onsemi-FDMS3620S

Part #onsemi-FDMS3620S
Download 
onsemi-FDMS3620S
Is Now Part of  
To learn more about ON Semiconductor, please visit our website at  
Please note: As part of the Fairchild Semiconductor integration, some of the Fairchild orderable part numbers  
will need to change in order to meet ON Semiconductor’s system requirements. Since the ON Semiconductor  
product management systems do not have the ability to manage part nomenclature that utilizes an underscore  
(_), the underscore (_) in the Fairchild part numbers will be changed to a dash (-). This document may contain  
device numbers with an underscore (_). Please check the ON Semiconductor website to verify the updated  
email any questions regarding the system integration to

.  
ON Semiconductor and the ON Semiconductor logo are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number  
to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability  
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON  
Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON  
Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s  
technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA  
Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended  
or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out  
of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor  
is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.  

July 2012  
FDMS3620S  
PowerTrench

®

PowerStage  
25V Asymmetric Dual N-Channel MOSFET  
Features  
General Description  
Q1: N-Channel  
This device includes two specialized N-Channel MOSFE
T
s
i
n a  
dual PQFN package. The switch node has been internally  
connected to enable easy placement and routing of synchronous  
buck converters. The control MOSFET (Q1) and synchronous  
SyncFET (Q2) have been designed to provide optimal power  
efficiency.  
„
Max r

DS(on)

= 4.7 m
Ω
at V

GS

= 10 V, I

D

= 17.5 A  
„
Max r

DS(on)

= 5.5 m
Ω
at V

GS

= 4.5 V, I

D

= 16 A  
Q2: N-Channel  
„
Max r

DS(on)

= 1.0 m
Ω
at V

GS

= 10 V, I

D

= 38 A  
„
Max r

DS(on)

= 1.2 m
Ω
at V

GS

= 4.5 V, I

D

= 35 A  
Applications  
„
Low inductance packaging shortens rise/fall times, resulting in  
lower switching losses  
„
Computing  
„
MOSFET integration enables optimum layout for lower circuit  
inductance and reduced switch node ringing  
„
Communications  
„
General Purpose Point of Load  
„
Notebook VCORE  
„
RoHS Compliant  
G1  
Pin 1  
D1  
D1  
D1  
Q2  
D1  
S2  
D1  
5
6
7
8
4
3
2
1
Pin 1  
PHASE  
(S1/D2)  
PHASE  
D1  
D1  
S2  
S2  
G2  
G2  
S2  
S2  
S2  
G1  
Q1  
Bottom  
Top  
Power 56  
MOSFET Maximum Ratings
T

A

= 25 °C unless otherwise noted  
Symbol  
V

DS  

V

GS  

Parameter  
Q1  
Q2  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
25  
±12  
30  
25  
±12  
49  
V
V
(Note 4)  
T

C

= 25 °C  
T

C

= 25 °C  
T

A

= 25 °C  
Drain Current  
-Continuous (Package
 
limited)  
-Continuous (Silicon
 
limited)  
-Continuous  
76  
17.5

1a  

211  
I

D  

A
38

1b  

150  
135  
2.5

1b  

1.0

1d  

-Pulsed  
70  
E

AS  

Single Pulse Avalanche Energy  
(Note 3)  
T

A

= 25 °C  
T

A

= 25 °C  
29  
mJ  
W
Power Dissipation for Single Operation  
Power Dissipation for Single Operation  
Operating and Storage Junction
T
e
mperature Range  
2.2

1a  

1.0

1c  

P

D  

T

J

, T

STG  

-55 to +150  
°C  
Thermal Characteristics  
R

θ
JA  

R

θ
JA  

R

θ
JC  

Thermal Resistance, Junction to Ambient  
57

1a  

125

1c  

3.0  
50

1b  

120

1d  

1.7  
Thermal Resistance, Junction to Ambient  
Thermal Resistance, Junction to Case  
°C/W  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
13 ”  
Tape Width  
Quantity  
08OD  
06OD  
FDMS3620S  
Power 56  
12 mm  
3000 units  
©2012 Fairchild Semiconductor Corporation  
FDMS3620S Rev.C1  
1

