Infineon-Technologies-IRLL014NTRPBF

Part #Infineon-Technologies-IRLL014NTRPBF
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Infineon-Technologies-IRLL014NTRPBF
PD- 95154  
IRLL014NPbF  
HEXFET

®

Power MOSFET  
l
Surface Mount  
D
l
Advanced Process Technology  
l
Ultra Low On-Resistance  
l
Dynamic dv/dt Rating  
l
Fast Switching  
l
Fully Avalanche Rated  
l
Lead-Free  
V

DSS

= 55V  
R

DS(on)

= 0ꢀ14
Ω  
G
I

D

= 2ꢀ0A  
S
Description  
Fifth Generation HEXFETs from International Rectifier  
utilize advanced processing techniques to achieve  
extremely low on-resistance per silicon area” This benefit,  
combined with the fast switching speed and ruggedized  
device design that HEXFET Power MOSFETs are well  
know
n
f
or, provide
s
t
h
e
d
esigne
r
w
it
h
a
n
e
xtremel
y
e
fficient  
and reliable device for use in a wide variety of applications”  
The SOT-223 package is designed for surface-mount  
usin
g
v
apo
r
p
hase, infr
a
r
ed, o
r
w
av
e
s
olderin
g
t
echniques”  
Its unique package design allows for easy automatic pick-  
and-place as with other SOT or SOIC packages but has  
the added advantage of improved thermal performance  
due to an enlarged tab for heatsinking”
 
Power dissipation  
of 1″0W is possible in a typical surface mount application”  
SOT-223  
Absolute Maximum Ratings  
Parameter  
Maxꢀ  
2ꢀ8  
2ꢀ0  
1ꢀ6  
16  
Units  
I

D

@ T

A

= 25°C  
I

D

@ T

A

= 25°C  
I

D

@ T

A

= 70°C  
I

DM  

Continuous Drain Current, V

GS

@ 10V**  
Continuous Drain Current, V

GS

@ 10V*  
Continuous Drain Current, V

GS

@ 10V*  
Pulsed Drain Current
  
A
P

D

@T

A

= 25°C  
P

D

@T

A

= 25°C  
Power Dissipation
 
(PCB Mount)**  
Power Dissipation
 
(PCB Mount)*  
Linear Derating Factor
 
(PCB Mount)*  
Gate-to-Source Voltage  
2ꢀ1  
1ꢀ0  
8ꢀ3  
± 16  
32  
W
W
mW/°C  
V
V

GS  

E

AS  

Single Pulse Avalanche Energy
‚  
Avalanche Current
  
mJ  
A
I

AR  

2ꢀ0  
0ꢀ1  
7ꢀ2  
E

AR  

Repetitive Avalanche Energy

*  
Peak Diode Recovery dv/dt
ƒ  
Junction and Storage Temperature Range  
mJ  
V/ns  
°C  
dv/dt  
T

J,

T

STG  

-55 to
 
+ 150  
Thermal Resistance  
Parameter  
Junction-to-Ambꢀ (PCB Mount, steady state)*  
Typꢀ  
90  
Maxꢀ  
120  
Units  
R

θ
JA  

R

θ
JA  

°C/W  
Junction-to-Ambꢀ (PCB Mount, steady state)**  
50  
60  
* When
 
mounted on FR-4 board using minimum recommended footprintꢀ  
** When mounted on 1 inch square copper board, for comparison with other SMD devicesꢀ  
1
4/20/04  

IRLL014NPbF  
Electrical Characteristics @ T

J

= 25°C (unless otherwise specified)  
Parameter  
Minꢀ Typꢀ Maxꢀ Units  
55 –––
 
–––  
Conditions  
V

GS

= 0V, I

D

= 250µA  
V

(BR)DSS  

Drain-to-Source Breakdown Voltage  
V
∆
V

(BR)DSS

/
∆
T

J

Breakdown Voltage Tempꢀ Coefficient
 
––– 0ꢀ015
 
––– V/°C
 
Reference to 25°C, I

D

= 1mA  
––– –––
 
0ꢀ14  
––– –––
 
0ꢀ20  
––– –––
 
0ꢀ28  
V

GS

= 10V, I

D

= 2ꢀ0A
„  
V

GS

= 5ꢀ0V, I

D

= 1ꢀ2A
„  
V

GS

= 4ꢀ0V, I

D

= 1ꢀ0A
„  
V

DS

= V

GS

, I

D

= 250µA  
V

DS

= 25V, I

D

= 1ꢀ0A  
V

DS

= 55V, V

GS

= 0V  
V

DS

= 44V, V

GS

= 0V, T

J

= 150°C  
V

GS

= 16V  
R

DS(on)  

