MDD-Microdiode-Electronics-MDD15N10D

Part #MDD-Microdiode-Electronics-MDD15N10D
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MDD-Microdiode-Electronics-MDD15N10D
MDD
15N10D  
100
V N-Channel Enhancement Mode MOSFET  
TO-252  
I

D
M
ax  

V

(BR)DSS  

R

DS(on)
Max  

@10V  
110
mΩ  
100
V
 
15
A  
@
120
mΩ
4.5
V  
2
1. Gate  
Features  
1
2. Drain  
3. Source  
● Trench Power
MV MOSFET technology  
●
Excellent package for heat dissipation  
●
High density cell design for low R

DS(ON)  

●
Moisture Sensitivity Level 1  
3
Application  
●
DC-DC Converters  
●
Epoxy Meets UL 94 V-0 Flammability Rating  
●
Halogen Free  
●
Power management functions  
Marking  
Equivale
n
t
C
ircuit  
XXX: Date Code  
MDD  
15N10D  
XXX  
Absolute Maximum Ratings (T

A

=25
℃
unless otherwise noted)  
Parameter  
Symbol  
Value  
Unit  
Drain-Source Voltage  
Gate-Source Voltage  
Continuous Drain Current  
V

DS  

100  
V
V

GS  

I

D  

±20  
15  
60  
9
V
A
Pulsed Drain Current (Note
1
)  
Avalanche Energy  
I

DM  

A
Single Pulsed (Note
2
)  
E

AS  

P

D  

mJ  
W
Power Dissipation  
28  
4.4  
R

θJC  

℃
/
W  
Thermal Resistance Junction-to-Case
(Note 3)  
Junction
T
e
mperature  
T

J  

150  
℃
℃
T

stg  

Storage
T
e
mperature  
-50 ~+150  
1.
Pulse Test: Pulse Width≤300us,Duty cycle ≤2%.  
2.
Tj=25
℃
, VDD=
50
V, VG=10V, L=0.5mH, IAS=
6
A  
Notes:  
3.
R

θJA

is the sum of the junction-to-case and case-to-ambient thermal resistance, where the case thermal reference is  
defined as the solder mounting surface of the drain pins. R

θJC

is guaranteed by design, while R

θJA

is determined by the  
board design. The maximum rating presented here is based on mounting on a 1 in 2
 
pad of 2oz copper.  
1
/
6
 
V 1.0  

MDD
15N10D  
100
V N-Channel Enhancement Mode MOSFET  
Ta = 25
℃
unless otherwise specified  
Symbol  
V

(BR)DSS  

Parameter  
Condition  
Min  
Typ  
Max  
Unit  
Drain-Source Breakdown Voltage  
V

GS

=0
V
,
I

D

=250μA  
100  
—  
—  
V
V

D
S

=
100
V
,
V

G
S

=0V  
V

G
S

=
±
2
0
V
,
V

D
S

=0V  
V

DS

=V

GS

,
I

D

=250μA  
V

GS

=10
V
,
I

D

=
10
A  
V

GS

=
4.5
V
,
I

D

=
8
A  
I

D
SS  

Drain-Source Leakage Current  
Gate-Source Leakage Current  
Gate Threshold Voltage  
1
—  
—  
—  
—  
u
A  
n
A  
V
±
100  
2.5  
I

G
SS  

1.8  
95  
100  
V

GS(TH)  

1.1  
—  
110  
m
Ω  
m
Ω  
R

DS(ON)  

Drain-Source On-State Resistance  
—  
120  
Dynamic Electrical Characteristics  
Symbol  
Parameter  
Condition  
Min  
Typ  
Max  
Unit  
—  
C

iss  

Input Capacitance  
Output Capacitance  
—  
1070  
pF  
V

DS

=
50
V  
V

GS

=0V  
f
=1MHz  
C

oss  

C

rss  

Q

g  

—  
—  
—  
—  
—  
33  
30  
—  
—  
—  
—  
—  
pF  
pF  
nC  
nC  
nC  
Reverse Transfer Capacitance  
T
o
tal Gate Charge  
26  
V

DS

=
50
V,  
V
GS
=1
0
V,  
I
D
=
10
A  
Q

gs  

Q

gd  

Gate Source Charge  
Gate Drain Charge  
5.4  
5.8  
(Note1,2)  
Switching Characteristics  
Symbol  
Parameter  
Condition  
Min  
Typ  
Max  
Unit  
—  
7
—  
ns  
t

d(on)  

Turn on Delay Time  
V
DS
=
50
V,  
V
GS
=
10
V,  
R
G
=
3
Ω  
—  
—  
—  
24  
24  
31  
—  
—  
—  
ns  
ns  
ns  
t

r  

Turn on Rise Time  
Turn Off Delay Time  
Turn Off Fall Time  
t

d(off)  

t

f  

(Note1,2)  
Source Drain Diode Characteristics  
Symbol  
I

SD  

Parameter  
Source drain current(Body Diode)  
Pulsed Current  
Condition  
Min  
—  
Typ  
—  
Max  
15  
60  
1.2  
—  
Unit  
A
I

S
M  

V

SD  

t

rr  

—  
—  
A
I

S

=
15
A,
V

GS

=0V  
0.8  
40  
Drain-Source Diode Forward Voltage  
—  
—  
—  
V
Body Diode Reverse Recovery Time  
ns  
I
F
=
10
A,  
dI/dt=100A/µs  
30.1  
Body Diode Reverse Recovery Charge  
—  
n
C  
Q

rr  

Notes:  
1.
Pulse test ; Pulse width
 
300
u
s, duty cycle
 
2%.  
2.
Essentially independent of operating temperature.  
2 /
6
 
V 1.0  

MDD
15N10D  
100
V N-Channel Enhancement Mode MOSFET  
■
Typical Performance Characteristics  
Figure 1. Output Characteristics  
Figure 2. Transfer Characteristics  
Figure 3. On-Resistance vs. Drain Current  
and Gate Voltage  
Figure 4. On-Resistance vs. Junction Temperature  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge  
3
/
6
 

MDD
15N10D  
100
V N-Channel Enhancement Mode MOSFET  
20  
15  
10  
5
0
-50  
0
50  
100  
150  
Tc
-Case Temperature
 
(
℃
)  
Figure 8. Maximum Continuous Drain Current  
vs Case Temperature  
Figure 7. Safe Operation Area  
Figure 9. Normalized Maximum Transient Thermal Impedance  
4
/
6
 

MDD
15N10D  
100
V N-Channel Enhancement Mode MOSFET  
Resistive Switching Test Circuit & Waveforms  
Diode Recovery Test Circuit & Waveforms  
Gate Charge Test Circuit & Waveform  
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms  
5
/
6
 
V 1.0  

MDD
15N10D  
100
V N-Channel Enhancement Mode MOSFET  
Outlitne
Drawing  
TO-252 Package Outline Dimensions  
Suggested Pad Layout  
Note:  
1
.
Controlling dimension:in/millimeters.  
2.General tolerance: ±0.05mm.  
3.The pad layout is for reference purposes only.  
6
/
6  
V 1.0