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MOSFET

– N-Channel,  
SUPERFET

)

II, FRFET

)  

650
V
,
1
0.2 A, 380 m
W
 
FCPF380N65FL1-F154  
Description  
SUPERFET II MOSFET is ON Semiconductor’s brand
−
new high  
voltage super
−
junction (SJ) MOSFET family that is utilizing charge  
balance technology for outstanding low on
−
resistance and lower gate  
charge performance. This advanced technology is tailored to minimize  
conduction loss, provide superior switching performance, and  
withstand extreme dv/dt rate. Consequently, SUPERFET II MOSFET  
is very suitable for the various power system for miniaturization and  
higher efficiency. SUPERFET II FRFET MOSFET’s optimized  
reverse recovery performance of body diode can remove additional  
component and improve system reliability.  
V
R
MAX  
I MAX  
D
DSS  
DS(ON)  
650 V  
380 m
ꢀ
@ 10 V  
10.2 A  
D
G
Features  
•
700 V @ T
 
= 150
°
C  
J
•
R  
= 320 m
ꢀ
(Typ.)  
•
Ultra Low Gate Charge (Typ. Q
 
= 33 nC)  
DS(on)  
S
g
MOSFET  
•
Low Effective Output Capacitance (Typ. C  
•
100% Avalanche Tested  
•
These Devices are Pb
−
Free and are RoHS Compliant  
= 165 pF)  
oss(eff.)  
Applications  
G
D
•
Computing / Display Power Supplies  
•
Telecom / Server Power Supplies  
•
Industrial Power Supplies  
S
TO
−
220F Ultra Narrow Lead  
CASE 221BN  
•
Lighting / Charger / Adapter  
MARKING DIAGRAM  
$Y&Z&3&K  
FCPF  
380N65F  
$Y  
&Z  
&3  
&K  
= ON Semiconductor Logo  
= Assembly Plant Code  
= Data Code (
Y
e
ar & Week)  
= Lot  
FCPF380N65F  
= Specific Device Code  
ORDERING INFORMATION  
this data sheet.  
©
Semiconductor Components Industries, LLC, 2020  
1
Publication Order Number:  
FCPF380N65FL1
−
F154/D  
December, 2020
−
Rev. 0  

FCPF380N65FL1
−
F154  
ABSOLUTE MAXIMUM RATINGS
(T =
 
25
°
C, Unless otherwise noted)  
C
Symbol  
Parameter  
Value  
650  
Unit  
V
V
DSS  
V
GSS  
Drain to Source Voltage  
Gate to Source Voltage  
−
DC  
20  
V
−
AC (f > 1 Hz)  
30  
I
D
Drain Current  
−
Continuous (T
 
= 25
°
C)  
10.2  
6.4  
A
C
−
Continuous (T
 
= 100
°
C)  
C
I
Drain Current  
30.6  
212  
A
mJ  
A
DM  
E
Repetitive Avalanche Energy (Note

MOSFET dv/dt  
AS  
AS  
I
2.3  
E
0.33  
100  
mJ  
V/ns  
AR  
dv/dt  
Peak Diode Recovery dv/dt (Note

Power Dissipation  
50  
P
(T =
 
25
°
C)  
33  
W
W/
°
C  
°
C  
D
C
−
Derate Above 25
°
C  
0.26  
−
55 to +150  
300  
T , T  
Operating and Storage
T
e
mperature Range  
J
STG  
T
Maximum Lead
T
e
mperature for Soldering, 1/8
″
from Case for 5 Seconds  
°
C  
L
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality  
should not be assumed, damage may occur and reliability may be affected.  
1. Repetitive
 
