Infineon-Technologies-IRLB8748PBF

Part #Infineon-Technologies-IRLB8748PBF
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Infineon-Technologies-IRLB8748PBF
PD – 96231  
IRLB8748PbF  
HEXFET

®

Power MOSFET  
Applications  
l
Optimized for UPS/Inverter Applications  
l
High Frequency Synchronous Buck  
Converters for Computer Processor Power  
l
High Frequency Isolated DC-DC  
Converters with Synchronous Rectification  
for Telecom and Industrial use  
V

DSS

R

DS(on)

max  
Qg  
15nC  
4.8m  
30V  
D
S
D
G
Benefits  
TO-220AB  
l
Very Low RDS(on) at 4.5V V

GS  

l
Ultra-Low Gate Impedance  
l
Fully Characterized Avalanche Voltage  
and Current  
IRLB8748PbF  
G
D
S
Gate  
Drain  
Source  
l
Lead-Free  
Absolute Maximum Ratings  
Parameter  
Max.  
Units  
V

DS  

30  
Drain-to-Source Voltage  
Gate-to-Source Voltage  
V
± 20  
V
GS  
Continuous Drain Current, V

GS

@ 10V (Silicon Limited)  
Continuous Drain Current, V

GS

@ 10V (Silicon Limited)  
Continuous Drain Current, V

GS

@ 10V (Package Limited)  
Pulsed Drain Current  
92  
I
I
I
I
@ T

C

= 25°C  
D
D
D
65  
@ T

C

= 100°C  
@ T

C

= 25°C  
A
78  
370  
DM  
75  
38  
Maximum Power Dissipation  
P
P
@T

C

= 25°C  
D
D
W
@T

C

= 100°C
 
Maximum Power Dissipation  
Linear Derating Factor  
0.5  
W/°C  
-55 to
 
+ 175  
T
T
Operating Junction and  
J
Storage Temperature Range  
°C  
STG  
Soldering Temperature, for 10 seconds  
Mounting Torque, 6-32 or M3 screw  
300 (1.6mm from case)  
10 lbf  
in (1.1N
 
m)  
Thermal Resistance  
Parameter  
Typ.  
–––  
0.5  
Max.  
2.0  
Units  
R

θ
JC  

Junction-to-Case  
R

θ
CS  

R

θ
JA  

–––  
62  
°C/W  
Case-to-Sink, Flat Greased Surface  
Junction-to-Ambient  
–––  
Notes

through
‡
are on page 9  
1
04/22/09  

IRLB8748PbF  
Static @ T

J

= 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max.
 
Units  
Conditions  
V

GS

= 0V, I

D

= 250µA  
BV

DSS  

∆Β  
R

DS(on)  

30  
–––  
–––  
V
Drain-to-Source Breakdown Voltage  
Breakdown Voltage Temp. Coefficient  
Static Drain-to-Source On-Resistance  
∆
V

DSS

/ T

J  

–––  
–––  
–––  
1.35  
–––  
–––  
–––  
–––  
–––  
196  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
21  
––– mV/°C
 
Reference to 25°C, I

D

= 1mA  
3.8  
5.5  
1.8  
-7.1  
–––  
–––  
–––  
–––  
–––  
15  
4.8  
6.8  
V

GS

= 10V, I

D

= 40A  
V

GS

= 4.5V, I

D

= 32A  
Ω
m
V

GS(th)  

2.35  
V
Gate Threshold Voltage  
V

DS

= V

GS

, I

D

= 50µA  
∆
V
∆

GS(th)

/ T

J  

––– mV/°C  
Gate Threshold Voltage Coefficient  
Drain-to-Source Leakage Current  
I

DSS  

1.0  
µA  
V

DS

= 24V, V

GS

= 0V  
150  
V

DS

= 24V, V

GS

= 0V, T

J

= 125°C  
I

GSS  

100  
nA  
V

GS

= 20V  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Forward Transconductance  
Total Gate Charge  
-100  
V

