onsemi-FDD6680S

Part #onsemi-FDD6680S
Download 
onsemi-FDD6680S
December 2000  
FDD6680S  
30V N
–
Channel PowerTrench
 
SyncFET

™  

General Description  
Features  
The FDD6680S is designed to replace  
a single  
•
55 A, 30 V  
R

DS(ON)

= 11 m
Ω
@ V

GS

= 10 V  

DS(ON)

= 17 m
Ω
@ V

GS

= 4.5 V  
MOSFET and Schottky diode in synchronous DC:DC  
power supplies.
 
This 30V MOSFET is designed to  
maximize power conversion efficiency, providing a low  
R

DS(ON)

and low gate charge.
 
The FDD6680S includes  
an integrated Schottky diode using Fairchild’s  
monolithic SyncFET technology.
 
The performance of  
the FDD6680S as the low-side switch in a synchronous  
rectifier is indistinguishable from the performance of the  
FDD6680A in parallel with a Schottky diode.  
R
•
Includes SyncFET Schottky body diode  
•
Low gate charge (17nC typical)  
•
High performance trench technology for extremely  
low R

DS(ON)  

Applications  
•
DC/DC converter  
•
Motor Drives  
•
High power and current handling capability  
.
D
D
G
G
S
TO-252  
S
Absolute Maximum Ratings
 
T

A

=25

o

C unless otherwise noted  
Symbol  
V

DSS  

Parameter  
Drain-Source Voltage  
Ratings  
Units  
30  
V
V
A
V

GSS  

Gate-Source Voltage  
Drain Current
 
– Continuous  
– Pulsed  
±
20  
I

D  

(Note 3)  
(Note 1a)  
(Note 1)  
55  
100  
P

D  

W
Power Dissipation  
60  
(Note 1a)  
(Note 1b)  
3.1  
1.3  
T

J

, T

STG  

Operating and Storage Junction Temperature Range  
–55 to +150  
°
C  
Thermal Characteristics  
Thermal Resistance, Junction-to-Case  
(Note 1)  
(Note 1a)  
(Note 1b)  
2.1  
40  
96  
R

θ
JC  

R

θ
JA  

R

θ
JA  

°
C/W  
°
C/W  
°
C/W  
Thermal Resistance, Junction-to-Ambient  
Thermal Resistance, Junction-to-Ambient  
Package Marking and Ordering Information  
Device Marking  
Device  
Reel Size  
Tape width  
Quantity  
FDD6680S  
FDD6680S  
13’’  
16mm  
2500 units  
FDD6680S Rev D(W)  
200
1
Fairchild Semiconductor Corporation  

Electrical Characteristics  
T

A

= 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min Typ Max Units  
Drain-Source Avalanche Ratings
(Note 2)  
W

DSS  

I

AR  

Drain-Source Avalanche Energy  
Drain-Source Avalanche Current  
Single Pulse, V

DD

= 15 V, I

D

=14A  
245  
14  
mJ  
A
Off Characteristics  
BV

DSS  

Drain–Source Breakdown Voltage  
V

GS

= 0 V, I

D

= 1 mA  
30  
V
19  
∆
BV
DSS  
∆
T

J  

Breakdown Voltage Temperature  
Coefficient  
I

D

= 1 mA, Referenced to 25
°
C  
mV/
°
C  
I

DSS  

Zero Gate Voltage Drain Current  
Gate–Body Leakage, Forward  
Gate–Body Leakage, Reverse  
V

DS

= 24 V,  
V

GS

= 20 V,  
V

GS

= 0 V  
V

DS

= 0 V  
500  
100  
µ
A  
nA  
nA  
I

GSSF  

I

GSSR  

V

GS

= –20 V,
 
V

DS

= 0 V  
–100  
On Characteristics  
(Note 2)  
V

GS(th)  

Gate Threshold Voltage  
V

DS

= V

GS

, I

D

= 1 mA  
1
2
3
V
Gate Threshold Voltage  
Temperature Coefficient  
–3.3  
∆
V
GS(th)  
∆
T

J  

I

D

= 1 mA, Referenced to 25
°
C  
mV/
°
C  
R

DS(on)  

