onsemi-NJVMJD42CT4G

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onsemi-NJVMJD42CT4G
MJD41Cꢀ(NPN),  
MJD42Cꢀ(PNP)  
Complementary Power  
Transistors  
DPAK for Surface Mount Applications  
Designed for general purpose amplifier and low speed switching  
applications.  
SILICON  
POWER TRANSISTORS  
6 AMPERES  
Features  
•
Lead Formed for Surface Mount Applications in Plastic Sleeves  
(No Suffix)  
100 VOLTS, 20 WATTS  
•
Straight Lead
V
e
rsion in Plastic Sleeves (“1” Suffix)  
•
Electrically Similar to Popular TIP41 and TIP42 Series  
•
Epoxy Meets UL 94 V−0 @ 0.125 in  
•
NJV Prefix for Automotive and Other Applications Requiring  
Unique Site and Control Change Requirements; AEC−Q101  
Qualified and PPAP Capable  
COMPLEMENTARY  
COLLECTOR  
2, 4  
COLLECTOR  
2, 4  
1
1
•
These Devices are Pb−Free and are RoHS Compliant  
BASE  
BASE  
MAXIMUM RATINGS  
3
3
EMITTER  
EMITTER  
Rating  
Collector−Emitter Voltage  
Collector−Base Voltage  
Emitter−Base Voltage  
Collector Current − Continuous  
Collector Current − Peak  
Base Current  
Symbol  
Max  
100  
100  
5
Unit  
Vdc  
Vdc  
Vdc  
Adc  
Adc  
Adc  
V
CEO  
4
V
CB  
EB  
V
4
I
C
6
1
2
3
1
2
I
10  
2
CM  
3
I
B
DPAK  
IPAK  
CASE 369C  
STYLE 1  
CASE 369D  
STYLE 1  
T
o
tal Power Dissipation  
P
P
W
W/
°
C  
D
20  
0.16  
@ T
 
= 25
°
C  
C
Derate above 25
°
C  
MARKING DIAGRAMS  
T
o
tal Power Dissipation (Note 1)  
W
W/
°
C  
°
C  
D
1.75  
0.014  
@ T
 
= 25
°
C  
A
Derate above 25
°
C  
Operating and Storage Junction  
T
e
mperature Range  
T , T  
J
−65 to +150  
AYWW  
J4xCG  
AYWW  
J4xCG  
stg  
ESD − Human Body Model  
ESD − Machine Model  
HBM  
MM  
3B  
C
V
V
DPAK  
IPAK  
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
1. These
 
ratings are applicable when surface mounted on the minimum pad  
sizes recommended.  
A
Y
= Assembly Location  
=
Y
e
ar  
WW =
 
Work Week  
J4xC =
 
Device Code  
x = 1 or 2  
G
= Pb−Free Package  
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 5 of this data sheet.  
©
Semiconductor Components Industries, LLC, 2016  
1
Publication Order Number:  
July, 2016 − Rev. 13  
MJD41C/D  

MJD41C (NPN), MJD42C (PNP)  
THERMAL CHARACTERISTICS  
Characteristic  
Symbol  
Max  
6.25  
71.4  
Unit  
°
C/W  
°
C/W  
Thermal Resistance, Junction−to−Case  
R
R
q
JC  
JA  
Thermal Resistance, Junction−to−Ambient (Note 2)  
q
2. These
 
ratings are applicable when surface mounted on the minimum pad sizes recommended.  
ELECTRICAL CHARACTERISTICS
(T =
 
25
_
C unless otherwise noted)  
C
Characteristic  
Symbol  
Min  
Max  
Unit  
OFF CHARACTERISTICS  
Collector−Emitter Sustaining Voltage (Note 3)  
V
Vdc  
m
Adc  
m
Adc  
mAdc  
CEO(sus)  
100  
−
−
(I =
 
30 mAdc, I
 
= 0)  
C
B
I
Collector Cutoff Current  
(V =
 
60 Vdc, I
 
= 0)  
CEO  
50  
10  
0.5  
CE  
B
I
Collector Cutoff Current  
(V =
 
100 Vdc, V
 
= 0)  
CES  
−
CE  
EB  
I
Emitter Cutoff Current  
(V =
 
5 Vdc, I
 
= 0)  
EBO  
−
BE  
C
ON CHARACTERISTICS
(Note 3)  
h
FE  
−
DC Current Gain  
(I =
 
