onsemi-FCD600N65S3R0

Part #onsemi-FCD600N65S3R0
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onsemi-FCD600N65S3R0
FCD600N65S3R0  

MOSFET

– Powe
r
,
N
-Channel,  
SUPERFET III, Easy Drive  
650
V
, 6
A
, 600 m
W
 
Description  
SUPERFET III MOSFET is ON Semiconductor’s brand-new high  
voltage super-junction (SJ) MOSFET family that is utilizing charge  
balance technology for outstanding low on-resistance and lower gate  
charge performance. This advanced technology is tailored to minimize  
conduction loss, provide superior switching performance, and  
withstand extreme dv/dt rate.  
V
R
MAX  
I MAX  
D
DSS  
DS(ON)  
650 V  
600 m
W
@ 10 V  
6 A  
Consequently, SUPERFET III MOSFET Easy drive series helps  
manage EMI issues and allows for easier design implementation.  
D
Features  
•
700 V @ T
 
= 150
°
C  
J
G
•
Typ. R  
= 493 m
W
 
DS(on)  
•
Ultra Low Gate Charge (Typ. Q
 
= 11 nC)  
S
g
•
Low Effective Output Capacitance (Typ. C  
•
100% Avalanche Tested  
= 127 pF)  
N-Channel MOSFET  
oss(eff.)  
D
•
These Devices are Pb
−
Free, Halogen Free/BFR Free and are RoHS  
Compliant  
G
S
Applications  
D
−
PAK  
TO
−
252  
CASE 369AS  
•
Computing / Display Power Supplies  
•
Telecom / Server Power Supplies  
•
Industrial Power Supplies  
MARKING DIAGRAM  
•
Lighting / Charger / Adapter  
$Y&Z&3&K  
FCD600  
N65S3R0  
$Y  
= ON Semiconductor Logo  
= Assembly Plant Code  
= Numeric Date Code  
= Lot Code  
&Z  
&3  
&K  
FCD600N65S3R0 =
 
Specific Device Code  
ORDERING INFORMATION  
See detailed ordering and shipping information on page

this data sheet.  
©
Semiconductor Components Industries, LLC, 2017  
1
Publication Order Number:  
August, 2019
−
Rev. 4  
FCD600N65S3R0/D  

FCD600N65S3R0  
ABSOLUTE MAXIMUM RATINGS
(T =
 
25
°
C, Unless otherwise specified)  
C
Symbol  
Parameter  
Value  
Unit  
V
V
DSS  
V
GSS  
Drain to Source Voltage  
Gate to Source Voltage  
650  
DC  
30  
V
AC (f > 1 Hz)  
30  
V
I
D
Drain Current  
Continuous (T
 
= 25
°
C)  
6
3.8  
A
C
Continuous (T
 
= 100
°
C)  
C
I
Drain Current  
Pulsed (Note

15  
A
mJ  
A
DM  
E
Single Pulsed Avalanche Energy (Note

Avalanche Current (Note

Repetitive Avalanche Energy (Note

MOSFET dv/dt  
24  
AS  
AS  
I
1.6  
E
0.54  
100  
mJ  
V/ns  
AR  
dv/dt  
Peak Diode Recovery dv/dt (Note

Power Dissipation  
20  
P
(T =
 
25
°
C)  
54  
W
W/
°
C  
°
C  
D
C
Derate Above 25
°
C  
0.43  
−
55 to +150  
300  
T , T  
Operating and Storage
T
e
mperature Range  
J
STG  
T
Maximum Lead
T
e
mperature for Soldering, 1/8
″
from Case for 5 s  
°
C  
L
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality  
should not be assumed, damage may occur and reliability may be affected.  
1. Repetitive
 
