MSKSEMI-5N10-MS

Part #MSKSEMI-5N10-MS
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MSKSEMI-5N10-MS
5N10-MS  
Semiconductor  
Compiance  
SOT23 Pin Configuration  
Product Summary  
BVDSS  
RDSON  
105 mΩ  
ID  
5A  
100V  
Green Device Available  
Super Low Gate Charge  
Excellent Cdv/dt effect decline  
Advanced high cell density Trench technology  
Absolute Maximum Ratings  
Symbol  
Parameter  
Rating  
100  
Units  
V

DS  

Drain-Source Voltage  
Gate-Sou
r
ce Voltage  
V
V
V

GS  

±
20  
I

D

@T

A

=25
℃  
I

D

@T

A

=70
℃  
I

DM  

Continuous Drain Current, V

GS

@ 10V

1  

Continuous Drain Current, V

GS

@ 10V

1  

Pulsed Drain Current

2  

5
2.2  
A
A
11  
A
P

D

@T

A

=25
℃  
T

STG  

Total Power Dissipation

3  

1
W
℃
℃
Storage Temperature Range  
-55 to 150  
-55 to 150  
T

J  

Operating Junction Temperature Range  
Thermal Data  
Symbol  
R

θJA  

Parameter  
Typ.  
—  
Max.  
125  
80  
Unit  
℃
/W  
℃
/W  
Thermal Resistance Junction-ambient

1  

Thermal Resistance Junction-Case

1  

R

θJC  

—  

5N10-MS  
Semiconductor  
Compiance  
Electrical Characteristics
T

C

=25
℃
unless otherwise specified  
Symbol  
Parameter  
Test Condition  
Min.  
Typ.  
Max.  
Units  
Off Characteristic  
V

(BR)DSS  

I

DSS  

Drain-Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
Gate to Body Leakage Current  
V

GS

= 0V, I

D

= 250μA  
V

DS

= 100V, V

GS

= 0V  
V

DS

= 0V, V

GS

= ±20V  
100  
110  
–
1
V
–
–
–
–
μA  
nA  
I

GSS  

±100  
On Characteristics

note3  

V

GS(th)

Gate Threshold Voltage  
R

DS(on)  

Static Drain-Source On-Resistance

note2  

Dynamic Characteristics

note4  

V

DS

= V

GS

, I

D

= 250μA  
V

GS

= 10V, I

D

= 3A  
1.0  
–
1.95  
105  
3.0  
V
140  
mΩ  
C

iss  

C

oss  

C

rss  

Q

g  

Input Capacitance  
–
–
–
–
–
–
196  
25.9  
21.4  
4.3  
–
–
–
–
–
–
pF  
pF  
pF  
nC  
nC  
nC  
V

DS

= 50V, V

GS

= 0V,  
f = 1.0MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Total Gate Charge  
V

DS

= 50V, I

D

= 3A,  
V

GS

= 10V  
Q

gs  

Q

gd  

Gate-Source Charge  
Gate-Drain(“Miller”) Charge  
3.5  
3.1  
Switching Characteristics

note4  

t

d(on)  

t

r  

t

d(off)  

t

f  

Turn-On Delay Time  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
–
–
–
–
14.7  
3.5  
–
–
–
–
ns  
ns  
ns  
ns  
V

DD

= 50V, I

DS

=3A  
R

G

= 2Ω, V

GEN

= 10V  
20.9  
2.7  
Drain-Source Diode Characteristics and Maximum Ratings  
I

S  

Maximum Continuous Drain to Source Diode Forward Current

note2  

Maximum Pulsed Drain to Source Diode Forward Current  
–
–
–
–
–
–
–
–
4.5  
A
A
I

SM  

V

SD  

t

rr  

12  
Drain to Source Diode Forward Voltage

note3  

Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Time Charge  
Peak Reverse Recovery Current  
V

GS

= 0V, I

S

=3A  
–
1.3  
V
32.1  
39.4  
2.1  
–
–
–
ns  
nC  
A
V

GS

= 0V, I

F

= 3A,  
di/dt =100A/μs  
Q

rr  

I

rrm  

Notes:  
1. Repetitive Rating: Pulse width limited by maximum junction temperature.  
2. Surface Mounted on FR4 Board, t ≤ 10 sec.  
3. Pulse Test: Pulse Width ≤ 300μs, Duty Cycle ≤2%.  
4. Guaranteed by design, not subject to production  
V

DD

=50 V, R

G

=50 Ω, L=0.3 mH, starting T

j

=25 °C  
5.  

