NXP-Semicon-BGU8L1115

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NXP-Semicon-BGU8L1115
BGU8L1  
ꢀ
1
2
6
;
SiGe:C low-noise amplifier MMIC for LTE  
Rev. 3 — 16 January 2017  
Product data sheet  
1. General
 
description  
The BGU8L1 is, also known as the LTE1001L, a Low-Noise Amplifier (LNA) for LTE  
receiver applications, available in a small plastic 6-pin extremely thin leadless package.  
The BGU8L1 requires one external matching inductor.  
The BGU8L1 adapts itself to the changing environment resulting from co-habitation of  
different radio systems in modern cellular handsets. It has been designed for low power  
consumption and optimal performance. At low jamming power levels, it delivers 14 dB  
gain at a noise figure of 0.7 dB. During high-power levels, it temporarily increases its bias  
current to improve sensitivity.  
The BGU8L1 is optimized for 728 MHz to 960 MHz.  
2. Features
 
and benefits  
Operating frequency from 728 MHz to 960 MHz  
Noise figure = 0.7 dB  
Gain = 14 dB  
High input 1 dB compression point of
3 dBm  
High in band IP3

i

of 2 dBm  
Supply voltage 1.5 V to 3.1 V  
Self-shielding package concept  
Integrated supply decoupling capacitor  
Optimized performance at a supply current of 4.6 mA  
Power-down mode current consumption < 1
A  
Integrated temperature stabilized bias for easy design  
Require only one input matching inductor  
Output DC decoupled  
ESD protection on all pins (HBM > 2 kV)  
Integrated matching for the output  
Available in a 6-pin leadless package 1.1 mm
0.7 mm
0.37 mm; 0.4 mm pitch:  
SOT1232  
180 GHz transit frequency – SiGe:C technology  
Moisture sensitivity level 1  

BGU8L1  
NXP Semiconductors  
SiGe:C low-noise amplifier MMIC for LTE  
3. Applications  
LNA for LTE reception in smart phones  
Feature phones  
T
a
blet PCs  
RF front-end modules  
4. Quick
 
reference data  
Table 1.  
Quick reference data  
f = 882 MHz; V

CC

= 2.8 V; V

I(ENABLE)

0.8 V; T

amb

= 25 °C; input matched to 50
using a 15 nH inductor;  
unless otherwise specified.  
Symbol  
V

CC  

Parameter  
Conditions  
Min  
1.5  
2.6  
12.5  
–
Typ  
–
Max  
3.1  
6.6  
16.5  
1.3  
–
Unit  
V
supply voltage  
I

CC  

supply current  
4.6  
14.5  
0.7  
3.0  
+2.0  
mA  
dB  
[1]  
[1][2][3]  
[1][3]  
G

p  

power gain  
NF  
noise figure  
dB  
P

i(1dB)  

IP3

i  

input power at 1 dB gain compression  
input third-order intercept point  
7.0  
3.0  
dBm  
dBm  
[1][3]  
–
[1] E-UTRA
 
operating band 5 (869 MHz to 894 MHz).  
[2] PCB
 
losses are subtracted.  
[3] Guaranteed
 
by device design; not tested in production.  
5. Ordering
 
information  
Table 2.  
Ordering information  
Type number  
Package  
Name  
Description  
Version  
BGU8L1  
XSON6  
plastic extremely thin small outline package; no leads; 6 terminals;  
SOT1232  
body 1.1
0.7
0.37 mm  
BGU8L1  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.
V
.
2
017. All rights reserved.  
Product data sheet  
Rev. 3 — 16 January 2017  
2 of 11  

BGU8L1  
NXP Semiconductors  
SiGe:C low-noise amplifier MMIC for LTE  
6. Block
 
diagram  
9
&&  
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DDDꢀꢁꢂꢂꢃꢃꢄ  
Fig 1.
 
Block diagram  
7. Pinning
 
information  
7.1 Pinning  
*1’B5)  
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Fig 2.
 
