MSKSEMI-MS15N10

Part #MSKSEMI-MS15N10
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MSKSEMI-MS15N10
MS15N10  
Semiconductor  
Compiance  
Schematic diagram  
FEATURE  
Excellent package for good heat dissipation  
Ultra low gate charge  
Low reverse transfer capacitance  
Fast switching capability  
Avalanche energy specified  
VBR:100V  
RDS:70MR@10V  
ID:15A  
TO-252  
MAXIMUM RATINGS ( T

a

=25
℃
unless otherwise noted )  
Parameter  
Drain-Source Voltage  
Symbol  
V

DS  

Limit  
Unit  
100  
±20  
15  
V
V
Gate-Source Voltage  
V

GS  

①
Continuous Drain Current  
I

D  

A
②
Pulsed Drain Current  
I

DM  

60  
A
③
Single Pulsed Avalanche Energy  
Power Dissipation  
E

AS  

49  
mJ  
W
①
P

D  

45  
⑥
Thermal Resistance from Junction to Ambient  
Thermal Resistance from Junction to Case  
R

θJA  

100  
2.78  
℃
/W  
℃
/W  
℃
①
R

θJC  

-55~+150  
Operating Junction and  
T

J

,
T

stg  

Storage Temperature Range  

MS15N10  
Semiconductor  
Compiance  
T =25  
a
unless otherwise specified  
℃
Parameter  
Symbol  
Test Condition  
Min  
Typ  
Max  
Unit  
Off characteristics  
Drain-source breakdown voltage  
V
(BR) DSS  
V
GS
= 0V, I
D
=250µA  
100  
V
1.0  
100  
T

J

=25
℃  
T

J

=125
℃  
V
DS
=80V,  
V
GS
=0V  
I

DSS  

µA  
nA  
Zero gate voltage drain current  
Gate-body leakage current  
I

GSS  

V
DS
=0V, V
GS
=±20V  
±100  
④
On characteristics  
Gate-threshold voltage  
V
GS(th)  
R
DS(on)  
V
DS
=V

GS

, I
D
=250µA  
V
GS
=10V, I
D
=8A  
1.0  
2.5  
70  
3.0  
V
mΩ  
100  
Static drain-source on-sate resistance  
④ ⑤  
Dynamic characteristics  
Input capacitance  
C

iss  

C

oss  

C

rss  

Rg  
773  
46  
1500  
92  
V
DS
=25V,V
GS
=0V,  
f = 100KHz  
pF  
Ω
Output capacitance  
Reverse transfer capacitance  
Gate resistance  
43  
90  
f =1MHz  
1.5  
④ ⑤  
Switching characteristics  
Total gate charge  
Q

g  

Q

gs  

Q

gd  

36  
5.6  
18  
2.8  
7.4  
15  
33  
41  
6
V

GS

=10V, V

DS

=50V,  
I

D

=10A  
nC  
ns  
Gate-source charge  
14.8  
Gate-drain charge  
Turn-on delay time  
t
d  
(on)  
V

DD

=25V,R

L

=5Ω
,  
Turn-on rise time  
t
r  
t
d(off)  
t
f  
V

GS

=10V,R

G

=1.0Ω  
Turn-off delay time  
Turn-off fall time  
Drain-Source Diode Characteristics  
Drain-source diode forward voltage  
④
V

SD  

V
GS
=0V, I

S

=8A  
1.2  
15  
60  
V
A
A
Continuous drain-source diode forward  
current  
①
I

S  

②
Pulsed drain-source diode forward current  
I

SM  

Notes:  
1
.
T

C

=25
℃
Limited only by maximum temperature allowed.  
2
.
P

W

≤10μs, Duty cycle≤1%.  
3
.
EAS condition: V

DD

=25V,V

GS

=10V, L=0.5mH, Rg=25Ω Starting T

J

= 25
℃
.  
4
.
Pulse Test : Pulse Width≤300µs, duty cycle ≤2%.  
5
.
Guaranteed by design, not subject to production.  
6
.
The value of RθJA is measured with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with T

a

=25
℃
.  

MS15N10  
Semiconductor  
Compiance  
PACKAGE MECHANICAL DATA  
D
A
D1  
c
h
φ
A1  
D2  
b
e
Dimensions In Millimeters  
Dimensions In Inches  
Symbol  
Min.  
2.200  
0.000  
0.635  
0.460  
6.500  
5.100  
Max.  
2.400  
0.127  
0.770  
0.580  
6.700  
5.460  
Min.  
0.087  
0.000  
0.025  
0.018  
0.256  
0.201  
Max.  
A
A1  
b
c
D
D1  
D2  
E
e
L
L1  
L2  
L3  
L4  
Φ
θ
0.094  
0.005  
0.030  
0.023  
0.264  
0.215  
4.830 REF.  
0.190 REF.  
6.000  
2.186  
9.712  
6.200  
2.386  
10.312  
2.900 REF.  
0.236  
0.086  
0.382  
0.244  
0.094  
0.406  
0.114 REF.  
0.063 REF.  
1.400  
1.700  
0.055  
0.067  
1.600 REF.  
0.600  
1.100  
0°  
1.000  
1.300  
8°  
0.024  
0.043  
0°  
0.039  
0.051  
8°  
h
0.000  
0.300  
0.000  
0.012  
V
5.250 REF.  
0.207 REF.  
REEL SPECIFICATION  
P/N  
PKG  
QTY  
MS15N10  
TO-252  
2500  

MS15N10  
Semiconductor  
Compiance  
Attention  
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Any and all MSKSEMI Semiconductor products described or contained herein do not
 
have specifications  
that can handle applications that require extremely high levels of reliability, such as life-support
 
systems,  
aircraft’s control systems, or other applications whose failure can be reasonably expected to result in serious  
physical and/or material damage. Consult with your MSKSEMI Semiconductor representative
 
nearest you  
before using any MSKSEMI Semiconductor products described or contained herein in such
 
applications.  
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at values that exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or  
other parameters) listed in products specificationsof any andall MSKSEMI Semiconductor products described  
orcontained herein.  
■
Specifications of any and all MSKSEMI Semiconductor products described or contained herein stipulate the  
performance, characteristics, and functions of the described products in the independent state, and are not  
guarantees of the performance, characteristics, and functions of the described products as mounted in the  
customer’s products or equipment. To verify symptoms and states that cannot be evaluated in an independent  
device, the customer should always evaluate and test devices mounted in the customer’sproducts orequipment.  
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semiconductor products fail with someprobability. It is possiblethat these probabilistic failures could give rise to  
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or events cannot occur. Such measures include but are not limited to protective circuits anderror prevention  
circuitsfor safedesign, redundant design, and structural design.  
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without the prior written permission of MSKSEMI Semiconductor.  
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Information (including circuit diagrams and circuit parameters) herein is for example only ; it is not  
guaranteed for volume production. MSKSEMI Semiconductor believes information herein is accurate and
 
reliable,  
but no guarantees are made or implied regarding its use or any infringementsof intellectual property rights or  
other rightsof third parties.  
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Any and all information described or contained herein are subject to change without notice due to  
product/technology improvement, etc. Whendesigning equipment, referto the “Delivery Specification” for the  
MSKSEMI Semiconductor productthat you intend to use.