MSKSEMI-AO4435-MS

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MSKSEMI-AO4435-MS
AO4435-MS  
Semiconductor  
Compiance  
Description  
uses advanced trench technology  
The
AO4435-MS  
to provide excellent R

DS(ON)

, low gate charge and  
operation with gate voltages as low as 2.5
V
. This  
device is suitable for use as a  
D
D
D
G
D
S
S
S
Battery protection or in other Switching application.  
General Features  
SOP-8  
V

DS

= 30V
 
I

D

= 9A  
D
R

DS(ON)

< 20mΩ @ V

GS

=10V  
Application  
G
Battery protection  
S
P-Channel MOSFET  
Load switch  
Uninterruptible power supply  
Absolute Maximum Ratings
(Tc=25
℃
unless otherwise noted )  
Symbol Parameter  
Rating  
– 30  
+ 20  
-9  
Units  
V

DS  

Drain-Source Voltage  
Gate-Source Voltage  
V
V
A
VGS  
Drain Current

3

, V

GS

@ 10V  
I

D

@T

A

=25
℃
 
Drain Current

3

, V

GS

@ 10V  
-7.3  
A
I

D

@T

A

=70
℃  
IDM  
Pulsed Drain Current

1  

T
o
tal Power Dissipation  
-50  
2.5  
A
W
P

D

@T

A

=25
℃  
Linear Derating Factor  
0.02  
W/
℃  
Storage
T
e
mperature Range  
-55 to 150  
-55 to 150  
50  
℃
℃
TSTG  
T

J  

Operating Junction
T
e
mperature Range  
Maximum Thermal Resistance, Junction-ambient

3  

Rthj-a  
℃
/W  

AO4435-MS  
Semiconductor  
Compiance  
Electrical Characteristics@T

j

=25

o

C(unless otherwise specified)  
Symbol  
BV

DSS  

Parameter  
T
e
st Conditions  
V

GS

=0
V
,
I

D

=-250uA  
Min. Typ. Max. Units  
Drain-Source Breakdown Voltage  
-30  
–
–
–
–
V
mΩ  
mΩ  
V
20  
V

GS

=-10
V
,
I

D

=-7A  
V

GS

=-4.5
V
,
I

D

=-5A  
V

DS

=V

GS

, I

D

=-250uA  
V

DS

=-10
V
,
I

D

=-7A  
V

DS

=-24
V
,
V

GS

=0V  
V

GS

=+20
V
,
V

DS

=0V  
I

D

=-7A  
Static Drain-Source On-Resistance

2  

–
–
32  
RDS(ON)  
Gate Threshold Voltage  
Forward Transconductance  
Drain-Source Leakage Current  
Gate-Source Leakage  
T
o
tal Gate Charge  
-1  
–
–
-3  
VGS(th)  
g

fs  

16  
–
–
S
IDSS  
IGSS  
Q

g  

–
-30  
uA  
nA  
nC  
nC  
nC  
ns  
ns  
ns  
ns  
pF  
pF  
pF  
V
–
–
+100  
–
18  
3
29  
–
V

DS

=-24V  
Q

gs  

Gate-Source Charge  
Gate-Drain (“Miller”) Charge  
Turn-on Delay Time  
–
V

GS

=-4.5V  
Q

gd  

–
10  
8
–
td(on)  
t

r  

V

DS

=-15V  
I

D

=-1A  
–
–
Rise Time  
–
6.6  
44  
34  
–
R

G

=3.3
Ω
 
V

GS

=-10V  
td(off)  
t

f  

Turn-off Delay Time  
–
–
Fall Time  
–
–
C

iss  

Input Capacitance  
V

GS

=0V  
V

DS

=-  
25V
.  
–
1175 1690  
C

oss  

C

rss  

Output Capacitance  
Reverse Transfer Capacitance  
Forward On Voltage

2  

Reverse Recovery Time  
Reverse Recovery Charge  
–
195  
190  
–
–
f=1.0MHz  
–
–
V

SD  

I

S

=-2.1A, V

GS

=0V  
–
-1.2  
trr  
I

S

=-7A, V

GS

=0
V
,
d
I/dt=100A/µs  
–
28  
18  
–
–
ns  
nC  
Q

rr  

–
Notes:  
1.Pulse width limited by Max. junction temperature.  
2.Pulse test  
3.Surface mounted on 1 in

2

copper pad of FR4 board, t <10sec ; 125
℃
/W when mounted on Min. cop  

AO4435-MS  
Semiconductor  
Compiance  
50  
40  
30  
20  
10  
0
50  
40  
30  
20  
10  
0
T

A

=25

o  

C
T

A

=150

o  

C
-10V  
-7.0V  
-5.0V  
-4.5V  
-10V  
-7.0V  
-5.0V  
-4.5V  
V

G

= -3.0V  
V

G

= -3.0V  
0
1
2
3
4
0
2
4
6
-V

DS

, Drain-to-Source Voltage (V)  
-V

DS

, Drain-to-Source Voltage (V)  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
32  
28  
24  
20  
16  
12  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
I

D

= -5A  
I

D

= -7A  
T

A

=25

o  

C
V

G

= -10V  
Ω
.
-50  
0
50  
100  
150  
2
4
6
8
10  
T

j

, Junction Temperature (

o

C)  
-V

GS

, Gate-to-Source Voltage (V)  
Fig 3. On-Resistance
 
v.s. Gate Voltage  
Fig 4. Normalized On-Resistance  
v.s. Junction Temperature  
2
1.8  
1.6  
1.4  
1.2  
1
10  
8
6
4
2
0
T

j

=25

o  

C
T

j

=150

o  

C
0.8  
0.1  
0.3  
0.5  
0.7  
0.9  
1.1  
1.3  
-50  
0
50  
100  
150  
T

j

, Junction Temperature (

o

C)  
-V

SD

, Source-to-Drain Voltage (V)  
Fig 5. Forward Characteristic of  
Reverse Diode  
Fig 6. Gate Threshold Voltage v.s.  
Junction Temperature  

