onsemi-FDMC8097AC
| Part # | onsemi-FDMC8097AC |
| Download | onsemi-FDMC8097AC |
Is Now Part of
To learn more about ON Semiconductor, please visit our website at
Please note: As part of the Fairchild Semiconductor integration, some of the Fairchild orderable part numbers
will need to change in order to meet ON Semiconductor’s system requirements. Since the ON Semiconductor
product management systems do not have the ability to manage part nomenclature that utilizes an underscore
(_), the underscore (_) in the Fairchild part numbers will be changed to a dash (-). This document may contain
device numbers with an underscore (_). Please check the ON Semiconductor website to verify the updated
device numbers. The most
current and up-to-date ordering information can be found at
www.onsemi.com
. Please
ON Semiconductor and the ON Semiconductor logo are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number
to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON
Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON
Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s
technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA
Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended
or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out
of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor
is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.
August 2015
FDMC8097AC
Dual N & P-Channel PowerTrench
®
MOSFET
N-Channel: 150 V, 2.4 A, 155 m
Ω
P-Channel: -150 V, -0.9 A, 1200 m
Ω
Features
General Description
These dual N
and P-Channel
enhancement mode
Power
MOSFE
T
s
a
re produced using Fairchild Semiconductor’s
advanced PowerTrench
®
process that has been especially
tailored to minimize on-state resistance and yet maintain
superior switching performance. Shrinking the area needed for
implementation of active clamp topology; enabling best in class
power density.
Q1: N-Channel
Max r
DS(on)
= 155 m
Ω
at V
GS
= 10 V, I
D
= 2.4 A
Max r
DS(on)
= 212 m
Ω
at V
GS
= 6 V, I
D
= 2 A
Q2: P-Channel
Max r
DS(on)
= 1200 m
Ω
at V
GS
= -10
V
,
I
D
= -0.9 A
Applications
Max r
DS(on)
= 1400 m
Ω
at V
GS
= -6
V
,
I
D
= -0.8 A
Optimised for active clamp forward converters
RoHS Compliant
DC-DC Converter
Active Clamp
Top
Bottom
S1
Pin 1
G1 S1
S1
G2
S2
S2
G1
S1
D1
D2
S1
S1
S2
S2 S2
G2 S2
Power 33
MOSFET Maximum Ratings
T
A
= 25 °C unless otherwise noted.
Symbol
V
DS
V
GS
Parameter
Q1
150
±20
6.3
Q2
Units
Drain to Source Voltage
Gate to Source Voltage
Drain Current -Continuous
-Continuous
-150
±25
V
V
T
C
= 25 °C
C
= 100 °C
(Note 5)
-2.0
T
(Note 5)
3.9
2.4
1a
-1.2
-0.9
1b
I
D
A
-Continuous
T
A
= 25 °C
-Pulsed
(Note 4)
(Note 3)
33
-8.8
E
AS
Single Pulse Avalanche Energy
24
6
mJ
W
Power Dissipation for Single Operation
Power Dissipation for Single Operation
Power Dissipation for Single Operation
T
A
= 25 °C
T
A
= 25 °C
T
C
= 25 °C
1.9
1a
0.8
1c
14
1.9
1b
0.8
1d
10
P
D
T
J
, T
STG
Operating and Storage Junction
T
e
mperature Range
-55 to +150
°C
Thermal Characteristics
R
θ
JA
R
θ
JA
R
θ
JC
Thermal Resistance, Junction-to-Ambient
65
1a
155
1c
8.9
65
1b
155
1d
12.5
Thermal Resistance, Junction-to-Ambient
Thermal Resistance, Junction-to-Case
°C/W
Package Marking and Ordering Information
Device Marking
Device
Package
Reel Size
13 ”
Tape Width
Quantity
FDMC8097AC
FDMC8097AC
Power 33
12 mm
3000 units
©2015 Fairchild Semiconductor Corporation
FDMC8097AC Rev.1.0
1
Electrical Characteristics
T
J
= 25 °C unless otherwise noted.
Symbol
Parameter
Test Conditions
Type
Min.
Typ.
