Microchip-Tech-ATBTLC1000A-UU-T

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Microchip-Tech-ATBTLC1000A-UU-T
ATBTLC1000 WLCSP SoC  
Ultra Low Power BLE 4.1 SoC  
DATASHEET  
Description  
The Atmel

®

ATBTLC1000 is an ultra-low power Bluetooth

®

SMART (BLE 4.1) System  
on a Chip with Integrated MCU, Transceiver, Modem, MAC, PA, TR Switch, and  
Power Management Unit (PMU). It can be used as a Bluetooth Low Energy link  
controller or data pump with external host MCU or as a standalone applications  
processor with embedded BLE connectivity and external memory.  
The qualified Bluetooth Smart protocol stack is stored in dedicated ROM. The  
firmware includes L2CAP service layer protocols, Security Manager, Attribute  
protocol (ATT), Generic Attribute Profile (GATT), and the Generic Access Profile  
(GAP). Additionally, application profiles such as Proximity, Thermometer, Heart Rate,  
Blood Pressure, and many others are supported and included in the protocol stack.  
Features  
Complies with Bluetooth V4.1, ETSI EN 300 328 and EN 300 440 Class 2, FCC  
CFR47 Part 15 and ARIB STD-T66  
2.4GHz transceiver and modem  
–
-95dBm/-93dBm programmable receiver sensitivity  
–
-20 to +3.5dBm programmable TX output power  
–
Integrated T/R switch  
–
Single wire antenna connection  
ARM

®

Cortex

®

-M0 32-bit processor  
–
Single wire Debug (SWD) interface  
–
Four-channel DMA controller  
–
Brownout detector and Power On Reset  
–
Watch Dog Timer  
Memory  
–
128kB embedded RAM (96kB available for application)  
–
128kB embedded ROM  
Hardware Security Accelerators  
–
AES-128  
–
SHA-256  
Peripherals  
–
10 digital and one wakeup GPIOs with 96k
Ω
internal pull-up resistors, one Mixed  
Signal GPIO  
–
2x SPI Master/Slave  
–
2x I

2

C Master/Slave and 1x I

2

C Slave  
–
2x UART  
–
1x SPI Flash  
–
Three-Axis quadrature decoder  
–
4x Pulse Width Modulation (PWM), three General Purpose Timers, and one  
Wakeup Timer  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  

–
1-channel 11-bit ADC  
Clock  
–
Integrated 26MHz RC oscillator  
–
26MHz crystal oscillator  
–
Integrated 2MHz sleep RC oscillator  
–
32.768kHz RTC crystal oscillator  
Ultra-low power  
–
1.1µA sleep current (8KB RAM retention and RTC running)  
–
3.0mA peak TX current (0dBm, 3.6V)  
–
4.0mA peak RX current (3.6V, -93dBm sensitivity)  
–
9.7µA average advertisement current (three channels, 1s interval)  
Integrated Power management  
–
1.8 to 4.3V battery voltage range  
–
Fully integrated Buck DC/DC converter  
Bluetooth SIG Certification  
–
QD ID Controller (see declaration

–
QD ID Host (see declaration

2
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  

Table of Contents  

10.2 I

C Master/Slave Interface …………………………………………………………………………………………………..

3
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  

4
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  

1
2
Ordering Information  
Ordering code  
Package  
31L WLCSP  
Description  
ATBTLC1000 Tape and Reel  
ATBTLC1000A-UU-T  
Package Information  
Table 2-1.  
ATBTLC1000 31L WLCSP Package Information  
Parameter  
Value  
2.262 × 2.142  
0.502  
Tolerance  
±0.03  
Units  
Package size  
Total thickness  
I/O pitch  
±0.039  
mm  
0.35  
Ball diameter  
Ball count  
0.2  
±0.03  
31  
3
Block Diagram  
Figure 3-1.  
ATBTLC1000 Block Diagram  
5
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  

4
Pinout Information  
The ATBTLC1000 is offered in a 0.35mm-pitch staggered SAC405 balls 31L WLCSP package. The WLCSP  
package pin assignment is shown i

The color shading is used to indicate the pin type as follows:  
Red
–
analog  
Green
–
digital I/O (switchable power domain)  
Blue
–
digital I/O (always-on power domain)  
Yellow
–
digital power, purple
–
PMU  
Green/red
–
configurable mixed-signal GPIO (digital/analog)  
The ATBTLC1000 pins are described in

Figure 4-1.
 
ATBTLC1000 WLCSP Pin Assignment  
6
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 

Table 4-1.  
ATBTLC1000 WLCSP Pin Description  
Pin #  
A2  
A4  
A6  
B1  
B3  
B5  
B7  
C2  
C4  
C6  
D1  
D3  
D5  
D7  
E2  
E4  
E6  
F1  
Pin Name  
Pin Type  
Digital Power  
Analog/RF  
Analog/RF  
Digital I/O  
Digital Power  
Analog/RF  
Analog/RF  
PMU  
Description / Default Function  
I/O Supply, can be less than or equal to VBATT_BUCK  
XO Crystal +  
VDDIO  
XO_P  
VDD_VCO & VDD_SXDIG  
AO_GPIO_0  
VDDIO_SWITCH  
XO_N  
Synthesizer VCO and Digital Supplies 1.2V  
Always-on External Wakeup  
I/O supply switch for external flash  
XO Crystal –  
RFIO  
RX input and TX output  
RTC_CLK_P  
TPP  
RTC terminal + / 32.768kHz XTAL +  
Test MUX + output  
Analog/RF  
Analog/RF  
PMU  
VDD_RF  
RF Supply 1.2V  
RTC_CLK_N  
LP_GPIO_13  
LP_GPIO_0  
RFGND  
RTC terminal
–
/ 32.768kHz XTAL –  
SPI MISO/SPI FLASH RXD  
SWD Clock  
Digital I/O  
Digital I/O  
Analog/RF  
PMU  
RF Ground  
CHIP_EN  
Master Enable for chip  
VSS  
Digital Power  
Analog/RF  
PMU  
Digital I/O and Core Ground  
AMS Supply 1.2V  
VDD_AMS  
LP_LDO_OUT_1P2  
GPIO_MS1  
Low Power LDO output (connect to 1µF decoupling cap)  
F3  
Mixed Signal I/O  
Configurable to be a GPIO Mixed Signal only (ADC inter-  
face)  
F5  
F7  
G2  
G4  
G6  
H1  
H3  
H5  
H7  
J2  
LP_GPIO_11  
LP_GPIO_1  
VBATT_BUCK  
LP_GPIO_12  
LP_GPIO_2  
VDDC_PD4  
GND_BUCK  
LP_GPIO_9  
LP_GPIO_3  
VSW  
Digital I/O  
Digital I/O  
PMU  
SPI MOSI/SPI FLASH TXD  
SWD I/O  
DC/DC Converter Supply and General Battery Connection  
SPI SSN/SPI FLASH SSN  
Digital I/O  
Digital I/O  
PMU  
UART RXD  
DC/DC Converter 1.2V output and feedback node  
DC/DC Converter Ground  
PMU  
Digital I/O  
Digital I/O  
PMU  
I

2

C SCL (high-drive pad, see

UART TXD  
DC/DC Converter Switching Node  
SPI SCK/SPI FLASH SCK  
J4  
LP_GPIO_10  
LP_GPIO_8  
Digital I/O  
Digital I/O  
J6  
I

2

C SDA (high-drive pad, see

7
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 

5
Package Drawing  
The ATBTLC1000 WLCSP package is RoHS/green compliant.  
Figure 5-1.  
ATBTLC1000 31L WLCSP Package Outline Drawing  
8
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  

6
Power Management  
6.1  
Power Architecture  
ATBTLC1000 uses an innovative power architecture to eliminate the need for external regulators and reduce the  
number of off-chip components. The integrated power management block includes a DC/DC buck converter and  
separate Low Drop out (LDO) regulators for different power domains. The DC/DC buck converter converts battery  
voltage to a lower internal voltage for the different circuit blocks and does this with high efficiency. The DC/DC  
requires three external components for proper operation (two inductors L 4.7µH and 9.1nH, and one capacitor C  
4.7µF).  
Figure 6-1.  
ATBTLC1000 Power Architecture  
RF/AMS  
VDD_VCO  
LDO2  
1.0V  
SX  
~
VDD_AMS,  
VDD_RF,  
VDD_SXDIG  
RF/AMS Core  
D
i
gital  
VDDIO  
Pads  
Digital Core  
e
F
u
se  
dcdc_e
n
a  
PMU  
Digital Core Voltage  
2.5V  
Sleep  
Osc  
EFuse  
LDO  
Dig Core  
LDO  
e
n
a  
LP LDO  
e
n
a  
CHIP_EN  
VDDC_PD4  
VSW  
e
n
a  
DC/DC Converter  
VBATT_BUCK  
Off-Chip  
LC  
V
i
n  
V
o
ut  
9
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  

6.2  
DC/DC Converter  
The DC/DC Converter is intended to supply current to the BLE digital core and the RF transceiver core. The  
DC/DC consists of a power switch, 26MHz RC oscillator, controller, external inductor, and external capacitor. The  
DC/DC is utilizing pulse skipping discontinuous mode as its control scheme. The DC/DC specifications are shown  
in the following tables and figures.  
Table 6-1.  
DC/DC Converter Specifications (Performance is Guaranteed for (L) 4.7µH and (C) 4.7µF  
Parameter  
Symbol  
Min.  
Typ.  
Max.  
Unit  
Note  
Dependent on external component values  
and DC/DC settings with acceptable effi-  
ciency  
Output current capability  
I

REG  

0
10  
30  
mA  
4.7  
-10%  
External capacitor range  
External inductor range  
C

