MSKSEMI-AO4812-MS

Part #MSKSEMI-AO4812-MS
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MSKSEMI-AO4812-MS
AO4812-MS  
Product specification  

AO4812-MS  
Description  
The AO4812-MS uses advanced trench technology to provide excellent
 
R DS(ON) , low gate charge and operation with  
gate voltages as low as 2.5V. This device is suitable for use as a Battery protection or in other Switching application.  
General Features  
Application  
VDS = 30V ID = 6A  
Battery protection  
Load switch  
RDS(ON) < 42mΩ @ VGS=4.5V  
RDS(ON) < 30mΩ @ VGS=10 V  
Uninterruptible power supply  
Reference News  
PACKAGE OUTLINE  
Pin Configuration  
Marking  
MSKSEMI  
4812  
3SKJ12  
SOP-8  
N-Channel MOSFET  
Absolute Maximum Ratings@Tj=25
℃
(unless otherwise specified)  
Parameter  
Units  
Symbol  
Rating  
Drain- Source
 
Voltage  
30  
V
V
A
V
DS  
V
GS  
Gate- Source
 
Voltage  
+20  
6
Drain Current, V
GS
@ 4.5V

3  

I
D
@T
A
=25
℃
 
Drain Current, V
GS
@ 4.5V

3  

5
A
I
D
@T
A
=70
℃  
I
DM  
Pulsed Drain Current

1  

Total Power Dissipation  
30  
2
A
W
P
D
@T
A
=25
℃  
Storage Temperature Range  
-55 to 150  
-55 to 150  
62.5  
T
STG  
T
J  
℃
℃
Operating Junction Temperature Range  
Maximum Thermal Resistance, Junction
–
a
mbient

3  

Rthj-a  
℃
/W  
Copyright© Msksemi Incorporated  

AO4812-MS  
Electrical Characteristics (T
 
=25°C unless otherwise noted

)
 

J
Symbol  
Typ  
Parameter  
Max Units  
Conditions  
Min  
STATIC PARAMETERS  
Drain
–
S
ource Breakdown Voltage  
I

D

=-250
µ
A, V

GS

=0V  
30  
V
BV

DSS  

1
μA  
5
V

DS

=30V, V

GS

=0V  
Zero Gate Voltage Drain Current  
I

DSS  

T

J

=55°C  
V

DS

=0V, V

GS

=±20V  
Gate-Body leakage current  
Gate Threshold Voltage  
On state drain current  
±100  
2.4  
nA  
V
I

GSS  

V

DS

=V

GS

I

D

=250
µ
A  
V

GS

=10V, V

DS

=5V  
V

GS

=10V, I

D

=6A  
1.2  
30  
1.8  
V

GS
(
t
h)  

I

D(ON)  

A
25  
40  
30  
48  
42  
mΩ  
Static Drain
–
S
ource On-Resistance  
T

J

=125°C  
R

DS(ON)  

V

GS

=4.5V, I

D

=5A  
V

DS

=5V, I

D

=6A  
I

S

=1A,V

GS

=0V  
33  
mΩ  
S
Forward Transconductance  
Diode Forward Voltage  
15  
FS  
V

SD  

I

S  

0.76  
1
V
Maximum Body-Diode Continuous Current  
2.5  
A
DYNAMIC PARAMETERS  
Input Capacitance  
C

iss  

Output Capacitance  
C

oss  

pF  
pF  
pF  
255  
45  
310  
V

GS

=0V, V

DS

=15V, f=1MHz  
Reverse Transfer Capacitance  
35  
50  
C

rss  

R

g  

V

GS

=0V, V

DS

=0V, f=1MHz  
Gate resistance  
1.6  
3.25  
4.9  
Ω
SWITCHING PARAMETERS  
Total Gate Charge  
Q

g(10V)  

nC  
5.2  
2.55  
0.85  
1.3  
6.3  
3.2  
Qg

(4.5V)  

nC  
nC  
nC  
ns  
ns  
ns  
ns  
V

GS

=10V, V

DS

=15V, I

D

=6A  
Gate Source Charge  
Q

gs  

Gate Drain Charge  
Q

gd  

Turn
–
O
n DelayTime  
4.5  
D(on)  
t

r  

Turn-On Rise Time  
Turn
–
O
ff DelayTime  
2.5  
V

GS

=10V, V

DS

=15V, R

L

=2.5
Ω  
14.5  
3.5  
D(off)  
R

GEN

=3
Ω  
,
t

f  

Turn-Off Fall Time  
t

rr  

Body Diode Reverse Recovery Time  
ns  
I

F

=6A, dI/dt=100A/  
µ
s  
8.5  
2.2  
nC  
Body Diode Reverse Recovery  
Charge  
Q

