NXP-Semicon-MW5IC970NBR1

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NXP-Semicon-MW5IC970NBR1
Document Number: MW5IC970NBR1  
Rev. 1, 5/2006  
Freescale Semiconductor  
T
e
chnical Data  
RF LDMOS Wideband
2
–
S
tage  
Power Amplifiers  
MW5IC970NBR1  
Designed for broadband commercial and industrial applications with frequen-  
cies from 132 MHz to 960 MHz. The high gain and broadband performance of  
this device make it ideal for larg
e
–
s
ignal, commo
n
–
s
ource amplifier applica-  
tions in 28 volt base station equipment. The device has a
2
–
s
tage design with  
of
f
–
c
hip matching for the input, interstage and output networks to cover the  
desired frequency band.  
80
0
–
9
00 MHz, 70 W,
 
28 V  
RF LDMOS WIDEBAND  
2-
S
TAGE POWER AMPLIFIERS  
•
Typical Performance: 800 MHz, 28 Volts, I

DQ1

= 80 mA,  
I

DQ2

= 650 mA, P

out

= 70 Watts PEP  
Power Gain — 30 dB  
Drain Efficiency — 48%  
•
Capable of Handling 10:1 VSWR, @ 28 Vdc, 850 MHz, 70 Watts CW  
Output Power  
Features  
•
Characterized with Series Equivalent Larg
e
–
S
ignal Impedance Parameters  
•
Integrated Quiescent Current
T
e
mperature Compensation  
CASE 132
9
–
0
9  
T
O
–
2
72 W
B
–
1
6  
PLASTIC  
with Enable/Disable Function  
•
O
n
–
C
hip Current Mirror g

m

Reference FET for Self Biasing Application

(1)  

•
Integrated ESD Protection  
•
200
°
C Capable Plastic Package  
•
RoHS Compliant  
•
In
T
a
pe and Reel. R1 Suffix = 500 Units per 44 mm, 13 inch Reel.  
V
RD2  
GND  
V
1
2
3
4
5
GND  
NC  
16  
15  
Quiescent Current  
Temperature Compensation  
V
V
/V  
RD2  
RG2 GS2  
V
V
/V  
RG2 GS2  
/V  
RG1 GS1  
RF  
in1  
/V  
RG1 GS1  
V
D2/  
RF  
GND  
6
14  
out2  
V
RD1  
/RF  
7
8
9
10  
RF  
V
D2  
/RF  
V
V
in1  
out2  
D1  
out1  
/RF  
D1 out1  
13  
12  
NC  
GND  
V
RD1  
RF  
in2  
GND  
11  
V
V
/RF  
/RF  
D1  
out1  
(
T
o
p View)  
D1  
out1  
RF  
in2  
Note: Exposed
 
backside flag is source  
terminal for transistors.  
Figure 1. Functional Block Diagram  
Figure 2. Pin Connections  
1. Refer
 
to AN1987,
Quiescent Current Control for the RF Integrated Circuit Device Family.

Select Documentation/Application Notes – AN1987.  
©
Freescale Semiconductor, Inc., 2006. All rights reserved.  

Table 1. Maximum Ratings  
Rating  
Symbol  
Value  
– 0.5,
+
6
5  
– 0.5,
+
1
5  
– 65 to +200  
200  
Unit  
Vdc  
Vdc  
°
C  
Drai
n
–
S
ource Voltage  
V
DSS  
Gat
e
–
S
ource Voltage  
V
GS  
Storage
T
e
mperature Range  
Operating Junction
T
e
mperature  
T
stg  
T
J
°
C  
Table 2. Thermal Characteristics  
(1)  
Characteristic  
Thermal Resistance, Junction to Case  
Symbol  
Value  
Unit  
R
°
C/W  
θ
JC  
Final Application  
(P =
 
70 W CW)  
out  
Stage 1, 28 Vdc, I
 
= 80 mA  
5.2  
0.8  
DQ  
Stage 2, 28 Vdc, I
 
= 650 mA  
DQ  
EDGE Application  
(P =
 
35 W CW)  
out  
Stage 1, 28 Vdc, I
 
= 80 mA  
5.3  
0.8  
DQ  
Stage 2, 28 Vdc, I
 
= 650 mA  
DQ  
Table 3. ESD Protection Characteristics  
Test Methodology  
Class  
Human Body Model (per JESD2
2
–
A
114)  
Machine Model (per EIA/JESD2
2
–
A
115)  
Charge Device Model (per JESD2
2
–
C
101)  
1A (Minimum)  
A (Minimum)  
IV (Minimum)  
Table 4. Moisture Sensitivity Level  
Test Methodology  
Rating  
Package Peak Temperature  
Unit  
Per JESD 2
2
–
A
113, IPC/JEDEC
J
–
S
T
D
–
0
20  
3
260  
°
C  
Table 5. Electrical Characteristics
 
