Infineon-Technologies-IRF7815TRPBF

Part #Infineon-Technologies-IRF7815TRPBF
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Infineon-Technologies-IRF7815TRPBF
PD – 96284  
IRF7815PbF  
HEXFET

®

Power MOSFET  
Applications  
l
Synchronous MOSFET for Notebook  
V

DSS  

R

DS(on)

max  
Qg (typ.)  
25nC  
43m @V

GS

= 10V  
150V  
Processor Power  
l
Synchronous Rectifier MOSFET for  
Isolated DC-DC Converters in  
Networking Systems  
A
A
D
1
8
S
Benefits  
2
7
S
D
l
Very Low R

DS(on)

at 10V V

GS  

l
Low Gate Charge  
l
Fully Characterized Avalanche Voltage  
and Current  
l
20V V

GS

Max. Gate Rating  
3
6
S
D
4
5
G
D
SO-8  
Top View  
Absolute Maximum Ratings  
Parameter  
Max.  
150  
± 20  
5.1  
Units  
V

DS  

Drain-to-Source Voltage  
Gate-to-Source Voltage  
Continuous Drain Current, V

GS

@ 10V  
Continuous Drain Current, V

GS

@ 10V  
Pulsed Drain Current  
V
V
GS  
I
I
I
@ T

A

= 25°C  
D
D
@ T

A

= 70°C  
4.1  
A
41  
DM  
Power Dissipation  
P
P
@T

A

= 25°C  
@T

A

= 70°C  
2.5  
W
D
D
Power Dissipation  
1.6  
Linear Derating Factor  
Operating Junction and  
0.02  
-55 to
 
+ 150  
W/°C  
°C  
T
J
T
Storage Temperature Range  
STG  
Thermal Resistance  
Parameter  
Junction-to-Drain Lead  
Junction-to-Ambient  
Typ.  
–––  
Max.  
20  
Units  
R

θ
JL  

R

θ
JA  

°C/W  
–––  
50  
Notes

through
ꢀ
are on page 9  
1
12/01/09  

IRF7815PbF  
Static @ T

J

= 25°C (unless otherwise specified)  
Parameter  
Drain-to-Source Breakdown Voltage  
Min. Typ. Max.
 
Units  
Conditions  
V

GS

= 0V, I

D

= 250µA  
BV

DSS  

150  
–––  
0.17  
34  
–––  
V
∆Β
V

DSS

/
∆
T

J  

R

DS(on)  

Breakdown Voltage Temp. Coefficient
 
–––  
––– V/°C
 
Reference to 25°C, I

D

= 1mA  
Static Drain-to-Source On-Resistance  
Gate Threshold Voltage  
–––  
3.0  
43  
V

GS

= 10V, I

D

= 3.1A  
Ω
m
V

GS(th)  

4.0  
5.0  
V
V

DS

= V

GS

, I

D

= 100µA  
∆
V

GS(th)  

Gate Threshold Voltage Coefficient  
Drain-to-Source Leakage Current  
––– -12.2 –––
 
mV/°C  
I

DSS  

–––  
–––  
–––  
–––  
8.2  
–––  
–––  
–––  
–––  
–––  
25  
20  
250  
100  
-100  
–––  
38  
V

DS

= 150V, V

GS

= 0V  
µA  
V

DS

= 150V, V

GS

= 0V, T

J

= 125°C  
V

GS

= 20V  

GS

= -20V  
I

GSS  

Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Forward Transconductance  
Total Gate Charge  
nA  
S
V
gfs  
Q

g  

V

DS

= 50V, I

D

= 3.1A  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
Q

gs1  

Pre-Vth Gate-to-Source Charge  
Post-Vth Gate-to-Source Charge  
Gate-to-Source Charge  
6.5  
1.3  
7.8  
7.4  
9.8  
8..7  
10  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
V

DS

= 75V  
Q

gs2  

Q

gs  

V

GS

= 10V  
I

D

= 3.1A  
nC  
Q

gd  

Gate-to-Drain Charge  
See Figs. 6, 16a & 16b  
Q

godr  

Gate Charge Overdrive  
Switch Charge (Q

gs2

+ Q

gd

)  
Q

sw  

Q

oss  

R

G  

Output Charge  
nC V

DS

= 16V, V

GS

= 0V  
Ω
Gate Resistance  
Turn-On Delay Time  
Rise Time  
1.02  
8.4  
3.2  
14  
t

d(on)  

t

r  

t

d(off)  

t

f  

V

DD

= 75V, V

GS

= 10V  
I

D

= 3.1A  
ns  
pF  
Turn-Off Delay Time  
Fall Time  
Ω
R

G

= 1.8  
8.3  
See Figs. 15a & 15b  
C

iss  

C

oss  

C

rss  

Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
––– 1647 –––  
V

GS

= 0V  
–––  
–––  
129  
30  
–––  
–––  
V

DS

= 75V  
ƒ = 1.0MHz  
Avalanche Characteristics  
Parameter  
Typ.  
–––  
–––  
Max.  
Units  
mJ  
Single Pulse Avalanche Energy  
E

AS  

I

AR  

529  
3.1  
Avalanche Current  
A
Diode Characteristics  
Parameter  
Min. Typ. Max.
 