rating: pulse-width limited by maximum junction temperature.  
2. I
 
= 1.6 A, R
 
= 25
W
, starting T
 
= 25
°
C.  
AS  
G
J
3. I
 
≤
3 A, di/dt
≤
200 A/
m
s, V
 
≤
400 V, starting T
 
= 25
°
C.  
SD  
DD  
J
THERMAL CHARACTERISTICS  
Symbol  
Parameter  
Value  
2.3  
Unit  
R
R
Thermal Resistance, Junction to Case, Max.  
_
C/W  
q
JC  
JA  
52  
q
2
4. Device
 
on 1 in
 
pad 2 oz copper pad on 1.5 x 1.5 in. board of FR
−
4 material.  
PACKAGE MARKING AND ORDERING INFORMATION  
†
Part Number  
Top Marking  
Package  
Reel Size  
Tape Width  
Shipping (Qty / Packing)  
FCD600N65S3R0  
FCD600N65S3R0  
D
−
PAK  
(DPAK3 (TO
−
252 3LD))  
(Pb
−
Free / Halogen Free)  
330 mm  
16 mm  
2500 /
T
a
pe & Reel  
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our
T
a
pe and Reel Packaging  
Specifications Brochure, BRD8011/D.  
2
 

FCD600N65S3R0  
ELECTRICAL CHARACTERISTICS
(T =
 
25
°
C unless otherwise noted)  
C
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Unit  
OFF CHARACTERISTICS  
BV  
Drain to Source Breakdown Voltage  
650  
700  
−
−
−
−
−
−
V
V
V
V
I
= 0
V
, I
 
= 1 mA, T
 
= 25
_
C  
DSS  
GS  
D
J
= 0
V
, I
 
= 1 mA, T
 
= 150
_
C  
GS  
D
J
D
BV  
/
D
T  
Breakdown Voltage
T
e
mperature  
Coefficient  
= 1 mA, Referenced to 25
_
C  
0.66  
V/
_
C  
DSS  
J
D
I
Zero Gate Voltage Drain Current  
V
DS  
V
DS  
V
GS  
= 650
V
, V
 
= 0 V  
−
−
−
−
0.3  
−
1
m
A  
DSS  
GS  
= 520
V
, T
 
=
1
25
_
C  
−
C
I
Gate to Body Leakage Current  
=
30
V
, V
 
= 0 V  
100  
nA  
GSS  
DS  
ON CHARACTERISTICS  
V
Gate Threshold Voltage  
V
GS  
V
GS  
V
DS  
= V
 
, I
 
= 0.12 mA  
2.5  
−
−
4.5  
600  
−
V
m
W  
S
GS(th)  
DS(on)  
DS  
D
R
Static Drain to Source On Resistance  
Forward Transconductance  
= 10
V
, I
 
= 3 A  
493  
3.6  
D
g
FS  
= 20
V
, I
 
= 3 A  
−
D
DYNAMIC CHARACTERISTICS  
C
Input Capacitance  
V
= 400
V
, V
 
= 0 V, f = 1
M
Hz  
−
−
−
−
−
−
−
−
465  
10  
−
−
−
−
−
−
−
−
pF  
pF  
pF  
pF  
nC  
nC  
nC  
W
iss  
DS  
GS  
C
Output Capacitance  
oss  
C
Effective Output Capacitance  
Energy Related Output Capacitance  
T
o
tal Gate Charge at 10 V  
Gate to Source Gate Charge  
Gate to Drain “Miller” Charge  
Equivalent Series Resistance  
V
DS  
V
DS  
V
DS  
= 0 V to 400 V, V
 
= 0 V  
127  
17  
oss(eff.)  
GS  
C
= 0 V to 400 V, V
 
= 0 V  
GS  
oss(er.)  
Q
= 400
V
, I
 
= 3
A
, V
 
= 10 V  
11  
g(tot)  
D
GS  
(Note

Q
3
gs  
Q
4.9  
0.9  
gd  
ESR  
f = 1 MHz  
SWITCHING CHARACTERISTICS  
t
Turn-On Delay Time  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
V
V
= 400
V
, I
 