Pin configuration  
7.2 Pin
 
description  
Table 3.  
Pin description  
Symbol  
GND  
Pin  
Description  
ground  
1
2
3
4
5
6
V

CC  

supply voltage  
RF output  
ground RF  
RF input  
RF_OUT  
GND_RF  
RF_IN  
ENABLE  
enable  
BGU8L1  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.
V
.
2
017. All rights reserved.  
Product data sheet  
Rev. 3 — 16 January 2017  
3 of 11  

BGU8L1  
NXP Semiconductors  
SiGe:C low-noise amplifier MMIC for LTE  
8. Limiting
 
values  
Table 4.  
Limiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134). Absolute maximum ratings are given as limiting  
values of stress conditions during operation, that must not be exceeded under the worst probable conditions.  
Symbol  
V

CC  

Parameter  
Conditions  
Min  
0.5  
0.5  
0.5  
0.5  
–
Max  
+5.0  
+5.0  
+5.0  
+5.0  
26  
Unit  
V
[1]  
[1][2]  
supply voltage  
RF input AC coupled  
V

I(ENABLE)

< V

CC

+ 0.6 V  
DC; V

I(RF_IN)

< V

CC

+ 0.6 V  
DC; V

I(RF_OUT)

< V

CC

+ 0.6 V  
V

I(ENABLE)  

V

I(RF_IN)  

V

I(RF_OUT)  

P

i  

input voltage on pin ENABLE  
input voltage on pin RF_IN  
input voltage on pin RF_OUT  
input power  
V
[1][2]  
V
[1][2][3]  
[1]  
V
dBm  
mW  
°C  
°C  
kV  
P

tot  

total power dissipation  
storage temperature  
junction temperature  
electrostatic discharge voltage  
T

sp

130 °C  
–
55  
T

stg  

65  
–
+150  
150  
2  
T

j  

V

ESD  

Human Body Model (HBM)  
according to ANSI/ESDA/JEDEC  
standard JS-001  
–
Charged Device Model (CDM)  
according to JEDEC standard  
JESD22-C101C  
–
1  
kV  
[1] Stressed
 
with pulses of 1 s in duration. V

CC

connected to a power supply of 2.8 V with 500 mA current limit
.
 
[2] Warning:
 
Due to internal ESD diode protection, to avoid excess current, the applied DC voltage must not exceed V

CC

+ 0.6 V or 5.0
V
.  
[3] The
 
RF output is AC coupled through internal DC blocking capacitors.  
9. Recommended
 
operating conditions  
Table 5.  
Symbol  
V

CC  

Operating conditions  
Parameter  
Conditions  
Min  
1.5  
40  
–
Typ  
Max  
3.1  
+85  
0.3  
–
Unit  
V
supply voltage  
–
T

amb  

ambient temperature  
input voltage on pin ENABLE  
+25  
C  
V
V

I(ENABLE)  

OFF state  
ON state  
–
–
0.8  
V
10. Thermal characteristics  
Table 6.  
Symbol  
R

th(j-sp)  

Thermal characteristics  
Parameter  
Conditions  
Typ  
Unit  
thermal resistance from junction to  
solder point  
225  
K/W  
BGU8L1  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.
V
.
2
017. All rights reserved.  
Product data sheet  
Rev. 3 — 16 January 2017  
4 of 11  

BGU8L1  
NXP Semiconductors  
SiGe:C low-noise amplifier MMIC for LTE  
11. Characteristics  
Table 7.  
Characteristics at V

CC

= 1.8 V  
728 MHz
f
960 MHz; V

CC

= 1.8 V; V

I(ENABLE)

0.8 V; T

amb

= 25
C; input matched to 50
using a 15 nH inductor;  
unless otherwise specified.  
Symbol Parameter  
Conditions  
V

I(ENABLE)

0.8 V  
V

I(ENABLE)

0.3 V  
f = 740 MHz  
f = 882 MHz  
f = 943 MHz  
f = 740 MHz  
f = 882 MHz  
f = 943 MHz  
f = 740 MHz  
f = 882 MHz  
f = 943 MHz  
f = 740 MHz  
f = 882 MHz  
f = 943 MHz  
f = 740 MHz  
f = 882 MHz  
f = 943 MHz  
f = 740 MHz  
f = 882 MHz  
f = 943 MHz  
Min  
Typ  
4.2  
–
Max Unit  
6.2 mA  
1.0
A  
I

