onsemi-MJD128T4G
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MJD128T4G (PNP)
Complementary Darlington
Power
T
r
ansistor
DPAK For Surface Mount Applications
Designed for general purpose amplifier and low speed switching
applications.
Features
•
Monolithic Construction With Built−in Base−Emitter Shunt Resistors
•
High DC Current Gain: h
= 2500 (Typ) @ I
= 4.0 Adc
SILICON
POWER TRANSISTOR
8 AMPERES
FE
C
•
Epoxy Meets UL 94 V−0 @ 0.125 in.
•
ESD Ratings:
120 VOLTS, 20 WATTS
♦
Human Body Model, 3B > 8000 V
♦
Machine Model, C > 400 V
•
NJV Prefix for Automotive and Other Applications Requiring
Unique Site and Control Change Requirements; AEC−Q101
Qualified and PPAP Capable
DPAK
CASE 369C
STYLE 1
•
These are Pb−Free Devices*
MAXIMUM RATINGS
Rating
Collector−Emitter Voltage
Collector−Base Voltage
Emitter−Base Voltage
Symbol
Value
120
120
5
Unit
Vdc
Vdc
Vdc
Adc
MARKING DIAGRAM
V
CEO
Base
Collector
Emitter
1
3
V
CB
EB
AYWW
J128G
4
2
V
Collector Current
Continuous
Peak
I
C
8
16
A
Y
= Assembly Location
=
Y
e
ar
WW =
Work Week
J128 =
Device Code
Base Current
I
B
120
mAdc
T
o
tal Power Dissipation
P
D
W
W/
°
C
G
= Pb−Free Package
@ T
= 25
°
C
20
0.16
C
Derate above 25
°
C
T
o
tal Power Dissipation*
P
D
W
W/
°
C
ORDERING INFORMATION
@ T
= 25
°
C
1.75
0.014
A
Derate above 25
°
C
†
Device
Package
Shipping
Operating and Storage Junction
T
e
mperature Range
T , T
−
6
5 to
+
1
50
°
C
J
stg
MJD128T4G
DPAK
(Pb−Free)
2,500/
T
a
pe & Reel
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
NJVMJD128T4G
DPAK
(Pb−Free)
2,500/
T
a
pe & Reel
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our
T
a
pe and Reel Packaging Specifications
Brochure, BRD8011/D.
THERMAL CHARACTERISTICS
Characteristic
Symbol
Max
Unit
°
C/W
°
C/W
Thermal Resistance,
Junction−to−Case
R
6.25
q
JC
JA
Thermal Resistance,
R
q
71.4
1. These
ratings are applicable when surface mounted on the minimum pad
sizes recommended.
*For additional information on our Pb−Free strategy and soldering details, please
download the ON Semiconductor Soldering and Mounting
T
e
chniques
Reference Manual, SOLDERRM/D.
©
Semiconductor Components Industries, LLC, 2016
1
Publication Order Number:
January, 2016 − Rev. 6
MJD128/D
MJD128T4G (PNP)
ELECTRICAL CHARACTERISTICS
(T =
25
°
C unless otherwise noted)
C
Characteristic
Symbol
Min
Max
Unit
OFF CHARACTERISTICS
Collector−Emitter Sustaining Voltage
V
Vdc
mA
CEO(sus)
(I =
30 mAdc, I
= 0)
120
−
−
5
C
B
Collector Cutoff Current
(V =
120 Vdc, I
= 0)
I
I
CEO
CBO
CE
B
Collector Cutoff Current
(V =
100 Vdc, I
= 0)
m
Adc
mAdc
−
10
2
CB
E
Emitter Cutoff Current
(V =
5 Vdc, I
= 0)
I
EBO
−
BE
C
ON CHARACTERISTICS
DC Current Gain
h
FE
−
(I =
4 Adc, V
= 4 Vdc)
C
CE
1000
100
12,000
−
(I =
8 Adc, V
= 4 Vdc)
C
CE
Collector−Emitter Saturation Voltage
(I =
4 Adc, I
= 16 mAdc)
V
V
Vdc
CE(sat)
BE(sat)
C
B
−
−
2
4
(I =
8 Adc, I
= 80 mAdc)
C
B
Base−Emitter Saturation Voltage (1)
(I =
8 Adc, I
= 80 mAdc)
Vdc
Vdc
−
−
4.5
2.8
C
B
Base−Emitter On Voltage
(I =
4 Adc, V
= 4 Vdc)
V
BE(on)
C
CE
DYNAMIC CHARACTERISTICS
Current−Gain−Bandwidth Product
|h |
MHz
pF
−
fe
(I =
3 Adc, V
= 4 Vdc, f = 1 MHz)
4
−
−
300
−
C
CE
Output Capacitance
(V =
10 Vdc, I
= 0, f = 0.1 MHz)
C
ob
fe
CB
E
Small−Signal Current Gain
(I =
3 Adc, V
= 4 Vdc, f = 1 kHz)
h
300
C
CE
2. Pulse
T
e
st: Pulse Width
v
300
m
s, Duty Cycle
v
2%.