Electrical Characteristics
T

J

= 25 °C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Type  
Min  
Typ  
Max  
Units  
Off Characteristics  
I
I

D

= 250
μ
A, V

GS

= 0 V  

D

= 1 mA, V

GS

= 0 V  
Q1  
Q2  
25  
25  
BV

DSS  

Drain to Source Breakdown Voltage  
V
Δ
BV

DSS  

Δ
T

J  

Breakdown Voltage
T
e
mperature  
Coefficient  
I

D

= 250
μ
A, referenced to 25 °C  

D

= 10 mA, referenced to 25 °C  
Q1  
Q2  
12  
16  
mV/°C  
I
Q1  
Q2  
1
500  
μ
A  
μ
A  
I

DSS  

I

GSS  

Zero Gate Voltage Drain Current  
Gate to Source Leakage Current  
V

DS

= 20 V, V

GS

= 0 V  
V

GS

= 12/-8 V, V

DS

= 0 V  
Q1  
Q2  
±100  
±100  
nA  
nA  
On Characteristics  
V
V

GS

= V

DS

, I

D

= 250
μ
A  

GS

= V

DS

, I

D

= 1 mA  
Q1  
Q2  
0.8  
1.1  
1.2  
1.3  
2.0  
2.2  
V

GS(th)  

Gate to Source Threshold Voltage  
V
Δ
V

GS(th)  

Δ
T

J  

Gate to Source Threshold Voltage  
T
e
mperature Coefficient  
I

D

= 250
μ
A, referenced to 25 °C  

D

= 10 mA, referenced to 25 °C  
V

GS

= 10 V,
 
I

D

= 17.5 A  
Q1  
Q2  
-4  
-4  
mV/°C  
I
3.8  
4.4  
5.4  
4.7  
5.5  
7.0  
V
V

GS

= 4.5 V,
 
I

D

= 16 A  

GS

= 10
V
,
I

D

= 17.5 A,T

J

=125 °C  
Q1  
Q2  
r

DS(on)  

Drain to Source On Resistance  
m
Ω  
V
V
V

GS

= 10 V,
 
I

D

= 38 A  

GS

= 4.5 V,
 
I

D

= 35 A  

GS

= 10 V, I

D

=38 A ,T

J

=125 °C  
0.8  
0.9  
1.1  
1.0  
1.2  
1.5  
V
V

DS

= 5 V,
 
I

D

= 17.5 A  

DS

= 5 V,
 
I

D

= 38 A  
Q1  
Q2  
100  
271  
g

FS  

Forward Transconductance  
S
Dynamic Characteristics  
Q1  
Q2  
1570  
6861  
Q1:  
C

iss  

C

oss  

C

rss  

R

g  

Input Capacitance  
pF  
pF  
pF  
Ω
V

DS

= 13 V, V

GS

= 0
V
, f = 1
M
HZ  
Q1  
Q2  
448  
1828  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
Q2:  
V

DS

= 13 V, V

GS

= 0
V
, f = 1
M
HZ  
Q1  
Q2  
61  
232  
Q1  
Q2  
0.1  
0.1  
0.4  
0.6  
3.3  
3.5  
Switching Characteristics  
Q1  
Q2  
7
14  
t

d(on)  

t

r  

t

d(off)  

t

f  

Turn-On Delay Time  
Rise Time  
ns  
ns  
Q1:  
Q1  
Q2  
2
7
V

DD

= 13
V
,
I

D

= 17.5 A, R

GEN

= 6
Ω  
Q1  
Q2  
23  
41  
Q2:  
Turn-Off Delay Time  
Fall Time  
ns  
V

DD

= 13 V, I

D

= 38 A, R

GEN

= 6
Ω  
Q1  
Q2  
2
5
ns  
Q1  
Q2  
26  
106  
Q

g  

T
o
tal Gate Charge  
T
o
tal Gate Charge  
Gate to Source Gate Charge  
Gate to Drain “Miller” Charge  
V

