onsemi-FDB603AL

Part #onsemi-FDB603AL
Download 
onsemi-FDB603AL
April 1998  
FDP603AL / FDB603AL  
N-Channel Logic Level Enhancement Mode Field Effect Transistor  
General Description  
Features  
These N-Channel logic level enhancement mode power field  
effect transistors are produced using Fairchild’s proprietary,  
high cell density, DMOS technology. This very high density  
process is especially tailored to minimize on-state  
resistance. These
 
devices are particularly suited for low  
voltage applications such as DC/DC converters and high  
efficiency switching circuits where fast switching, low in-line  
power loss, and resistance to transients are needed.  
33 A, 30 V. R

DS(ON)

= 0.022
W
@ V

GS

=10 V  
R

DS(ON)

= 0.036
W
@ V

GS

=4.5 V
.  
Critical DC electrical parameters specified at elevated  
temperature.  
Rugged internal source-drain diode can eliminate the need  
for an external Zener diode transient suppressor.  
High density cell design for extremely low R

DS(ON)  

.
175°C maximum junction temperature rating.  
_________________________________________________________________________________  
D
G
S
Absolute Maximum Ratings
 
T

C

= 25°C unless otherwise noted  
Symbol Parameter  
FDP603AL  
FDB603AL  
Units  
Drain-Source Voltage  
30  
V
V
A
V

DSS  

V

GSS  

I

D  

Gate-Source Voltage – Continuous  
Drain Current
 
– Continuous  
– Pulsed  
±20  
33  
(Note 1)  
100  
50  
W
W/
°
C  
°C  
P

D  

Total Power Dissipation @ T

C

= 25
°
C  
Derate above 25
°
C  
0.33  
-65 to 175  
275  
Operating and Storage Temperature Range  
T

J

,T

STG  

T

L  

Maximum lead temperature for soldering purposes,  
1/8″ from case for 5 seconds  
°C  
THERMAL CHARACTERISTICS  
Thermal Resistance, Junction-to-Case  
Thermal Resistance, Junction-to-Ambient  
3
°
C/W  
°
C/W  
R

q

JC  

R
62.5  
JA  
q
©
1
998
 
F
a
i
r
c
h
i
ld
S
em
i
c
onductor Corporat
i
o
n  
FDP603AL Rev.D  

Electrical Characteristics
T

C

= 25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
DRAIN-SOURCE AVALANCHE RATINGS
(Note 1)  
W

DSS  

I

AR  

Single Pulse Drain-Source Avalanche Energy  
Maximum Drain-Source Avalanche Current  
V

DD

= 15 V, I

D

= 12 A  
100  
12  
mJ  
A
OFF CHARACTERISTICS  
BV

DSS  

D
BV

DSS

/
D
T

J  

I

DSS  

Drain-Source Breakdown Voltage  
V

GS

= 0 V, I

D

= 250 µA  
I

D

= 250 µA, Referenced to
 
25

o

C  
30  
V
mV/

o

C  
Breakdown Voltage Temp. Coefficient  
32  
Zero Gate Voltage
 
Drain Current  
Gate – Body Leakage, Forward  
Gate – Body Leakage, Reverse  
10  
µA  
nA  
nA  
V

DS

= 24 V, V

GS

= 0 V  
V

GS

= 20
 
V, V

DS

= 0 V  
V

GS

= -20 V, V

DS

= 0 V  
I

GSSF  

100  
-100  
I

GSSR  

ON CHARACTERISTICS
 
(Note
1
)  
V

GS(th)  

Gate Threshold Voltage  
V

DS

= V

GS

, I

D

= 250 µA  
1
1.8  
3
V
I

D

= 250 µA, Referenced to
 
25

o

C  
mV/

o

C  
Gate Threshold Voltage Temp.Coefficient  
-4.5  
D
V

GS(th)

/
D
T

J  

R

DS(ON)  

