onsemi-FCMT360N65S3

Part #onsemi-FCMT360N65S3
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onsemi-FCMT360N65S3

MOSFET

– Powe
r
,  
N-Channel, SUPERFET

)

III,  
Easy-Drive  
650
V
,
1
0 A, 360 m
W
 
FCMT360N65S3  
General Description  
SuperFET III MOSFET is ON Semiconductor’s brand
−
new high  
voltage super
−
junction (SJ) MOSFET family that is utilizing charge  
balance technology for outstanding low on
−
resistance and lower gate  
charge performance. This advanced technology is tailored to minimize  
conduction loss, provide superior switching performance, and  
withstand extreme dv/dt rate.  
V
R
MAX  
I MAX  
D
DSS  
DS(ON)  
650 V  
360 m
ꢀ
@ 10 V  
10 A  
Consequently, SuperFET III MOSFET Easy
−
drive series helps  
manage EMI issues and allows for easier design implementation.  
The Power88 package is an ultra
−
slim surface
−
mount package  
D
S1 : Driver Source  
S2 : Power Source  
2
(1 mm
 
high) with a low profile and small footprint (8×8 mm ).  
SuperFET III MOSFET in a Power88 package offers excellent  
switching performance due to lower parasitic source inductance and  
separated power and drive sources. Power88 offers Moisture  
Sensitivity Level 1 (MSL 1).  
G
S1 S2  
Features  
N-CHANNEL MOSFET  
•
700 V @ T
 
= 150
°
C  
J
•
Typ R  
= 310 m
ꢀ  
DS(on)  
•
Ultra Low Gate Charge (Typ. Q
 
= 18 nC)  
g
•
Low Effective Output Capacitance (Typ. C  
•
100% Avalanche Tested  
•
These Devices are Pb
−
Free and are RoHS Compliant  
= 173 pF)  
oss(eff.)  
S2  
S2  
S1  
G
PQFN4 8X8 2P  
CASE 483AP  
Applications  
•
Computing / Display Power Supplies  
•
Telecom / Server Power Supplies  
•
Industrial Power Supplies  
•
Lighting / Charger / Adapter  
MARKING DIAGRAM  
&Z&3&K  
FCMT  
360N65S3  
&Z  
&3  
&K  
= Assembly Plant Code  
= Data Code (
Y
e
ar & Week)  
= Lot  
FCMT360N65S3 =
 
Specific Device Code  
ORDERING INFORMATION  
this data sheet.  
©
Semiconductor Components Industries, LLC, 2018  
1
Publication Order Number:  
February, 2020
−
Rev. 1  
FCMT360N65S3/D  

FCMT360N65S3  
ABSOLUTE MAXIMUM RATINGS
(T =
 
25
°
C, Unless otherwise specified)  
C
Symbol  
Parameter  
Value  
Unit  
V
V
DSS  
V
GSS  
Drain to Source Voltage  
Gate to Source Voltage  
650  
DC  
30  
V
AC (f > 1 Hz)  
30  
V
I
D
Drain Current  
Continuous (T
 
= 25
°
C)  
10  
A
C
Continuous (T
 
= 100
°
C)  
6
25  
C
I
Drain Current  
Pulsed (Note

A
mJ  
A
DM  
E
Single Pulsed Avalanche Energy (Note

Avalanche Current (Note

Repetitive Avalanche Energy (Note

MOSFET dv/dt  
40  
AS  
AS  
I
2.1  
E
0.83  
100  
mJ  
V/ns  
AR  
dv/dt  
Peak Diode Recovery dv/dt (Note