GS

= 0
 
V to 10 V  
Q1  
nC  
nC  
nC  
nC  
V

DD

= 13
V
,  
Q1  
Q2  
12  
50  
Q

g  

V

GS

= 0
 
V to 4.5 V  
I

D

= 17.5 A  
Q1  
Q2  
3.3  
12.9  
Q2  
V

DD

= 13
V
,  
Q

gs  

Q

gd  

Q1  
Q2  
2.7  
12  
I

D

= 38 A  
©2012 Fairchild Semiconductor Corporation  
FDMS3620S Rev.C1  
2

Electrical Characteristics
T

J

= 25 °C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Type  
Min  
Typ  
Max  
Units  
Drain-Source Diode Characteristics  
V
V

GS

= 0 V, I

S

= 17.5 A  

GS

= 0 V, I

S

= 38
 
A  
(Note 2)
 
Q1  
(Note 2)
 
Q2  
0.8  
0.8  
1.2  
1.2  
V

SD  

t

rr  

Source to Drain Diode Forward Voltage  
Reverse Recovery Time  
V
Q1  
Q2  
23  
38  
Q1  
ns  
nC  
I

F

= 17.5 A, di/dt = 100 A/
μ
s  
Q2  
I

F

= 38 A, di/dt = 300 A/
μ
s  
Q1  
Q2  
9
54  
Q

rr  

Reverse Recovery Charge  
Notes:  
2
1.R  
is determined with the device mounted on a 1 in
 
pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R  
is guaranteed by design while R  
is determined by  
θ
JA  
θ
JC  
θ
CA  
the user’s board design.  
c. 50 °C/W when mounted on  
a 1 in
 
pad of
 
2 oz
 
copper  
a. 57 °C/W when mounted on  
a 1 in
 
pad of
 
2 oz
 
copper  
2
2
b. 125 °C/W when mounted on
 
a  
minimum pad of 2 oz copper  
d. 120 °C/W when mounted on
 
a  
minimum pad of 2 oz copper  
2 Pulse Test: Pulse Width < 300
μ
s, Duty cycle < 2.0%.  
o
3. Q1 :E
 
of 29
 
mJ is based on starting T
 
= 25
 
C; N-ch: L = 0.3
 
mH, I
 
= 14
 
A, V
 
= 23 V, V
 
= 10 V. 100% test at L= 0.1 mH, I
 
= 20 A.  
AS  
J
AS  
DD  
GS  
AS  
o
Q2: E
 
of 135 mJ is based on starting T
 
= 25
 
C; N-ch: L = 0.3 mH, I
 
= 30 A, V
 
= 23 V, V
 
= 10 V. 100% test at L=
 
0.1 mH, I
 
= 44 A.  
AS  
J
AS  
DD  
GS  
AS  
4. As an N-ch device, the negative Vgs rating is for low duty cycle pulse occurrence only.
 
No continuous rating is implied.  
©2012 Fairchild Semiconductor Corporation  
FDMS3620S Rev.C1  
3

Typical Characteristics (Q1 N-Channel)
T

J

= 25°C unless otherwise noted  
70  
60  
50  
40  
30  
20  
10  
0
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
V

GS

= 10 V  
V

GS

= 4.5 V  
PULSE DURATION = 80
μ
s  
DUTY CYCLE = 0.5% MAX  
V

GS

= 2.5 V  
V

GS

= 3.5 V  
V

GS

= 3 V  
V

GS

= 3 V  
V

GS

= 2.5 V  
PULSE DURATION = 80
μ
s  
DUTY CYCLE = 0.5% MAX  
V

GS

= 4.5 V
 
V

GS

= 10 V  
V

GS

= 3.5 V  
0.0  
0.3  
0.6  
0.9  
1.2  
1.5  
0
10  
20  
30  
40  
50  
60  
70  
V

DS

,
DRAIN TO SOURCE VOLTAGE (V)  
I

D

,
DRAIN CURRENT (A)  
Figure 1.
 
