MSKSEMI-AOD609-MS

Part #MSKSEMI-AOD609-MS
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MSKSEMI-AOD609-MS
AOD609-MS  
Semiconductor  
Compiance  
TO252-4 Pin
 
Configuration  
Features  
Fast switching  
Green Device Available  
Suit for 4.5V Gate Drive Applications  
D1/D2  
Applications  
G2  
S2  
DC Fan  
G1  
S1  
Motor Drive Applications  
Networking  
Half / Full Bridge Topology  
D1/D2  
G1  
G2  
BVDSS  
40V  
RDSON  
19m
 
ID  
15A  
-12A  
S1  
S2  
-40V  
38m
  
Absolute Maximum Ratings
Tc=25
℃
unless otherwise noted  
Symbol Parameter  
Rating  
Units  
V

DS  

V

GS  

Drain-Source Voltage  
40  
-40  
V
V
Gate-Sou
r
ce Voltage  
±
20  
15  
±20  
-12  
-7  
Drain Current – Continuous (T

C

=25
℃
)  
Drain Current – Continuous (T

C

=100
℃
)  
Drain Current – Pulsed

1  

A
I

D  

9
A
I

DM  

P

D  

60  
-48  
A
Power Dissipation (T

C

=25
℃
)  
20  
W
W/
℃  
℃
℃
Power Dissipation – Derate above 25
℃  
Storage Temperature Range  
0.16  
T

STG  

T

J  

-55 to 150  
-55 to 150  
Operating Junction Temperature Range  
Thermal Characteristics  
Symbol  
Parameter  
Typ.  
Max.  
6
Unit  
℃
/W  
℃
/W  
R

θJC  

R

θJA  

Thermal Resistance Junction to Case  
Thermal Resistance Junction to Ambient  
—  
—  
62  

AOD609-MS  
Semiconductor  
Compiance  
N-CH Electrical Characteristics
(T

J

=25
℃
, unless otherwise)  
Off Characteristics  
Symbol  
Parameter  
Conditions  
Min.  
40  
—  
Typ.  
—  
Max.  
—  
Unit  
V
BV

DSS  

Drain-Source Breakdown Voltage  
V

GS

=0V , I

D

=250uA  
Reference to 25
℃
, I

D

=1mA  
V

DS

=40V , V

GS

=0V , T

J

=25
℃  
V

DS

=32V , V

GS

=0V , T

J

=125
℃  
V

GS

=±20V , V

DS

=0V  
V/
℃  
uA  
O
BV

DSS

/
O
T

J

BV

DSS

Temperature Coefficient  
0.04  
—  
—  
—  
1
I

DSS  

I

GSS  

Drain-Source Leakage Current  
Gate-Source Leakage Current  
—  
—  
10  
uA  
—  
—  
±100  
nA  
On Characteristics  
V

GS

=10V , I

D

=6A  
V

GS

=4.5V , I

D

=4A  
—  
—  
19  
30  
1.5  
-3  
30  
42  
2.5  
—  
m
R

DS(ON)  

Static Drain-Source On-Resistance  
m
 
V
V

GS(th)  

Gate Threshold Voltage  
1.0  
—  
V

GS

=V

DS

, I

D

=250uA  
V

DS

=10V , I

D

=3A  
O
V

GS(th)  

mV/
℃  
S
V

GS(th)

Temperature Coefficient  
Forward Transconductance  
gfs  
—  
6.5  
—  
Dynamic and switching Characteristics  
Q

g  

Q

gs  

Q

gd  

T

d(on)  

T

r  

Total Gate Charge

2 , 3  

Gate-Source Charge

2 , 3  

Gate-Drain Charge

2 , 3  

Turn-On Delay Time

2 , 3  

Rise Time

2 , 3  

—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
5.2  
1.2  
2.5  
3.2  
8.6  
18  
V

DS

=20V , V

GS

=4.5V , I

D

=6A  
nC  
ns  
V

DD

=20V , V

GS

=4.5V , R

G

=25
 
T

d(off)  

T

f  

Turn-Off Delay Time

2 , 3  

Fall Time

2 , 3  

I

D

=1A  
6
C

iss  

C

oss  

C

rss  

Input Capacitance  
420  
65  
V

DS

=15V , V

GS

=0V , F=1MHz  
pF  
Output Capacitance  
Reverse Transfer Capacitance  
40  
Drain-Source Diode Characteristics and Maximum Ratings  
Symbol  
I

S  

Parameter  
Continuous Source Current  
Pulsed Source Current  
Diode Forward Voltage  
Conditions  
Min.  
—  
Typ.  
—  
Max.  
15  
30  
1
Unit  
A
V

G

=V

D

=0V , Force Current  
I

SM  

—  
—  
A
V

SD  

V

GS

=0V , I

S

=1A , T

J

=25
℃
 
—  
—  
V
Note :  
1.
Repetitive Rating : Pulsed width limited by maximum junction temperature.  
2.
The data tested by pulsed , pulse width
≦
300us , duty cycle
≦
2%.  
3.
Essentially independent of operating temperature.  

