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February 2009  
FDS8842NZ  
N-Channel PowerTrench

®

MOSFET  
40 V, 14.9 A, 7.0 m
Ω  
Features  
General Description  
„
Max r

DS(on)

= 7.0 m
Ω
at V

GS

= 10
V
,
I

D

= 14.9 A  
„
Max r

DS(on)

= 11.6 m
Ω
at V

GS

= 4.5 V, I

D

= 11.6 A  
„
HBM ESD protection level of
 
4.4 kV typical(note 3)  
The FDS8842NZ has been designed to minimize losses in  
power conversion application. Advancements in both silicon and  
package technologies have been combined to offer the lowest  
r

DS(on)

while maintaining excellent switching performance.  
„
High performance trench technology for extremely low r

DS(on)  

and fast switching  
Applications  
„
Synchronous Buck for Notebook Vcore and Server  
„
Notebook Battery  
„
High power and current handling capability  
„
Termination is Lead-free and RoHS Compliant  
„
Load Switch  
D
D
D
G
D
D
D
D
S
S
G
SO-8  
S
S
D
S
Pin 1  
S
MOSFET Maximum Ratings
T

A

= 25 °C unless otherwise noted  
Symbol  
V

DS  

V

GS  

Parameter  
Ratings  
40  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current
 
-Continuous  
-Pulsed  
V
V
±20  
14.9  
I

D  

A
93  
E

AS  

P

D  

Single Pulse Avalanche Energy  
Power Dissipation  
(Note 4)  
(Note 1a)  
(Note 1b)  
253  
mJ  
W
T

A

= 25 °C  
T

A

= 25 °C  
2.5  
Power Dissipation  
1.0  
T

J

, T

STG  

Operating and Storage Junction
T
e
mperature Range  
-55 to +150  
°C  
Thermal Characteristics  
R

θ
JC  

R

θ
JA  

Thermal Resistance, Junction to Case  
Thermal Resistance, Junction to Ambient  
(Note 1)  
25  
50  
°C/W  
(Note 1a)  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
Tape Width  
12 mm  
Quantity  
FDS8842NZ  
FDS8842NZ  
SO8  
13 ’’  
2500 units  
1
©2009 Fairchild Semiconductor Corporation  
FDS8842NZ Rev.C  

Electrical Characteristics
T

J

= 25 °C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Units  
Off Characteristics  
BV

DSS  

Drain to Source Breakdown Voltage  
I

D

= 250
µ
A, V

GS

= 0 V  
40  
V
∆
BV

DSS  

∆
T

J  

Breakdown Voltage
T
e
mperature  
Coefficient  
I

D

= 250
µ
A, referenced to 25 °C  
35  
mV/°C  
I

DSS  

I

GSS  

Zero Gate Voltage Drain Current  
Gate to Source Leakage Current  
V

DS

= 32 V, V

GS

= 0 V  
V

GS

= ±20 V, V

DS

= 0 V  
1
µ
A  
µ
A  
±10  
On Characteristics  
V

GS(th)  

Gate to Source Threshold Voltage  
V

GS

= V

DS

, I

D

= 250
µ
A  
1.0  
1.9  
-6  
3.0  
V
∆
V

GS(th)  

∆
T

J  

Gate to Source Threshold Voltage  
T
e
mperature Coefficient  
I

D

= 250
µ
A, referenced to 25 °C  
mV/°C  
V

GS

= 10 V,
 
I

D

= 14.9 A  
5.6  
6.7  
8.9  
111  
7.0  
11.6  
11.1  
r

DS(on)  

g

FS  

Static Drain to Source On Resistance  
Forward Transconductance  
V

GS

= 4.5 V, I

D

= 11.6 A  
m
Ω  
V

GS

= 10 V,
 
I

D

= 14.9 A, T

J

=125 °C  
V

DS

= 5 V,
 
I

D

= 14.9 A  
S
Dynamic Characteristics  
C

iss  

C

oss  

C

rss  

R

g  

Input Capacitance  
2890  
340  
220  
0.8  
3845  
455  
pF  
pF  
pF  
Ω
V

DS

= 15 V, V

GS

= 0 V,  
f = 1 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
330  
f = 1 MHz  
Switching Characteristics  
t

d(on)  

t

r  

t

d(off)  

t

f  

Turn-On Delay Time  
Rise Time  
13  
7
23  
14  
54  
10  
73  
38  
ns  
ns  
V

