Infineon-Technologies-IPP70N12S3-11

Part #Infineon-Technologies-IPP70N12S3-11
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Infineon-Technologies-IPP70N12S3-11
IPB70N12S3-11  
IPI70N12S3-11, IPP70N12S3-11  
OptiMOS

®

-T Power-Transistor  
Product Summary  
V

DS  

120  
11.3  
70  
V
R

DS(on),max

(SMD version)  
m
W  
A
I

D  

Features  
• OptiMOS

TM

– power MOSFET for automotive applications  
• N-channel – Enhancement mode  
• Automotive AEC Q101 qualified  
• MSL1 up to 260°C peak reflow  
• 175°C operating temperature  
• Green product (RoHS compliant)  
• 100% Avalanche tested  
PG-TO263-3-2  
PG-TO262-3-1  
PG-TO220-3-1  
Type  
Package  
Marking  
3N1211  
3N1211  
3N1211  
IPB70N12S3-11  
IPI70N12S3-11  
IPP70N12S3-11  
PG-TO263-3-2  
PG-TO262-3-1  
PG-TO220-3-1  
Maximum ratings,
at
T

j

=25 °C, unless otherwise specified  
Value  
Parameter  
Symbol  
Conditions  
Unit  
I

D  

T

C

=25 °C,
V

GS

=10 V  
Continuous drain current  
70  
48  
A
T

C

=100 °C,  
V

GS

=10 V

2)  

Pulsed drain current

1)  

I

D,pulse  

E

AS  

T

C

=25 °C  
280  
410  
70  
Avalanche energy, single pulse

1)  

Avalanche current, single pulse  
Gate source voltage  
I

D

=35A  
mJ  
A
I

AS  

–
V

GS  

–
±20  
125  
V
P

tot  

T

C

=25 °C  
Power dissipation  
W
T

j

,
T

stg  

Operating and storage temperature  
–
-55 … +175  
°C  
Rev. 1.0  
page 1  
2016-06-20  

IPB70N12S3-11  
IPI70N12S3-11, IPP70N12S3-11  
Values  
typ.  
Parameter  
Symbol  
Conditions  
Unit  
min.  
max.  
Thermal characteristics

1)  

R

thJC  

R

thJA  

R

thJA  

Thermal resistance, junction – case  
–
–
–
–
–
–
1.2  
62  
K/W  
Thermal resistance, junction –  
ambient, leaded  
SMD version, device on PCB  
minimal footprint  
–
–
–
–
62  
40  
6 cm

2

cooling area

2)  

Electrical characteristics,
at
T

j

=25 °C, unless otherwise specified  
Static characteristics  
V

(BR)DSS

V

GS

=0 V,
I

D

= 1 mA  
V

GS(th)

V

DS

=
V

GS

,
I

D

=83µA  
Drain-source breakdown voltage  
Gate threshold voltage  
120  
2.0  
–
–
V
3.0  
4.0  
V

DS

=120V,
V

GS

=0V,  
T

j

=25°C  
I

DSS  

Zero gate voltage drain current  
–
–
0.01  
1
0.1  
10  
µA  
V

DS

=120V,
V

GS

=0V,  
T

j

=125°C

2)  

I

GSS  

V

GS

=20V,
V

DS

=0V  
Gate-source leakage current  
–
–
–
100 nA  
R

DS(on)

V

GS

=10V,
I

D

=70A  
Drain-source on-state resistance  
9.7  
11.6  
11.3  
m
W  
V

GS

=10V,
I

D

=70A,  
SMD version  
–
9.4  
Rev. 1.0  
page 2  
2016-06-20  

IPB70N12S3-11  
IPI70N12S3-11, IPP70N12S3-11  
Values  
typ.  
Parameter  
Symbol  
Conditions  
Unit  
min.  
max.  
Dynamic characteristics

1)  

Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
C

iss  

C

oss  

C

rss  

t

d(on)  

t

r  

–
–
–
–
–
–
–
3350  
940  
105  
17  
4355 pF  
1222  
V

GS

=0V,
V

DS

=25V,  
f
=1MHz  
158  
–
–
–
–
ns  
8
V

DD

=20 V,
V

GS

=10 V,  
I

D

=70 A,
R

G

=3.5
W  
t

d(off)  

t

f  

Turn-off delay time  
Fall time  
25  
8
Gate Charge Characteristics

1)  

Gate to source charge  
Gate to drain charge  
Gate charge total  
Q

gs  

–
–
–
–
18  
16  
51  
5.5  
23  
24  
65  
–
nC  
Q

gd  

V

DD

=96 V,
I

D

=70 A,  
V

GS

=0 to 10 V  
Q

g  

V

plateau  

Gate plateau voltage  
V
A
Reverse Diode  
Diode continous forward current

1)  

Diode pulse current

1)  

I

S  

–
–
–
–
70  
T

C

=25°C  
I

S,pulse  

280  
V

GS

=0 V,
I

F

=70 A,  
T

j

=25 °C  
V

SD  

Diode forward voltage  
0.6  
1
1.2  
V
V

R

=60V,
I

F

=50A,  
d
i

F

/d
t
=100A/µs  
Reverse recovery time

1)  

Reverse recovery charge

1)  

t

rr  

–
–
100  
265  
–
–
ns  
nC  
Q

rr  

1)

Defined by design. Not subject to production test.  

2)

Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm

2

(one layer, 70 µm thick) copper area for drain  
connection. PCB is vertical in still air.  
Rev. 1.0  
page 3  
2016-06-20  

IPB70N12S3-11  
IPI70N12S3-11, IPP70N12S3-11  
1 Power dissipation  
2 Drain current  
P

tot

= f(
T

C

);
V

GS

= 10 V  
I

D

= f(
T

C

);
V

GS

= 10 V; SMD  
150  
125  
100  
75  
80  
60  
40  
20  
0
50  
25  
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
T

C

[
°
C]  
T

C

[
°
C]  
3 Safe operating area  
4 Max. transient thermal impedance  
Z

thJC

= f(
t

p

)  
I

D

= f(
V

DS

);
T

C

= 25 °C;
D
= 0; SMD  
parameter:
t

p  

parameter:
D
=
t

p

/
T  
10

1  

1000  
1 µs  
10

0  

10 µs  
0.5  
100  
100 µs  
0.1  
1 ms  
10

-1  

0.05  
0.01  
10  
10

-2  

single pulse  
10

-3  

1
10

-6  

10

-5  

10

-4  

10

-3  

10

-2  

10

-1  

10

0  

0.1  
1
10  
V

DS

[V]  
100  
1000  
t

p

[s]  
Rev. 1.0  
page 4  
2016-06-20  

IPB70N12S3-11  
IPI70N12S3-11, IPP70N12S3-11  
5 Typ. output characteristics  
I

D

= f(
V

DS

);
T

j

= 25 °C; SMD  
parameter:
V

GS  

6 Typ. drain-source on-state resistance  
R

DS(on)

= f(
I

D

);
T

j

= 25 °C; SMD  
parameter:
V

GS  

400  
360  
320  
280  
240  
200  
160  
120  
80  
20  
10 V  
18  
5.5 V  
6 V  
16  
7 V  
14  
12  
10  
8
6.5 V  
6 V  
6.5 V  
7 V  
5.5 V  
5 V  
10 V  
40  
0
0
1
2
3
4
5
0
20  
40  
60  
80  
100  
120  
V

DS

[V]  
I

D

[A]  
7 Typ. transfer characteristics  
I

D

= f(
V

GS

);
V

DS

= 6V  
parameter:
T

j  

8 Typ. drain-source on-state resistance  
R

DS(on)

= f(
T

j

);
I

D

= 70 A;
V

GS

= 10 V; SMD  
250  
200  
150  
100  
50  
21  
19  
17  
15  
13  
11  
9
-55 °C  
25 °C  
175 °C  
7
0
5
3
4
5
6
7
-60  
-20  
20  
60  
100  
140  
180  
V

