onsemi-NTD4904N-1G

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onsemi-NTD4904N-1G
NTD4904N  

MOSFET

– Powe
r
,
S
ingle,  
N-Channel, DPAK/IPAK  
30
V
,
7
9 A  
Features  
•
Low R  
to Minimize Conduction Losses  
DS(on)  
•
Low Capacitance to Minimize Driver Losses  
•
Optimized Gate Charge to Minimize Switching Losses  
•
These are Pb
−
Free Devices  
V
R
MAX  
I MAX  
D
(BR)DSS  
DS(on)  
3.7 m
W
@ 10 V  
5.5 m
W
@ 4.5 V  
30 V  
79 A  
Applications  
D
•
CPU Power Delivery  
•
DC
−
DC Converters  
N
−
Channel  
MAXIMUM RATINGS
(T =
 
25
°
C unless otherwise noted)  
J
G
Parameter  
Drain
−
to
−
Source Voltage  
Gate
−
to
−
Source Voltage  
Continuous Drain  
Symbol  
Value  
30  
Unit  
V
S
4
V
DSS  
V
GS  
“
20  
17.8  
V
4
I
D
A
T =
 
25
°
C  
A
4
Current (R  
)
q
JA  
T =
 
100
°
C  
A
12.6  
2.6  
Power Dissipation  
T =
 
25
°
C  
A
P
W
A
2
1
D
D
D
1
2
3
3
1
2
3
q
JA  
Continuous Drain  
I
D
T =
 
25
°
C  
A
13  
9.2  
1.4  
CASE 369AD  
IPAK  
(Straight Lead)  
CASE 369AA  
DPAK  
(Bent Lead)  
STYLE 2  
CASE 369D  
IPAK  
(Straight Lead  
DPAK)  
Current (R
 
) (Note  
q
JA  
T =
 
100
°
C  
A
Steady  
State  
Power Dissipation  
T =
 
25
°
C  
A
P
I
W
A
q
JA  
Continuous Drain  
T
= 25
°
C  
= 100
°
C  
= 25
°
C  
79  
56  
52  
D
C
MARKING DIAGRAMS  
& PIN ASSIGNMENTS  
Current (R  
)
q
JC  
T
C
4
Drain  
Power Dissipation  
T
C
P
W
4
4
Drain  
Drain  
q
JC  
Pulsed Drain Current
 
t =10
m
s T
 
= 25
°
C  
I
316  
90  
A
A
p
A
DM  
I
DmaxPkg  
Current Limited by Package  
T =
 
25
°
C  
A
Operating Junction and Storage
T
e
mperature  
T , T  
−
55 to  
175  
°
C  
J
stg  
2
1
2
3
Source Current (Body Diode)  
Drain to Source dV/dt  
I
47  
6.0  
A
S
Drain  
1
3
Gate Drain Source  
Gate Source  
dV/dt  
V/ns  
mJ  
1
2
3
Gate Drain Source  
Single Pulse Drain
−
to
−
Source Avalanche  
E
AS  
68.4  
A
Y
= Assembly Location  
=
Y
e
ar  
Energy (T
 
= 25
°
C, V
 
= 50
V
, V
 
=
1
0
V
,  
J
DD  
GS  
L = 0.1 mH, I  
= 37 A, R
 
= 25
W
)  
L(pk)  
G
WW  
= Work Week  
Lead
T
e
mperature for Soldering Purposes  
T
260  
°
C  
L
4904N =
 
Device Code  
G
(1/8
″
from case for 10 s)  
= Pb
−
Free Package  
Stresses exceeding those listed in the Maximum Ratings table may damage the  
device. If any of these limits are exceeded, device functionality should not be  
assumed, damage may occur and reliability may be affected.  
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
©
Semiconductor Components Industries, LLC, 2014  
1
Publication Order Number:  
May, 2019
−
Rev. 2  
NTD4904N/D  

NTD4904N  
THERMAL RESISTANCE MAXIMUM RATINGS  
Parameter  
Symbol  
Value  
Unit  
Junction
−
to
−
Case (Drain)  
R
2.9  
4.3  
57  
°
C/W  
q
JC  
Junction
−
to
−
T
a
b (Drain)  
R
q
JC
−
TAB  
Junction
−
to
−
Ambient
−

