NXP-Semicon-MW4IC001MR4

Part #NXP-Semicon-MW4IC001MR4
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NXP-Semicon-MW4IC001MR4
MW4IC001MR4  
Rev. 4, 5/2006  
Freescale Semiconductor  
T
e
chnical Data  
Replaced by MW4IC001NR4. There are no form, fit or function changes with this part  
replacement. N suffix added to part number to indicate transition to lea
d
–
f
ree  
terminations.  
MW4IC001MR4  
RF LDMOS Wideband Integrated  
Power Amplifier  
The MW4IC001M wideband integrated circuit is designed for use as a  
distortion signature device in analog predistortion systems. It uses Freescale’s  
newest High Voltage (26 to 28 Volts) LDMOS IC technology. Its wideband On  
Chip design makes it usable from 800 MHz to 2170 MHz. The linearity  
performances cover all modulations for cellular applications: GSM EDGE,  
TDMA, CDMA and
W
–
C
DMA.  
80
0
–
2
170 MHz, 900 mW, 28 V  
W-
C
DMA  
RF LDMOS WIDEBAND  
INTEGRATED POWER AMPLIFIER  
•
Typical CW Performance at 2170 MHz, 28 Volts, I

DQ

= 12 mA  
Output Power — 900 mW PEP  
Power Gain — 13 dB  
Efficiency — 38%  
•
High Gain, High Efficiency and High Linearity  
•
Designed for Maximum Gain and Insertion Phase Flatness  
•
Excellent Thermal Stability  
•
Characterized with Series Equivalent Larg
e
–
S
ignal Impedance Parameters  
CASE 46
6
–
0
3, STYLE 1  
PL
D
–
1
.5  
PLASTIC  
•
In
T
a
pe and Reel. R4 Suffix = 100 Units per 12 mm, 7 inch Reel.  
Table 1. Maximum Ratings  
Rating  
Symbol  
Value  
Unit  
Vdc  
Vdc  
Drai
n
–
S
ource Voltage  
Gat
e
–
S
ource Voltage  
V
– 0.5, +65  
– 0.5, +15  
DSS  
V
GS  
T
o
tal Device Dissipation @ T
 
= 25
°
C  
Derate above 25
°
C  
P
4.58  
0.037  
W
W/
°
C  
C
D
Storage
T
e
mperature Range  
Operating Junction
T
e
mperature  
T
– 65 to +150  
150  
°
C  
°
C  
stg  
T
J
Table 2. Thermal Characteristics  
Characteristic  
Symbol  
Value  
Unit  
Thermal Resistance, Junction to Case @ 85
°
C  
R
θ
JC  
27.3  
°
C/W  
Table 3. ESD Protection Characteristics  
Test Conditions  
Class  
Human Body Model  
0 (Minimum)  
M1 (Minimum)  
C2 (Minimum)  
Machine Model  
Charge Device Model  
Table 4. Moisture Sensitivity Level  
Test Methodology  
Rating  
Package Peak Temperature  
Unit  
Per JESD 2
2
–
A
113, IPC/JEDEC
J
–
S
T
D
–
0
20  
3
260  
°
C  
©
Freescale Semiconductor, Inc., 2006. All rights reserved.  

Table 5. Electrical Characteristics
 
(T =
 
25
°
C unless otherwise noted)  
C
Characteristic  
Symbol  
Min  
Typ  
Max  
Unit  
Off Characteristics  
Zero Gate Voltage Drain Current  
(V =
 
65 Vdc, V
 
= 0 Vdc)  
I
I
I
—
—
—
—
—
—
10  
10  
1
μ
Adc  
μ
Adc  
μ
Adc  
DSS  
DSS  
GSS  
DS  
GS  
Zero Gate Voltage Drain Current  
(V =
 
28 Vdc, V
 
= 0 Vdc)  
DS  
GS  
Gat
e
–
S
ource Leakage Current  
(V =
 
5 Vdc, V
 
= 0 Vdc)  
GS  
DS  
On Characteristics  
Gate Threshold Voltage  
(V =
 
10 V, I
 
= 50
μ
A)  
V
V
2
2
3
5
5
Vdc  
Vdc  
Vdc  
S
GS(th)  
GS(Q)  
DS(on)  
DS  
D
Gate Quiescent Voltage  
(V =
 
