onsemi-FDN339AN

Part #onsemi-FDN339AN
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onsemi-FDN339AN
November 1999  
FDN339AN  
N-Channel 2.5V Specified PowerTrench
 
MOSFET  
General Description  
Features  
This N-Channel 2.5V specified MOSFET
 
is produced  
using Fairchild Semiconductor’s advanced PowerTrench  
process that has been especially tailored to minimize the  
on-state resistance and yet maintain low gate charge for  
superior switching performance.  
•
3 A, 20
V
.
R

DS(ON)

= 0.035
Ω
@ V

GS

= 4.5 V  
R

DS(ON)

= 0.050
Ω
@ V

GS

= 2.5 V.  
•
Low gate charge (7nC typical).  
Applications  
•
High performance trench technology for extremely  
low R

DS(ON)  

.
•
DC/DC converter  
•
Load switch  
•
High power and current handling capability.  
D
D
S
G
S
SuperSOT

T
M

-3  
G
Absolute Maximum Ratings
 

T

A

= 25
°
C unless otherwise noted  

Symbol  
Parameter  
Ratings  
Units  
V

DSS  

V

GSS  

I

D  

Drain-Source Voltage  
Gate-Source Voltage  
20  
V
V
A
8
±
Drain Current
 
– Continuous  
– Pulsed  
3
(Note 1a)  
20  
0.5  
P

D  

Power Dissipation for Single Operation  
W
(Note 1a)  
(Note 1b)  
0.46  
T

J

, T

stg  

Operating and Storage Junction Temperature Range  
-55 to +150  
C
°
Thermal Characteristics  
Thermal Resistance, Junction-to-Ambient  
250  
75  
R

θ  

(Note 1a)  
(Note 1)  
C/W  
C/W  
°
JA  
Thermal Resistance, Junction-to-Case  
R

θ  

°
JC  
Package Outlines and Ordering Information  
Device Marking  
Device  
Reel Size  
Tape Width  
Quantity  
339  
FDN339AN  
7
’’  
8mm  
3000 units  
1999 Fairchild Semiconductor Corporation  
FDN339AN Rev.
 
C  

Electrical Characteristics  
T

A

= 25
°
C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min Typ Max
 
Units  
Off Characteristics  
BV

DSS  

Drain-Source Breakdown Voltage  
20  
V
µ
A
V

GS

= 0 V, I

D

= 250  
Breakdown Voltage Temperature  
Coefficient  
14  
∆
DSS  
µ
°
°
mV/ C  
BV  
∆
I

D

= 250
 
A,Referenced to 25 C  
T

J  

I

DSS  

I

GSSF  

Zero Gate Voltage Drain Current  
V

DS

= 16 V, V

GS

= 0 V  
V

GS

= 8 V, V

DS

= 0 V  
1
µ
A
Gate-Body Leakage Current,  
Forward  
100  
nA  
I

GSSR  

Gate-Body Leakage Current,  
Reverse  
V

GS

= -8 V, V

DS

= 0 V  
-100  
1.5  
nA  
On Characteristics
 
(Note 2)  
V

GS(th)  

Gate Threshold Voltage  
0.4  
10  
0.85  
-3  
V
µ

DS

= V

GS

, I

D

= 250
 
A  
V
Gate Threshold Voltage  
Temperature Coefficient  
∆
GS(th)  
µ
°
°
V
I

D

= 250
 
A,Referenced to 25 C  
mV/ C  
∆
T

J  

R

DS(on)  

Static Drain-Source  
On-Resistance  
V

GS

= 4.5 V, I

D

= 3 A  
V

GS

= 4.5 V, I

D

= 3 A, T

J

=125 C  
V

GS

= 2.5 V, I

D

= 2.4 A  
V

GS

= 4.5 V, V

DS

= 5 V  
0.029 0.035  
0.040 0.061  
0.039 0.050  
Ω
°
I

D(on)  

g

FS  

On-State Drain Current  
A
S
Forward Transconductance  
V

DS

= 5 V, I

D

= 3 A  
11  
Dynamic Characteristics  
C

iss  

C

oss  

C

rss  

Input Capacitance  
V

DS

= 10 V, V

GS

= 0 V,  
700  
175  
85  
pF  
pF  
pF  
f = 1.0 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Switching Characteristics
 