AOD609-MS  
Semiconductor  
Compiance  
T

J

, Junction Temperature (
℃
)  
T

C

, Case Temperature (
℃
)  
Fig.1 Continuous Drain Current vs. T

C  

Fig.2 Normalized
 
RDSON vs. T

J  

T

J

, Junction Temperature (
℃
)  
Qg , Gate Charge (
nC
)  
Fig.4 Gate
 
Charge Waveform  
Fig.3 Normalized
 
V

th

vs. T

J  

V

DS

, Drain to Source Voltage (V)  
Square Wave Pulse Duration (s)  
Fig.5 Normalized
 
Transient Impedance  
Fig.6 Maximum Safe Operation Area  

AOD609-MS  
Semiconductor  
Compiance  
P-CH Electrical Characteristics
(T

J

=25
℃
, unless otherwise  
Off Characteristics  
Symbol  
BV

DSS  

Parameter  
Conditions  
V

GS

=0V , I

D

=
–
250uA  
Reference to 25
℃
, I

D

=  
Min.  
–
40  
—  
Typ.  
—  
Max.  
—  
Unit  
V
Drain-Source Breakdown Voltage  
BV

DSS

Temperature Coefficient  
△
BV

DSS

/△
T

J  

–
1mA  
–
0.04  
—  
—  
V/
℃  
uA  
V

DS

=
–
40V , V

GS

=0V , T

J

=25
℃  
V

DS

=
–
32V , V

GS

=0V , T

J

=125
℃  
V

GS

=
±
10V , V

DS

=0V  
—  
–
1  
I

DSS  

I

GSS  

Drain-Source Leakage Current  
Gate-Source Leakage Current  
—  
—  
–
10  
±
100  
uA  
—  
—  
nA  
On Characteristics  
V

GS

=
–
10V , I

D

=
–
5A  
V

GS

=
–
4.5V , I

D

=
–
3A  
—  
—  
38  
45  
–
1.5  
3
45  
70  
m
 
m
  
V
R

DS(ON)  

Static Drain-Source On-Resistance  
V

GS(th)  

△
V

GS(th)  

gfs  
Gate Threshold Voltage  
–
1.0  
—  
–
2.5  
—  
V

GS

=V

DS

, I

D

=
–
250uA  
V

DS

=
–
10V , I

D

=
–
3A  
V

GS(th)

Temperature Coefficient  
Forward Transconductance  
mV/
℃  
S
—  
9
—  
Dynamic and switching Characteristics  
Q

g  

Q

gs  

Q

gd  

T

d(on)  

T

r  

Total Gate Charge

2 , 3  

Gate-Source Charge

2 , 3  

Gate-Drain Charge

2 , 3  

Turn-On Delay Time

2 , 3  

Rise Time

2 , 3  

—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
9
2.5  
3.2  
20  
nC  
ns  
V

DS

=
–
20V , V

GS

=
–
4.5V , I

D

=
–
5A  
12  
V

DD

=
–
20V , V

GS

=
–
4.5V , R

G

=25
  
T

d(off)  

T

f  

Turn-Off Delay Time

2 , 3  

Fall Time

2 , 3  

46  
I

D

=
–
1A  
6
C

iss  

C

oss  

C

rss  

Input Capacitance  
1050  
110  
80  
pF  
Output Capacitance  
Reverse Transfer Capacitance  
V

DS

=
–
15V , V

GS

=0V , F=1MHz  
Drain-Source Diode Characteristics and Maximum Ratings  
Symbol  
I

S  

Parameter  
Continuous Source Current  
Pulsed Source Current  
Diode Forward Voltage  
Conditions  
V

G

=V

D

=0V , Force Current  
V

GS

=0V , I

S

=
–
1A , T

J

=25
℃  
Min.  
—  
Typ.  
—  
Max.  
–
12  
–
24  
–
1  
Unit  
A
I

SM  

—  
—  
A
V

SD  

—  
—  
V
Note :  
4.
Repetitive Rating : Pulsed width limited by maximum junction temperature.  
5.
The data tested by pulsed , pulse width
≦
300us , duty cycle
≦
2%.  
6.
Essentially independent of operating temperature.  