On Region Characteristics  
Figur
e
2
. N
 
o r m a l i z e d O n – R e s i s t a n c e  
vs Drain Current and Gate Voltage  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
20  
16  
12  
8
I

D

= 17.5 A  
PULSE DURATION = 80
μ
s  
DUTY CYCLE = 0.5% MAX  
I

D

= 17.5 A  
V

GS

= 10 V  
T

J

= 125

o

C  
4
T

J

= 25

o  

C
0
-75 -50 -25  
0
25 50 75
 
100 125 150  
2
3
4
5
6
7
8
9
10  
T

J

,
JUNCTION TEMPERATURE
(

o

C
)  
V

GS

,
GATE TO SOURCE VOLTAGE (V)  
Figure 3. Normalized On Resistance  
vs Junction Temperature  
Figur
e
4
. On-Resistance
 
vs Gate to  
Source Voltage  
70  
70  
PULSE DURATION = 80
μ
s  
V

GS

= 0 V  
DUTY CYCLE = 0.5% MAX  
60  
50  
40  
30  
20  
10  
0
10  
1
V

DS

= 5 V  
T

J

= 150

o  

C
T

J

= 25

o

C  
T

J

= 150

o  

C
0.1  
T

J

= 25

o  

C
T

J

= -55

o  

C
T

J

= -55

o  

C
0.01  
0.001  
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
V

GS

, GATE TO SOURCE VOLTAGE (V)  
V

SD

, BODY DIODE FORWARD VOLTAGE (V)  
Figure 5.
 
Transfer Characteristics  
Figur
e
6
. Source
 
to Drain Diode  
Forward Voltage vs Source Current  
©2012 Fairchild Semiconductor Corporation  
FDMS3620S Rev.C1  
4

Typical Characteristics (Q1 N-Channel)
T

J

= 25°C unless otherwise noted  
10  
8
2000  
1000  
I

D

= 17.5 A  
C

iss  

V

DD

= 10 V  
V

DD

=
15 V  
V

DD

= 13 V  
C

oss  

6
100  
4
C

rss  

2
f = 1 MHz  
= 0 V  
V
GS  
0
10  
0.1  
1
10  
30  
0
4
8
12  
16  
20  
24  
28  
V

DS

, DRAIN TO SOURCE VOLTAGE (V)  
Q ,
 
GATE CHARGE (nC)  
g
Figure 7.
 
Gate Charge Characteristics  
Figur
e
8
. C
 
a p a c i t a n c e v s D r a i n  
to Source Voltage  
30  
80  
70  
60  
50  
40  
30  
20  
10  
0
V

GS

= 10 V  
10  
T

J

= 25

o

C  
T

J

= 100

o

C  
V

GS

= 4.5 V  
T

J

= 125

o  

C
Limited by Package  
R

θ
JC

= 3.0

o

C/W  
1
0.001  
0.01  
0.1  
1
10  
50  
25  
50  
75  
100  
125  
150  
T

C

,
CASE TEMPERATURE
(

o

C
)  
t

AV

, TIME IN AVALANCHE (ms)  
Figur
e
9
. U
 
n c l a m p e d I n d u c t i v e  
Switching Capability  
Figur
e
1
0. Maximum Continuous Drain  
Current vs
 
Case Temperature  
100  
10  
1000  
SINGLE PULSE  

θ
JA

= 125

o

C/W  
R
100
μ
s  
100  
10  
1 ms  
10 ms  
1
THIS AREA IS  
LIMITED BY r  
DS
(
on
)  
100 ms  
SINGLE PULSE  
T

J

= MAX RATED  
1s  
0.1  
10s  
DC  
R

θ
JA

= 125

o

C/W  

A

= 25

o

C  
1
T
0.01  
0.5  
10

-4  

10

-3  

10

-2  

t, PULSE WIDTH (sec)  
10

-1  

1
10  
0.01  
0.1  
1
10  
100  
100 1000  
V

DS

, DRAIN to SOURCE VOLTAGE (V)  
Figure 11.
 
Forward Bias Safe  
Operating Area  
Figur
e
1
2. Single Pulse
 
Maximum  
Power Dissipation  
©2012 Fairchild Semiconductor Corporation  
FDMS3620S Rev.C1  
5

Typical Characteristics (Q1 N-Channel)
T

J

= 25°C unless otherwise noted  
2
DUTY CYCLE-DESCENDING ORDER  
1
D = 0.5  
0.2  
0.1  
0.05  
0.1  
0.01  
0.02  
0.01  
P
DM  
t
1
SINGLE PULSE  

θ
JA

= 125

o

C/W  
t
2
NOTES:  
DUTY FACTOR: D = t /t  
R
1
2
(Note 1b)  
PEAK T
 
= P  
J
x Z  
x R  
+ T  
θ
JA
A  
DM  
θ
JA  
0.001  
10

-4  

10

-3  

10

-2  

10

-1  

t, RECTANGULAR PULSE DURATION (sec)  
1
10  
100  
1000  
Figure 13.
 