(Note 2)  
t

d(on)  

t

r  

t

d(off)  

t

f  

Turn-On Delay Time  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
Total Gate Charge  
Gate-Source Charge  
Gate-Drain Charge  
V

DD

= 10 V, I

D

= 1 A,  
8
10  
18  
5
16  
18  
29  
10  
10  
ns  
ns  
Ω
V

GS

= 4.5 V, R

GEN

= 6  
ns  
ns  
Q

g  

V

DS

= 10 V, I

D

= 3 A,  
7
nC  
nC  
nC  
V

GS

= 4.5 V  
Q

gs  

Q

gd  

1.2  
1.9  
Drain-Source Diode Characteristics and Maximum Ratings  
I

S  

Maximum Continuous Drain-Source Diode Forward Current  
0.42  
1.2  
A
V
(Note  
V

SD  

Drain-Source Diode Forward Voltage
 
V

GS

= 0 V, I

S

= 0.42 A  
0.65  
2)  
Notes:  
1:
R

θ
JA

is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting  
surface of the drain pins. R

θ
JC

is guaranteed by design while R

θ
C
A

is determined by the user’s board design.  
b) 270
°
C/W on a minimum  
mounting pad of 2 oz. Cu.  
a) 250
°
C/W when  
mounted on a 0.02 in

2  

Pad of 2 oz. Cu.  
Scale  
1 : 1 on
 
letter size paper  
2:
Pulse
T
e
st: Pulse Width
≤
300
µ
s, Duty Cycle
≤
2.0%  
FDN339AN Rev.
 
C  

Typical Characteristics  
20  
2
1.8  
1.6  
1.4  
1.2  
1
V

GS

= 4.5V  
2.5V  
3.0V  
16  
V

GS

= 2.0V  
12  
2.0V  
2.5V  
8
4
0
3.0V  
3.5V  
4.0V  
4.5V  
16  
1.5V  
0.8  
0
4
8
12  
20  
0
0.5  
1
1.5  
2
2.5  
3
I

D

, DRAIN CURRENT (A)  
V

DS

, DRAIN TO SOURCE VOLTAGE (V)  
Figure 1. On-Region Characteristics.  
Figure 2. On-Resistance Variation  
with Drain Current and Gate Voltage.  
0.1  
1.6  
1.4  
1.2  
1
I

D

= 3A  

GS

= 4.5V  
I

D

= 1.5A  
V
0.08  
0.06  
0.04  
0.02  
0
T

A

= 125

o

C  
T

A

= 25

o

C  
0.8  
0.6  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
1
2
3
4
5
T

J

, JUNCTION TEMPERATURE (

o

C)  
V

GS

, GATE TO SOURCE VOLTAGE (V)  
Figure 3. On-Resistance Variation  
with Temperature.  
Figure 4. On-Resistance Variation  
with Gate-to-Source Voltage.  
100  
10  
1
20  
T

A

= -55

o

C  
V

GS

= 0V  
V

DS

= 5V  
25

o

C  
125

o

C  
16  
12  
8
T

A

= 125

o

C  
25

o

C  
0.1  
-55

o

C  
0.01  
0.001  
4
0.0001  
0
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
0.5  
1
1.5  
2
2.5  
3
V

SD

, BODY DIODE FORWARD VOLTAGE (V)  
V

GS

, GATE TO SOURCE VOLTAGE (V)  
Figure 5. Transfer Characteristics.  
Figure 6. Body Diode Forward Voltage  
Variation with Source Current  
and Temperature.  
FDN339AN Rev.
 