Units  
Conditions  
I

S  

Continuous Source Current  
MOSFET symbol  
–––  
–––  
2.3  
(Body Diode)  
Pulsed Source Current  
showing the  
integral reverse  
A
I

SM  

–––  
–––  
41  
(Body Diode)  
p-n junction diode.  
V

SD  

t

rr  

Diode Forward Voltage  
–––  
–––  
–––  
–––  
41  
1.3  
62  
V
T =
 
25°C, I
 
= 3.1A, V
 
= 0V  
J S
 
GS  
Reverse Recovery Time  
Reverse Recovery Charge  
ns T
 
= 25°C, I
 
= 3.1A, V

DD

= 75V  
J F  
Q

rr  

di/dt = 300A/µs  
213  
320  
nC  
2

IRF7815PbF  
100  
10  
100  
10  
1
VGS  
15V  
10V  
8.0V  
7.0V  
6.5V  
6.0V  
5.5V  
5.0V  
VGS  
15V  
10V  
8.0V  
7.0V  
6.5V  
6.0V  
5.5V  
5.0V  
TOP  
TOP  
BOTTOM  
BOTTOM  
1
5.0V  
0.1  
0.01  
60µs PULSE WIDTH  
Tj = 150°C  
5.0V  
≤
≤
60µs PULSE
 
WIDTH Tj = 25°C  
0.1  
0.1  
1
10  
100  
0.1  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1.
 
Typical Output Characteristics  
Fig 2.
 
Typical Output Characteristics  
2.5  
2.0  
1.5  
1.0  
0.5  
100  
10  
1
I
= 5.1A  
D
V
= 50V  
DS  
V
= 10V  
GS  
≤
60µs PULSE WIDTH  
T
= 150°C  
J
T
= 25°C  
J
0.1  
3.5 4.0 4.5 5.0 5.5 6.0 6.5 7.0 7.5  
-60 -40 -20  
0
20 40 60 80
 
100 12
0
1
40 160  
T
J
, Junction Temperature (°C)  
V
, Gate-to-Source Voltage (V)  
GS  
Fig 3.
 
Typical Transfer Characteristics  
Fig 4.
 
Normalized On-Resistance  
Vs. Temperature  
3

IRF7815PbF  
100000  
14.0  
12.0  
10.0  
8.0  
V
= 0V,  
= C  
f = 1 MHZ  
GS  
I =
 
3.1A  
D
C
C
C
+ C
 
, C  
SHORTED  
iss  
gs  
gd  
ds  
= C  
rss  
oss  
gd  
V
= 120V  
= 75V  
DS  
= C
 
+ C  
ds  
gd  
10000  
1000  
100  
V
DS  
VDS= 30V  
C
iss  
6.0  
C
oss  
4.0  
C
rss  
2.0  
10  
0.0  
1
10  
100  
1000  
0
5
10  
15  
20  
25  
30  
35  
V
, Drain-to-Source Voltage (V)  
Q ,
 
Total Gate Charge (nC)  
DS  
G
Fig 6.
 
Typical Gate Charge Vs.  
Fig 5.
 
Typical Capacitance Vs.  
Gate-to-Source Voltage  
Drain-to-Source Voltage  
100  
10  
1
100  
10  
1
OPERATION IN THIS AREA  
LIMITED BY R  
(on)  
DS  
100µsec  
T
= 150°C  
J
10msec  
1msec  
T
= 25°C  
J
T
= 25°C  
A
Tj = 150°C  
Single Pulse  
V
GS  
= 0V  
0.1  
0.3  
0.5  
0.7  
0.9  
0
1
10  
100  
1000  
V
, Drain-to-Source Voltage (V)  
V
, Source-to-Drain Voltage (V)  
SD  
DS  
Fig 8.
 
Maximum Safe Operating Area  
Fig 7.
 
Typical Source-Drain Diode  
Forward Voltage  
4

IRF7815PbF  
6
5
4
3
2
1
0
6.0  
5.0  
4.0  
3.0  
2.0  
I
I
I
= 100uA  
= 150uA  
= 250uA  
D
D
D
ID = 1.0mA  
= 1.0A  
I
D
25  
50  
75  
100  
125  
150  
-75 -50 -25  
0
25 50 75
 
100 125 150  
T
, Ambient Temperature (°C)  
T ,
 
Temperature ( °C )  
A
J
Fig 10.
 
Threshold Voltage Vs. Temperature  
Fig 9.
 
Maximum Drain Current Vs.  
Ambient Temperature  
100  
D = 0.50  
10  
1
0.20  
0.10  
0.05  
0.02  
0.01  
R

1  

R

1  

R

2  

R

2  

R

3  

R

3  

R

4  

R

4  

Ri (°C/W)
 
τ
i (sec)  
τ

J

τ

J  

τ
2.8482  
0.012383  
0.1  

A

τ

A  

τ
τ

1

τ

1  

τ
τ
16.4171  
36.75014  

2

τ

2  

3

τ

3  

4

τ

4  

20.8292 5.677801  
9.8220 0.525832  
0.01  
0.001  
0.0001  
Ci=
τ
i
/
Ri  
Ci=
τ
i
/
Ri  
Notes:  
1. Duty Factor D = t1/t2  
SINGLE PULSE  
( THERMAL RESPONSE )  
2. Peak Tj = P dm x Zthja + T  
A
1E-006  
1E-005  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
t
, Rectangular Pulse Duration (sec)  
1
Fig 11.
 