28 V, I
 
= 10 mA)  
3.7  
DS  
D
Drai
n
–
S
ource O
n
–
V
oltage  
(V =
 
10 V, I
 
= 0.05 A)  
V
—
—
0.48  
0.05  
0.9  
—
GS  
D
Forward Transconductance  
(V =
 
10 V, I
 
= 0.1 A)  
g
fs  
DS  
D
Dynamic Characteristics  
Output Capacitance  
(V =
 
28 Vdc
 
30 mV(rms)ac @ 1 MHz, V
 
= 0 Vdc)  
DS  
C
—
—
45  
—
—
pF  
pF  
oss  
GS  
Reverse Transfer Capacitance  
C
0.62  
rss  
(V =
 
28 Vdc
 
30 mV(rms)ac @ 1 MHz, V
 
= 0 Vdc)  
DS  
GS  
Functional Tests
(In Freescale
T
e
st Fixture, 50 ohm system)  
Tw
o
–
T
o
ne Common Source Amplifier Power Gain  
G
—
—
—
—
13  
29  
—
—
—
—
dB  
%
ps  
(V =
 
28 Vdc, P
 
= 0.9 W PE
P
, I
 
=
1
2 mA,  
DD  
out  
DQ  
f = 2170 MHz,
T
o
ne Spacing = 100 kHz)  
Tw
o
–
T
o
ne Drain Efficiency  
η
D
(V =
 
28 Vdc, P
 
= 0.9 W PE
P
, I
 
=
1
2 mA,  
DQ  
DD  
out  
f = 2170 MHz,
T
o
ne Spacing = 100 kHz)  
Third Order Intermodulation Distortion  
IMD  
IRL  
– 28  
–
1
8  
dBc  
dB  
(V =
 
28 Vdc, P
 
= 0.9 W PE
P
, I
 
=
1
2 mA,  
DQ  
DD  
out  
f = 2170 MHz,
T
o
ne Spacing = 100 kHz)  
Input Return Loss  
(V =
 
28 Vdc, P
 
= 0.9 W PE
P
, I
 
=
1
2 mA,  
DQ  
DD  
out  
f = 2170 MHz,
T
o
ne Spacing = 100 kHz)  
Output Power, 1 dB Compression Point, CW  
P1dB  
—
12  
0.85  
13  
—
—
—
—
W
dB  
%
(V =
 
28 Vdc, I  
= 12 mA, f = 2170 MHz)  
DD  
DQ  
Commo
n
–
S
ource Amplifier Power Gain  
G
ps  
(V =
 
28 Vdc, P
 
= 0.9 W CW, I  
= 12 mA, f = 2170 MHz)  
= 12 mA, f = 2170 MHz)  
= 12 mA, f = 2170 MHz)  
DD  
out  
DQ  
DQ  
DQ  
Drain Efficiency  
η
D
35  
38  
(V =
 
28 Vdc, P
 
= 0.9 W CW, I  
DD  
out  
Input Return Loss  
IRL  
–
1
0  
–
1
6  
dB  
(V =
 
28 Vdc, P
 
= 0.9 W CW, I  
DD  
out  
MW4IC001MR4  
RF Device Data  
Freescale Semiconductor  
13  