Max. Units
Off Characteristics
I
I
D
= 250
μ
A, V
GS
= 0 V
D
= -250
μ
A, V
GS
= 0 V
Q1
Q2
150
-150
BV
DSS
Drain to Source Breakdown Voltage
V
Δ
BV
DSS
Δ
T
J
Breakdown Voltage
T
e
mperature
Coefficient
I
D
= 250
μ
A, referenced to 25 °C
D
= -250
μ
A, referenced to 25 °C
Q1
Q2
98
122
mV/°C
I
V
V
DS
= 120 V,
V
GS
= 0 V
DS
= -120 V,
V
GS
= 0 V
Q1
Q2
1
I
DSS
I
GSS
Zero Gate Voltage Drain Current
Gate to Source Leakage Current
μ
A
-1
V
V
GS
= ±20 V, V
DS
= 0 V
GS
= ±25 V, V
DS
= 0 V
Q1
Q2
±100
±100
nA
nA
On Characteristics
V
V
GS
= V
DS
, I
D
= 250
μ
A
GS
= V
DS
, I
D
= -250
μ
A
Q1
Q2
2.0
-2.0
3.1
-3.0
4.0
-4.0
V
GS(th)
Gate to Source Threshold Voltage
V
Δ
V
GS(th)
Δ
T
J
Gate to Source Threshold Voltage
T
e
mperature Coefficient
I
D
= 250
μ
A, referenced to 25 °C
D
= -250
μ
A, referenced to 25 °C
V
GS
= 10
V
,
I
D
= 2.4 A
Q1
Q2
-9
-6
mV/°C
I
124
155
245
155
212
306
V
V
GS
= 6
V
,
I
D
= 2 A
GS
= 10
V
,
I
D
= 2.4 A, T
J
= 125 °C
Q1
Q2
r
DS(on)
Static Drain to Source On Resistance
m
Ω
V
V
V
GS
= -10
V
,
I
D
= -0.9 A
GS
= -6 V,
I
D
= -0.8 A
GS
= -10 V,
I
D
= -0.9 A, T
J
= 125 °C
930
1030 1400
1682 2171
1200
V
V
DD
= 10
V
,
I
D
= 2.4 A
DD
= -10 V,
I
D
= -0.9 A
Q1
Q2
6.4
0.75
g
FS
Forward Transconductance
S
Dynamic Characteristics
Q1
Q2
279
162
395
230
Q1
C
iss
C
oss
C
rss
R
g
Input Capacitance
pF
pF
pF
Ω
V
DS
= 75
V
,
V
GS
= 0 V, f = 1 MHZ
Q1
Q2
26
13
40
25
Output Capacitance
Reverse Transfer Capacitance
Gate Resistance
Q2
V
DS
= -75 V, V
GS
= 0 V, f = 1 MHZ
Q1
Q2
1.4
0.6
5
5
Q1
Q2
0.1
0.1
0.6
3.3
1.5
8.3
Switching Characteristics
Q1
Q2
5.4
5.2
11
11
t
d(on)
t
r
t
d(off)
t
f
Turn-On Delay Time
Rise Time
ns
ns
Q1
V
V
DD
= 75 V, I
D
= 2.4 A,
GS
= 10 V, R
GEN
= 6
Ω
Q1
Q2
1.3
1.6
10
10
Q1
Q2
9.1
7.4
18
15
Q2
Turn-Off Delay Time
Fall Time
ns
V
DD
= -75 V, I
D
= -0.9 A,
Q1
Q2
2.2
6.3
10
13
V
GS
= -10
V
,
R
GEN
= 6
Ω
ns
V
V
GS
= 0 V to 10 V
GS
= 0 V to -10 V
Q1
Q2
4.4
2.8
6.2
4.0
Q
g(TOT)
Q
g(TOT)
Q
gs
T
o
tal Gate Charge
T
o
tal Gate Charge
Gate to Source
Charge
Gate to Drain “Miller” Charge
nC
nC
nC
nC
Q1
V
DD
= 75 V,
V
V
GS
= 0 V to 6 V
GS
= 0 V to -6 V
Q1
Q2
2.9
1.8
4.1
2.6
I
D
= 2.4 A
Q1
Q2
1.3
0.8
Q2
V
DD
= -75 V
Q1
Q2
1.0
0.7
I
D
= -0.9 A
Q
gd
©2015 Fairchild Semiconductor Corporation
FDMC8097AC Rev.1.0
2
Electrical Characteristics
T
J
= 25 °C unless otherwise noted.