Maximum Effective Transient Thermal Impedance, Junction-to-Ambient  
5

IRF7815PbF  
100  
90  
80  
70  
60  
50  
2500  
2000  
1500  
1000  
500  
I
I
= 5.1A  
D
D
TOP  
0.30A  
0.44A  
BOTTOM 3.1A  
T
= 125°C  
J
T
= 25°C  
J
40  
30  
20  
0
4
6
8
10  
12 14 16  
18 20  
25  
50  
75  
100  
125  
150  
Starting T
 
, Junction Temperature (°C)  
J
V
Gate -to -Source Voltage
 
(V)  
GS,  
Fig 12.
 
On-Resistance Vs. Gate Voltage  
Fig 13c.
 
Maximum Avalanche Energy  
Vs. Drain Current  
V
(BR)DSS  
15V  
t
p
DRIVER  
+
L
V
DS  
D.U.T  
AS  
R
G
V
DD  
–
I
A
V
GS  
Ω
0.01  
t
p
I
AS  
Fig 14a.
 
Unclamped Inductive Test Circuit  
Fig 14b.
 
Unclamped Inductive Waveforms  
R

D  

V
DS  
V

DS  

90%  
V

GS  

D.U.T.  
R

G  

+

V

DD  

–
10%  
V

GS  

Pulse Width
≤ 1
µs  
Duty Factor
≤ 0.1 %  
V
GS  
t
t
r
t
t
f
d(on)  
d(off)  
Fig 15a.
 
Switching Time Test Circuit  
Fig 15b.
 
Switching Time Waveforms  
6

IRF7815PbF  
Id  
Vds  
Vgs  
L
VCC  
DUT  
0
Vgs(th)  
20K  
Qgs1  
Qgs2  
Qgodr  
Qgd  
Fig 16b.
 
Gate Charge Waveform  
Fig 16a.
 
Gate Charge Test Circuit  
Driver Gate Drive  
P
.
W.  
Period  
D =  
D.U.T  
Period  
P.W.  
+

V

***  
=10V  
GS  
ƒ
Circuit Layout Considerations  
•
Low Stray Inductance  
•
Ground Plane  
•
Low Leakage Inductance  
Current Transformer  
–
D.U.
T
. I
 
W
aveform  
SD  
+
‚
–
Reverse  
Recovery  
Current  
Body Diode Forward  
„
Current  
di/dt  
–
+
D.U.
T
. V
 
W
aveform  
DS  
Diode Recovery  
dv/dt  

V
DD  
*
V

DD  

**  
Re-Applied  
Voltage  
•
dv/dt controlled by R

G  

R

G  

+
–
Body Diode  
Forward Drop  
•
Driver same type as D.U.T.  
•
I

SD

controlled by Duty Factor “D”  
•
D.U.T. – Device Under Test  
Inductor Curent  
I
SD  
Ripple
≤
5%  
*
Use P-Channel Driver for P-Channel Measurements  
**
Reverse Polarity for P-Channel  
***
V

GS

= 5V for Logic Level Devices  
Fig 17.
 
Diode Reverse Recovery Test Circuit
for HEXFET

®

Power MOSFETs  
7

IRF7815PbF  
SO-8 Package Outline
(Mosfet & Fetky)  
Dimensions are shown in milimeters (inches)  
SO-8 Part Marking Information  
8

IRF7815PbF  
SO-8 Tape and Reel  
TERMINAL NUMBER 1  
12.3 ( .484 )  
11.7 ( .461 )  
8.1 ( .318 )  
7.9 ( .312 )  
FEED DIRECTION  
NOTES:  
1. CONTROLLING
 
DIMENSION : MILLIMETER.  
2. ALL
 
DIMENSIONS ARE SHOWN IN MILLIMETERS(INCHES).  
3. OUTLINE
 
CONFORMS TO EIA-481 & EIA-541.  
330.00  
(12.992)  
MAX.  
14.40 ( .566 )  
12.40 ( .488 )  
NOTES :  
1. CONTROLLING DIMENSION : MILLIMETER.  
2. OUTLINE CONFORMS TO EIA-481 & EIA-541.  
Notes:  

Repetitive rating;
 
pulse width limited by max. junction temperature.  
‚
Starting T

J

= 25°C, L = 110mH, R

G

= 25
Ω
, I

AS

= 3.1A  
ƒ
Pulse width
≤
400µs; duty cycle
≤
2%.  
„
When mounted on 1 inch square
 
copper board.  
ꢀ
R
is measured at
T

J

of approximately 90°C.  
θ
Data and specifications subject to change without notice.  
This product has been designed and qualified for the Industrial market.  
Qualification Standards can be found on IR’s Web site.  
IR WORLD HEADQUARTERS:
233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
9