V
GG  
V
D
D
C
1
C 2  
+
Z
6
1
C
7
C
6
C8  
Z
7
R
R
F
O
U
T
P
U
T
R F  
I N
 
PU T  
Z
8
Z
9
Z
1
0
Z
11  
Z
1
2
Z1 3  
DUT  
Z
1
Z
2
Z
3
Z
4
Z
5
R
2
L
2
C
5
C
11  
C 1
 
3  
C1 2  
L
1
C
3
C
9
C1 0  
C
4
Z1  
Z2  
Z3  
Z4  
Z5  
1.331
″
x 0.044
″
Microstrip  
0.126
″
x 0.076
″
Microstrip  
0.065
″
x 0.175
″
Microstrip  
0.065
″
x 0.195
″
Microstrip  
0.680
″
x 0.145
″
Microstrip  
1.915
″
x 0.055
″
Microstrip  
0.120
″
x 0.141
″
Microstrip  
Z9  
0.062
″
x 0.044
″
to 0.615
″
T
a
per  
0.082
″
x 0.615
″
Microstrip  
0.075
″
x 0.044
″
Microstrip  
0.625
″
x 0.044
″
Microstrip  
1.375
″
x 0.044
″
Microstrip  
Z10  
Z11  
Z12  
Z13  
Z6, Z7  
Z8  
PCB  
Rogers RO4350, 0.020
″
,
ε
= 3.5  
r
Figure 1. MW4IC001MR4 900 MHz Test Circuit Schematic  
Table 6. MW4IC001MR4 900 MHz Test Circuit Component Designations and Values  
Part  
Description  
0.1
μ
F
,
1
00 V Chip Capacitors  
43 p
F
,
5
00 V Chip Capacitors  
12 p
F
,
5
00 V Chip Capacitor  
22
μ
F
,
3
5 V
T
a
ntalum Chip Capacitor  
4.7 p
F
,
5
00 V Chip Capacitor  
0.
6
–
4
.5 p
F
,
5
00 V Variable Capacitors  
2.7 p
F
,
5
00 V Chip Capacitor  
3.3 p
F
,
5
00 V Chip Capacitor  
5.6 nH Chip Inductor  
Part Number  
C1210C104K5RACTR  
100B430JP500X  
100B120JP500X  
T491X226K035AS  
100B4R7CP500X  
27271SL  
Manufacturer  
Kemet  
C1, C6  
C2, C3, C5, C7  
ATC  
C4  
ATC  
C8  
Kemet  
ATC  
C9  
C10, C11  
C12  
C13  
L1  
Johanson  
ATC  
100B2R7CP500X  
100B3R3CP500X  
0805 Series  
ATC  
AVX  
L2  
10 nH Chip Inductor  
1008 Series  
ATC  
R1  
100
W
Chip Resistor  
CRCW12061001F100  
CRCW120620R0F100  
Dale  
Dale  
R2  
20
W
Chip Resistor  
MW4IC001MR4  
RF Device Data  
Freescale Semiconductor  
14  

V
V
G
G
D
D
C
8
C
1
C2  
C
6
C
7
R
1
C1 2  
C
9
C 3  
C
4
C
5
L
2
C11  
C
1
0
C
1
3
L
1
R2  
MW4IC001MR4  
900 MHz  
Rev 2  
Freescale has begun the transition of marking Printed Circuit Boards (PCBs) with the Freescale Semiconductor  
signature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will have  
no impact on form, fit or function of the current product.  
Figure 2. MW4IC001MR4 900 MHz Test Circuit Component Layout  
MW4IC001MR4  
15  
RF Device Data  
Freescale Semiconductor  

TYPICAL CHARACTERISTICS – 900 MHz  
5
0
−
−
−
−
−
−
−
−
−
−
1 5  
17  
19  
21  
23  
25  
27  
29  
31  
33  
3 5  
I RL  
4
4
6
2
η
D
3
3
8
4
V
P
I
=
=
2
0
8 Vd
 
c  
. 9
 
W (
 
PE P )  
D S  
o u t  
=
1
4
m
A
3
2
0
6
D Q  
Tw  
o
−
T
o
n
e
M
e asu re me n t  
S
1
0
0
k
H
z
T
o
ne  
p
a
c
i
n
g
2
2
I
M
3
1
1
8
4
G
p
s
1
0
−
8
5
5
8
6
0
8
6
5
8
7
0
8
7
5
8
8
0
8
8
5
8
9
0
8
9
5
9
0
0
9
0
5
f
1
,
F
R
E
Q
U
E
N
C
Y
(
M
H
z
)
Figure 3. Two-Tone Performance versus  
Frequency  
1
1
1
1
5
4
3
2
6
5
5
0
5
0
−
2
5
G
η
D
p
s
V
=
2
8
V
8 0
 
MH  
d
c
D S  
=
−
−
3
0
5
f
f
1
8
z
I
=
8
m
A
2
=
8
8
0
.
1
M
H
z
D
Q
3
4
4
5
0
P
1
d
B
1
0
1
m
A
1
1
8
m
A
−
−
4
0
5
1
0
9
3
3
5
0
1
6
m
A
4
8
7
V
=
2
8
V
d
c
2
2
5
0
D
S
1
4
m
A
−
−
5
0
5
I
f
=
1
4
= 880
 
M H
 
z  
m
A
D
Q
T
w
o
−
T
o
n
e
M
e
a
s
u
r
e
m
e
n
t
1
0
0
k
H
z
T
o
n
e
S
p
a
c
i
n
g
1
2
m
A
6
1
5
5
0
0
.
2
0
.
4
0
.
6
0
.
8
1
.
0
1
.
2
1
.
4
0
.
0
1
0
.
1
1
1
0
P
,
O
U
T
P
U
T
P
O
W
E
R
(
W
A
T
T
S
)
P
, O  
o u t  
U
T
P
U
T
P
O
W
E
R
(
W
A
T
T
S
)
P
E
P
o
u
t
Figure 4. CW Performance
 
versus Output  
Power  
Figure 5. Intermodulation Distortion versus  
Output Power  
−
−
−
2
3
3
5
0
5
−
2
5
V
=
2
8
V
= 1
 
