MSKSEMI-STU417S
| Part # | MSKSEMI-STU417S |
| Download | MSKSEMI-STU417S |
STU417S
Semiconductor Compiance
Description
The
STU417S
uses advanced trench technology
to provide excellent R
DS(ON)
, low gate charge and
operation with gate voltages as low as 4.5
V
. This
device is suitable for use as a
TO-252
Battery protection or in other Switching application.
D
General Features
V
DS
= -40V
I
D
=-40A
G
R
DS(ON)
< 21 m
Ω
@
V
GS
=10V
Application
S
P-Channel MOSFET
Battery protection
Load switch
Uninterruptible power supply
Absolute Maximum Ratings (T
C
=25
℃
unless otherwise noted)
Symbol
VDS
Parameter
Rating
Units
V
Drain-Source Voltage
-40
±
20
-40
VGS
V
Gate-Sou
r
ce Voltage
I
D
@T
C
=25
℃
I
D
@T
C
=100
℃
IDM
Continuous Drain Current, V
GS
@ 10V
1
Continuous Drain Current, V
GS
@ 10V
1
Pulsed Drain Current
2
A
-25
A
-144
A
P
D
@T
C
=25
℃
TSTG
T
o
tal Power Dissipation
4
Storage
T
e
mperature Range
30
W
-55 to 150
-55 to 150
62
℃
T
J
Operating Junction
T
e
mperature Range
Thermal Resistance Junction-ambient
1
Thermal Resistance Junction-Case
1
℃
R
θ
JA
℃
/W
℃
/W
R
θ
JC
2.5
STU417S
Semiconductor Compiance
Electrical Characteristics (T
J
=25
℃
, unless otherwise noted)
Symbol
Parameter
Conditions
Min
Typ
Max Units
Off Characteristics
Drain-Sourtce Breakdown Voltage
Zero Gate Voltage Drain Current
Gate-Source Leakage Current
V
GS
=0V,I
D
=-250
μ
A
V
GS
=0V, V
DS
=-40V
V
GS
=
±
20V, V
DS
=0A
-40
—
—
—
—
—
-1
V
BV
DSS
μ
A
nA
I
DSS
I
GSS
—
±
100
On Characteristics
V
GS(th)
GATE-Source Threshold Voltage
Drain-Source On Resistance
Forward Transconductance
V
GS
=V
DS
, I
D
=-250
μ
A
V
GS
=-10V,I
D
=-20A
V
GS
=-4.5V,I
D
=-15A
V
DS
=-5V, I
D
=-5A
-1.1
—
-1.7
15
-2.5
21
V
m
Ω
S
R
DS(ON)
—
21
32
15
—
—
G
FS
Dynamic Characteristics
Input Capacitance
—
—
—
2050
260
—
—
—
C
iss
C
oss
C
rss
Output Capacitance
V
DS
=-20V, V
GS
=0V, f=1MHz
pF
Reverse Transfer Capacitance
150
Switching Characteristics
Turn-On Delay Time
—
—
—
—
—
—
—
10
24
40
9
—
—
—
—
—
—
—
ns
ns
ns
ns
nC
nC
nC
t
d(on)
t
r
t
d(off)
t
f
Rise Time
V
DS
=-20V, R
L
=1.6
Ω
R
GEN
=3
Ω
, V
GS
=-10V
Turn-Off Delay Time
Fall Time
T
o
tal Gate Charge
Gate-Source Charge
Gate-Drain
“
Miller
”
Charge
45
6
Q
g
V
GS
=-10V, V
DS
=-20V,
I
D
=-8A
Q
gs
Q
gd
11
Drain-Source Diode Characteristics
Source-Drain Diode Forward Voltage
Source-Drain Current(Body Diode)
V
GS
=0V,I
S
=-10A,
—
—
-1.2
V
V
SD
—
—
-36
A
I
SD
Notes:
1.Repetitive Rating: Pulse width limited by maximum junction temperature
STU417S
Semiconductor Compiance
Typical Characteristics
Figure1. Power Dissipation
Figure2. Drain Current
T
J
-Junction Temperature(
℃
)
T
J
-Junction Temperature(
℃
)
Figure3. Output Characteristics
Figure4. Transfer Characteristics
Figure5. Capacitance
Figure6. R
DS(ON)
vs Junction Temperature
-VDS Drain-to-Source Voltage(V)
STU417S
Semiconductor Compiance
Figure7. V
GS(th)
vs Junction Temperature
Figure8. Gate Charge Waveforms
Qg(nC)
Figure9. Normalized Maximum Transient Thermal Impedance
STU417S
Semiconductor Compiance
PACKAGE MECHANICAL DATA
D
A
D1
c
h
φ
A1
D2
b
e
Dimensions In Millimeters
Dimensions In Inches
Symbol
Min.