(T =
 
25
°
C unless otherwise noted)  
C
Characteristic  
Symbol  
Min  
Typ  
Max  
Unit  
Functional Tests
(In Freescale
T
e
st Fixture, 50 ohm system) V
 
= 28.5 Vdc, I  
= 80 mA, I  
= 650 mA, P
 
= 70 W PE
P
,  
DD  
DQ1  
DQ2  
out  
f1 = 870.0 MHz, f2 = 870.1 MHz  
Power Gain  
G
26.5  
40  
30  
48  
34.5  
—
dB  
%
ps  
Drain Efficiency  
η
D
Input Return Loss  
Intermodulation Distortion  
IRL  
—
–
1
2  
–
3
3  
–
1
0  
–
2
8  
dB  
dBc  
IMD  
—
Typical 800/900 MHz Performances
(In Freescale 800/900 MHz Reference Fixture, 50 ohm system) V
 
= 28 Vdc, I  
= 80 mA, I  
=
DD  
DQ1  
DQ2  
650 mA, 74
0
–
8
70 MHz, 87
0
–
9
60 MHz  
Gain Flatness in 30 MHz Bandwidth @ P
 
= 70 W CW  
G
G
—
—
2
—
—
dB  
dB  
out  
F
F
Gain Flatness in 30 MHz Instantaneous Bandwidth  
0.2  
@ P
 
= 70 W CW  
out  
Delay @ P
 
= 70 W CW Including Output Matching  
Delay  
—
—
4.5  
15  
—
—
ns  
out  
Par
t
–
t
o
–
P
art Phase Variation @ P
 
= 70 W CW  
ΔΦ  
°
out  
1. Refer
 
to AN1955,
Thermal Measurement Methodology of RF Power Amplifiers.

Select Documentation/Application Notes – AN1955.  
(continued)  
MW5IC970NBR1  
RF Device Data  
Freescale Semiconductor  
2

V
BIAS  
V
D2  
R6  
R5  
F1  
R4  
R3  
R8  
R7  
R2  
C8 C9  
1
2
16  
15  
C18  
C17  
C16  
NC  
Quiescent Current  
Temperature  
Compensation  
V
G2R2  
R1  
3
4
5
C15  
Z2  
V
G1R1  
RF  
INPUT  
Z6  
Z5  
Z1  
Z3  
RF  
OUTPUT  
C7  
C10  
Z8  
C12  
C13  
Z7  
Z9  
C2  
6
14  
C1  
C6  
C11  
7
8
Z10  
Z11  
C14  
9
C5  
NC  
10  
11  
13  
12  
Z4  
C3  
C4  
F2  
V
D1  
Z1  
0.485
″
x 0.066
″
Microstrip  
0.270
″
x 0.040
″
Microstrip  
0.068
″
x 0.020
″
Microstrip  
0.950
″
x 0.040
″
Microstrip  
0.131
″
x 0.233
″
Microstrip  
0.797
″
x 0.050
″
Microstrip  
Z7  
Z8  
Z9  
Z10  
Z11  
0.040
″
x 0.233
″
Microstrip  
0.450
″
x 0.120
″
Microstrip  
0.100
″
x 0.066
″
Microstrip  
1.000
″
x 0.040
″
Microstrip  
0.148
″
x 0.040
″
Microstrip  
Z2  
Z3  
Z4  
Z5  
Z6  
PCB  
Rogers 4350B, 0.030
″
,
ε
= 3.5  
r
Figure 3. MW5IC970NBR1 Test Circuit Schematic  
Table 6. MW5IC970NBR1 Test Circuit Component Designations and Values  
Part  
C1, C10, C11  
Description  
3.9 pF Chip Capacitor  
Part Number  
600S3R9BT  
Manufacturer  
ATC  
C2  
56 pF Chip Capacitor  
39 pF Chip Capacitors  
10
μ
F Chip Capacitors  
24 pF Chip Capacitor  
15 pF Chip Capacitors  
4.7 pF Chip Capacitor  
0.4 pF Chip Capacitor  
0.015
μ
F Chip Capacitors  
5A Surface Mount Fuse  
1A Surface Mount Fuse  
681
Ω
, Chip Resistors  
4.75 k
Ω
, Chip Resistors  
1.21 k
Ω
, Chip Resistors  
267
Ω
, Chip Resistor  
600S560JW  
ATC  
C3, C8, C14, C15, C17  
GRM40001C0G390J050BD  
ECJ4YF1H106Z  
600F240JT  
Murata  
C4, C9  
Panasonic  
ATC  
C5  
C6, C7  
600F150JT  
ATC  
C12  
600F4R7BT  
ATC  
C13  
600F0R4BT  
ATC  
C16, C18, C19, C20  
GRM400X7R153J050BD  
1FT5A  
Murata  
Little Fuse  
Little Fuse  
F1  
F2  
1FT1A  
R1, R7  
R2, R5  
R3, R4, R8  
R6  
MW5IC970NBR1  
RF Device Data  
Freescale Semiconductor  
3