CC  

supply current  
2.2  
–
–
[1]  
[2]  
G

p  

power gain  
14.5  
–
dB  
12.5 14.5 16.5
 
dB  
[3]  
–
–
–
–
–
–
–
–
–
–
–
–
–
–
14.0  
9.0  
–
–
–
–
–
–
–
–
–
–
–
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
[1]  
RL

in  

RL

out  

ISL  
input return loss  
output return loss  
isolation  
[2]  
13.0  
11.0  
12.0  
20.0  
20.0  
25.0  
25.0  
26.0  
0.7  
[3]  
[1]  
[2]  
[3]  
[1]  
[2]  
[3]  
[1][4]  
[2][4][5]  
[3][4]  
[1]  
NF  
noise figure  
0.7  
1.3 dB  
0.8  
–
–
dB  
P

i(1dB)  

input power at 1 dB  
gain compression  
11.0  
dBm  
dBm  
dBm  
dBm  
dBm  
dBm  
–
[2][5]  
[3]  
14.0
10.0 –  
–
–
9.0  
5.0  
–
[1]  
IP3

i  

input third-order intercept point
 
f = 740 MHz  
f = 882 MHz  
–
[2][5]  
[3]  
8.0
3.0  
–
f = 943 MHz  
–
2.0  
–
K
Rollett stability factor  
1
–
–
–
–
–
t

on  

t

off  

turn-on time  
turn-off time  
time from V

I(ENABLE)

ON to 90 % of the gain  
time from V

I(ENABLE)

OFF to 10 % of the gain  
4
1
s  
–
s  
[1] E-UTRA
 
operating band 17 (734 MHz to 746 MHz).  
[2] E-UTRA
 
operating band 5 (869 MHz to 894 MHz).  
[3] E-UTRA
 
operating band 8 (925 MHz to 960 MHz).  
[4] PCB
 
losses are subtracted.  
[5] Guaranteed
 
by device design; not tested in production.  
BGU8L1  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.
V
.
2
017. All rights reserved.  
Product data sheet  
Rev. 3 — 16 January 2017  
5 of 11  

BGU8L1  
NXP Semiconductors  
SiGe:C low-noise amplifier MMIC for LTE  
Table 8.  
Characteristics at V

CC

= 2.8 V  
728 MHz
f
960 MHz; V

CC

= 2.8 V; V

I(ENABLE)

0.8 V; T

amb

= 25
C; input matched to 50
using a 15 nH inductor;  
unless otherwise specified.  
Symbol Parameter  
Conditions  
V

I(ENABLE)

0.8 V  
V

I(ENABLE)

0.3 V  
f = 740 MHz  
f = 882 MHz  
f = 943 MHz  
f = 740 MHz  
f = 882 MHz  
f = 943 MHz  
f = 740 MHz  
f = 882 MHz  
f = 943 MHz  
f = 740 MHz  
f = 882 MHz  
f = 943 MHz  
f = 740 MHz  
f = 882 MHz  
f = 943 MHz  
f = 740 MHz  
f = 882 MHz  
f = 943 MHz  
f = 740 MHz  
f = 882 MHz  
f = 943 MHz  
Min Typ
 
Max Unit  
I

CC  

supply current  
2.6 4.6
 
6.6 mA  
–
–
–
1
–
A  
[1]  
[2]  
G

p  

power gain  
14.5  
dB  
12.5 14.5
 
16.5 dB  
[3]  
–
–
–
–
–
–
–
–
–
–
–
–
–
–
14.0  
9.0  
–
–
–
–
–
–
–
–
–
–
–
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
dB  
[1]  
RL

in  

RL

out  

ISL  
input return loss  
output return loss  
isolation  
[2]  
14.0  
12.0  
12.0  
20.0  
20.0  
26.0  
26.0  
26.0  
0.7  
[3]  
[1]  
[2]  
[3]  
[1]  
[2]  
[3]  
[1][4]  
[2][4][5]  
[3][4]  
[1]  
NF  
noise figure  
0.7 1.3 dB  
0.8  
–
–
–
–
–
–
–
–
dB  
P

i(1dB)  

input power at 1 dB  
gain compression  
5.0  
dBm  
dBm  
dBm  
dBm  
dBm  
dBm  
–
[2][5]  
[3]  
7.0
3.0  
–
–
3.0  
[1]  
IP3

i  

input third-order intercept point  
1.0  
[2][5]  
[3]  
3.0 +2.0  
–
2.0  
K
Rollett stability factor  
turn-on time  
1
–
–
–
–
t

on  

t

off  

time from V

I(ENABLE)

