onsemi-NTB082N65S3F

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onsemi-NTB082N65S3F
NTB082N65S3F  

MOSFET

– N‐Channel,  
SUPERFET III, FRFET  
650
V
,
4
0 A, 82 m
W
 
Description  
SUPERFET III MOSFET is ON Semiconductor’s brand-new high  
voltage super-junction (SJ) MOSFET family that is utilizing charge  
balance technology for outstanding low on-resistance and lower gate  
charge performance. This advanced technology is tailored to minimize  
conduction loss, provide superior switching performance, and  
withstand extreme dv/dt rate.  
V
R
MAX  
I MAX  
D
DSS  
DS(ON)  
650 V  
82 m
W
@ 10 V  
40 A  
Consequently, SUPERFET III MOSFET is very suitable for the  
various power system for miniaturization and higher efficiency.  
SUPERFET III FRFET MOSFET’s optimized reverse recovery  
performance of body diode can remove additional component and  
improve system reliability.  
D
G
Features  
•
700 V @ T
 
= 150
°
C  
J
•
Typ. R  
= 70 m
W
 
S
DS(on)  
•
Ultra Low Gate Charge (Typ. Q
 
= 81 nC)  
g
•
Low Effective Output Capacitance (Typ. C  
•
100% Avalanche Tested  
= 722 pF)  
oss(eff.)  
D
•
These Devices are Pb
−
Free and are RoHS Compliant  
G
S
Applications  
2
D PAK
−
3  
CASE 418AJ  
•
Telecom / Server Power Supplies  
•
Industrial Power Supplies  
•
EV Charger  
MARKING DIAGRAM  
•
UPS / Solar  
$Y&Z&3&K  
NTB  
082N65S3F  
$Y  
= ON Semiconductor Logo  
= Assembly Plant Code  
= Data Code (
Y
e
ar & Week)  
= Lot  
&Z  
&3  
&K  
NTB082N65S3F =
 
Specific Device Code  
ORDERING INFORMATION  
See detailed ordering and shipping information on page

this data sheet.  
©
Semiconductor Components Industries, LLC, 2017  
1
Publication Order Number:  
August, 2019
−
Rev. 4  
NTB082N65S3F/D  

NTB082N65S3F  
ABSOLUTE MAXIMUM RATINGS
(T =
 
25
°
C, Unless otherwise specified)  
C
Symbol  
Parameter  
Value  
650  
Unit  
V
V
DSS  
V
GSS  
Drain to Source Voltage  
Gate to Source Voltage  
DC  
30  
V
AC (f > 1 Hz)  
30  
V
I
D
Drain Current  
Continuous (T
 
= 25
°
C)  
40  
A
C
Continuous (T
 
= 100
°
C)  
25.5  
100  
C
I
Drain Current  
Pulsed (Note

A
mJ  
A
DM  
E
Single Pulsed Avalanche Energy (Note

Avalanche Current (Note

Repetitive Avalanche Energy (Note

MOSFET dv/dt  
510  
AS  
AS  
I
4.8  
E
3.13  
100  
mJ  
V/ns  
AR  
dv/dt  
Peak Diode Recovery dv/dt (Note

Power Dissipation  
50  
P
(T =
 
25
°
C)  
313  
W
W/
°
C  
°
C  
D
C
Derate Above 25
°
C  
2.5  
T , T  
Operating and Storage
T
e
mperature Range  
−
55 to +150  
300  
J
STG  
T
Maximum Lead
T
e
mperature for Soldering, 1/8
″
from Case for 5 s  
°
C  
L
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality  
should not be assumed, damage may occur and reliability may be affected.  
1. Repetitive
 
rating: pulse-width limited by maximum junction temperature.  
2. I
 
= 4.8 A, R
 
= 25
W
, starting T
 
= 25
°
C.  
AS  
G
J
3. I
 
£
20 A, di/dt
≤
100 A/
m
s, V
 
≤
400 V, starting T
 
= 25
°
C.  
SD  
DD  
J
THERMAL CHARACTERISTICS  
Symbol  
Parameter  
Value  
0.4  
Unit  
R
Thermal Resistance, Junction to Case, Max.  
q
JC  
JA  
_
C/W  
2
R
Thermal Resistance, Junction to Ambient (1 in
 