Junction
−
to
−
Ambient
−

R
R
q
q
JA  
JA  
108  
1. Surface
−
mounted on FR4 board using 1 in sq pad size, 1 oz Cu.  
2. Surface
−
mounted on FR4 board using the minimum recommended pad size.  
ELECTRICAL CHARACTERISTICS
(T =
 
25
°
C unless otherwise noted)  
J
Parameter  
Symbol  
Test Condition  
Min  
Typ  
Max  
Unit  
OFF CHARACTERISTICS  
Drain
−
to
−
Source Breakdown Voltage  
V
V
GS  
= 0
V
, I
 
=
2
50
m
A  
30  
V
(BR)DSS  
D
Drain
−
to
−
Source Breakdown Voltage  
T
e
mperature Coefficient  
V
/T  
J
15  
mV/
°
C  
(BR)DSS  
Zero Gate Voltage Drain Current  
I
m
A  
T =
 
25
°
C  
1.0  
10  
DSS  
J
V
V
= 0
V
,  
= 24 V  
GS  
DS  
T =
 
125
°
C  
J
Gate
−
to
−
Source Leakage Current  
ON CHARACTERISTICS

Gate Threshold Voltage  
I
V
= 0
V
, V
 
=
“
20 V  
“
100  
nA  
GSS  
DS  
GS  
V
V
= V
 
, I
 
= 250
m
A  
1.0  
1.6  
4.0  
2.2  
V
GS(TH)  
GS  
DS  
D
Negative Threshold
T
e
mperature  
Coefficient  
V
/T  
J
mV/
°
C  
GS(TH)  
Drain
−
to
−
Source On Resistance  
R
V
= 10 V  
GS  
m
W  
I
D
I
D
I
D
I
D
= 30 A  
= 15 A  
= 30 A  
= 15 A  
3.0  
3.0  
4.0  
4.0  
76  
3.7  
5.5  
DS(on)  
V
GS  
= 4.5 V  
Forward Transconductance  
CHARGES AND CAPACITANCES  
Input Capacitance  
gFS  
V
DS  
= 1.5
V
, I
 
=
3
0 A  
S
D
pF  
C
3052  
976  
23  
iss  
V
GS  
= 0
V
, f =
1
.0 MHz,  
Output Capacitance  
C
oss  
V
DS  
= 15 V  
Reverse Transfer Capacitance  
T
o
tal Gate Charge  
C
rss  
nC  
Q
16.8  
4.4  
8.2  
3.0  
41  
G(TOT)  
Threshold Gate Charge  
Gate
−
to
−
Source Charge  
Gate
−
to
−
Drain Charge  
T
o
tal Gate Charge  
Q
G(TH)  
V
= 4.5
V
, V
 
=
1
5
V
,  
DS  
GS  
I
D
= 30 A  
Q
GS  
GD  
Q
Q
V
= 10
V
, V
 
=
1
5
V
,  
nC  
ns  
G(TOT)  
GS  
DS  
I
D
= 30 A  
SWITCHING CHARACTERISTICS

Turn
−
On Delay Time  
Rise Time  
t
15.3  
19.8  
23.4  
7.5  
d(on)  
t
r
V
= 4.5
V
, V
 
=
1
5
V
,  
DS  
GS  
I
D
= 15 A, R
 
= 3.0
W  
G
Turn
−
Off Delay Time  
Fall Time  
t
d(off)  
t
f
ns  
Turn
−
On Delay Time  
Rise Time  
t
t
10.3  
20  
d(on)  
t
r
V
I
= 10
V
, V
 
=
1
5
V
,  
DS  
GS  
= 15 A, R
 
= 3.0
W  
D
G
Turn
−
Off Delay Time  
Fall Time  
28.7  
8.0  
d(off)  
t
f
3. Pulse
 
T
e
st: Pulse Width
≤
300
m
s, Duty Cycle
≤
2%.  
4. Switching
 
characteristics are independent of operating junction temperatures.  
2
 

NTD4904N  
ELECTRICAL CHARACTERISTICS
(T =
 
25
°
C unless otherwise noted)  
J
Parameter  
Symbol  
Test Condition  
Min  
Typ  
Max  
Unit  
V
DRAIN
−
SOURCE DIODE CHARACTERISTICS  
Forward Diode Voltage  
V
SD  
T =
 