Static Drain-to-Source On-Resistance  
Ω
V

GS(th)  

g

fs  

Gate Threshold Voltage  
1ꢀ0  
2ꢀ3  
––– 2ꢀ0  
––– –––  
V
S
Forward Transconductance  
––– ––– 25  
––– –––
 
250  
––– –––
 
100  
––– –––
 
-100  
I

DSS  

I

GSS  

Drain-to-Source Leakage Current  
µA  
nA  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
V

GS

= -16V  
Q

g  

–––  
–––  
–––  
–––  
–––  
–––  
–––  
9ꢀ5  
14  
I

D

= 2ꢀ0A  
Q

gs  

Q

gd  

t

d(on)  

t

r  

Gate-to-Source Charge  
Gate-to-Drain (“Miller”) Charge  
Turn-On Delay Time  
Rise Time  
1ꢀ1 1ꢀ7  
3ꢀ0 4ꢀ4  
5ꢀ1 –––  
4ꢀ9 –––  
14 –––  
2ꢀ9 –––  
nC V

DS

= 44V  
V

GS

= 10V, See Figꢀ 6 and 9
„  
V

DD

= 28V  
I

D

= 2ꢀ0A  
ns  
pF  
t

d(off)  

t

f  

Turn-Off Delay Time  
Fall Time  
R

G

= 6ꢀ0
Ω  
R

D

= 14
Ω,
See Figꢀ 10
„  
V

GS

= 0V  
C

iss  

C

oss  

C

rss  

Input Capacitance  
––– 230
 
–––  
Output Capacitance  
–––  
–––  
66 –––  
30 –––  
V

DS

= 25V  
Reverse Transfer Capacitance  
ƒ = 1ꢀ0MHz, See Figꢀ 5  
Source-Drain Ratings and Characteristics  
Parameter  
Continuous Source Current  
(Body Diode)  
Minꢀ Typꢀ Maxꢀ Units  
Conditions  
MOSFET symbol  
I

S  

––– ––– 1ꢀ3  
A
showing the  
I

S
M  

Pulsed Source Current  
(Body Diode)
  
integral reverse  
–––  
––– ––– 1ꢀ0  
––– 41
 
61  
––– 73 110  
Intrinsic turn-on time is negligible (turn-on is dominated by L

S

+L

D

)  
16  
–––  
p-n junction diodeꢀ  
V

SD  

t

rr  

Diode Forward Voltage  
Reverse Recovery Time  
Reverse RecoveryCharge  
Forward Turn-On Time  
V
T

J

= 25°C, I

S

= 2ꢀ0A, V

GS

= 0V
„  
T

J

= 25°C, I

F

= 2ꢀ0A  
ns  
Q

rr  

t

on  

nC di/dt
 
= 100A/µs
„  
Notes:  

Repetitive rating;
 
pulse width limited by  
ƒ
I

SD

≤
2ꢀ0A, di/dt
≤
170A/µs, V

DD

≤
V

(BR)DSS  

T

J

≤
150°C  
,
maxꢀ junction temperatureꢀ ( See figꢀ 11 )  
‚
V

DD

= 25V, starting T

J

= 25°C, L = 4ꢀ0mH  
R

G

= 25
Ω
, I

AS

= 4ꢀ0Aꢀ (See Figure 12)  
„
Pulse width
≤
300µs; duty cycle
≤
2%ꢀ  
2

IRLL014NPbF  
100  
10  
1
100  
10  
1
VGS  
15V  
VGS  
15V  
TOP  
TOP  
10V  
10V  
7.0V  
5.5V  
4.5V  
4.0V  
3.5V  
7.0V  
5.5V  
4.5V  
4.0V  
3.5V  
BOTTOM 3.0V  
BOTTOM 3.0V  
3.0V  
20µs PULSE WIDTH  
20µs PULSE WIDTH  
T
J
3.0V  
T
J
= 25°C  
= 150°C  
A
A
100  
0.1  
1
10  
100  
0.1  
1
10  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 2ꢀ
 