ON to 90 % of the gain  
time from V

I(ENABLE)

OFF to 10 % of the gain  
4.0
s  
1.0
s  
turn-off time  
–
[1] E-UTRA
 
operating band 17 (734 MHz to 746 MHz).  
[2] E-UTRA
 
operating band 5 (869 MHz to 894 MHz).  
[3] E-UTRA
 
operating band 8 (925 MHz to 960 MHz).  
[4] PCB
 
losses are subtracted.  
[5] Guaranteed
 
by device design; not tested in production.  
BGU8L1  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.
V
.
2
017. All rights reserved.  
Product data sheet  
Rev. 3 — 16 January 2017  
6 of 11  

BGU8L1  
NXP Semiconductors  
SiGe:C low-noise amplifier MMIC for LTE  
12. Package outline  
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Fig 3.
 
Package outline SOT1232 (XSON6)  
BGU8L1  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.
V
.
2
017. All rights reserved.  
Product data sheet  
Rev. 3 — 16 January 2017  
7 of 11  

BGU8L1  
NXP Semiconductors  
SiGe:C low-noise amplifier MMIC for LTE  
13. Handling information  
CAUTION  
This device is sensitive to ElectroStatic Discharge (ESD). Observe precautions for handling  
electrostatic sensitive devices.  
Such precautions are described in the
ANSI/ESD S20.20
,
IEC/ST 61340-5
,
JESD625-A
or  
equivalent standards.  
14. Abbreviations  
Table 9.  
Acronym  
ESD  
Abbreviations  
Description  
ElectroStatic Discharge  
Evolved UMTS
T
e
rrestrial Radio Access  
Human Body Model  
E-UTRA  
HBM  
LNA  
Low-Noise Amplifier  
LTE  
Long
T
e
rm Evolution  
MMIC  
PCB  
Monolithic Microwave Integrated Circuit  
Printed-Circuit Board  
SiGe:C  
Silicon Germanium Carbon  
15. Revision history  
Table 10.
 
Revision history  
Document ID  
BGU8L1 v.3  
Modifications:  
BGU8L1 v.2  
Modifications:  
Release date  
20170116  
Data sheet status  
Change notice  
Supersedes  
Product data sheet  
–
BGU8L1 v.2  
•
Section 1
: added LTE1001L according to our new naming convention  
20160404  
Product data sheet  
–
BGU8L1 v.1  
•
T
a
ble 4
: updated input power  
•
T
a
ble 7
: updated  
•
T
a
ble 8
: updated  
BGU8L1 v.1  
20140603  
Product data sheet  
–
–
BGU8L1  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.
V
.
2
017. All rights reserved.  
Product data sheet  
Rev. 3 — 16 January 2017  
8 of 11  

BGU8L1  
NXP Semiconductors  
SiGe:C low-noise amplifier MMIC for LTE  
16. Legal information  
16.1 Data
 
sheet status  
Document status

[1][2]  

Product status

[3]  

Development  
Definition  
Objective [short] data sheet  
This document contains data from the objective specification for product development.  
This document contains data from the preliminary specification.  
This document contains the product specification.  
Preliminary [short] data sheet
 
Qualification  
Product [short] data sheet
 
Production  
[1]  
[2]  
[3]  
Please consult the most recently issued document before initiating or completing a design.  
The term ‘short data sheet’ is explained in section “Definitions”.  
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status  
information is available on the Internet at URL

