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August 2015  
FDMC8097AC  
Dual N & P-Channel PowerTrench

®

MOSFET  
N-Channel: 150 V, 2.4 A, 155 m
Ω
P-Channel: -150 V, -0.9 A, 1200 m
Ω  
Features  
General Description  
These dual N
 
and P-Channel
 
enhancement mode
 
Power  
MOSFE
T
s
a
re produced using Fairchild Semiconductor’s  
advanced PowerTrench

®

process that has been especially  
tailored to minimize on-state resistance and yet maintain  
superior switching performance. Shrinking the area needed for  
implementation of active clamp topology; enabling best in class  
power density.  
Q1: N-Channel  
„
Max r

DS(on)

= 155 m
Ω
at V

GS

= 10 V, I

D

= 2.4 A  
„
Max r

DS(on)

= 212 m
Ω
at V

GS

= 6 V, I

D

= 2 A  
Q2: P-Channel  
„
Max r

DS(on)

= 1200 m
Ω
at V

GS

= -10
V
,
I

D

= -0.9 A  
Applications  
„
Max r

DS(on)

= 1400 m
Ω
at V

GS

= -6
V
,
I

D

= -0.8 A  
„
Optimised for active clamp forward converters  
„
RoHS Compliant  
„
DC-DC Converter  
„
Active Clamp  
Top  
Bottom  
S1  
Pin 1  
G1 S1  
S1  
G2  
S2  
S2  
G1  
S1  
D1  
D2  
S1  
S1  
S2  
S2 S2  
G2 S2  
Power 33  
MOSFET Maximum Ratings
T

A

= 25 °C unless otherwise noted.  
Symbol  
V

DS  

V

GS  

Parameter  
Q1  
150  
±20  
6.3  
Q2  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current -Continuous  
-Continuous  
-150  
±25  
V
V
T

C

= 25 °C  

C

= 100 °C  
(Note 5)  
-2.0  
T
(Note 5)  
3.9  
2.4

1a  

-1.2  
-0.9

1b  

I

D  

A
-Continuous  
T

A

= 25 °C  
-Pulsed  
(Note 4)  
(Note 3)  
33  
-8.8  
E

AS  

Single Pulse Avalanche Energy  
24  
6
mJ  
W
Power Dissipation for Single Operation  
Power Dissipation for Single Operation  
Power Dissipation for Single Operation  
T

A

= 25 °C  
T

A

= 25 °C  
T

C

= 25 °C  
1.9

1a  

0.8

1c  

14  
1.9

1b  

0.8

1d  

10  
P

D  

T

J

, T

STG  

Operating and Storage Junction
T
e
mperature Range  
-55 to +150  
°C  
Thermal Characteristics  
R

θ
JA  

R

θ
JA  

R

θ
JC  

Thermal Resistance, Junction-to-Ambient  
65

1a  

155

1c  

8.9  
65

1b  

155

1d  

12.5  
Thermal Resistance, Junction-to-Ambient  
Thermal Resistance, Junction-to-Case  
°C/W  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
13 ”  
Tape Width  
Quantity  
FDMC8097AC  
FDMC8097AC  
Power 33  
12 mm  
3000 units  
©2015 Fairchild Semiconductor Corporation  
FDMC8097AC Rev.1.0  
1

Electrical Characteristics
T

J

= 25 °C unless otherwise noted.  
Symbol  
Parameter  
Test Conditions  
Type  
Min.  
Typ.  
Max. Units  
Off Characteristics  
I
I

D

= 250
μ
A, V

GS

= 0 V  

D

= -250
μ
A, V

GS

= 0 V  
Q1  
Q2  
150  
-150  
BV

DSS  

Drain to Source Breakdown Voltage  
V
Δ
BV

DSS  

Δ
T

J  

Breakdown Voltage
T
e
mperature  
Coefficient  
I

D

= 250
μ
A, referenced to 25 °C  

D

= -250
μ
A, referenced to 25 °C  
Q1  
Q2  
98  
122  
mV/°C  
I
V
V

DS

= 120 V,
 
V

GS

= 0 V  

DS

= -120 V,
 
V

GS

= 0 V  
Q1  
Q2  
1
I

DSS  

I

GSS  

Zero Gate Voltage Drain Current  
Gate to Source Leakage Current  
μ
A  
-1  
V
V

