  
14 Typ. gate charge  
V

GS

=f(
Q

gate

);
I

D

=1.2 A pulsed  
parameter:
V

DD  

I

AS

=f(
t

AV

);
R

GS

=25
W  
parameter:
T

j(start)  

10

1  

10  
9
8
7
6
5
4
3
2
1
0
50 V  
80 V  
20 V  
10

0  

25 °C  
125 °C  
100 °C  
10

-1  

0
1
2
3
4
5
t

AV

[µs]  
Q

gate

[nC]  
10

0  

10

1  

10

2  

10

3  

15 Drain-source breakdown voltage  
16 Gate charge waveforms  
V

BR(DSS)

=f(
T

j

);
I

D

=250 µA  
120  
116  
112  
108  
104  
100  
96  
V

GS  

Q

g  

V

gs(th)  

92  
88  
Q

g(th)  

Q

sw  

Q

gd  

Q

gate  

84  
Q

gs  

80  
-60  
-20  
20  
60  
100  
140  
180  
T

j

[
°
C]  
Rev 2.0  
page 7  
2013-04-04  

BSP296N  
SOT223  
Package Outline:  
F
Di
Rev 2.0  
page 8  
2013-04-04  

BSP296N  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
© 2011 Infineon Technologies AG  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of  
conditions or characteristics. With respect to any examples or hints given herein, any typical  
values stated herein and/or any information regarding the application of the device,  
Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind,  
including without limitation, warranties of non-infringement of intellectual property rights  
of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices, please  
Warnings  
Due to technical requirements, components may contain dangerous substances. For information  
on the types in question, please contact the nearest Infineon Technologies Office.  
Infineon Technologies components may be used in life-support devices or systems only with  
the express written approval of Infineon Technologies, if a failure of such components can  
reasonably be expected to cause the failure of that life-support device or system or to affect  
the safety or effectiveness of that device or system. Life support devices or systems are  
intended to be implanted in the human body or to support and/or maintain and sustain  
and/or protect human life. If they fail, it is reasonable to assume that the health of the user  
or other persons may be endangered.  
Rev 2.0  
page 9  
2013-04-04