rating: pulse width limited by maximum junction temperature.  
2. I
 
= 2.3 A, R
 
= 25
 
ꢀ
, starting T
 
= 25
°
C.  
AS  
G
J
3. I
 
≤
5.1 A, di/dt
≤
200 A/
ꢁ
s, V
 
≤
380
V
,
s
tarting T
 
= 25
°
C.  
SD  
DD  
J
THERMAL CHARACTERISTICS  
Symbol  
Parameter  
Value  
3.8  
Unit  
R
Thermal Resistance, Junction to Case, Max.  
Thermal Resistance, Junction to Ambient, Max.  
_
C/W  
_
C/W  
ꢂ
JC  
JA  
R
62.5  
ꢂ
PACKAGE MARKING AND ORDERING INFORMATION  
Part Number  
Top Marking  
Package  
Shipping  
50 Units / Tube  
FCPF380N65FL1
−
F154  
FCPF380N65F  
TO
−
220F  
(Pb
−
Free)  
2
 

FCPF380N65FL1
−
F154  
ELECTRICAL CHARACTERISTICS
(T =
 
25
°
C unless otherwise noted)  
C
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
OFF CHARACTERISTICS  
BV  
Drain to Source Breakdown Voltage  
650  
700  
−
−
−
−
−
−
V
V
V
V
I
= 0
V
, I
 
=
1
0 mA, T
 
= 25
_
C  
DSS  
GS  
D
J
= 0
V
, I
 
=
1
0 mA, T
 
= 150
_
C  
GS  
D
J
ꢃ
B
V
/
ꢃ
T  
Breakdown Voltage
T
e
mperature  
Coefficient  
= 10 mA, Referenced to 25
_
C  
0.72  
V/
_
C  
DSS  
J
D
I
Zero Gate Voltage Drain Current  
V
V
V
= 650
V
, V
 
= 0 V  
−
−
−
−
40  
−
10  
−
ꢁ
A  
ꢁ
A  
V
DSS  
DS  
DS  
GS  
GS  
= 520
V
, V
 
= 0 V, T
 
=
1
25
_
C  
GS  
C
I
Gate to Source Leakage Current  
=
20
V
, V
 
= 0 V  
100  
GSS  
DS  
ON CHARACTERISTICS  
V
Gate Threshold Voltage  
V
GS  
V
GS  
V
DS  
= V
 
, I
 
= 1 mA  
3
−
−
−
5
380  
−
GS(th)  
DS(on)  
DS  
D
R
Static Drain to Source On Resistance  
Forward Transconductance  
= 10
V
, I
 
=
5
.1 A  
320  
9.9  
m
ꢀ  
D
g
= 20
V
, I
 
=
5
.1 A  
S
FS  
D
DYNAMIC CHARACTERISTICS  
C
Input Capacitance  
V
= 100
V
, V
 
= 0 V, f = 1
M
Hz  
−
−
−
−
−
−
−
−
−
1265  
42  
1680  
55  
−
pF  
pF  
pF  
pF  
pF  
nC  
nC  
nC  
ꢀ
iss  
DS  
GS  
C
Output Capacitance  
oss  
C
Reverse Transfer Capacitance  
Output Capacitance  
1.0  
25  
rss  
C
V
DS  
V
DS  
V
DS  
= 380
V
, V
 
= 0 V, f = 1
M
Hz  
−
oss  
GS  
C
Effective Output Capacitance  
T
o
tal Gate Charge at 10 V  
Gate to Source Gate Charge  
Gate to Drain “Miller” Charge  
Equivalent Series Resistance  
= 0 V to 400 V, V
 
= 0 V  
165  
33  
−
oss(eff.)  
GS  
Q
= 380
V
, I
 
= 5.1 A, V
 
= 10 V  
43  
−
g(tot)  
D
GS  
(Note

Q
6.6  
14  
gs  
gd  
Q
−
ESR  
f = 1 MHz  
0.46  
−
SWITCHING CHARACTERISTICS  
t
Turn-On Delay Time  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
V
= 380
V
, I
 
=
5
.1 A, V
 
= 10
V
,  
−
−
−
−
18  
7.8  
45  
8
46  
25.6  
100  
26  
ns  
ns  
ns  
ns  
d(on)  
DD  
g
D
GS  
R =
 
