onsemi-AFGHL75T65SQD

Part #onsemi-AFGHL75T65SQD
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onsemi-AFGHL75T65SQD
AFGHL50T65SQDC  
Hybrid IGBT 50ꢀA, 650ꢀV  
th  
Using the novel field stop 4
 
generation IGBT technology and the  
th  
1.5  
generation SiC Schottky Diode technology,  
AFGHL50T65SQDC offers the optimum performance with both low  
conduction and switching losses for high efficiency operations in  
various applications, especially totem pole bridgeless PFC and  
Inverter.  
Features  
50 A, 650 V  

CESat

= 1.6 V (Typ.)  
•
AEC
−
Q101 Qualified  
•
Maximum Junction Temperature : T
 
= 175
°
C  
V
J
•
Positive Temperature Co
−
efficient for Easy Parallel Operating  
•
High Current Capability  
C
•
Low Saturation
V
o
ltage: V  
•
Fast Switching  
= 1.6 V (Typ.) @I
 
= 50 A  
C
CE(Sat)  
•
Tighten Parameter Distribution  
G
•
No Reverse Recovery/No Forward Recovery  
E
Typical Applications  
•
Automotive  
•
On & Off Board Chargers  
•
DC
−
DC Converters  
•
PFC  
•
Industrial Inverter  
G
C
MAXIMUM RATINGS  
E
TO
−
247
−
3L  
CASE 340CX  
Rating  
Symbol Value  
Unit  
V
Collector to Emitter Voltage  
V
CES  
V
GES  
650  
Gate to Emitter Voltage  
Transient Gate to Emitter Voltage  
20  
30  
V
MARKING DIAGRAM  
Collector Current  
@T =
 
25
°
C  
I
C
100  
50  
A
C
@T =
 
100
°
C  
C
I
200  
200  
A
A
A
LM  
&Y&Z&3&K  
AFGHL  
I
CM  
50T65SQDC  
Diode Forward Current  
@T =
 
25
°
C  
@T =
 
100
°
C  
I
F
40  
20  
C
C
Pulsed Diode Maximum Forward Current  
I
200  
A
FM  
Maximum Power Dissipation
 
@T =
 
25
°
C  
P
D
238  
119  
W
C
@T =
 
100
°
C  
C
&Y  
&Z  
&3  
&K  
= ON Semiconductor Logo  
= Assembly Plant Code  
= 3
−
Digit Data Code  
Operating Junction  
T ,  
STG  
55 to  
+175  
°
C  
°
C  
J
/ Storage
T
e
mperature Range  
T
= 2
−
Digit Lot Traceability Code  
Maximum Lead
T
e
mp. for Soldering  
Purposes, 1/8
″
from case for 5 seconds  
T
L
300  
AFGHL50T65SQDC = Specific Device Code  
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
ORDERING INFORMATION  
Device  
Package  
Shipping  
1. V
 
= 400
V
, V
 
=
1
5
V
, I
 
=
2
00 A, R
 
= 26
W
, Inductive Load,  
CC  
GE  
C
G
100%
T
e
sted.  
AFGHL50T65SQDC TO
−
247
−
3L 30
 
Units / Rail  
2. Repetitive
 
Rating: pulse width limited by max. Junction temperature.  
©
Semiconductor Components Industries, LLC, 2019  
1
Publication Order Number:  
August, 2019
−
Rev. 2  
AFGHL50T65SQDC/D  
 

AFGHL50T65SQDC  
THERMAL CHARACTERISTICS  
Rating  
Symbol  
Value  
0.63  
1.55  
40  
Unit  
°
C
/W  
°
C
/W  
°
C
/W  
Thermal resistance junction
−
to
−
case, for IGBT  
Thermal resistance junction
−
to
−
case, for Diode  
Thermal resistance junction
−
to
−
ambient  
R
q
JC  
R
q
JC  
R
q
JA  
ELECTRICAL CHARACTERISTICS
(T =
 
25
°
C unless otherwise noted)  
J
Parameter  
Test Conditions  
Symbol  
Min.  
Typ.  
Max.  
Unit  
OFF CHARACTERISTICS  
Collector
−
emitter breakdown voltage,  
gate
−
emitter short
−
circuited  
V
C
= 0
V
,  
BV  
650  
−
−
−
V
GE  
CES  
I
= 1 mA  
T
e
mperature Coefficient of Breakdown  
Voltage  
V
C
= 0
V
,  
= 1 mA  
−
0.6  
V/
°
C  
GE  
D
BV  
D
T  
CES  
I
J
Collector
−
emitter cut
−
off current,  
gate
−
emitter short
−
circuited  
V
CE  
= 0
V
,  
I
−
−
−
−
250  
400  
m
A  
GE  
CES  
V
= 650 V  
Gate leakage current, collector
−
emitter  
short
−
circuited  
V
= 20 V,  
= 0 V  
I
nA  
GE  
GES  
V
CE  
ON CHARACTERISTICS  
Gate
−
emitter threshold voltage  
Collector
−
emitter saturation voltage  
V
= V
 