Typical Output Characteristics,  
Fig 1ꢀ
 
Typical Output Characteristics,  
2.0  
1.5  
1.0  
0.5  
0.0  
100  
I
= 2.0A  
D
10  
T

J

= 25°C  
T

J

= 150°C  
V

DS

= 25V  
20µs PULSE WIDTH  

7.0

A  
V
= 10V  
GS  
1
A
-60 -40 -20  
0
20 40 60 80
 
100 120 140 160  
3.0  
4.0  
5.0  
6.0  
T ,
 
Junction Temperature (°C)  
V

GS

, Gate-to-Source Voltage (V)  
J
Fig 3ꢀ
 
Typical Transfer Characteristics  
Fig 4ꢀ
 
Normalized On-Resistance  
Vsꢀ Temperature  
3

IRLL014NPbF  
20  
16  
12  
8
400  
V
C
C
C
= 0V,  
f = 1MHz  
I
= 2.0A  
D
GS  
iss  
rss  
oss  
= C
 
+ C  
,
C
SHORTED  
gs  
gd  
gd  
ds  
V
V
= 44V  
= 28V  
DS  
DS  
= C  
= C
 
+ C  
ds  
gd  
300  
200  
100  
0
C
C
iss  
oss  
C
rss  
4
FOR TEST CIRCUIT  
SEE FIGURE 9  
0
A
A
1
10  
100  
0
3
6
9
12  
15  
V
, Drain-to-Source Voltage (V)  
Q
, Total Gate Charge (nC)  
DS  
G
Fig 5ꢀ
 
Typical Capacitance Vsꢀ  
Fig 6ꢀ
 
Typical Gate Charge Vsꢀ  
Drain-to-Source Voltage  
Gate-to-Source Voltage  
100  
100  
10  
1
OPERATION IN THIS AREA LIMITED  
BY R  
DS(on)  
10µs  
10  
100µs  
T =
 
150°C  
J
T =
 
25°C  
J
1ms  
1
10ms  
T
T
= 25°C  
= 150°C  
A
J
Single Pulse  
V
= 0V  
GS  
A
0.1  
0.1  
A
100  
0.4  
0.6  
0.8  
1.0  
1.2  
1.4  
1.6  
1
10  
V
, Drain-to-Source Voltage (V)  
V
, Source-to-Drain Voltage (V)  
DS  
SD  
Fig 8ꢀ
 
Maximum Safe Operating Area  
Fig 7ꢀ
 
Typical Source-Drain Diode  
Forward Voltage  
4

IRLL014NPbF  
R

D  

V

DS  

Q
G
10V  
V

GS  

DꢀUꢀTꢀ  
Q
Q
GD  
GS  
R

G  

+

V

DD  

–
V
G
10V  
Pulse Width
≤ 1
µs  
Duty Factor
≤ 0.1 %  
Charge  
Fig 9aꢀ
 
Basic Gate Charge Waveform  
Fig 10aꢀ
 
Switching Time Test Circuit  
Current Regulator  
Same Type as D.U.
T
.  
V
DS  
50K
Ω  
90%  
.2
µ
F  
12V  
.3
µ
F  
+
V
DS  
D.U.
T
.  
–
10%  
V
GS  
V
GS  
t
t
r
t
t
f
3mA  
d(on)  
d(off)  
I
I
D
G
Current Sampling Resistors  
Fig 9bꢀ
 
Gate Charge Test Circuit  
Fig 10bꢀ
 
Switching Time Waveforms  
1000  
100  
10  
1
D = 0.50  
0.20  
0.10  
0.05  
P
DM  
0.02  
0.01  
t
1
t
2
Notes:  
1. Duty factor D =
 
t /
 
t  
SINGLE PULSE  
(THERMAL RESPONSE)  
1
2
2. Peak T
 
= P  
DM  
x Z  
+ T  
thJA  
A
J
A
0.1  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
t

1

, Rectangular Pulse Duration (sec)  
Fig 11ꢀ
 
Maximum Effective Transient Thermal Impedance, Junction-to-Ambient  
5

IRLL014NPbF  
80  
60  
40  
20  
0
I
D
TOP  
1.8A  
3.2A  
BOTTOM 4.0A  
15V  
DRIVER  
+
L
V
DS  
D.U.T  
R
G
V
DD  
–
I
A
AS  
10V  
Ω
0.01  
t
p
Fig 12aꢀ
 