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
T
A
T
C
2.5 25
2
20
T
C
1.5 15
T
A
1
0.5
0
10
5
SURFACE
MOUNT
0
25
50
75
100
125
150
T, TEMPERATURE (
°
C)
Figure 1. Power Derating
2
MJD128T4G (PNP)
TYPICAL ELECTRICAL CHARACTERISTICS
3
20,000
V
CE
= 4 V
T =
25
°
C
J
10,000
7000
2.6
2.2
1.8
I =
2 A
C
4 A
6 A
5000
T =
150
°
C
J
3000
2000
25
°
C
1000
700
500
-ꢀ55
°
C
1.4
1
300
200
0.3
0.5 0.7
1
2
3
5
7
10
20 30
0.1
0.2 0.3
0.5 0.7
1
2
3
5
7
10
I ,
COLLECTOR CURRENT (AMP)
C
I ,
BASE CURRENT (mA)
B
Figure 2. DC Current Gain
Figure 3. Collector Saturation Region
3
2.5
2
+ꢀ5
+ꢀ4
+ꢀ3
+ꢀ2
+ꢀ1
0
*I /I
≤
h
C B
FE/3
T =
25
°
C
J
25
°
C to 150
°
C
-ꢀ1
1.5
V
BE
@ V
= 4 V
CE
q
for V
CE(sat)
VC
-ꢀ2
-ꢀ3
-ꢀ55
°
C to 25
°
C
25
°
C to 150
°
C
V
@ I
/I =
250
C B
BE(sat)
1
q
for V
BE
-ꢀ55
°
C to 25
°
C
VB
-ꢀ4
-ꢀ5
V
@ I
/I =
250
C B
CE(sat)
0.5
0.1
0.2 0.3
0.5 0.7
1
2
3
5
7
10
0.1
0.2 0.3
0.5
1
2
3
5
7
10
I ,
COLLECTOR CURRENT (AMP)
C
I ,
COLLECTOR CURRENT (AMP)
C
Figure 4. “On” Voltages
Figure 5. Temperature Coefficients
5
10
10,000
5000
REVERSE
FORWARD
4
10
10
10
10
3000
2000
V
CE
= 30 V
3
1000
500
T =
25
°
C
C
2
1
300
200
V
CE
I =
3 Adc
= 4 Vdc
T =
150
°
C
J
C
100
100
°
C
25
°
C
50
30
20
PNP
NPN
0
10
-1
10
10
+ꢀ0.6 +ꢀ0.4 +ꢀ0.2
0
-ꢀ0.2 -ꢀ0.4 -ꢀ0.6 -ꢀ0.8
-ꢀ1 -ꢀ1.2
-ꢀ1.4
1
2
5
10
20
50 100
200
500 1000
f, FREQUENCY (kHz)
V
BE
, BASE−EMITTER VOLTAGE (VOLTS)
Figure 6. Collector Cut−Off Region
Figure 7. Small−Signal Current Gain
3
MJD128T4G (PNP)
300
200
T =
25
°
C
J
C
ob
100
70
C
5
ib
50
30
0.1 0.2
0.5
1
2
10
20
50 100
V ,
REVERSE VOLTAGE (VOLTS)
R
Figure 8. Capacitance
5
t
s
R &
R VARIED
TO OBTAIN DESIRED CURRENT LEVELS
V
CC
-ꢀ30 V
B
C
ꢃD ,
MUST BE FAST RECOVERY TYPE, e.g.:
3
2
1
ꢃꢃ1N5825 USED ABOVE I
≈
100 mA
B
ꢃꢃMSD6100 USED BELOW I
≈
100 mA
B
R
t
f
C
SCOPE
1
TUT
0.7
0.5
V
2
R
B
APPROX
+ꢀ8 V
0.3
0.2
≈
8 k
≈
120
D
51
1
0
t
r
V
= 30 V
I /I
= 250
V
1
CC
APPROX
-12 V
C B
+ 4 V
0.1
0.07
0.05
I
= I
B1 B2
25
m
s
t @
V
d
= 0 V
BE(off)
T =
25
°
C
J
FOR t
AND t , D