Junction-to-Ambient Transient Thermal Response Curve  
©2012 Fairchild Semiconductor Corporation  
FDMS3620S Rev.C1  
6

Typical Characteristics (Q2 N-Channel)
T

J

= 25 °C unless otherwise noted  
150  
120  
90  
60  
30  
0
6
5
4
3
2
1
0
V

GS

= 10 V  
V

GS

= 4.5 V  
V

GS

= 3.5 V  
V

GS

= 3 V  
PULSE DURATION = 80
μ
s  
DUTY CYCLE = 0.5% MAX  
V

GS

= 2.5 V  
V

GS

= 2.5 V  
V

GS

= 3 V  
V

GS

= 3.5 V  
PULSE DURATION = 80
μ
s  
DUTY CYCLE = 0.5% MAX  
V

GS

= 10 V  
120 150  
V

GS

= 4.5 V  
60  
0
30  
90  
0
0.3  
0.6  
0.9  
I

D

,
DRAIN CURRENT (A)  
V

DS

,
DRAIN TO SOURCE VOLTAGE (V)  
Figure 14.
 
On-Region Characteristics  
Figure 15. Normalized on-Resistance vs Drain  
Current and Gate
 
Voltage  
1.6  
5
I

D

= 38 A  
PULSE DURATION = 80
μ
s  
DUTY CYCLE = 0.5% MAX  
V

GS

= 10 V  
1.4  
1.2  
1.0  
0.8  
0.6  
4
I

D

= 38 A  
3
2
T

J

= 125

o  

C
1
0
T

J

= 25

o  

C
2
4
6
8
10  
-75 -50 -25  
0
25 50 75
 
100 125 150  
T

J

,
JUNCTION TEMPERATURE
(

o

C
)  
V

GS

,
GATE TO SOURCE VOLTAGE (V)  
Figure 17. On-Resistance vs Gate to  
Source Voltage  
Figure 16. Normalized On-Resistance  
vs Junction Temperature  
150  
200  
PULSE DURATION = 80
μ
s  
DUTY CYCLE = 0.5% MAX  
V

GS

= 0 V  
100  
10  
1
120  
90  
60  
30  
0
V

DS

= 5 V  
T

J

= 150

o  

C
T

J

= 150

o  

C
T

J

= 25

o

C  
T

J

= 25

o  

C
T

J

= -55

o  

C
T

J

= -55

o  

C
1.0  
1.5  
2.0  
2.5  
3.0  
0
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
V

GS

, GATE TO SOURCE VOLTAGE (V)  
V

SD

, BODY DIODE FORWARD VOLTAGE (V)  
Figure 18. Transfer Characteristics  
Figure 19. Source to Drain Diode  
Forward Voltage vs Source Current  
©2012 Fairchild Semiconductor Corporation  
FDMS3620S Rev.C1  
7

Typical Characteristics (Q2 N-Channel)
T

J

= 25°C unless otherwise noted  
10  
8
10000  
1000  
100  
I

D

= 38 A  
C

iss  

C

oss  

6
V

DD

= 13 V  
V

DD

= 15 V  
V

DD

= 10 V  
4
C

rss  

2
f = 1 MHz  
= 0 V  
V
GS  
10  
0.1  
0
0
20  
40  
60  
80  
100  
120  
1
10  
30  
V

DS

, DRAIN TO SOURCE VOLTAGE (V)  
Q

g

, GATE CHARGE (nC)  
Figure 21. Capacitance vs Drain  
to Source Voltage  
Figure 20. Gate Charge Characteristics  
210  
180  
150  
120  
90  
100  
V