25
°
C  
J
0.84  
0.7  
1.1  
V
= 0
V
,  
GS  
I
S
= 30 A  
T =
 
125
°
C  
J
Reverse Recovery Time  
Charge Time  
t
40.4  
20.5  
19.9  
35  
ns  
RR  
ta  
V
GS  
= 0
V
,
d
Is/dt= 100 A/
m
s,  
I
S
= 30 A  
Discharge Time  
tb  
Reverse Recovery Time  
PACKAGE PARASITIC VALUES  
Drain Inductance, DPAK  
Drain Inductance, IP

Gate Resistance  
Q
nC  
nH  
RR  
L
2.48  
0.0164  
1.88  
4.9  
S
D
D
G
L
L
L
T =
 
25
°
C  
A
R
1.0  
2.0  
W
G
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
5. Assume
 
terminal length of 110 mils.  
3
 

NTD4904N  
TYPICAL PERFORMANCE CURVES  
130  
130  
T =
 
25
°
C  
J
10 V  
3.8 V to 6 V  
3.6 V  
3.4 V  
V
DS  
≥
10 V  
120  
110  
100  
90  
120  
110  
100  
90  
3.2 V  
3.0 V  
2.8 V  
80  
70  
60  
50  
40  
30  
20  
10  
0
80  
70  
60  
50  
40  
30  
20  
10  
0
T =
 
125
°
C  
J
T =
 
25
°
C  
J
2.6 V  
2.4 V  
T =
 
−
55
°
C  
J
0
1
2
3
4
5
2
2.5  
3
3.5  
4
V
DS  
, DRAIN
−
TO
−
SOURCE VOLTAGE (VOLTS)  
V
GS  
, GATE
−
TO
−
SOURCE VOLTAGE (VOLTS)  
Figure 1. On
−
Region Characteristics  
Figure 2. Transfer Characteristics  
0.012  
0.010  
0.008  
0.006  
0.004  
0.006  
0.005  
0.004  
0.003  
0.002  
I
= 30 A  
D
T =
 
25
°
C  
J
T =
 
25
°
C  
J
V
= 4.5 V  
GS  
V
= 10 V  
GS  
0.002  
3
4
5
6
7
8
9
10  
20  
40  
60  
80  
100  
120  
V
GS  
, GATE
−
TO
−
SOURCE VOLTAGE (VOLTS)  
I ,
 
DRAIN CURRENT (AMPS)  
D
Figure 3. On
−
Resistance vs. Gate
−
to
−
Source  
Figure 4. On
−
Resistance vs. Drain Current and  
Voltage  
Gate Voltage  
10,000  
1000  
100  
2.2  
2.0  
V
GS  
= 0 V  
I
V
= 30 A  
D
= 10 V  
GS  
T =
 
150
°
C  
J
1.8  
1.6  
1.4  
1.2  
1.0  
T =
 
125
°
C  
J
T =
 
85
°
C  
J
0.8  
0.6  
10  
−
50
−
25  
0
25  
50  
75 100 125 150 175  
5
10  
, DRAIN
−
TO
−
SOURCE VOLTAGE (VOLTS)  
DS  
15  
20  
25  
30  
T , JUNCTION TEMPERATURE (
°
C)  
J
V
Figure 5. On
−
Resistance Variation with  
Figure 6. Drain
−
to
−
Source Leakage Current  
Temperature  
vs. Drain Voltage  
4

NTD4904N  
TYPICAL PERFORMANCE CURVES  
3600  
3200  
2800  
2400  
2000  
1600  
1200  
800  
12  
T =
 
25
°
C  
GS  
J
V
11  
10  
9
C
iss  
= 0 V  
Q
T
8
7
6
V
GS  
Q
GD  
5
4
3
2
1
0
Q
GS  
C
oss  
V
V
I
= 15 V  
= 10 V  
= 30 A  
DD  
GS  
D
400  
0
C
T =
 
25
°
C  
rss  
J
0
5
10  
15  
20  
25  
30  
0
5
10  
15  
20  
25  
30  
35  
40 45  
V ,
 
DRAIN
−
TO
−
SOURCE VOLTAGE (VOLTS)  
DS  
Q ,
 
TOTAL GATE CHARGE (nC)  
G
Figure 7. Capacitance Variation  
Figure 8. Gate
−
To
−
Source and Drain
−
To
−
Source  
Voltage vs. Total Charge  
30  
25  
20  
15  
10  
1000  
V
= 15 V  
= 15 A  
= 10 V  
V
GS  
= 0 V  
DD  
I
D
t
d(off)  
V
GS  
t
t
f
100  
r
t
d(on)  
T =
 