Unclamped Inductive Test Circuit  
V
= 25V  
50  
DD  
A
150  
V
25  
75  
100  
125  
(BR)DSS  
Starting T
 
, Junction Temperature (°C)  
J
t
p
Fig 12cꢀ
 
Maximum Avalanche Energy  
Vsꢀ Drain Current  
I
AS  
Fig 12bꢀ
 
Unclamped Inductive Waveforms  
6

IRLL014NPbF  
Peak Diode Recovery dv/dt Test Circuit  
+
ƒ
–
Circuit Layout Considerations  
•
Low Stray Inductance  
•
Ground Plane  
•
Low Leakage Inductance  
Current Transformer  
DꢀUꢀT  
+
‚
–
„
–
+

R

G  

•
dv/dt controlled by R

G  

+
–
•
Driver same type as DꢀUꢀTꢀ  
•
I

SD

controlled by Duty Factor “D”  
•
DꢀUꢀTꢀ – Device Under Test  
V

DD  

Driver Gate Drive  
P.W.  
P
.
W.  
Period  
Period  
D =  
V
=10V  
*
GS  
D.U.
T
. I
 
W
aveform  
SD  
Reverse  
Recovery  
Current  
Body Diode Forward  
Current  
di/dt  
D.U.
T
. V
 
W
aveform  
DS  
Diode Recovery  
dv/dt  
V
DD  
Re-Applied  
Voltage  
Body Diode  
Forward Drop  
Inductor Curent  
I
SD  
Ripple
≤
5%  
*
V

GS

= 5V for Logic Level Devices  
Fig 13ꢀ
For N-Channel HEXFETS  
7

IRLL014NPbF  
SOT-223 (TO-261AA) Package Outline  
Dimensions are shown in milimeters (inches)  
SOT-223 (TO-261AA) Part Marking Information  
HEXFET PR
O
D
U
C
T MA
R
KING  
THIS IS
A
N
I
RFL014  
L
O
T CO
D
E  
P
A
R
T
N
U
M
B
ER  
IN
T
ER
N
A
T
I
O
NAL  
RE
C
T
IFIER  
L
O
GO  
FL
0
14  
314P  
AXXXX  
A=
A
S
SE
M
B
LY
 
SITE  
CODE  
DAT E
 
CODE  
(YYWW)  
YY =
 
Y
E
A
R  
WW =
 
W
E
EK  
B
O
T
T
O
M  
T
O
P  
P =
 
DE S IGNAT
E
S
 
LE
A
D-F
R
EE  
PR
O
D
U
C
T (O
P
TI
O
NA
L
)  
8

IRLL014NPbF  
SOT-223 (TO-261AA)
T
a
pe & Reel Information  
Dimensions are shown in milimeters (inches)  
4.10 (.161)  
3.90 (.154)  
0.35 (.013)  
0.25 (.010)  
1.85 (.072)  
1.65 (.065)  
2.05 (.080)  
1.95 (.077)  
TR  
7.55 (.297)  
7.45 (.294)  
16.30 (.641)  
15.70 (.619)  
7.60 (.299)  
7.40 (.292)  
1.60 (.062)  
1.50 (.059)  
TYP.  
FEED DIRECTION  
2.30 (.090)  
2.10 (.083)  
7.10 (.279)  
6.90 (.272)  
12.10 (.475)  
11.90 (.469)  
NOTES :  
1. CONTROLLING DIMENSION: MILLIMETER.  
2. OUTLINE CONFORMS TO EIA-481 & EIA-541.  
3. EACH O330.00 (13.00) REEL CONTAINS 2,500 DEVICES.  
13.20 (.519)  
12.80 (.504)  
15.40 (.607)  
11.90 (.469)  
4
330.00  
(13.000)  
MAX.  
50.00 (1.969)  
MIN.  
18.40 (.724)  
MAX.  
NOTES :  
1. OUTLINE
 
COMFORMS TO EIA-418-1.  
2. CONTROLLING
 
DIMENSION: MILLIMETER..  
3. DIMENSION
 
MEASURED @ HUB.  
4. INCLUDES
 
FLANGE DISTORTION @ OUTER EDGE.  
14.40 (.566)  
12.40 (.488)  
4
3
Data and specifications subject to change without notice.  
IR WORLD HEADQUARTERS:
233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
9