0.3 Adc, V
 
= 4 Vdc)  
30  
15  
−
75  
C
CE  
(I =
 
3 Adc, V
 
= 4 Vdc)  
C
CE  
V
Vdc  
Vdc  
Collector−Emitter Saturation Voltage  
(I =
 
6 Adc, I
 
= 600 mAdc)  
CE(sat)  
−
−
1.5  
2
C
B
V
Base−Emitter On Voltage  
(I =
 
6 Adc, V
 
= 4 Vdc)  
BE(on)  
C
CE  
DYNAMIC CHARACTERISTICS  
f
MHz  
−
Current Gain − Bandwidth Product (Note 4)  
T
3
−
−
(I =
 
500 mAdc, V
 
= 10 Vdc, f
 
= 1 MHz)  
test  
C
CE  
h
Small−Signal Current Gain  
(I =
 
0.5 Adc, V
 
= 10 Vdc, f = 1 kHz)  
fe  
20  
C
CE  
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
3. Pulse
 
T
e
st: Pulse Width
≤
300
m
s, Duty Cycle
≤
2%.  
4. f =
 
⎪
h
⎪•
f .  
test  
T
fe  
2

MJD41C (NPN), MJD42C (PNP)  
TYPICAL CHARACTERISTICS  
T
T
C
V
CC  
+ꢀ30 V  
A
2.5 25  
R
C
2
20  
25
m
s  
SCOPE  
+11 V  
R
B
0
1.5 15  
T
C
D
1
51  
-ꢀ9 V  
T SURFACE
 
MOUNT  
A
1
10  
t , t
 
≤
10 ns  
r
f
DUTY CYCLE = 1%  
-ꢀ4 V  
0.5  
0
5
0
R and
 
R VARIED
 
TO OBTAIN DESIRED CURRENT LEVELS  
B
C
ꢃD MUST
 
BE FAST RECOVERY TYPE, e.g.:  
1
ꢃꢃMSB5300 USED ABOVE I
 
≈
100 mA  
B
ꢃꢃMSD6100 USED BELOW I
 
≈
100 mA  
B
REVERSE ALL POLARITIES FOR PN
P
.  
25  
50  
75  
100  
125  
150  
T, TEMPERATURE (
°
C)  
Figure 1. Power Derating  
Figure 2. Switching Time Test Circuit  
2
1
500  
T =
 
25
°
C  
J
300  
200  
V
CE  
= 2 V  
V
CC  
I /I
 
= 10  
= 30 V  
T =
 
150
°
C  
J
C B  
0.7  
0.5  
100  
70  
25
°
C  
0.3  
0.2  
t
r
50  
30  
20  
0.1  
-ꢀ55
°
C  
0.07  
t @
 
V  
d
≈
5 V  
BE(off)  
0.05  
10  
7
0.03  
0.02  
5
0.06  
0.2 0.3
 
0.4 0.6  
1
2
4
6
0.06  
0.2  
0.4 0.6  
1
2
4
6
0.1  
0.1  
I ,
 
COLLECTOR CURRENT (AMP)  
C
I ,
 
COLLECTOR CURRENT (AMP)  
C
Figure 3. DC Current Gain  
Figure 4. Turn−On Time  
1.4  
1.4  
I /I
 
= 10  
V
CE  
= 4 V  
C
B
1.2  
1.0  
1.2  
1.0  
0.8  
0.6  
0.4  
−55
°
C  
−55
°
C  
−40
°
C  
25
°
C  
0.8  
0.6  
0.4  
−40
°
C  
25
°
C  
80
°
C  
80
°
C  
T =
 
150
°
C  
A
T =
 
150
°
C  
A
0.2  
0
0.2  
0
0.01  
0.1  
1
10  
0.01  
0.1  
1
10  
I ,
 
COLLECTOR CURRENT (A)  
C
I ,
 
COLLECTOR CURRENT (A)  
C
Figure 5. Base Emitter Voltage vs. Collector  
Current  
Figure 6. Base Emitter Saturation Voltage vs.  
Collector Current  
3

MJD41C (NPN), MJD42C (PNP)  
TYPICAL CHARACTERISTICS  
5
1.0  
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
T =
 
150
°
C  
A
T =
 
25
°
C  
J
I /I
 
= 10  
3
C
B
V
CC  
I /I
 
= 10  
= 30 V  
80
°
C  
2
C B  
t
s
I =
 
I  
B1 B2  
25
°
C  
1
0.7  
0.5  
0.3  
0.2  
t
f
0.1  
−40
°
C  
and −55
°
C  
0.1  
0
0.07  
0.05  
0.06  
0.2  
0.4 0.6  
1
2
4
6
0.01  
0.1  
1
10  
0.1  
I ,
 