4 m
 
A  
d
c
D
S
I
f
f
D
Q
−
−
−
30  
35  
40  
1
2
=
=
8
8
0
0
M
H z  
M H
 
z  
8
8
.
1
−
−
4
0
5
4
3
r
d
O
r
d
e
r
−
−
5
0
5
5
V
= 2
 
8 V
 
d c  
D S  
= 1
 
4 m
 
A  
1
0
M
H
z
I
f
f
D
Q
5
7
t
t
h
h
O
O
r
r
d
e
e
r
r
−
−
6
0
5
−
−
4
5
0
1
M
H
z
1
2
=
=
8
8
0
M
H
z
,
T
w
o
−
T
o
n
e
M
e
a
s
u
on e
 
S paci
 
ng  
r
e
m
e
n
t
f
1
+
T
o
n
e
S
p
a
c
i
n
g
6
To ne  
S
1
0
0
k
H
z
T
d
T
w
o
−
T
o
n
e
M
e
a
s
u
r
e
m
e
n
t
p
a
c
i
n
g
=
1
0
0
k
H
,
z
−
7
0
5
0
.
0
1
0
.
1
1
)
1
0
0
.
0
1
0
.
1
1
1
0
P
,
O
U
T
P
U
T
P
O
W
E
R
(
W
A
T
T
S
P
E
P
P
O
U
T
P
U
T
P
O
W
E
R
(
W
A
T
T
S
)
P
E
P
o
u
t
o
u
t
Figure 6. Intermodulation Distortion Products  
versus Output Power  
Figure 7. Third Order Intermodulation  
Distortion versus Output Power  
MW4IC001MR4  
RF Device Data  
Freescale Semiconductor  
16  

Z
5
V
GG  
Z1 2  
+
V
F
D D  
C
1
C2  
+
Z
4
C
4
C6  
Z11  
R
1
R
O
U
T
P
U
T
R F  
IN P UT  
Z
8
Z
9
Z
1
3
Z
1
4
Z
1
5
Z
1
0
DUT  
Z
1
Z
2
Z
3
Z
6
Z
7
C
5
C
3
C
7
Z1  
Z2  
Z3  
Z4  
Z5  
Z6  
Z7  
Z8  
1.018
″
x 0.044
″
Microstrip  
0.495
″
x 0.296
″
Microstrip  
0.893
″
x 0.500
″
Microstrip  
1.340
″
x 0.022
″
Microstrip  
0.912
″
x 0.022
″
Microstrip  
0.241
″
x 0.500
″
Microstrip  
0.076
″
x 0.150
″
Microstrip  
0.294
″
x 0.150
″
Microstrip  
Z9  
0.067
″
x 0.264
″
Microstrip  
0.457
″
x 0.492
″
Microstrip  
0.719
″
x 0.022
″
Microstrip  
1.149
″
x 0.022
″
Microstrip  
0.677
″
x 0.434
″
Microstrip  
0.095
″
x 0.264
″
Microstrip  
0.772
″
x 0.044
″
Microstrip  
Z10  
Z11  
Z12  
Z13  
Z14  
Z15  
PCB  
Rogers RO4350, 0.020
″
,
ε
= 3.5  
r
Figure 8. MW4IC001MR4 1990 MHz Test Circuit Schematic  
Table 7. MW4IC001MR4 1990 MHz Test Circuit Component Designations and Values  
Part  
Description  
22
μ
F
,
3
5 V
T
a
ntalum Capacitors  
10 p
F
,
5
00 V Chip Capacitors  
10 p
F
,
5
00 V Chip Capacitor  
0.
6
–
4
.5 p
F
,
5
00 V Variable Capacitor  
1 k
W
Chip Resistor  
Part Number  
T491X226K035AS  
100B100JCA500X  
600S100JW  
Manufacturer  
Kemet  
C1, C6  
C2, C4  
C3, C5  
C7  
ATC  
ATC  
27271SL  
Johanson  
Dale  
R1  
CRCW12061021F100  
V
V
D
D
G
G
C1  
C6  
C2  
C4  
R1  
C3  
C5  
C7  
MW4IC001MR4  
1990 MHz  
Rev 3  
Freescale has begun the transition of marking Printed Circuit Boards (PCBs) with the Freescale Semiconductor  
signature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will have  
no impact on form, fit or function of the current product.  
Figure 9. MW4IC001MR4 1990 MHz Test Circuit Component Layout  
MW4IC001MR4  
17  
RF Device Data  
Freescale Semiconductor  