GS

= ±20 V, V

DS

= 0 V  

GS

= ±25 V, V

DS

= 0 V  
Q1  
Q2  
±100  
±100  
nA  
nA  
On Characteristics  
V
V

GS

= V

DS

, I

D

= 250
μ
A  

GS

= V

DS

, I

D

= -250
μ
A  
Q1  
Q2  
2.0  
-2.0  
3.1  
-3.0  
4.0  
-4.0  
V

GS(th)  

Gate to Source Threshold Voltage  
V
Δ
V

GS(th)  

Δ
T

J  

Gate to Source Threshold Voltage  
T
e
mperature Coefficient  
I

D

= 250
μ
A, referenced to 25 °C  

D

= -250
μ
A, referenced to 25 °C  
V

GS

= 10
V
,
 
I

D

= 2.4 A  
Q1  
Q2  
-9  
-6  
mV/°C  
I
124  
155  
245  
155  
212  
306  
V
V

GS

= 6
V
,
 
I

D

= 2 A  

GS

= 10
V
,
 
I

D

= 2.4 A, T

J

= 125 °C  
Q1  
Q2  
r

DS(on)  

Static Drain to Source On Resistance  
m
Ω  
V
V
V

GS

= -10
V
,
 
I

D

= -0.9 A  

GS

= -6 V,
 
I

D

= -0.8 A  

GS

= -10 V,
 
I

D

= -0.9 A, T

J

= 125 °C  
930  
1030 1400  
1682 2171  
1200  
V
V

DD

= 10
V
,
 
I

D

= 2.4 A  

DD

= -10 V,
 
I

D

= -0.9 A  
Q1  
Q2  
6.4  
0.75  
g

FS  

Forward Transconductance  
S
Dynamic Characteristics  
Q1  
Q2  
279  
162  
395  
230  
Q1  
C

iss  

C

oss  

C

rss  

R

g  

Input Capacitance  
pF  
pF  
pF  
Ω
V

DS

= 75
V
,
V

GS

= 0 V, f = 1 MHZ  
Q1  
Q2  
26  
13  
40  
25  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
Q2  
V

DS

= -75 V, V

GS

= 0 V, f = 1 MHZ  
Q1  
Q2  
1.4  
0.6  
5
5
Q1  
Q2  
0.1  
0.1  
0.6  
3.3  
1.5  
8.3  
Switching Characteristics  
Q1  
Q2  
5.4  
5.2  
11  
11  
t

d(on)  

t

r  

t

d(off)  

t

f  

Turn-On Delay Time  
Rise Time  
ns  
ns  
Q1  
V
V

DD

= 75 V, I

D

= 2.4 A,  

GS

= 10 V, R

GEN

= 6
Ω  
Q1  
Q2  
1.3  
1.6  
10  
10  
Q1  
Q2  
9.1  
7.4  
18  
15  
Q2  
Turn-Off Delay Time  
Fall Time  
ns  
V

DD

= -75 V, I

D

= -0.9 A,  
Q1  
Q2  
2.2  
6.3  
10  
13  
V

GS

= -10
V
,
R

GEN

= 6
Ω  
ns  
V
V

GS

= 0 V to 10 V  

GS

= 0 V to -10 V  
Q1  
Q2  
4.4  
2.8  
6.2  
4.0  
Q

g(TOT)  

Q

g(TOT)  

Q

gs  

T
o
tal Gate Charge  
T
o
tal Gate Charge  
Gate to Source
 
Charge  
Gate to Drain “Miller” Charge  
nC  
nC  
nC  
nC  
Q1  
V

DD

= 75 V,  
V
V

GS

= 0 V to 6 V  

GS

= 0 V to -6 V  
Q1  
Q2  
2.9  
1.8  
4.1  
2.6  
I

D

= 2.4 A  
Q1  
Q2  
1.3  
0.8  
Q2  
V

DD

= -75 V  
Q1  
Q2  
1.0  
0.7  
I

D

= -0.9 A  
Q

gd  

©2015 Fairchild Semiconductor Corporation  
FDMC8097AC Rev.1.0  
2

Electrical Characteristics
T

J

= 25 °C unless otherwise noted.  
Symbol  
Parameter  
Test Conditions  
Type  
Min.  
Typ.  
Max. Units  
Drain-Source Diode Characteristics  
V
V