, I
 
= 50 mA  
V
GE(th)  
3.4  
4.9  
6.4  
V
V
GE  
CE  
C
V
V
= 15 V, I
 
= 50 A  
V
CE(sat)  
−
−
1.6  
1.9  
2.1  
−
GE  
C
= 15 V, I
 
= 50 A,  
GE  
C
T =
 
175
°
C  
J
DYNAMIC CHARACTERISTICS  
Input capacitance  
V
= 30 V,  
GE  
C
−
−
−
−
−
−
3098  
265  
9
−
−
−
−
−
−
pF  
nC  
CE  
ies  
V
= 0
V
,  
Output capacitance  
Reverse transfer capacitance  
Gate charge total  
C
oes  
f = 1 MHz  
C
res  
V
= 400
V
,  
= 50 V,  
Q
94  
CE  
g
I
C
Gate to emitter charge  
Gate to collector charge  
SWITCHING CHARACTERISTICS  
Turn
−
on delay time  
Rise time  
Q
Q
18  
ge  
gc  
V
= 15 V  
GE  
23  
T =
 
25
°
C  
VCC = 400
V
,  
IC = 12.5 A  
t
−
−
−
−
−
−
−
−
−
−
−
−
−
−
17.6  
6.4  
−
−
−
−
−
−
−
−
−
−
−
−
−
−
ns  
J
d(on)  
t
r
R
V
= 4.7
W  
Turn
−
off delay time  
Fall time  
G
t
94.4  
14.4  
131  
96  
d(off)  
= 15 V  
GE  
t
Inductive Load  
f
Turn
−
on switching loss  
Turn
−
off switching loss  
T
o
tal switching loss  
Turn
−
on delay time  
Rise time  
E
E
m
J  
on  
off  
E
227  
19.2  
11.2  
89.6  
6.4  
ts  
T =
 
25
°
C  
VCC = 400
V
,  
IC = 25 A  
t
ns  
J
d(on)  
t
r
R
V
= 4.7
W  
G
Turn
−
off delay time  
Fall time  
td  
(off)  
= 15 V  
GE  
Inductive Load  
t
f
Turn
−
on switching loss  
Turn
−
off switching loss  
T
o
tal switching loss  
Eon  
Eoff  
Ets  
311  
141  
452  
m
J  
2

AFGHL50T65SQDC  
ELECTRICAL CHARACTERISTICS
(T =
 
25
°
C unless otherwise noted)  
J
Parameter  
SWITCHING CHARACTERISTICS  
Turn
−
on delay time  
Rise time  
Test Conditions  
Symbol  
Min.  
Typ.  
Max.  
Unit  
T =
 
175
°
C  
t
t
−
−
−
−
−
−
−
−
−
−
−
−
−
−
16  
8
−
−
−
−
−
−
−
−
−
−
−
−
−
−
ns  
J
d(on)  
VCC = 400
V
,  
IC = 12.5 A  
t
r
R
GE  
Inductive Load  
= 4.7
W  
G
Turn
−
off delay time  
Fall time  
107.2  
53.6  
157  
193  
350  
17.6  
14.4  
99.2  
9.6  
d(off)  
V
= 15 V  
t
f
Turn
−
on switching loss  
Turn
−
off switching loss  
T
o
tal switching loss  
Turn
−
on delay time  
Rise time  
E
on  
E
off  
m
J  
E
ts  
T =
 
175
°
C  
t
t
ns  
J
d(on)  
VCC = 400
V
,  
IC = 25 A  
t
r
R
GE  
Inductive Load  
= 4.7
W  
G
Turn
−
off delay time  
Fall time  
d(off)  
V
= 15 V  
t
f
Turn
−
on switching loss  
Turn
−
off switching loss  
T
o
tal switching loss  
DIODE CHARACTERISTICS  
Forward voltage  
E
on  
E
off  
350  
328  
678  
m
J  
E
ts  
I =
 
20 A  
V
F
−
1.45  
1.83  
1.75  
−
V
F
I =
 
20 A, T
 
= 175
°
C  
F
J
T
o
tal Capacitance  
V
= 400
V
, f = 1
M
Hz  
= 600
V
, f = 1
M
Hz  
C
−
−
103  
99  
−
−
pF  
R
R
V
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
3

AFGHL50T65SQDC  
TYPICAL CHARACTERISTICS  
200  
150  
100  
50  
200  
20 V  
15 V  
12 V  
10 V  
20 V  
15 V  
12 V  
10 V  
T =
 