GS

= -20V  
gfs  
Q

g  

–––  
23  
S
V

DS

= 15V, I

D

= 32A  
Q

gs1  

3.6  
2.2  
–––  
–––  
–––  
–––  
–––  
–––  
V

DS

= 15V  
Pre-Vth Gate-to-Source Charge  
Post-Vth Gate-to-Source Charge  
Gate-to-Drain Charge  
Gate Charge Overdrive  
Switch Charge (Q

gs2

+ Q

gd

)  
Output Charge  
Q

gs2  

Q

gd  

nC V

GS

= 4.5V  
I

D

= 32A  
5.9  
3.9  
8.1  
11  
Q

godr  

Q

sw  

Q

oss  

nC V

DS

= 16V, V

GS

= 0V  
R

G  

t

d(on)  

t

r  

Gate Resistance  
–––  
–––  
–––  
–––  
–––  
2.0  
14  
3.5  
–––  
–––  
–––  
–––  
Ω
V

DD

= 15V, V

GS

= 4.5V  
Turn-On Delay Time  
96  
I

D

= 32A  
ns  
Rise Time  
t

d(off)  

t

f  

16  
R

G

= 1.8
Ω  
Turn-Off Delay Time  
34  
Fall Time  
C

iss  

C

oss  

C

rss  

––– 2139 –––  
V

GS

= 0V  
Input Capacitance  
–––  
–––  
464  
199  
–––  
–––  
V

DS

= 15V  
ƒ = 1.0MHz  
pF  
Output Capacitance  
Reverse Transfer Capacitance  
Avalanche Characteristics  
Parameter  
Typ.  
–––  
–––  
–––  
Max.  
114  
32  
Units  
mJ  
A
E

AS  

Single Pulse Avalanche Energy  
I

AR  

Avalanche Current  
E

AR  

7.5  
mJ  
Repetitive Avalanche Energy  
Diode Characteristics  
Parameter  
Min. Typ. Max.
 
Units  
Conditions  
I

S  

–––  
–––  
MOSFET symbol  
Continuous Source Current  
92  
(Body Diode)  
showing the  
integral reverse  
A
I

SM  

–––  
–––  
Pulsed Source Current  
370  
(Body Diode)  
p-n junction diode.  
V

SD  

–––  
–––  
–––  
–––  
23  
1.0  
35  
59  
V
T =
 
25°C, I
 
= 32A, V
 
= 0V  
J S GS  
Diode Forward Voltage  
t

rr  

ns T
 
= 25°C, I
 
= 32A, V

DD

= 15V  
Reverse Recovery Time  
J
F
Q

rr  

di/dt = 200A/µs  
39  
nC  
Reverse Recovery Charge  
t

on  

Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
Forward Turn-On Time  
2

IRLB8748PbF  
1000  
100  
10  
1000  
100  
10  
VGS  
10V  
VGS  
10V  
TOP  
TOP  
9.0V  
7.0V  
5.5V  
4.5V  
4.0V  
3.5V  
3.0V  
9.0V  
7.0V  
5.5V  
4.5V  
4.0V  
3.5V  
3.0V  
BOTTOM  
BOTTOM  
3.0V  
3.0V  
60µs  
PULSE WIDTH  
Tj = 175°C  
≤
60µs  
Tj = 25°C  
PULSE WIDTH  
≤
1
1
0.1  
1
10  
100  
0.1  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1.
 
Typical Output Characteristics  
Fig 2.
 
Typical Output Characteristics  
2.0  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
1000  
100  
I
= 40A  
D
V
= 10V  
GS  
T
= 175°C  
J
10  
1
T =
 
25°C  
J
V
= 15V  
DS  
≤
60µs PULSE WIDTH  
0.1  
-60 -40 -20
 
0 20
 
40 60 80
 
100120140160180  
1
2
3
4
5
6
7
8
T ,
 
Junction Temperature (°C)  
J
V
, Gate-to-Source Voltage (V)  
GS  
Fig 3.
 
