Infineon-Technologies-IRLI520NPBF

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Infineon-Technologies-IRLI520NPBF
IRLI520NPbF  
HEXFET

®

Power MOSFET  
Logic –Level Gate Drive  
Advanced Process Technology  
Isolated Package  
High Voltage Isolation = 2.5KVRMS
 
Sink to Lead Creepage Dist. = 4.8mm  
Fully Avalanche Rated  
V

DSS  

R

DS(on)  

I

D  

100V  
0.18
  
8.1A  
Lead-Free  
Description  
Fifth Generation HEXFETs from International Rectifier utilize  
advanced processing techniques to achieve extremely low
 
on-  
resistance per silicon area.
 
This benefit, combined with the fast  
switching speed and ruggedized device design that HEXFET  
Power MOSFETs are well known for, provides the designer with  
an extremely efficient and reliable device for use in a wide variety  
of applications.  
S
D
G
TO-220 Full-Pak  
G
D
S
Gate  
Drain  
Source  
The TO-220 Full Pak eliminates the need for additional insulating  
hardware in commercial-industrial applications. The molding  
compound used provides a high isolation capability and a low  
thermal resistance between the tab and external heat sink. This  
isolation is equivalent to using a 100 micron mica barrier with  
standard TO-220 product.
 
The Fullpak is mounted to a heat sink  
using a single clip or by a single screw fixing.  
Standard Pack  
Quantity  
50  
Base Part Number  
Package Type  
Orderable Part Number  
Form  
IRLI520NPbF  
TO-220 Full-Pak  
Tube  
IRLI520NPbF  
Absolute Maximum Ratings  
Symbol  
Parameter  
Max.  
8.1  
Units  
A
I

D

@ T

C

= 25°C  
Continuous Drain Current, V

GS

@ 10V  
I

D

@ T

C

= 100°C  
I

DM  

Continuous Drain Current, V

GS

@ 10V  
Pulsed Drain Current
  
Maximum Power Dissipation  
Linear Derating Factor  
5.7  
35  
30  
P

D

@T

C

= 25°C  
W
W/°C  
V
0.20  
V

GS  

E

AS  

I

AR  

Gate-to-Source Voltage  
Single Pulse Avalanche Energy (Thermally Limited)
  
Avalanche Current
  
± 16  
85  
mJ  
A
6.0  
E

AR  

dv/dt  
T

J  

Repetitive Avalanche Energy
  
3.0  
mJ  
V/ns  
Peak Diode Recovery dv/dt
  
5.0  
Operating Junction and  
-55 to
 
+ 175  
T

STG  

Storage Temperature Range  
°C  
Soldering Temperature, for 10 seconds (1.6mm from case)  
Mounting torque, 6-32 or M3 screw  
300  
10 lbf•in (1.1N•m)  
Thermal Resistance  
Symbol  
R

JC  

R

JA  

Parameter  
Junction-to-Case  
Junction-to-Ambient  
Typ.  
–––  
–––  
Max.  
5.0  
65  
Units  
°C/W  
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IRLI520NPbF  
Electrical Characteristics @ T

J

= 25°C (unless otherwise specified)  
Parameter  
Min. Typ. Max.
 
Units  
100 ––– –––  
––– 0.11 ––– V/°C
 
Reference to 25°C, I

D

= 1mA
  
Conditions  
V

(BR)DSS  

Drain-to-Source Breakdown Voltage  
Breakdown Voltage Temp. Coefficient  
V
V

GS

= 0V, I

D

= 250µA  
V

(BR)DSS

/
T

J  

––– ––– 0.18  
––– ––– 0.22  
––– ––– 0.26  
V

GS

= 10V, I

D

= 6.0A  
R

DS(on)  

Static Drain-to-Source On-Resistance  
V

GS

= 5.0V, I

D

= 6.0A  

GS

= 4.0V, I

D

= 5.0A  
  
V
V

GS(th)  

gfs  
Gate Threshold Voltage  
Forward Trans conductance  
1.0  
3.1  
––– –––  
––– –––  
––– –––  
–––  
–––  
2.0  
–––  
25  
250  
100  
V
S
V