= 3
A
,  
−
−
−
−
11  
9
−
−
−
−
ns  
ns  
ns  
ns  
d(on)  
DD  
GS  
D
= 10
V
, R
 
=
4
.7
W  
g
t
r
(Note

t
29  
14  
d(off)  
t
f
SOURCE-DRAIN DIODE CHARACTERISTICS  
I
Maximum Continuous Source to Drain Diode Forward Current  
Maximum Pulsed Source to Drain Diode Forward Current  
−
−
−
−
−
−
6
A
A
V
S
I
15  
1.2  
SM  
V
SD  
Source to Drain Diode Forward  
Voltage  
V
GS  
= 0
V
, I
 
= 3 A  
SD  
t
Reverse Recovery Time  
V
= 0
V
, I
 
= 3
A
,  
−
−
198  
1.6  
−
−
ns  
rr  
GS  
F
SD  
dI /dt
 
= 100 A/
m
s  
Q
Reverse Recovery Charge  
m
C  
rr  
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
5. Essentially
 
independent of operating temperature typical characteristics.  
3
 

FCD600N65S3R0  
TYPICAL PERFORMANCE CHARACTERISTICS  
30  
10  
20  
V
GS  
= 10.0 V  
8.0 V  
7.0 V  
6.5 V  
6.0 V  
*Notes:  
1. V
 
= 20 V  
DS  
10  
2. 250
m
s Pulse
T
e
st  
150
°
C  
5.5 V  
1
0.1  
25
°
C  
1
−
55
°
C  
*Notes:  
1. 250
m
s Pulse
T
e
st  
2. T
 
= 25
°
C  
C
0.01  
0.1  
0.2  
1
10  
3
4
5
6
7
8
9
V ,
 
Gate
−
Source Voltage [V]  
GS  
V ,
 
Drain
−
Source Voltage [V]  
DS  
Figure 1. On-Region Characteristics  
Figure 2. Transfer Characteristics  
1.2  
0.8  
0.4  
0.0  
100  
10  
*Note: T
 
= 25
°
C  
*Notes:  
C
1. V
 
= 0 V  
GS  
2. 250
m
s Pulse
T
e
st  
150
°
C  
1
V
GS  
= 10 V  
25
°
C  
0.1  
V
GS  
= 20 V  
−
55
°
C  
0.01  
0.001  
0
3
6
9
12  
0.0  
0.5  
1.0  
1.5  
V
SD  
, Body Diode Forward Voltage [V]  
I ,
 
Drain Current [A]  
D
Figure 3. On-Resistance Variation vs. Drain  
Current and Gate Voltage  
Figure 4. Body Diode Forward Voltage  
Variation vs. Source Current and Temperature  
10  
10000  
*Note: I
 
= 3 A  
D
C

iss  

C

oss  

C

rss  

8
6
1000  
100  
10  
V
DS  
= 130 V  
V
DS  
= 400 V  
4
2
*Notes:  
1 V
 
= 0 V  
GS  
2. f = 1 MHz  
C
C
C
= C
 
+ C
 
(C =
 
shorted)  
gs gd
 
ds  
= C
 
+ C  
= C  
1
iss  
oss  
rss  
ds  
gd  
gd  
0
0.1  
0.1  
0
3
6
9
12  
1
10  
100  
1000  
Q ,
 
Total Gate Charge [nC]  
g
V ,
 
Drain
−
Source Voltage [V]  
DS  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  
4

FCD600N65S3R0  
TYPICAL PERFORMANCE CHARACTERISTICS
(Continued)  
1.2  
1.1  
1.0  
0.9  
0.8  
3.0  
*Notes:  
*Notes:  
1. V
 
= 10 V  
1. V
 
= 0 V  
GS  
GS  
2.5  
2. I
 
= 3 A  
D
2. I
 
= 10 mA  
D
2.0  
1.5  
1.0  
0.5  
0.0  
−
50  
0
50  
100  
150  
−
50  
0
50  
100  
150  
T ,
 
