onsemi-NSS40300MZ4T1G

Part #onsemi-NSS40300MZ4T1G
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onsemi-NSS40300MZ4T1G
NSS40300MZ4  
Bipolar Power
T
r
ansistors  
40
V
,
3
.0 A, Low V

CE(sat)  

PNP
T
r
ansistor  
2
ON Semiconductor’s
 
e PowerEdge
 
family of low V  
CE(sat)  
transistors are surface mount devices featuring ultra low saturation  
voltage (V
 
) and high current gain capability. These are designed  
CE(sat)  
PNP TRANSISTOR  
3.0 AMPERES  
40 VOLTS, 2.0 WATTS  
for use in low voltage, high speed switching applications where  
affordable efficient energy control is important.  
Typical applications are DC−DC converters and power management  
in portable and battery powered products such as cellular and cordless  
phones, PDAs, computers, printers, digital cameras and MP3 players.  
Other applications are low voltage motor controls in mass storage  
products such as disc drives and tape drives. In the automotive  
industry they can be used in air bag deployment and in the instrument  
C 2, 4  
2
cluster. The high current gain allows e PowerEdge devices to be  
driven directly from PMU’s control outputs, and the Linear Gain  
(Beta) makes them ideal components in analog amplifiers.  
B 1  
E 3  
Schematic  
Features  
•
Complement to NSS40301MZ4 Series  
4
•
NSV Prefix for Automotive and Other Applications Requiring  
Unique Site and Control Change Requirements; AEC−Q101  
Qualified and PPAP Capable  
1
2
3
SOT−223  
CASE 318E  
STYLE 1  
•
These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS  
Compliant  
MARKING DIAGRAM  
MAXIMUM RATINGS
(T =
 
25
°
C unless otherwise noted)  
C
Rating  
Symbol  
Value  
40  
Unit  
Vdc  
Vdc  
Vdc  
Adc  
Adc  
Adc  
W
AYW  
40300
G  
Collector−Emitter Voltage  
Collector−Base Voltage  
Emitter−Base Voltage  
V
CEO  
1
V
40  
CB  
EB  
A
Y
W
= Assembly Location  
Y
e
ar  
= Work Week  
V
6.0  
1.0  
3.0  
5.0  
Base Current − Continuous  
Collector Current − Continuous  
Collector Current − Peak  
I
B
40300 =
 
Specific Device Code  
I
C
G
= Pb−Free Package  
I
CM  
PIN ASSIGNMENT  
T
o
tal Power Dissipation  
P
D
T
o
tal P
 
@ T
 
= 25
°
C (Note

2.0  
0.80  
D
A
4
T
o
tal P
 
@ T
 
= 25
°
C (Note

)  
D
A
C
Operating and Storage Junction  
T
e
mperature Range  
T , T  
–
5
5 to
+
1
50  
°
C  
J
stg  
Stresses exceeding Maximum Ratings may damage the device. Maximum  
Ratings are stress ratings only. Functional operation above the Recommended  
Operating Conditions is not implied. Extended exposure to stresses above the  
Recommended Operating Conditions may affect device reliability.  
1. Mounted
 
on 1” sq. (645 sq. mm) Collector pad on FR−4 bd material.  
2. Mounted
 
on 0.012” sq. (7.6 sq. mm) Collector pad on FR−4 bd material.  
B
1
C
2
E
3
T
o
p View Pinout  
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on

©
Semiconductor Components Industries, LLC, 2013  
1
Publication Order Number:  
September, 2013 − Rev. 3  
NSS40300MZ4/D  
 

NSS40300MZ4  
THERMAL CHARACTERISTICS  
Characteristic  
Symbol  
Max  
Unit  
Thermal Resistance, Junction−to−Case  
Junction−to−Ambient on 1” sq. (645 sq. mm) Collector pad on FR−4 bd material  
Junction−to−Ambient on 0.012” sq. (7.6 sq. mm) Collector pad on FR−4 bd material  
°
C/W  
R
R
64  
155  
q
q
JA  
JA  
Maximum Lead
T
e
mperature for Soldering Purposes, 1/8” from case for 5 seconds  
T
L
260  
°
C  
ELECTRICAL CHARACTERISTICS
(T =
 
25
°
C unless otherwise noted)  
C
Characteristic  
Symbol  
Min  
Typ  
Max  
Unit  
OFF CHARACTERISTICS  
Collector−Emitter Sustaining Voltage (I
 
= 10 mAdc, I
 
= 0 Adc)  
V
CEO(sus)  
40  
6.0  
−
−
−
−
−
−
Vdc  
Vdc  
C
B
Emitter−Base Voltage (I
 