IS DISCONNECTED
1
d
AND V
= 0
r
t , t
≤
10 ns
r
f
DUTY CYCLE = 1%
2
0.1
0.3
0.5 0.7
1
2
3
5
7
10
0.2
FOR NPN TEST CIRCUIT REVERSE ALL POLARITIES.
I ,
COLLECTOR CURRENT (AMP)
C
Figure 9. Switching Times Test Circuit
Figure 10. Switching Times
1
0.7
0.5
D = 0.5
0.2
0.3
0.2
0.1
0.05
P
(pk)
R
R
= r(t) R
q
JC
= 6.25
°
C/W
q
q
JC(t)
0.1
0.07
0.05
JC
D CURVES APPLY FOR POWER
0.01
PULSE TRAIN SHOWN
t
1
READ TIME AT t
t
1
2
0.03
0.02
SINGLE PULSE
0.02 0.03
0.05
T
J(pk)
− T
= P
q
C
(pk) JC(t)
DUTY CYCLE, D = t
/t
1 2
0.01
0.01
0.1
0.2 0.3
0.5
1
2
3
5
10
20 30
50
100
200 300
500
1000
t, TIME OR PULSE WIDTH (ms)
Figure 11. Thermal Response
4
MJD128T4G (PNP)
20
15
10
There are two limitations on the power handling ability of
a transistor: average junction temperature and second
breakdown. Safe operating area curves indicate I
− V
500ꢂ
m
s
100ꢂ
m
s
C
CE
5
limits of the transistor that must be observed for reliable
operation; i.e., the transistor must not be subjected to greater
dissipation than the curves indicate.
3
2
1ꢂms
T =
150
°
C
J
1
variable depending on conditions. Second breakdown pulse
limits are valid for duty cycles to 10% provided T
= 150
°
C; T
is
5ꢂms
J(pk)
C
0.5
0.3
0.2
BONDING WIRE LIMIT
THERMAL LIMIT
J(pk)
T =
25
°
C (SINGLE PULSE)
dc
< 150
°
C. T
may be calculated from the data in
0.1
C
SECOND BREAKDOWN LIMIT
CURVES APPLY BELOW RATED V
J(pk)
will reduce the power that can be handled to values less than
the limitations imposed by second breakdown.
0.05
0.03
0.02
CEO
1
2
3
5
7
10
20 30
50
100 120 200
V
CE
, COLLECTOR-EMITTER VOLTAGE (VOLTS)
Figure 12. Maximum Forward Bias
Safe Operating REA
COLLECTOR
BASE
≈
8 k
≈
120
EMITTER
Figure 13. Darlington Schematic
5
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
DPAK (SINGLE GAUGE)
CASE 369C
4
ISSUE F
2
1
DATE 21 JUL 2015
3
SCALE 1:1
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME
Y14.5M, 1994.
2. CONTROLLING DIMENSION: INCHES.
3. THERMAL PAD CONTOUR OPTIONAL WITHIN DI-
MENSIONS b3, L3 and Z.