Pad of 2
−
oz Copper), Max.  
62.5  
q
PACKAGE MARKING AND ORDERING INFORMATION  
Part Number  
Top Marking  
Package  
Packing Method  
Reel Size  
Tape Width  
Quantity  
2
†
NTB082N65S3F  
NTB082N65S3F  
D PAK  
T
a
pe and Reel  
330 mm  
24 mm  
800 Units  
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our
T
a
pe and Reel Packaging  
Specifications Brochure,

.  
2
 

NTB082N65S3F  
ELECTRICAL CHARACTERISTICS
(T =
 
25
°
C unless otherwise noted)  
C
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Unit  
OFF CHARACTERISTICS  
BV  
Drain to Source Breakdown Voltage  
650  
700  
−
−
−
−
−
−
V
V
V
V
I
= 0
V
, I
 
= 1 mA, T
 
= 25
_
C  
DSS  
GS  
D
J
= 0
V
, I
 
= 1 mA, T
 
= 150
_
C  
GS  
D
J
D
BV  
/
D
T  
Breakdown Voltage
T
e
mperature  
Coefficient  
= 10 mA, Referenced to 25
_
C  
0.7  
V/
_
C  
DSS  
J
D
I
Zero Gate Voltage Drain Current  
V
DS  
V
DS  
V
GS  
= 650
V
, V
 
= 0 V  
−
−
−
−
124  
−
10  
−
m
A  
DSS  
GS  
= 520
V
, T
 
=
1
25
_
C  
C
I
Gate to Body Leakage Current  
=
30
V
, V
 
= 0 V  
100  
nA  
GSS  
DS  
ON CHARACTERISTICS  
V
Gate Threshold Voltage  
V
GS  
V
GS  
V
DS  
= V
 
, I
 
= 1.0 mA  
3.0  
−
−
5.0  
82  
−
V
m
W  
S
GS(th)  
DS(on)  
DS  
D
R
Static Drain to Source On Resistance  
Forward Transconductance  
= 10
V
, I
 
=
2
0 A  
70  
24  
D
g
FS  
= 20
V
, I
 
=
2
0 A  
−
D
DYNAMIC CHARACTERISTICS  
C
Input Capacitance  
V
= 400
V
, V
 
= 0 V, f = 1
M
Hz  
−
−
−
−
−
−
−
−
3410  
70  
−
−
−
−
−
−
−
−
pF  
pF  
pF  
pF  
nC  
nC  
nC  
W
iss  
DS  
GS  
C
Output Capacitance  
oss  
C
Effective Output Capacitance  
Energy Related Output Capacitance  
T
o
tal Gate Charge at 10V  
Gate to Source Gate Charge  
Gate to Drain “Miller” Charge  
Equivalent Series Resistance  
V
DS  
V
DS  
V
DS  
= 0 V to 400 V, V
 
= 0 V  
722  
126  
81  
oss(eff.)  
GS  
C
= 0 V to 400 V, V
 
= 0 V  
GS  
oss(er.)  
Q
= 400
V
, I
 
=
2
0 A, V
 
= 10 V  
D GS  
g(tot)  
(Note

Q
24  
gs  
Q
32  
gd  
ESR  
f = 1 MHz  
1.9  
SWITCHING CHARACTERISTICS  
t
Turn-On Delay Time  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
V
V
= 400
V
, I
 
=
2
0 A,  
−
−
−
−
27  
27  
79  
5
−
−
−
−
ns  
ns  
ns  
ns  
d(on)  
DD  
GS  
D
= 10
V
, R
 
= 3
W  
g
t
r
(Note

t
d(off)  
t
f
SOURCE-DRAIN DIODE CHARACTERISTICS  
I
Maximum Continuous Source to Drain Diode Forward Current  
Maximum Pulsed Source to Drain Diode Forward Current  
−
−
−
−
−
−
40  
100  
1.3  
A
A
V
S
I
SM  
V
SD  
Source to Drain Diode Forward  
Voltage  
V
GS  
= 0
V
, I
 