Static Drain-Source On-Resistance  
0.018 0.022  
0.026 0.035  
V

GS

= 10 V, I

D

= 25 A  
W
T

J

=125 °C  
V

GS

= 4.5 V, I

D

= 10 A  
V

GS

= 10 V, V

DS

= 10 V  
V

GS

= 4.5 V, V

DS

= 10 V  
V

DS

= 10 V, I

D

= 25 A  
0.03  
0.036  
On-State Drain Current  
On-State Drain Current  
Forward Transconductance  
60  
15  
A
A
S
I

D(on)  

I

D(on)  

g

FS  

24  
DYNAMIC CHARACTERISTICS  
Input Capacitance  
V

DS

= 15 V,
 
V

GS

= 0 V,  
f =
 
1.0 MHz  
670  
345  
95  
pF  
pF  
pF  
C

iss  

C

oss  

C

rss  

Output Capacitance  
Reverse Transfer Capacitance  
SWITCHING CHARACTERISTICS
(Note 1)  
Turn – On Delay Time  
Turn – On Rise Time  
8
16  
nS  
nS  
t

D(on)  

V

DD

= 15 V,
 
I

D

= 25 A  
102  
140  
V

GS

= 10 V, R

GEN

= 24
W  
t

r  

t

D(off)  

Turn – Off Delay Time  
Turn – Off Fall Time  
20  
80  
36  
nS  
nS  
115  
t

f  

Q

g  

Q

gs  

Q

gd  

Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
V

DS

= 10 V  
I

D

= 25 A, V

GS

= 10 V  
19  
3.5  
5.5  
26  
nC  
nC  
nC  
DRAIN-SOURCE DIODE CHARACTERISTICS  
Maximum Continuos Drain-Source Diode Forward Current  
25  
1.3  
1.1  
A
V
I

S  

V

SD  

Drain-Source Diode Forward Voltage  
V

GS

= 0 V, I

S

= 25 A
 
(Note 1)  
1
0.85  
T

J

= 125°C  
Note  
1. Pulse Test: Pulse Width < 300 µs, Duty Cycle < 2.0%.  
FDP603AL Rev.D  

Typical Electrical Characteristics  
3
2.5  
2
80  
V
=10V  
8.0  
7.0  
V

GS

= 4.0V  
GS  
6.0  
4.5  
60  
40  
20  
0
5.0  
5.0  
4.5  
6.0  
1.5  
1
7.0  
60  
8.0  
4.0  
4
10  
3.0  
0.5  
0
1
2
3
5
0
20  
40  
, DRAIN CURRENT (A)  
80  
V
, DRAIN-SOURCE VOLTAGE (V)  
DS  
I
D
Fi
g
ure 2. On-Res
i
s
tance
V
a
r
i
a
t
i
o
n w
i
t
h  
Drain Current
 
and Gate  
Voltage.  
Fi
g
ure 1. On-Reg
i
o
n Character
i
s
t
i
c
s.  
0.06  
0.05  
0.04  
0.03  
0.02  
0.01  
1.8  
I

D

= 12.5A  
I

D

= 25A  
1.6  
V

G
S

= 10V  
1.4  
1.2  
1
T

J

= 125°C  
25°C  
0.8  
0.6  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
175  
3
4
5
6
7
8
9
10  
T
, JUNCTION TEMPERATURE (°C)  
J
V
, GATE TO SOURCE VOLTAGE (V)  
GS  
Fi
g
ure 3. On-Res
i
s
tance
V
a
r
i
a
t
i
o
n  
Fi
g
ure 4. On-Res
i
s
tance
V
a
r
i
a
t
i
o
n w
i
t
h  
Gate-to-Source Vo
l
t
age.  
w
i
t
h Temperature
.  
20  
30  
25  
20  
15  
10  
5
V
= 10V  
DS  
V
GS  
= 0V  
T =
 