25
°
C  
J
T =
 
175
°
C  
J
150  
100  
50  
V
GE  
= 8 V  
V
GE  
= 8 V  
0
0
0
1
2
3
4
5
0
1
2
3
4
CE  
5
Collector
−
Emitter Voltage, V
 
[V]  
Collector
−
Emitter Voltage, V
 
[V]  
CE  
Figure 1. Typical Output Characteristics  
Figure 2. Typical Output Characteristics ¨  
(T

J

= 25
5
C)  
(T

J

= 175
5
C)  
100  
80  
60  
40  
20  
0
200  
150  
100  
50  
Common Emitter  
V
CE  
= 20 V  
T =
 
25
°
C  
J
T =
 
175
°
C  
J
Common Emitter  
V
CE  
= 20 V  
T =
 
25
°
C  
J
T =
 
175
°
C  
J
0
0
1
2
3
4
5
0
2
4
6
8
10  
Collector Current, I
 
[A]  
Collector
−
Emitter Voltage, V
 
[V]  
CE  
C
Figure 3. Transfer Characteristics  
Figure 4. Typical Saturation Voltage  
Characteristics  
20  
16  
12  
8
5
4
3
2
1
Common Emitter  
Common Emitter  
T =
 
25
°
C  
J
V
GE  
= 15 V  
100 A  
50 A  
100 A  
I
C
= 25 A  
50 A  
100  
4
I
C
= 20 A  
0
−
100
−
50  
0
50  
150  
200  
4
8
12  
16  
20  
Collector
−
Emitter Case Temperature, T
 
[
°
C]  
Gate
−
Emitter Voltage, V
 
[V]  
J
GE  
Figure 5. Saturation Voltage vs. Case Temperature  
at Variant Current Level  
Figure 6. Saturation Voltage vs. V

GE

(T

J

= 25
5
C)  
4

AFGHL50T65SQDC  
TYPICAL CHARACTERISTICS
(continued)  
20  
16  
12  
8
Common Emitter  
T =
 
175
°
C  
10000  
1000  
100  
10  
J
C
ies  
C
oes  
100 A  
50 A  
C
res  
I
C
= 25 A  
Common Emitter  
= 0
V
, f = 1
M
Hz  
4
V
GE  
T =
 
25
°
C  
J
0
1
30  
4
8
12  
16  
20  
1
10  
Collector
−
Emitter Voltage, V
 
[V]  
Gate
−
Emitter Voltage, V
 
[V]  
GE  
CE  
Figure 7. Saturation Voltage vs. V

GE

(T

J

= 175
5
C)  
Figure 8. Capacitance Characteristics  
15  
200  
100  
V
CC  
= 200 A  
t
r
12  
9
300 V  
400 A  
t
d(on)  
10  
1
6
Common Emitter  
V
CC  
= 400
V
, V
 
=
1
5 V  
GE  
I
C
= 50 A  
3
Common Emitter  
T =
 
25
°
C  
J
T =
 
25
°
C  
J
T =
 
175
°
C  
J
0
0
20  
40  
60  
80  
100  
5
15  
25  
35  
45 50  
Gate Charge, Q
 
[nC]  
Gate Resistance, R
 
[
W]  
G
G
Figure 9. Gate Charge Characteristics (T

J

= 25
5
C)  
Figure 10. Turn
−
on Characteristics  
vs. Gate Resistance  
200  
100  
1000  
t
r
t
d(on)  
t
d(on)  
100  
10  
10  
1
Common Emitter  
= 400
V
, V
 
=
1
5 V  
Common Emitter  
t
r
V
CC  
V
R
= 400
V
, V
 
=
1
5 V  
= 4.7
W  
T =
 
25
°
C  
T =
 
175
°
C  
J
GE  
CC  
GE  
I
C
= 50 A  
G
T =
 
25
°
C  
J
J
T =
 
175
°
C  
J
5
15  
25  
35  
45 50  
0
30  
60  
90  
120  
150  
Gate Resistance, R
 
[
W]  
Collector Current, I
 
[A]  
G
C
Figure 11. Turn
−
Off Characteristics vs. Resistance  
Figure 12. Turn
−
On Characteristics  
vs. Collector Current  
5

AFGHL50T65SQDC  
TYPICAL CHARACTERISTICS
(continued)  
1000  
100  
10  
5000  
t
r
E
on  
1000  
t
d(on)  
E
off  
Common Emitter  
Common Emitter  
V =
 
400
V
, V
 
=
1
5 V  
CC  
V
CC  
= 400
V
, V
 
=
1
5 V  
GE  
GE  
R
= 4.7
W  
I =
 
50 A  
C
G
T =
 
25
°
C  
T =
 
175
°
C  
J
T =
 
25
°
C  
J
T =
 
175
°
C  
J
J
1
100  
0
30  
60  
90  
120  
150  
5
15  
25  
35  
45 50  
Collector Current, I
 