Typical Transfer Characteristics  
Fig 4.
 
Normalized On-Resistance  
vs. Temperature  
3

IRLB8748PbF  
14.0  
12.0  
10.0  
8.0  
10000  
V
= 0V,  
= C  
f = 1 MHZ  
GS  
I =
 
32A  
D
C
C
C
+ C
 
, C  
SHORTED  
iss  
gs  
gd  
ds  
V
V
= 24V  
= 15V  
DS  
DS  
= C  
rss  
oss  
gd  
= C
 
+ C  
ds  
gd  
C
iss  
1000  
6.0  
C
oss  
4.0  
C
rss  
2.0  
0.0  
100  
0
10  
20  
30  
40  
1
10  
, Drain-to-Source Voltage (V)  
100  
Q , Total
 
Gate Charge (nC)  
V
G
DS  
Fig 6.
 
Typical Gate Charge vs.  
Fig 5.
 
Typical Capacitance vs.  
Gate-to-Source Voltage  
Drain-to-Source Voltage  
1000  
1000  
100  
10  
OPERATION IN THIS AREA  
LIMITED BY R  
(on)  
DS  
100  
10  
1
T =
 
175°C  
J
100µsec  
1msec  
10msec  
T
= 25°C  
J
Tc = 25°C  
Tj = 175°C  
Single Pulse  
V
= 0V  
GS  
0.1  
1
0.0  
0.5  
1.0  
1.5  
2.0  
2.5  
0
1
10  
100  
V
, Source-to-Drain Voltage (V)  
V
, Drain-to-Source Voltage (V)  
SD  
DS  
Fig 8.
 
Maximum Safe Operating Area  
Fig 7.
 
Typical Source-Drain Diode  
Forwar
d
V
oltage  
4

IRLB8748PbF  
2.5  
2.0  
1.5  
1.0  
0.5  
100  
80  
60  
40  
20  
0
Limited By Package  
I
= 50µA  
D
ID = 250µA  
ID = 1.0mA  
-75 -50 -25  
0
25 50 75
 
100 125 150 175  
25  
50  
75  
100  
125  
150  
175  
T ,
 
Temperature ( °C )  
J
T
, Case Temperature (°C)  
C
Fig 9.
 
Maximum Drain Current vs.  
Fig 10.
 
Threshold Voltage vs. Temperature  
Case Temperature  
10  
1
0.1  
D = 0.50  
0.20  
0.10  
0.05  
Ri (°C/W)
 
τ
i (sec)  
R

1  

R

1  

R

2  

R

2  

R

3  

R

3  

R

4  

R

4  

1.55246 0.005303  
0.00682 8.250407  
0.00172 6.932919  
0.43999 0.000317  
τ
0.02  
0.01  
τ

J

τ

J  

τ

C

1

τ

1  

Ci=
τ
i
/
Ri  
τ
τ
τ

2

τ

2  

3

τ

3  

4

τ

4  

0.01  
Notes:  
SINGLE PULSE  
1. Duty Factor D = t1/t2  
2. Peak Tj = P dm x Zthjc + Tc  
( THERMAL RESPONSE )  
0.001  
1E-006  
1E-005  
0.0001  
0.001  
0.01  
0.1  
t
, Rectangular Pulse Duration (sec)  
1
Fig 11.
 
Maximum Effective Transient Thermal Impedance, Junction-to-Case  
5

IRLB8748PbF  
18  
16  
14  
12  
10  
8
500  
450  
400  
350  
300  
250  
200  
150  
100  
50  
I
= 40A  
I
D
D
TOP  
6.73A  
11.6A  
BOTTOM 32A  
T
T
= 125°C  
J
J
6
= 25°C  
8
0
4
2
4
6
10  
25  
50  
75  
100  
125  
150  
175  
Starting T
 
, Junction Temperature (°C)  
J
V
Gate -to -Source Voltage
 
(V)  
GS,  
Fig 13c.
 