EXT  

4.7  
4.7  
20  
µF  
µH  
External capacitance range  
External inductance range  
2.2  
-10%  
4.7  
+10%  
L

EXT  

Battery voltage  
V

BAT  

V

REG  

I

DD  

2.35  
1.05  
3
4.3  
Functionality and stability given  
25mV step size  
V
Output voltage range  
Current consumption  
1.2  
125  
1.47  
µA  
µs  
DC/DC quiescent current  
Dependent on external component values  
and DC/DC settings  
Startup time  
t

startup  

50  
5
600  
30  
Dependent on external component values  
and DC/DC settings  
Voltage ripple  
ΔV

REG  

10  
mV  
%
Efficiency  
η
85  
0
Measured at 3V VBAT, at load of 10mA  
No overshoot, no output pre-charge  
From 1.8 to 4.3V  
Overshoot at startup  
Line Regulation  
Load regulation  
V

OS  

ΔV

REG  

ΔV

REG  

10  
5
mV  
From 0 to 10mA  
Table 6-2.  
DC/DC Converter Allowable Onboard Inductor and Capacitor Values (VBAT = 3V)  
Vripple [mV]  
Inductor [µH]  
Efficiency [%]  
RX Sensitivity

(1)

[dBm]  
C=2.2µF C=4.7µF
 
C=10µF  
2.2  
4.7  
83  
85  
N/A  
9
<5  
5
<5  
<5  
~1.5 dB degrade  
~0.7 dB degrade  
Note:  
1. Degradation
 
relative to design powered by external LDO and DC/DC disabled.  
10  
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 
 

Figure 6-2.  
DC/DC Converter Efficiency  
Efficiency vs. Battery Voltage  
95.0  
90.0  
85.0  
80.0  
75.0  
70.0  
2
2.2  
2.4  
2.6  
2.8  
3
3.2  
3.4  
3.6  
3.8  
4
4.3  
Battery Voltage (V)  
Efficiency vs. Load Current  
86.0  
85.0  
84.0  
83.0  
82.0  
81.0  
80.0  
79.0  
78.0  
77.0  
3
4
5
6
7
8
9
10  
11  
12  
13  
14  
15  
Load Current (mA)  
6.3  
Power Consumption  
6.3.1 Description
 
of Device States  
ATBTLC1000 has multiple device states, depending on the state of the ARM processor and BLE subsystem.  
Note: The
 
ARM is required to be powered on if the BLE subsystem is active.  
BLE_On_Transmit
–
Device is actively transmitting a BLE signal (Application may or may not be active)  
BLE_On_Receive
–
Device is actively receiving a BLE signal (Application may or may not be active)  
MCU_Only
–
Device has ARM processor powered on and BLE subsystem powered down  
Ultra_Low_Power
–
BLE is powered down and Application is powered down (with or without RAM retention)  
Power_Down
–
Device core supply off  
11  
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  

6.3.2 Controlling
 
the Device States  
The following pins are used to switch between the main device states:  
CHIP_EN
–
used to enable PMU  
VDDIO
–
I/O supply voltage from external supply  
In Power_Down state, VDDIO is on and CHIP_EN is low (at GND level). To switch between Power_Down state  
and MCU_Only state CHIP_EN has to change between low and high (VDDIO voltage level). Once the device is  
MCU_Only state, all other state transitions are controlled entirely by software. When VDDIO is off and CHIP_EN is  
low, the chip is powered off with no leakage.  
When no power is supplied to the device (the DC/DC Converter output and VDDIO are both off and at ground  
potential), a voltage cannot be applied to the ATBTLC1000 pins because each pin contains an ESD diode from the  
pin to supply. This diode will turn on when voltage higher than one diode-drop is supplied to the pin.  
If a voltage must be applied to the signal pads while the chip is in a low power state, the VDDIO supply must be  
on, so the Power_Down state must be used. Similarly, to prevent the pin-to-ground diode from turning on, do not  
apply a voltage that is more than one diode-drop below ground to any pin.  
6.3.3 Current
 
Consumption in Various Device States  
Table 6-3.  
ATBTLC1000 Device Current Consumption at VBAT = 3.6V  
I

VBAT (typical)  

(note 3)  
I

VDDIO (typical)  

Device state  
CHIP_EN  
VDDIO  
Remark  
(note 3)  
Power_Down  
Off  
On  
On  
On  
<50nA  
900nA  
<50nA  
50nA  
Ultra_Low_Power Standby  
Ultra_Low_Power with 8KB retention, BLE  
timer, no RTC

(1)  

On  
On  
On  
On  
1.1µA  
0.2µA  
0.1uA  
Ultra_Low_Power with 8KB retention, BLE  
timer, with RTC

(2)  

1.25µA  
.85mA  
MCU_Only, idle (waiting for interrupt)  
BLE_On_Receive@-95dBm  
On  
On  
On  
On  
0.2µA  
0.2µA  
4.2mA  
3.0mA  
4.0mA  
BLE_On_Transmit, 0dBm output power  
BLE_On_Transmit, 3.5dBm output power  
On  
On  
On  
On  
0.2µA  
0.2µA  
Notes: 1. Sleep
 
clock derived from internal 32kHz RC oscillator.  
2. Sleep
 
clock derived from external 32.768kHz crystal specified for CL = 7pF, using the default on-chip capacitance  
only, without using external capacitance.  
3. Expected
 
values for production silicon.  
12  
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 

Figure 6-3.  
ATBTLC1000 Average Advertising Current  
Notes: 1.
 
The Average advertising current is measured at VBAT = 3.6V, TX POUT=0dBm.  
6.4  
Power Sequences  
The power sequences for ATBTLC1000 is shown in

The timing parameters are provided  
Figure 6-4.  
ATBTLC1000 Power Sequences  
VBATT  
t

A  

t

A’  

VDDIO  
t

B  

t

B’  

CHIP_EN  
t

C  

XO Clock  
13  
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 
 

Table 6-4.  
ATBTLC1000 Sequence Timings  
Parameter Min. Max.  
Units  
Description  
Notes  
VBATT and VDDIO can rise simultaneously  
or can be tied together  
t

A  

t

B  

t

C  

0
0
VBATT rise to VDDIO rise  
ms  
CHIP_EN must not rise before VDDIO.  
CHIP_EN must be driven high or low, not left  
floating.  
VDDIO rise to CHIP_EN rise  
CHIP_EN rise to 31.25kHz  
(2MHz/64) oscillator stabilizing  
10  
0
µs  
CHIP_EN must fall before VDDIO. CHIP_EN  
must be driven high or low, not left floating.  
1
t

A  

CHIP_EN fall to VDDIO fall  
VDDIO fall to VBATT fall  
ms  
VBATT and VDDIO can fall simultaneously or  
be tied together  
1
t

B  

0
6.5  
Power on Reset and Brown out Detector  
The ATBTLC1000 has a Power on Reset (POR) circuit for proper system power bring up and a brown out detector  
to reset the system’s operation when a drop in battery voltage is detected.  
POR is a power on reset circuit that outputs a HI logic value when the VBATT_BUCK is below a voltage  
threshold. The POR output becomes a LO logic value when the VBATT_BUCK is above a voltage threshold.  
Brown out Detector (BOD) is a brown out detector that outputs a HI logic value when the bandgap reference  
(BGR) voltage falls below a programmable voltage threshold. When the bandgap voltage reference voltage  
level is restored above a voltage threshold, the BOD output becomes a LO logic value.  
The counter creates a pulse that holds the chip in reset for 256*(64*T_2MHz) ~ 8.2ms  

Figure 6-5

and

illustrate the system block diagram and timing.  
Figure 6-5.
 
ATBTLC1000 POR and BOD Block Diagram  
14  
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 
 
 

Figure 6-6.  
ATBTLC1000 POR and BOD Timing Sequence  
Table 6-5.  
ATBTLC1000 BOD Thresholds  
Parameter  
Min.  
Typ.  
1.80V  
Max.  
Comment  
BOD threshold  
1.73V  
1.92V  
BOD threshold temperature coefficient  
BOD current consumption  
t

POR  

-1.09mV/C  
300nA  
8.2ms  
15  
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 
 

7
Clocking  
7.1  
Overview  
Figure 7-1.  
ATBTLC1000 Clock Architecture  
26 MHz  
52 MHz  
26 MHz  
XO  
×2  
BLE Clock  
ARM Clock  
26 MHz  
26 MHz  
2 MHz  
ARM  
Clock  
Control  
26 MHz  
RC Osc  
2 MHz  
RC Osc  
2 MHz  
Low  
Power  
Clock  
31.25 kHz  
÷64  
Low Power  
Clock  
Control  
32.768 kHz  
32.768 kHz  
RTC XO  

Figure 7-1

provides an overview of the clock tree and clock management blocks.  
The BLE Clock is used to drive the BLE subsystem. The ARM clock is used to drive the Cortex-M0 MCU and its  
interfaces (UART, SPI, and I