Power Dissipation  
20  
P
(T =
 
25
°
C)  
83  
W
W/
°
C  
°
C  
D
C
Derate Above 25
°
C  
0.67  
−
55 to +150  
300  
T , T  
Operating and Storage
T
e
mperature Range  
J
STG  
T
Maximum Lead
T
e
mperature for Soldering, 1/8
″
from Case for 5 s  
°
C  
L
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality  
should not be assumed, damage may occur and reliability may be affected.  
1. Repetitive
 
rating: pulse
−
width limited by maximum junction temperature.  
2. I
 
= 2.1 A, R
 
= 25
ꢀ
starting T
 
= 25
°
C  
AS  
G
J
3. I
 
≤
5 A, di/dt
≤
200 A/
ꢁ
s, V
 
≤
400
V
,
s
tarting T
 
= 25
°
C  
SD  
DD  
J
THERMAL CHARACTERISTICS  
Symbol  
Parameter  
Value  
1.5  
Unit  
Thermal Resistance, Junction to Case, Max.  
°
C/W  
R
R
ꢂ
JC  
JA  
45  
ꢂ
2
4. Device
 
on 1 in
 
pad 2 oz copper pad on 1.5 x 1.5 in. board of FR
−
4 material.  
ORDERING INFORMATION  
†
Device  
Marking  
Package  
Reel Size  
Tape Width  
Quantity  
FCMT360N65S3  
FCMT360N65S3  
PQFN8  
13
″  
13.3 mm  
3000 /
T
a
pe & Reel  
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our
T
a
pe and Reel Packaging  
Specifications Brochure, BRD8011/D.  
2
 

FCMT360N65S3  
ELECTRICAL CHARACTERISTICS
(T =
 
25
°
C unless otherwise noted)  
C
Symbol  
Parameter  
Test Condition  
Min  
Typ  
Max  
Unit  
OFF CHARACTERISTICS  
BV  
Drain to Source Breakdown Voltage  
V
V
= 0
V
, I
 
= 1
m
A, T
 
= 25
°
C  
650  
700  
V
V
DSS  
GS  
D
J
= 0
V
, I
 
= 1
m
A, T
 
= 150
°
C  
GS  
D
J
ꢃ
BV  
Breakdown Voltage
T
e
mperature  
Coefficient  
I
= 1mA, referenced to 25
°
C  
0.68  
0.58  
V/
°
C  
DSS  
J
D
/
ꢃ
T  
I
Zero Gate Voltage Drain Current  
V
V
V
= 650 V, V
 
= 0 V  
10  
ꢁ
A  
nA  
V
DSS  
DS  
DS  
GS  
GS  
= 520 V, T
 
= 125
°
C  
C
I
Gate to Source Leakage Current  
=
30
V
, V
 
= 0 V  
100  
GSS  
DS  
ON CHARACTERISTICS  
V
Gate Threshold Voltage  
V
V
V
= V
 
, I
 
= 200
ꢁ
A  
2.5  
4.5  
GS(th)  
DS(on)  
GS  
GS  
DS  
DS  
D
R
Static Drain to Source On Resistance  
Forward Transconductance  
= 10
V
, I
 
= 5 A  
310  
6
360  
m
ꢀ  
D
g
FS  
= 20
V
, I
 
= 5 A  
S
D
DYNAMIC CHARACTERISTICS  
C
Input Capacitance  
V
= 400
V
, V
 
= 0 V, f = 1
M
Hz  
730  
15  
pF  
pF  
pF  
pF  
nC  
nC  
nC  
ꢀ
iss  
DS  
GS  
C
Output Capacitance  
oss  
C
Effective Output Capacitance  
Energy Related Output Capacitance  
T
o
tal Gate Charge at 10 V  
Gate to Source Gate Charge  
Gate to Drain “Miller” Charge  
Equivalent Series Resistance  
V
V
V
= 0 V to 400
V
, V
 
= 0 V  
173  
26  
oss(eff.)  
DS  
DS  
DS  
GS  
C
= 0 V to 400
V
, V
 
= 0 V  
GS  
oss(er.)  
Q
= 400
V
, V
 
=
1
0
V
,  
18  
g(tot)  
GS  
I
= 5 A  
D
Q
4.3  
7.6  
1
gs  
Q
gd  
ESR  
f = 1 MHz  
SWITCHING CHARACTERISTICS  
t
Turn-On Delay Time  
Rise Time  
V
= 400
V
, I
 
