MSKSEMI-AONR36366-MS

Part #MSKSEMI-AONR36366-MS
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MSKSEMI-AONR36366-MS
AONR36366-MS  
Product specification  

AONR36366-MS  
Description  
The AONR36366-MS uses advanced trench technology to provide excellent R
DS(ON)
, low gate charge and operation with gate voltages as  
low as 4.5V. This device is suitable for use as a Battery protection or in other Switching application.  
Application  
Features  
Battery protection  
V

DS

= 30V  
I =100A  
D
Load switch  
R
DS(ON)
< 5 . 5 mΩ @ V
GS
=10V  
Uninterruptible power supply  
Reference News  
PACKAGE OUTLINE  
P-Channel MOSFET  
Marking  
100N03  
XXXX  
PIN1  
DFN3X3-8L  
Absolute Maximum Ratings (TC=25
℃
unless otherwise specified)  
Symbol  
V
DS  
Parameter  
Drain-Source Voltage  
Rating  
30  
Units  
V
V
GS  
V
±
20  
Gate-Sou
r
ce Voltage  
Continuous Drain Current, V

GS

@ 10V

1  

Continuous Drain Current, V

GS

@ 10V

1  

Continuous Drain Current, V

GS

@ 10V

1  

Continuous Drain Current, V

GS

@ 10V

1  

100  
70  
A
A
A
A
I
D
@T
C
=25
℃  
I
D
@T
C
=100
℃  
I
D
@T
A
=25
℃  
30  
25  
I
D
@T
A
=70
℃  
Pulsed Drain Current

2  

Single Pulse
 
Avalanche Energy

3  

Avalanche Current  
192  
144.7  
53.8  
62.5  
I
DM  
EAS  
A
mJ  
A
I
AS  
Total Power Dissipation

4  

W
P
D
@T
C
=25
℃  
Total Power Dissipation

4  

Storage Temperature Range  
4.5  
W
℃
P
D
@T
A
=25
℃  
T
STG  
T
J  
-55 to 150  
Operating Junction Temperature Range  
℃
-55 to 150  
62  
Thermal Resistance Junction-ambient

1  

Thermal Resistance
 
Junction-Case

1  

℃
/W  
℃
/W  
R
θJA  
R
θJC  
2.4  
Copyright© Msksemi Incorporated  

AONR36366-MS  
Electrical Characteristics (T

J

=25 ,
 
unless otherwise noted)  
Symbol  
Parameter  
Conditions Min.
 
Typ. Max
 
Unit  
.
Drain-Source Breakdown  
Voltage  
BV
DSS  
V
GS
=0V , I
D
=250uA  
30  
—  
—  
V
—  
—  
—  
BVDSS Temperature  
Coefficient  
0.0213  
△
BV
DSS
/
△
T
J  
,
V/
℃  
Reference to 25
℃  
I
D
=1mA  
V
GS
=10V , I
D
=30A  
4
5.5  
6
R
DS(ON)  
Static Drain-Source On-  
Resistance

2  

V
GS
=4.5V , I
D
=15A  
5.2  
mΩ  
V
V
GS(th)  
Gate Threshold Voltage  
1.0  
2.5  
—  
-5.8  
—  
△
V
GS(th)  
V
GS(th)
Temperature Coefficient  
Drain-Source Leakage Current  
V
GS
=V
DS
, I
D
=250uA  
V
DS
=24V , V
GS
=0V ,  
mV/
℃  
—  
—  
—  
1
T
J
=25
℃  
I
DSS  
uA  
V
DS
=24V , V
GS
=0V ,  
5
—  
—  
T
J
=55
℃  
I
GSS  
gfs  
R
g  
Gate-Source Leakage Current  
Forward Transconductance  
Gate Resistance  
nA  
S
V
GS
=
±
20V , V
DS
=0V  
—  
—  
—  
—  
±
100  
—  
V
DS
=5V , I
D
=30A  
26.5  
Ω
V
DS
=0V , V
GS
=0V ,  
f=1MHz  
1.4  
—  
Total Gate Charge (4.5V)  
Gate-Source Charge  
Gate-Drain Charge  
Turn-On Delay
 
Time  
Rise Time  
31.6  
8.6  
Q
g  
Q
gs  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
—  
100  
V
DS
=15V ,
 
V
GS
=4.5V ,  
I
D
=15A  
nC  
Q
gd  
11.7  
9
T
d(on)  
V
DD
=15V , V
GS
=10V ,  
R
G
=3.
3
Ω  
19  
T
r  
ns  
T
d(off)  
Turn-Off Delay Time  
Fall Time  
58  
I
D
=15A  
15.2  
3075  
400  
315  
T
f  
C
iss  
C
oss  
C
rss  
I
S  
Input Capacitance  
V
DS
=15V , V
GS
=0V ,  
f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Continuous Source Current