GS

= 0 V, I

S

= 2.4 A  

GS

= 0 V, I

S

= -0.9 A  
(Note 2)
 
Q1  
(Note 2)
 
Q2  
0.8  
-0.9  
1.3  
V
V

SD  

t

rr  

Source-Drain Diode
 
Forward Voltage  
Reverse Recovery Time  
-1.3  
Q1  
Q2  
50  
44  
80  
ns  
71  
Q1  
I

F

= 2.4 A, di/dt = 100 A/s  
Q2  
I

F

= -0.9 A, di/dt = 100 A/s  
Q1  
Q2  
43  
68  
69  
nC  
Q

rr  

Reverse Recovery Charge  
109  
Notes:  
2
1.
R  
is determined with the device mounted on a 1in
 
pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R  
is guaranteed by design while R  
is determined  
θ
CA  
θ
JA  
θ
JC  
by the
 
user’s board design.  
b. 65 °C/W when mounted on  
a 1 in
 
pad of
 
2 oz
 
copper  
a. 65 °C/W when mounted on  
a 1 in
 
pad of
 
2 oz
 
copper  
2
2
d. 155 °C/W when mounted on  
minimum pad of 2 oz copper  
a
c. 155 °C/W when mounted on
 
a  
minimum pad of 2 oz copper  
2. Pulse Test: Pulse Width < 300
 
μ
s, Duty cycle < 2.0%.  
o
3. Q1: E
 
of 24 mJ is based on starting T
 
= 25
 
C, L = 3 mH, I
 
= 4 A, V
 
= 150 V, V
 
= 10 V. 100% test at L = 0.1 mH, I
 
= 14 A.  
AS  
J
AS  
DD  
GS  
AS  
o
Q2: E
 
of 6 mJ is based on starting T
 
= 25
 
C, L = 3 mH, I
 
= -2 A, V
 
= -150 V, V
 
= -10 V. 100% test at L = 0.1 mH, I
 
= -8 A.  
AS  
J
AS  
DD  
GS  
AS  
4. Q1: Pulsed Id please refer to Fig 11 SOA graph for more details.  
Q2: Pulsed Id please refer to Fig 24 SOA graph for more details.  
5. Computed continuous current limited to Max Junction Temperature only, actual continuous current will be limited by thermal & electro-mechanical application board design.  
©2015 Fairchild Semiconductor Corporation  
FDMC8097AC Rev.1.0  
3

Typical Characteristics (Q1 N-Channel)
T

J

= 25°C unless otherwise noted.  
10  
8
4
3
2
1
0
V

GS

= 10 V  
V

GS

= 6 V  
V

GS

= 4.5 V  
V

GS

= 5 V  
V

GS

= 5.5 V  
V

GS

= 5.5 V  
6
V

GS

= 6 V  
4
V

GS

= 5 V  
PULSE DURATION = 80
μ
s  
DUTY CYCLE = 0.5% MAX  
2
V

GS

= 10 V  
PULSE DURATION = 80
μ
s  
DUTY CYCLE = 0.5% MAX  
V

GS

= 4.5 V  
0
0
1
2
3
4
5
0
2
4
6
8
10  
V

DS

,
DRAIN TO SOURCE VOLTAGE (V)  
I

D

,
DRAIN CURRENT (A)  
Figure 1.
 