Symbol
Parameter
Test Conditions
Type
Min.
Typ.
Max. Units
Drain-Source Diode Characteristics
V
V
GS
= 0 V, I
S
= 2.4 A
GS
= 0 V, I
S
= -0.9 A
(Note 2)
Q1
(Note 2)
Q2
0.8
-0.9
1.3
V
V
SD
t
rr
Source-Drain Diode
Forward Voltage
Reverse Recovery Time
-1.3
Q1
Q2
50
44
80
ns
71
Q1
I
F
= 2.4 A, di/dt = 100 A/s
Q2
I
F
= -0.9 A, di/dt = 100 A/s
Q1
Q2
43
68
69
nC
Q
rr
Reverse Recovery Charge
109
Notes:
2
1.
R
is determined with the device mounted on a 1in
pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R
is guaranteed by design while R
is determined
θ
CA
θ
JA
θ
JC
by the
user’s board design.
b. 65 °C/W when mounted on
a 1 in
pad of
2 oz
copper
a. 65 °C/W when mounted on
a 1 in
pad of
2 oz
copper
2
2
d. 155 °C/W when mounted on
minimum pad of 2 oz copper
a
c. 155 °C/W when mounted on
a
minimum pad of 2 oz copper
2. Pulse Test: Pulse Width < 300
μ
s, Duty cycle < 2.0%.
o
3. Q1: E
of 24 mJ is based on starting T
= 25
C, L = 3 mH, I
= 4 A, V
= 150 V, V
= 10 V. 100% test at L = 0.1 mH, I
= 14 A.
AS
J
AS
DD
GS
AS
o
Q2: E
of 6 mJ is based on starting T
= 25
C, L = 3 mH, I
= -2 A, V
= -150 V, V
= -10 V. 100% test at L = 0.1 mH, I
= -8 A.
AS
J
AS
DD
GS
AS
4. Q1: Pulsed Id please refer to Fig 11 SOA graph for more details.
Q2: Pulsed Id please refer to Fig 24 SOA graph for more details.
5. Computed continuous current limited to Max Junction Temperature only, actual continuous current will be limited by thermal & electro-mechanical application board design.
©2015 Fairchild Semiconductor Corporation
FDMC8097AC Rev.1.0
3
Typical Characteristics (Q1 N-Channel)
T
J
= 25°C unless otherwise noted.
10
8
4
3
2
1
0
V
GS
= 10 V
V
GS
= 6 V
V
GS
= 4.5 V
V
GS
= 5 V
V
GS
= 5.5 V
V
GS
= 5.5 V
6
V
GS
= 6 V
4
V
GS
= 5 V
PULSE DURATION = 80
μ
s
DUTY CYCLE = 0.5% MAX
2
V
GS
= 10 V
PULSE DURATION = 80
μ
s
DUTY CYCLE = 0.5% MAX
V
GS
= 4.5 V
0
0
1
2
3
4
5
0
2
4
6
8
10
V
DS
,
DRAIN TO SOURCE VOLTAGE (V)
I
D
,
DRAIN CURRENT (A)
Figure 1.