Junction Temperature [
5
C]  
J
T ,
 
Junction Temperature [
5
C]  
J
Figure 7. Breakdown Voltage Variation  
vs. Temperature  
Figure 8. On-Resistance Variant vs. Temperature  
8
6
4
2
0
30  
10
m
s  
10  
100
m
s  
1 ms  
10 ms  
DC  
1
Operation in This Area  
is Limited by R  
DS(on)  
0.1  
0.01  
*Notes:  
1. T
 
= 25
°
C  
C
2. I
 
= 10 mA  
D
3. Single Pulse  
1
10  
100  
1000  
25  
50  
75  
100  
125  
150  
V ,
 
Drain
−
Source Voltage [V]  
DS  
T ,
 
Case Temperature [
5
C]  
C
Figure 9. Maximum Safe Operation Area  
Figure 10. Maximum Drain Current  
vs. Case Temperature  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
0
0
130  
260  
390  
520  
650  
V ,
 
Drain
−
Source Voltage [V]  
DS  
Figure 11. E

OSS

vs. Drain to Source Voltage  
5

FCD600N65S3R0  
TYPICAL PERFORMANCE CHARACTERISTICS
(Continued)  
2
1
DUTY CYCLE
−
DESCENDING ORDER  
D = 0.5  
0.2  
0.1  
0.1  
0.01  
0.05  
0.02  
0.01  
SINGLE PULSE  
10

−
4  

0.001  
10

−
5  

10

−
3  

10

−
2  

10

−
1  

10

0  

10

1  

t, RECTANGULAR PULSE DURATION (sec)  
Figure 12. Transient Thermal Response Curve  
6

FCD600N65S3R0  
V
GS  
R
Q
g
L
V
DS  
Q
Q
gs  
gd  
V
GS  
DUT  
I
G
= Const.  
Charge  
Figure 13. Gate Charge Test Circuit & Waveform  
R
L
V
DS  
GS  
90%  
90%  
10%  
90%  
V
DS  
V
DD  
V
GS  
R
G
10%  
V
DUT  
V
GS  
t
r
t
f
t
t
d(off)  
d(on)  
t
on  
t
off  
Figure 14. Resistive Switching Test Circuit & Waveforms  
L
2
1
2
E

AS  

+
@
LI

AS  

V
DS  
BV  
DSS  
I
D
I
AS  
R
G
V
DD  
I (t)  
D
DUT  
V
DD  
V
GS  
V
DS  
(t)  
t
p
Time  
t
p
Figure 15. Unclamped Inductive Switching Test Circuit & Waveforms  
7

FCD600N65S3R0  
+
DUT  
V
SD  
−
I
SD  
L
Driver  
R
G
Same Type  
as DUT  
V
DD  
V
GS  
−
dv/dt controlled by R  
G
−
I controlled
 
by pulse period  
SD  
Gate Pulse Width  
D
+  
Gate Pulse Period  
V
GS  
10 V  
(Driver)  
I
, Body Diode Forward Current  
FM  
I
di/dt  
SD  
(DUT)  
I
RM  
Body Diode Reverse Current  
Body Diode Recovery dv/dt  
V
DS  
V
DD  
V
SD  
(DUT)  
Body Diode  
Forward Voltage Drop  
Figure 16. Peak Diode Recovery dv/dt Test Circuit & Waveforms  
SUPERFET is a registered trademark of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or  
other countries.  
8

MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
DPAK3 (TO
−
252 3 LD)  
CASE 369AS  
ISSUE O  
DATE 30 SEP 2016  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions
 
are uncontrolled
 
except when stamped
 
“CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON13810G  
DPAK3 (TO
−
252 3 LD)  
PAGE 1 OF 1  
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are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
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©
Semiconductor Components Industries, LLC, 2019  

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