2

C), the nominal MCU clock speed is 26MHz. The Low Power Clock is used to drive  
all the low power applications like BLE sleep timer, always-on power sequencer, always-on timer, and others.  
The 26MHz Crystal Oscillator (XO) must be used for the BLE operations or in the event a very accurate clock is  
required for the ARM subsystem operations.  
The 26MHz integrated RC Oscillator is used for most general purpose operations on the MCU and its peripherals.  
In cases when the BLE subsystem is not used, the RC oscillator can be used for lower power consumption. The  
frequency variation of this RC oscillator is up to ±50% over process, voltage, and temperature.  
The 2MHz integrated RC Oscillator can be used as the Low Power Clock for applications that require fast wakeup  
of the ARM or for generating a ~31.25kHz clock for slower wakeup but lowest power in sleep mode. This 2MHz  
oscillator can also be used as the ARM Clock for low-power applications where the MCU needs to remain on but  
run at a reduced clock speed. The frequency variation of this RC oscillator is up to ±50% over process, voltage,  
and temperature.  
The 32.768kHz RTC Crystal Oscillator (RTC XO) is recommended to be used for BLE operations (although  
optional) as it will reduce power consumption by providing the best timing for wakeup precision, allowing circuits to  
be in low power sleep mode for as long as possible until they need to wake up and connect during the BLE  
connection event. The ~31.25kHz clock derived from the 2MHz integrated RC Oscillator can be used instead of  
RTC XO but it has low accuracy over process, voltage and temperature variations (up to ±50%) and thus needs to  
be frequently calibrated to within ±500ppm if the RC oscillator is used for BLE timing during a connection event.  
Because this clock is less accurate than RTC XO, it will require waking up earlier to prepare for a connection event  
16  
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 
 

and this will increase the average power consumption. Calibration of the RC Oscillator is described in the  
application note.  
7.2  
26MHz Crystal Oscillator (XO)  
Table 7-1.  
ATBTLC1000 26MHz Crystal Oscillator Parameters  
Parameter  
Min.  
Typ.  
26  
Max.  
N/A  
150  
50  
Units  
MHz  
Ω
Crystal Resonant Frequency  
Crystal Equivalent Series Resistance  
Stability – Initial Offset

(1)  

N/A  
50  
-50  
-40  
ppm  
Stability – Temperature and Aging  
40  
Note:  
1. Initial
 
offset must be calibrated to maintain ±25ppm in all operating conditions. This calibration is performed during  
final production testing and calibration offset values are stored in eFuse. More details are provided in the  
calibration application note.  
The block diagram i

(a) shows how the internal Crystal Oscillator (XO) is connected to the external  
crystal.  
The XO has up to 10pF internal capacitance on each terminal XO_P and XO_N (programmable in steps of  
1.25pF). To bypass the crystal oscillator, an external Signal capable of driving 10pF can be applied to the XO_P  
terminal as shown i

(b).  
The needed external bypass capacitors depend on the chosen crystal characteristics. Refer to the datasheet of the  
preferred crystal and take into account the on chip capacitance.  
When bypassing XO_P from an external clock, XO_N is required to be floating.  
It is recommended that only crystals specified for CL=8pF be used in customer designs since this affects the  
sleep/wake up timing of the device. CL other than 8pF may require upgraded firmware and device re-  
characterization.  
Figure 7-2.  
ATBTLC1000 Connections to XO  
(a) Crystal oscillator is used  
(b) Crystal oscillator is bypassed  
17  
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 
 

Table 7-2.  
ATBTLC1000 26MHz XTAL C_onchip Programming  
Register  
Cl_onchip  
1.00  
[pF]  
rx_xo_regs[7,6,15] = 000  
rx_xo_regs[7,6,15] = 001  
rx_xo_regs[7,6,15] = 010  
rx_xo_regs[7,6,15] = 011  
rx_xo_regs[7,6,15] = 100  
rx_xo_regs[7,6,15] = 101  
rx_xo_regs[7,6,15] = 110  
rx_xo_regs[7,6,15] = 111  
2.25  
3.50  
4.75  
6.00  
7.25  
8.50  
9.75  
If rx_reg7[1] = 1 add 5pF to above value  

Table 7-3

specifies the electrical and performance requirements for the external clock.  
Table 7-3.
 
ATBTLC1000 XO Bypass Clock Specification  
Parameter  
Min.  
26  
Max.  
26  
Unit  
MHz  
V

pp  

Comments  
Oscillation frequency  
Voltage swing  
Must be able to drive 5pF load @ desired frequency  
0.75  
-25  
1.2  
Stability
–
Temperature and Aging  
Phase Noise  
+25  
ppm  
-130  
<1psec  
dBc/Hz At
 
10kHz offset  
Jitter (RMS)  
Based on integrated phase noise spectrum from  
1kHz to 1MHz  
7.3  
32.768kHz RTC Crystal Oscillator (RTC XO)  
7.3.1 General
 
Information  
ATBTLC1000 has a 32.768kHz RTC oscillator that is preferably used for BLE activities involving connection  
events. To be compliant with the BLE specifications for connection events, the frequency accuracy of this clock  
has to be within ±500ppm. Because of the high accuracy of the 32.768kHz crystal oscillator clock, the power  
consumption can be minimized by leaving radio circuits in low-power sleep mode for as long as possible until they  
need to wake up for the next connection timed event.  
The block diagram i

a) shows how the internal low frequency Crystal Oscillator (XO) is connected to  
the external crystal.  
The RTC XO has a programmable internal capacitance with a maximum of 15pF on each terminal, RTC_CLK_P  
and RTC_CLK_N. When bypassing the crystal oscillator with an external signal, one can program down the  
internal capacitance to its minimum value (~1pF) for easier driving capability. The driving signal can be applied to  
the RTC_CLK_P terminal as shown i

(b).  
The need for external bypass capacitors depends on the chosen crystal characteristics. Refer to the datasheet of  
the preferred crystal and take into account the on-chip capacitance.  
When bypassing RTC_CLK_P from an external clock, RTC_CLK_N is required to be floating.  
18  
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 
 

Figure 7-3.  
ATBTLC1000 Connections to RTC XO  
(a) Crystal oscillator is used  
Table 7-4.
 
32.768kHz XTAL C_onchip Programming  
Register: pierce_cap_ctrl[3:0]  
(b) Crystal oscillator is bypassed  
Cl_onchip  
0.0  
[pF]  
0000  
0001  
0010  
0011  
0100  
0101  
0110  
0111  
1000  
1001  
1010  
1011  
1100  
1101  
1110  
1111  
1.0  
2.0  
3.0  
4.0  
5.0  
6.0  
7.0  
8.0  
9.0  
10.0  
11.0  
12.0  
13.0  
14.0  
15.0  
19  
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Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 

7.3.2 RTC
 
XO Design and Interface Specification  
The RTC consists of two main blocks: The Programmable Gm stage and tuning capacitors. The programmable  
Gm stage is used to maintain a phase shift of 360°C with the motional arm and keep total negative resistance to  
sustain oscillation. Tuning capacitors are used to adjust the XO center frequency and control the XO precision for  
different crystal models. The output of the XO is driven to the digital domain via a digital buffer stage with supply  
voltage of 1.2V.  
Table 7-5.  
RTC XO Interface  
Pin name  
Function  
Register default  
Digital Control Pins  
Control feedback resistance value:  
Pierce_res_ctrl  
0 = 20M
Ω
Feedback resistance  
1 = 30M
Ω
Feedback resistance  
0X4000F404<15>=’1’  
Control the internal tuning capacitors with step of 700fF:  
0000=700fF  
Pierce_cap_ctrl<3:0>  
0X4000F404<23:20>
=”1000”  
1111=11.2pF  
Refer to crystal datasheet to check for optimum tuning cap  
value  
Controls the Gm stage gain for different crystal mode:  
0011= for crystal with shunt cap of 1.2pF  
1000= for crystal with shunt cap >3pF  
Pierce_gm_ctrl<3:0>  
VDD_XO  
0X4000F404<19:16>=”1000”  
Supply Pins  
1.2V  
7.3.3 RTC
 
Characterization with Gm Code Variation at Supply 1.2V and Temp. = 25°C  
This section shows the RTC total drawn current and the XO accuracy versus different tuning capacitors and  
different GM codes, at supply voltage of 1.2V and temp. = 25°C.  
Figure 7-4.  
RTC Drawn Current vs. Tuning Caps at 25°C  
600  
500  
400  
300  
200  
100  
0
gm code=1  
gm code=2  
gm code=4  
gm code=8  
gm code=12  
gm code=16  
0
5
10  
15  
20  
Tuning Caps in pF  
20  
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  

Figure 7-5.  
RTC Oscillation Frequency Deviation vs. Tuning Caps at 25°C  
450  
400  
350  
300  
250  
200  
150  
100  
50  
gm code=1  
gm code=2  
gm code=4  
gm code=8  
gm code=12  
gm code=16  
0
0
2
4
6
8
10  
12  
14  
16  
18  
Tuning Caps  
7.3.4 RTC
 
Characterization with Supply Variation and Temp. = 25°C  
Figure 7-6.  
1400  
RTC Drawn Current vs. Supply Variation  
1200  
1000  
800  
600  
400  
200  
0
gm code=0 &  
Tuning Cap=8pF  
gm code=0 &  
Tuning Cap=0pF  
gm code=16 &  
Tuning Cap=16pF  
gm code=16 &  
Tuning Cap =0pF  
0.9  
1
1.1  
1.2  
1.3  
1.4  
1.5  
Supply voltage  
21  
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  

Figure 7-7.  
400  
RTC Frequency Deviation vs. Supply Voltage  
350  
300  
250  
200  
150  
100  
50  
gm code=0 & Tuning  
Cap=8pF  
gm code=0 & Tuning  
Cap=0pF  
gm code=16 & Tuning  
Cap=16pF  
gm code=16 & Tuning Cap=0  
0
0.9  
1
1.1  
1.2  
1.3  
1.4  
1.5  
Supply Voltage  
7.4  
2MHz and 26MHz Integrated RC Oscillators  
The 2MHz integrated RC Oscillator circuit without calibration has a frequency variation of 50% over process,  
temperature, and voltage variation. The ~31.25kHz clock is derived from the 2MHz clock by dividing by 64 and  
provides for lowest sleep power mode with a real-time clock running. As described above, calibration over process,  
temperature, and voltage are required to maintain the accuracy of this clock.  
Figure 7-8.  
32kHz RC Oscillator PPM Variation vs. Calibration Time at Room Temperature  
22  
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Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 