V
D2  
F1  
V
V
G2  
C9  
R6  
G1  
C8  
R8  
R7  
R4  
R3  
R5  
C18  
C17  
R2  
R1  
C16  
C15  
C11  
C10  
C13  
C12  
C7  
C2  
C6  
C
C1  
C5  
C14  
C3  
C4  
MW5IC970  
Rev. 1  
V
D1  
F2  
Figure 4. MW5IC970NBR1 Test Circuit Component Layout  
MW5IC970NBR1  
RF Device Data  
Freescale Semiconductor  
4

TYPICAL CHARACTERISTICS  
60  
40  
20  
60  
40  
20  
PAE  
G
ps  
V
DD  
= 28.5 Vdc, P
 
= 35 W (Avg.)  
out  
I
DQ1  
100 kHz
T
o
ne Spacing  
= 80 mA, I  
= 650 mA  
DQ2  
0
−20  
−40  
0
IRL  
−20  
−40  
IMD  
920  
800  
820  
840  
860  
880  
900  
940  
960  
f, FREQUENCY (MHz)  
Figure 5. Tw
o
–
T
one Wideband Performance  
@ P

out

= 35 Watts (Avg.)  
−10  
32  
31  
30  
29  
V
= 28.5 Vdc  
= 80 mA, I  
DD  
I
= 975 mA  
DQ2  
I
= 650 mA  
DQ1  
DQ2  
−20  
−30  
−40  
−50  
f1 = 870 MHz, f2 = 870.1 MHz  
Two−Tone Measurements  
100 kHz
T
o
ne Spacing  
812 mA  
650 mA  
3rd Order  
488 mA  
325 mA  
5th Order  
7th Order  
V
= 28.5 Vdc, I  
= 80 mA  
DD  
DQ1  
28  
27  
f1 = 870 MHz, f2 = 870.1 MHz  
Two−Tone Measurements  
100 kHz
T
o
ne Spacing  
−60  
−70  
1
10  
, OUTPUT POWER (WATTS) PEP  
100  
300  
1
10  
100  
200  
P
out  
P
out  
, OUTPUT POWER (WATTS) PEP  
Figure 6. Tw
o
–
T
one Power Gain versus  
Output Power  
Figure 7. Intermodulation Distortion Products  
versus Output Power  
−20  
−25  
−30  
−35  
34  
32  
30  
28  
26  
24  
70  
V
I
= 28.5 Vdc, I  
= 80 mA  
V
I
= 28.5 Vdc, P
 
= 35 W (PEP)  
out  
−30
_
C  
DD  
DQ1  
= 650 mA, f = 870 MHz  
DD  
= 80 mA, I  
= 650 mA  
60  
50  
DQ2  
DQ1  
DQ2  
25
_
C  
85
_
C  
Two−Tone Measurements  
(f1 + f2)/2 = Center Frequency of 870 MHz  
−30
_
C  
G
ps  
3rd Order  
T
= 25
_
C  
C
40  
30  
20  
10  
0
5th Order  
85
_
C  
−40  
−45  
−50  
−55  
7th Order  
PAE  
22  
20  
0.1  
1
10  
100 200  
0.1  
1
10  
100  
1000  
TWO−TONE SPACING (MHz)  
P ,
 
OUTPUT POWER (WATTS) CW  
out  
Figure 8. Intermodulation Distortion Products  
versus Tone Spacing  
Figure 9. Power Gain and Power Added  
Efficiency versus CW Output Power  
MW5IC970NBR1  
RF Device Data  
Freescale Semiconductor  
5

TYPICAL CHARACTERISTICS  
32  
31  
I
I
= 80 mA  
= 650 mA  
DQ1  
DQ2  
f = 870 MHz  
30  
29  
28  
27  
16 V  
32 V  
24 V  
80  
28.5 V  
100  
20 V  
60  
V
= 12 V  
DD  
0
20  
40  
120  
140  
P ,
 
OUTPUT POWER (WATTS) CW  
out  
Figure 10. Power Gain versus Output Power  
MW5IC970NBR1  
RF Device Data  
Freescale Semiconductor  
6

NOTES  
MW5IC970NBR1  
RF Device Data  
Freescale Semiconductor  
7

NOTES  
MW5IC970NBR1  
RF Device Data  
Freescale Semiconductor  
8

PACKAGE DIMENSIONS  
MW5IC970NBR1  
RF Device Data  
Freescale Semiconductor  
9

MW5IC970NBR1  
RF Device Data  
Freescale Semiconductor  
10  

MW5IC970NBR1  
RF Device Data  
Freescale Semiconductor  
11  

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chnical Information Center, CH370  
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Document Number: MW5IC970NBR1  

R

ev. 1, 5/2006