On Region Characteristics
Figur
e
2
. N
o r m a l i z e d O n – R e s i s ta n c e
vs. Drain Current and Gate Voltage
2.5
500
PULSE DURATION = 80
μ
s
DUTY CYCLE = 0.5% MAX
I
D
= 2.4 A
V
GS
= 10 V
I
D
= 2.4 A
400
300
200
100
0
2.0
1.5
1.0
0.5
T
J
= 125
o
C
T
J
= 25
o
C
-75 -50 -25
0
25 50 75
100 125 150
4
5
6
7
8
9
10
T
J
,
JUNCTION TEMPERATURE
(
o
C
)
V
GS
,
GATE TO SOURCE VOLTAGE (V)
Figure 3. Normalized On Resistance
vs. Junction Temperature
Figur
e
4
. On-Resistance
vs. Gate to
Source Voltage
10
20
10
V
GS
= 0 V
PULSE DURATION = 80
μ
s
DUTY CYCLE = 0.5% MAX
8
6
4
2
0
V
DS
= 5 V
1
T
J
= 150
o
C
T
J
= 25
o
C
T
J
= 150
o
C
0.1
T
J
= 25
o
C
0.01
T
J
= -55
o
C
T
J
= -55
o
C
0.001
2
3
4
5
6
7
0.0
0.2
0.4
0.6
0.8
1.0
1.2
V
GS
, GATE TO SOURCE VOLTAGE (V)
V
SD
, BODY DIODE FORWARD VOLTAGE (V)
Figure 5.
Transfer Characteristics
Figur
e
6
. Source
to Drain Diode
Forward Voltage vs. Source Current
©2015 Fairchild Semiconductor Corporation
FDMC8097AC Rev.1.0
4
Typical Characteristics (Q1 N-Channel)
T
J
= 25°C unless otherwise noted.
1000
100
10
10
8
I
D
= 2.4 A
C
iss
V
DD
= 50 V
V
DD
= 75 V
V
DD
= 100 V
C
oss
6
4
C
rss
2
f = 1 MHz
GS
= 0 V
V
1
0.1
0
0
1
2
3
4
5
1
10
100
V
DS
, DRAIN TO SOURCE VOLTAGE (V)
Q
g
, GATE CHARGE (nC)
Figure 7.
Gate Charge Characteristics
Figur
e
8
. C
a p a c i t a n c e v s . D r a i n
to Source Voltage
20
8
6
4
2
0
R
θ
JC
= 8.9
o
C/W
10
T
J
= 25
o
C
V
GS
= 10 V
T
J
= 100
o
C
V
GS
= 6 V
T
J
= 125
o
C
1
0.001
0.01
0.1
1
10
25
50
75
100
125
150
T
C
,
CASE TEMPERATURE
(
o
C
)
t
AV
, TIME IN AVALANCHE (ms)
Figur
e
9
. U
n c l a m p e d I n d u c t i v e
Switching Capability
Figur
e
1
0. Maximum Continuous Drain
Current vs.
Case Temperature
100
10
10000
SINGLE PULSE
R
θ
JC
= 8.9
o
C/W
C
= 25
o
C
10
μ
s
T
1000
100
10
100
μ
s
1
THIS AREA IS
LIMITED BY r
DS(on)
SINGLE PULSE
T
J
= MAX RATED
R
θ
JC
= 8.9
o
C/W
1 ms
0.1
0.01
10 ms
DC
CURVE BENT TO
MEASURED DATA
T
C
= 25
o
C
10
-5
10
-4
10
-3
t, PULSE WIDTH (sec)
10
-2
10
-1
1
0.1
1
10 100
1000
V
DS
, DRAIN to SOURCE VOLTAGE (V)
Figur
e
1
1. Forward Bias Safe
Operating Area
Figur
e
1
2. Single Pulse Maximum Power
Dissipation
©2015 Fairchild Semiconductor Corporation
FDMC8097AC Rev.1.0
5
Typical Characteristics (Q1 N-Channel)
T
J
= 25°C unless otherwise noted.
2
DUTY CYCLE-DESCENDING ORDER
1
D = 0.5
0.2
P
DM
0.1
0.1
0.05
0.02
0.01
t
1
t
2
NOTES:
(t) = r(t) x R
θ
JC
0.01
Z
SINGLE PULSE
θ
JC
o
R
= 8.9
C/W
θ
JC
Peak T
= P
x Z
(t) + T
J
DM
θ
JC C
Duty Cycle, D = t
/ t
1
2
0.001
10
-5
10
-4
10
-3
10
-2
10
-1
1
t, RECTANGULAR PULSE DURATION (sec)
Figure 13.