TYPICAL CHARACTERISTICS – 1990 MHz  
4
3
0
5
−
11  
I
R
L
−
−
1
4
7
η
1
D
3
2
2
1
1
0
5
0
5
0
5
−
20  
V
=
2
8
V
d
c
,
P
=
0
.
9
W
(
P
E
P
)
,
I
= 1
 
2 m
 
A  
i
DD  
o
o u t  
e
D Q  
−
−
2
3
6
Tw  
−
To  
n
e
M
e
a
s
u
r
m
e
n
t
,
1
0
0
k
H
z
T
o
n
e
S
p
a
c
n
g
G
p
s
2
−
−
2
9
2
I
M
D
3
0
−
3
5
1
9
3
0
1
9
4
0
1
9
5
0
1
9
6
0
1
9
7
0
1
9
8
0
1
9
9
0
f
1
,
F
R
E
Q
U
E
N
C
Y
(
M
H
z
)
Figure 10. Two-Tone Performance versus  
Frequency  
1
4
.
4
0
5
6
−
3
0
G
p
s
I
=
2
0
m
A
D
Q
−
−
3
5
0
1
1
4
.
4
4
3
2
1
8
0
2
4
6
4
3
.
6
−
−
45  
50  
55  
1
6
m
A
1
1
3
2
.
2
P
1
d
B
V
= 2
 
8 Vd
 
c  
1
D D  
=
V
=
2
8
V
d
c
D
D
f
1
9
9
0
M
H
z
,
f
2
=
1
9
9
0
t
.
1
M
H
z
.
8
I
f
= 2  
= 1
 
990  
1
m
A
H
D
Q
−
−
T
w
o
−
T
o
n
e
M
e
a
s
u
r
e
m
e
n
η
M
z
D
9
1
.
6
m
A
1
2
m
A
1
0
0
k
H
z
T
o
n
e
S
p
a
c
i
n
g
6
0
1
2
.
4
0
.
1
0
.
2
0
.
3
0
.
4
0
.
5
0
.
6
0
.
7
0
.
8
0
.
9
1
.
0
1
.
1
1
.
2
1
.
3
0
.
0
0
.
1
1
P
,
O
U
T
P
U
T
P
O
W
E
R
(
W
A
T
T
S
)
P
, O  
o u t  
U
T
P
U
T
P
O
W
E
R
(
W
A
T
T
S
)
P
E
P
o
u
t
Figure 11. CW Performance versus Output  
Power  
Figure 12. Intermodulation Distortion versus  
Output Power  
−
3
3
4
0
5
0
−
3
0
5
0
−
−
−
−
3
4
3
r
d
O
r
d
e
r
−
−
−
45  
50  
55  
1
0
M
H
z
5
t
h
O
r
d
e
r
−
−
4
5
0
−
−
6
0
5
5
1
M
H
z
V
= 2
 
8 V
 
dc  
D D  
= 1
 
2 m
 
A  
I
f
f
D
Q
6
V
I
=
D D  
2
8
V
d
c
1
2
=
=
1
9
9
0
M
H
z
7
t
h
O
r
d
e
r
−
−
5
5
0
=
1
2
m
A
,
f
1
=
1
9
9
0
M
H
z
,
f
2
=
1
9
9
0
.
1
M
H
z
f
1
+
T
o
n
e
S
p
a
c
i
n
g
−
−
7
0
5
D
Q
1
0
0
k
H
z
T
w
o
−
T
o
n
e
M
e
a
s
u
r
e
m
e
n
t
,
1
0
0
k
H
z
T
o
n
e
S
p
a
c
i
n
g
T
w
o
−
T
o
n
e
M
e
a
s
u
r
e
m
e
n
t
6
7
0
.
0
1
0
.
1
1
0
.
0
1
0
.
1
1
O
U
T
P
U
T
P
O
W
E
R
(
W
A
T
T
S
)
P
E
P
P
,
O
U
T
P
U
T
P
O
W
E
R
(
W
A
T
T
S
)
P
E
P
o
u
t
Figure 13. Intermodulation Distortion  
Products versus Output Power  
Figure 14. Third Order
 
Intermodulation  
Distortion versus Output Power  
MW4IC001MR4  
RF Device Data  
Freescale Semiconductor  
18  