rr  

I

F

=6A, dI/dt=100A/
µ
s  
A. The value of RθJA is measured with the device mounted on 1in2 FR-4 board with 2oz. Copper, in a still air environment  
with TA =25°C. The value in any given application depends on the user’s specific board design.  
B. The power dissipation PD is based on TJ(MAX)=150°C, using ≤ 10s junction-to-ambient thermal resistance.  
C. Repetitive rating, pulse width limited by junction temperature TJ(MAX)=150°C. Ratings are based on low frequency and  
duty cycles to keep initialTJ=25°C.  
D. The RθJA is the sum of the thermal impedence from junction to lead RθJL and lead to ambient.  
E. The static characteristics in Figures 1 to 6 are obtained using <300µs pulses, duty cycle 0.5% max.  
F. These curves are based on the junction-to-ambient thermal impedence which is measured with the device mounted on  
1in2 FR-4 board with 2oz. Copper, assuming a maximum junction temperature of TJ(MAX)=150°C. The SOA curve provides a  
single pulse ratin g.  
Copyright© Msksemi Incorporated  

AO4812-MS  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
15  
10  
5
30  
25  
20  
15  
10  
5
V

DS

=5V  
10V  
7V  
4.5V  
4V  
3.5V  
25
°
C  
125
°
C  
V

GS

=3V  
0
0
1
1.5  
2
2.5  
3
3.5  
4
4.5  
0
1
2
3
4
5
V

DS

(Volts)  
V

GS

(Volts)  
Fig 1: On-Region Characteristics (Note E)  
Figure 2: Transfer Characteristics (Note E)  
1.8  
1.6  
1.4  
1.2  
1
40  
35  
30  
25  
20  
V

GS

=10V  
I

D

=6A  
V

GS

=4.5V  

=4.5V

10  
V

GS  

I

D

=5A  
V

GS

=10V  
0.8  
0
25  
50  
75  
100  
125  
150  
175  
0
3
6
9
12  
15  
I

D

(A)  
Temperature (
°
C
)  
Figure 3: On-Resistance vs. Drain Current and  
Gate Voltage (Note E)  

Figure 4: On-Resistance vs. Junction Te
m

p

erature  

(Note E)  
100  
80  
1.0E+02  
1.0E+01  
I

D

=6A  
1.0E+00  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
60  
125
°
C  
125
°
C  
25
°
C  
0.8  
40  
25
°
C  
20  
0.0  
0.2  
0.4  
0.6  
1.0  
1.2  
2
4
6
8
10  
V

GS

(Volts)  
V

SD

(Volts)  
Figure 5: On-Resistance vs. Gate-Source Voltage  
(Note E)  
Figure 6: Body-Diode Characteristics (Note E)  
Copyright© Msksemi Incorporated  

AO4812-MS  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
400  
350  
300  
250  
200  
150  
100  
50  
10  
8
V

DS

=15V  
I

D

=6A  
C

iss  

6
4
C

oss  

2
C

rss  

0
0
0
1
2
3
4
5
6
0
5
10  
15  

DS

(Volts)  
20  
25  
30  
Q

g

(nC)  
V
Figure 7: Gate-Charge Characteristics  
Figure 8: Capacitance Characteristics  
100.0  
10.0  
1.0  
10000  
1000  
100  
10  
T

A

=25
°
C  
10
µ
s  
R

DS(ON)  

limited  
100
µ
s  
1ms  
10ms  
T

J(Max)

=150
°
C  
T

A

=25
°
C  
0.1  
10s  
DC  
0.0  
1
0.01  
0.1  
1
10  
100  
0.00001  
0.001  
0.1  
10  
1000  
V

DS

(Volts)  
Pulse Width (s)  
Figure 11: Single Pulse Power Rating Junction-to-  
Ambient (Note F)  
Figure 10: Maximum Forward Biased Safe  
Operating Area (Note F)  
10  
D=T

on

/T  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
T

J,PK

=T

A

+P

DM

.Z

θ
JA

.R

θ
JA  

R

θ
JA

=90
°
C
/W  
1
0.1  
P

D  

0.01  
0.001  
Single Pulse  
0.001  
T

on  

T
0.00001  
0.0001  
0.01  
0.1  
1
10  
100  
1000  
Pulse Width (s)  
Figure 12: Normalized Maximum Transient Thermal Impedance (Note F)  
Copyright© Msksemi Incorporated  