AOD609-MS  
Semiconductor Compiance  
PACKAGE MECHANICAL DATA  
D
A
D1  
c
h
φ
A1  
D2  
b
e
Dimensions In Millimeters  
Dimensions In Inches  
Symbol  
Min.  
2.200  
0.000  
0.635  
0.460  
6.500  
5.100  
Max.  
2.400  
0.127  
0.770  
0.580  
6.700  
5.460  
Min.  
0.087  
0.000  
0.025  
0.018  
0.256  
0.201  
Max.  
0.094  
A
A1  
b
c
D
D1  
D2  
E
e
L
0.005  
0.030  
0.023  
0.264  
0.215  
4.830 REF.  
0.190 REF.  
6.000  
2.186  
9.712  
6.200  
2.386  
10.312  
0.236  
0.086  
0.382  
0.244  
0.094  
0.406  
L1  
L2  
L3  
L4  
Φ
θ
2.900 REF.  
0.114 REF.  
0.063 REF.  
1.400  
1.700  
0.055  
0.067  
1.600 REF.  
0.600  
1.100  
0°  
1.000  
1.300  
8°  
0.024  
0.043  
0°  
0.039  
0.051  
8°  
h
0.000  
0.300  
0.000  
0.012  
V
5.250 REF.  
0.207 REF.  
REEL SPECIFICATION  
QTY  
P/N  
PKG  
AOD609-MS  
TO-252
-4  
2500  

AOD609-MS  
Semiconductor  
Compiance  
T

J

, Junction Temperature (
℃
)  
T

C

, Case Temperature (
℃
)  
Fig.7 Continuous Drain Current vs. T

C  

Fig.8 Normalized
 
RDSON vs. T

J  

T

J

, Junction Temperature (
℃
)  
Qg , Gate Charge (
nC
)  
Fig.10 Gate
 
Charge Waveform  
Fig.9 Normalized
 
V

th

vs. T

J  

-V

DS

, Drain to Source Voltage (V)  
Square Wave Pulse Duration (s)  
Fig.12 Maximum Safe Operation Area  
Fig.11 Normalized
 
Transient Impedance  

AOD609-MS  
Semiconductor  
Compiance  
Attention  
■
Any and all MSKSEMI Semiconductor products described or contained herein do not have specifications  
that can handle applications that require extremely high levels of reliability, such as life-support systems,  
aircraft’s control systems, or other applications whose failure can be reasonably expected to result in serious  
physical and/or material damage. Consult with your MSKSEMI Semiconductor representative nearest you  
before using any MSKSEMI Semiconductor products described or contained herein in such applications.  
■
MSKSEMI Semiconductor assumes no responsibility for equipment failures that result from using products  
at values that exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or  
other parameters) listed in products specificationsof any andall MSKSEMI Semiconductor products described  
orcontained herein.  
■
Specifications of any and all MSKSEMI Semiconductor products described or contained herein stipulate the  
performance, characteristics, and functions of the described products in the independent state, and are not  
guarantees of the performance, characteristics, and functions of the described products as mounted in the  
customer’s products or equipment. To verify symptoms and states that cannot be evaluated in an independent  
device, the customer should always evaluate and test devices mounted in the customer’sproducts orequipment.  
■
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semiconductor products fail with someprobability. It is possiblethat these probabilistic failures could give rise to  
accidents or events that could endanger human lives, that could give rise to smoke or fire, or that could cause  
damage to other property. When designing equipment, adopt safety measures so that these kinds of accidents  
or events cannot occur. Such measures include but are not limited to protective circuits anderror prevention  
circuitsfor safedesign, redundant design, and structural design.  
■
In the event that any or all MSKSEMI Semiconductor products(including technical data, services) described  
or contained herein are controlled under any of applicable local export control laws and regulations, such  
products must not be exported without obtaining the export license from theauthorities concerned in  
accordance with the above law.  
■
No part of this publication may be reproduced or transmitted in any form or by any means, electronic or  
mechanical, including photocopying and recording, or any information storage or retrieval system, or otherwise,  
without the prior written permission of MSKSEMI Semiconductor.  
■
Information (including circuit diagrams and circuit parameters) herein is for example only ; it is not  
guaranteed for volume production. MSKSEMI Semiconductor believes information herein is accurate and  
reliable, but no guarantees are made or implied regarding its use or any infringementsof intellectual property  
rights or other rightsof third parties.  
■
Any and all information described or contained herein are subject to change without notice due to  
product/technology improvement, etc. Whendesigning equipment, referto the “Delivery Specification” for the  
MSKSEMI Semiconductor productthat you intend to use.