MSKSEMI-NTTFS5826NL-MS

Part #MSKSEMI-NTTFS5826NL-MS
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MSKSEMI-NTTFS5826NL-MS
NTTFS5826NL-MS  
Product specification  

NTTFS5826NL-MS  
Description  
The NTTFS5826NL-MS uses advanced trench technology to provide excellent R
DS(ON)
, low gate charge and  
operation with gate voltages as low as 4.5V. This device is suitable for use as a Battery protection or in other Switching application.  
Application  
Features  
Battery protection  
VDS = 60V ID =20 A  
Load switch  
RDS(ON) < 40mΩ @ VGS=10V  
Uninterruptible power supply  
Reference News  
PACKAGE OUTLINE  
N-Channel MOSFET  
Marking  
MSKSEMI  
5826NL  
N60  
PIN1  
DFN3X3-8L  
Absolute Maximum Ratings (TC=25
℃
unless otherwise noted)  
Symbol  
Parameter  
Rating  
Units  
V
DS  
Drain-Source Voltage  
60  
V
V
GS  
V
A
Gate-Sou
r
ce Voltage  
Continuous Drain Current, V

GS

@ 10V

1  

Continuous Drain Current, V

GS

@ 10V

1  

Pulsed Drain Current

2  

±
20  
20  
I
D
@T
A
=25
℃  
I
D
@T
A
=70
℃  
I
DM  
10  
A
46  
A
EAS  
Single Pulse
 
Avalanche Energy

3  

Avalanche Current  
25.5  
mJ  
A
I
AS  
20  
Total Power Dissipation

4  

34.7  
W
P
D
@T
C
=25
℃  
-55 to 175  
-55 to 175  
T
STG  
T
J  
Storage Temperature Range  
Operating Junction Temperature Range  
℃
℃
1
Thermal Resistance
 
Junction-Ambient  
62  
℃
/W  
R
θJA  
Copyright© Msksemi Incorporated  

NTTFS5826NL-MS  
AElectrical Characteristics
(T

J

=25
℃
unless otherwise specified)  
Symbol  
Parameter  
Test Condition
 
Min. Typ. Max. Units  
Off Characteristic  
V

GS

=0V, I

D

=250μA  
V

DS

=60V, V

GS

= 0V,  
V

DS

=0V, V

GS

= ±20V  
Drain-Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
Gate to Body Leakage Current  
60  
V
V

(BR)DSS  

I
DSS  
–
–
–
–
1.0  
μA  
μA  
–
–
I
GSS  
±100  
On Characteristics  
V

DS

=V

GS

, I

D

=250μA  
V

GS

=10V, I

D

=5A  
V

GS

=4.5V, I

D

=3A  
Gate Threshold Voltage  
1.0  
1.6  
31  
36  
2.5  
40  
50  
V
V

GS(th)  

Static Drain-Source on-Resistance  
note3  
–
–
mΩ  
R

DS(on)  

Dynamic Characteristics  
C

iss  

C

oss  

C

rss  

Q

g  

Input Capacitance  
1148  
58.5  
49.4  
20.3  
3.7  
pF  
pF  
pF  
nC  
nC  
nC  
–
–
–
–
–
–
–
–
–
–
–
–
V

DS

=25V, V

GS

=0V,  
f=1.0MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Total Gate Charge  
V

DS

=30V, I

D

=2.5A,  
V

GS

=10V  
Q

gs  

Q

gd  

Gate-Source Charge  
Gate-Drain(“Miller”) Charge  
5.3  
Switching Characteristics  
t
d(on)  
t

r  

Turn-on Delay Time  
Turn-on Rise Time  
Turn-off Delay Time  
Turn-off Fall Time  
7.6  
20  
15  
24  
ns  
ns  
ns  
ns  
–
–
–
–
–
–
–
–
V

DS

=30V, I

D

=5A,  
t

d(off)  

t

f  

R

G

=1.8Ω, V

GS

=10V  
Drain-Source Diode Characteristics and Maximum Ratings  
Maximum Continuous
 
Drain to Source Diode Forward  
Current  
5
A
A
I
S  
–
–
–
–
–
–
–
I
SM  
V

SD  

trr  
Maximum Pulsed Drain to Source Diode Forward Current  
20  
1.2  
Drain to Source Diode Forward  
V

GS

=0V, I

S

=5A  
V
–
Voltage  
Body Diode Reverse Recovery Time  
29  
ns  
nC  
–
–
IF=5A, dI/dt=100A/μs  
Body Diode Reverse Recovery  
Charge  
Qrr  
43  
Notes:1. Repetitive Rating: Pulse Width Limited by Maximum Junction Temperature  
2. EAS condition : T
J
=25
℃
,V
DD
=30V,V
G
=10V,L=0.5mH,Rg=25Ω,I
AS
=8.7A  
3. Pulse Test: Pulse Width≤300μs, Duty Cycle≤0.5%  
Copyright© Msksemi Incorporated  