C  

Typical Characteristics
 
(continued)  
5
1000  
800  
600  
400  
200  
0
V

DS

= 5V  
f = 1MHz  

GS

= 0 V  
I

D

= 3A  
V
10V  
4
15V  
C

ISS  

3
2
1
0
C

OSS  

C

RSS  

0
2
4
6
8
10  
0
4
8
12  
16  
20  
Q

g

, GATE CHARGE (nC)  
V

DS

, DRAIN TO SOURCE VOLTAGE (V)  
Figure 7. Gate Charge Characteristics.  
Figure 8. Capacitance Characteristics.  
100  
10  
20  
16  
12  
8
SINGLE PULSE  
R

θ

JA

=270

o

C/W  
T

A

=25

o

C  
R

DS(ON)

LIMIT  
1ms  
10ms  
100ms  
1
1s  
10s  
DC  
V

GS

= 4.5V  
SINGLE PULSE  
R

θ
JA

= 270

o

C/W  
TA = 25

o

C  
0.1  
0.01  
4
0
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
0.1  
1
10  
100  
V

DS

, DRAIN-SOURCE VOLTAGE (V)  
SINGLE PULSE TIME (SEC)  
Figure 9. Maximum Safe Operating Area.  
Figure 10. Single Pulse Maximum  
Power Dissipation.  
1
D = 0.5  
0.5  
0.2  
0.2  
R
(t) = r(t)
 
* R  
JA  
θ
JA  
θ
0.1  
R
= 270
°
C/W  
JA  
θ
0.1  
0.05  
0.05  
0.02  
P(pk)  
0.02  
0.01  
0.01  
t

1  

Single Pulse  
t

2  

0.005  
T –
 
T =
 
P *
 
R  
(t)  
JA  
J
A
θ
Duty Cycle, D = t

1

/
t

2  

0.002  
0.001  
0.0001  
0.001  
0.01  
0.1  
, TIME (sec)  
1
10  
100  
300  
t
1
Figure 11. Transient Thermal Response Curve.  
Thermal characterization performed using the conditions described in Note 1b.  
Transient themal response will change depending on the circuit board design.  
FDN339AN Rev.
 
C  

TRADEMARKS  
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is  
not intended to be an exhaustive list of all such trademarks.  
ACEx™  
HiSeC™  
SuperSOT™-8  
SyncFET™  
TinyLogic™  
UHC™  
Bottomless™  
CoolFET™  
CROSSVOLT™  
E

2

CMOS

TM  

FACT™  
ISOPLANAR™  
MICROWIRE™  
POP™  
PowerTrench  
QFET™  
VCX™  
QS™  
FACT Quiet Series™  
FAST  
FASTr™  
Quiet Series™  
SuperSOT™-3  
SuperSOT™-6  
GTO™  
DISCLAIMER  
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER  
NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILIT
Y
,
F
UNCTION OR DESIGN. FAIRCHILD  
DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT  
OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT  
RIGHTS, NOR THE RIGHTS OF OTHERS.  
LIFE SUPPORT POLICY  
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.  
As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant into  
the body, or (b) support or sustain life, or (c) whose  
failure to perform when properly used in accordance  
with instructions for use provided in the labeling, can be  
reasonably expected to result in significant injury to the  
user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
PRODUCT STATUS DEFINITIONS  
Definition of Terms  
Datasheet Identification  
Product Status  
Definition  
Advance Information  
Formative or  
In Design  
This datasheet contains the design specifications for  
product development. Specifications may change in  
any manner without notice.  
Preliminary  
First Production  
This datasheet contains preliminary data, and  
supplementary data will be published at a later date.  
Fairchild Semiconductor reserves the right to make  
changes at any time without notice in order to improve  
design.  
No Identification Needed  
Obsolete  
Full Production  
This datasheet contains final specifications. Fairchild  
Semiconductor reserves the right to make changes at  
any time without notice in order to improve design.  
Not In Production  
This datasheet contains specifications on a product  
that has been discontinued by Fairchild semiconductor.  
The datasheet is printed for reference information only.  
Rev. E