GS

= 10 V  
T

J

= 25

o

C  
V

GS

= 4.5 V  
T

J

= 100

o

C  
10  
60  
30  
T

J

= 125

o  

C
R

θ
JC

= 1.7

o

C/W  
0
25  
1
0.001  
0.01  
0.1  
1
10  
100  
1000  
50  
75  
100  
125  
150  
T

C

, CASE
TEMPERATURE
(

o

C
)  
t

AV

, TIME IN AVALANCHE (ms)  
Figure 22. Unclamped Inductive  
Switching Capability  
Figure 23. Maximum Continuous Drain  
Current vs
 
Case Temperature  
1000  
100  
10  
10000  
SINGLE PULSE  
1000  
100 us  
R

θ
JA

= 120

o

C/W  
T

A

= 25

o

C  
100  
10  
1
1 ms  
THIS AREA IS  
LIMITED BY r

DS(on)  

10 ms  
100 ms  
1 s  
1
SINGLE PULSE  
T

J

= MAX RATED  
0.1  
0.01  
10 s  
DC  
R

θ
JA

= 120

o

C/W  

A

= 25

o

C  
T
0.1  
10

-4  

10

-3  

10

-2  

t, PULSE WIDTH (s)  
10

-1  

1
10  
0.01  
0.1  
1
10  
100  
100 1000  
V

DS

, DRAIN to SOURCE VOLTAGE (V)  
Figure 24. Forward Bias Safe  
Operating Area  
Figure 25. Single Pulse Maximum Power  
Dissipation  
©2012 Fairchild Semiconductor Corporation  
FDMS3620S Rev.C1  
8

Typical Characteristics (Q2 N-Channel)
T

J

= 25 °C unless otherwise noted  
2
1
DUTY CYCLE-DESCENDING ORDER  
D = 0.5  
0.2  
0.1  
0.1  
0.05  
0.02  
0.01  
P
DM  
0.01  
t
1
t
2
SINGLE PULSE  
R

θ
JA

= 120

o

C/W  
NOTES:  
DUTY FACTOR: D = t /t  
0.001  
0.0001  
1
2
PEAK T
 
= P  
J
x Z  
x R  
+ T  
θ
JA
A  
DM  
θ
JA  
Note 1d  
10

-4  

10

-3  

10

-2  

10

-1  

t, RECTANGULAR PULSE DURATION (s)  
1
10  
100  
1000  
Figure 26. Junction-to-Ambient Transient Thermal Response Curve  
©2012 Fairchild Semiconductor Corporation  
FDMS3620S Rev.C1  
9

Typical Characteristics (Q2 N-Channel)  
SyncFET Schottky body diode  
Characteristics  
Schottky barrier diodes exhibit significant leakage at high tem-  
perature and high reverse voltage. This will increase the power  
in the device.  
Fairchild’s SyncFET process embeds a Schottky diode in parallel  
with PowerTrench MOSFET. This diode exhibits similar  
characteristics to a discrete external Schottky diode in parallel  
with  
a MOSFET. Figure 27 shows the reverse recovery  
characteristic of the FDMS3620S.  
10

-2  

45  
40  
35  
30  
25  
20  
15  
10  
5
T

J

= 125

o  

C
10

-3  

10

-4  

10

-5  

10

-6  

T

J

= 100

o  

C
di/dt = 300 A/
μ
s  
T

J

= 25

o  

C
0
-5  
0
5
10  
15  
20  
25  
0
50  
100  
150  
200  
250  
300  
350  
TIME (ns)  
V

DS

, REVERSE VOLTAGE (V)  
Figure 28. SyncFET body diode reverse  
leakage versus
 
drain-source voltage  
Figure 27. FDMS3620S SyncFET body  
diode reverse recovery characteristic  
©2012 Fairchild Semiconductor Corporation  
FDMS3620S Rev.C1  
10  