On Region Characteristics  
Figur
e
2
. N
 
o r m a l i z e d O n – R e s i s ta n c e  
vs. Drain Current and Gate Voltage  
2.5  
500  
PULSE DURATION = 80
μ
s  
DUTY CYCLE = 0.5% MAX  
I

D

= 2.4 A  
V

GS

= 10 V  
I

D

= 2.4 A  
400  
300  
200  
100  
0
2.0  
1.5  
1.0  
0.5  
T

J

= 125

o  

C
T

J

= 25

o  

C
-75 -50 -25  
0
25 50 75
 
100 125 150  
4
5
6
7
8
9
10  
T

J

,
JUNCTION TEMPERATURE
(

o

C
)  
V

GS

,
GATE TO SOURCE VOLTAGE (V)  
Figure 3. Normalized On Resistance  
vs. Junction Temperature  
Figur
e
4
. On-Resistance
 
vs. Gate to  
Source Voltage  
10  
20  
10  
V

GS

= 0 V  
PULSE DURATION = 80
μ
s  
DUTY CYCLE = 0.5% MAX  
8
6
4
2
0
V

DS

= 5 V  
1
T

J

= 150

o  

C
T

J

= 25

o

C  
T

J

= 150

o  

C
0.1  
T

J

= 25

o  

C
0.01  
T

J

= -55

o  

C
T

J

= -55

o  

C
0.001  
2
3
4
5
6
7
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
V

GS

, GATE TO SOURCE VOLTAGE (V)  
V

SD

, BODY DIODE FORWARD VOLTAGE (V)  
Figure 5.
 
Transfer Characteristics  
Figur
e
6
. Source
 
to Drain Diode  
Forward Voltage vs. Source Current  
©2015 Fairchild Semiconductor Corporation  
FDMC8097AC Rev.1.0  
4

Typical Characteristics (Q1 N-Channel)
T

J

= 25°C unless otherwise noted.  
1000  
100  
10  
10  
8
I

D

= 2.4 A  
C

iss  

V

DD

= 50 V  
V

DD

= 75 V  
V

DD

= 100 V  
C

oss  

6
4
C

rss  

2
f = 1 MHz  

GS

= 0 V  
V
1
0.1  
0
0
1
2
3
4
5
1
10  
100  
V

DS

, DRAIN TO SOURCE VOLTAGE (V)  
Q

g

, GATE CHARGE (nC)  
Figure 7.
 
Gate Charge Characteristics  
Figur
e
8
. C
 
a p a c i t a n c e v s . D r a i n  
to Source Voltage  
20  
8
6
4
2
0
R

θ
JC

= 8.9

o

C/W  
10  
T

J

= 25

o

C  
V

GS

= 10 V  
T

J

= 100

o  

C
V

GS

= 6 V  
T

J

= 125

o  

C
1
0.001  
0.01  
0.1  
1
10  
25  
50  
75  
100  
125  
150  
T

C

,
CASE TEMPERATURE
(

o

C
)  
t

AV

, TIME IN AVALANCHE (ms)  
Figur
e
9
. U
 
n c l a m p e d I n d u c t i v e  
Switching Capability  
Figur
e
1
0. Maximum Continuous Drain  
Current vs.
 
Case Temperature  
100  
10  
10000  
SINGLE PULSE  
R

θ
JC

= 8.9

o

C/W  

C

= 25

o

C  
10
μ
s  
T
1000  
100  
10  
100
μ
s  
1
THIS AREA IS  
LIMITED BY r

DS(on)  

SINGLE PULSE  
T

J

= MAX RATED  
R

θ
JC

= 8.9

o

C/W  
1 ms  
0.1  
0.01  
10 ms  
DC  
CURVE BENT TO  
MEASURED DATA  
T

C

= 25

o

C  
10

-5  

10

-4  

10

-3  

t, PULSE WIDTH (sec)  
10

-2  

10

-1  

1
0.1  
1
10 100  
1000  
V

DS

, DRAIN to SOURCE VOLTAGE (V)  
Figur
e
1
1. Forward Bias Safe  
Operating Area  
Figur
e
1
2. Single Pulse Maximum Power  
Dissipation  
©2015 Fairchild Semiconductor Corporation  
FDMC8097AC Rev.1.0  
5

Typical Characteristics (Q1 N-Channel)
T

J

= 25°C unless otherwise noted.  
2
DUTY CYCLE-DESCENDING ORDER  
1
D = 0.5  
0.2  
P
DM  
0.1  
0.1  
0.05  
0.02  
0.01  
t
1
t
2
NOTES:  
(t) = r(t) x R  
θ
JC  
0.01  
Z
SINGLE PULSE  
θ
JC  
o
R
= 8.9
 
C/W  
θ
JC  
Peak T
 
= P  
x Z
 
(t) + T  
J
DM  
θ
JC C  
Duty Cycle, D = t
 
/ t  
1
2
0.001  
10

-5  

10

-4  

10

-3  

10

-2  

10

-1  

1
t, RECTANGULAR PULSE DURATION (sec)  
Figure 13.
 