=
2
0 A  
SD  
t
Reverse Recovery Time  
V
= 0
V
, I
 
=
2
0 A,  
−
−
108  
410  
−
−
ns  
rr  
GS  
F
SD  
dI /dt
 
= 100 A/
m
s  
Q
Reverse Recovery Charge  
nC  
rr  
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
4. Essentially
 
independent of operating temperature typical characteristics.  
3
 

NTB082N65S3F  
TYPICAL PERFORMANCE CHARACTERISTICS  
200  
100  
200  
V

GS
= 10.0
 
V  

*Notes:  
1. V
 
= 20 V  
8.0 V  
7.0 V  
6.5 V  
6.0 V  
5.5 V  
DS  
100  
2. 250
m
s Pulse Test  
10  
1
150

o

C  
10  
25

o

C  
o
*Notes:  
−
55 C  
ms Pulse Test  
1. 250  

C

= 25

o

C  
2. T  
0.1  
1
0.1  
1
10 20  
2
3
4
5
6
7
8
9
V

DS

, Drain
−
Source Voltage [V]  
V

GS

, Gate
−
Source Voltage [V]  
Figure 1. On-Region Characteristics  
Figure 2. Transfer Characteristics  
0.20  
0.15  
0.10  
0.05  
0.00  
1000  
100  
10  
*Note: T

C

= 25

o

C  
*Notes:  
1. V

GS

= 0 V  
2. 250
m
s Pulse Test  
150

o

C  
25

o

C  
1
V

GS

= 10 V  
V

GS

= 20 V  
o
−
55 C  
0.1  
0.01  
0.001  
0
20  
40  
60  
80  
100  
120  
0.0  
0.5  
1.0  
1.5  
2.0  
I

D

, Drain Current [A]  
V

SD

, Body Diode Forward Voltage [V]  
Figure 3. On-Resistance Variation vs. Drain  
Current and Gate Voltage  
Figure 4. Body Diode Forward Voltage  
Variation vs. Source Current and Temperature  
10  
100000  
*Note: I

D

= 20 A  
10000  
1000  
100  
10  
C

iss  

V

DS

= 130 V  
8
6
4
2
0
V

DS

= 400 V  
C

oss  

*Note:  
1. V
 
= 0 V  
GS  
2. f = 1 MHz  
C
C
C
= C  
+ C
 
(C =
 
shorted)  
gs gd
 
ds  
C

rss  

iss  
1
= C
 
+ C  
oss  
rss  
ds  
gd  
= C  
gd  
0.1  
0.1  
0
20  
40  
60  
80  
100  
1
10  
100  
1000  
Q

g

, Total Gate Charge [nC]  
V

DS

, Drain
−
Source Voltage [V]  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  
4

NTB082N65S3F  
TYPICAL PERFORMANCE CHARACTERISTICS
(Continued)  
1.2  
1.1  
1.0  
0.9  
0.8  
3.0  
*Notes:  
1. V  
*Notes:  
1. V
 
= 0 V  
= 10 V  
GS  
GS  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  

D

= 20 A  
2. I  
2. I

D

= 10 mA  
−
50  
0
50  
100  
150  
−
50  
0
50  
100  
150  
T

J

, Junction Temperature
[

o

C]  
T

J

, Junction Temperature
[

o

C]  
Figure 7. Breakdown Voltage Variation  
vs. Temperature  
Figure 8. On-Resistance Variant vs. Temperature  
50  
40  
30  
20  
10  
0
200  
100  
10  
1
30ms  
100ms  
1ms  
10ms  
DC  
Operation in This Area  
is Limited by R  
DS(on)  
*Notes:  
1. T

C

= 25

o  

C

J

= 150

o

C  
3. Single Pulse  
2. T  
0.1  
1
10  
100  
1000  
25  
50  
75  
100  
125  
150  
T

C

, Case Temperature [

o

C]  
V

DS

, Drain
−
Source Voltage [V]  
Figure 9. Maximum Safe Operation Area  
Figure 10. Maximum Drain Current  
vs. Case Temperature  
20  
16  
12  
8
4
0
0
130  
260  
390  
520  
650  
V