DD

= 20 V, I

D

= 14.9 A,  
V

GS

= 10 V, R

GEN

= 6
Ω  
Turn-Off Delay Time  
Fall Time  
34  
5
ns  
ns  
Q

g  

T
o
tal Gate Charge  
T
o
tal Gate Charge  
Gate to Source Charge  
Gate to Drain “Miller” Charge  
V

GS

= 0 V to 10 V  
V

GS

= 0 V to 5 V  
52  
27  
8.6  
9.7  
nC  
nC  
nC  
nC  
V

DD

= 20
V
,  

D

= 14.9 A  
Q

g  

I
Q

gs  

Q

gd  

Drain-Source Diode Characteristics  
V

GS

= 0 V, I

S

= 14.9 A  
0.8  
0.7  
26  
1.2  
1.2  
42  
V

SD  

Source to Drain Diode
 
Forward Voltage  
V
V

GS

= 0 V, I

S

= 2.1 A  
t

rr  

Reverse Recovery Time  
ns  
I

F

= 14.9 A, di/dt = 100 A/
µ
s  
Q

rr  

Reverse Recovery Charge  
15  
27  
nC  
NOTES:  
2
1. R  
is determined with the device mounted on a 1 in
 
pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R  
is guaranteed by design while R
 
is determined by  
θ
CA  
θ
JA  
θ
JC  
the user’s board design.  
a) 50 °C/W when mounted on a  
1 in
 
pad of 2 oz copper.  
b) 125 °C/W when mounted on a  
minimum pad.  
2
2. Pulse Test: Pulse Width < 300
µ
s, Duty cycle < 2.0%.  
3. The diode connected between the gate and source servers only as protection against ESD. No gate overvoltage rating is implied.  
4. Starting T
 
= 25 °C,
 
L = 3 mH, I
 
= 13 A, V
 
= 40 V, V
 
= 10 V.  
J
AS  
DD  
GS  
©2009 Fairchild Semiconductor Corporation  
FDS8842NZ Rev.C  
2

Typical Characteristics
T

J

= 25 °C unless otherwise noted  
60  
5
4
3
2
1
0
V

GS

= 10 V  
PULSE DURATION = 80  
DUTY CYCLE = 0.5% MAX  
µ
s  
V

GS

= 3 V  
V

GS

= 6 V  
50  
40  
V

GS

= 4.5 V  
V

GS

= 3.5 V  
V

GS

= 3.5 V  
PULSE DURATION = 80  
DUTY CYCLE = 0.5% MAX  
µ
s  
30  
20  
10  
0
V

GS

= 4 V  
V

GS

= 4.5 V  
V

GS

= 10 V  
V

GS

= 4 V  
V

GS

= 6 V  
40  
V

GS

= 3 V  
0
0.3  
V

DS  

0.6  
0.9  
1.2  
1.5  
0
10  
20  
30  
50  
60  
,
DRAIN TO SOURCE VOLTAGE (V)  
I

D

,
DRAIN CURRENT (A)  
Figure 1.
 
On-Region Characteristics  
Figur
e
2
. N
 
o r m a l i z e d O n – R e s i s ta n c e  
vs Drain Current and Gate Voltage  
1.8  
20  
I

D

= 14.9 A  
V

GS

= 10 V  
PULSE DURATION = 80
µ
s  
DUTY CYCLE = 0.5% MAX  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
15  
10  
5
I

D

= 14.9 A  
T

J

= 125

o

C  
T

J

= 25

o

C  
0
-75 -50 -25  
T

J  

0
25 50 75
 
100 125 150  
2
4
6
8
10  
,
JUNCTION TEMPERATURE
( )  

o

C  
V

GS

,
GATE TO SOURCE VOLTAGE (V)  
F i gu re 3 .
 