= 5
A
, V
 
= 10
V
,  
GEN  
12  
11  
34  
10  
ns  
ns  
ns  
ns  
d(on)  
DD  
D
GS  
R
= 4.7
ꢀ  
t
r
t
Turn-Off Delay Time  
Fall Time  
d(off)  
t
f
SOURCE
−
DRAIN DIODE CHARACTERISTICS  
I
S
Source to Drain Diode Forward VoltageMaximum Continuous Source to Drain  
Diode Forward Current  
10  
A
I
Maximum Pulsed Source to Drain Diode Forward Current  
25  
A
V
SM  
V
Source to Drain Diode Forward Voltage  
Reverse Recovery Time  
V
V
= 0
V
, I
 
= 5 A  
1.2  
SD  
GS  
SD  
t
rr  
= 400
V
, I
 
= 5
A
,  
di /dt
 
= 100 A/
ꢁ
s  
241  
2.4  
ns  
ꢁ
C  
DD  
SD  
F
Q
Reverse Recovery Charge  
rr  
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
5. Essentially
 
independent of operating temperature typical characteristics.  
3
 

FCMT360N65S3  
TYPICAL PERFORMANCE CHARACTERISTICS  
50  
10  
50  
V

GS  

=
10.0V  
*Notes:  
1. V
 
= 20V  
8.0V  
7.0V  
6.5V  
6.0V  
5.5V  
DS  
2. 250
ꢁ
s Pulse Test  
10  
1
150

o

C  
25

o

C  
1
−
55

o

C  
*Notes:  
1. 250
ꢁ
s Pulse Test  
2. T

C

= 25

o

C  
0.1  
0.1  
0.2  
1
10  
20  
2
3
4
5
6
7
8
V

DS

, Drain
−
Source Voltage[V]  
V

GS

, Gate
−
Source Voltage[V]  
Figure 1. On-Region Characteristics  
Figure 2. Transfer Characteristics  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
100  
10  
1
*Note: T

C

= 25

o

C  
*Notes:  
1. V

GS

= 0V  
2. 250
ꢁ
s Pulse Test  
150

o

C  
25

o

C  
V

GS

= 10V  
0.1  
V

GS

= 20V  
o
−
55 C  
0.01  
0.001  
0
5
10  
15  
20  
25  
30  
0.0  
0.5  
1.0  
1.5  
I

D

, Drain Current [A]  
V

SD

, Body Diode Forward Voltage [V]  
Figure 3. On-Resistance Variation vs. Drain  
Current and Gate Voltage  
Figure 4. Body Diode Forward Voltage  
Variation vs. Source Current and Temperature  
10  
100000  
*Note:
I

D

= 5A  
10000  
1000  
100  
8
V

DS

= 130V  
C

iss  

V

DS

= 400V  
6
4
2
0
C

oss  

*Note:  
1. V
 
= 0V  
GS  
10  
2. f = 1MHz  
C
C
C
= C  
+ C
 
(C
= shorted)  
gs gd
 
ds  
iss  
C

rss  

1
= C  
+ C  
oss  
rss  
ds  
gd  
gd  
= C  
0.1  
0.1  
0
5
10  
15  
20  
1
10  
100  
1000  
Q

g

, Total Gate Charge [nC]  
V

DS

, Drain
−
Source Voltage [V]  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  
4

FCMT360N65S3  
TYPICAL PERFORMANCE CHARACTERISTICS
(Continued)  
3.0  
1.2  
1.1  
1.0  
0.9  
0.8  
*Notes:  
1. V
 
= 10V  
*Notes:  
1. V
 
= 0V  
GS  
GS  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
2.
I

D

= 5A  
2.
I

D

= 10mA  
−
50  
0
50  
100  
150  
−
50  
0
50  
100  
150  
T

J

, Junction Temperature
[

o

C]  
T

J

, Junction Temperature
[

o

C]  
Figure 7. Breakdown Voltage Variation  
vs. Temperature  
Figure 8. On-Resistance Variant vs. Temperature  
12  
10  
8
100  
10  
10
ꢁ
s  
100
ꢁ
s  
1ms  
10ms  
DC  
6
1
Operation in This Area  
is Limited by R  
DS(on)  
4
*Notes:  
1. T