NTTFS5826NL-MS  
Typical Performance Characteristics  
Figure1:
Output Characteristics  
Figure 2:
Typical Transfer Characteristics  
Figure 3:
On-resistance vs. Drain Current  
Figure 4
: Body Diode Characteristics  
Figure 5:
Gate Charge Characteristics  
Figure 6:
Capacitance Characteristics  
Copyright© Msksemi Incorporated  

NTTFS5826NL-MS  
Figure 7:
Normalized Breakdown Voltage vs.  
Figure 8:
Normalized on Resistance vs.  
Junction Temperature  
Junction Temperature  
Figure 9:
Maximum Safe Operating Area  
Figure 10:
Maximum Continuous Drain Current vs.  
Ambient Temperature  
Figure.11:
Maximum Effective  
Transient Thermal Impedance, Junction-to-Ambient  
Copyright© Msksemi Incorporated  

NTTFS5826NL-MS  
Test Circuit  
Figure1:Gate Charge Test Circuit & Waveform  
Figure 2: Resistive Switching Test Circuit & Waveforms  
Figure 3:Unclamped Inductive Switching Test Circuit & Waveforms  
Copyright© Msksemi Incorporated  

NTTFS5826NL-MS  
DFN3X3-8
L
P
ackag
e
I
nformation  
Dimensions In Millimeters  
Symbol  
Min.  
0.70  
0.25  
0.10  
3.25  
3.00  
1.48  
Nom.  
0.75  
0.30  
0.15  
3.35  
3.10  
1.58  
0.13  
Max.  
0.80  
0.35  
0.25  
3.45  
3.20  
1.68  
A
b
c
D
D1  
D2  
D3  
–
–
E
E1  
E2  
e
3.20  
3.00  
2.39  
3.30  
3.15  
2.49  
3.40  
3.20  
2.59  
0.65BSC  
H
L
0.30  
0.30  
0.39  
0.40  
0.13  
0.50  
0.50  
L1  
–
–
M
0.15  
*
*
。
。
θ
10  
12  
REEL SPECIFICATION  
P/N  
PKG  
QTY  
NTTFS5826NL-MS  
DFN3X3-8L  
5000  
Copyright© Msksemi Incorporated  

NTTFS5826NL-MS  
Attention  
■
Any and all MSKSEMI Semiconductor products described or contained herein do not
 
have specifications
 
that can  
handle applications that require extremely high levels of reliability, such as life-support
 
systems, aircraft’s control systems, or  
other applications whose failure can be reasonably expected to result in serious physical and/or material damage. Consult with  
your MSKSEMI Semiconductor representative
 
nearest you
 
before using any MSKSEMI Semiconductor products described  
or contained herein in such
 
applications.  
■
MSKSEMI Semiconductor assumes no responsibility for equipment failures that result from using products  
at values that  
exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or other parameters) listed in  
products specificationsof any andall MSKSEMI Semiconductor products described orcontained herein.  
■
Specifications of any and all MSKSEMI Semiconductor products described or contained herein stipulate the  
performance, characteristics, and functions of the described products in the independent state, and are not guarantees of the  
performance, characteristics, and functions of the described products as mounted in the customer’s products or equipment.
T
o  
verify symptoms and states that cannot be evaluated in an independent device, the customer should always evaluate and test  
devices mounted in the customer’sproducts orequipment.  
■
MSKSEMI Semiconductor. strives to supply high-quality high-reliability products. However, any and all semiconductor  
products fail with someprobability. It is possiblethat these probabilistic failures could give rise to accidents or events that could  
endanger human lives, that could give rise to smoke or fire, or that could cause damage to other property. When designing  
equipment, adopt safety measures so that these kinds of accidents
 
or events cannot occur. Such measures include but are  
not limited to protective circuits anderror prevention circuitsfor safedesign, redundant design, and structural design.  
■
In the event that any or all MSKSEMI Semiconductor products(including technical data, services) described
 
or contained  
herein are controlled under any of applicable local export control laws and regulations, such products must not be exported  
without obtaining the export license from theauthorities
 
concerned in accordance
 
with the above law.  
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mechanical, including photocopying and recording, or any information storage or retrieval system, or otherwise, without the prior  
written permission of MSKSEMI Semiconductor.  
■
Information (including circuit diagrams and circuit parameters) herein is for example only ; it is not guaranteed for volume  
production. MSKSEMI Semiconductor believes information herein is accurate and
 
reliable, but no guarantees are made or  
implied regarding its use or any infringementsof intellectual property rights or other rightsof third parties.  
■
Any and all information described or contained herein are subject to change without notice due to  
product/technology improvement, etc. Whendesigning equipment, referto the “Delivery Specification” for the MSKSEMI  
Semiconductor productthat you intend to use.  
Copyright© Msksemi Incorporated