Z
5
V
G
G
Z1 2  
+
V
F
D D  
C
1
C
2
+
Z
4
C
4
C6  
Z11  
R
1
R
O
U
T
P
U
T
R F  
IN P UT  
Z
8
Z
9
Z
1
3
Z
1
4
Z
1
5
Z
1
0
D
U
T
Z
1
Z
2
Z
3
Z
6
Z
7
C
5
C
3
C
7
Z1  
Z2  
Z3  
Z4  
Z5  
Z6  
Z7  
Z8  
1.267
″
x 0.044
″
Microstrip  
0.058
″
x 0.044
″
Microstrip  
0.758
″
x 0.256
″
Microstrip  
1.073
″
x 0.022
″
Microstrip  
1.361
″
x 0.022
″
Microstrip  
0.205
″
x 0.332
″
Microstrip  
0.109
″
x 0.150
″
Microstrip  
0.210
″
x 0.150
″
Microstrip  
Z9  
0.106
″
x 0.344
″
Microstrip  
0.783
″
x 0.500
″
Microstrip  
0.847
″
x 0.022
″
Microstrip  
1.055
″
x 0.022
″
Microstrip  
0.291
″
x 0.387
″
Microstrip  
0.050
″
x 0.287
″
Microstrip  
0.950
″
x 0.044
″
Microstrip  
Z10  
Z11  
Z12  
Z13  
Z14  
Z15  
PCB  
Rogers RO4350, 0.020
″
,
ε
= 3.5  
r
Figure 15. MW4IC001MR4 2170 MHz Test Circuit Schematic  
Table 8. MW4IC001MR4 2170 MHz Test Circuit Component Designations and Values  
Part  
Description  
22
μ
F
,
3
5 V
T
a
ntalum Capacitors  
10 p
F
,
5
00 V Chip Capacitors  
10 p
F
,
5
00 V Chip Capacitor  
0.
6
–
4
.5 p
F
,
5
00 V Variable Capacitor  
1 k
W
Chip Resistor  
Part Number  
T491X226K035AS  
100B100JCA500X  
600S100JW  
Manufacturer  
Kemet  
C1, C6  
C2, C4  
C3, C5  
C7  
ATC  
ATC  
27271SL  
Johanson  
Dale  
R1  
CRCW12061021F100  
V
V
D
D
G
G
C1  
C6  
C4  
C2  
R1  
C5  
C3  
C7  
MW4IC001MR4  
2170 MHz  
Rev 3  
Freescale has begun the transition of marking Printed Circuit Boards (PCBs) with the Freescale Semiconductor  
signature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will have  
no impact on form, fit or function of the current product.  
Figure 16. MW4IC001MR4 2170 MHz Test Circuit Component Layout  
MW4IC001MR4  
19  
RF Device Data  
Freescale Semiconductor  

TYPICAL CHARACTERISTICS – 2170 MHz  
3
2
2
2
7
2
−
−
−
13  
18  
23  
I RL  
η
D
V
P
=
=
2
8
V
d
c
D D  
o u t  
0
.
9
W
(
P
E
P
)
I
=
1
2
m
A
D Q  
Tw  
o
−
To  
n
e
M
e
a su re me nt
 
,  
S
1
0
0
k
H
z
T
o
n
e
p
a
c
i
n
g
I
M
D
1
1
7
2
−
−
2
8
3
G
p s  
3
2
1
1
0
2
1
2
0
2
1
3
0
2
1
4
0
2
1
5
0
2
1
6
0
2
1
7
0
f
,
F
R
E
Q
U
E
N
C
Y
(
M
H
z
)
Figure 17. Two-Tone Performance versus  
Frequency  
1
3
.
8
6
0
−
2
0
V
= 2
 
8 Vd
 
c  
2
D D  
=
f
1
1
7
0
M
H
z
,
f
2
=
2
1
7
0
.
1
M
H
z
G
5
4
0
0
1
1
3
3
.
.
4
0
p
s
−
−
2
5
0
T
w
o
−
T
o
n
e
M
e
a
s
u
r
e
m
e
n
t
1
0
0
k
H
z
T
o
n
e
S
p
a
c
i
n
g
7
.
2
m
A
3
2
0
m
A
3
2
1
0
0
0
0
−
−
3
5
0
1
1
2
2
.
.
6
2
η
D
1
6
m
A
4
P
1
d
B
V
=
2
8
V
d
c
D
D
1
1
.
.
8
4
−
−
4
5
0
I
f
=
1
2
m
A
D
Q
9
.
6
m
A
=
2
1
7
0
M
H
z
1
2
m
A
1
1
5
0
.
1
0
.
2
0
.
3
0
.
4
0
.
5
0
.
6
0
.
7
0
.
8
0
.
9
1
.
0
1
.
1
1
.
2
1
.
3
1
.
4
1
.
5
0
.
01  
0
.
1
1
P
,
O
U
T
P
U
T
P
O
W
E
R
(
W
A
T
T
S)  
P
EP  
o u t  
P
,
OU  
T
P
U
T
PO  
W
E
R
(
W
A
T
T
S
)
P
E
P
o
u
t
Figure 18. CW
 