AO4435-MS  
Semiconductor  
Compiance  
f=1.0MHz  
12  
10  
8
10000  
I

D

= -7A  

DS

= -24V  
V
C

iss  

6
1000  
4
2
C

oss  

C

rss  

0
100  
0
10  
20  
30  
40  
1
5
9
13  
17  
21  
25  
29  
Q

G

, Total Gate Charge (nC)  
-V

DS

, Drain-to-Source Voltage (V)  
Fig 7. Gate Charge Characteristics  
Fig 8. Typical Capacitance Characteristics  
1
100.00  
Duty factor=0.5  
10.00  
1.00  
0.10  
0.01  
0.2  
0.1  
100us  
1ms  
0.1  
10ms  
.
0.05  
P

DM  

100ms  
1s  
t
T
0.02  
T

A

=25

o

C  
0.01  
Duty factor = t/T  
DC  
Peak T

j

= P

DM

x R

thja

+ T

a  

Single Pulse  
R

thja

= 125
℃
/W  
Single Pulse  
0.01  
0.01  
0.1  
1
10  
100  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
-V

DS

, Drain-to-Source Voltage (V)  
t , Pulse Width (s)  
Fig 9. Maximum Safe Operating Area  
Fig 10. Effective Transient Thermal Impedance  
40  
30  
20  
10  
0
T

j

=25

o

C  
T

j

=150

o

C  
V

G  

V

DS

= -5V  
Q

G  

-4.5V  
Q

GS  

Q

GD  

Charge  
Q
0
1
2
3
4
5
6
-V

GS

, Gate-to-Source Voltage (V)  
Fig 11. Transfer Characteristics  
Fig 12. Gate Charge Circuit  

AO4435-MS  
Semiconductor  
Compiance  
PACKAGE MECHANICAL DATA  
Dimensions In Millimeters  
Dimensions In Inches  
Sy
m
bo l  
M
i
n  
1.350  
0.100  
1.
3
50  
0.330  
0.170  
4.800  
Max  
1.
7
50  
0.250  
1.5
5
0  
0.510  
0.250  
5.000  
M
i
n  
0.053  
0.004  
0.0
53  
0.013  
0.007  
0.189  
Max  
A
A1  
A2  
b
0.069  
0.010  
0.0
61  
0.020  
0.010  
0.197  
c
D
e
1.270(BSC)  
0.050(BSC)  
E
5.800  
3.800  
0.400  
0°  
6.200  
4.000  
1.270  
8°  
0.228  
0.150  
0.016  
0°  
0.244  
0.157  
0.050  
8°  
E1  
L
θ
REEL SPECIFICATION  
P/N  
PKG  
QTY  
AO4435-MS  
3000  
SOP-8  

AO4435-MS  
Semiconductor  
Compiance  
Attention  
■
Any and all MSKSEMI Semiconductor products described or contained herein do not have specifications  
that can handle applications that require extremely high levels of reliability, such as life-support systems,  
aircraft’s control systems, or other applications whose failure can be reasonably expected to result in serious  
physical and/or material damage. Consult with your MSKSEMI Semiconductor representative nearest you  
before using any MSKSEMI Semiconductor products described or contained herein in such applications.  
■
MSKSEMI Semiconductor assumes no responsibility for equipment failures that result from using products  
at values that exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or  
other parameters) listed in products specificationsof any andall MSKSEMI Semiconductor products described  
orcontained herein.  
■
Specifications of any and all MSKSEMI Semiconductor products described or contained herein stipulate the  
performance, characteristics, and functions of the described products in the independent state, and are not  
guarantees of the performance, characteristics, and functions of the described products as mounted in the  
customer’s products or equipment. To verify symptoms and states that cannot be evaluated in an independent  
device, the customer should always evaluate and test devices mounted in the customer’sproducts orequipment.  
■
MSKSEMI Semiconductor. strives to supply high-quality high-reliability products. However, any and all  
semiconductor products fail with someprobability. It is possiblethat these probabilistic failures could give rise to  
accidents or events that could endanger human lives, that could give rise to smoke or fire, or that could cause  
damage to other property. When designing equipment, adopt safety measures so that these kinds of accidents  
or events cannot occur. Such measures include but are not limited to protective circuits anderror prevention  
circuitsfor safedesign, redundant design, and structural design.  
■
In the event that any or all MSKSEMI Semiconductor products(including technical data, services) described  
or contained herein are controlled under any of applicable local export control laws and regulations, such  
products must not be exported without obtaining the export license from theauthorities concerned in  
accordance with the above law.  
■
No part of this publication may be reproduced or transmitted in any form or by any means, electronic or  
mechanical, including photocopying and recording, or any information storage or retrieval system, or otherwise,  
without the prior written permission of MSKSEMI Semiconductor.  
■
Information (including circuit diagrams and circuit parameters) herein is for example only ; it is not  
guaranteed for volume production. MSKSEMI Semiconductor believes information herein is accurate and  
reliable, but no guarantees are made or implied regarding its use or any infringementsof intellectual property  
rights or other rightsof third parties.  
■
Any and all information described or contained herein are subject to change without notice due to  
product/technology improvement, etc. Whendesigning equipment, referto the “Delivery Specification” for the  
MSKSEMI Semiconductor productthat you intend to use.