DS

, Drain to Source Voltage [V]  
Figure 11. E

OSS

vs. Drain to Source Voltage  
5

NTB082N65S3F  
TYPICAL PERFORMANCE CHARACTERISTICS
(Continued)  
2
1
DUTY CYCLE
−
DESCENDING ORDER  
D = 0.5  
0.2  
0.1  
P
DM  
0.1  
0.01  
0.05  
0.02  
0.01  
t
1
t
2
NOTES:  
(t) = r(t) x R  
o
Z
R
q
JC  
q
JC  
= 0.4
 
C/W  
q
JC  
Peak T
 
= P  
Duty Cycle, D = t
 
/ t  
x Z
 
(t) + T  
SINGLE PULSE  
10

−
4  

J
DM  
q
JC C  
1
2
0.001  
10

−
5  

10

−
3  

10

−
2  

10

−
1  

10

0  

10

1  

10

2  

t, RECTANGULAR PULSE DURATION (sec)  
Figure 12. Transient Thermal Response Curve  
6

NTB082N65S3F  
V
GS  
R
Q
Q
L
G
V
DS  
Q
GS  
GD  
V
GS  
DUT  
I
G
= Const.  
Charge  
Figure 13. Gate Charge Test Circuit & Waveform  
R
L
V
DS  
GS  
90%  
90%  
10%  
90%  
V
DS  
V
DD  
V
GS  
R
G
10%  
V
DUT  
V
GS  
t
r
t
f
t
t
d(off)  
d(on)  
t
on  
t
off  
Figure 14. Resistive Switching Test Circuit & Waveforms  
L
2
1
2
E

AS  

+
@
LI

AS  

V
DS  
BV  
DSS  
I
D
I
AS  
R
G
V
DD  
I (t)  
D
DUT  
V
DD  
10 V  
V
DS  
(t)  
t
p
Time  
t
p
Figure 15. Unclamped Inductive Switching Test Circuit & Waveforms  
7

NTB082N65S3F  
+
DUT  
V
SD  
−
I
SD  
L
Driver  
R
G
Same Type  
as DUT  
V
DD  
V
GS  
−
dv/dt controlled by R  
G
−
I controlled
 
by pulse period  
SD  
Gate Pulse Width  
D
+  
Gate Pulse Period  
V
GS  
10 V  
(Driver)  
I
, Body Diode Forward Current  
FM  
I
di/dt  
SD  
(DUT)  
I
RM  
Body Diode Reverse Current  
Body Diode Recovery dv/dt  
V
DS  
V
DD  
V
SD  
(DUT)  
Body Diode  
Forward Voltage Drop  
Figure 16. Peak Diode Recovery dt/dt Test Circuit & Waveforms  
SUPERFET and FRFET are a registered trademarks of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United  
States and/or other countries.  
8

MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
D

2

PAK
−
3 (TO
−
263, 3
−
LEAD)  
CASE 418AJ  
ISSUE F  
DATE 11 MAR 2021  
SCALE 1:1  
XXXXXX = Specific Device Code  
A
= Assembly Location  
WL  
Y
= Wafer Lot  
=
Y
e
ar  
GENERIC MARKING DIAGRAMS*  
WW  
W
M
G
AKA  
= Work Week  
= Week Code (SSG)  
= Month Code (SSG)  
= Pb
−
Free Package  
= Polarity Indicator  
XX  
AYWW  
XXXXXXXXG  
AKA  
XXXXXXXXG  
AYWW  
XXXXXX  
XXYMW  
XXXXXXXXX  
AWLYWWG  
*This information is generic. Please refer to  
device data sheet for actual part marking.  
Pb
−
Free indicator, “G” or microdot “
G
”,  
may or may not be present. Some products  
may not follow the Generic Marking.  
IC  
Standard  
Rectifier  
SSG  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions
 
are uncontrolled
 
except when stamped
 
“CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
98AON56370E  
D

2

PAK
−
3 (TO
−
263, 3
−
LEAD)  
PAGE 1 OF 1  
DESCRIPTION:  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding  
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©
Semiconductor Components Industries, LLC, 2018  

ON Semiconductor and  
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