4.00  
C
L
5.10  
4.90  
0.10 C  
A
1.27 TYP  
0.65 TYP  
(2X)  
PKG  
B
C
L
8
5
8
6
7
5
0.63  
2.15  
2.52  
1.60  
KEEP OUT AREA  
6.25  
5.90  
C
PKG  
C
L
0.00  
L
4.16  
1.21  
2.13  
2.31  
3.15  
1
4
0.10 C  
(2X)  
2
4
1
3
PIN # 1  
INDICATOR  
0.63  
0.59  
TOP VIEW  
3.18  
5.10  
SEE  
DETAIL A  
RECOMMENDED LAND PATTERN  
FOR SAWN / PUNCHED TYPE  
SIDE VIEW  
0.10  
0.05  
C A B  
C
0.10 C  
3.16  
2.80  
0.65  
0.38  
0.70  
0.36  
8X  
0.45  
0.25  
(6X)  
0.08 C  
1.34  
1.12  
C
0.05  
0.00  
1
2
3
0.35  
0.15  
4
1.10  
0.90  
SEATING  
PLANE  
0.66±.05  
(SCALE: 2X)  
2.25  
2.05  
4.08  
3.70  
1.02  
0.82  
0.65  
0.38  
8
7
6
5
0.44  
0.24  
0.61  
0.31

(8X)  

1.27  
3.81  
BOTTOM VIEW  

5.10  
4.90  
0.10 C  
(2X)  
SEE  
0.35  
0.15  
PKG  
DETAIL B  
C
L
5
8
0.28  
0.08  
10°  
6.25  
5.90  
5.90  
5.70  
PKG  
C
L
(SCALE: 2X)  
0.10 C  
1
4
(2X)  
0.41  
0.21  
(8X)  
TOP VIEW  
5.00  
4.80  
SEE  
0.10 C  
0.08 C  
DETAIL C  
0.35  
0.15  
8X  
C
SIDE VIEW  
SEATING  
PLANE  
1.10  
0.90  
(SCALE: 2X)  
0.10  
0.05  
C A B  
3.16  
2.80  
0.70  
0.36  
0.65  
0.38  
C
0.45  
0.25  
(6X)  
1
2
3
1.34  
1.12  
4
NOTES: UNLESS OTHERWISE SPECIFIED  
A) PACKAGE STANDARD REFERENCE:  
0.66±.05  
JEDEC REGISTRATION, MO-240, VARIATION AA.  
B) ALL
 
DIMENSIONS ARE IN MILLIMETERS.  
C) DIMENSIONS
 
DO NOT INCLUDE BURRS OR  
MOLD FLASH. MOLD FLASH OR BURRS DOES  
NOT EXCEED 0.10MM.  
2.25  
2.05  
4.08  
3.70  
D) DIMENSIONING
 
AND TOLERANCING PER  
ASME Y14.5M-1994.  
E) IT
 
IS RECOMMENDED TO HAVE NO TRACES  
OR VIAS WITHIN THE KEEP OUT AREA.  
F) DRAWING
 
FILE NAME: PQFN08EREV6.  
G) FAIRCHILD SEMICONDUCTOR  
1.02  
0.82  
0.65  
0.38  
6
8
7
5
0.61  
0.44  
0.24  
(8X)  
0.31  
1.27  
3.81  
BOTTOM VIEW  

ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent  
coverage may be accessed at

. ON Semiconductor reserves the right to make changes without further notice to any products herein.  
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability  
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,  
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer  
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not  
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification  
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized  
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and  
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such  
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This  
literature is subject to all applicable copyright laws and is not for resale in any manner.  
PUBLICATION ORDERING INFORMATION  
LITERATURE FULFILLMEN
T
:  
N. American Technical Support
: 800
−
282
−
9855
T
o
ll Free  
USA/Canada  
Europe, Middle East and Africa Technical Support:  
Phone: 421 33 790 2910  
Japan Customer Focus Center  
Phone: 81
−
3
−
5817
−
1050  
ON Semiconductor Website
:

Literature Distribution Center for ON Semiconductor  
19521 E. 32nd Pkwy, Aurora, Colorado 80011 USA  
Phone
: 303
−
675
−
2175 or 800
−
344
−
3860
T
o
ll Free USA/Canada  
Fax
: 303
−
675
−
2176 or 800
−
344
−
3867
T
o
ll Free USA/Canada  
Email
: orderlit@onsemi.com  
For additional information, please contact your local  
Sales Representative  
©
Semiconductor Components Industries, LLC