125°C  
J
1
25°C  
-55°C  
0.1  
0.01  
0.001  
T
= 125°C  
J
25°C  
-55°C  
0
0.0001  
1
2
3
4
5
0
0.2  
V
0.4  
0.6  
0.8  
1
1.2  
V
, GATE TO SOURCE VOLTAGE (V)  
GS  
, BODY DIODE FORWARD VOLTAGE (V)  
SD  
Fi
g
ure 5. Transfer Character
i
s
t
i
c
s
.  
Fi
g
ure 6 .
B
o
dy Diode For
w
a
r
d Voltage  
V
a
r
i
a
t
i
o
n w
i
t
h Source Current  
and Temperature.  
FDP603AL Rev.D  

Typical Electrical Characteristics
(continued)  
2000  
1000  
500  
10  
I
= 25A  
D
V
= 5.0V  
DS  
8
6
4
2
0
10V  
20V  
C
iss  
C
oss  
200  
f = 1 MHz  
V

GS

= 0V  
C
rss  
100  
60  
0
5
10  
, GATE CHARGE (nC)  
15  
20  
0.1  
0.3  
V
1
4
10  
30  
Q
g
, DRAIN TO SOURCE VOLTAGE (V)  
DS  
Figure 8. Capacitance Characteristics.  
Figure 7. Gate Charge Characteristics.  
200  
100  
50  
2000  
1600  
1200  
800  
400  
0
SINGLE PULSE  
R

q

JC
=3.0° C/W  
T

C

= 25°C  
20  
10  
5
V

GS

= 10V  
SINGLE PULSE  
R

q

J
C

=
3

o

C/W  
T

A

= 25 °C  
2
1
0.5  
0.5  
1
3
5
10  
20  
30  
50  
0.01  
0.1  
1
10  
100  
1000  
V
, DRAIN-SOURCE VOLTAGE (V))  
SINGLE PULSE TIME (ms)  
DS  
Figure 10. Single Pulse Maximum Power  
Dissipation.  
Fi
g
ure 9. Max
i
m
um Safe Operat
i
n
g Area.  
1
D = 0.5  
0.5  
0.3  
0.2  
0.2  
R
(t) = r(t)
 
* R  
q
JC  
R
q
JC  
= 3.0 °C/W  
q
JC  
0.1  
0.1  
P(pk)  
0.05  
0.05  
0.02  
t

1  

t

2  

0.03  
T
– T
 
= P
 
* R  
(t)  
0.01  
J
q
C
JC  
0.02  
Duty Cycle, D = t

1

/
t

2  

Single Pulse  
0.05  
0.01  
0.01  
0.1  
0.5  
1
5
10  
50  
100  
500  
1000  
t

1

, TIME (ms)  
Fi
g
ure 11. Trans
i
e
nt Thermal Response Curve
.  
FDP603AL Rev.D  

TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
â
SMART START™  
STAR*POWER™  
Stealth™  
VCX™  
FAST  
ACEx™  
Bottomless™  
CoolFET™  
OPTOLOGIC™  
OPTOPLANAR™  
PACMAN™  
FASTr™  
FRFET™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SyncFET™  
GlobalOptoisolator™  
GTO™  
HiSeC™  
ISOPLANAR™  
LittleFET™  
MicroFET™  
MicroPak™  
MICROWIRE™  
CROSSVOL
T
™  
DenseTrench™  
DOME™  
POP™  
Power247™  
PowerTrenc
h

â  

QFET™  
EcoSPARK™  
E

2

CMOS

TM  

TinyLogic™  
QS™  
EnSigna

TM  

TruTranslation™  
UHC™  
QT Optoelectronics™  
Quiet Series™  
SILEN
T
S
WITCHE
R

â  

FACT™  
FACT Quiet Series™  
UltraFE
T

â  

STAR*POWER is used under license  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILIT
Y
,
F
UNCTION OR DESIGN. FAIRCHILD  
DOES NOT ASSUME ANY LIABILIT
Y
A
RISING OUT OF THE APPLICATION OR USE O
F
A
NY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICE
S
O
R
S
YSTEM
S
W
ITHOU
T
T
H
E
E
XPRES
S
W
RITTE
N
A
PPROVA
L
O
F
F
AIRCHIL
D
S
EMICONDUCTO
R
C
ORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. H4