Figure 7-9.  
32kHz RC Oscillator Frequency Variation over Temperature  
The 26MHz integrated RC Oscillator circuit has a frequency variation of 50% over process, temperature, and  
voltage variation.  
23  
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Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  

8
CPU and Memory Subsystem  
8.1  
ARM Subsystem  
ATBTLC1000 has an ARM Cortex-M0 32-bit processor. It is responsible for controlling the BLE Subsystem and  
handling all application features.  
The Cortex-M0 Microcontroller consists of a full 32-bit processor capable of addressing 4GB of memory. It has a  
RISC-like load/store instruction set and internal 3-stage Pipeline Von Neumann architecture.  
The Cortex-M0 processor provides a single system-level interface using AMBA technology to provide high speed,  
low latency memory accesses.  
The Cortex-M0 processor implements a complete hardware debug solution, with four hardware breakpoint and two  
watch point options. This provides high system visibility of the processor, memory, and peripherals through a 2-pin  
Serial Wire Debug (SWD) port that is ideal for microcontrollers and other small package devices.  
Figure 8-1.  
ATBTLC1000 ARM Cortex-M0 Subsystem  
BLE  
Retention  
Ahb_to_sram  
PD1  
ROM  
Ahb_to_rom  
Ahb_to_sram  
Ahb_to_sram  
Timer  
IDRAM1  
IDRAM2  
DualTimer  
AHB  
Slave  
AHB  
GPIO Ctrl x3  
System Level AHB Slave  
System Regs  
Watch Dog  
Timer x2  
Master  
SPI x2  
I2C x2  
Security Cores  
DMA Controller  
UART x2  
System Level  
AHB Master  
Nested Vector  
IRQ Ctrl  
SPI Flash Ctrl  
Control Registers  
EFUSE Registers  
LP Clock Calibration  
AON Sleep Timer  
LP  
CORTEX  
M0  
AON Power  
Sequencer  
8.1.1 Features  
The processor features and benefits are:  
Tight integration with the system peripherals to reduce area and development costs  
Thumb instruction set combines high code density with 32-bit performance  
Integrated sleep modes using a Wakeup Interrupt Controller for low power consumption  
Deterministic, high-performance interrupt handling via Nested Vector Interrupt Controller for time-critical  
applications  
Serial Wire Debug reduces the number of pins required for debugging  
DMA engine for Peripheral-to-Memory, Memory-to-Memory, and Memory-to-Peripheral operation  
24  
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8.1.2 Module
 
Descriptions  
8.1.2.1
Timer  
The 32-bit timer block allows the CPU to generate a time tick at a programmed interval. This feature can be used  
for a wide variety of functions such as counting, interrupt generation, and time tracking.  
8.1.2.2
Dual Timer  
The APB dual-input timer module is an APB slave module consisting of two programmable 32-bit down-counters  
that can generate interrupts when they expire. The timer can be used in a Free-running, Periodic, or One-shot  
mode.  
8.1.2.3
Watchdog  
The two watchdog blocks allow the CPU to be interrupted if it has not interacted with the watchdog timer before it  
expires. In addition, this interrupt will be an output of the core so that it can be used to reset the CPU in the event  
that a direct interrupt to the CPU is not useful. This will allow the CPU to get back to a known state in the event a  
program is no longer executing as expected. The watchdog module applies a reset to a system in the event of a  
software failure, providing a way to recover from software crashes.  
8.1.2.4
Wake-up Timer  
This timer is a 32-bit count-down timer that operates on the 32kHz sleep clock. It can be used as a general  
purpose timer for the ARM or as a wakeup source for the chip. It has the ability to be a onetime programmable  
timer, as it will generate an interrupt/wakeup on expiration and stop operation. It also has the ability to be  
programmed in an auto reload fashion where it will generate an interrupt/wakeup and then proceed to start another  
count down sequence.  
8.1.2.5
SPI Controller  
See Section

8.1.2.6
I

2

C Controller  
See Section

8.1.2.7
SPI-Flash Controller  
The AHB SPI-Flash Controller is used to access an external SPI Flash device to access various instruction/data  
code needed for storing application code, code patches, and OTA images. Supports several SPI modes including  
0, 1, 2, and 3. See Section

8.1.2.8
UART  
See Section

8.1.2.9
DMA Controller  
Direct Memory Access (DMA) allows certain hardware subsystems to access main system memory independently  
of the Cortex-M0 Processor.  
The DMA features and benefits are:  
Supports any address alignment  
Supports any buffer size alignment  
Peripheral flow control, including peripheral block transfer  
The following modes are supported:  
–
–
–
–
Peripheral to peripheral transfer  
Memory to memory  
Memory to peripheral  
Peripheral to memory  
25  
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Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  

–
Register to memory  
Interrupts for both TX done and RX done in memory and peripheral mode  
Scheduled transfers  
Endianness byte swapping  
Watchdog timer  
4-channel operation  
32-bit data width  
AHB MUX (on read and write buses)  
Command lists support  
Usage of tokens  
8.1.2.10
Nested Vector Interrupt Controller (NVIC)  
External interrupt signals connect to the NVIC, and the NVIC prioritizes the interrupts. Software can set the priority  
of each interrupt. The NVIC and the Cortex-M0 processor core are closely coupled, providing low latency interrupt  
processing and efficient processing of late arriving interrupts.  
All NVIC registers are accessible via word transfers and are little-endian. Any attempt to read or write a half-word  
or byte individually is unpredictable.  
The NVIC allows for the CPU to be able to individually enable, disable each interrupt source, and hold each  
interrupt until it has been serviced and cleared by the CPU.  
Table 8-1.  
NVIC Register Summary  
Name  
Description  
ISER  
Interrupt Set-Enable Register  
ICER  
Interrupt Clear-Enable Register  
Interrupt Set-Pending Register  
Interrupt Clear-Pending Register  
Interrupt Priority Registers  
ISPR  
ICPR  
IPR0-IPR7  
For a description of each register, see the Cortex-M0 documentation from ARM.  
8.1.2.11
GPIO Controller  
The AHB GPIO is a general-purpose I/O interface unit allowing the CPU to independently control all input or output  
signals on ATBTLC1000. These can be used for a wide variety of functions pertaining to the application.  
The AHB GPIO provides a 16-bit I/O interface with the following features:  
Programmable interrupt generation capability  
Programmable masking support  
Thread safe operation by providing separate set and clear addresses for control registers  
Inputs are sampled using a double flip-flop to avoid meta-stability issues  
26  
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8.2  
Memory Subsystem  
The M0 core uses a 128kB instruction/boot ROM along with a 128kB shared instruction and data RAM.  
8.2.1 BLE
 
Retention Memory  
The BLE functionality requires 8KB (or more depending on the application) state, instruction, and data to be  
retained in memory when the processor either goes into Sleep Mode or Power Off Mode. The RAM is separated  
into specific power domains to allow tradeoff in power consumption with retention memory size.  
8.3  
Non-volatile Memory  
ATBTLC1000 has 768 bits of non-volatile eFuse memory that can be read by the CPU after device reset. This non-  
volatile one-time-programmable memory can be used to store customer-specific parameters, such as BLE  
address, XO calibration information, TX power, crystal frequency offset, as well as other software-specific  
configuration parameters. The eFuse is partitioned into six 128-bit banks. The bit map of the first bank is shown in  

Figure 8-2

he purpose of the first 80 bits in bank 0 is fixed, and the remaining bits are general-purpose software  
dependent bits, or reserved for future use. Since each bank and each bit can be programmed independently, this  
allows for several updates of the device parameters following the initial programming, e.g. updating BLE address  
(this can be done by invalidating the last programmed bank and programming a new bank). Refer to the  
ATBTLC1000 Programming Guide for the eFuse programming instructions.  
Figure 8-2.  
ATBTLC1000 eFuse Bit Map  
128 Bits  
Bank 0  
Bank 1  
Bank 2  
Bank 3  
Bank 4  
Application  
Specific  
Configuration  
Bank 5  
F
BT ADDR  
48  
8
XO  
1
1
3
3
Calibration  
Tx Power  
Calibration  
HW Config  
27  
ATBTLC1000 WLCSP SoC [DATASHEET]  
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9
Bluetooth Low Energy (BLE) Subsystem  
The BLE subsystem implements all the critical real-time functions required for full compliance with Specification of  
the Bluetooth System, v4.1, Bluetooth SIG.  
It consists of a Bluetooth 4.1 baseband controller (core), radio transceiver and the Atmel Bluetooth Smart Stack,  
the BLE Software Platform.  
9.1  
BLE Core  
The baseband controller consists of modem and Medium Access Controller (MAC) and it encodes and decodes  
HCI packets, constructs baseband data packages, schedules frames, and manages and monitors connection  
status, slot usage, data flow, routing, segmentation, and buffer control.  
The core performs Link Control Layer management supporting the main BLE states, including advertising and  
connection.  
9.1.1 Features  
Broadcaster, Central, Observer, Peripheral  
Simultaneous Master and Slave operation, connect up to eight slaves  
Frequency Hopping  
Advertising/Data/Control packet types  
Encryption (AES-128, SHA-256)  
Bit stream processing (CRC, whitening)  
Operating clock 52MHz  
9.2  
BLE Radio  
The radio consists of a fully integrated transceiver, including Low Noise Amplifier, Receive (RX) down converter,  
and analog baseband processing as well as Phase Locked Loop (PLL), Transmit (TX) Power Amplifier, and  
Transmit/Receive switch. At the RF front end, no external RF components on the PCB are required other than the  
antenna and a matching component.  
The RX sensitivity and TX output power of the radio together with the 4.1 PHY core provide a 100dB RF link  
budget for superior range and link reliability.  
9.2.1 Receiver
 
Performance  
Table 9-1.
 