125
°
C  
J
10  
1
5
0
T =
 
25
°
C  
J
1
10  
100  
0.4  
0.5  
0.6  
0.7  
0.8  
0.9  
1.0  
R ,
 
GATE RESISTANCE (OHMS)  
G
V
SD  
, SOURCE
−
TO
−
DRAIN VOLTAGE (VOLTS)  
Figure 9. Resistive Switching Time  
Variation vs. Gate Resistance  
Figure 10. Diode Forward Voltage vs. Current  
1000  
100  
10  
70  
60  
50  
40  
30  
20  
I
D
= 37 A  
10
m
s  
100
m
s  
1 ms  
V
= 10 V  
GS  
SINGLE PULSE  
= 25
°
C  
10 ms  
dc  
T
C
1
R
LIMIT  
DS(on)  
THERMAL LIMIT  
PACKAGE LIMIT  
10  
0
0.1  
0.1  
1
10  
100  
25  
50  
75  
100  
125  
150  
175  
V
DS  
, DRAIN
−
TO
−
SOURCE VOLTAGE (VOLTS)  
T , JUNCTION TEMPERATURE (
°
C)  
J
Figure 11. Maximum Rated Forward Biased  
Safe Operating Area  
Figure 12. Maximum Avalanche Energy vs.  
Starting Junction Temperature  
5

NTD4904N  
TYPICAL PERFORMANCE CURVES  
100  
10  
50% (DUTY CYCLE)  
20%  
10%  
5.0%  
2.0%  
1.0  
0.1  
1.0%  
SINGLE PULSE  
0.01  
PSi TAB-A  
0.001  
0.000001  
0.00001  
0.0001  
0.001  
0.01  
PULSE TIME (s)  
0.1  
1.0  
10  
100  
1000  
Figure 13. FET Thermal Response  
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
V
DS  
= 1.5 V  
0
0
10  
20 30 40  
50 60 70 80 90
 
100  
ID (A)  
Figure 14. GFS vs ID  
ORDERING INFORMATION  
Order Number  
†
Package  
Shipping  
NTD4904NT4G  
DPAK  
2500 /
T
a
pe & Reel  
75 Units / Rail  
(Pb
−
Free)  
NTD4904N
−
1G  
NTD4904N
−
35G  
IPAK  
(Pb
−
Free)  
IPAK Trimmed Lead  
75 Units / Rail  
(Pb
−
Free)  
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our
T
a
pe and Reel Packaging  
Specifications Brochure, BRD8011/D.  
6

MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
IPAK  
CASE 369D
−
01  
ISSUE C  
DATE 15 DEC 2010  
C
B
NOTES:  
SCALE 1:1  
1. DIMENSIONING
 
AND TOLERANCING PER  
ANSI Y14.5M, 1982.  
V
E
R
2. CONTROLLING
 
DIMENSION: INCH.  
INCHES  
DIM MIN
 
MAX  
MILLIMETERS  
4
MIN  
5.97  
6.35  
2.19  
0.69  
0.46  
0.94  
MAX  
6.35  
6.73  
2.38  
0.88  
0.58  
1.14  
Z
A
B
C
D
E
F
G
H
J
K
R
S
V
Z
0.235 0.245  
0.250 0.265  
0.086 0.094  
0.027 0.035  
0.018 0.023  
0.037 0.045  
0.090 BSC  
0.034 0.040  
0.018 0.023  
0.350 0.380  
0.180 0.215  
0.025 0.040  
0.035 0.050  
A
S
1
2
3
−
T
−  
SEATING  
PLANE  
2.29 BSC  
K
0.87  
0.46  
8.89  
4.45  
0.63  
0.89  
3.93  
1.01  
0.58  
9.65  
5.45  
1.01  
1.27  
−−−  
J
F
H
0.155  
−−−  
D
3 PL  
G
M
T
0.13 (0.005)  
MARKING  
DIAGRAMS  
STYLE 1:  
PIN 1.
 
BASE  
STYLE 2:  
STYLE 3:  
PIN 1.
 
ANODE  
STYLE 4:  
PIN 1.
 
CATHODE  
2. ANODE  
Integrated  
Circuits  
PIN 1.
 