AO4812-MS  
Gate Charge Test Circuit & Waveform  
Vgs  
Qg  
10V  
+
VDC  
+
Qgs  
Qgd  
Vds  
VDC  
–
–
DUT  
Vgs  
Ig  
Charge  
Resistive Switching Test Circuit & Waveforms  
RL  
Vds  
Vds  
90%  
10%  
+
DUT  
Vdd  
Vgs  
VDC  
Rg  
–
Vgs  
Vgs  
t

d(on)  

t
r
t

d(off)  

t
f
t

on  

t

off  

Unclamped Inductive Switching (UIS) Test Circuit & Waveforms  
L
E

AR

= 1/2 L
I

A

2

R  

B
V

DSS  

Vds  
Id  
Vgs  
Vds  
+
Vgs  
Vdd  
I

AR  

VDC  
Id  
Rg  
–
DUT  
Vgs  
Vgs  
Diode Recovery Test Circuit & Waveforms  
Q

rr

= –
 
Idt  
Vds +  
Vds –  
Ig  
DUT  
Vgs  
t

rr  

L
Isd  
I

F  

Isd  
Vgs  
dI/dt  
I

RM  

+
Vdd  
VDC  
Vdd  
–
Vds  
Copyright© Msksemi Incorporated  

AO4812-MS  
PACKAGE MECHANICAL DATA  
Dimensions In Millimeters  
Dimensions In Inches  
Symbol  
Min  
Min  
Max  
Max  
A
1.350  
1.750  
0.053  
0.069  
A1  
0.100  
1.350  
0.330  
0.170  
4.800  
0.250  
1.550  
0.510  
0.250  
5.000  
0.004  
0.053  
0.013  
0.007  
0.189  
0.010  
0.061  
0.020  
0.010  
0.197  
A2  
b
c
D
e
1. 2 70 (
B
SC)  
0
.
0 5 0 (
B
SC)  
E
5.800  
3.800  
0.400  
0°  
6.200  
4.000  
1.270  
8°  
0.228  
0.150  
0.016  
0°  
0.244  
0.157  
0.050  
8°  
E1  
L
θ
Suggested Pad Layout  
Note:  
1.Controlling dimension:in millimeters.  
2.General tolerance:±0.05mm.  
3.The pad layout is for reference purposes only  
REEL SPECIFICATION  
P/N  
PKG  
QTY  
AO4812-MS  
SOP–8  
4000  
Copyright© Msksemi Incorporated  

AO4812-MS  
Attention  
■
Any and all MSKSEMI Semiconductor products described or contained herein do not
 
have specifications
 
that can  
handle applications that require extremely high levels of reliability, such as life-support
 
systems, aircraft’s control systems, or  
other applications whose failure can be reasonably expected to result in serious physical and/or material damage. Consult with  
your MSKSEMI Semiconductor representative
 
nearest you
 
before using any MSKSEMI Semiconductor products described  
or contained herein in such
 
applications.  
■
MSKSEMI Semiconductor assumes no responsibility for equipment failures that result from using products  
at values that  
exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or other parameters) listed in  
products specificationsof any andall MSKSEMI Semiconductor products described orcontained herein.  
■
Specifications of any and all MSKSEMI Semiconductor products described or contained herein stipulate the  
performance, characteristics, and functions of the described products in the independent state, and are not guarantees of the  
performance, characteristics, and functions of the described products as mounted in the customer’s products or equipment.
T
o  
verify symptoms and states that cannot be evaluated in an independent device, the customer should always evaluate and test  
devices mounted in the customer’sproducts orequipment.  
■
MSKSEMI Semiconductor. strives to supply high-quality high-reliability products. However, any and all semiconductor  
products fail with someprobability. It is possiblethat these probabilistic failures could give rise to accidents or events that could  
endanger human lives, that could give rise to smoke or fire, or that could cause damage to other property. When designing  
equipment, adopt safety measures so that these kinds of accidents
 
or events cannot occur. Such measures include but are  
not limited to protective circuits anderror prevention circuitsfor safedesign, redundant design, and structural design.  
■
In the event that any or all MSKSEMI Semiconductor products(including technical data, services) described
 
or contained  
herein are controlled under any of applicable local export control laws and regulations, such products must not be exported  
without obtaining the export license from theauthorities
 
concerned in accordance
 
with the above law.  
■
No part of this publication may be reproduced or transmitted in any form or by any means, electronic or  
mechanical, including photocopying and recording, or any information storage or retrieval system, or otherwise, without the prior  
written permission of MSKSEMI Semiconductor.  
■
Information (including circuit diagrams and circuit parameters) herein is for example only ; it is not guaranteed for volume  
production. MSKSEMI Semiconductor believes information herein is accurate and
 
reliable, but no guarantees are made or  
implied regarding its use or any infringementsof intellectual property rights or other rightsof third parties.  
■
Any and all information described or contained herein are subject to change without notice due to  
product/technology improvement, etc. Whendesigning equipment, referto the “Delivery Specification” for the MSKSEMI  
Semiconductor productthat you intend to use.  
Copyright© Msksemi Incorporated