.  
Suitability for use —
NXP Semiconductors products are not designed,  
16.2 Definitions  
authorized or warranted to be suitable for use in life support, life-critical or  
safety-critical systems or equipment, nor in applications where failure or  
malfunction of an NXP Semiconductors product can reasonably be expected  
to result in personal injury, death or severe property or environmental  
damage. NXP Semiconductors and its suppliers accept no liability for  
inclusion and/or use of NXP Semiconductors products in such equipment or  
applications and therefore such inclusion and/or use is at the customer’s own  
risk.  
Draft —
The document is a draft version only. The content is still under  
internal review and subject to formal approval, which may result in  
modifications or additions. NXP Semiconductors does not give any  
representations or warranties as to the accuracy or completeness of  
information included herein and shall have no liability for the consequences of  
use of such information.  
Short data sheet —
A short data sheet is an extract from a full data sheet  
with the same product type number(s) and title. A short data sheet is intended  
for quick reference only and should not be relied upon to contain detailed and  
full information. For detailed and full information see the relevant full data  
sheet, which is available on request via the local NXP Semiconductors sales  
office. In case of any inconsistency or conflict with the short data sheet, the  
full data sheet shall prevail.  
Applications —
Applications that are described herein for any of these  
products are for illustrative purposes only. NXP Semiconductors makes no  
representation or warranty that such applications will be suitable for the  
specified use without further testing or modification.  
Customers are responsible for the design and operation of their applications  
and products using NXP Semiconductors products, and NXP Semiconductors  
accepts no liability for any assistance with applications or customer product  
design. It is customer’s sole responsibility to determine whether the NXP  
Semiconductors product is suitable and fit for the customer’s applications and  
products planned, as well as for the planned application and use of  
customer’s third party customer(s). Customers should provide appropriate  
design and operating safeguards to minimize the risks associated with their  
applications and products.  
Product specification —
The information and data provided in a Product  
data sheet shall define the specification of the product as agreed between  
NXP Semiconductors and its customer, unless NXP Semiconductors and  
customer have explicitly agreed otherwise in writing. In no event however,  
shall an agreement be valid in which the NXP Semiconductors product is  
deemed to offer functions and qualities beyond those described in the  
Product data sheet.  
NXP Semiconductors does not accept any liability related to any default,  
damage, costs or problem which is based on any weakness or default in the  
customer’s applications or products, or the application or use by customer’s  
third party customer(s). Customer is responsible for doing all necessary  
testing for the customer’s applications and products using NXP  
Semiconductors products in order to avoid a default of the applications and  
the products or of the application or use by customer’s third party  
customer(s). NXP does not accept any liability in this respect.  
16.3 Disclaimers  
Limited warranty and liability —
Information in this document is believed to  
be accurate and reliable. However, NXP Semiconductors does not give any  
representations or warranties, expressed or implied, as to the accuracy or  
completeness of such information and shall have no liability for the  
consequences of use of such information. NXP Semiconductors takes no  
responsibility for the content in this document if provided by an information  
source outside of NXP Semiconductors.  
Limiting values —
Stress above one or more limiting values (as defined in  
the Absolute Maximum Ratings System of IEC 60134) will cause permanent  
damage to the device. Limiting values are stress ratings only and (proper)  
operation of the device at these or any other conditions above those given in  
the Recommended operating conditions section (if present) or the  
Characteristics sections of this document is not warranted. Constant or  
repeated exposure to limiting values will permanently and irreversibly affect  
the quality and reliability of the device.  
In no event shall NXP Semiconductors be liable for any indirect, incidental,  
punitive, special or consequential damages (including – without limitation – lost  
profits, lost savings, business interruption, costs related to the removal or  
replacement of any products or rework charges) whether or not such  
damages are based on tort (including negligence), warranty, breach of  
contract or any other legal theory.  
Terms and conditions of commercial sale —
NXP Semiconductors  
products are sold subject to the general terms and conditions of commercial  
sale, as published at

, unless otherwise  
agreed in a valid written individual agreement. In case an individual  
agreement is concluded only the terms and conditions of the respective  
agreement shall apply. NXP Semiconductors hereby expressly objects to  
applying the customer’s general terms and conditions with regard to the  
purchase of NXP Semiconductors products by customer.  
Notwithstanding any damages that customer might incur for any reason  
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards  
customer for the products described herein shall be limited in accordance  
with the
T
e
rms and conditions of commercial sale
of NXP Semiconductors.  
Right to make changes —
NXP Semiconductors reserves the right to make  
changes to information published in this document, including without  
limitation specifications and product descriptions, at any time and without  
notice. This document supersedes and replaces all information supplied prior  
to the publication hereof.  
No offer to sell or license —
Nothing in this document may be interpreted or  
construed as an offer to sell products that is open for acceptance or the grant,  
conveyance or implication of any license under any copyrights, patents or  
other industrial or intellectual property rights.  
BGU8L1  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.
V
.
2
017. All rights reserved.  
Product data sheet  
Rev. 3 — 16 January 2017  
9 of 11  