GATE  
2. DRAIN  
3. SOURCE  
4. DRAIN  
2. COLLECTOR  
3. EMITTER  
4. COLLECTOR  
2. CATHODE  
3. ANODE  
4. CATHODE  
Discrete  
3. GATE  
4. ANODE  
xxxxx  
ALYWW  
x
YWW  
xxxxxxxx  
STYLE 5:  
PIN 1.
 
GATE  
2. ANODE  
STYLE 6:  
PIN 1.
 
MT1  
2. MT2  
STYLE 7:  
PIN 1.
 
GATE  
2. COLLECTOR  
3. CATHODE  
4. ANODE  
3. GATE  
4. MT2  
3. EMITTER  
4. COLLECTOR  
xxxxxxxxx =
 
Device Code  
A
= Assembly Location  
lL  
Y
= Wafer Lot  
=
Y
e
ar  
WW  
= Work Week  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions
 
are uncontrolled
 
except when stamped
 
“CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON10528D  
IPAK (DPAK INSERTION MOUNT)  
PAGE 1 OF 1  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding  
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically  
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the  
rights of others.  
©
Semiconductor Components Industries, LLC, 2019  

MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
DPAK (SINGLE GUAGE)  
CASE 369AA
−
01  
ISSUE B  
4
2
1
DATE 03 JUN 2010  
3
SCALE 1:1  
NOTES:  
1. DIMENSIONING AND TOLERANCING PER ASME  
Y14.5M, 1994.  
C
A
D
2. CONTROLLING DIMENSION: INCHES.  
3. THERMAL PAD CONTOUR OPTIONAL WITHIN DI-  
MENSIONS b3, L3 and Z.  
A
E
c2  
4. DIMENSIONS D AND E DO NOT INCLUDE MOLD  
FLASH, PROTRUSIONS, OR BURRS. MOLD  
FLASH, PROTRUSIONS, OR GATE BURRS SHALL  
NOT EXCEED 0.006 INCHES PER SIDE.  
5. DIMENSIONS D AND E ARE DETERMINED AT THE  
OUTERMOST EXTREMES OF THE PLASTIC BOD
Y
.  
6. DATUMS A AND B ARE DETERMINED AT DATUM  
PLANE H.  
b3  
B
4
2
L3  
Z
H
DETAIL A  
1
3
INCHES  
DIM MIN
 
MAX  
0.086 0.094  
A1
0.000 0.005  
0.025 0.035  
MILLIMETERS  
MIN  
2.18  
0.00  
0.63  
0.76  
4.57  
0.46  
0.46  
5.97  
6.35  
MAX  
2.38  
0.13  
0.89  
1.14  
5.46  
0.61  
0.61  
6.22  
6.73  
L4  
b2  
A
c
b
b
b2
0.030 0.045  
b3
0.180 0.215  
M
0.005 (0.13)  
C
H
e
c
0.018 0.024  
c2
0.018 0.024  
GAUGE  
SEATING  
PLANE  
L2  
PLANE  
C
D
E
e
0.235 0.245  
0.250 0.265  
0.090 BSC  
2.29 BSC  
9.40 10.41  
1.40 1.78  
2.74 REF  
0.51 BSC  
0.89 1.27  
H
L
L1  
L2  
0.370 0.410  
0.055 0.070  
0.108 REF  
L
A1  
L1  
0.020 BSC  
DETAIL A  
L3
0.035 0.050  
ROTATED 9
0
5
CW  
L4  
Z
−−−
0.040  
0.155
−−−  
−−−  
3.93  
1.01  
−−−  
STYLE 1:  
STYLE 2:  
PIN 1.
 
GATE  
2. DRAIN  
STYLE 3:  
STYLE 4:  
PIN 1.
 
CATHODE  
2. ANODE  
PIN 1.
 
BASE  
PIN 1.
 
ANODE  
2. CATHODE  
3. ANODE  
GENERIC  
MARKING DIAGRAM*  
2. COLLECTOR  
3. EMITTER  
4. COLLECTOR  
3. SOURCE  
4. DRAIN  
3. GATE  
4. ANODE  
4. CATHODE  
STYLE 5:  
PIN 1.
 
GATE  
2. ANODE  
STYLE 6:  
PIN 1.
 
MT1  
2. MT2  
STYLE 7:  
PIN 1.
 