2.200
0.000
0.635
0.460
6.500
5.100
Max.
2.400
0.127
0.770
0.580
6.700
5.460
Min.
0.087
0.000
0.025
0.018
0.256
0.201
Max.
0.094
A
A1
b
c
D
D1
D2
E
e
L
0.005
0.030
0.023
0.264
0.215
4.830 REF.
0.190 REF.
6.000
2.186
9.712
6.200
2.386
10.312
0.236
0.086
0.382
0.244
0.094
0.406
L1
L2
L3
L4
Φ
θ
2.900 REF.
0.114 REF.
0.063 REF.
1.400
1.700
0.055
0.067
1.600 REF.
0.600
1.100
0°
1.000
1.300
8°
0.024
0.043
0°
0.039
0.051
8°
h
0.000
0.300
0.000
0.012
V
5.250 REF.
0.207 REF.
REEL SPECIFICATION
QTY
P/N
PKG
STU417S
TO-252
2500
STU417S
Semiconductor Compiance
Attention
■
Any and all MSKSEMI Semiconductor products described or contained herein do not have specifications
that can handle applications that require extremely high levels of reliability, such as life-support systems,
aircraft’s control systems, or other applications whose failure can be reasonably expected to result in serious
physical and/or material damage. Consult with your MSKSEMI Semiconductor representative nearest you
before using any MSKSEMI Semiconductor products described or contained herein in such applications.
■
MSKSEMI Semiconductor assumes no responsibility for equipment failures that result from using products
at values that exceed, even momentarily, rated values (such as maximum ratings, operating condition ranges, or
other parameters) listed in products specificationsof any andall MSKSEMI Semiconductor products described
orcontained herein.
■
Specifications of any and all MSKSEMI Semiconductor products described or contained herein stipulate the
performance, characteristics, and functions of the described products in the independent state, and are not
guarantees of the performance, characteristics, and functions of the described products as mounted in the
customer’s products or equipment. To verify symptoms and states that cannot be evaluated in an independent
device, the customer should always evaluate and test devices mounted in the customer’sproducts orequipment.
■
MSKSEMI Semiconductor. strives to supply high-quality high-reliability products. However, any and all
semiconductor products fail with someprobability. It is possiblethat these probabilistic failures could give rise to
accidents or events that could endanger human lives, that could give rise to smoke or fire, or that could cause
damage to other property. When designing equipment, adopt safety measures so that these kinds of accidents
or events cannot occur. Such measures include but are not limited to protective circuits anderror prevention
circuitsfor safedesign, redundant design, and structural design.
■
In the event that any or all MSKSEMI Semiconductor products(including technical data, services) described
or contained herein are controlled under any of applicable local export control laws and regulations, such
products must not be exported without obtaining the export license from theauthorities concerned in
accordance with the above law.
■
No part of this publication may be reproduced or transmitted in any form or by any means, electronic or
mechanical, including photocopying and recording, or any information storage or retrieval system, or otherwise,
without the prior written permission of MSKSEMI Semiconductor.
■
Information (including circuit diagrams and circuit parameters) herein is for example only ; it is not
guaranteed for volume production. MSKSEMI Semiconductor believes information herein is accurate and
reliable, but no guarantees are made or implied regarding its use or any infringementsof intellectual property
rights or other rightsof third parties.
■
Any and all information described or contained herein are subject to change without notice due to
product/technology improvement, etc. Whendesigning equipment, referto the “Delivery Specification” for the
MSKSEMI Semiconductor productthat you intend to use.