ATBTLC1000 BLE Receiver Performance  
Parameter  
Min.  
Typ.  
Max.  
Unit  
Frequency  
2,402  
2,480  
MHz  
Sensitivity with external 1.2V  
Sensitivity with on-chip DC/DC  
Maximum receive signal level  
CCI  
-96  
-95  
+5  
dBm  
12.5  
0
ACI (N±1)  
N+2 Blocker (Image)  
N-2 Blocker  
-22  
-38  
-35  
-43  
dB  
N+3 Blocker (Adj. Image)  
N-3 Blocker  
28  
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Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 
 

Parameter  
Min.  
Typ.  
-45  
Max.  
Unit  
N±4 or greater  
dB  
Intermod (N+3, N+6)  
-32  
OOB (2GHz<f<2.399GHz)  
OOB (f<2GHz) or (f>2.4GHz)  
RX peak current draw  
-15  
-10  
dBm  
mA  
4.0

(1)  

Note:  
1. At
 
-93dBm sensitivity setting. Add 0.2mA at 3.6V for best sensitivity setting.  
All measurements performed at 3.6V VBATT and 25°C, with tests following Bluetooth V4.1 standard tests.  
There are two gain settings for Sensitivity; high gain (-95dBm) and low gain (-93dBm). Low gain has lower current  
consumption.  
9.2.2 Transmitter
 
Performance  
The transmitter has fine step power control with P

out

variable in <3dB steps below 0dBm and in <0.5dB steps  
above 0dBm.  
Table 9-2.  
ATBTLC1000 BLE Transmitter Performance  
Parameter Min.  
Typ.  
Max.  
2,480  
3.5  
Unit  
Frequency  
2,402  
-20  
MHz  
Output power range  
Maximum output power  
In-band Spurious (N±2)  
In-band Spurious (N±3)  
2

nd

harmonic P

out  

0
3.5  
-45  
-55  
dBm  
-41  
-41  
-41  
-41  
3

rd

harmonic P

out  

4

th

harmonic P

out  

5

th

harmonic P

out  

Frequency deviation  
TX peak current draw  
±250  
kHz  
mA  
3.0

(1)  

Note:  
1. At
 
0dBm TX output power.  
All measurements performed at 3.6V VBATT and 25°C, with tests following Bluetooth V4.1 standard tests.  
9.3  
Atmel Bluetooth SmartConnect Stack  
The ATBTLC1000 has a completely integrated Bluetooth Low Energy stack on chip, fully qualified, mature, and  
Bluetooth V4.1 compliant.  
Customer applications interface with the BLE protocol stack through the Atmel BLE API which supports direct  
access to the GAP, SMP, ATT, GATT client / server, and L2CAP service layer protocols in the embedded  
firmware.  
The stack includes numerous BLE profiles for applications like:  
Smart Energy  
Consumer Wellness  
29  
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Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 

Home Automation  
Security  
Proximity Detection  
Entertainment  
Sports and Fitness  
Automotive  
Together with the Atmel Studio Software Development environment, additional customer profiles can be easily  
developed.  
The Atmel Bluetooth SmartConnect software development kit is based on Keil and IAR
™
compiler tools and  
contains numerous application code examples for embedded and hosted modes.  
In addition to the protocol stack, drivers for each peripheral hardware block are provided.  
30  
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10 External
 
Interfaces  
10.1 Overview  
ATBTLC1000 external interfaces include: 2xSPI Master/Slave (SPI0 and SPI1), 2xI

2

C Master/Slave (I

2

C0 and  
I

2

C1), 1xI

2

C Slave-only (I

2

C2), 2xUART (UART1 and UART2), 1xSPI Flash, 1xSWD, and General Purpose  
Input/Output (GPIO) pins. For specific programming instructions, refer to the ATBTLC1000 Programming Guide.  

Table 10-1

illustrates the different peripheral functions that are software selectable for each pin. This allows for  
maximum flexibility of mapping desired interfaces on GPIO pins. MUX1 option allows for any MEGAMUX option  
from

to be assigned to a GPIO.  
Table 10-1.  
ATBTLC1000 Pin-MUX Matrix of External Interfaces  
Pin Name  
LP_GPIO_0  
LP_GPIO_1  
LP_GPIO_2  
LP_GPIO_3  
LP_GPIO_8  
LP_GPIO_9  
Pin# Pull  
MUX0  
MUX1  
MUX2  
SWD CLK  
MUX3  
MUX4  
MUX5  
MUX6  
MUX7  
TEST OUT 0  
TEST OUT 1  
D5 Up
 
GPIO 0  
MEGAMUX 0  
MEGAMUX 1  
MEGAMUX 2  
MEGAMUX 3  
MEGAMUX 8  
MEGAMUX 9  
MEGAMUX 10  
MEGAMUX 11  
MEGAMUX 12  
MEGAMUX 13  
WAKEUP  
F7  
G6  
H7  
J6  
Up GPIO
 
1  
Up GPIO
 
2  
Up GPIO
 
3  
Up GPIO
 
8  
Up GPIO
 
9  
Up GPIO
 
10  
Up GPIO
 
11  
Up GPIO
 
12  
Up GPIO
 
13  
Up GPIO
 
31  
Up GPIO
 
47  
SWD I/O  
UART1 RXD  
UART1 TXD  
I

2

C0 SDA  
SPI1 SCK  
SPI1 MOSI  
SPI0 SCK  
SPI FLASH SCK
 
TEST OUT 2  
SPI FLASH TXD
 
TEST OUT 3  
SPI FLASH SSN
 
TEST OUT 8  
SPI FLASH RXD
 
TEST OUT 9  
SPI FLASH SCK
 
TEST OUT 10  
SPI FLASH TXD
 
TEST OUT 11  
SPI FLASH SSN
 
TEST OUT 12  
SPI FLASH RXD
 
TEST OUT 13  
SPI0 MOSI  
SPI0 SSN  
SPI0 MISO  
I

2

C2 SDA  
H5  
I

2

C0 SCL  
I

2

C2 SCL  
LP_GPIO_10 J4  
LP_GPIO_11 F5  
LP_GPIO_12 G4  
LP_GPIO_13 D3  
SPI0 SCK  
SPI0 MOSI  
SPI0 SSN  
SPI0 MISO  
RTC CLK IN  
AO_GPIO_0  
GPIO_MS1  
B1  
F3  
32KHZ CLK OUT  

Table 10-2

shows the various software selectable MEGAMUX options that correspond to specific peripheral  
functionality. Several MEGAMUX options provide an interface to manage Wi-Fi

®

– BLE coexistence.  
Table 10-2.  
ATBTLC1000 Software Selectable MEGAMUX Options  
MUX_Sel  
Function  
UART1 RXD  
UART1 TXD  
UART1 CTS  
UART1 RTS  
UART2 RXD  
UART2 TXD  
UART2 CTS  
UART2 RTS  
I

2

C0 SDA  
Notes  
0
1
2
3
4
5
6
7
8
9
I

2

C0 SCL  
10  
11  
I

2

C1 SDA  
I

2

C1 SCL  
31  
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Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 
 

MUX_Sel  
12  
Function  
Notes  
PWM 1  
13  
PWM 2  
14  
PWM 3  
15  
PWM 4  
16  
LP CLOCK OUT  
32kHz clock output (RC Osc. or RTC XO)  
Coexistence: Wi-Fi is currently transmitting  
Coexistence: Wi-Fi is currently receiving  
Coexistence: BLE is currently transmitting  
Coexistence: BLE is currently receiving  
Coexistence Signal  
17  
WLAN TX ACTIVE  
WLAN RX ACTIVE  
BLE TX ACTIVE  
BLE RX ACTIVE  
BLE IN PROCESS  
BLE MBSY  
18  
19  
20  
21  
22  
Coexistence Signal  
23  
BLE SYNC  
Coexistence Signal  
24  
BLE RXNTX  
Coexistence Signal  
25  
BLE PTI 0  
Coexistence: BLE Priority  
26  
BLE PTI 1  
Coexistence: BLE Priority  
27  
BLE PTI 2  
Coexistence: BLE Priority  
28  
BLE PTI 3  
Coexistence: BLE Priority  
29  
QUAD DEC X IN A  
QUAD DEC X IN B  
QUAD DEC Y IN A  
QUAD DEC Y IN B  
QUAD DEC Z IN A  
QUAD DEC Z IN B  
30  
31  
32  
33  
34  
An example of peripheral assignment using these MEGAMUX options is as follows:  
I

2

C0 pin-muxed on LP_GPIO_10 and LP_GPIO_11 via MUX1 and MEGAMUX=8 and 9  
I

2

C1 pin-muxed on LP_GPIO_0 and LP_GPIO_1 via MUX1 and MEGAMUX=10 and 11  
PWM pin-muxed on LP_GPIO_12 via MUX1 and MEGAMUX=12  
Another example is to illustrate the available options for pin LP_GPIO_3, depending on the pin-MUX option  
selected:  
MUX0: the pin will function as bit 3 of the GPIO bus and is controlled by the GPIO controller in the ARM  
subsystem  
MUX1: any option from the MEGAMUX table can be selected, for example it can be a quad_dec, pwm, or  
any of the other functions listed in the MEGAMUX table  
MUX2: the pin will function as UART1 TXD; this can be also achieved with the MUX1 option via MEGAMUX,  
but the MUX2 option allows a shortcut for the recommended pinout  
MUX3: this option is not used and thus defaults to the GPIO option (same as MUX0)  
MUX4: the pin will function as SPI1 MOSI (this option is not available through MEGAMUX)  
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MUX5: the pin will function as SPI0 MOSI (this option is not available through MEGAMUX)  
MUX6: the pin will function as SPI FLASH SCK (this option is not available through MEGAMUX)  
MUX7: the pin will function as bit 3 of the test output bus, giving access to various debug signals  
10.2 I

2

C Master/Slave Interface  
10.2.1 Description  
ATBTLC1000 provides I

2

C Interface that can be configured as Slave or Master. I

2

C Interface is a two-wire serial  
interface consisting of a serial data line (SDA) and a serial clock line (SCL). ATBTLC1000 I

2

C supports I

2

C bus  
Version 2.1 – 2000 and can operate in the following speed modes:  
Standard mode (100kb/s)  
Fast mode (400kb/s)  
High-speed mode (3.4Mb/s)  
The I

2

C is a synchronous serial interface. The SDA line is a bidirectional signal and changes only while the SCL  
line is low, except for STOP, START, and RESTART conditions. The output drivers are open-drain to perform wire-  
AND functions on the bus. The maximum number of devices on the bus is limited by only the maximum  
capacitance specification of 400pF. Data is transmitted in byte packages.  
For specific information, refer to the
Philips Specification entitled “
The I

2

C -Bus Specification, Ver2.1
”
.  
10.2.2 I

2

C Interface Timing  
The I

2

C Interface timing (common to Slave and Master) is provided i

The timing parameters for Slave  
and Master modes are specified in

and

respectively.  
Figure 10-1.
 