GATE  
2. COLLECTOR  
3. EMITTER  
4. COLLECTOR  
XXXXXXG  
ALYWW  
YWW  
XXX  
3. CATHODE  
4. ANODE  
3. GATE  
4. MT2  
XXXXXG  
SOLDERING FOOTPRINT*  
IC  
Discrete  
6.20  
0.244  
3.00  
0.118  
XXXXXX =
 
Device Code  
2.58  
0.102  
A
= Assembly Location  
L
= Wafer Lot  
Y
=
Y
e
ar  
WW  
G
= Work Week  
= Pb
−
Free Package  
5.80  
0.228  
1.60  
0.063  
6.17  
0.243  
*This information is generic. Please refer  
to device data sheet for actual part  
marking.  
mm  
inches  
ǒ
Ǔ
SCALE 3:1  
*For additional information on our Pb
−
Free strategy and soldering  
details, please download the ON Semiconductor Soldering and  
Mounting
T
e
chniques Reference Manual, SOLDERRM/D.  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions
 
are uncontrolled
 
except when stamped
 
“CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON13126D  
DPAK (SINGLE GAUGE)  
PAGE 1 OF 1  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding  
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically  
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the  
rights of others.  
©
Semiconductor Components Industries, LLC, 2019  

MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
3.5 MM IPAK, STRAIGHT LEAD  
CASE 369AD  
ISSUE B  
DATE 18
 
APR 2013  
SCALE 1:1  
L2  
NOTES:  
E
A
1.. DIMENSIONING AND TOLERANCING PER  
ASME Y14.5M, 1994.  
E3  
E2  
2.. CONTROLLING DIMENSION: MILLIMETERS.  
3. DIMENSION
 
b APPLIES TO PLATED TERMINAL  
AND IS MEASURED BETWEEN 0.15 AND  
0.30mm FROM TERMINAL TI
P
.  
A1  
4. DIMENSIONS
 
D AND E DO NOT INCLUDE  
MOLD GATE OR MOLD FLASH.  
D2  
D
L
L1  
MILLIMETERS  
DIM MIN  
MAX  
2.38  
0.60  
1.10  
0.89  
1.10  
6.22  
−−−  
A
A1  
A2  
b
b1  
D
D2  
E
E2  
E3  
e
2.19  
0.46  
0.87  
0.69  
0.77  
5.97  
4.80  
6.35  
4.57  
4.45  
T
SEATING  
PLANE  
b1  
A1  
e
2X  
A2  
E2  
6.73  
5.45  
5.46  
3X
b  
M
0.13  
T
2.28 BSC  
D2  
L
L1  
L2  
3.40  
−−−  
0.89  
3.60  
2.10  
1.27  
GENERIC MARKING  
DIAGRAMS*  
OPTIONAL  
CONSTRUCTION  
Integrated  
Circuits  
Discrete  
AYWW  
XXX  
XXXXXG  
STYLE 1:  
STYLE 2:  
PIN 1.
 
GATE  
2. DRAIN  
STYLE 3:  
STYLE 4:  
PIN 1.
 
CATHODE  
2. ANODE  
XXXXXXG  
ALYWW  
PIN 1.
 
BASE  
PIN 1.
 
ANODE  
2. CATHODE  
3. ANODE  
2. COLLECTOR  
3. EMITTER  
4. COLLECTOR  
3. SOURCE  
4. DRAIN  
3. GATE  
4. ANODE  
4. CATHODE  
STYLE 5:  
PIN 1.
 
GATE  
2. ANODE  
STYLE 6:  
PIN 1.
 
MT1  
2. MT2  
STYLE 7:  
PIN 1.
 
GATE  
2. COLLECTOR  
3. CATHODE  
4. ANODE  
3. GATE  
4. MT2  
3. EMITTER  
4. COLLECTOR  
XXXXXX =
 
Device Code  
A
= Assembly Location  
L
= Wafer Lot  
Y
=
Y
e
ar  
WW  
G
= Work Week  
= Pb
−
Free Package  
*This information is generic. Please refer to  
device data sheet for actual part marking.  
Pb
−
Free indicator, “G” or microdot “
G
”,  
may or may not be present.  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions
 
are uncontrolled
 
except when stamped
 
“CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON23319D  
3.5 MM IPAK, STRAIGHT LEAD  
PAGE 1 OF 1  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding  
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically  
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the  
rights of others.  
©
Semiconductor Components Industries, LLC, 2019  

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