5N10-MS  
Semiconductor  
Compiance  
Typical Characteristics  
4
3
2
1
0
4
V

GS

= 10V  

GS

= 4.5V  
V
DS
= 5V  
V
3
2
1
0
V
GS
= 3.5V  
V
GS
= 2.5V  
V
GS
= 2V  
0
1
2
3
4
5
0
1
2
3
4
Drain−source voltage V

DS

(V)  
Gate−source voltage V

GS

(V)  
Figure 1.Output Characteristics  
Figure 2. Transfer Characteristics  
2
1.5  
1
1200  
900  
600  
300  
0
I
D
= 2A  
0.5  
0
0
3
6
9
12  
15  
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
Gate−source voltage V

GS

(V)  
Source−drain voltage V

SD

(V)  
Figure 3. Forward Characteristic
s
o
f Reverse  
Figure 4. R

DS(ON)

vs. V

GS  

500  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
400  
300  
200  
100  
0
V
GS
= 4.5V  
V
GS
= 10V  
0
0.5  
1
1.5  
2
2.5  
3
-50  
-25  
0
25  
50  
75  
100 125 150  
Drain current I
D
(A)  
Temperature T

j

(  
°
C
)  
Figure 5. R

DS(ON)

vs. I

D  

Figure 6. Normalized R

DS(on)

vs. Temperature  
3

5N10-MS  
Semiconductor  
Compiance  
10000  
1000  
100  
10  
Ciss  
Coss  
Crss  
F=1.0MHz  
1
0
20  
40  
60  
80  
100  
Drain-source voltage V
DS
(
V
)  
Figure 7. Capacitance Characteristics  
Figure 8. Gate Charge Characteristics  

5N10-MS  
Semiconductor Compiance  
PACKAGE MECHANICAL DATA  
Dimensions In Millimeters  
Dimensions In Inches  
Symbol  
Min  
Max  
1.150  
0.100  
1.050  
0.500  
0.150  
3.000  
1.400  
2.550  
Min  
Max  
0.045  
0.004  
0.041  
0.020  
0.006  
0.118  
0.055  
0.100  
A
A1  
A2  
b
c
D
E
E1  
e
e1  
L
0.900  
0.000  
0.900  
0.300  
0.080  
2.800  
1.200  
2.250  
0.035  
0.000  
0.035  
0.012  
0.003  
0.110  
0.047  
0.089  
0.950 T
Y
P  
0.550 REF  
0.037 T
Y
P  
0.022 REF  
1.800  
2.000  
0.071  
0.079  
L1  
θ
0.300  
0°  
0.500  
8°  
0.012  
0°  
0.020  
8
°  
REEL SPECIFICATION  
QTY  
P/N  
PKG  
3000  
5N10-MS  
SOT-23  

5N10-MS  
Semiconductor  
Compiance  
Attention  
■
Any and all MSKSEMI Semiconductor products described or contained herein do not have specifications  
that can handle applications that require extremely high levels of reliability, such as life-support systems,  
aircraft’s control systems, or other applications whose failure can be reasonably expected to result in serious  
physical and/or material damage. Consult with your MSKSEMI Semiconductor representative nearest you  
before using any MSKSEMI Semiconductor products described or contained herein in such applications.  
■
MSKSEMI Semiconductor assumes no responsibility for equipment failures that result from using products  
at values that exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or  
other parameters) listed in products specificationsof any andall MSKSEMI Semiconductor products described  
orcontained herein.  
■
Specifications of any and all MSKSEMI Semiconductor products described or contained herein stipulate the  
performance, characteristics, and functions of the described products in the independent state, and are not  
guarantees of the performance, characteristics, and functions of the described products as mounted in the  
customer’s products or equipment. To verify symptoms and states that cannot be evaluated in an independent  
device, the customer should always evaluate and test devices mounted in the customer’sproducts orequipment.  
■
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semiconductor products fail with someprobability. It is possiblethat these probabilistic failures could give rise to  
accidents or events that could endanger human lives, that could give rise to smoke or fire, or that could cause  
damage to other property. When designing equipment, adopt safety measures so that these kinds of accidents  
or events cannot occur. Such measures include but are not limited to protective circuits anderror prevention  
circuitsfor safedesign, redundant design, and structural design.  
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or contained herein are controlled under any of applicable local export control laws and regulations, such  
products must not be exported without obtaining the export license from theauthorities concerned in  
accordance with the above law.  
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mechanical, including photocopying and recording, or any information storage or retrieval system, or otherwise,  
without the prior written permission of MSKSEMI Semiconductor.  
■
Information (including circuit diagrams and circuit parameters) herein is for example only ; it is not  
guaranteed for volume production. MSKSEMI Semiconductor believes information herein is accurate and  
reliable, but no guarantees are made or implied regarding its use or any infringementsof intellectual property  
rights or other rightsof third parties.  
■
Any and all information described or contained herein are subject to change without notice due to  
product/technology improvement, etc. Whendesigning equipment, referto the “Delivery Specification” for the  
MSKSEMI Semiconductor productthat you intend to use.