Junction-to-Case Transient Thermal Response Curve  
©2015 Fairchild Semiconductor Corporation  
FDMC8097AC Rev.1.0  
6

Typical Characteristics (Q2 P-Channel)
T

J

= 25 °C unless otherwise noted  
4
1.8  
V

GS

= -10 V  
PULSE DURATION = 80
μ
s  
DUTY CYCLE = 0.5% MAX  
V

GS

= -5 V  
V

GS

= -7 V  
1.6  
3
V

GS

= -6 V  
V

GS

= -5.5 V  
V

GS

= -5.5 V  
V

GS

= -5 V  
1.4  
1.2  
1.0  
0.8  
2
1
0
V

GS

= -10 V  
PULSE DURATION = 80
μ
s  
DUTY CYCLE = 0.5% MAX  
V

GS

= -7 V  
V

GS

= -6 V  
0
1
2
3
4
5
0
1
2
3
4
-V

DS

,
DRAIN TO SOURCE VOLTAGE (V)  
-I

D

,
DRAIN CURRENT (A)  
Figure 14.
 
On- Region Characteristics  
Figure 15. Normalized on-Resistance vs. Drain  
Current and Gate
 
Voltage  
3000  
2.2  
2.0  
I

D

= -0.9 A  

GS

= -10 V  
PULSE DURATION = 80
μ
s  
DUTY CYCLE = 0.5% MAX  
V
2500  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
I

D

= -0.9
 
A  
2000  
T

J

= 125

o  

C
1500  
1000  
T

J

= 25

o  

C
4
5
6
7
8
9
10  
-75 -50 -25  
0
25 50 75
 
100 125 150  
T

J

,
JUNCTION TEMPERATURE
(

o

C
)  
-V

GS

,
GATE TO SOURCE VOLTAGE (V)  
Figure 17. On-Resistance vs. Gate to  
Source Voltage  
Figure 16. Normalized On-Resistance  
vs. Junction Temperature  
4
5
V

GS

= 0 V  
PULSE DURATION = 80
μ
s  
DUTY CYCLE = 0.5% MAX  
1
3
V

DS

= -5 V  
T

J

= 150

o  

C
0.1  
0.01  
T

J

= 25

o

C  
2
T

J

= 150

o  

C
T

J

= 25

o  

C
1
0
T

J

= -55

o  

C
T

J

= -55

o  

C
0.001  
2
3
4
5
6
7
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
-V

GS

, GATE TO SOURCE VOLTAGE (V)  
-V

SD

, BODY DIODE FORWARD VOLTAGE (V)  
Figure 18. Transfer Characteristics  
Figure 19. Source to Drain Diode  
Forward Voltage vs. Source Current  
©2015 Fairchild Semiconductor Corporation  
FDMC8097AC Rev.1.0  
7

Typical Characteristics (Q2 P-Channel)
T

J

= 25°C unless otherwise noted  
1000  
100  
10  
10  
8
I

D

= -0.9 A  
C

iss  

V

DD

= -75 V  
V

DD

= -50 V  
C

oss  

6
V

DD

= -100 V  
4
C

rss  

1
f = 1 MHz  
V

GS

= 0 V  
2
0.1  
0
0.1  
1
10  
100  
150  
1
0.0  
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
3.5  
-V

DS

, DRAIN TO SOURCE VOLTAGE (V)  
Q

g

, GATE CHARGE (nC)  
Figure 21. Capacitance vs. Drain  
to Source Voltage  
Figure 20. Gate Charge Characteristics  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
20  
10  
T

J

= 25

o

C  
V

GS

= -10 V  
T

J

= 100

o  

C
V

GS

= -6 V  
T

J

= 125

o  

C
R

θ
JC

= 12.5

o

C/W  
1
0.001  
0.01  
0.1  
1
25  
50  
75  
100  
125  
T

C

,
CASE TEMPERATURE
(

o

C
)  
t

AV

, TIME IN AVALANCHE (ms)  
Figure 22. Unclamped Inductive  
Switching Capability  
F ig ure 23 . Ma ximum
 
C on tin uo us
 
D rain  
Current vs.
 