GS

[V]  
T

j

[
°
C]  
Rev. 1.0  
page 5  
2016-06-20  

IPB70N12S3-11  
IPI70N12S3-11, IPP70N12S3-11  
9 Typ. gate threshold voltage  
V

GS(th)

= f(
T

j

);
V

GS

=
V

DS  

parameter:
I

D  

10 Typ. capacitances  
C
= f(
V

DS

);
V

GS

= 0 V;
f
= 1 MHz  
10

4  

4
3.5  
3
Ciss  
Coss  
10

3  

10

2  

10

1  

400 µA  
80 µA  
2.5  
Crss  
2
1.5  
1
0
5
10  
15  
20  
25  
30  
-60  
-20  
20  
60  
100  
140  
180  
V

DS

[V]  
T

j

[
°
C]  
11 Typical forward diode characteristics  
12 Typ. avalanche characteristics  
I

A S

= f(
t

AV  

IF = f(V

SD

)  
)
parameter:
T

j  

parameter: T

j(start)  

10

3  

100  
25 °C  
10

2  

100 °C  
150 °C  
10  
175 °C  
25 °C  
10

1  

10

0  

1
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
0.1  
1
10  
t

AV

[µs]  
100  
1000  
V

SD

[V]  
Rev. 1.0  
page 6  
2016-06-20  

IPB70N12S3-11  
IPI70N12S3-11, IPP70N12S3-11  
13 Typical avalanche energy  
E

AS

= f(
T

j

)  
14 Typ. drain-source breakdown voltage  
V

BR(DSS)

= f(
T

j

);
I

D

= 1 mA  
parameter:
I

D  

135  
1000  
130  
125  
120  
115  
110  
800  
17.5 A  
600  
35 A  
400  
70 A  
200  
0
-55  
-15  
25  
65  
105  
145  
25  
75  
125  
175  
T

j

[
°
C]  
T

j

[
°
C]  
15 Typ. gate charge  
16 Gate charge waveforms  
V

GS

= f(
Q

gate

);
I

D

= 70 A pulsed  
parameter:
V

DD  

10  
9
8
7
6
5
4
3
2
1
0
V

GS  

24 V  
Q

g  

96 V  
V

gs(th)  

Q

g(th)  

Q

sw  

Q

gd  

Q

gate  

Q

gs  

0
10  
20  
30  
40  
50  
Q

gate

[nC]  
Rev. 1.0  
page 7  
2016-06-20  

IPB70N12S3-11  
IPI70N12S3-11, IPP70N12S3-11  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
©
Infineon Technologies AG 2016  
All Rights Reserved.  
Legal Disclaimer  
The information given in this document shall in no event be regarded as a guarantee of conditions  
or characteristics (“Beschaffenheitsgarantie”). With respect to any examples or hints given herein,  
any typical values stated herein and/or any information regarding the application of the device,  
Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including  
without limitation warranties of non
‑
infringement of intellectual property rights of any third party.  
Information  
For further information on technology, delivery terms and conditions and prices please  
contact your nearest Infineon Technologies Office (

).  
Warnings  
Due to technical requirements components may contain dangerous substances. For information  
on the types in question please contact your nearest Infineon Technologies Office.  
Infineon Technologies Components may only be used in life-support devices or systems with the  
express written approval of Infineon Technologies, if a failure of such components can reasonably  
be expected to cause the failure of that life-support device or system, or to affect the safety or  
effectiveness of that device or system. Life support devices or systems are intended to be  
implanted in the human body, or to support and/or maintain and sustain and/or protect human life.  
If they fail, it is reasonable to assume that the health of the user or other persons may be  
endangered.  
Rev. 1.0  
page 8  
2016-06-20  

IPB70N12S3-11  
IPI70N12S3-11, IPP70N12S3-11  
Revision History  
Version  
Date  
Changes  
Revision 1.0  
20.06.2016 Final Data Sheet  
Rev. 1.0  
page 9  
2016-06-20