C

= 25

o

C  
0.1  
0.01  
2
2. T
 
= 150

o  

3. Single Pulse  
C
J
0
25  
50  
75  
100  
125  
150  
1
10  
100  
1000  
V

DS

, Drain
−
Source Voltage [V]  
T

C

, Case Temperature [

o

C]  
Figure 9. Maximum Safe Operation Area  
Figure 10. Maximum Drain Current  
vs. Case Temperature  
5
4
3
2
1
0
0
130  
260  
390  
520  
650  
V

DS

, Drain to Source Voltage [V]  
Figure 11. E

OSS

vs. Drain to Source Voltage  
5

FCMT360N65S3  
TYPICAL PERFORMANCE CHARACTERISTICS
(Continued)  
2
1
DUTY CYCLE
−
DESCENDING ORDER  
D = 0.5  
0.2  
0.1  
P
DM  
0.1  
0.01  
0.05  
0.02  
0.01  
t
1
t
2
NOTES:  
Z
(t) = r(t) x R  
o
ꢂ
JC  
ꢂ
JC  
R
= 1.5
 
C/W  
ꢂ
JC  
Peak T
 
= P  
Duty Cycle, D = t
 
/ t  
x Z
 
(t) + T  
SINGLE PULSE  
10

−
4  

J
DM  
ꢂ
JC
C  
1
2
0.001  
10

−
5  

10

−
3  

10

−
2  

10

−
1  

10

0  

10

1  

10

2  

t, RECTANGULAR PULSE DURATION (sec)  
Figure 12. Transient Thermal Response Curve  
6

FCMT360N65S3  
V
GS  
R
Q
g
L
V
DS  
Q
Q
gd  
gs  
V
GS  
DUT  
I
G
= Const.  
Figure 13. Gate Charge Test Circuit & Waveform  
R
L
V
DS  
GS  
90%  
90%  
10%  
90%  
V
DS  
V
DD  
V
GS  
R
G
10%  
V
DUT  
V
GS  
t
t
d(off)  
t
r
t
f
d(on)  
t
on  
t
off  
Figure 14. Resistive Switching Test Circuit & Waveforms  
L
2
1
2
E

AS  

+
@
LI

AS  

V
DS  
BV  
DSS  
I
D
I
AS  
R
G
V
DD  
I (t)  
D
DUT  
V
DD  
V
GS  
V
DS  
(t)  
t
p
Time  
t
p
Figure 15. Unclamped Inductive Switching Test Circuit & Waveforms  
7

FCMT360N65S3  
+
DUT  
V
DS  
−
I
SD  
L
Driver  
R
G
Same Type  
as DUT  
V
DD  
V
GS  
−
dv/dt controlled by R  
G
−
I controlled
 
by pulse period  
SD  
Gate Pulse Width  
D
+  
Gate Pulse Period  
V
GS  
10 V  
(Driver)  
I
, Body Diode Forward Current  
FM  
I
di/dt  
SD  
(DUT)  
I
RM  
Body Diode Reverse Current  
Body Diode Recovery dv/dt  
V
DS  
V
DD  
V
SD  
(DUT)  
Body Diode  
Forward Voltage Drop  
Figure 16. Peak Diode Recovery dv/dt Test Circuit & Waveforms  
SUPERFET is a registered trademark of Semiconductor Components Industries, LLC.  
8

MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
PQFN4 8X8, 2P  
CASE 483AP  
ISSUE A  
DATE 06 JUL 2021  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions
 
are uncontrolled
 
except when stamped
 
“CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON13664G  
PQFN4 8X8, 2P  
PAGE 1 OF 1  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding  
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically  
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the  
rights of others.  
©
Semiconductor Components Industries, LLC, 2019  

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,  
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onsemi
” or its affiliates  
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−
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