ATBTLC1000 I

2

C Slave Timing Diagram  
t

PR  

t

HDDAT  

t

SUDAT  

t

BUF  

t

SUSTO  

SDA  
SCL  
t

HL  

t

LH  

t

LH  

t

HL  

t

WL  

t

HDSTA  

t

WH  

t

PR  

t

PR  

f

SCL  

t

SUSTA  

Table 10-3.  
ATBTLC1000 I

2

C Slave Timing Parameters  
Parameter Symbol
 
Min. Max. Units  
Remarks  
SCL Clock Frequency  
SCL Low Pulse Width  
SCL High Pulse Width  
SCL, SDA Fall Time  
f

SCL  

t

WL  

t

WH  

t

HL  

0
400  
kHz  
1.3  
0.6  
µs  
300  
ns  
33  
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Parameter  
SCL, SDA Rise Time  
Symbol Min. Max. Units  
Remarks  
This is dictated by external compo-  
nents  
t

LH  

300  
START Setup Time  
START Hold Time  
SDA Setup Time  
t

SUSTA  

t

HDSTA  

t

SUDAT  

0.6  
0.6  
100  
0
µs  
ns  
Slave and Master Default  
SDA Hold Time  
t

HDDAT  

40  
0.6  
1.3  
0
Master Programming Option  
STOP Setup time  
t

SUSTO  

t

BUF  

µs  
ns  
Bus Free Time Between STOP and START  
Glitch Pulse Reject  
t

PR  

50  
Table 10-4.  
ATBTLC1000 I

2

C Master Timing Parameters  
Standard  
Mode  
High-speed  
Fast Mode  
Mode  
Parameter  
Symbol  
Units  
Min.  
Max.  
Min.  
Max.  
Min.  
0
Max.  
SCL Clock Frequency  
SCL Low Pulse Width  
SCL High Pulse Width  
SCL Fall Time  
f

SCL  

t

WL  

0
4.7  
4
100  
0
400  
3400  
kHz  
µs  
1.3  
0.6  
0.16  
0.06  
10  
t

WH  

t

HLSCL  

t

HLSDA  

t

LHSCL  

t

LHSDA  

t

SUSTA  

t

HDSTA  

t

SUDAT  

t

HDDAT  

t

SUSTO  

t

BUF  

300  
300  
300  
300  
300  
300  
40  
80  
40  
80  
SDA Fall Time  
10  
ns  
SCL Rise Time  
1000  
1000  
10  
SDA Rise Time  
10  
START Setup Time  
START Hold Time  
SDA Setup Time  
4.7  
4
0.6  
0.6  
100  
40  
0.16  
0.16  
10  
µs  
ns  
250  
5
SDA Hold Time  
0
70  
STOP Setup time  
4
0.6  
1.3  
0
0.16  
µs  
ns  
Bus Free Time Between STOP and START  
Glitch Pulse Reject  
4.7  
t

PR  

50  
10.3 SPI
 
Master/Slave Interface  
10.3.1 Description  
ATBTLC1000 provides a Serial Peripheral Interface (SPI) that can be configured as Master or Slave. The SPI  
Interface pins are mapped as shown i

he SPI Interface is a full-duplex slave-synchronous serial  
interface. When the SPI is not selected, i.e., when SSN is high, the SPI interface will not interfere with data  
transfers between the serial-master and other serial-slave devices. When the serial slave is not selected, its  
transmitted data output is buffered, resulting in a high impedance drive onto the serial master receive line. The SPI  
34  
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Slave interface responds to a protocol that allows an external host to read or write any register in the chip as well  
as initiate DMA transfers. For the details of the SPI protocol and more specific instructions, refer to the  
ATBTLC1000 Programming Guide.  
Table 10-5.  
ATBTLC1000 SPI Interface Pin Mapping  
Pin Name  
SPI Function  
SSN  
Active Low Slave Select  
Serial Clock  
SCK  
MOSI  
MISO  
Master Out Slave In (Data)  
Master In Slave Out (Data)  
10.3.2 SPI
 
Interface Modes  
The SPI Interface supports four standard modes as determined by the Clock Polarity (CPOL) and Clock Phase  
(CPHA) settings. These modes are illustrated i

and

The red lines i

correspond to Clock Phase = 0 and the blue lines correspond to Clock Phase = 1.  
Table 10-6.  
ATBTLC1000 SPI Modes  
Mode  
CPOL  
CPHA  
0
1
2
3
0
0
1
1
0
1
0
1
Figure 10-2.
 
ATBTLC1000 SPI Clock Polarity and Clock Phase Timing  
CPOL = 0  
SCK  
CPOL = 1  
SSN  
CPHA = 0  
CPHA = 1  
z
1
2
3
4
5
6
7
8
z
RXD/TXD  
(MOSI/MISO)  
z
1
2
3
4
5
6
7
8
z
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10.3.3 SPI
 
Slave Timing  
The SPI Slave timing is provided i

an

Figure 10-3.
 
ATBTLC1000 SPI Slave Timing Diagram  
Table 10-7.  
ATBTLC1000 SPI Slave Timing Parameters  
Parameter  
Symbol  
f

SCK  

Min.  
Max.  
Units  
Clock Input Frequency  
Clock Low Pulse Width  
Clock High Pulse Width  
Clock Rise Time  
2
MHz  
t

WL  

240  
240  
t

WH  

ns  
t

LH  

10  
10  
Clock Fall Time  
t

HL  

Input Setup Time  
t

ISU  

5
5
0
5
5
Input Hold Time  
t

IHD  

ns  
Output Delay  
t

ODLY  

t

SUSSN  

t

HDSSN  

20  
Slave Select Setup Time  
Slave Select Hold Time  
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10.3.4 SPI
 
Master Timing  
The SPI Master Timing is provided in

and

Figure 10-4.
 
ATBTLC1000 SPI Master Timing Diagram  
f

SCK  

t

LH  

t

WH  

t

WL  

SCK  
t

HL  

SSN,  
TXD  
t

ODLY  

t

ISU  

t

IHD  

RXD  
Table 10-8.  
ATBTLC1000 SPI Master Timing Parameters  
Parameter  
Symbol  
f

SCK  

t

WL  

Min.  
Max.  
Units  
Clock Output Frequency  
Clock Low Pulse Width  
Clock High Pulse Width  
Clock Rise Time  
4
MHz  
120  
120  
t

WH  

t

LH  

5
5
Clock Fall Time  
t

HL  

ns  
Input Setup Time  
Input Hold Time  
t

ISU  

5
5
0
t

IHD  

Output Delay  
t

ODLY  

5
10.4 SPI
 
Flash Master Interface  
10.4.1 Description  
ATBTLC1000 provides an SPI Master interface for accessing external Flash memory. The TXD pin is the same as  
the Master Output, Slave Input (MOSI), and the RXD pin is the same as the Master Input, Slave Output (MISO).  
The SPI Master interface supports all four standard modes of clock polarity and clock phase shown i

External SPI Flash memory is accessed by a processor programming commands to the SPI Master interface,  
which in turn initiates an SPI master access to the Flash. For more specific instructions. Refer to ATBTLC1000  
Programming Guide.  
37  
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10.4.2 SPI
 
Master Timing  
The SPI Master Timing is provided in

and

Figure 10-5.
 