N orma li zed
 
On – Res is ta nc e  
vs Junction Temperature  
Figur
e
4
. On-Resistance
 
vs Gate to  
Source Voltage  
60  
50  
40  
30  
20  
10  
0
60  
10  
PULSE DURATION = 80
µ
s  
DUTY CYCLE = 0.5% MAX  
V

GS

= 0 V  
V

DS

= 5 V  
T

J

= 150
 

o

C  
T

J

= 25

o  

C
T

J

= 150

o  

T

J

= 25

o  

T

J

= -55

o

C  
C
1
C
T

J

= -55

o  

C
0.1  
0.2  
0
1
2
3
4
0.4  
0.6  
0.8  
1.0  
1.2  
V

GS

, GATE TO SOURCE VOLTAGE (V)  
V

SD

, BODY DIODE FORWARD VOLTAGE (V)  
Figure 5.
 
Transfer Characteristics  
Figur
e
6
. Source
 
to Drain Diode  
Forward Voltage vs Source Current  
©2009 Fairchild Semiconductor Corporation  
FDS8842NZ Rev.C  
3

Typical Characteristics
T

J

= 25 °C unless otherwise noted  
5000  
1000  
10  
I

D

= 14.9 A  
C

iss  

8
V

DD

= 15 V  
6
V

DD

= 20 V  
V

DD

= 25 V  
4
C

oss  

2
0
f = 1 MHz  
= 0 V  
C

rss  

V
GS  
100  
0.1  
1
10  
40  
0
10  
20  
30  
40  
50  
60  
V

DS

, DRAIN TO SOURCE VOLTAGE (V)  
Q ,
 
GATE CHARGE (nC)  
g
Figure 7.
 
Gate Charge Characteristics  
Figur
e
8
. C
 
a p a c i t a n c e v s
 
D r a i n  
to Source Voltage  
30  
10

-3  

10

-5  

10

-7  

10

-9  

V

GS

= 0 V  
10  
T

J

= 125

o

C  
T

J

= 25

o  

C
T

J

= 125

o  

C
T

J

= 100

o  

C
T

J

= 25

o  

C
1
0.001  
0.01  
0.1  
1
10  
100  
1000  
0
5
10  
15  
20  
25  
30  
t

AV

, TIME IN AVALANCHE (ms)  
V

GS

,
GATE TO SOURCE VOLTAGE (V)  
Figur
e
9
. Unclamped
 
Inductive  
Switching Capability  
Figure 10.
 
Igss vs Vgs  
100  
10  
2000  
1000  
V

GS

= 10 V  
1 ms  
SINGLE PULSE  
R

θ

JA

= 125

o

C/W  

A

= 25

o

C  
10 ms  
100  
10  
T
100 ms  
1
THIS AREA IS  
LIMITED BY r  
DS(on)  
1 s  
SINGLE PULSE  
T

J

= MAX RATED  
0.1  
R

θ

JA

= 125

o

C/W  
10 s  
DC  

A

= 25

o

C  
1
T
0.01  
0.5  
10

-3  

10

-2  

10

-1  

t, PULSE WIDTH (sec)  
1
10  
0.01  
0.1  
1
10  
100
200  
100  
1000  
V

DS

, DRAIN to SOURCE VOLTAGE (V)  
Figure 11.
 
Forward Bias Safe  
Operating Area  
Figure 12.
 
Single Pulse Maximum  
Power Dissipation  
©2009 Fairchild Semiconductor Corporation  
FDS8842NZ Rev.C  
4

Typical Characteristics
T

J

= 25 °C unless otherwise noted  
2
DUTY CYCLE-DESCENDING ORDER  
1
D = 0.5  
0.2  
0.1  
0.1  
0.05  
0.02  
0.01  
P
DM  
t
0.01  
1
t
2
NOTES:  
DUTY FACTOR: D = t
 
/t  
SINGLE PULSE  
R

θ

JA

= 125

o

C/W  
1
2
PEAK T
 
= P  
J
x Z
 
x R
 
+ T  
θ
J
A
θ
J
A
A  
DM  
0.001  
0.0005  
10

-3  

10

-2  

10

-1  

1
10  
100  
1000  
t, RECTANGULAR PULSE DURATION (sec)  
Figure 13.
 
Transient Thermal Response Curve  
©2009 Fairchild Semiconductor Corporation  
FDS8842NZ Rev.C  
5

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