= 50
m
Adc, I
 
= 0 Adc)  
V
−
E
C
EBO  
CBO  
Collector Cutoff Current (V
 
= 40 Vdc)  
I
100  
100  
nAdc  
nAdc  
CB  
Emitter Cutoff Current (V
 
= 6.0 Vdc)  
I
−
BE  
EBO  
ON CHARACTERISTICS

Collector−Emitter Saturation Voltage  
V
V
Vdc  
CE(sat)  
(I =
 
0.5 Adc, I
 
= 50 mAdc)  
−
−
−
−
−
−
0.070  
0.150  
0.400  
C
B
(I =
 
1.0 Adc, I
 
= 20 mAdc)  
C
B
(I =
 
3.0 Adc, I
 
= 0.3 Adc)  
C
B
Base−Emitter Saturation Voltage (I
 
= 1.0 Adc, I
 
= 0.1 Adc)  
−
−
−
−
1.0  
0.9  
Vdc  
Vdc  
−
C
B
BE(sat)  
Base−Emitter On Voltage (I
 
= 1.0 Adc, V
 
= 2.0 Vdc)  
V
BE(on)  
C
CE  
DC Current Gain  
(I =
 
0.5 Adc, V
 
= 1.0 Vdc)  
h
FE  
200  
175  
100  
−
−
−
−
350  
−
C
CE  
(I =
 
1.0 Adc, V
 
= 1.0 Vdc)  
C
CE  
(I =
 
3.0 Adc, V
 
= 1.0 Vdc)  
C
CE  
DYNAMIC CHARACTERISTICS  
Output Capacitance (V
 
= 10 Vdc, f = 1.0 MHz)  
C
−
−
40  
−
−
pF  
pF  
CB  
ob  
Input Capacitance (V
 
= 5.0 Vdc, f = 1.0 MHz)  
C
130  
EB  
ib  
f
T
MHz  
(I =
 
500 mA, V
 
= 10
V
, F
 
=
1
.0 MHz)  
−
160  
−
C
CE  
test  
3. Pulse
 
T
e
st: Pulse Width
≤
300
m
s, Duty Cycle
≤
2%.  
4. f =
 
|h |
 
•
f  
T
FE  
test  
2.5  
2.0  
1.5  
1.0  
T
C
T
A
0.5  
0
25  
50  
75  
100  
125  
150  
T , TEMPERATURE (
°
C)  
J
Figure 1. Power Derating  
2
 

NSS40300MZ4  
TYPICAL CHARACTERISTICS  
600  
500  
400  
300  
200  
700  
V
CE  
= 4 V  
V
CE  
= 1 V  
150
°
C  
600  
500  
400  
300  
200  
150
°
C  
25
°
C  
25
°
C  
−40
°
C  
−40
°
C  
100  
0
100  
0
0.001  
0.01  
0.1  
1
10  
0.001  
0.01  
0.1  
1
10  
10  
10  
I ,
 
COLLECTOR CURRENT (A)  
C
I ,
 
COLLECTOR CURRENT (A)  
C
Figure 2. DC Current Gain  
Figure 3. DC Current Gain  
1
1
I /I
 
= 10  
C
B
I /I
 
= 50  
150
°
C  
C
B
150
°
C  
25
°
C  
−40
°
C  
0.1  
25
°
C  
−40
°
C  
0.1  
0.01  
0.001  
0.01  
0.001  
0.01  
0.1  
1
10  
0.001  
0.01  
0.1  
1
I ,
 
COLLECTOR CURRENT (A)  
C
I ,
 
COLLECTOR CURRENT (A)  
C
Figure 4. Collector−Emitter Saturation Voltage  
Figure 5. Collector−Emitter Saturation Voltage  
1
1.2  
1.1  
1.0  
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
V
CE  
= 2 V  
I
C
= 2 A  
−40
°
C  
25
°
C  
1 A  
0.1  
0.5 A  
0.1 A  
150
°
C  
0.1  
0
0.01  
1.0E−04 1.0E−03  
1.0E−02  
1.0E−01  
1.0E+00  
0.001  
0.01  
0.1  
1
I ,
 
BASE CURRENT (A)  
B
I ,
 
COLLECTOR CURRENT (A)  
C
Figure 6. Collector Saturation Region  
Figure 7. V

BE(on)

Voltage  
3

NSS40300MZ4  
TYPICAL CHARACTERISTICS  
1.2  
1.3  
1.2  
1.1  
1.0  
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
1.1  
1.0  
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
I /I
 
= 10  
I /I
 
= 50  
C B  
C
B
−40
°
C  
25
°
C  
−40
°
C  
25
°
C  
150
°
C  
150
°
C  
0.1  
0
0.1  
0
0.001  
0.01  
0.1  
1
10  
0.001  
0.01  
0.1  
1
10  
I ,
 
COLLECTOR CURRENT (A)  
C
I ,
 
COLLECTOR CURRENT (A)  
C
Figure 8. Base−Emitter Saturation Voltage  
Figure 9. Base−Emitter Saturation Voltage  
350  
100  
80  
T =
 