ATBTLC1000 SPI Master Timing Diagram  
f

SCK  

t

LH  

t

WH  

t

WL  

SCK  
t

HL  

SSN,  
TXD  
t

ODLY  

t

ISU  

t

IHD  

RXD  
Table 10-9.  
ATBTLC1000 SPI Master Timing Parameters  
Parameter  
Symbol  
f

SCK  

t

WL  

t

WH  

t

LH  

Min.  
Max.  
Units  
Clock Output Frequency  
Clock Low Pulse Width  
Clock High Pulse Width  
Clock Rise Time  
13  
MHz  
33  
33  
5
5
Clock Fall Time  
t

HL  

ns  
Input Setup Time  
Input Hold Time  
t

ISU  

t

IHD  

t

ODLY  

5
5
0
Output Delay  
5
10.5 UART
 
Interface  
ATBTLC1000 provides Universal Asynchronous Receiver/Transmitter (UART) interfaces for serial communication.  
The Bluetooth subsystem has two UART interfaces: a 4-pin interface for control and data transfer. The UART  
interfaces are compatible with the RS-232 standard, where ATBTLC1000 operates as Data Terminal Equipment  
(DTE). The 4-pin UART has two pins for data (TX and RX) and two pins for flow control/handshaking: Request To  
Send (RTS) and Clear To Send (CTS
).
The RTS and CTS are used for hardware flow control; they MUST be  
connected to the host MCU UART and enabled for the UART interface to be functional.
The pins associated  
with each the UART interfaces can be enabled on several alternative pins by programming their corresponding pin-  
MUX control registers (see

an

for available options).  
The UART features programmable baud rate generation with fractional clock division, which allows transmission  
and reception at a wide variety of standard and non-standard baud rates. The Bluetooth UART input clock is  
selectable between 26MHz, 13MHz, 6.5MHz, and 3.25MHz. The clock divider value is programmable as 13 integer  
bits and three fractional bits (with 8.0 being the smallest recommended value for normal operation). This results in  
the maximum supported baud rate of 26MHz/8.0 = 3.25MBd.  
38  
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The UART can be configured for seven or eight bit operation, with or without parity, with four different parity types  
(odd, even, mark, or space), and with one or two stop bits. It also has RX and TX FIFOs, which ensure reliable  
high speed reception and low software overhead transmission. FIFO size is 4×8 for both RX and TX direction. The  
UART also has status registers showing the number of received characters available in the FIFO and various error  
conditions, as well the ability to generate interrupts based on these status bits.  
An example of UART receiving or transmitting a single packet is shown i

his example shows 7-bit  
data (0x45), odd parity, and two stop bits.  
Refer to the ATBTLC1000 Programming Guide for more specific instructions.  
Figure 10-6.
 
Example of UART RX or TX Packet  
10.6 GPIOs  
12 General Purpose Input/Output (GPIO) pins total, labeled LP_GPIO, GPIO_MS, and AO_GPIO, are available to  
allow for application specific functions. Each GPIO pin can be programmed as an input (the value of the pin can be  
read by the host or internal processor) or as an output (the output values can be programmed by the host or  
internal processor).  
LP_GPIO are digital interface pins, GPIO_MS is a mixed signal/analog interface pin and AO_GPIO is an always-on  
digital interface pin that can detect interrupt signals while in deep sleep mode for wake up purposes.  
The LP_GPIO have interrupt capability but only when in active/standby mode. In sleep mode, they are turned off to  
save power consumption.  
10.7 Analog
 
to Digital Converter (ADC)  
10.7.1 Overview  
The ATBTLC1000 has an integrated Successive Approximation Register (SAR) ADC with 11-bit resolution and  
variable conversion speed up 1MS/s. The key building blocks are the capacitive DAC, comparator, and  
synchronous SAR engine as shown i

39  
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Figure 10-7.
 
BTLC1000 SAR ADC Block Diagram  
The ADC reference voltage can be either generated internally or set externally via one of the two available Mixed  
Signal GPIO pins on the ATBTLC1000.  
There are two modes of operation:  
A. High
 
resolution (11-bit): Set the reference voltage to half the supply voltage or below. In this condition the  
input signal dynamic range is equal to twice the reference voltage (ENOB=10bit).  
B. Medium
 
Resolution (10-bit): Set the reference voltage to any value below supply voltage (up to supply  
voltage – 300mV) and in this condition the input dynamic range is from zero to reference voltage (ENOB = 9  
bit).  
There are four input channels that are time multiplexed to the input of the SAR ADC. However on the  
ATBTLC1000, only one channel input is accessible from the outside, through the Mixed Signal GPIO pin.  
In power saving mode, the internal reference voltage is completely off and the reference voltage is set externally.  
The ADC characteristics are summarized in

Table 10-10.
 
SAR ADC Characteristics  
Conversion rate  
1ks → 1MS  
Selectable Resolution  
Power consumption  
10 → 11bit  
13.5µA (at 100KS/s)

(1)  

Note:  
1. With
 
external reference.  
10.7.2 Timing  
The ADC timing is shown i

The input signal is sampled twice, in the first sampling cycle the input  
range is defined either to be above reference voltage or below it and in the 2

nd

sampling instant the ADC start its  
normal operation.  
The ADC takes two sampling instants and N-1 conversion cycle (N=ADC resolution) and one cycle to sample the  
data out. So for 11-bit resolution it takes 13 clock cycles to do one Sample conversion.  
The Input clock equals N+2 the sampling clock frequency (N is the ADC resolution).  
CONV signal
 
: Gives indication about end of conversion.  
SAMPL  
: The input signal is sampled when this signal is high.  
RST ENG  
: When High SAR Engine is in reset mode (SAR engine output is set to mid-scale).  
40  
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Figure 10-8.
 
SAR ADC Timing  
10.7.3 Performance  
Table 10-11.
 
Static Performance of SAR ADC  
Parameter  
Input voltage range  
Resolution  
Condition  
Min.  
Typ.  
Max.  
Unit  
V
0
VBAT  
11  
bits  
KSPS  
mV  
%
Sample rate  
100  
1000  
+10  
+4  
Input offset  
Gain error  
Internal VREF  
Internal VREF  
-10  
-4  
100KSPS. Internal VREF=1.6V. Same result for  
external VREF.  
DNL  
INL  
-0.75  
-2  
+1.75  
+2.5  
LSB  
100KSPS. Internal VREF=1.6V. Same result for  
external VREF.  
THD  
1kHz sine input at 100KSPS  
1kHz sine input at 100KSPS  
1kHz sine input at 100KSPS  
73  
62.5  
73.7  
13  
SINAD  
dB  
SFDR  
Conversion time  
cycles  
Using external VREF, at 100KSPS  
13.5  
25.0  
94  
Using internal VREF, at 100KSPS  
Using external VREF, at 1MSPS  
Current consumption  
µA  
Using internal VREF, at 1MSPS  
150  
100  
50  
Using internal VREF, during VBAT monitoring  
Using internal VREF, during temperature monitoring  
Mean value using VBAT = 2.5V  
1.026*  
10.5  
V
Internal reference voltage  
Standard deviation across parts  
Without calibration  
mV  
-55  
-17  
-9  
+55  
+17  
+9  
VBAT Sensor Accuracy  
With offset and gain calibration  
Without calibration  
Temperature Sensor Accuracy  
ºC  
With offset calibration  
-4  
+4  
Note:  
1. Effective
 
VREF is 2xInternal Reference Voltage.  
41  
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푇 =
 
25

0

퐶
푉

퐵퐴ꢀ

= 3.ꢁ 푉, 푢푛푙푒푠푠 표푡ℎ푒푟푤ꢂ푠푒 푛표푡푒푑  
푐
Figure 10-9.
 
INL of SAR ADC  
INL 100KS/s 3V internal reference  
3
2
1
0
0
500  
1000  
1500  
2000  
-1  
-2  
-3  
Output Code  
Figure 10-10.
 
DNL of SAR ADC  
DNL 100KS/s 3V internal reference  
2
1.5  
1
0.5  
0
0
500  
1000  
1500  
2000  
-0.5  
-1  
-1.5  
Output Code  
42  
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Figure 10-11.
 
Sensor ADC Dynamic Measurement with Sinusoidal Input  
Notes: 1. 25ºC,
 
3.6V VBAT, and 100kS/s  
Input signal: 1kHz sine wave, 3Vp-p amplitude  
2. SNDR
 
= 62.5dB  
SFDR = 73.7dB  
THD = 73.0dB  
Figure 10-12.
 
Sensor ADC Dynamic Performance Summary at 100KSPS  
Dynamic performance summary  
74  
SNR  
72  
SNDR  
SFDR  
70  
THD  
68  
66  
64  
62  
60  
58  
56  
54  
0
0.5  
1
1.5  
2
2.5  
3
x 10

4  

input signal frequency in Hz  
43  
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10.8 Software
 
Programmable Timer and Pulse Width Modulator  
ATBTLC1000 contains four individually configurable pulse width modulator (PWM) blocks to provide external  
control voltages. The base frequency of the PWM block (fPWM_base) is derived from the XO clock (26MHz) or the  
RC oscillator followed by a programmable divider.  
The frequency of each PWM pulse (fPWM) is programmable in steps according to the following relationship:  
푓
푃푊푀_푏푎ꢃꢄ  
64 ∗ 2

푖  

푓
푃푊푀  
=
ꢂ = ꢁ,1,2,
 
… , 8  
The duty cycle of each PWM signal is configurable with 10-bit resolution (minimum duty cycle is 1/1024 and  
maximum is 1023/1024).  
푓
can be selected to have different values according to

Minimum and maximum frequencies  
푃푊푀  
ꢅꢆꢇꢈ  
supported for each clock selection is listed in the table as well.  
Table 10-12.
 
f

PWM

Range for Different f

PWM

Base Frequencies  
f

PWM

max.  
f

PWM

min.  
풇

푷푾푴  

풃풂풔풆  
26MHz  
13MHz  
6.5MHz  
3.25MHz  
406.25kHz  
203.125kHz  
101.562kHz  
50.781kHz  
6.347kHz  
3.173kHz  
1.586kHz  
793.25Hz  
10.9 Clock
 
Output  
ATBTLC1000 has an ability to output a clock. The clock can be output to any GPIO pin via the test MUX. Note that  
this feature requires that the ARM and BLE power domains stay on. If BLE is not used, the clocks to the BLE core  
are gated off, resulting in small leakage. The following two methods can be used to output a clock.  
10.9.1 Variable
 