Performance versus Output  
Power  
Figure 19. Intermodulation Distortion versus  
Output Power  
−
20  
25  
30  
35  
−
2
0
V
I
= 2
 
8 V
 
dc  
= 1
 
2 m
 
A  
V
=
2
8
V
d
c
,
I
=
1
2
m
A
,
D
D
D D  
=
DQ  
f
−
−
2
5
0
f
1
2
1
7
0
M
H
z
,
2
=
2
1
7
0
.
1
M
H z  
H
D Q  
−
−
−
3
f
f
1
=
=
2
1
7
0
M
H
z
T
w
o
−
To  
n
e
M
e
a
s
u
r
e
m
e
n
t
,
1
0
0
k
z
To  
n
e
S
p
a
c
i
n
g
2
f
1
+
T
o
n
e
S
pa  
c
i
n
g
−
−
−
−
35  
40  
45  
50  
T
w
o
−
T
o
n
e
M
e
a
s
u
r
e
m
e
n
t
3
r
d
O
r
d
e
r
1
M
H
z
1
0
M
H
z
5
t
h
O
r
d
e
r
−
−
5
5
0
6
−
−
4
0
5
7
t
h
O
r
d
e
r
−
−
6
5
0
1
0
0
k
H
z
4
7
0
.
0
1
0
.
1
1
0
.
0
1
0
.
1
1
P
,
O
U
T
P
U
T
P
O
W
E
R
(
W
A
T
T
S
)
P
E
P
P
,
O
U
T
P
U
T
P
O
W
E
R
(
W
A
T
T
S
)
P
E
P
o
u
t
o
u
t
Figure 21. Third Order Intermodulation  
Distortion versus Output Power  
Figure 20. Intermodulation Distortion  
Products versus Output Power  
MW4IC001MR4  
RF Device Data  
Freescale Semiconductor  
20  

f
=
86  
0
M
H
z
Z
f
=
9
0
0
M
H
z
l o
 
a d  
Z
= 5
 
0
Ω  
o
Z
s
o
u
r
c
e
f =
 
9 00 M
 
Hz  
f
=
8
6
0
M
H
z
V
=
2
8
V
,
I
=
1
4
m
A
,
P
o u t  
=
0
.
9
W
P
E
P
D
D
D
Q
f
Z
Z
load  
source  
MHz  
Ω
Ω
860  
865  
870  
27.853 + j5.908  
28.617 + j6.078  
29.458 + j6.285  
15.492 + j63.669  
15.592 + j68.687  
15.788 + j69.799  
875  
880  
30.306 + j6.422  
31.223 + j6.567  
32.194 + j6.660  
33.228 + j6.656  
34.293 + j6.624  
35.424 + j6.508  
15.835 + j70.863  
15.975 + j71.920  
16.094 + j73.091  
16.286 + j74.159  
16.344 + j75.236  
16.628 + j76.283  
885  
890  
895  
900  
Z
Z
=
=
T
e
st circuit impedance as measured from  
gate to ground.  
source  
load  
T
e
st circuit impedance as measured  
from drain to ground.  
O
u
t
p
u
t
D
U
e
n
vice  
d er
 
T
e
s
t  
I
n
p
u
t
M i  
Ne t
 
wo rk  
a
t
c
h
n
g
M i  
N etw or
 
k  
a
t
c
h
n
g
Z
Z
s
o
u
r
c
e
l
o
a
d
Figure 22. Series Equivalent Source and Load Impedance  
MW4IC001MR4  
RF Device Data  
Freescale Semiconductor  
21  

f
= 21
 
8 0 M
 
Hz  
Z
l
o
a
d
f =
 
1 920
 
MH z  
f
=
0
21 0 0
 
M Hz  
f
=
2
0
0
0
M
H
z
Z
l o
 
a d  
f
=
2
1
8
M
H
z
f
=
2
0
0
0
M
H
z
f =
 
21 0 0
 
M Hz  
Z
s
o
u
r
c
e
f
=
1
9
2
0
M
H
z
Z
so u r
 
ce  
Z
=
5
0
Ω
o
Z
=
5
0
Ω
o
V
=
2 8  
V
,
I
=
1
2
m
A
,
P
o u t  
=
0
.
9
W
P
E
P
V
=
2
8
V,  
I
=
1
2
m
A
,
P
o u
 
