MSKSEMI-5N10-MS
| Part # | MSKSEMI-5N10-MS |
| Download | MSKSEMI-5N10-MS |
5N10-MS
Semiconductor
Compiance
SOT23 Pin Configuration
Product Summary
BVDSS
RDSON
105 mΩ
ID
5A
100V
Green Device Available
Super Low Gate Charge
Excellent Cdv/dt effect decline
Advanced high cell density Trench technology
Absolute Maximum Ratings
Symbol
Parameter
Rating
100
Units
V
DS
Drain-Source Voltage
Gate-Sou
r
ce Voltage
V
V
V
GS
±
20
I
D
@T
A
=25
℃
I
D
@T
A
=70
℃
I
DM
Continuous Drain Current, V
GS
@ 10V
1
Continuous Drain Current, V
GS
@ 10V
1
Pulsed Drain Current
2
5
2.2
A
A
11
A
P
D
@T
A
=25
℃
T
STG
Total Power Dissipation
3
1
W
℃
℃
Storage Temperature Range
-55 to 150
-55 to 150
T
J
Operating Junction Temperature Range
Thermal Data
Symbol
R
θJA
Parameter
Typ.
—
Max.
125
80
Unit
℃
/W
℃
/W
Thermal Resistance Junction-ambient
1
Thermal Resistance Junction-Case
1
R
θJC
—
5N10-MS
Semiconductor
Compiance
Electrical Characteristics
T
C
=25
℃
unless otherwise specified
Symbol
Parameter
Test Condition
Min.
Typ.
Max.
Units
Off Characteristic
V
(BR)DSS
I
DSS
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current
Gate to Body Leakage Current
V
GS
= 0V, I
D
= 250μA
V
DS
= 100V, V
GS
= 0V
V
DS
= 0V, V
GS
= ±20V
100
110
–
1
V
–
–
–
–
μA
nA
I
GSS
±100
On Characteristics
note3
V
GS(th)
Gate Threshold Voltage
R
DS(on)
Static Drain-Source On-Resistance
note2
Dynamic Characteristics
note4
V
DS
= V
GS
, I
D
= 250μA
V
GS
= 10V, I
D
= 3A
1.0
–
1.95
105
3.0
V
140
mΩ
C
iss
C
oss
C
rss
Q
g
Input Capacitance
–
–
–
–
–
–
196
25.9
21.4
4.3
–
–
–
–
–
–
pF
pF
pF
nC
nC
nC
V
DS
= 50V, V
GS
= 0V,
f = 1.0MHz
Output Capacitance
Reverse Transfer Capacitance
Total Gate Charge
V
DS
= 50V, I
D
= 3A,
V
GS
= 10V
Q
gs
Q
gd
Gate-Source Charge
Gate-Drain(“Miller”) Charge
3.5
3.1
Switching Characteristics
note4
t
d(on)
t
r
t
d(off)
t
f
Turn-On Delay Time
Turn-On Rise Time
Turn-Off Delay Time
Turn-Off Fall Time
–
–
–
–
14.7
3.5
–
–
–
–
ns
ns
ns
ns
V
DD
= 50V, I
DS
=3A
R
G
= 2Ω, V
GEN
= 10V
20.9
2.7
Drain-Source Diode Characteristics and Maximum Ratings
I
S
Maximum Continuous Drain to Source Diode Forward Current
note2
Maximum Pulsed Drain to Source Diode Forward Current
–
–
–
–
–
–
–
–
4.5
A
A
I
SM
V
SD
t
rr
12
Drain to Source Diode Forward Voltage
note3
Body Diode Reverse Recovery Time
Body Diode Reverse Recovery Time Charge
Peak Reverse Recovery Current
V
GS
= 0V, I
S
=3A
–
1.3
V
32.1
39.4
2.1
–
–
–
ns
nC
A
V
GS
= 0V, I
F
= 3A,
di/dt =100A/μs
Q
rr
I
rrm
Notes:
1. Repetitive Rating: Pulse width limited by maximum junction temperature.
2. Surface Mounted on FR4 Board, t ≤ 10 sec.
3. Pulse Test: Pulse Width ≤ 300μs, Duty Cycle ≤2%.
4. Guaranteed by design, not subject to production
V
DD
=50 V, R
G
=50 Ω, L=0.3 mH, starting T
j
=25 °C
5.
