KIA-Semicon-Tech-KIA2808AH

Part #KIA-Semicon-Tech-KIA2808AH
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KIA-Semicon-Tech-KIA2808AH
150A
,
80V  
2808A  
N-CHANNEL MOSFET  
KIA  
SEMICONDUCTORS  
1
.
Features  
n
R

DS(on)

=4.0m
Ω
(
typ.
)
@ V

GS

=10V  
100% avalanche tested  
n
n
n
Reliable and rugged  
Lead free and green device available
(
RoHS Compliant
)  
2
.
Applications  
n
n
Switching application  
Power management for inverter systems  
3.Symbol  
Pin  
1
Function  
Gate  
2
Drain  
3
Source  
Drain  
4
1 of 6  
Rev 1.2 Nov. 2016  

150A
,
80V  
2808A  
N-CHANNEL MOSFET  
KIA  
SEMICONDUCTORS  
4.
Absolute maximum ratings  
(T

A

=25
°
C,unless otherwise noted)  
Rating  
Units  
Parameter  
Symbol  
TO-220/  
TO-263  
TO-247/  
TO-3P  
Drain-source voltage  
V

DSS  

V

GSS  

T

J  

80  
V
V
Gate-source voltage  
+25  
175  
Maximum junction temperature  
Storage temperature range  
Diode continuous forward current  
ºC  
ºC  
A
T

STG  

I

S  

-55 to175  
150  
T

C

=25ºC  
T

C

=25ºC  
T

C

=100ºC  
T

C

=25ºC  
L=0.5mH  
T

C

=25 ºC  
T

C

=100ºC  
150  
A
Continuous drain current  
I

D  

114  
A
Pulse drain current*  
I

DM  

660**  
1.1***  
A
Avalanche energy,single pulsed  
E

AS  

J
178  
89  
214  
107  
W
W
Maximum power dissipation  
P

D  

Note:* Repetitive
 
rating;pulse width limited by junction temperature  
** Drain current is limited by junction temperature  
***VD=64V  
5.
Thermal characteristics  
Parameter  
Symbol  
R

θ
JA  

Rating  
62.5  
0.7  
Unit  
Thermal resistance,Junction-ambient  
Thermal resistance,Junction-case  
ºC/W  
ºC/W  
R

θ
JC  

2 of 6  
Rev 1.3 Nov. 2016  

150A
,
80V  
2808A  
N-CHANNEL MOSFET  
KIA  
SEMICONDUCTORS  
6
.
Electrical characteristics  
(T

A

=25
°
C,unless otherwise noted)  
Parameter  
Symbol  
BV

DSS  

Test Conditions  
V

GS

=0V,I

DS

=250
μ
A  
V

DS

=80V, V

GS

=0V  
T

J

=85
°
C  
Min  
Typ  
Max  
Units  
Drain-source breakdown voltage  
80  
–
–
V
–
–
1
Zero gate voltage drain current  
I

DSS  

μ
A  
–
–
10  
4.0  
+100  
4.5  
–
Gate threshold voltage  
Gate leakage current  
Drain-source on-state resistance  
Gate resistance  
V

GS(th)  

I

GSS  

V

DS

=V

GS

, I

D

=250
μ
A  
V

GS

=+25V, V

DS

=0V  
V

GS

=10V,I

D

=85A  
V

DS

=0V, V

GS

=0V,f=1MHz  
I

SD

=85A, V

GS

=0V  
2.0  
3.0  
–
V
nA  
m
Ω  
Ω
–
–
–
–
*
R

DS(on)  

4.0  
1.8  
0.8  
R

g  

*
Diode forward voltage  
V

SD  

1.2  
V
Reverse recovery time  
Reverse recovery charge  
Input capacitance  
Output capacitance  
Reverse transfer capacitance  
Turn-on delay time  
Rise time  
t

rr  

Q

rr  

C

iss  

C

oss  

C

rss  

t

d(on)  

t

r  

–
–
–
–
–
–
–
–
–
–
–
–
30  
52  
–
–
nS  
nC  
I

SD

=85A ,  
dl

SD

/dt=100A/
μ
s  
6109  
995  
530  
28  
–
V

DS

=25V,V

GS

=0V,  
f=1MHz  
–
pF  
–
–
18  
–
V

DD

=40V, I

DS

=85A,  
ns  
R

G

=6
Ω
,V

GS

=10V  
Turn-off delay time  
Fall time  
t

d(off)  

t

f  

42  
–
54  
–
Total gate charge  
Gate-source charge  
Gate-drain charge  
Q

g  

152  
25  
–
V

DS

=64V, V

GS

=10V  
I

DS

=85A  
Q

gs  

Q

gd  

—  
—  
nC  
53  
Note*:Pulse test;pulse width<300us duty cycle<2%.  
3 of 6  
Rev 1.3 Nov. 2016  

150A
,
80V  
2808A  
N-CHANNEL MOSFET  
KIA  
SEMICONDUCTORS  
7
.
T
e
st circuits and waveforms  
4 of 6  
Rev 1.3 Nov. 2016  

150A
,
80V  
2808A  
N-CHANNEL MOSFET  
KIA  
SEMICONDUCTORS  
5 of 6  
Rev 1.3 Nov. 2016  

150A
,
80V  
2808A  
N-CHANNEL MOSFET  
KIA  
SEMICONDUCTORS  
6 of 6  
Rev 1.3 Nov. 2016