t  
=
0
.
9
W
P
E
P
D
D
D
Q
D
D
D
Q
f
Z
Z
load  
Ω
f
Z
Z
load  
Ω
source  
Ω
source  
Ω
MHz  
MHz  
2100  
2110  
2120  
2.667 + j12.903  
2.671 + j13.070  
2.664 + j13.224  
5.892 + j26.374  
6.092 + j26.739  
6.281 + j27.094  
1920  
1930  
1940  
4.238 + j15.142  
4.322 + j15.362  
4.490 + j15.466  
7.764 + j28.829  
8.056 + j29.352  
8.436 + j29.727  
2130  
2140  
2.694 + j13.431  
2.703 + j13.511  
2.702 + j13.700  
2.745 + j13.952  
2.754 + j14.026  
2.784 + j14.206  
6.540 + j27.510  
6.748 + j27.795  
6.996 + j28.182  
7.300 + j28.678  
7.562 + j28.987  
7.862 + j29.411  
1950  
1960  
4.605 + j15.711  
4.752 + j15.904  
4.905 + j16.050  
5.071 + j16.236  
5.262 + j16.446  
5.487 + j16.632  
8.809 + j30.249  
9.183 + j30.763  
9.598 + j31.213  
2150  
2160  
1970  
1980  
10.030 + j31.690  
10.546 + j32.237  
11.054 + j32.726  
2170  
2180  
1990  
2000  
Z
Z
=
=
T
e
st circuit impedance as measured from  
gate to ground.  
source  
load  
Z
Z
=
T
e
st circuit impedance as measured from  
gate to ground.  
source  
load  
T
e
st circuit impedance as measured  
from drain to ground.  
=
T
e
st circuit impedance as measured  
from drain to ground.  
O
u
t
p
u
t
O
u
t
p
u
t
D
U
e
n
vice  
d er
 
T
e
s
t  
D
U
e
n
v
i
c
e
I
n
p
u
t
I
n
p
u
t
M i  
Ne t
 
w or
 
k  
a
t
c
h
n
g
M i  
Ne t
 
wor k  
a
t
c
h
n
g
d
e
r
T
e
s
t
M c  
Ne t
 
wo rk  
a
t
h
i
n
g
Ma  
N e tw
 
o rk  
t
c
h
i
n
g
Z
Z
Z
Z
s
o
u
r
c
e
l
o
a
d
s
o
u
r
c
e
l
o
a
d
Figure 23. Series Equivalent Source and Load Impedance  
MW4IC001MR4  
RF Device Data  
Freescale Semiconductor  
22  

NOTES  
MW4IC001MR4  
RF Device Data  
Freescale Semiconductor  
23  

NOTES  
MW4IC001MR4  
RF Device Data  
Freescale Semiconductor  
24  

NOTES  
MW4IC001MR4  
RF Device Data  
Freescale Semiconductor  
25  

PACKAGE DIMENSIONS  
A
F
3
1
2
R
D
L
B
N
O
T
E
I
S
:
1 .  
N T  
E RP RET  
DI M EN SIO N S  
A
N
D
TO L ERA NC ES  
P
E
R
A S ME  
Y
1
4
.
5
M
,
1
9
8
4
.
2
3
.
.
C
R
O
N
I
T
N
R
B
O
L
L
E
L
E
I
N
D
G
D
I
M
S
E
H
N
A
S
L
I
L
O
O
N
W
:
I
A
N
B
C
L
H
E
E
S
/
F
LA  
I
N
Z
O
N
E
V
,
W
,
4
AN D  
X
.
N
K
I
N
C
H
E
S
M
I
L
L
I
M
E
T
E
R
S
_
_
D
I
M
M
I
N
M
A
X
M
I
N
M
A
X
“
5
0
.
3
5
(
0
.
8
9
)
X
4
5
A
B
C
D
E
F
0
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
2
2
0
1
0
0
0
0
1
2
2
2
0
0
2
0
0
0
0
0
5
2
6
3
2
2
5
4
6
7
4
3
0
5
0
0
0
0
0
0
5
0
0
.
.
.
.
.
.
.
.
.
.
.
.
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ZONE V  
ZONE W  
P
4
G
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1
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1 :  
1.  
2.  
3 .  
4 .  
I
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D RA IN  
G ATE  
3
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C
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E
Z
O
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S O  
U RC  
Z
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S
G
Z
O
N
E
ZONE X  
CASE 46
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3  
ISSUE C  
VIEW
Y
-Y  
PL
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1
.5  
PLASTIC  
MW4IC001MR4  
RF Device Data  
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