Maximum Avalanche Energy  
Fig 12.
 
On-Resistance vs. Gate Voltage  
vs. Drain Current  
15V  
R

D  

V

DS  

V

GS  

DRIVER  
+
L
V
DS  
D.U.T.  
R

G  

+

V

DD  

–
D.U.T  
AS  
R
G
V
DD  
–
I
A
V

GS  

20V  
V

GS  

Puls
e
W
idth
≤ 1
µs  
Duty Factor
≤ 0.1 %  
Ω
0.01  
t
p
Fig 13a.
 
Unclamped Inductive Test Circuit  
Fig 14a.
 
Switching Time Test Circuit  
V
(BR)DSS  
V
DS  
t
p
90%  
10%  
V
GS  
t
t
r
t
t
f
d(on)  
d(off)  
I
AS  
Fig 14b.
 
Switching Time Waveforms  
Fig 13b.
 
Unclamped Inductive Waveforms  
6

IRLB8748PbF  
Driver Gate Drive  
P.W.  
P
.
W.  
Period  
D.U.T  
Period  
D =  
+
*
=10V  
V
GS  
ƒ
Circuit Layout Considerations  
•
Low Stray Inductance  
•
Ground Plane  
•
Low Leakage Inductance  
Current Transformer  
–
D.U.
T
. I
 
W
aveform  
SD  
+
‚
–
Reverse  
Recovery  
Current  
Body Diode Forward  
„
Current  
di/dt  
–
+
D.U.
T
. V
 
W
aveform  
DS  
Diode Recovery  
dv/dt  

V
DD  
V

DD  

Re-Applied  
Voltage  
•
dv/dt controlled by R

G  

R

G  

+
–
Body Diode  
Forward Drop  
•
Driver same type as D.U.T.  
•
I

SD

controlled by Duty Factor “D”  
•
D.U.T. – Device Under Test  
Inductor Curent  
I
SD  
Ripple
≤
5%  
*
V

GS

= 5V for Logic Level Devices  
Fig 15.
Peak Diode Recovery dv/dt Test Circuit
for N-Channel  
HEXFET

®

Power MOSFETs  
Current Regulator  
Same Type as D.U.
T
.  
Id  
Vds  
50K
Ω  
Vgs  
.2
µ
F  
.3
µ
F  
12V  
+
V
DS  
D.U.
T
.  
–
Vgs(th)  
Qgs1  
V
GS  
3mA  
Qgodr  
Qgd  
Qgs2  
I
I
D
G
Current Sampling Resistors  
Fig 17.
 
Gate Charge Waveform  
Fig 16.
 
Gate Charge Test Circuit  
7

IRLB8748PbF  
TO-220AB Package Outline
(Dimensions are shown in millimeters (inches))  
TO-220AB packages are not recommended for Surface Mount Application.  
8

IRLB8748PbF  
TO-220AB Part Marking Information  
Notes:  
ꢀ
When mounted on 1″ square PCB (FR-4 or G-10 Material).  
For recommended footprint and soldering techniques refer to  
application note #AN-994.  

Repetitive rating;
 
pulse width limited by  
max. junction temperature.  
‚
Starting T

J

= 25°C, L =
0.22
mH, R

G

= 25
Ω
,  
I

AS

= 32A.  
†
R

θ

is measured at T

J

approximately 90°C.  
‡
This is only applied to TO-220AB pakcage.  
ƒ
Pulse width
≤
400µs; duty cycle
≤
2%.  
„
Calculated continuous current based on  
maximum allowable junction temperature.  
Package limitation current is 78A.  
Data and specifications subject to change without notice.  
This product has been designed and qualified for the Industrial market.  
Qualification Standards can be found on IR’s Web site.  
IR WORLD HEADQUARTERS:
233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
9