Static Drain–Source  
On–Resistance  
V

GS

= 10 V,  
V

GS

= 4.5 V,  
V

GS

= 10 V, I

D

= 12.5A, T

J

= 125
°
C  
I

D

= 12.5 A  
I

D

= 10 A  
9.5  
13.5  
17  
11  
17  
23  
m
Ω  
I

D(on)  

g

FS  

On–State Drain Current  
V

GS

= 10 V,  
V

DS

= 15 V,  
V

DS

= 5 V  
50  
A
S
Forward Transconductance  
I

D

= 12.5 A  
27  
Dynamic Characteristics  
C

iss  

C

oss  

C

rss  

Input Capacitance  
2010  
526  
pF  
pF  
pF  
V

DS

= 15 V,  
f = 1.0 MHz  
V

GS

= 0 V,  
Output Capacitance  
Reverse Transfer Capacitance  
186  
Switching Characteristics
 
(Note 2)  
t

d(on)  

t

r  

t

d(off)  

t

f  

Turn–On Delay Time  
Turn–On Rise Time  
Turn–Off Delay Time  
Turn–Off Fall Time  
Total Gate Charge  
Gate–Source Charge  
Gate–Drain Charge  
10  
10  
34  
14  
17  
6.2  
5.5  
18  
18  
55  
23  
24  
ns  
ns  
V

DS

= 15 V,  
V

GS

= 10 V,  
I

D

= 1 A,  
R

GEN

= 6
Ω  
ns  
ns  
Q

g  

Q

gs  

Q

gd  

nC  
nC  
nC  
V

DS

= 15 V,  
I

D

= 12.5 A,  
V

GS

= 5 V  
Drain–Source Diode Characteristics and Maximum Ratings  
I

S  

Maximum Continuous Drain–Source Diode Forward Current  
4.4  
0.7  
A
V
V

SD  

V

GS

= 0 V,
 
I

S

= 4.4 A  
(Note 2)  
(Note 2)  
0.49  
0.56  
20  
Drain–Source Diode Forward  
Voltage  
V

GS

= 0 V,
 
I

S

= 7 A  
I

F

= 12.5A,  
t

rr  

nS  
nC  
Diode Reverse Recovery Time  
Diode Reverse Recovery Charge  
d

iF

/d

t

= 300 A/µs  
(Note 3)  
Q

rr  

19.7  
FDD6680S Rev D (W)  

Electrical Characteristics  
T

A

= 25°C unless otherwise noted  
Notes:  
1.
R

θ
JA

is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of  
the drain pins.
 
R

θ
JC

is guaranteed by design while R

θ
CA

is determined by the user’s board design.  
a)  
R

θ
JA

= 40°C/W when mounted on a  
b)  
R

θ
JA

= 96°C/W when mounted  
1in

2

pad of 2 oz copper  
on a minimum pad.  
Scale 1 : 1 on letter size paper  
2.
Pulse Test: Pulse Width < 300
µ
s, Duty Cycle < 2.0%  
P

D  

3.
Maximum current is calculated as:  
R

DS(ON)  

where P

D

is maximum power dissipation at T

C

= 25°C and R

DS(on)

is at T

J(max)

and V

GS

= 10V.
 
Package current limitation is 21A  
FDD6680S Rev D (W)  

Typical Characteristics  
2
1.8  
1.6  
1.4  
1.2  
1
60  
V

GS

= 10V  
5.0V  
4.5V  
50  
40  
30  
20  
10  
0
4.0V  
V

GS

= 4.0V  
4.5V  
7.0V  
5.0V  
3.5V  
6.0V  
7.0V  
8.0V  
10V  
3.0V  
0.8  
0
10  
20  
30  
40  
50  
0
1
2
3
150  
5
I

D

, DRAIN CURRENT (A)  
V

DS

, DRAIN-SOURCE VOLTAGE (V)  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation with  
Drain Current and Gate Voltage.  
0.04  
0.03  
0.02  
0.01  
0
2.6  
I

D

= 6.3A  
I

D

= 12.5A  
V

GS

= 10V  
2.2  
1.8  
1.4  
1
T

A

= 100

o

C  
T

A

= 25

o

C  
0.6  
0.2  
-50  
-25  
0
25  
50  
75  
100  
125  
2
4
6
8
10  
T

J

, JUNCTION TEMPERATURE (

o

C)  
V

GS

, GATE TO SOURCE VOLTAGE (V)  
Figure 3. On-Resistance Variation with  
Temperature.  
Figure 4. On-Resistance Variation with  
Gate-to-Source Voltage.  
10  
50  
100

o

C  
T

A

= -55

o

C  
25

o

C  
V

GS

= 0V  
V

DS

= 5V  
40  
30  
20  
10  
0
1
T

A

= 100

o

C  
0.1  
0.01  
25

o

C  
-55

o

C  
0.001  
0
0.2  
0.4  
0.6  
0.8  
1
2
3
4
V

SD

, BODY DIODE FORWARD VOLTAGE (V)  
V

GS

, GATE TO SOURCE VOLTAGE (V)  
Figure 5. Transfer Characteristics.  
Figure 6. Body Diode Forward Voltage Variation  
with Source Current and Temperature.  
FDD6680S Rev D (W)  