A
D
E
C
A
b3
B
4. DIMENSIONS D AND E DO NOT INCLUDE MOLD
FLASH, PROTRUSIONS, OR BURRS. MOLD
FLASH, PROTRUSIONS, OR GATE BURRS SHALL
NOT EXCEED 0.006 INCHES PER SIDE.
5. DIMENSIONS D AND E ARE DETERMINED AT THE
OUTERMOST EXTREMES OF THE PLASTIC BOD
Y
.
6. DATUMS A AND B ARE DETERMINED AT DATUM
PLANE H.
c2
4
2
L3
Z
DETAIL A
H
1
3
7. OPTIONAL MOLD FEATURE.
INCHES
DIM MIN
MAX
0.086 0.094
A1
0.000 0.005
0.025 0.035
b2
0.028 0.045
b3
0.180 0.215
MILLIMETERS
L4
NOTE 7
MIN
2.18
0.00
0.63
0.72
4.57
0.46
0.46
5.97
6.35
MAX
2.38
0.13
0.89
1.14
5.46
0.61
0.61
6.22
6.73
c
b2
e
BOTTOM VIEW
A
SIDE VIEW
b
b
M
0.005 (0.13)
C
TOP VIEW
c
0.018 0.024
c2
0.018 0.024
Z
Z
D
E
e
0.235 0.245
0.250 0.265
0.090 BSC
H
2.29 BSC
9.40 10.41
1.40 1.78
2.90 REF
0.51 BSC
0.89 1.27
GAUGE
PLANE
SEATING
PLANE
H
L
L1
L2
0.370 0.410
0.055 0.070
0.114 REF
L2
C
0.020 BSC
L3
0.035 0.050
L
BOTTOM VIEW
A1
L4
Z
−−−
0.040
0.155
−−−
−−−
3.93
1.01
−−−
L1
ALTERNATE
CONSTRUCTIONS
DETAIL A
ROTATED 9
0
5
CW
GENERIC
MARKING DIAGRAM*
STYLE 1:
PIN 1.
BASE
STYLE 2:
PIN 1.
GATE
2. DRAIN
STYLE 3:
STYLE 4:
STYLE 5:
PIN 1.
GATE
PIN 1.
ANODE
2. CATHODE
3. ANODE
PIN 1.
CATHODE
2. ANODE
2. COLLECTOR
2. ANODE
3. CATHODE
4. ANODE
3. EMITTER
3. SOURCE
4. DRAIN
3. GATE
4. ANODE
XXXXXXG
ALYWW
AYWW
XXX
4. COLLECTOR
4. CATHODE
STYLE 6:
PIN 1.
MT1
2. MT2
STYLE 7:
STYLE 8:
STYLE 9:
PIN 1.
ANODE
2. CATHODE
STYLE 10:
PIN 1.
CATHODE
2. ANODE
XXXXXG
PIN 1.
GATE
PIN 1.
N/C
2. COLLECTOR
2. CATHODE
3. GATE
4. MT2
3. EMITTER
3. ANODE
3. RESISTOR
ADJUST
4. CATHODE
3. CATHODE
4. ANODE
4. COLLECTOR
4. CATHODE
IC
Discrete
SOLDERING FOOTPRINT*
XXXXXX =
Device Code
A
L
Y
WW
G
= Assembly Location
= Wafer Lot
=
Y
e
ar
= Work Week
= Pb
−
Free Package
6.20
0.244
3.00
0.118
2.58
0.102
*This information is generic. Please refer
to device data sheet for actual part
marking.
5.80
0.228
1.60
0.063
6.17
0.243
mm
inches
ǒ
Ǔ
SCALE 3:1
*For additional information on our Pb
−
Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting
T
e
chniques Reference Manual, SOLDERRM/D.
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions
are uncontrolled
except when stamped
“CONTROLLED COPY” in red.
DOCUMENT NUMBER:
DESCRIPTION:
98AON10527D
DPAK (SINGLE GAUGE)
PAGE 1 OF 1
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