5N10-MS
Semiconductor
Compiance
Typical Characteristics
4
3
2
1
0
4
V
GS
= 10V
GS
= 4.5V
V
DS
= 5V
V
3
2
1
0
V
GS
= 3.5V
V
GS
= 2.5V
V
GS
= 2V
0
1
2
3
4
5
0
1
2
3
4
Drain−source voltage V
DS
(V)
Gate−source voltage V
GS
(V)
Figure 1.Output Characteristics
Figure 2. Transfer Characteristics
2
1.5
1
1200
900
600
300
0
I
D
= 2A
0.5
0
0
3
6
9
12
15
0.0
0.2
0.4
0.6
0.8
1.0
1.2
Gate−source voltage V
GS
(V)
Source−drain voltage V
SD
(V)
Figure 3. Forward Characteristic
s
o
f Reverse
Figure 4. R
DS(ON)
vs. V
GS
500
2.5
2.0
1.5
1.0
0.5
0.0
400
300
200
100
0
V
GS
= 4.5V
V
GS
= 10V
0
0.5
1
1.5
2
2.5
3
-50
-25
0
25
50
75
100 125 150
Drain current I
D
(A)
Temperature T
j
(
°
C
)
Figure 5. R
DS(ON)
vs. I
D
Figure 6. Normalized R
DS(on)
vs. Temperature
3
5N10-MS
Semiconductor
Compiance
10000
1000
100
10
Ciss
Coss
Crss
F=1.0MHz
1
0
20
40
60
80
100
Drain-source voltage V
DS
(
V
)
Figure 7. Capacitance Characteristics
Figure 8. Gate Charge Characteristics
5N10-MS
Semiconductor Compiance
PACKAGE MECHANICAL DATA
Dimensions In Millimeters
Dimensions In Inches
Symbol
Min
Max
1.150
0.100
1.050
0.500
0.150
3.000
1.400
2.550
Min
Max
0.045
0.004
0.041
0.020
0.006
0.118
0.055
0.100
A
A1
A2
b
c
D
E
E1
e
e1
L
0.900
0.000
0.900
0.300
0.080
2.800
1.200
2.250
0.035
0.000
0.035
0.012
0.003
0.110
0.047
0.089
0.950 T
Y
P
0.550 REF
0.037 T
Y
P
0.022 REF
1.800
2.000
0.071
0.079
L1
θ
0.300
0°
0.500
8°
0.012
0°
0.020
8
°
REEL SPECIFICATION
QTY
P/N
PKG
3000
5N10-MS
SOT-23
5N10-MS
Semiconductor
Compiance
Attention
■
Any and all MSKSEMI Semiconductor products described or contained herein do not have specifications
that can handle applications that require extremely high levels of reliability, such as life-support systems,
aircraft’s control systems, or other applications whose failure can be reasonably expected to result in serious
physical and/or material damage. Consult with your MSKSEMI Semiconductor representative nearest you
before using any MSKSEMI Semiconductor products described or contained herein in such applications.
■
MSKSEMI Semiconductor assumes no responsibility for equipment failures that result from using products
at values that exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or
other parameters) listed in products specificationsof any andall MSKSEMI Semiconductor products described
orcontained herein.
■
Specifications of any and all MSKSEMI Semiconductor products described or contained herein stipulate the
performance, characteristics, and functions of the described products in the independent state, and are not
guarantees of the performance, characteristics, and functions of the described products as mounted in the
customer’s products or equipment. To verify symptoms and states that cannot be evaluated in an independent
device, the customer should always evaluate and test devices mounted in the customer’sproducts orequipment.
■
MSKSEMI Semiconductor. strives to supply high-quality high-reliability products. However, any and all
semiconductor products fail with someprobability. It is possiblethat these probabilistic failures could give rise to
accidents or events that could endanger human lives, that could give rise to smoke or fire, or that could cause
damage to other property. When designing equipment, adopt safety measures so that these kinds of accidents
or events cannot occur. Such measures include but are not limited to protective circuits anderror prevention
circuitsfor safedesign, redundant design, and structural design.
■
In the event that any or all MSKSEMI Semiconductor products(including technical data, services) described
or contained herein are controlled under any of applicable local export control laws and regulations, such
products must not be exported without obtaining the export license from theauthorities concerned in
accordance with the above law.
■
No part of this publication may be reproduced or transmitted in any form or by any means, electronic or
mechanical, including photocopying and recording, or any information storage or retrieval system, or otherwise,
without the prior written permission of MSKSEMI Semiconductor.
■
Information (including circuit diagrams and circuit parameters) herein is for example only ; it is not
guaranteed for volume production. MSKSEMI Semiconductor believes information herein is accurate and
reliable, but no guarantees are made or implied regarding its use or any infringementsof intellectual property
rights or other rightsof third parties.
■
Any and all information described or contained herein are subject to change without notice due to
product/technology improvement, etc. Whendesigning equipment, referto the “Delivery Specification” for the
MSKSEMI Semiconductor productthat you intend to use.