DS

= V

GS

, I

D

= 250µA  
V

DS

= 25V, I

D

= 6.0A
  
V

DS

= 100V, V

GS

= 0V  
I

DSS  

I

GSS  

Drain-to-Source Leakage Current  
µA  
nA  
V

DS

= 80V,V

GS

= 0V,T

J

=150°C  

GS

= 16V  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
Gate-to-Source Charge  
Gate-to-Drain Charge  
Turn-On Delay Time  
Rise Time  
V
––– ––– -100  
V

GS

= -16V  
I

D

= 6.0A  
Q

g  

Q

gs  

Q

gd  

t

d(on)  

t

r  

––– –––  
––– –––  
––– –––  
–––  
–––  
–––  
–––  
20  
4.6  
10  
–––  
–––  
–––  
–––  
nC V

DS

= 80V  
V

GS

= 5.0V , See Fig. 6 and 13
  
40  
35  
23  
22  
V

DD

= 50V  
I

D

= 6.0A  
R

G

= 11

V

GS

= 5.0V
  
R

D

= 8.2

See Fig. 10
  
Between lead,  
6mm (0.25in.)  
from package  
and center of die contact  
V

GS

= 0V  
ns  
nH  
pF  
t

d(off)  

t

f  

Turn-Off Delay Time  
Fall Time  
L

D  

L

S  

Internal Drain Inductance  
Internal Source Inductance  
–––  
–––  
4.5  
7.5  
–––  
–––  
C

iss  

C

oss  

C

rss  

C
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
Drain to Sink Capacitance  
––– 440  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
97  
50  
12  
V

DS

= 25V  
ƒ = 1.0MHz, See Fig. 5
  
ƒ = 1.0MHz  
Source-Drain Ratings and Characteristics  
Parameter  
Min. Typ. Max.
 
Units  
Conditions  
MOSFET symbol  
showing the  
integral reverse  
p-n junction diode.  
Continuous Source Current  
(Body Diode)  
I

S  

––– –––  
––– –––  
8.1  
35  
A
V
Pulsed Source Current  
(Body Diode)
  
I

SM  

V

SD  

t

rr  

Diode Forward Voltage  
Reverse Recovery Time  
––– –––  
––– 110  
––– 410  
1.3  
160  
620  
T

J

= 25°C,I

S

= 6.0A,V

GS

= 0V
  
ns T

J

= 25°C ,I

F

= 6.0A  
Q

rr  

t

on  

Reverse Recovery Charge  
Forward Turn-On Time  
nC di/dt
 
= 100A/µs
  
Intrinsic turn-on time is negligible (turn-on is dominated by L

S

+L

D

)  
Notes:
 
Repetitive rating;
 
pulse width limited by max. junction temperature. (See fig. 11)  
Starting T

J

= 25°C, L = 4.7mH, R

G

= 25
, I

AS

= 6.0A
 
(See fig. 12)  
I

SD


6.0A, di/dt

340A/µs, V

DD


V

(BR)DSS

, T

J

175°C.  
Pulse width

300µs; duty cycle
2%.  
t=60s, ƒ=60Hz  
Uses IRL520N data and test conditions.  
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IRLI520NPbF  
Fig. 2
Typical Output Characteristics  
Fig. 1
Typical Output Characteristics  
Fig. 4
Normalized On-Resistance  
Fig. 3
Typical Transfer Characteristics  
vs. Temperature  
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IRLI520NPbF  
Fig 5.
 
Typical Capacitance vs.  
Fig 6.
 
Typical Gate Charge vs.  
Drain-to-Source Voltage  
Gate-to-Source Voltage  
Fig. 7
Typical Source-to-Drain Diode  
Fig 8.
 
Maximum Safe Operating Area  
Forward Voltage  
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IRLI520NPbF  
Fig 10a.
 
Switching Time Test Circuit  
Fig 9.
 
Maximum Drain Current vs. Case Temperature  
Fig 10b.
 
Switching Time Waveforms  
Fig 11.
 
Maximum Effective Transient Thermal Impedance, Junction-to-Case  
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IRLI520NPbF  
15V  
DRIVER  
+
L
V
DS  
D.U.T  
AS  
R
G
V
DD  
–
I
A
20V  
0.01  
t
p
Fig 12a.
 
Unclamped Inductive Test Circuit  
V
(BR)DSS  
t
p
Fig 12c.
Maximum Avalanche Energy  
vs. Drain Current  
I
AS  
Fig 12b.
 