Junction-to-Case Transient Thermal Response Curve
©2015 Fairchild Semiconductor Corporation
FDMC8097AC Rev.1.0
6
Typical Characteristics (Q2 P-Channel)
T
J
= 25 °C unless otherwise noted
4
1.8
V
GS
= -10 V
PULSE DURATION = 80
μ
s
DUTY CYCLE = 0.5% MAX
V
GS
= -5 V
V
GS
= -7 V
1.6
3
V
GS
= -6 V
V
GS
= -5.5 V
V
GS
= -5.5 V
V
GS
= -5 V
1.4
1.2
1.0
0.8
2
1
0
V
GS
= -10 V
PULSE DURATION = 80
μ
s
DUTY CYCLE = 0.5% MAX
V
GS
= -7 V
V
GS
= -6 V
0
1
2
3
4
5
0
1
2
3
4
-V
DS
,
DRAIN TO SOURCE VOLTAGE (V)
-I
D
,
DRAIN CURRENT (A)
Figure 14.
On- Region Characteristics
Figure 15. Normalized on-Resistance vs. Drain
Current and Gate
Voltage
3000
2.2
2.0
I
D
= -0.9 A
GS
= -10 V
PULSE DURATION = 80
μ
s
DUTY CYCLE = 0.5% MAX
V
2500
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
I
D
= -0.9
A
2000
T
J
= 125
o
C
1500
1000
T
J
= 25
o
C
4
5
6
7
8
9
10
-75 -50 -25
0
25 50 75
100 125 150
T
J
,
JUNCTION TEMPERATURE
(
o
C
)
-V
GS
,
GATE TO SOURCE VOLTAGE (V)
Figure 17. On-Resistance vs. Gate to
Source Voltage
Figure 16. Normalized On-Resistance
vs. Junction Temperature
4
5
V
GS
= 0 V
PULSE DURATION = 80
μ
s
DUTY CYCLE = 0.5% MAX
1
3
V
DS
= -5 V
T
J
= 150
o
C
0.1
0.01
T
J
= 25
o
C
2
T
J
= 150
o
C
T
J
= 25
o
C
1
0
T
J
= -55
o
C
T
J
= -55
o
C
0.001
2
3
4
5
6
7
0.0
0.2
0.4
0.6
0.8
1.0
1.2
-V
GS
, GATE TO SOURCE VOLTAGE (V)
-V
SD
, BODY DIODE FORWARD VOLTAGE (V)
Figure 18. Transfer Characteristics
Figure 19. Source to Drain Diode
Forward Voltage vs. Source Current
©2015 Fairchild Semiconductor Corporation
FDMC8097AC Rev.1.0
7
Typical Characteristics (Q2 P-Channel)
T
J
= 25°C unless otherwise noted
1000
100
10
10
8
I
D
= -0.9 A
C
iss
V
DD
= -75 V
V
DD
= -50 V
C
oss
6
V
DD
= -100 V
4
C
rss
1
f = 1 MHz
V
GS
= 0 V
2
0.1
0
0.1
1
10
100
150
1
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
-V
DS
, DRAIN TO SOURCE VOLTAGE (V)
Q
g
, GATE CHARGE (nC)
Figure 21. Capacitance vs. Drain
to Source Voltage
Figure 20. Gate Charge Characteristics
2.5
2.0
1.5
1.0
0.5
0.0
20
10
T
J
= 25
o
C
V
GS
= -10 V
T
J
= 100
o
C
V
GS
= -6 V
T
J
= 125
o
C
R
θ
JC
= 12.5
o
C/W
1
0.001
0.01
0.1
1
25
50
75
100
125
T
C
,
CASE TEMPERATURE
(
o
C
)
t
AV
, TIME IN AVALANCHE (ms)
Figure 22. Unclamped Inductive
Switching Capability
F ig ure 23 . Ma ximum
C on tin uo us
D rain
Current vs.