COLLECTOR CURRENT (AMP)  
C
I ,
 
COLLECTOR CURRENT (A)  
C
Figure 7. Collector Emitter Saturation Voltage  
vs. Collector Current  
Figure 8. Turn−Off Time  
2
300  
T =
 
25
°
C  
J
T =
 
25
°
C  
J
200  
1.6  
1.2  
0.8  
0.4  
0
I =
 
1 A  
C
2.5 A  
5 A  
C
C
ib  
100  
70  
ob  
50  
30  
0.5  
1
2
3
5
10  
20 30  
50  
10  
20 30  
50  
100  
200 300
 
500  
1000  
V ,
 
REVERSE VOLTAGE (VOLTS)  
R
I ,
 
BASE CURRENT (mA)  
B
Figure 10. Capacitance  
Figure 9. Collector Saturation Region  
1
0.7  
D = 0.5  
0.5  
0.3  
0.2  
0.2  
P
(pk)  
R
R
= r(t) R  
q
JC  
q
q
JC(t)  
0.1  
= 6.25
°
C/W MAX  
JC  
0.1  
0.07  
0.05  
0.05  
D CURVES APPLY FOR POWER  
PULSE TRAIN SHOWN  
READ TIME AT t  
t
1
0.02  
t
2
1
T
– T
 
= P
 
q  
C (pk)
 
JC(t)  
J(pk)  
0.03  
0.02  
DUTY CYCLE, D = t
 
/t  
0.01  
1 2  
SINGLE PULSE  
0.01  
0.01  
0.02 0.03
 
0.05  
0.1  
0.2 0.3
 
0.5  
1
2
3
5
10  
20 30  
50  
100  
200 300
 
500  
1000  
t, TIME (ms)  
Figure 11. Thermal Response  
4

MJD41C (NPN), MJD42C (PNP)  
10  
5
3
2
There are two limitations on the power handling ability of  
a transistor: average junction temperature and second  
breakdown. Safe operating area curves indicate I
 
− V  
limits of the transistor that must be observed for reliable  
operation; i.e., the transistor must not be subjected to greater  
dissipation than the curves indicate.  
100ꢂ
m
s  
500ꢂ
m
s  
C
CE  
1ꢂms  
dc  
5ꢂms  
1
0.5  
0.3  
WIRE BOND LIMIT  
THERMAL LIMIT  
SECOND BREAKDOWN LIMIT  
The data of Figure 12 is based on T  
variable depending on conditions. Second breakdown pulse  
limits are valid for duty cycles to 10% provided  
= 150
_
C; T
 
is  
J(pk)  
C
CURVES APPLY BELOW RATED V  
CEO  
0.1  
0.05  
0.03  
T
v
150
_
C. T  
may be calculated from the data in  
J(pk)  
J(pk)  
T =
 
25
°
C SINGLE PULSE  
T =
 
150
°
C  
J
C
Figure 11. At high case temperatures, thermal limitations  
will reduce the power that can be handled to values less than  
the limitations imposed by second breakdown.  
MJD41C, 42C  
0.01  
1
2
3
5
7
10  
20 30  
50 70
 
100  
V
CE  
, COLLECTOR-EMITTER VOLTAGE (VOLTS)  
Figure 12. Maximum Forward Bias  
Safe Operating Area  
ORDERING INFORMATION  
Device  
†
Package Type  
Package  
Shipping  
MJD41CRLG  
DPAK  
(Pb−Free)  
369C  
1,800 /
T
a
pe & Reel  
MJD41CT4G  
DPAK  
(Pb−Free)  
369C  
369C  
369C  
369D  
369C  
369C  
369C  
369C  
2,500 /
T
a
pe & Reel  
2,500 /
T
a
pe & Reel  
75 Units / Rail  
NJVMJD41CT4G*  
MJD42CG  
DPAK  
(Pb−Free)  
DPAK  
(Pb−Free)  
MJD42C1G  
IPAK  
(Pb−Free)  
75 Units / Rail  
MJD42CRLG  
NJVMJD42CRLG*  
MJD42CT4G  
DPAK  
(Pb−Free)  
1,800 /
T
a
pe & Reel  
1,800 /
T
a
pe & Reel  
2,500 /
T
a
pe & Reel  
2,500 /
T
a
pe & Reel  
DPAK  
(Pb−Free)  
DPAK  
(Pb−Free)  
NJVMJD42CT4G*  
DPAK  
(Pb−Free)  
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our
T
a
pe and Reel Packaging  
Specifications Brochure, BRD8011/D.  
*NJV Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q101 Qualified and PPAP  
Capable  
5

MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
IPAK  
CASE 369D
−
01  
ISSUE C  
DATE 15 DEC 2010  
C
B
NOTES:  
SCALE 1:1  
1. DIMENSIONING
 
AND TOLERANCING PER  
ANSI Y14.5M, 1982.  
V
E
R
2. CONTROLLING
 
DIMENSION: INCH.  
INCHES  
DIM MIN
 
MAX  
MILLIMETERS  
4
MIN  
5.97  
6.35  
2.19  
0.69  
0.46  
0.94  
MAX  
6.35  
6.73  
2.38  
0.88  
0.58  
1.14  
Z
A
B
C
D
E
F
G
H
J
K
R
S
V
Z
0.235 0.245  
0.250 0.265  
0.086 0.094  
0.027 0.035  
0.018 0.023  
0.037 0.045  
0.090 BSC  
0.034 0.040  
0.018 0.023  
0.350 0.380  
0.180 0.215  
0.025 0.040  
0.035 0.050  
A
S
1
2
3
−
T
−  
SEATING  
PLANE  
2.29 BSC  
K
0.87  
0.46  
8.89  
4.45  
0.63  
0.89  
3.93  
1.01  
0.58  
9.65  
5.45  
1.01  
1.27  
−−−  
J
F
H
0.155  
−−−  
D
3 PL  
G
M
T
0.13 (0.005)  
MARKING  
DIAGRAMS  
STYLE 1:  
PIN 1.
 
BASE  
STYLE 2:  
STYLE 3:  
PIN 1.
 
ANODE  
STYLE 4:  
PIN 1.
 
CATHODE  
2. ANODE  
Integrated  
Circuits  
PIN 1.
 
GATE  
2. DRAIN  
3. SOURCE  
4. DRAIN  
2. COLLECTOR  
3. EMITTER  
4. COLLECTOR  
2. CATHODE  
3. ANODE  
4. CATHODE  
Discrete  
3. GATE  
4. ANODE  
xxxxx  
ALYWW  
x
YWW  
xxxxxxxx  
STYLE 5:  
PIN 1.
 
GATE  
2. ANODE  
STYLE 6:  
PIN 1.
 
MT1  
2. MT2  
STYLE 7:  
PIN 1.
 
GATE  
2. COLLECTOR  
3. CATHODE  
4. ANODE  
3. GATE  
4. MT2  
3. EMITTER  
4. COLLECTOR  
xxxxxxxxx =
 
Device Code  
A
= Assembly Location  
lL  
Y
= Wafer Lot  
=
Y
e
ar  
WW  
= Work Week  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions
 
are uncontrolled
 
except when stamped
 
“CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON10528D  
IPAK (DPAK INSERTION MOUNT)  
PAGE 1 OF 1  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding  
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically  
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the  
rights of others.  
©
Semiconductor Components Industries, LLC, 2019  

MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
DPAK (SINGLE GAUGE)  
CASE 369C  
4
ISSUE F  
2
1
DATE 21 JUL 2015  
3
SCALE 1:1  
NOTES:  
1. DIMENSIONING AND TOLERANCING PER ASME  
Y14.5M, 1994.  
2. CONTROLLING DIMENSION: INCHES.  
3. THERMAL PAD CONTOUR OPTIONAL WITHIN DI-  
MENSIONS b3, L3 and Z.  
4. DIMENSIONS D AND E DO NOT INCLUDE MOLD  
FLASH, PROTRUSIONS, OR BURRS. MOLD  
FLASH, PROTRUSIONS, OR GATE BURRS SHALL  
NOT EXCEED 0.006 INCHES PER SIDE.  
5. DIMENSIONS D AND E ARE DETERMINED AT THE  
OUTERMOST EXTREMES OF THE PLASTIC BOD
Y
.  
6. DATUMS A AND B ARE DETERMINED AT DATUM  
PLANE H.  
A
D
E
C
A
b3  
B
c2  
4
2
L3  
Z
DETAIL A  
H
1
3
7. OPTIONAL MOLD FEATURE.  
INCHES  
DIM MIN
 