Frequency Clock Output Using Fractional Divider  
ATBTLC1000 can output the variable frequency ADC clock using a fractional divider off the 26MHz oscillator. This  
clock needs to be enabled using bit 10 of the lpmcu_clock_enables_1 register. The clock frequency can be  
controlled by the divider ratio using the sens_adc_clk_ctrl register (12-bits integer part, 8-bit fractional part). The  
division ratio can vary from 2 to 4096 delivering output frequency between 6.35kHz to 13MHz. This is a digital  
divider with pulse swallowing implementation so the clock edges may not be at exact intervals for the fractional  
ratios. However, it is exact for integer division ratios.  
10.9.2 Fixed
 
Frequency Clock Output  
ATBTLC1000 can output the following fixed-frequency clocks:  
52MHz derived from XO  
26MHz derived from XO  
2MHz derived from the 2MHz RC Osc.  
31.25kHz derived from the 2MHz RC Osc.  
32.768kHz derived from the RTC XO  
26MHz derived from 26MHz RC Osc.  
6.5MHz derived from XO  
3.25MHz derived from 26MHz RC Osc.  
For clocks 26MHz and above ensure that external pad load on the board is minimized to get a clean waveform.  
44  
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10.10 Three-axis
 
Quadrature Decoder  
ATBTLC1000 has a three-axis Quadrature decoder (X, Y, and Z) that can determine the direction and speed of  
movement on three axes, requiring in total six GPIO pins to interface with the sensors. The sensors are expected  
to provide pulse trains as inputs to the quadrature decoder.  
Each axis channel input will have two pulses with ±90 degrees phase shift depending on the direction of  
movement. The decoder counts the edges of the two waveforms to determine the speed and uses the phase  
relationship between the two inputs to determine the direction of motion.  
The decoder is configured to interrupt ARM based on independent thresholds for each direction. Each quadrature  
clock counter (X, Y, and Z) is an unsigned 16-bit counter and the system clock uses a programmable sampling  
clock ranging from 26MHz, 13, 6.5, to 3.25MHz.  
If wakeup is desired from threshold detection on an axis input, the always-on GPIO needs to be used (only one  
GPIO on ATBTLC1000).  
45  
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  

11 Reference
 
Design  
4
T
k
_ P C D D V D  
H 1  
F 1  
G 2  
A 2  
0 u 1 F . 1 3
 
C  
O _ O U
 
L P _ L D  
_ b u c V B a t  
O _ 0  
O I _ D S W V D  
A O _ G P I  
B 1  
B 3  
0 1 0 u . F 2 0
 
C  
3 V 6 .  
2
1
1 N  
0 3 A G B 1 L 2 M 1 S 2 u 2 F .  
1 2 C  
K C
 
B U
 
D G
 
N  
V S S  
G F N R  
B F 2  
H 3  
E 4  
D 7  
O I D
 
V D  
D
1 u 0 F . 1 1
 
C  
0 u 1 F . 1 0
 
C  
1 u 0 F . 1 5
 
C  
S
_ A D M V D  
S X
 
O /
 
_ V D C V D  
E 6  
A 6  
C 6  
F R D
 
V D  
1 u 0 F . C 9  
46  
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Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 

12 Bill
 
of Material (BOM)  
47  
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 

13 Electrical
 
Characteristics  
13.1 Absolute
 
Maximum Ratings  
Table 13-1.  
ATBTLC1000 Absolute Maximum Ratings  
Symbol  
Characteristics  
I/O supply voltage  
Min.  
-0.3  
-0.3  
-0.3  
-0.3  
Max.  
5.0  
Unit  
VDDIO  
VBATT  
Battery supply voltage  
Digital input voltage  
5.0  
VIN

(1)  

VDDIO  
1.5  
V
VAIN

(2)  

VESDHBM

(3)  

Analog input voltage  
ESD human body model  
-1000, -2000  
+1000, +2000  
(see notes below)  
(see notes below)  
T

A  

Storage temperature  
-65  
150  
°C  
Notes: 1. V

IN

corresponds to all the digital pins.  
2. V

AIN

corresponds to all the analog pins.  
3. For
 
V

ESDHBM

, each pin is classified as Class 1, or Class 2, or both:  
The Class 1 pins include all the pins (both analog and digital)  
The Class 2 pins include all digital pins only  
V

ESDHBM

is ±1kV for Class1 pins. V

ESDHBM

is ±2kV for Class2 pins  
13.2 Recommended
 
Operating Conditions  
Table 13-2.  
ATBTLC1000 Recommended Operating Conditions  
Symbol  
VDDIO

L  

VDDIO

M  

VDDIO

H  

VBATT  
Characteristic  
I/O supply voltage low range  
Min.  
1.62  
2.00  
3.00  
1.8  
Typ.  
Max.  
2.00  
3.00  
4.30  
4.3  
Unit  
V
1.80  
2.50  
3.30  
3.6  
I/O supply voltage mid-range  
I/O supply voltage high range  
Battery supply voltage

(1)  

Operating temperature  
-40  
85  
°C  
Note:  
1. VBATT
 
must not be less than VDDIO.  
2. When
 
powering up the device, VBATT must be greater or equal to 1.9V to ensure BOD does not  
trigger. BOD threshold is typically 1.8V and the device will be held in reset if VBATT is near this  
threshold on startup. After startup, BOD can be disabled and the device can operated down to 1.8V.  
48  
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Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 

13.3 DC
 
Characteristics  

Table 13-3

provides the DC characteristics for the ATBTLC1000 digital pads.  
Table 13-3.  
ATBTLC1000 DC Electrical Characteristics  
Characteristic  
VDDIO  
condition  
Min.  
Typ.  
Max.  
Unit  
Input low voltage V

IL  

Input high voltage V

IH  

Output low voltage V

OL  

Output high voltage V

OH  

Input low voltage V

IL  

Input high voltage V

IH  

Output low voltage V

OL  

Output high voltage V

OH  

Input low voltage V

IL  

Input high voltage V

IH  

Output low voltage V

OL  

Output high voltage V

OH  

Output loading  
-0.30  
0.60  
VDDIO+0.30  
0.45  
VDDIO-0.60  
VDDIO

L  

VDDIO-0.50  
-0.30  
0.63  
VDDIO+0.30  
0.45  
VDDIO-0.60  
VDDIO

M  

V
VDDIO-0.50  
-0.30  
0.65  
VDDIO+0.30 (up to 3.60)  
0.45  
VDDIO-0.60  
VDDIO

H  

VDDIO-0.50  
20  
6
All  
pF  
Digital input load  
VDDIO

L  

VDDIO

M  

VDDIO

H  

VDDIO

L  

VDDIO

M  

VDDIO

H  

Pad drive strength (regular pads

(1)  

Pad drive strength (regular pads)  
Pad drive strength (regular pads)  
)
1.7  
3.4  
10.5  
3.4  
6.8  
21  
2.5  
6.6  
14  
mA  
Pad drive strength (high-drive pads

(1)  

Pad drive strength (high-drive pads)  
Pad drive strength (high-drive pads)  
)
5.0  
13.2  
28  
Note:  
1. The
 
following are high-drive pads: GPIO_8, GPIO_9; all other pads are regular.  
49  
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Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 

14 Errata  
Issue:  
The measured current for the cases listed

will be higher than what is reported in the  
figure.  
This is because the Power number values in the SDK4.0 release have not been fully optimized to  
their final values.  
A small sample measurement has been performed on 10 samples and they show the following  
results:  
Measurement condition:  
–
–
–
–
–
1-sec adverting interval  
37 byte advertising payload  
Connectable beacon  
Advertising on three channels (37, 38, 39)  
Vbatt and VDDIO are set to 3.3V  
SAM L21 has a measurement floor of 80nA, which was compensated in the reported numbers  
(this number varies from board to board and needs to be compensated).  
The Average advertising current: 11.3µA  
The Average sleep current between beacons: 1.17µA  
The average current for the 10 boards was (including 80nA floor):  
Sample #  
Average Current (µA)
 
11.55 11.45 11.45
 
11.7  
1
2
3
4
5
6
7
8
9
11.6  
10  
11.4  
11.4 11.25
 
10.95 11.2  
Work around:  
Will be resolved in a SDK update.  
50  
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  
 

15 Document
 
Revision History  
Doc Rev.  
Date  
Comments  
42493D  
02/2016  
Some minor corrections in text and template.  
1. Updated power values and added Bluet
ooth Certification ID’s
in feature list.  
2. Added UART flow control to LP_GPIO Pins in

3. Revised values in Ex Inductor Rng in

4. Removed 1µH Row and updated cap and ripple values in

5. Updated BLE on Transmit/BLE on Receive values in

6. Updated text in describing BOD handling in
Section

7. Removed BGR block from diagram in

and reference in

8. Added

for Brownout Thresholds and POR time.  
9. Updated oscillator variations to 50% in Sections

and

10. Updated
 

TX peak current values.  
42493C  
01/2016  
11. Updated
 
Reference Design info. In Section

12. Added
 
note 2, in

13. Revised
 
Sensitivity values in the Features, and Section

14. Updated
 

and

15. Revised
 
Power sequence

16. Updated
 
Reference Schematic and BOM in Sections

and

17. Added
 
Errata area in Section

1. Updated current numbers in the feature list.  
2. Updated current numbers and added comments in

3. Updated advertising current chart in

4. Updated capacitance value in Section

5. Updated voltage value in

6. Updated capacitance value and text in Section

7. Added 32kHz RC Oscillator performance charts in Section

8. Updated Receiver performance numbers and comments in

9. Updated Transmitter performance numbers and comments in

10. Updated ADC power consumption and added comment in

11. Replaced the whole ADC performance

12. Replaced ADC performance charts:

and

13. Added new ADC performance charts

and

14. BTLC1000 corrected to ATBTLC1000.  
42493B  
09/16/2015  
42493A  
08/2015  
Initial document release. Based on 42409B, changed package type to WLCSP.  
51  
ATBTLC1000 WLCSP SoC [DATASHEET]  
Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016  

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