1,6  

Pulsed Source Current

2,6  

Diode Forward Voltage

2  

pF  
A
A
V
—  
—  
—  
V
G
=V
D
=0V , Force  
Current  
I
SM  
192  
1
V
GS
=0V , I
S
=1A ,  
V
SD  
T
J
=25
℃  
Diode Characteristics  
Note ;  
2
1.The data tested by surface mounted on a 1 inch
 
FR-4 board with 2OZ copper.  
2.The data tested by pulsed , pulse width
≦
300us , duty cycle
≦
2%  
3.The EAS data shows Max. rating . The test condition is V
 
=25V,V =10V,L=0.1mH,I =34A  
DD  
GS  
AS  
4.The power dissipation is limited by 150
℃
junction temperature  
5 .The
 
data is theoretically the same as I  
and I  
DM  
, in real applications , should be limited by total power dissipation.  
D
Copyright© Msksemi Incorporated  

AONR36366-MS  
Typical Characteristics  
Fig.1 Typical Output Characteristics  
Fig.2 On-Resistance vs. G-S Voltage  
Fig.3 Forward Characteristics of Reverse  
Fig.4 Gate-Charge Characteristics  
Fig.5 Normalized V
GS(th)
vs. T
J  
Fig.6 Normalized R
DSON
vs. T
J  
Copyright© Msksemi Incorporated  

AONR36366-MS  
Fig.7 Capacitance  
Fig.8 Safe Operating Area  
Fig.9 Normalized Maximum Transient Thermal Impedance  
Fig.10 Switching Time Waveform  
Fig.11 Unclamped
 
Inductive Switching Waveform  
Copyright© Msksemi Incorporated  

AONR36366-MS  
DFN3X3-8
L
P
ackag
e
I
nformation  
Dimensions In Millimeters  
Symbol  
Min.  
0.70  
0.25  
0.10  
3.25  
3.00  
1.48  
Nom.  
0.75  
0.30  
0.15  
3.35  
3.10  
1.58  
0.13  
Max.  
0.80  
0.35  
0.25  
3.45  
3.20  
1.68  
A
b
c
D
D1  
D2  
D3  
–
–
E
E1  
E2  
e
3.20  
3.00  
2.39  
3.30  
3.15  
3.40  
3.20  
2.59  
2.49  
0.65BSC  
0.39  
H
L
0.30  
0.30  
0.50  
0.50  
0.40  
L1  
0.13  
–
–
M
0.15  
*
*
。
。
θ
10  
12  
REEL SPECIFICATION  
P/N  
PKG  
QTY  
AONR36366-MS  
DFN3X3-8L  
5000  
Copyright© Msksemi Incorporated  

AONR36366-MS  
Attention  
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Any and all MSKSEMI Semiconductor products described or contained herein do not
 
have specifications
 
that can  
handle applications that require extremely high levels of reliability, such as life-support
 
systems, aircraft’s control systems, or  
other applications whose failure can be reasonably expected to result in serious physical and/or material damage. Consult with  
your MSKSEMI Semiconductor representative
 
nearest you
 
before using any MSKSEMI Semiconductor products described  
or contained herein in such
 
applications.  
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at values that  
exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or other parameters) listed in  
products specificationsof any andall MSKSEMI Semiconductor products described orcontained herein.  
■
Specifications of any and all MSKSEMI Semiconductor products described or contained herein stipulate the  
performance, characteristics, and functions of the described products in the independent state, and are not guarantees of the  
performance, characteristics, and functions of the described products as mounted in the customer’s products or equipment.
T
o  
verify symptoms and states that cannot be evaluated in an independent device, the customer should always evaluate and test  
devices mounted in the customer’sproducts orequipment.  
■
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equipment, adopt safety measures so that these kinds of accidents
 
or events cannot occur. Such measures include but are  
not limited to protective circuits anderror prevention circuitsfor safedesign, redundant design, and structural design.  
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or contained  
herein are controlled under any of applicable local export control laws and regulations, such products must not be exported  
without obtaining the export license from theauthorities
 
concerned in accordance
 
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written permission of MSKSEMI Semiconductor.  
■
Information (including circuit diagrams and circuit parameters) herein is for example only ; it is not guaranteed for volume  
production. MSKSEMI Semiconductor believes information herein is accurate and
 
reliable, but no guarantees are made or  
implied regarding its use or any infringementsof intellectual property rights or other rightsof third parties.  
■
Any and all information described or contained herein are subject to change without notice due to  
product/technology improvement, etc. Whendesigning equipment, referto the “Delivery Specification” for the MSKSEMI  
Semiconductor productthat you intend to use.  
Copyright© Msksemi Incorporated