4.7  
ꢀ
t
r
(Note

t
d(off)  
t
f
SOURCE
−
DRAIN DIODE CHARACTERISTICS  
I
Maximum Continuous Source to Drain Diode Forward Current  
Maximum Pulsed Source to Drain Diode Forward Current  
−
−
−
−
−
−
−
10.2  
30.6  
1.2  
−
A
A
S
I
SM  
V
SD  
Source to Drain Diode Forward Voltage  
Reverse Recovery Time  
V
V
= 0
 
V
, I
 
= 5.1
 
A  
−
V
GS  
SD  
t
rr  
= 400
 
V, I
 
= 5.1
 
A,  
84  
224  
ns  
nC  
DD  
SD  
dI /dt
 
= 100 A/
ꢁ
s  
F
Q
Reverse Recovery Charge  
−
rr  
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
4. Essentially
 
independent of operating temperature.  
3
 

FCPF380N65FL1
−
F154  
TYPICAL PERFORMANCE CHARACTERISTICS  
30  
30  
10  
V
= 20 V  
V
GS  
=
1
5.0 V  
10.0 V  
8.0 V  
7.0 V  
6.0 V  
DS  
250
ꢁ
s Pulse
T
e
st  
10  
5.5 V  
5.0 V  
150
°
C  
25
°
C  
−
55
°
C  
250
ꢁ
s Pulse
T
e
st  
= 25
°
C  
T
C
1
1
0.1  
1
10  
20  
4
5
6
7
V
DS  
, Drain
−
Source Voltage (V)  
V
GS  
, Gate
−
Source Voltage (V)  
Figure 1. On
−
Region Characteristics  
Figure 2. Transfer Characteristics  
0.6  
0.4  
100  
10  
1
V
= 0 V  
T
C
= 25
°
C  
GS  
250
ꢁ
s Pulse
T
e
st  
V
= 10 V  
= 20 V  
GS  
150
°
C  
25
°
C  
V
GS  
0.1  
0.2  
0.0  
0.01  
0.001  
0
6
12  
18  
24  
30  
0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6  
, Body Diode Forward Voltage (V)  
I ,
 
Drain Current (A)  
V
SD  
D
Figure 4. Body Diode Forward Voltage  
Variation vs. Source Current and  
Temperature  
Figure 3. On
−
Resistance Variation vs.  
Drain Current and Gate Voltage  
10  
10000  
V
V
V
= 130 V  
= 325 V  
= 520 V  
DS  
DS  
DS  
C
iss  
8
6
4
2
0
1000  
100  
10  
C
oss  
C
rss  
V
= 0 V  
GS  
f = 1 MHz  
1
C
C
C
= C
 
+ C
 
(C =
 
shorted)  
iss  
gs gd
 
ds  
= C
 
+ C  
gd  
oss  
rss  
ds  
= C  
gd  
I
D
= 5.1 A  
32 40  
0.1  
0
8
16  
24  
0.1  
1
10  
100  
700  
Q ,
 
T
o
tal Gate Charge (nC)  
g
V
DS  
, Drain
−
Source Voltage (V)  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  
4

FCPF380N65FL1
−
F154  
TYPICAL PERFORMANCE CHARACTERISTICS
(continued)  
2.4  
1.2  
1.1  
V
= 0 V  
= 1 mA  
V
= 10 V  
GS  
GS  
I
D
I =
 
5.1 A  
D
2.0  
1.6  
1.0  
0.9  
0.8  
1.2  
0.8  
0.4  
−
75
−
50
−
25  
25 50 75
 
100 125 150  
−
75
−
50
−
25  
25 50 75
 
100 125 150  
0
0
T , Junction
T
e
mperature (
°
C)  
J
T , Junction
T
e
mperature (
°
C)  
J
Figure 7. Breakdown Voltage Variation  
vs. Temperature  
Figure 8. On
−
Resistance Variation  
vs. Temperature  
100  
12  
R
= 3.8
°
C/W  
ꢂ
JC  
10
ꢁ
s  
10  
9
6
3
0
100
ꢁ
s  
1 ms  
1
Operation in this Area  
10 ms  
DC  
is Limited by R  
DS(on)  
0.1  
T
= 25
°
C  
T =
 