Unclamped Inductive Waveforms  
Fig 13a.
 
Gate Charge Waveform  
Fig 13b.
 
Gate Charge Test Circuit  
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IRLI520NPbF  
Fig 14.
Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs  
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IRLI520NPbF  
TO-220 Full-Pak Package Outline
(Dimensions are shown in millimeters (inches))  
TO-220 Full-Pak Part Marking Information  
TO-220AB Full-Pak
 
packages are not recommended for Surface Mount Application.  
Note: For the most current drawing please refer to
 
website at

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IRLI520NPbF  
Qualification Information  
Qualification Level  
Industrial  
(per JEDEC JESD47F)

†  

TO-220 Full-Pak  
N/A  
Yes  
Moisture Sensitivity Level  
RoHS Compliant  
†
Applicable version of JEDEC standard at the time of product release.  
Revision History  
Date  
Comments  

Changed datasheet with Infineon logo – all pages.  

Corrected Package Outline on page 8.  

Added disclaimer on last page.  
4/27/17  
Trademarks of Infineon Technologies AG  
µHVIC™, µIPM™, µPFC™, AU-ConvertIR™, AURIX™, C166™, CanPAK™, CIPOS™, CIPURSE™, CoolDP™, CoolGaN™, COOLiR™, CoolMOS™, CoolSET™,  
CoolSiC™, DAVE™, DI-POL™, DirectFET™, DrBlade™, EasyPIM™, EconoBRIDGE™, EconoDUAL™, EconoPACK™, EconoPIM™, EiceDRIVER™, eupec™, FCOS™,  
GaNpowIR™, HEXFET™, HITFET™, HybridPACK™, iMOTION™, IRAM™, ISOFACE™, IsoPACK™, LEDrivIR™, LITIX™, MIPAQ™, ModSTACK™, my-d™, NovalithIC™,  
OPTIGA™, OptiMOS™, ORIGA™, PowIRaudio™, PowIRStage™, PrimePACK™, PrimeSTACK™, PROFET™, PRO-SIL™, RASIC™, REAL3™, SmartLEWIS™, SOLID  
FLASH™, SPOC™, StrongIRFET™, SupIRBuck™, TEMPFET™, TRENCHSTOP™, TriCore™, UHVIC™, XHP™, XMC™  
Trademarks updated November 2015  
Other Trademarks  
All referenced product or service names and trademarks are the property of their respective owners.  
IMPORTANT NOTICE  
Edition 2016-04-19  
Published by  
Infineon Technologies AG  
81726 Munich, Germany  
For further information on the product, technology,  
delivery terms and conditions and prices please  
contact your nearest Infineon Technologies o
ff
ice  
The information given in this document shall in no  
event be regarded as a guarantee of conditions or  
characteristics (“Bescha
ff
enheitsgarantie”) .  
With respect to any examples, hints or any typical  
values stated herein and/or any information  
regarding the application of the product, Infineon  
Technologies hereby disclaims any and all  
warranties and liabilities of any kind, including  
without limitation warranties of non-infringement  
of intellectual property rights of any third party.  
Please note that this product is not qualified  
according to the AEC Q100 or AEC Q101 documents  
of the Automotive Electronics Council.  
© 2016 Infineon Technologies AG.  
All Rights Reserved.  
Do you have a question about this  
document?  
WARNINGS  
Due to technical requirements products may  
In addition, any information given in this
 
contain dangerous substances. For information on  
document
is subject to customer’s compliance
 
the types in question please contact your nearest  
with its
obligations stated in this document and
 
Infineon Technologies o
ff
ice.  
any applicable legal requirements, norms and  
standards concerning customer’s products and  
Except as otherwise explicitly approved by Infineon  
any use of the product of Infineon Technologies in  
Technologies in a written document signed by  
customer’s applications.  
Document reference  
ifx1  
authorized  
representatives  
of  
Infineon  
Technologies,
Infineon Technologies’ products  
may
not be used in any applications where a  
failure of the product or any consequences of the  
use thereof can reasonably be expected to result in  
personal injury.  
The data contained in this document is exclusively  
intended for technically trained sta
ff
. It is the  
responsibility  
of  
customer’s  
technical  
departments
to evaluate the suitability of the  
product for the intended application and the  
completeness of the product information given in  
this document with respect to such application.  
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2017-04-27