[A]  
Gate Resistance, R
 
[
W]  
C
G
Figure 13. Turn
−
Off Characteristics vs. Collector  
Figure 14. Switching Loss vs. Gate  
Resistance  
Current  
10000  
300  
100  
E
on  
DC  
10
m
s  
100
m
s  
1 ms  
1000  
10 ms  
10  
1
E
off  
Common Emitter  
*Notes:  
1. T
 
= 25
°
C  
100  
10  
V
= 400
V
, V
 
=
1
5 V  
CC  
GE  
C
R
= 4.7
W  
2. T
 
= 175
°
C  
3. Single Pulse  
G
J
T =
 
25
°
C  
J
T =
 
175
°
C  
J
0.1  
0
30  
60  
90  
120  
150  
1
10  
100  
1000  
Collector Current, I
 
[A]  
Collector
−
Emitter Voltage, V
 
[V]  
C
CE  
Figure 15. Switching Loss vs. Collector Current  
Figure 16. SOA Characteristics (FBSOA)  
150  
50  
40  
T =
 
25
°
C  
100  
10  
1
J
T =
 
75
°
C  
J
T =
 
125
°
C  
J
30  
T =
 
175
°
C  
J
20  
10  
0
0
1
2
3
4
5
25  
50  
75  
100 125  
150  
175  
Forward Voltage, V
 
[V]  
Collector
−
Emitter Case Temperature, TC [
°
C]  
F
Figure 18. (Diode) Current Derating  
Figure 17. (Diode) Forward Characteristics vs.  
(Normal I
−
V)  
6

AFGHL50T65SQDC  
TYPICAL CHARACTERISTICS
(continued)  
180  
150  
120  
90  
60  
30  
0
25  
50  
175  
75  
100 125  
150  
Collector
−
Emitter Case Temperature, T
 
[
°
C]  
C
Figure 19. (Diode) Power Derating  
10000  
1000  
100  
Common Emitter  
V
GE  
= 0
V
, f = 1
M
Hz  
T =
 
25
°
C  
J
10  
0,1  
1
10  
100  
650  
Collector
−
Emitter Voltage, V
 
[V]  
CE  
Figure 20. (Diode) Output Capacitance (Coes) vs.  
Reverse Voltage  
30  
20  
10  
0
0
100 200 300 400 500 600
 
650  
Collector
−
Emitter Voltage, V
 
[V]  
CE  
Figure 21. Output Capacitance Stored Energy  
7

AFGHL50T65SQDC  
5
1
0.5  
0.2  
0.1  
P
DM  
0.1  
t
0.05  
0.02  
0.01  
1
t
2
Duty Factor, D = t
 
/ t  
Peak T
 
= Pdm
×
Zthjc + T  
1
2
Single Pulse  
J
C
0.01  
−
5  
−
4  
−
3  
−
2  
−
1  
0
1
10  
10  
10  
10  
10  
10  
10  
Rectangular Pulse Duration [sec]  
Figure 22. Transient Thermal Impedance of IGBT  
5
1
0.5  
0.2  
0.1  
0.05  
0.02  
0.1  
P
DM  
0.01  
t
1
t
2
Single Pulse  
Duty Factor, D = t
 
/ t  
1
2
Peak T
 
= Pdm
×
Zthjc + T  
J
C
0.01  
−
5  
−
4  
−
3  
−
2  
−
1  
0
1
10  
10  
10  
10  
10  
10  
10  
Rectangular Pulse Duration [sec]  
Figure 23. Transient Thermal Impedance of Diode  
8

MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
TO
−
247
−
3LD  
CASE 340CX  
ISSUE A  
DATE 06 JUL 2020  
GENERIC  
MARKING DIAGRAM*  
XXXXX =
 
Specific Device Code  
A
Y
= Assembly Location  
=
Y
e
ar  
WW  
G
= Work Week  
= Pb
−
Free Package  
XXXXXXXXX  
AYWWG  
*This information is generic. Please refer to  
device data sheet for actual part marking.  
Pb
−
Free indicator, “G” or microdot “
G
”, may  
or may not be present. Some products may  
not follow the Generic Marking.  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions
 
are uncontrolled
 
except when stamped
 
“CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON93302G  
TO
−
247
−
3LD  
PAGE 1 OF 1  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding  
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically  
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the  
rights of others.  
©
Semiconductor Components Industries, LLC, 2018  

ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
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coverage may be accessed at

. ON Semiconductor reserves the right to make changes without further notice to any products herein.  
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arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,  
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