BGU8L1  
NXP Semiconductors  
SiGe:C low-noise amplifier MMIC for LTE  
Quick reference data —
The Quick reference data is an extract of the  
product data given in the Limiting values and Characteristics sections of this  
document, and as such is not complete, exhaustive or legally binding.  
product for such automotive applications, use and specifications, and (b)  
whenever customer uses the product for automotive applications beyond  
NXP Semiconductors’ specifications such use shall be solely at customer’s  
own risk, and (c) customer fully indemnifies NXP Semiconductors for any  
liability, damages or failed product claims resulting from customer design and  
use of the product for automotive applications beyond NXP Semiconductors’  
standard warranty and NXP Semiconductors’ product specifications.  
Export control —
This document as well as the item(s) described herein  
may be subject to export control regulations. Export might require a prior  
authorization from competent authorities.  
Non-automotive qualified products —
Unless this data sheet expressly  
states that this specific NXP Semiconductors product is automotive qualified,  
the product is not suitable for automotive use. It is neither qualified nor tested  
in accordance with automotive testing or application requirements. NXP  
Semiconductors accepts no liability for inclusion and/or use of  
Translations —
A non-English (translated) version of a document is for  
reference only. The English version shall prevail in case of any discrepancy  
between the translated and English versions.  
non-automotive qualified products in automotive equipment or applications.  
16.4 Trademarks  
Notice: All referenced brands, product names, service names and trademarks  
are the property of their respective owners.  
In the event that customer uses the product for design-in and use in  
automotive applications to automotive specifications and standards, customer  
(a) shall use the product without NXP Semiconductors’ warranty of the  
17. Contact information  
For more information, please visit:

For sales office addresses, please send an email to:

BGU8L1  
All information provided in this document is subject to legal disclaimers.  
© NXP Semiconductors N.
V
.
2
017. All rights reserved.  
Product data sheet  
Rev. 3 — 16 January 2017  
10 of 11  

BGU8L1  
NXP Semiconductors  
SiGe:C low-noise amplifier MMIC for LTE  
18. Contents  
1
2
3
4
5
6
General description . . . . . . . . . . . . . . . . . . . . . .
 
1  
Features and benefits . . . . . . . . . . . . . . . . . . . .
 
1  
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . .
 
2  
Quick reference data . . . . . . . . . . . . . . . . . . . . .
 
2  
Ordering informatio
n
. . . . . . . . . . . . . . . . . . . . .
 
2  
Block diagram
 
. . . . . . . . . . . . . . . . . . . . . . . . . .
 
3  
7
7.1  
7.2  
Pinning informatio
n
. . . . . . . . . . . . . . . . . . . . . .
 
3  
Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
 
3  
Pin description
 
. . . . . . . . . . . . . . . . . . . . . . . . .
 
3  
8
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . .
 
4  
Recommended operating conditions. . . . . . . .
 
4  
Thermal characteristics. . . . . . . . . . . . . . . . . . .
 
4  
Characteristic
s
. . . . . . . . . . . . . . . . . . . . . . . . . .
 
5  
Package outline . . . . . . . . . . . . . . . . . . . . . . . . .
 
7  
Handling information. . . . . . . . . . . . . . . . . . . . .
 
8  
Abbreviation
s
. . . . . . . . . . . . . . . . . . . . . . . . . . .
 
8  
Revision histor
y
. . . . . . . . . . . . . . . . . . . . . . . . .
 
8  
9
10  
11  
12  
13  
14  
15  
16  
Legal information. . . . . . . . . . . . . . . . . . . . . . . .
 
9  
Data sheet status . . . . . . . . . . . . . . . . . . . . . . .
 
9  
Definition
s
. . . . . . . . . . . . . . . . . . . . . . . . . . . . .
 
9  
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . .
 
9  
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . .
 
10  
16.1  
16.2  
16.3  
16.4  
17  
18  
Contact information. . . . . . . . . . . . . . . . . . . . .
 
10  
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
 
11  
Please be aware that important notices concerning this document and the product(s)  
described herein, have been included in section ‘Legal information’.  
© NXP Semiconductors N.
V
.
 
2
017.  
All rights reserved.  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: 16 January 2017  
Document identifier: BGU8L1