Case Temperature  
20  
10  
500  
SINGLE PULSE  
R

θ
JC

= 12.5

o

C/W  

C

= 25

o  

T
C
100  
10  
1
100
μ
s  
1
0.1  
THIS AREA IS  
LIMITED BY r

DS(on)  

1 ms  
SINGLE PULSE  
T

J

= MAX RATED  
R

θ
JC

= 12.5

o

C/W  
10 ms  
DC  
CURVE BENT TO  
MEASURED DATA  
T

C

= 25

o

C  
0.01  
10

-4  

10

-3  

10

-2  

10

-1  

1
10  
100  
500  
-V

DS

, DRAIN to SOURCE VOLTAGE (V)  
t, PULSE WIDTH (sec)  
Figure 24. Forward Bias Safe  
Operating Area  
Figure 25. Single Pulse
 
Maximum Power  
Dissipation  
©2015 Fairchild Semiconductor Corporation  
FDMC8097AC Rev.1.0  
8

Typical Characteristics (Q2 P-Channel)
T

J

= 25 °C unless otherwise noted  
2
DUTY CYCLE-DESCENDING ORDER  
1
D = 0.5  
0.2  
0.1  
P
DM  
0.05  
0.02  
0.01  
t
1
0.1  
t
2
NOTES:  
(t) = r(t) x R  
SINGLE PULSE  
Z
θ
JC  
θ
JC  
o
R
= 12.5
 
C/W  
θ
JC  
Peak T
 
= P  
x Z
 
(t) + T  
J
DM  
θ
JC C  
Duty Cycle, D = t
 
/ t  
1
2
0.01  
10

-4  

10

-3  

10

-2  

10

-1  

1
t, RECTANGULAR PULSE DURATION (sec)  
Figure 26. Junction-to-Case Transient Thermal Response Curve  
©2015 Fairchild Semiconductor Corporation  
FDMC8097AC Rev.1.0  
9

2.52  
(0.20)  
0.10 C  
A
3.00  
2X  
B
5
8
0.75(2X)  
(0.35)  
3.30  
3.00  
2.26  
PIN#1  
IDENT AREA  
(0.20)2X  
0.52  
0.45  
0.10 C  
1
4
1.75  
TOP VIEW  
2X  
RECOMMENDED LAND PATTERN  
0.80 MAX  
0.10 C  
0.08 C  
(0.20)  
NOTES:  
0.05  
0.00  
C
A. DOES NOT FULLY CONFORM TO  
JEDEC REGISTRATION, MO-229.  
SEATING  
PLANE  
SIDE VIEW  
B. DIMENSIONS ARE IN MILLIMETERS.  
C. DIMENSIONS AND TOLERANCES PER  
ASME Y14.5M, 1994  
ꢈꢁꢃꢀ“ꢀꢁꢀꢃ  
0.30 (2X)  
PIN #1  
IDENT  
(1.65)  
(0.35)  
4X  
D. LAND PATTERN RECOMMENDATION IS  
BASED ON FSC DESIGN
 
ONLY  
A
1
4
ꢀꢁꢉꢃꢃ“ꢀꢁꢀꢃꢄꢅꢈ;ꢇ  
E. DRAWING FILE NAME: MKT-MLP08Xrev2.  
0.163  
(0.35)  
(0.25) 2X  
ꢀꢁꢂꢈ“ꢀꢁꢀꢃꢄꢅꢆ;ꢇ  
ꢀꢁꢂꢈ“ꢀꢁꢀꢃ  
(2X)  
0.10  
0.05  
C A B  
8
C
5
ꢀꢁꢂꢃ“ꢀꢁꢀꢃ  
(2X)  
ꢀꢁꢂꢃ“ꢀꢁꢀꢃꢄꢅꢆ;ꢇ  
0.30 (4X)  
0.65  
BOTTOM VIEW  

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