Case Temperature
20
10
500
SINGLE PULSE
R
θ
JC
= 12.5
o
C/W
C
= 25
o
T
C
100
10
1
100
μ
s
1
0.1
THIS AREA IS
LIMITED BY r
DS(on)
1 ms
SINGLE PULSE
T
J
= MAX RATED
R
θ
JC
= 12.5
o
C/W
10 ms
DC
CURVE BENT TO
MEASURED DATA
T
C
= 25
o
C
0.01
10
-4
10
-3
10
-2
10
-1
1
10
100
500
-V
DS
, DRAIN to SOURCE VOLTAGE (V)
t, PULSE WIDTH (sec)
Figure 24. Forward Bias Safe
Operating Area
Figure 25. Single Pulse
Maximum Power
Dissipation
©2015 Fairchild Semiconductor Corporation
FDMC8097AC Rev.1.0
8
Typical Characteristics (Q2 P-Channel)
T
J
= 25 °C unless otherwise noted
2
DUTY CYCLE-DESCENDING ORDER
1
D = 0.5
0.2
0.1
P
DM
0.05
0.02
0.01
t
1
0.1
t
2
NOTES:
(t) = r(t) x R
SINGLE PULSE
Z
θ
JC
θ
JC
o
R
= 12.5
C/W
θ
JC
Peak T
= P
x Z
(t) + T
J
DM
θ
JC C
Duty Cycle, D = t
/ t
1
2
0.01
10
-4
10
-3
10
-2
10
-1
1
t, RECTANGULAR PULSE DURATION (sec)
Figure 26. Junction-to-Case Transient Thermal Response Curve
©2015 Fairchild Semiconductor Corporation
FDMC8097AC Rev.1.0
9
2.52
(0.20)
0.10 C
A
3.00
2X
B
5
8
0.75(2X)
(0.35)
3.30
3.00
2.26
PIN#1
IDENT AREA
(0.20)2X
0.52
0.45
0.10 C
1
4
1.75
TOP VIEW
2X
RECOMMENDED LAND PATTERN
0.80 MAX
0.10 C
0.08 C
(0.20)
NOTES:
0.05
0.00
C
A. DOES NOT FULLY CONFORM TO
JEDEC REGISTRATION, MO-229.
SEATING
PLANE
SIDE VIEW
B. DIMENSIONS ARE IN MILLIMETERS.
C. DIMENSIONS AND TOLERANCES PER
ASME Y14.5M, 1994
ꢈꢁꢃꢀꢀꢁꢀꢃ
0.30 (2X)
PIN #1
IDENT
(1.65)
(0.35)
4X
D. LAND PATTERN RECOMMENDATION IS
BASED ON FSC DESIGN
ONLY
A
1
4
ꢀꢁꢉꢃꢃꢀꢁꢀꢃꢄꢅꢈ;ꢇ
E. DRAWING FILE NAME: MKT-MLP08Xrev2.
0.163
(0.35)
(0.25) 2X
ꢀꢁꢂꢈꢀꢁꢀꢃꢄꢅꢆ;ꢇ
ꢀꢁꢂꢈꢀꢁꢀꢃ
(2X)
0.10
0.05
C A B
8
C
5
ꢀꢁꢂꢃꢀꢁꢀꢃ
(2X)
ꢀꢁꢂꢃꢀꢁꢀꢃꢄꢅꢆ;ꢇ
0.30 (4X)
0.65
BOTTOM VIEW
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at
www.onsemi.com/site/pdf/Patent
−
Marking.pdf
. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This
literature is subject to all applicable copyright laws and is not for resale in any manner.
PUBLICATION ORDERING INFORMATION
LITERATURE FULFILLMEN
T
:
N. American Technical Support
: 800
−
282
−
9855
T
o
ll Free
USA/Canada
Europe, Middle East and Africa Technical Support:
Phone: 421 33 790 2910
Japan Customer Focus Center
Phone: 81
−
3
−
5817
−
1050
Literature Distribution Center for ON Semiconductor
19521 E. 32nd Pkwy, Aurora, Colorado 80011 USA
Phone
: 303
−
675
−
2175 or 800
−
344
−
3860
T
o
ll Free USA/Canada
Fax
: 303
−
675
−
2176 or 800
−
344
−
3867
T
o
ll Free USA/Canada
Email
: orderlit@onsemi.com
For additional information, please contact your local
Sales Representative
©
Semiconductor Components Industries, LLC