Typical Characteristics
(continued)  
10  
3000  
2500  
2000  
1500  
1000  
500  
f = 1MHz  
V

GS

= 0 V  
I

D

=12.5A  
V

DS

= 5V  
10V  
8
6
4
2
0
15V  
C

ISS  

C

OSS  

C

RSS  

0
0
10  
20  
Q

g

, GATE CHARGE (nC)  
30  
40  
0
10  
20  
30  
V

DS

, DRAIN TO SOURCE VOLTAGE (V)  
Figure 7. Gate Charge Characteristics.  
Figure 8. Capacitance Characteristics.  
60  
50  
40  
30  
20  
10  
0
SINGLE PULSE  
R

θ
JA

= 96°C/W  
T

A

= 25°C  
R

DS(ON)

LIMIT  
100  
100
µ
s  
1ms  
10ms  
100ms  
1s  
10s  
1
V

GS

= 10V  
SINGLE PULSE  
R

θ
JA

= 96

o

C/W  
DC  
T

A

= 25

o

C  
0.01  
0.1  
1
10  
100  
0.01  
0.1  
1
10  
100  
1000  
V

DS

, DRAIN-SOURCE VOLTAGE (V)  
t

1

, TIME (sec)  
Figure 9. Maximum Safe Operating Area.  
Figure 10. Single Pulse Maximum  
Power Dissipation.  
1
D = 0.5  
R

θ
JA

(t) = r(t) + R

θ
JA  

0.2  
R

θ
JA

= 96 °C/W  
0.1  
0.1  
0.05  
0.02  
P(pk)  
t

1  

0.01  
t

2  

0.01  
T

J

– T

A

= P * R

θ
JA

(t)  
Duty Cycle, D = t

1

/ t

2  

SINGLE PULSE  
0.001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
t

1

, TIME (sec)  
Figure 11. Transient Thermal Response Curve.  
Thermal characterization performed using the conditions described in Note 1b.  
Transient thermal response will change depending on the circuit board design.  
FDD6680S Rev D (W)  

Typical Characteristics
(continued)  
SyncFET Schottky Body Diode  
Characteristics  
Fairchild’s SyncFET process embeds a Schottky diode  
in parallel with PowerTrench MOSFET.
 
This diode  
exhibits similar characteristics to a discrete external  
Schottky diode in parallel with a MOSFET.
 
Figure 12  
shows the reverse recovery characteristic of the  
FDD6680S.  
Schottky barrier diodes exhibit significant leakage at  
high temperature and high reverse voltage.
 
This will  
increase the power in the device.  
0.1  
100

o

C  
0.01  
0.001  
25

o

C  
0
0.0001  
0
10  
20  
30  
V

DS

, REVERSE VOLTAGE (V)  
Figure 14. SyncFET body diode reverse  
leakage versus drain-source voltage and  
temperature.  
10nS/div  
Figure 12. FDD6680S SyncFET body diode  
reverse recovery characteristic.  
For comparison purposes, Figure 13 shows the reverse  
recovery characteristics of the body diode of an  
equivalent size MOSFET produced without SyncFET  
(FDD6680).  
0
10nS/div  
Figure 13. Non-SyncFET (FDS6680) body  
diode reverse recovery characteristic.  
FDS6680S Rev C (W)  

TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
PowerTrench  
QFET™  
QS™  
SyncFET™  
TinyLogic™  
UHC™  
ACEx™  
FASTr™  
GlobalOptoisolator™  
GTO™  
Bottomless™  
CoolFET™  
CROSSVOLT
™  
DOME™  
QT Optoelectronics™  
VCX™  
HiSeC™  
Quiet Series™  
SILENT SWITCHER  
SMART START™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
ISOPLANAR™  
MICROWIRE™  
OPTOLOGIC™  
OPTOPLANAR™  
PACMAN™  
POP™  
E

2

CMOS

TM  

EnSigna

TM  

FACT™  
FACT Quiet Series™  
FAST  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE T
O
A
NY PRODUCTS HEREIN TO IMPROVE RELIABILIT
Y
,
F
UNCTION OR DESIGN. FAIRCHILD  
DOES NO
T
A
SSUM
E
A
NY LIABILIT
Y
A
RISING OUT OF TH
E
A
PPLICATION OR USE O
F
A
NY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOU
T
T
HE EXPRESS WRITTE
N
A
PPROVA
L
O
F FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. G