25
°
C  
J
J
f
= 1 MHz  
300  
250  
200  
150  
100  
test  
f
60  
40  
20  
0
50  
0
0
1
2
3
4
5
6
0
5
10  
15  
20  
25  
30  
35  
V
EB  
, EMITTER BASE VOLTAGE (V)  
V
CB  
, COLLECTOR BASE VOLTAGE (V)  
Figure 10. Input Capacitance  
Figure 11. Output Capacitance  
200  
10  
1
T =
 
25
°
C  
J
180  
160  
140  
120  
100  
80  
f
= 1 MHz  
test  
0.5 ms  
V
CE  
= 10 V  
1 ms  
10 ms  
100 ms  
0.1  
60  
40  
20  
0
0.01  
0.001  
0.01  
0.1  
1
1
10  
100  
I ,
 
COLLECTOR CURRENT (A)  
C
V
CE  
, COLLECTOR−EMITTER VOLTAGE (V)  
Figure 12. Current−Gain Bandwidth Product  
Figure 13. Safe Operating Area  
4

NSS40300MZ4  
ORDERING INFORMATION  
Device  
†
Package  
Shipping  
NSS40300MZ4T1G  
SOT−223  
(Pb−Free)  
1,000 /
T
a
pe & Reel  
1,000 /
T
a
pe & Reel  
4,000 /
T
a
pe & Reel  
NSV40300MZ4T1G*  
NSS40300MZ4T3G  
SOT−223  
(Pb−Free)  
SOT−223  
(Pb−Free)  
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our
T
a
pe and Reel Packaging  
Specifications Brochure, BRD8011/D.  
*NSV Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q101 Qualified and PPAP  
Capable  
5

MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
SOT
−
223 (TO
−
261)  
CASE 318E
−
04  
ISSUE R  
DATE 02 OCT 2018  
SCALE 1:1  
q
q
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions
 
are uncontrolled
 
except when stamped
 
“CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98ASB42680B  
SOT
−
223 (TO
−
261)  
PAGE 1 OF 2  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding  
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically  
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the  
rights of others.  
©
Semiconductor Components Industries, LLC, 2018  

SOT
−
223 (TO
−
261)  
CASE 318E
−
04  
ISSUE R  
DATE 02 OCT 2018  
STYLE 1:  
PIN 1.
 
BASE  
2. COLLECTOR  
3. EMITTER  
4. COLLECTOR  
STYLE 2:  
PIN 1.
 
ANODE  
STYLE 3:  
STYLE 4:  
PIN 1.
 
SOURCE  
STYLE 5:  
PIN 1.
 
DRAIN  
PIN 1.
 
GATE  
2. DRAIN  
2. CATHODE  
3. NC  
2. DRAIN  
3. GATE  
4. DRAIN  
2. GATE  
3. SOURCE  
4. DRAIN  
3. SOURCE  
4. GATE  
4. CATHODE  
STYLE 6:  
PIN 1.
 
RETURN  
STYLE 7:  
STYLE 8:  
STYLE 9:  
STYLE 10:  
PIN 1.
 
ANODE 1  
2. CATHODE  
3. ANODE
 
2  
CANCELLED  
PIN 1.
 
INPUT  
2. GROUND  
3. LOGIC  
PIN 1.
 
CATHODE  
2. ANODE  
2. INPUT  
3. OUTPUT  
4. INPUT  
3. GATE  
4. CATHODE  
4. GROUND  
4. ANODE  
STYLE 11:  
PIN 1.
 
MT 1  
STYLE 12:  
STYLE 13:  
PIN 1.
 
INPUT  
2. OUTPUT  
3. NC  
PIN 1.
 
GATE  
2. COLLECTOR  
3. EMITTER  
4. COLLECTOR  
2. MT
 
2  
3. GATE  
4. MT
 
2  
4. OUTPUT  
GENERIC  
MARKING DIAGRAM*  
AYW  
XXXXX
G  
G
1
A
Y
= Assembly Location  
=
Y
e
ar  
W
= Work Week  
XXXXX =
 
Specific Device Code  
G
= Pb
−
Free Package  
(Note: Microdot may be in either location)  
*This information is generic. Please refer to  
device data sheet for actual part marking.  
Pb
−
Free indicator, “G” or microdot “
G
”, may  
or may not be present. Some products may  
not follow the Generic Marking.  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions
 
are uncontrolled
 
except when stamped
 
“CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98ASB42680B  
SOT
−
223 (TO
−
261)  
PAGE 2 OF 2  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding  
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically  
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the  
rights of others.  
©
Semiconductor Components Industries, LLC, 2018  

onsemi
,  
, and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “
onsemi
” or its affiliates  
and/or subsidiaries in the United States and/or other countries.
onsemi
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onsemi
’s product/patent coverage may be accessed at

.
onsemi
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−
is” and
onsemi
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onsemi
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and applications using
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provided by
onsemi
. “Typical” parameters which may be provided in
onsemi
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onsemi
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T
:  
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o
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