MAX  
0.086 0.094  
A1
0.000 0.005  
0.025 0.035  
MILLIMETERS  
L4  
NOTE 7  
MIN  
2.18  
0.00  
0.63  
0.72  
4.57  
0.46  
0.46  
5.97  
6.35  
MAX  
2.38  
0.13  
0.89  
1.14  
5.46  
0.61  
0.61  
6.22  
6.73  
c
b2  
e
BOTTOM VIEW  
A
SIDE VIEW  
b
b
b2
0.028 0.045  
b3
0.180 0.215  
M
0.005 (0.13)  
C
TOP VIEW  
c
0.018 0.024  
c2
0.018 0.024  
Z
Z
D
E
e
0.235 0.245  
0.250 0.265  
0.090 BSC  
H
2.29 BSC  
9.40 10.41  
1.40 1.78  
2.90 REF  
0.51 BSC  
0.89 1.27  
GAUGE  
PLANE  
SEATING  
PLANE  
H
L
L1  
L2  
0.370 0.410  
0.055 0.070  
0.114 REF  
L2  
C
0.020 BSC  
L3
0.035 0.050  
L
BOTTOM VIEW  
A1  
L4  
Z
−−− 0.040  
0.155 −−−  
−−−  
3.93  
1.01  
−−−  
L1  
ALTERNATE  
CONSTRUCTIONS  
DETAIL A  
ROTATED 9
0
5
CW  
GENERIC  
MARKING DIAGRAM*  
STYLE 1:  
PIN 1.
 
BASE  
STYLE 2:  
PIN 1.
 
GATE  
2. DRAIN  
STYLE 3:  
STYLE 4:  
STYLE 5:  
PIN 1.
 
GATE  
PIN 1.
 
ANODE  
2. CATHODE  
3. ANODE  
PIN 1.
 
CATHODE  
2. ANODE  
2. COLLECTOR  
3. EMITTER  
4. COLLECTOR  
2. ANODE  
3. CATHODE  
4. ANODE  
3. SOURCE  
4. DRAIN  
3. GATE  
4. ANODE  
XXXXXXG  
ALYWW  
AYWW  
XXX  
4. CATHODE  
STYLE 6:  
PIN 1.
 
MT1  
2. MT2  
STYLE 7:  
PIN 1.
 
GATE  
STYLE 8:  
PIN 1.
 
N/C  
STYLE 9:  
PIN 1.
 
ANODE  
2. CATHODE  
STYLE 10:  
PIN 1.
 
CATHODE  
2. ANODE  
XXXXXG  
2. COLLECTOR  
2. CATHODE  
3. GATE  
4. MT2  
3. EMITTER  
4. COLLECTOR  
3. ANODE  
4. CATHODE  
3. RESISTOR
 
ADJUST  
4. CATHODE  
3. CATHODE  
4. ANODE  
IC  
Discrete  
SOLDERING FOOTPRINT*  
XXXXXX =
 
Device Code  
A
L
Y
WW  
G
= Assembly Location  
= Wafer Lot  
=
Y
e
ar  
= Work Week  
= Pb−Free Package  
6.20  
0.244  
3.00  
0.118  
2.58  
0.102  
*This information is generic. Please refer  
to device data sheet for actual part  
marking.  
5.80  
0.228  
1.60  
0.063  
6.17  
0.243  
mm  
inches  
ǒ
Ǔ
SCALE 3:1  
*For additional information on our Pb−Free strategy and soldering  
details, please download the ON Semiconductor Soldering and  
Mounting
T
e
chniques Reference Manual, SOLDERRM/D.  
98AON10527D  
DOCUMENT NUMBER:  
STATUS:  
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ON SEMICONDUCTOR STANDARD  
REF TO JEDEC TO−252  
NEW STANDARD:  
DESCRIPTION: DPAK
 
SINGLE GAUGE SURFACE MOUNT  
PAGE 1 O
F
2

DOCUMENT NUMBER:  
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RELEASED FOR PRODUCTION. REQ. BY L. GAN  
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DATE  
O
A
B
C
D
24 SEP 2001  
06 AUG 2008  
16 JAN 2009  
09 JUN 2009  
29 JUN 2010  
ADDED STYLE 9. REQ. BY D. WARNER.  
ADDED STYLE 10. REQ. BY S. ALLEN.  
RELABELED DRAWING TO JEDEC STANDARDS. ADDED SIDE VIEW DETAIL A.  
CORRECTED MARKING INFORMATION. REQ. BY D. TRUHITTE.  
E
F
ADDED ALTERNATE CONSTRUCTION BOTTOM VIEW. MODIFIED DIMENSIONS  
b2 AND L1. CORRECTED MARKING DIAGRAM FOR DISCRETE. REQ. BY I. CAM-  
BALIZA.  
06 FEB 2014  
21 JUL 2015  
ADDED SECOND ALTERNATE CONSTRUCTION BOTTOM VIEW. REQ. BY K.  
MUSTAFA.  
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