150
°
C  
Single Pulse  
C
J
0.01  
150  
0.1  
1
10  
100  
1000  
25  
50  
75  
100  
125  
V
DS  
, Drain
−
Source Voltage (V)  
T ,
 
Case
T
e
mperature (
°
C)  
C
Figure 9. Maximum Safe Operating Area  
Figure 10. Maximum Drain Current  
vs. Case Temperature  
8
6
4
2
0
0
130  
260  
390  
520  
650  
V
DS  
, Drain to Source Voltage (V)  
Figure 11. E

OSS

vs. Drain to Source Voltage  
5

FCPF380N65FL1
−
F154  
TYPICAL PERFORMANCE CHARACTERISTICS
(continued)  
5
1
0.5  
0.2  
0.1  
0.05  
0.02  
P

DM  

0.1  
0.01  
t

1  

0.01  
t

2  

Z
ꢂ
(t) = 3.8
°
C/W Max.  
JC  
Duty Factor, D = t
 
/ t  
1
2
Single Pulse  
1
0

−
4  

T
JM  
−
T =
 
P  
x Z
 
(t)  
ꢂ
DM JC  
C
0.001  
1
0

−
5  

1
0

−
3  

1
0

−
2  

1
0

−
1  

1
10  
100  
Rectangular Pulse Duration (s)  
Figure 12. Transient Thermal Response Curve  
6

FCPF380N65FL1
−
F154  
V
GS  
R
Q
g
L
V
DS  
Q
Q
gd  
gs  
V
GS  
DUT  
I
G
= const.  
Charge  
Figure 13. Gate Charge Test Circuit & Waveform  
R
L
V
DS  
GS  
90%  
90%  
10%  
90%  
V
DS  
V
DD  
V
GS  
R
G
10%  
V
DUT  
V
GS  
t
t
d(off)  
t
r
t
f
d(on)  
t
on  
t
off  
Figure 14. Resistive Switching Test Circuit & Waveforms  
L
2
1
2
E

AS  

+
LI

AS  

V
DS  
BV  
DSS  
I
D
I
AS  
R
G
V
DD  
I
D
(t)  
DUT  
V
DD  
V
GS  
V
DS  
(t)  
t
p
Time  
t
p
Figure 15. Unclamped Inductive Switching Test Circuit & Waveforms  
7

FCPF380N65FL1
−
F154  
+
DUT  
V
DS  
−
I
SD  
L
Driver  
R
G
Same Type  
as DUT  
V
DD  
V
GS  
•
dv/dt controlled by R  
G
•
I controlled
 
by pulse period  
SD  
Gate Pulse Width  
D
+  
Gate Pulse Period  
V
GS  
10 V  
(Driver)  
I
, Body Diode Forward Current  
FM  
I
di/dt  
SD  
(DUT)  
I
RM  
Body Diode Reverse Current  
Body Diode Recovery dv/dt  
V
DS  
V
DD  
V
SD  
(DUT)  
Body Diode  
Forward Voltage Drop  
Figure 16. Peak Recovery dv/dt Test Circuit & Waveforms  
SUPERFET and FRFET are a registered trademarks of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United  
States and/or other countries.  
8

FCPF380N65FL1
−
F154  
PACKAGE DIMENSIONS  
TO
−
220 FULLPACK, 3
−
LEAD  
CASE 221BN  
ISSUE O  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent  
coverage may be accessed at

. ON Semiconductor reserves the right to make changes without further notice to any products herein.  
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability  
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,  
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer  
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not  
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification  
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized  
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and  
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such  
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This  
literature is subject to all applicable copyright laws and is not for resale in any manner.  
PUBLICATION ORDERING INFORMATION  
LITERATURE FULFILLMEN
T
:  
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ll Free USA/Canada  
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